A stroboscopic spectrum-based multi-spot anti-jamming deformation measurement device and method

Abstract

The application discloses a kind of multi-light point anti-interference deformation measuring devices and methods based on stroboscopic spectroscopy, it is related to precision measurement technical field, including point light source, the lower portion of the point light source is provided with cylindrical mirror one, the lower portion of the cylindrical mirror one is provided with linear array sensor one, the linear array sensor one is electrically connected with data acquisition device, the light emitted by the point light source is focused into a line segment after passing through cylindrical mirror one and is imaged on linear array sensor one, the linear array sensor one converts the light signal of focused line segment and outputs digital signal to data acquisition device, in the application, the multi-light point anti-interference deformation measuring device is by applying cylindrical mirror, linear array sensor and point light source, establishes a kind of multi-dimensional displacement sensor measurement system, can realize high-precision, high-resolution and high sampling rate displacement measurement system, the related components are less, the appearance is small and exquisite, maintenance is simple, while cost is lower, system stability is high, more suitable for being used in engineering structure outdoor multi-point monitoring.

Description

Technical Field

[0001] This invention relates to the field of precision measurement technology, and in particular to a multi-spot anti-deformation measurement device and method based on stroboscopic energy spectrum. Background Technology

[0002] Displacement sensors, also known as deformation measurement devices, are crucial measurement tools widely used to detect the position, displacement, and motion of objects, playing an indispensable role in modern industry, scientific research, and daily life. Their widespread application stems from the strong demand for position and displacement information, which is of significant value in fields such as industrial automation, precision manufacturing, and structural health monitoring. As various industries continuously increase their requirements for measurement accuracy, response speed, reliability, and environmental adaptability, displacement sensor technology has developed rapidly and occupies a pivotal position in modern science and industry.

[0003] Currently, there are many types of displacement sensors, including strain gauge, inductive, differential transformer, grating, capacitive grating, laser, and fiber optic sensors. These sensors typically operate in direct contact with the surface of an object, measuring the displacement difference between the initial and final positions. However, these displacement sensors still have significant drawbacks in practical applications: 1. Limited measurement direction; 2. Limited environmental adaptability; 3. Insufficient dynamic response capability; 4. Installation and usage limitations. Furthermore, existing technologies struggle with cursor detection under complex lighting conditions or frequent environmental changes, leading to decreased measurement accuracy. These shortcomings limit the effectiveness of displacement sensors in complex, multidimensional displacement measurements, and also place higher demands on the accuracy, reliability, and environmental adaptability of these sensors. Summary of the Invention

[0004] The purpose of this invention is to address the shortcomings of existing technologies by proposing a multi-spot anti-interference deformation measurement device and method based on stroboscopic energy spectrum.

[0005] To achieve the above objectives, the present invention adopts the following technical solution:

[0006] A multi-spot anti-interference deformation measurement device based on stroboscopic energy spectrum includes a point light source, a cylindrical mirror disposed below the point light source, and a linear array sensor disposed below the cylindrical mirror. The linear array sensor is electrically connected to a data acquisition device. The light emitted by the point light source is focused into a line segment and imaged onto the linear array sensor after passing through the cylindrical mirror. The linear array sensor converts the light signal of the focused line segment into a digital signal and outputs it to the data acquisition device. The data acquisition device determines the position of the focused line segment on the linear array sensor based on the digital signal of the focused line segment on the linear array sensor, and calculates the position change of the focused line segment at different times. This position change corresponds one-to-one with the displacement of the point light source in the direction of the linear array sensor. Furthermore, the displacement of the point light source in the direction of the linear array sensor is calculated based on the imaging relationship.

[0007] Preferably, it also includes a beam splitter prism, which is located between the point light source and the cylindrical mirror prism. A cylindrical mirror prism 2 is disposed on one side of the beam splitter prism 1, and a linear array sensor 2 is disposed on the other side of the cylindrical mirror 2. The linear array sensor 2 is electrically connected to the data acquisition device. The cylindrical mirror 1, the linear array sensor 1, the beam splitter prism 1, the cylindrical mirror 2, and the linear array sensor 2 constitute a two-dimensional displacement sensor.

