Method for testing reversion resistance of power supply fan and server

Abstract

The invention discloses a method for testing the anti-reversion ability of a power supply fan and a server, and relates to the technical field of servers, the method comprises the steps that a test instruction sent by a client is received, and the test instruction is used for indicating the anti-reversion ability of the power supply fan to a system fan; according to the test rule corresponding to each test scene, running a plurality of target test tasks corresponding to the test scene in the test scene; collecting an actual index value of each target test index in the plurality of target test indexes according to a data collection rule in the process of running each target test task; extracting a reference index value corresponding to each target test index from a pre-constructed mapping table; and according to the actual index value and the reference index value, determining whether the anti-reversion capability of the power supply fan is abnormal or not. The problems that the anti-reversion capability of the power supply fan cannot be directly tested, so that the root of the heat dissipation problem is difficult to accurately distinguish, the maintenance and troubleshooting difficulty is increased, and the test coverage is insufficient are solved.

Description

Technical Field

[0001] The present application relates to the technical field of servers, and in particular to a method for testing the anti-reversal capability of a power supply fan and a server. Background Art

[0002] In a server's internal cooling system, the fan module (also known as the system fan) and the power supply unit (PSU) fan have different cooling responsibilities. The system fan provides directional airflow, providing forced cooling for high-heat components such as the server's processor, memory, hard drives, network interface cards, and motherboards. The PSU fan dissipates heat from core components such as the power devices and capacitors within the PSU. In a server, the strong airflow generated by the system fan can directly impact the PSU fan, hindering its forward rotation or even causing it to rotate in the reverse direction. If the PSU fan's reverse rotation resistance is insufficient, this can lead to a significant risk of cooling failure. Therefore, testing the PSU fan's reverse rotation resistance is crucial.

[0003] Related technologies typically simulate different airflow impact intensities by manually adjusting the system fan speed. During this process, if the PSU fan experiences speed fluctuations or reversals due to high-speed airflow interference, power consumption monitoring or abnormal temperature sensor data can be used to identify risks and indirectly test the PSU fan's ability to resist reversal. However, this indirect testing method cannot determine whether the temperature or power consumption anomaly is caused by the system fan or the PSU fan, making it difficult to accurately distinguish the root cause of the heat dissipation problem, increasing the difficulty of repair and troubleshooting, and the test coverage is insufficient. Summary of the Invention

[0004] The present application provides a method and server for testing the anti-reversal capability of a power supply fan, so as to at least solve the problem in the related art that the anti-reversal capability of the power supply fan cannot be directly tested, resulting in difficulty in accurately distinguishing the root cause of the heat dissipation problem, increasing the difficulty of maintenance and troubleshooting, and insufficient test coverage.

[0005] The present application provides a method for testing the anti-reversal capability of a power supply fan, which is applied to a server, and the server includes a power supply fan and a system fan; the method includes: receiving a test instruction sent by a client, the test instruction is used to instruct to test the anti-reversal capability of the power supply fan to the system fan, wherein the test instruction carries test rules and data collection rules corresponding to each test scenario in a plurality of test scenarios; according to the test rules corresponding to each test scenario, running a plurality of target test tasks corresponding to the test scenario in the test scenario; in the process of running each target test task, collecting the actual index value of each target test index in the plurality of target test indexes according to the data collection rules; extracting the benchmark index value corresponding to each target test index from a pre-built mapping table; and determining whether the anti-reversal capability of the power supply fan is abnormal according to the actual index value and the benchmark index value.

[0006] The present application also provides a server, which includes: a transceiver module for receiving a test instruction sent by a client, the test instruction is used to instruct the test power supply fan to resist the reversal of the system fan, wherein the test instruction carries test rules and data collection rules corresponding to each test scenario in a plurality of test scenarios. A processing module for running a plurality of target test tasks corresponding to the test scenario in the test scenario according to the test rules corresponding to each test scenario. An acquisition module for collecting the actual index value of each target test indicator in a plurality of target test indicators according to the data collection rules during the running of each target test task. The processing module is also used to extract the benchmark index value corresponding to each target test indicator from a pre-built mapping table; and determine whether the power supply fan's anti-reversal ability is abnormal based on the actual index value and the benchmark index value.

[0007] The present application also provides a server, comprising: a memory for storing a computer program; and a processor for implementing the steps of any of the above-mentioned methods for testing the anti-reversal capability of a power supply fan when executing the computer program.

[0008] The present application also provides a computer-readable storage medium, in which a computer program is stored. When the computer program is executed by a processor, the steps of any of the above-mentioned methods for testing the anti-reversal capability of a power supply fan are implemented.

[0009] The present application also provides a computer program product, including a computer program, which implements the steps of any of the above-mentioned methods for testing the anti-reversal capability of a power supply fan when the computer program is executed by a processor.

[0010] Through this application, since the server can test the anti-reversal capability of the power supply fan under multiple test scenarios, multiple test scenarios can cover the full load cycle range of the server, that is, cover all situations of wind speed changes or airflow changes of the system fan. Therefore, the anti-reversal capability of the power supply fan can be targeted tested within the full load cycle range of the server, thereby improving the test coverage of the anti-reversal capability of the power supply fan and ensuring the factory quality of the server. Because it is a direct test of the power supply fan, it can accurately locate whether the fault is caused by the poor anti-reversal capability of the power supply fan when a heat dissipation problem occurs in the server. In addition, the use of automated testing processes and methods avoids possible misjudgments caused by manual observation and judgment, saves labor costs and improves the degree of factory automated testing. BRIEF DESCRIPTION OF THE DRAWINGS

[0011] In order to more clearly illustrate the embodiments of the present application, the following is a brief introduction to the drawings required for use in the embodiments. Obviously, the drawings described below are only some embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without any creative work.

