Planarization of spin-on films
By using an intermediate layer development technique that spin-coates on uneven semiconductor substrates and utilizes photochemical radiation patterns to change solubility, the problem of uneven deposition of spin-coated films on uneven substrates has been solved, thereby improving the resolution of photolithography processes and device performance.
Patent Information
- Application Number
- CN202180021194.1
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- Priority Date
- 2020-12-15
- Filing Date
- 2021-02-09
- Publication Date
- 2026-07-24
- Estimated Expiration
- 2041-02-09
AI Technical Summary
Existing technologies struggle to uniformly apply spin-coated films on uneven semiconductor substrates, impacting the critical size resolution of photolithography processes and device performance.
An intermediate layer containing a solubility modifier is spin-coated onto an uneven semiconductor substrate, and its solubility is altered using a photochemical radiation pattern, making the upper region of the uneven topography soluble in the solvent while the lower region is insoluble. The soluble portion is then removed by development, followed by spin-coating to deposit a second layer to improve flatness.
This technology enables uniform deposition of thin films on uneven semiconductor substrates, improving the critical size resolution of photolithography processes and device performance.