[0008] Preferably, the cylindrical mirror is a cylindrical mirror placed horizontally perpendicular to the direction of light illumination, and the cylindrical mirror has curvature in the vertical direction but no curvature in the horizontal direction.

[0009] The second cylindrical mirror is a cylindrical mirror placed perpendicular to the direction of light illumination. The second cylindrical mirror has no curvature in the vertical direction but has curvature in the horizontal direction.

[0010] Preferably, the first linear array sensor is a linear CCD, a linear CMOS, or a linear photon counting sensor, and the second linear array sensor is a linear CCD, a linear CMOS, or a linear photon counting sensor.

[0011] Preferably, it further includes a second beam splitter prism, a third cylindrical mirror is disposed below the second beam splitter prism, a third linear array sensor is disposed below the third cylindrical mirror, the third linear array sensor is electrically connected to a data acquisition device, the second beam splitter prism is located between the point light source and the third cylindrical mirror, a fourth cylindrical mirror is disposed on one side of the second beam splitter prism, a fourth linear array sensor is disposed on the other side of the fourth cylindrical mirror, and the fourth linear array sensor is electrically connected to the data acquisition device;

[0012] The cylindrical mirror 1, linear array sensor 1, beam splitter 1, cylindrical mirror 2, linear array sensor 2 and cylindrical mirror 3, linear array sensor 3, beam splitter 2, cylindrical mirror 4, linear array sensor 4 respectively constitute two two-dimensional displacement sensors. The two two-dimensional displacement sensors jointly image the point light source, and the two two-dimensional displacement sensors constitute a three-dimensional displacement sensor.

[0013] A multi-spot anti-interference deformation measurement method based on stroboscopic energy spectrum includes the following steps:

[0014] S1. Fix F point light sources with different flicker frequencies f(i) at the deformable points of interest positions of the target under test. If the target under test has multiple target planes, ensure that there are at least 2 point light sources in each target plane. The point light sources are active cursors;

[0015] S2. Select two active cursors with characteristics. These two active cursors are in the same target plane and are a certain distance apart in the direction of deformation to be measured. Use a standard measuring tool to measure the distance d1 between the two active cursors in the target plane in the direction of deformation to be measured.

[0016] S3. If the target to be measured has W different target planes, repeat S2 and measure the distance dw between the two active cursors in the deformation direction of the wth different target plane.

[0017] S4. The measuring device is aligned with the target to be measured. The linear array sensor one is parallel to the direction of deformation to be measured. F active cursors are simultaneously focused on the linear array sensor one through the cylindrical mirror one.

[0018] S5. Collect the pixel values ​​corresponding to one row of P pixels from the linear array sensor;

[0019] S6. Repeat S5 to collect N×P pixel values ​​corresponding to N rows and P pixels of the linear array sensor.

[0020] S7. Collect N×P pixel values ​​from the P-th pixel and perform frequency domain analysis based on short-time Fourier transform to obtain the energy spectrum of each pixel.

[0021] S8. Search for the energy value corresponding to the strobe frequency f(i) of the i-th active cursor on the energy spectrum signal of each pixel;

[0022] S9. Calculate the displacement value corresponding to the strobe frequency f(i) of the i-th active cursor based on the energy spectrum signal of each pixel;

[0023] S10. Repeat steps S5 to S9 to obtain the time-frequency displacement sequence D(i,t) of F active cursors with different stroboscopic frequencies f(i);

[0024] Preferably, in step S4, the linear array sensor is focused, and the generatrix of the cylindrical lens is perpendicular to the pixel arrangement direction of the linear array sensor.