[0012] Figure 1 A topological diagram of a system for testing the anti-reversal capability of a power supply fan provided in an embodiment of the present application; Figure 2 A flowchart of a method for testing the anti-reversal capability of a power supply fan provided in an embodiment of the present application; Figure 3 A flow chart of a test method for a dynamic pressure test scenario provided in an embodiment of the present application; Figure 4 A flow chart of a test method for dynamically adjusting the rotational speed in a test scenario provided by an embodiment of the present application; Figure 5 A flowchart of a test method for a power redundancy dynamic test scenario provided in an embodiment of the present application; Figure 6 A flow chart of a test method for a power cycle test scenario provided in an embodiment of the present application; Figure 7 A flowchart of a test method for a power cycle test scenario provided by an embodiment of the present application; Figure 8 A flowchart of a test method for a first combined test scenario provided in an embodiment of the present application; Figure 9 A flowchart of a testing method for a second combined testing scenario provided in an embodiment of the present application; Figure 10 A block diagram of the device structure of a server provided in an embodiment of the present application; Figure 11 A schematic diagram of the hardware structure of a server provided in an embodiment of the present application. DETAILED DESCRIPTION

[0013] The following will be combined with the accompanying drawings in the embodiments of this application to clearly and completely describe the technical solutions in the embodiments of this application. Obviously, the embodiments described are only part of the embodiments of this application, not all of them. Based on the embodiments in this application, all other embodiments obtained by ordinary technicians in this field without making creative efforts are within the scope of protection of this application.

[0014] It should be noted that, in the description of this application, the terms "comprises," "includes," or any other variations thereof are intended to cover non-exclusive inclusion, such that a process, method, article, or device comprising a series of elements includes not only those elements, but also other elements not explicitly listed, or elements inherent to such process, method, article, or device. The terms "first," "second," etc., in this application are used to distinguish similar objects, and are not used to describe a particular order or sequence.

[0015] In order to enable those skilled in the art to better understand the present application, the present application is further described in detail below with reference to the accompanying drawings and specific implementation methods.

[0016] The embodiment of the present application is applied to the scenario of testing the anti-reversal capability of the power supply fan of the server. The poor anti-reversal capability of the power supply fan of the server will cause its forward rotation to be blocked, and even reverse rotation to occur. This not only makes it impossible to discharge the heat inside the PSU in time, causing the temperature of the core components to rise sharply, but is also likely to cause hardware failures such as capacitor aging and component burning, seriously threatening the service life and power supply stability of the PSU, and thus affecting the reliable operation of the entire server. Therefore, the PSU fan needs to have a stronger anti-reversal capability to ensure that the power supply can work stably in a complex airflow environment.

[0017] In the related art, the anti-reversal capability of the PSU fan is usually indirectly tested through the following three methods. Method 1: Usually, the system fan speed is manually adjusted to simulate different airflow impact intensities. During this process, if the PSU fan speed fluctuates or reverses under the interference of high-speed airflow, the risk can be identified through power consumption monitoring or abnormal temperature sensor data to indirectly test the anti-reversal capability of the PSU fan. Method 2: By simulating the server power on and off cycle, the rotation response of the PSU fan at the moment of startup is manually observed. When the system fan and the PSU fan conflict in direction, the PSU fan may have a startup delay or abnormal noise, which indirectly tests the anti-reversal capability of the PSU fan. Method 3: During the single and dual PSU redundancy test of the server, the main power supply is disconnected to observe the takeover status of the backup power supply. During this process, the operating stability of the PSU fan during sudden load changes is synchronously monitored to indirectly test the anti-reversal capability of the PSU fan.

[0018] Among the above three methods, only some anti-reversal scenarios can be triggered under specific working conditions (such as startup and sudden load changes), and it is impossible to fully simulate the airflow interference to the PSU fan under the full load cycle of the server, resulting in insufficient test coverage; when the PSU fails due to insufficient anti-reversal ability of the fan, indirect testing is difficult to accurately identify the root cause of the problem, increasing the difficulty of repair and troubleshooting.

[0019] To address the aforementioned technical issues, the present invention provides a method for testing the reversal resistance of power supply fans. This method uses the full server load cycle as the test dimension and randomly generates test tasks under various scenarios to fully simulate the airflow interference to the PSU fan under the full server load cycle (no load, full load, and mixed load), thereby improving the test coverage of the power supply fan's reversal resistance. Furthermore, by combining real-time data collection with comparison to a preset mapping table, the root cause of the heat dissipation problem can be accurately located, reducing the difficulty of repair and troubleshooting.

[0020] Below Figure 1 Taking the test system for the anti-reversal capability of the power supply fan as an example, the method provided in the embodiment of the present application is described. Figure 1 It is only a schematic diagram and does not constitute a limitation on the applicable scenarios of the technical solution provided in this application.

[0021] like Figure 1 As shown, Figure 1 A topological diagram of a system for testing the anti-reversal capability of a power supply fan provided in an embodiment of the present application. Figure 1 In the embodiment, a system 100 for testing the anti-reversal capability of a power supply fan may include a server 101 and a client 102 .

[0022] The server 101 can be any type of server. For example, it can be a tower server, a rack server, a blade server, a file server, etc. The server 101 includes a power supply fan and a system fan. Furthermore, the server includes multiple components such as a processor, memory, a graphics card, as well as a main power supply and a backup power supply.

[0023] The client 102 may be any device having display and communication functions, for example, a mobile device, an Internet of Things device, etc.

[0024] Figure 1 The power supply fan anti-reversal capability testing system 100 shown is for example only and is not intended to limit the technical solutions of this application. Those skilled in the art will appreciate that, in a specific implementation, the power supply fan anti-reversal capability testing system 100 may also include other devices without limitation.

[0025] The embodiment of the present application provides a method for testing the anti-reversal capability of a power supply fan, which is applied to a server 101, such as Figure 2 As shown, Figure 2 This is a flow chart of a method for testing the anti-reversal capability of a power supply fan provided in an embodiment of the present application. The method for testing the anti-reversal capability of a power supply fan includes the following steps: S201, receiving a test instruction sent by a client.

[0026] The test instruction is used to instruct to test the anti-reversal capability of the power supply fan to the system fan. The test instruction carries test rules and data collection rules corresponding to each test scenario in the plurality of test scenarios.

[0027] The multiple test scenarios include a dynamic stress test scenario, a dynamic speed adjustment test scenario, a dynamic power redundancy test scenario, a power cycle test scenario, a power on / off cycle test scenario, a first combination test scenario corresponding to the dynamic stress test scenario and the dynamic power redundancy test scenario, and a second combination test scenario corresponding to the dynamic speed adjustment test scenario and the dynamic power redundancy test scenario. These multiple test scenarios cover the full server load cycle, meaning they correspond to all scenarios where the system fan speed varies.

[0028] The test rules corresponding to each test scenario may be the number of test tasks and the test duration of each test task.

[0029] The data collection rules corresponding to each test scenario may be the collection frequency of the actual indicator value of the test indicator and the type of the test indicator during the execution of each test task.

