Scanning Probe Microscopy TRIZ Cases
- Side-Gated FinFET Scanning SET for High-Resolution Quantum Dot Sensing
An etched-back plunger gate and side-gated finFET place the quantum dot at the fin tip, enabling sub-20 nm scanning and operation above 4 K.
- Probe Cassette Pocket Structure for Accurate Automated Pickup
Physical confinement pockets limit probe shift and rotation, enabling accurate automated pickup while reducing damage risk and storage space.
- Probe Cassette Vacuum Release Sequence for Automated SPM Transfer
Selective vacuum release in a probe cassette preserves probe and cassette alignment during automated scanning probe microscope exchange.
- Rotatable Probe Chip Geometry for High-Aspect-Ratio Mapping
A truncated probe chip enables controlled rotation so the tip can follow deep sidewalls and map high-aspect-ratio nanostructures more accurately.
- SPM Nanotip Array Substrates for Fast Probe Replacement
Masked etching forms pedestal-mounted nanotip arrays that cut SPM probe exchange time and support rapid consecutive measurements.
- Transitional Tapping AFM for Metastable Relaxation Imaging
Ultra-light tapping AFM matches tip-surface and resonance timescales to separate loss mechanisms and image metastable relaxations in soft biomaterials.
- Rotationally Symmetric Z-Stage for Compact Multi-Probe SPM
A rotationally symmetric Z-stage cuts scan head bulk and vibration, enabling stable multi-probe scanning with higher throughput.
- AFM Cantilever Image Recognition for Precise Laser Targeting
Neural image recognition locates AFM cantilever target positions despite size and shape variation, enabling faster, precise laser alignment.
- Peak Force Tapping AFM Probe for Sensitive Electrical Mapping
A homogeneous conducting tip with an insulating cantilever improves KPFM sensitivity while enabling correlated electrical and mechanical AFM mapping.
- AFM Level Difference Measurement Using Local Height Histograms
Local AFM height histograms isolate film-step peaks, improving level difference measurement on warped or distorted specimen surfaces.
- Vacuum Probe Cassette Clamping for Secure Probe Handling
Vacuum clamping holds probe devices securely during transport and handling while reducing damage risk and particle contamination.
- Scanning Probe Tip Geometry for Low-Deflection Measurement
Simulation-guided probe tip geometry tuning reduces deflection from sample interactions while preserving access, stiffness, and resolution.
- Pump-Probe Cantilever Measurement for Photoexcitation Dynamics
Variable pump-probe delay and lock-in detection let a cantilever microscope capture photoexcitation dynamics with high signal-to-noise.
- Multi-Probe Microscope Lighting for Independent Beam Modulation
Independent light sources replace slow spatial light modulators to actuate and detect individual microscope probes with faster modulation and easier pitch adaptation.
- Sidewall Scanning Probe Microscopy for Narrow 3D Structures
Non-oscillatory lateral probe contact maps narrow sidewalls, trenches, and negative slopes with accurate 3D topography.
- Probe Microscopy of Liquid-Filled Trenches With Wear-Tolerant Tips
Filling narrow trenches with liquid reduces wall attraction, helping high-aspect-ratio probe tips reach the base for repeatable measurements.
- Terahertz Near-Field Probe Imaging With Direct Current Signal Extraction
A metal probe directly extracts terahertz near-field signals as current, improving signal-to-noise ratio while removing complex optical paths.