[0025] Preferably, step S7 specifically includes the following steps:

[0026] S71. Read in the N pixel values ​​corresponding to the p-th pixel;

[0027] S72. Window the signal X(p,n) collected from each pixel to obtain the m-th windowed signal X. m (p, n);

[0028] S73, The windowed pixel signal X m Perform a short-time Fourier transform on (p, n) to obtain the corresponding signal spectrum FT. m (p, k);

[0029] S74, FT of the signal spectrum m The linear spectrum S is obtained by taking the absolute value of (p, k). m (p, k);

[0030] S75, the linear spectrum S m Taking the square of the modulus of (p, k) gives the energy E. m (p, k);

[0031] Preferably, in step S8, the energy spectrum E of each pixel is... m (p, k), search along the frequency axis for the maximum energy value e corresponding to F strobe frequencies f(i). m (p, i).

[0032] Preferably, step S9 specifically includes the following steps:

[0033] S91. For F different flicker frequencies f(i), the energy value e of each pixel corresponding to the flicker frequency f(i) is... m (i) Synthesize F sequences Y according to the original pixel order of the image sensor m (p, i);

[0034] S92, Adaptive estimation sequence Y m The energy threshold T(i) of (p, i);

[0035] S93, Transform sequence Y m In the sequence (p, i), gray values ​​less than the energy threshold T(i) are set to 0, while gray values ​​greater than the energy threshold are retained. The sequence Y is then regenerated. m '(p, i);

[0036] S94. Using the gray-scale centroid method, calculate the sequence Y corresponding to all flicker frequencies f(i). m The subpixel value C(i) of the centroid position of (p, i);

[0037] S95. Search and find the distance dw between two characteristic cursors in the plane of all W targets to be tested in the direction of deformation to be tested in the corresponding w-th target plane, and their corresponding centroid position sub-pixel values ​​Cw(j) and Cw(k).

[0038] The distance Lw from the first linear array sensor to the w-th target plane is calculated based on the focal length of the cylindrical lens, the distance dw between the two characteristic cursors in the target plane, and their corresponding centroid position sub-pixel values ​​Cw(j) and Cw(k).

[0039] S96. Based on the focal length of the cylindrical mirror and the distance Lw from the linear array sensor to the target plane, the sequence Y corresponding to all flicker frequencies f(i) can be calculated. m The subpixel value C(i) of the centroid position (p, i) corresponds to the displacement value D(i).

[0040] The beneficial effects of this invention are as follows:

[0041] 1. In this invention, the multi-spot anti-deformation measuring device establishes a multi-dimensional displacement sensor measuring system by applying cylindrical mirrors, linear array sensors and point light sources. It can realize a displacement measurement system with high precision, high resolution and high sampling rate. It involves fewer components, is compact in size, simple to maintain, has low cost and high system stability, and is more suitable for outdoor multi-point monitoring of engineering structures.

[0042] 2. In this invention, the multi-cursor deformation measurement method acquires multiple stroboscopic cursor images obtained through cylindrical mirrors on a linear array sensor. For each pixel coordinate on the image, the grayscale values ​​of the multiple images are subjected to a Fourier transform along the time direction. The energy spectrum value corresponding to the cursor frequency on the spectrum is recorded on that pixel. After the energy spectrum value of the cursor is recorded on each pixel of the image, the pixel with the largest energy spectrum value is the location of the cursor. Since the sampling frequency of the linear array sensor is much higher than the stroboscopic frequency of the cursor, there is sufficient bandwidth for multi-cursor measurement. Furthermore, since each cursor has its own unique frequency, it is easy to distinguish two cursors even if they overlap in the same position. This also makes the cursor recognition highly resistant to ambient light interference. Attached Figure Description

[0043] Figure 1 This is a schematic diagram of an embodiment 1 of the multi-spot anti-deformation measurement device based on stroboscopic energy spectrum of the present invention.

[0044] Figure 2 This is a schematic diagram of Embodiment 2 of the multi-spot anti-deformation measurement device based on stroboscopic energy spectrum of the present invention.

[0045] Figure 3 This is a schematic diagram of embodiment 3 of the multi-spot anti-deformation measurement device based on stroboscopic energy spectrum of the present invention.