[0030] Exemplarily, the client generates a test instruction in response to the number of test tasks and the test duration of each test task set by the tester on the client, and sends it to the server; the server receives the test instruction and parses it to obtain the number of test tasks and the test duration of each test task.

[0031] S202 : According to the test rules corresponding to each test scenario, a plurality of target test tasks corresponding to the test scenario are run in the test scenario.

[0032] In one example, the server determines multiple target test tasks in the task pool corresponding to the test scenario based on the number of test tasks corresponding to each test scenario and the test duration of each test task; and runs the multiple target test tasks corresponding to the test scenario.

[0033] S203 , collecting the actual indicator value of each target test indicator among the multiple target test indicators according to the data collection rules during the execution of each target test task.

[0034] Among them, multiple target test indicators include power supply fan speed, power supply temperature, power supply power consumption and ambient temperature.

[0035] For example, taking the data collection rule as a collection frequency of three times per second and the test indicator type as power supply fan speed and power supply temperature, the server collects the power supply fan speed, power supply temperature, power supply power consumption and ambient temperature three times per second during the execution of each target test task, and obtains multiple actual indicator values ​​corresponding to the power supply fan speed, power supply temperature, power supply power consumption and ambient temperature.

[0036] S204: extracting a benchmark indicator value corresponding to each target test indicator from a pre-built mapping table.

[0037] The mapping table includes multiple correspondences, each of which is a correspondence between a power supply fan speed, a power supply temperature, a power supply power consumption, and an ambient temperature.

[0038] The benchmark indicator value corresponding to the first target test indicator is the benchmark indicator value corresponding to each target test indicator under the actual indicator values ​​corresponding to the other target test indicators except the first target test indicator. The first target test indicator is any one of the multiple target test indicators.

[0039] For example, taking the first target test indicator as the power supply fan speed, other target test indicators including power supply temperature, power supply power consumption, ambient temperature, the actual indicator value of the power supply temperature being the first indicator value, the actual indicator value of the power supply power consumption being the second indicator value, and the actual indicator value of the ambient temperature being the third indicator value as an example, the server extracts from the pre-built mapping table the benchmark indicator value corresponding to the power supply fan speed when the ambient temperature is the third indicator value, the power supply temperature is the first indicator value, and the power supply power consumption is the second indicator value.

[0040] S205: Determine whether the anti-reversal capability of the power supply fan is abnormal based on the actual indicator value and the reference indicator value.

[0041] In one example, the server compares the actual index value and the benchmark index value. If the difference between the actual index value and the benchmark index value is greater than the target value, it is determined that the anti-reversal capability of the power supply fan is abnormal; if the difference between the actual index value and the benchmark index value is less than or equal to the target value, it is determined that the anti-reversal capability of the power supply fan is normal.

[0042] The target value can be set according to actual needs and is not limited. For example, the target value can be the product of the benchmark indicator value and a preset coefficient. The preset coefficient can be any coefficient within a preset coefficient range. The preset coefficient range can be between 0.95 and 1.05.

[0043] Optionally, based on the actual indicator value and the benchmark indicator value, determine whether the power supply fan's anti-reverse capability is abnormal, including: In one example, in each of multiple test scenarios, the difference between the actual indicator value and the benchmark indicator value corresponding to the power supply fan speed, power supply temperature and power supply power consumption of each target test task in the multiple target test tasks corresponding to each test scenario is calculated; the ratio between each difference and the corresponding benchmark indicator value is calculated to obtain the deviation corresponding to the power supply fan speed, power supply temperature and power consumption of each target test task.

[0044] In one example, when the deviation corresponding to the power supply temperature in each target test task is greater than a first threshold, it is determined that the anti-reversal capability of the power supply fan is abnormal.

[0045] In another example, when the deviation corresponding to the power consumption in each target test task is greater than the second threshold, or the deviation corresponding to the power fan speed in each target test task is greater than the third threshold, a first weight value corresponding to the power fan speed, a second weight value corresponding to the power temperature, and a third weight value corresponding to the power consumption are obtained; based on the deviation corresponding to the power fan speed, power temperature, and power consumption corresponding to each target test task, as well as the first weight value, the second weight value, and the third weight value, the abnormality score of each target test task is obtained. When there is a target test task with an abnormality score greater than the preset comprehensive threshold, it is determined that the anti-reversal capability of the power fan is abnormal.

[0046] Among them, the first weight value is greater than the second weight value; the second weight value is greater than the third weight value.

[0047] Specifically, the expression corresponding to the anomaly score of each target test task can be as follows:

[0048] in, is the abnormal score; is the first weight; is the deviation corresponding to the power supply fan speed; is the second weight; is the deviation corresponding to the power supply temperature; is the third weight; is the deviation corresponding to the power consumption.

[0049] Understandably, since power supply temperature directly affects the safety of servers and power supply fans, high temperatures can directly cause power supply burnout or server downtime. Therefore, when the power supply temperature deviation exceeds the first threshold, the power supply fan's anti-reversal capability is determined to be abnormal. To avoid misjudgments of power supply fan speed and power consumption deviations due to a single non-fatal abnormality, weights are combined to reflect the importance of each test indicator. A weighted calculation comprehensively assesses whether the power supply fan is abnormal. This is more consistent with the synergistic influence of multiple indicators in real-world scenarios and improves test accuracy.

[0050] based on Figure 2 According to the method shown, the server can run multiple target test tasks corresponding to the test scenarios in the test scenarios according to the test rules corresponding to each test scenario in the multiple test scenarios; collect the actual indicator value of each target test indicator in the multiple target test indicators according to the data collection rules during the running of each target test task; extract the benchmark indicator value corresponding to each target test indicator from the pre-built mapping table; and determine whether the anti-reversal ability of the power supply fan is abnormal based on the actual indicator value and the benchmark indicator value.

[0051] Because the server can test the power supply fan's anti-reversal capability under multiple test scenarios, each covering the server's full load cycle—that is, all situations where the system fan's wind speed or airflow varies—this allows for targeted testing of the power supply fan's anti-reversal capability across the server's full load cycle, improving test coverage and ensuring server factory quality. Furthermore, since this is a direct test of the power supply fan, it can accurately determine if a server's cooling issues are caused by poor anti-reversal capability. Furthermore, the use of automated testing processes and methods avoids potential misjudgments that could arise from manual observation and judgment, saving labor costs and improving the level of factory automated testing.

[0052] In an optional example, based on the above embodiment, as described above, when the test scenario is a dynamic stress test scenario, according to the test rules corresponding to each test scenario, multiple target test tasks corresponding to the test scenario are run in the test scenario. The following method steps are specifically referred to. Figure 3 As shown, Figure 3 A flow chart of a testing method in a dynamic stress testing scenario provided in an embodiment of the present application includes: S301 , randomly selecting a first number of subtasks from at least one type of test tasks in a task pool corresponding to the dynamic stress test scenario according to a test rule corresponding to the dynamic stress test scenario as target test tasks.

[0053] The test rules corresponding to the dynamic stress test scenario include a first number of target test tasks and a test duration of each target test task in the first number of target test tasks.

[0054] The task pool corresponding to the dynamic stress test scenario includes multiple types of test tasks. Each type of test task includes a different number of server components to be stress tested. The number of components included in each type of test task and the total number of components determine the number of subtasks included in each type of test task.

[0055] The multiple types of test tasks may include a first type of test task, a second type of test task, a third type of test task, and a fourth type of test task. As shown in Table 1 below, Table 1 includes multiple types of test tasks.

[0056] Table 1

[0057] Each test task in the first category is to perform stress testing on a component of the server.

[0058] Each test task in the second category is to perform stress tests on two components of the server at the same time.

[0059] Each test task in the third category is to perform pressure tests on three components at the same time.

[0060] Each test task in the fourth category performs stress testing on all components of the server at the same time.

[0061] S302 , in a dynamic stress test scenario, running the i th target test task according to the test duration of the i th target test task, and terminating the operation after the first number of target test tasks are all completed.

[0062] Wherein, i is a positive integer.

[0063] In one example, the test instruction also carries system fan speed control mode information. In a dynamic stress test scenario, the server sets the system fan speed control mode to automatic speed control mode based on the system fan speed control mode information, runs the i-th target test task according to the test duration of the i-th target test task, and terminates the operation after all target test tasks of the first number of tasks have been completed.

[0064] Understandably, the pressures faced by real servers during operation often change dynamically, leading to dynamic changes in the airflow generated by system fans. Therefore, in stress testing scenarios, by randomly selecting target test tasks from multiple categories, we can simulate the "mixed loads" that occur in actual server operation. This avoids the disconnect between the "single load mode" in static testing and the real-world scenario, ensuring that the airflow generated by system fans matches actual operating conditions and improving the accuracy of the power supply fan's anti-reversal capability test.

[0065] In an optional example, based on the above embodiment, as described above, when the test scenario is a dynamic speed adjustment test scenario, according to the test rules corresponding to each test scenario, multiple target test tasks corresponding to the test scenario are run in the test scenario. The following method steps are specifically referred to. Figure 4 As shown, Figure 4A flow chart of a test method for dynamically adjusting the speed test scenario provided in an embodiment of the present application includes: S401 : Selecting a second number of target test tasks from a task pool corresponding to the dynamic speed adjustment test scenario according to a test rule corresponding to the dynamic speed adjustment test scenario.

[0066] The test rules corresponding to the dynamic speed adjustment test scenario include a second task quantity of the plurality of target test tasks and a test duration of each target test task in the second task quantity of the target test tasks.

[0067] The task pool corresponding to the dynamic speed adjustment test scenario includes multiple test tasks, and the speeds of the system fans corresponding to every two test tasks in the multiple test tasks are different.

[0068] For example, in multiple test tasks, the rotation speed of the system fan starts from 10% of the maximum rotation speed of the system fan, and each 5% increase in the rotation speed corresponds to one test task until the maximum rotation speed of the system fan is reached.

[0069] The difference in rotational speed of the system fan corresponding to each two target test tasks in the second number of target test tasks is greater than a first threshold. The first threshold can be set based on the maximum rotational speed of the system fan. For example, the first threshold can be 10% of the maximum rotational speed of the system fan.

[0070] Understandably, in the dynamic speed adjustment test scenario, selecting the second number of tasks from the task pool based on the test rules and stipulating that the speed difference between adjacent selected tasks is greater than the first threshold can avoid selecting tasks with similar speeds. This helps to focus on testing the impact of system fans on the power supply fans under significantly different speed conditions, preventing wasted testing resources in similar scenarios and thus improving the rationality and pertinence of the test.

[0071] S402 , in a dynamic speed adjustment test scenario, running the jth target test task according to the test duration of the jth target test task, and ending the operation after the second number of target test tasks are all completed.

[0072] Wherein, j is a positive integer.

[0073] In one example, the test instruction also carries system fan speed control mode information. In a dynamic speed adjustment test scenario, the server sets the system fan speed control mode to manual speed control mode based on the system fan speed control mode information, runs the jth target test task according to the test duration of the jth target test task, and terminates the operation after all the second number of target test tasks have been completed.

[0074] Understandably, changes in system fan speed can cause changes in system cooling and internal load. By testing under various speed variations for specified durations, we can more easily capture the impact of speed adjustments on the power supply fan, improve the accuracy of the power supply fan's anti-reversal capability test, increase the likelihood of discovering hidden issues, and help improve server reliability.

[0075] In an optional example, based on the above embodiment, as described above, when the test scenario is a power redundancy dynamic test scenario, according to the test rules corresponding to each test scenario, multiple target test tasks corresponding to the test scenario are run in the test scenario, as follows: Figure 5 As shown, Figure 5 A flowchart of a test method for a power redundancy dynamic test scenario provided in an embodiment of the present application includes: S501, according to the test rules corresponding to the power redundancy dynamic test scenario, in the task pool corresponding to the power redundancy dynamic test scenario, test tasks equal to the number of the third task are selected alternately from the single power supply type test tasks and the dual power supply type test tasks as target test tasks.

[0076] The test rules corresponding to the power redundancy dynamic test scenario include a third number of target test tasks and a test duration of each target test task in the third number of target test tasks.

[0077] The task pool for the power redundancy dynamic test scenario includes single-power supply test tasks and dual-power supply test tasks. Single-power supply test tasks are tested when either of the server's two power supplies is operating alone. Dual-power supply test tasks are tested when both power supplies are operating.

[0078] It can be understood that the target test tasks of the third task quantity include dual power supply test tasks, single power supply test tasks, dual power supply test tasks, single power supply test tasks, dual power supply test tasks, single power supply test tasks, etc.