[0046] Figure 4 This is a flowchart illustrating the measurement process of a multi-spot anti-deformation measurement method based on stroboscopic energy spectrum according to the present invention.

[0047] Figure 5 This is a flowchart of the frequency domain calculation for a multi-spot anti-deformation measurement method based on stroboscopic energy spectrum according to the present invention.

[0048] Figure 6 This is a flowchart illustrating the displacement calculation process of a multi-spot anti-deformation measurement method based on stroboscopic energy spectrum according to the present invention.

[0049] The following are the labels in the diagram: 1. Point light source; 2. Cylindrical mirror 1; 3. Linear array sensor 1; 4. Data acquisition device; 5. Beam splitter 1; 6. Cylindrical mirror 2; 7. Linear array sensor 2; 8. Cylindrical mirror 3; 9. Linear array sensor 3; 10. Beam splitter 2; 11. Cylindrical mirror 4; 12. Linear array sensor 4. Detailed Implementation

[0050] The technical solutions of the present invention will be clearly and completely described below with reference to the accompanying drawings of the embodiments of the present invention. Obviously, the described embodiments are only some embodiments of the present invention, and not all embodiments.

[0051] Example 1, as shown in the appendix Figure 1 As shown:

[0052] A multi-point anti-interference deformation measurement device based on stroboscopic energy spectrum includes a point light source 1, a cylindrical mirror 2 disposed below the point light source 1, and a linear array sensor 3 disposed below the cylindrical mirror 2. The linear array sensor 3 is electrically connected to a data acquisition device 4. The light emitted from the point light source 1 is focused into a line segment and imaged onto the linear array sensor 3 after passing through the cylindrical mirror 2. Figure 1 As shown, the linear array sensor 3 converts the light signal of the focused line segment into a digital signal and outputs it to the data acquisition device 4, which is a computer. The data acquisition device 4 determines the position of the focused line segment on the linear array sensor 3 based on the digital signal of the focused line segment on the linear array sensor 3, and calculates the position change of the focused line segment at different times. This position change corresponds one-to-one with the displacement of the point light source 1 in the direction of the linear array sensor 3. Furthermore, the displacement of the point light source 1 in the direction of the linear array sensor 3 is calculated based on the imaging relationship. By fixing the point light source 1 on the structure, it can be used for dynamic and static displacement measurement and monitoring in various engineering situations such as ground settlement, bridge deformation, and large equipment.

[0053] It is worth mentioning that the size and brightness of the point light source 1 are determined by the measurement distance, and its size can range from tens of micrometers to hundreds of millimeters; it is focused into a focal line by the cylindrical lens 2; the linear array sensor 3 is composed of a single row or several rows of photosensitive elements [pixels], arranged in a straight line, usually containing thousands to tens of thousands of pixels, each pixel is independently photosensitive;

[0054] Example 2 is the second embodiment of the present invention, which is based on the first embodiment:

[0055] As attached Figure 2 As shown, a multi-spot anti-interference deformation measurement device based on stroboscopic energy spectrum also includes a beam splitter prism 15, which is located between the point light source 1 and the cylindrical mirror 2. A cylindrical mirror 2 6 is provided on one side of the beam splitter prism 15, and a linear array sensor 2 7 is provided on the other side of the cylindrical mirror 2 6. The linear array sensor 2 7 is electrically connected to the data acquisition device 4.

[0056] Cylindrical mirror 2 is a cylindrical mirror placed horizontally perpendicular to the direction of light illumination. Cylindrical mirror 2 has curvature in the vertical direction but no curvature in the horizontal direction. Cylindrical mirror 2 does not change the propagation path of light in the horizontal direction, that is, the light continues to propagate in its original direction and has no focusing effect. Therefore, the image will not form a point, but can form a horizontal focal line.