[0079] S502 , in a power redundancy dynamic test scenario, running the kth target test task according to the test duration of the kth target test task, and ending the operation after a third number of target test tasks are all completed.

[0080] Wherein, k is a positive integer.

[0081] Understandably, dynamic power redundancy testing, alternating between single and dual power modes, comprehensively tests the server's fan's ability to withstand reverse rotation under different power supply conditions, avoiding the blind spots associated with testing in a single power supply mode. Furthermore, alternating dual and single power supply testing tasks more closely resembles real-world server applications, specifically the actual operation of system fans, making the test results more valuable for practical use.

[0082] In an optional example, based on the above embodiment, as described above, when the test scenario is a power cycle test scenario, according to the test rules corresponding to each test scenario, multiple target test tasks corresponding to the test scenario are run in the test scenario. The following method steps are specifically referred to. Figure 6 As shown, Figure 6 A flow chart of a test method for a power cycle test scenario provided in an embodiment of the present application includes: S601, according to the test rules corresponding to the power-on and power-off test scenario, in the task pool corresponding to the power-on and power-off test scenario, test tasks equal to the number of the fourth task are selected alternately from the power-on test tasks and the power-off test tasks as target test tasks.

[0083] The test rules corresponding to the power cycle test scenario include a fourth number of target test tasks and a test duration of each target test task in the fourth number of target test tasks.

[0084] The task pool corresponding to the power cycle test scenario includes power-on test tasks and power-off test tasks.

[0085] S602 , in a power cycle test scenario, running the nth target test task according to the test duration of the nth target test task, and ending the operation after the fourth number of target test tasks are all completed.

[0086] Wherein, n is a positive integer.

[0087] Understandably, in a power cycling test scenario, alternating between power-on and power-off states comprehensively tests the power supply fan's ability to withstand repeated power switching, avoiding test vulnerabilities caused by single-state testing. Furthermore, in real-world scenarios, servers may frequently undergo power cycling due to routine maintenance, faulty reboots, power grid fluctuations, and other factors. Alternating between power-on and power-off testing tasks more closely reflects the real-world use of system fans, further revealing potential issues with the power supply fan's ability to withstand repeated power cycling.

[0088] In an optional example, based on the above embodiment, as described above, when the test scenario is a power cycle test scenario, according to the test rules corresponding to each test scenario, multiple target test tasks corresponding to the test scenario are run in the test scenario. The following method steps are specifically referred to. Figure 7 As shown, Figure 7 A flowchart of a test method for a power cycle test scenario provided in an embodiment of the present application includes: S701, according to the test rules corresponding to the power on / off cycle test scenario, in the task pool corresponding to the power on / off cycle test scenario, test tasks equal to the number of the fifth task are selected alternately from the power on test tasks and the power off test tasks as target test tasks.

[0089] The test rules corresponding to the power on / off cycle test scenario include a fifth number of target test tasks and a test duration of each target test task in the fifth number of target test tasks.

[0090] The task pool corresponding to the power cycle test scenario includes power-on test tasks and power-off test tasks.

[0091] S702 , in a power cycle test scenario, running the mth target test task according to the test duration of the mth target test task, and ending the operation after the fifth number of target test tasks are all completed.

[0092] Wherein, m is a positive integer.

[0093] Understandably, alternating between power-on and power-off testing in a power-on / off cycle test scenario systematically tests the power supply fan's ability to withstand repeated power-off cycles, avoiding incomplete testing due to single-operation testing. Furthermore, in actual use, servers may be frequently powered on and off for system updates, feature debugging, troubleshooting, and other needs. Alternating between power-on and power-off testing tasks simulates this high-frequency cycling scenario, particularly highlighting issues with the power supply fan's ability to withstand repeated power-off cycles that may arise during long-term use.

[0094] In an optional example, based on the above embodiment, as described above, when the test scenario is the first combined test scenario, according to the test rules corresponding to each test scenario, multiple target test tasks corresponding to the test scenario are run in the test scenario. The following method steps are specifically referred to. Figure 8 As shown, Figure 8 A flowchart of a testing method for a first combined testing scenario provided in an embodiment of the present application includes: S801 , randomly selecting a sixth number of subtasks from at least one type of test task in a task pool corresponding to a dynamic stress test scenario according to a test rule corresponding to a first combination test scenario as target test tasks.

[0095] S802 , alternately generate a first number of dual-power supply type test tasks and a second number of single-power supply type test tasks from the sixth number of test tasks.

[0096] Among them, the total number of the first quantity and the second quantity is the sixth task quantity, and the first quantity is one more than the second quantity.

[0097] S803 , in the first combined test scenario, run the hth target test task according to the test duration of the hth target test task, and end the operation after the sixth number of target test tasks are all completed.

[0098] Wherein, h is a positive integer.

[0099] In one example, in the first combination test scenario, the server sets the system fan speed control mode to automatic speed control mode based on the system fan speed control mode information, runs the hth target test task according to the test duration of the hth target test task, and ends the operation after the sixth number of target test tasks are completed.

[0100] It can be understood that in the first combination test scenario, the dynamic changes in the server load are simulated, and the power supply mode is alternating, so that in this process, the operating conditions of the system fan are closer to the actual server operation. The power supply mode may be dynamically switched due to failures, load changes, etc., and the tasks processed at the same time also have random and complex scenarios, which makes it possible to fully test the power supply fan's anti-reversal ability in complex scenarios such as power state switching and task load fluctuations.

[0101] In an optional example, based on the above embodiment, as described above, when the test scenario is the second combined test scenario, according to the test rules corresponding to each test scenario, multiple target test tasks corresponding to the test scenario are run in the test scenario, as follows: Figure 9 As shown, Figure 9 A flow chart of a testing method for the second combined testing scenario provided in an embodiment of the present application includes: S901 : Selecting a seventh number of test tasks from a task pool corresponding to a dynamic speed adjustment test scenario according to a test rule corresponding to the second combination test scenario.

[0102] Among them, the rotational speed difference of the system fan corresponding to every two test tasks in the seventh number of test tasks is greater than the second threshold.

[0103] The test rules corresponding to the second combination test scenario include a seventh number of target test tasks and a test duration of each target test task in the seventh number of target test tasks.

[0104] S902 , alternately generate the seventh number of test tasks into a third number of dual-power supply type test tasks and a fourth number of single-power supply type test tasks.

[0105] Among them, the total of the third quantity and the fourth quantity is the seventh task quantity, and the third quantity is one more than the fourth quantity.

[0106] S903, in the second combined test scenario, run the pth target test task according to the test duration of the pth target test task, and end the operation after the seventh number of target test tasks are all completed.

[0107] Wherein, p is a positive integer.

[0108] In one example, in the second combination test scenario, the server sets the system fan speed control mode to manual speed control mode based on the system fan speed control mode information, runs the pth target test task according to the test duration of the pth target test task, and ends the operation after the seventh number of target test tasks are completed.

[0109] Understandably, the second combined test scenario simulates dynamic changes in system fan speed and alternating power supply modes, making the system fan's operating conditions more realistic in actual use. Server fan speed dynamically adjusts with load and ambient temperature, and the power supply mode may change due to failures or maintenance. This allows the power supply fan's ability to withstand reversal in complex scenarios such as power state switching and system fan speed changes.

[0110] Through the description of the above implementation methods, those skilled in the art can clearly understand that the method according to the above embodiment can be implemented by means of software plus the necessary general hardware platform, and of course it can also be implemented by hardware, but in many cases the former is a better implementation method.

[0111] The embodiment of the present application further provides a server, the server including a power supply fan and a system fan; Figure 10 As shown, Figure 10 This is a block diagram of a server device structure provided in an embodiment of the present application; the server includes: The transceiver module 1001 is used to receive a test instruction sent by the client, where the test instruction is used to instruct to test the anti-reversal capability of the power supply fan to the system fan, wherein the test instruction carries test rules and data collection rules corresponding to each test scenario in multiple test scenarios.

[0112] The processing module 1002 is configured to run a plurality of target test tasks corresponding to each test scenario in the test scenario according to the test rules corresponding to each test scenario.

[0113] The collection module 1003 is used to collect the actual indicator value of each target test indicator among multiple target test indicators according to data collection rules during the execution of each target test task.

[0114] The processing module 1002 is further configured to extract a benchmark indicator value corresponding to each target test indicator from a pre-built mapping table; and determine whether the anti-reversal capability of the power supply fan is abnormal based on the actual indicator value and the benchmark indicator value.

[0115] In some optional embodiments, when the test scenario is a dynamic stress testing scenario, the test rules corresponding to the dynamic stress testing scenario include the first number of target test tasks and the test duration of each target test task in the first number of target test tasks; the task pool corresponding to the dynamic stress testing scenario includes multiple types of test tasks, each type of test task includes a different number of server components to be stress tested, and the number of components included in each type of test task and the total number of components are used to determine the number of subtasks included in each type of test task; the processing module 1002 is specifically used to randomly select the first number of subtasks from at least one type of test task as target test tasks in the task pool corresponding to the dynamic stress testing scenario according to the test rules corresponding to the dynamic stress testing scenario; in the dynamic stress testing scenario, run the i-th target test task according to the test duration of the i-th target test task, and terminate the operation after all the first number of target test tasks have been completed, where i is a positive integer.

[0116] In some optional embodiments, when the test scenario is a dynamically adjusted speed test scenario, the test rules corresponding to the dynamically adjusted speed test scenario include a second task quantity of multiple target test tasks, and a test duration of each target test task in the second task quantity of target test tasks; the task pool corresponding to the dynamically adjusted speed test scenario includes multiple test tasks, and the speeds of the system fans corresponding to every two test tasks in the multiple test tasks are different; the processing module 1002 is specifically used to select the second task quantity of target test tasks in the task pool corresponding to the dynamically adjusted speed test scenario according to the test rules corresponding to the dynamically adjusted speed test scenario, and the speed difference of the system fans corresponding to every two target test tasks in the second task quantity of target test tasks is greater than a first threshold; in the dynamically adjusted speed test scenario, run the jth target test task according to the test duration of the jth target test task, and end the operation after all the target test tasks of the second task quantity have been completed, where j is a positive integer.

[0117] In some optional embodiments, when the test scenario is a power redundancy dynamic test scenario, the test rules corresponding to the power redundancy dynamic test scenario include the third task quantity of multiple target test tasks, and the test duration of each target test task in the third task quantity of target test tasks; the task pool corresponding to the power redundancy dynamic test scenario includes single power supply type test tasks and dual power supply type test tasks; the processing module 1002 is specifically used to, according to the test rules corresponding to the power redundancy dynamic test scenario, alternately select test tasks equal to the third task quantity from single power supply type test tasks and dual power supply type test tasks in the task pool corresponding to the power redundancy dynamic test scenario as target test tasks; in the power redundancy dynamic test scenario, run the kth target test task according to the test duration of the kth target test task, and terminate the operation after all the target test tasks of the third task quantity are completed, where k is a positive integer.

[0118] In some optional embodiments, when the test scenario is a power cycle test scenario, the test rules corresponding to the power cycle test scenario include the fourth task quantity of multiple target test tasks, and the test duration of each target test task in the fourth task quantity of target test tasks; the task pool corresponding to the power cycle test scenario includes power-on test tasks and power-off test tasks; the processing module 1002 is specifically used to, according to the test rules corresponding to the power cycle test scenario, alternately select test tasks equal to the fourth task quantity from the power-on test tasks and the power-off test tasks in the task pool corresponding to the power cycle test scenario as target test tasks; in the power cycle test scenario, run the nth target test task according to the test duration of the nth target test task, and terminate the operation after all the target test tasks of the fourth task quantity have been completed, where n is a positive integer.

[0119] In some optional embodiments, when the test scenario is a power on / off cycle test scenario, the test rules corresponding to the power on / off cycle test scenario include the fifth task quantity of multiple target test tasks, and the test duration of each target test task in the fifth task quantity of target test tasks; the task pool corresponding to the power on / off cycle test scenario includes power on test tasks and power off test tasks; the processing module 1002 is specifically used to select test tasks equal to the fifth task quantity from the power on test tasks and the power off test tasks in the task pool corresponding to the power on / off cycle test scenario according to the test rules corresponding to the power on / off cycle test scenario; in the power on / off cycle test scenario, run the mth target test task according to the test duration of the mth target test task, and terminate the operation after all the target test tasks of the fifth task quantity have been completed, where m is a positive integer.