[0057] Cylindrical mirror 6 is a cylindrical mirror placed perpendicular to the direction of light illumination. Cylindrical mirror 6 has no curvature in the vertical direction but has curvature in the horizontal direction. Cylindrical mirror 6 does not change the propagation path of light in the vertical direction, that is, the light maintains its original direction of propagation and has no focusing effect. Therefore, the image will not form a point, but can form a vertical focal line.

[0058] In the above technical solution, the design of cylindrical mirror 26 and linear array sensor 27 realizes two-dimensional spatial displacement measurement. Cylindrical mirror 2, linear array sensor 3, beam splitter 5, cylindrical mirror 26, and linear array sensor 27 constitute a two-dimensional displacement sensor.

[0059] Linear array sensor 1 (3) is a linear CCD, linear CMOS, or linear photon counting sensor, and linear array sensor 2 (7) is a linear CCD, linear CMOS, or linear photon counting sensor.

[0060] Example 3 is the third embodiment of the present invention, which is based on the second embodiment:

[0061] As attached Figure 3 As shown, a multi-spot anti-interference deformation measurement device based on stroboscopic energy spectrum also includes a beam splitter 10, a cylindrical mirror 8 below the beam splitter 10, a linear array sensor 9 below the cylindrical mirror 8, and a data acquisition device 4 electrically connected to the linear array sensor 9. The beam splitter 10 is located between the point light source 1 and the cylindrical mirror 8. A cylindrical mirror 11 is arranged on one side of the beam splitter 10, and a linear array sensor 12 is arranged on the other side of the cylindrical mirror 11. The linear array sensor 12 is electrically connected to the data acquisition device.

[0062] In the above technical solution, cylindrical mirror 12, linear array sensor 13, beam splitter 15, cylindrical mirror 26, linear array sensor 27, cylindrical mirror 38, linear array sensor 39, beam splitter 210, cylindrical mirror 41, and linear array sensor 412 respectively constitute two two-dimensional displacement sensors. The two two-dimensional displacement sensors jointly image the point light source, and the two two-dimensional displacement sensors constitute a three-dimensional displacement sensor to realize three-dimensional spatial displacement measurement.

[0063] For details, see attached. Figure 3 As shown, two two-dimensional displacement sensors are used to image point P. The coordinates x1 and x2 of this point are obtained through cylindrical mirror 6 and cylindrical mirror 11, as well as linear array sensor 7 and linear array sensor 12. The coordinates y1 and y2 are obtained through cylindrical mirror 2 and cylindrical mirror 8, as well as linear array sensor 3 and linear array sensor 9. According to the perspective transformation model of stereo vision:

[0064]

[0065] Where s1 and s2 are scaling factors, f 1x f 2x f 1y f 2y The focal lengths of cylindrical mirror 1 (2), cylindrical mirror 2 (6), cylindrical mirror 3 (8), and cylindrical mirror 4 (11) are respectively, and (X1, Y1, Z1) and (X2, Y2, Z2) are the spatial coordinate systems of the two two-dimensional displacement sensors.

[0066] The coordinate systems of two two-dimensional displacement sensors can be rigidly transformed using a rotation matrix R and a translation matrix T:

[0067]

[0068] When the coordinates of a spatial point in two two-dimensional displacement sensors are P1(x1, y1) and P2(x2, y2) respectively, and the focal length of the camera is f 1x f 2x f 1y f 2y Given the given information, the external parameters R and T matrices of the two two-dimensional sensors are calibrated, and the world coordinates are established on the coordinate system of the two-dimensional sensors (X1, Y1, Z1). This allows us to solve for the three-dimensional coordinates of point P in space.

[0069]

[0070] Example 4 is the fourth embodiment of the present invention, which is based on the first embodiment:

[0071] As attached Figure 1 and attached Figure 4 To be continued Figure 6As shown, a multi-spot anti-interference deformation measurement method based on stroboscopic energy spectrum is implemented using a multi-spot anti-interference deformation measurement device based on stroboscopic energy spectrum, and includes the following steps:

[0072] S1. Fix F point light sources with different flicker frequencies f(i) at the deformable points of interest positions of the target under test. If the target under test has multiple target planes, ensure that there are at least 2 point light sources in each target plane. The point light sources are active cursors;

[0073] S2. Select two active cursors with characteristics. These two active cursors are in the same target plane and are a certain distance apart in the direction of deformation to be measured. Use a standard measuring tool to measure the distance d1 between the two active cursors in the target plane in the direction of deformation to be measured.