[0120] In some optional embodiments, when the test scenario is a first combination test scenario corresponding to a dynamic stress test scenario and a power supply redundancy dynamic test scenario, the test rules corresponding to the first combination test scenario include a sixth number of tasks of multiple target test tasks, and a test duration of each target test task in the sixth number of target test tasks; the processing module 1002 is specifically used to randomly select a sixth number of subtasks as target test tasks from at least one type of test task in the task pool corresponding to the dynamic stress test scenario according to the test rules corresponding to the first combination test scenario; the sixth number of test tasks is alternately generated into a first number of dual-power supply type test tasks and a second number of single-power supply type test tasks, the total number of the first number and the second number being the sixth number of tasks, and the first number being one more than the second number; in the first combination test scenario, the hth target test task is run according to the test duration of the hth target test task, and the operation is terminated after all the sixth number of target test tasks are completed, where h is a positive integer.

[0121] In some optional embodiments, when the test scenario is a second combination test scenario corresponding to a dynamic speed adjustment test scenario and a power redundancy dynamic test scenario, the test rules corresponding to the second combination test scenario include a seventh number of tasks of multiple target test tasks, and a test duration of each target test task in the seventh number of target test tasks; the processing module 1002 is specifically used to select a seventh number of test tasks from the task pool corresponding to the dynamic speed adjustment test scenario according to the test rules corresponding to the second combination test scenario, and the speed difference of the system fan corresponding to every two test tasks in the seventh number of test tasks is greater than a second threshold; the seventh number of test tasks is alternately generated into a third number of dual-power supply test tasks and a fourth number of single-power supply test tasks, the total number of the third and fourth numbers is the seventh number of tasks, and the third number is one more than the fourth number; in the second combination test scenario, the pth target test task is run according to the test duration of the pth target test task, and the operation is terminated after the seventh number of target test tasks are all completed, where p is a positive integer.

[0122] In some optional implementations, determining whether the anti-reversal capability of the power supply fan is abnormal is performed based on the actual index value and the benchmark index value, including: if the difference between the actual index value and the benchmark index value is greater than the target value, determining that the anti-reversal capability of the power supply fan is abnormal.

[0123] For descriptions of features in the embodiment corresponding to the device for testing the anti-reversal capability of a power supply fan, reference may be made to the descriptions of the embodiment corresponding to the method for testing the anti-reversal capability of a power supply fan, which will not be described in detail here.

[0124] The embodiment of the present application also provides a server, such as Figure 11 As shown, Figure 11 A schematic diagram of the hardware structure of a server provided in an embodiment of the present application. The server includes a processor 10 and a memory 20. The memory 20 stores a computer program. The processor 10 is configured to execute the computer program to perform the steps of any of the above-mentioned embodiments of the method for testing the anti-reversal capability of a power supply fan.

[0125] An embodiment of the present application further provides a computer-readable storage medium storing a computer program, wherein the computer program is configured to execute the steps of any of the above-mentioned embodiments of the method for testing the anti-reversal capability of a power supply fan when running.

[0126] In an exemplary embodiment, the computer-readable storage medium may include, but is not limited to, various media that can store computer programs, such as a USB flash drive, a read-only memory (ROM), a random access memory (RAM), a mobile hard disk, a magnetic disk, or an optical disk.

[0127] An embodiment of the present application further provides a computer program product, which includes a computer program. When the computer program is executed by a processor, the steps in any of the above-mentioned methods for testing the anti-reversal capability of a power supply fan are implemented.

[0128] An embodiment of the present application also provides another computer program product, including a non-volatile computer-readable storage medium, which stores a computer program. When the computer program is executed by a processor, it implements the steps in any of the above-mentioned test methods for the anti-reversal capability of a power supply fan.

[0129] Professionals may further appreciate that the units and algorithm steps of each example described in conjunction with the embodiments disclosed herein can be implemented in electronic hardware, computer software, or a combination of the two. In order to clearly illustrate the interchangeability of hardware and software, the above description has generally described the components and steps of each example according to their functions. Whether these functions are performed in hardware or software depends on the specific application and design constraints of the technical solution. Professionals and technicians may use different methods to implement the described functions for each specific application, but such implementation should not be considered beyond the scope of this application.

[0130] The above is a detailed introduction to the test method and server for the anti-reversal capability of a power supply fan provided by this application. This article uses specific examples to illustrate the principles and implementation methods of this application. The description of the above embodiments is only used to help understand the method and core ideas of this application. It should be pointed out that for ordinary technicians in this technical field, without departing from the principles of this application, several improvements and modifications can be made to this application, and these improvements and modifications also fall within the scope of protection of the claims of this application.

Claims

1. A method for testing the anti-reversal capability of a power supply fan, characterized in that: The method is applied to a server, wherein the server includes a power supply fan and a system fan; the method includes: receiving a test instruction sent by a client, the test instruction being used to instruct a test of the anti-reversal capability of the power supply fan to the system fan, wherein the test instruction carries a test rule and a data collection rule corresponding to each of the multiple test scenarios; According to the test rules corresponding to each test scenario, executing multiple target test tasks corresponding to the test scenario in the test scenario; During the execution of each target test task, the actual indicator value of each target test indicator in the plurality of target test indicators is collected according to the data collection rule; Extracting a benchmark indicator value corresponding to each of the target test indicators from a pre-built mapping table; It is determined whether the anti-reversal capability of the power supply fan is abnormal according to the actual indicator value and the reference indicator value.

2. The method according to claim 1, characterized in that When the test scenario is a dynamic stress test scenario, the test rules corresponding to the dynamic stress test scenario include a first task quantity of multiple target test tasks and a test duration of each target test task in the target test tasks of the first task quantity; the task pool corresponding to the dynamic stress test scenario includes multiple types of test tasks, each type of test task includes a different number of server components to be stress tested, and the number of components and the total number of components included in each type of test task determine the number of subtasks included in each type of test task; The step of running a plurality of target test tasks corresponding to each test scenario in the test scenario according to the test rules respectively corresponding to the test scenario includes: According to the test rule corresponding to the dynamic stress test scenario, randomly selecting the first number of subtasks from at least one type of test task in the task pool corresponding to the dynamic stress test scenario as the target test tasks; In the dynamic stress test scenario, the i-th target test task is run according to the test duration of the i-th target test task, and the operation is terminated after all the target test tasks of the first number of tasks are completed, where i is a positive integer.

3. The method according to claim 2, characterized in that When the test scenario is a dynamic speed adjustment test scenario, the test rule corresponding to the dynamic speed adjustment test scenario includes a second task quantity of multiple target test tasks, and a test duration of each target test task in the second task quantity of target test tasks; the task pool corresponding to the dynamic speed adjustment test scenario includes multiple test tasks, and the speed of the system fan corresponding to every two test tasks in the multiple test tasks is different; The step of running a plurality of target test tasks corresponding to each test scenario in the test scenario according to the test rules respectively corresponding to the test scenario includes: According to the test rule corresponding to the dynamic speed adjustment test scenario, selecting the second number of target test tasks from the task pool corresponding to the dynamic speed adjustment test scenario, wherein a speed difference of the system fan corresponding to every two target test tasks in the second number of target test tasks is greater than a first threshold; In the dynamic speed adjustment test scenario, the jth target test task is run according to the test duration of the jth target test task, and the operation is terminated after all the target test tasks of the second number of tasks are completed, where j is a positive integer.

4. The method according to claim 3, characterized in that When the test scenario is a power redundancy dynamic test scenario, the test rules corresponding to the power redundancy dynamic test scenario include a third task quantity of multiple target test tasks, and a test duration of each target test task in the third task quantity of target test tasks; the task pool corresponding to the power redundancy dynamic test scenario includes single power supply type test tasks and dual power supply type test tasks; The step of running a plurality of target test tasks corresponding to each test scenario in the test scenario according to the test rules respectively corresponding to the test scenario includes: According to the test rule corresponding to the power redundancy dynamic test scenario, in the task pool corresponding to the power redundancy dynamic test scenario, test tasks equal in number to the third task are alternately selected from the single power supply test tasks and the dual power supply test tasks in sequence as the target test tasks; In the power redundancy dynamic test scenario, the kth target test task is run according to the test duration of the kth target test task, and the operation is terminated after the target test tasks of the third number of tasks are all completed, where k is a positive integer.

5. The method according to any one of claims 1 to 4, characterized in that When the test scenario is a power cycle test scenario, the test rule corresponding to the power cycle test scenario includes a fourth task number of the plurality of target test tasks, and a test duration of each of the target test tasks in the fourth task number of target test tasks; The task pool corresponding to the power-on and power-off cycle test scenario includes power-on test tasks and power-off test tasks; The step of running a plurality of target test tasks corresponding to each test scenario in the test scenario according to the test rules respectively corresponding to the test scenario includes: According to the test rule corresponding to the power-on / off cycle test scenario, in the task pool corresponding to the power-on / off cycle test scenario, test tasks equal in number to the fourth task are alternately selected from the power-on test tasks and the power-off test tasks in sequence as target test tasks; In the power cycle test scenario, the nth target test task is run according to the test duration of the nth target test task, and the operation is terminated after the fourth number of target test tasks are all completed, where n is a positive integer.

6. The method according to any one of claims 1 to 4, characterized in that When the test scenario is a power-on / off cycle test scenario, the test rule corresponding to the power-on / off cycle test scenario includes a fifth task quantity of a plurality of target test tasks, and a test duration of each target test task in the fifth task quantity of target test tasks; The task pool corresponding to the power cycle test scenario includes power-on test tasks and power-off test tasks; The step of running a plurality of target test tasks corresponding to each test scenario in the test scenario according to the test rules respectively corresponding to the test scenario includes: According to the test rule corresponding to the power on / off cycle test scenario, in the task pool corresponding to the power on / off cycle test scenario, test tasks equal in number to the fifth task are alternately selected from the power on test tasks and the power off test tasks in sequence as target test tasks; In the power on / off cycle test scenario, the mth target test task is run according to the test duration of the mth target test task, and the operation is terminated after all the target test tasks of the fifth number of tasks are completed, where m is a positive integer.

7. The method according to claim 4, characterized in that When the test scenario is a first combined test scenario corresponding to the dynamic stress test scenario and the power redundancy dynamic test scenario, the test rule corresponding to the first combined test scenario includes a sixth task quantity of multiple target test tasks, and a test duration of each target test task in the sixth task quantity of target test tasks; The step of running a plurality of target test tasks corresponding to each test scenario in the test scenario according to the test rules respectively corresponding to the test scenario includes: According to the test rule corresponding to the first combined test scenario, randomly selecting the sixth number of subtasks from the at least one type of test task in the task pool corresponding to the dynamic stress test scenario as the target test tasks; Alternately generate a first number of dual-power supply test tasks and a second number of single-power supply test tasks from the sixth number of test tasks, wherein the total number of the first number and the second number is the sixth number of tasks, and the first number is one more than the second number; In the first combination test scenario, the hth target test task is run according to the test duration of the hth target test task, and the operation is terminated after all the target test tasks of the sixth number of tasks are completed, where h is a positive integer.

8. The method according to claim 4, characterized in that When the test scenario is a second combined test scenario corresponding to the dynamic speed adjustment test scenario and the power redundancy dynamic test scenario, the test rule corresponding to the second combined test scenario includes a seventh task number of the plurality of target test tasks, and a test duration of each of the target test tasks in the seventh task number of target test tasks; The step of running a plurality of target test tasks corresponding to each test scenario in the test scenario according to the test rules respectively corresponding to the test scenario includes: selecting, according to the test rule corresponding to the second combined test scenario, the seventh number of test tasks from the task pool corresponding to the dynamic speed adjustment test scenario, wherein a speed difference between each two of the seventh number of test tasks corresponding to the system fans is greater than a second threshold; Alternately generate a third number of dual-power supply test tasks and a fourth number of single-power supply test tasks from the seventh number of test tasks, wherein the total of the third number and the fourth number is the seventh number of tasks, and the third number is one more than the fourth number; In the second combination test scenario, the pth target test task is run according to the test duration of the pth target test task, and the operation is terminated after all the target test tasks of the seventh number of tasks are completed, where p is a positive integer.

9. The method according to claim 7 or 8, characterized in that The determining whether the anti-reversal capability of the power supply fan is abnormal based on the actual indicator value and the reference indicator value includes: if the difference between the actual indicator value and the reference indicator value is greater than a target value, determining that the anti-reversal capability of the power supply fan is abnormal.

10. A server, characterized in that: include: memory for storing computer programs; A processor is configured to implement the steps of the method for testing the anti-reversal capability of a power supply fan as claimed in any one of claims 1 to 9 when executing the computer program.

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