[0074] S3. If the target to be measured has W different target planes, repeat S2 and measure the distance dw between the two active cursors in the deformation direction of the wth different target plane.

[0075] S4. The measuring device is aligned with the target to be measured. The linear array sensor one is parallel to the direction of deformation to be measured. F active cursors are simultaneously focused on the linear array sensor one through the cylindrical mirror one.

[0076] In step S4, the linear array sensor is focused, and the generatrix of the cylindrical lens is perpendicular to the pixel arrangement direction of the linear array sensor.

[0077] S5. Collect the pixel values ​​corresponding to one row of P pixels from the linear array sensor;

[0078] S6. Repeat S5 to collect N×P pixel values ​​corresponding to N rows and P pixels of the linear array sensor.

[0079] S7. Collect N×P pixel values ​​from the P-th pixel and perform frequency domain analysis based on short-time Fourier transform to obtain the energy spectrum of each pixel.

[0080] Step S7 specifically includes the following steps:

[0081] S71. Read in the N pixel values ​​corresponding to the p-th pixel;

[0082] S72. Window the signal X(p,n) collected from each pixel to obtain the m-th windowed signal X. m (p, n);

[0083] S73, The windowed pixel signal X m Perform a short-time Fourier transform on (p, n) to obtain the corresponding signal spectrum FT. m (p, k);

[0084] S74, FT of the signal spectrumm The linear spectrum S is obtained by taking the absolute value of (p, k). m (p, k);

[0085] S75, the linear spectrum S m Taking the square of the modulus of (p, k) gives the energy E. m (p, k);

[0086] S8. Search for the energy value corresponding to the strobe frequency f(i) of the i-th active cursor on the energy spectrum signal of each pixel;

[0087] In step S8, the energy spectrum E of each pixel is... m (p, k), search along the frequency axis for the maximum energy value e corresponding to F strobe frequencies f(i). m (p, i);

[0088] S9. Calculate the displacement value corresponding to the strobe frequency f(i) of the i-th active cursor based on the energy spectrum signal of each pixel;

[0089] Step S9 specifically includes the following steps:

[0090] S91. For F different flicker frequencies f(i), the energy value e of each pixel corresponding to the flicker frequency f(i) is... m (i) Synthesize F sequences Y according to the original pixel order of the image sensor m (p, i);

[0091] S92, Adaptive estimation sequence Y m The energy threshold T(i) of (p, i);

[0092] S93, Transform sequence Y m In the sequence (p, i), gray values ​​less than the energy threshold T(i) are set to 0, while gray values ​​greater than the energy threshold are retained. The sequence Y is then regenerated. m '(p, i);

[0093] S94. Using the gray-scale centroid method, calculate the sequence Y corresponding to all flicker frequencies f(i). m The subpixel value C(i) of the centroid position of (p, i);

[0094] S95. Search and find the distance dw between two characteristic cursors in the plane of all W targets to be tested in the direction of deformation to be tested in the corresponding w-th target plane, and their corresponding centroid position sub-pixel values ​​Cw(j) and Cw(k).

[0095] The distance Lw from the first linear array sensor to the w-th target plane is calculated based on the focal length of the cylindrical lens, the distance dw between the two characteristic cursors in the target plane, and their corresponding centroid position sub-pixel values ​​Cw(j) and Cw(k).

[0096] S96. Based on the focal length of the cylindrical mirror and the distance Lw from the linear array sensor to the target plane, the sequence Y corresponding to all flicker frequencies f(i) can be calculated. m '(p, i) The subpixel value C(i) of the centroid position corresponds to the displacement value D(i);

[0097] S10. Repeat steps S5 to S9 to obtain the time-frequency displacement sequence D(i,t) of F active cursors with different stroboscopic frequencies f(i).

[0098] The above description is only a preferred embodiment of the present invention, but the scope of protection of the present invention is not limited thereto. Any equivalent substitutions or modifications made by those skilled in the art within the scope of the technology disclosed in the present invention, based on the technical solution and inventive concept of the present invention, should be covered within the scope of protection of the present invention.

Claims

1. A multi-spot anti-interference deformation measurement method based on stroboscopic energy spectrum, characterized in that, Includes the following steps: S1. Fix F point light sources with different strobe frequencies f(i) at the deformable interest points of the target to be tested. If the target to be tested has multiple target planes, ensure that there are at least 2 point light sources in each target plane. The point light sources are active cursors. S2. Select two active cursors with characteristics. These two active cursors are in the same target plane and are a certain distance apart in the direction of deformation to be measured. Use a standard measuring tool to measure the distance d1 between the two active cursors in the target plane in the direction of deformation to be measured. S3. If the target to be tested has W different target planes, repeat S2 and measure the distance dw between the two active cursors in the direction of deformation to be tested within the w-th different target plane. S4. The measuring device is aligned with the target to be measured. The linear array sensor one is parallel to the direction of deformation to be measured. F active cursors are simultaneously focused on the linear array sensor one through the cylindrical mirror one. S5. Collect the pixel values ​​corresponding to one row of P pixels from the linear array sensor; S6. Repeat S5 to collect N×P pixel values ​​corresponding to N rows and P pixels of the linear array sensor. S7. Collect N×P pixel values ​​from the Pth pixel and perform frequency domain analysis based on short-time Fourier transform to obtain the energy spectrum of each pixel; S8. Search for the energy value corresponding to the strobe frequency f(i) of the i-th active cursor on the energy spectrum signal of each pixel; S9. Calculate the displacement value corresponding to the strobe frequency f(i) of the i-th active cursor based on the energy spectrum signal of each pixel; S10. Repeat steps S5 to S9 to obtain the time-frequency displacement sequence D(i,t) of F active cursors with different stroboscopic frequencies f(i).

2. The multi-spot anti-interference deformation measurement method based on stroboscopic energy spectrum according to claim 1, characterized in that, In step S4, the linear array sensor is focused, and the generatrix of the cylindrical lens is perpendicular to the pixel arrangement direction of the linear array sensor.

3. The method for measuring multi-spot anti-interference deformation based on stroboscopic energy spectrum according to claim 2, characterized in that, Step S7 specifically includes the following steps: S71. Read in the N pixel values ​​corresponding to the p-th pixel; S72. Window the signal X(p,n) collected from each pixel to obtain the m-th windowed signal X. m (p, n); S73, The windowed pixel signal X m Perform a short-time Fourier transform on (p, n) to obtain the corresponding signal spectrum FT. m (p, k); S74, FT of the signal spectrum m The linear spectrum S is obtained by taking the absolute value of (p, k). m (p, k); S75, the linear spectrum S m Taking the square of the modulus of (p, k) gives the energy E. m (p, k).

4. The multi-spot anti-interference deformation measurement method based on stroboscopic energy spectrum according to claim 3, characterized in that, In step S8, the energy spectrum E of each pixel is... m (p, k), search along the frequency axis for the maximum energy value e corresponding to F strobe frequencies f(i). m (p, i).

5. The method for measuring multi-spot anti-interference deformation based on stroboscopic energy spectrum according to claim 1, characterized in that, Step S9 specifically includes the following steps: S91. For F different flicker frequencies f(i), the energy value e of each pixel corresponding to the flicker frequency f(i) is... m (i) Synthesize F sequences Y according to the original pixel order of the image sensor m (p, i); S92, Adaptive estimation sequence Y m The energy threshold T(i) of (p, i); S93, Transform sequence Y m In the sequence (p, i), gray values ​​less than the energy threshold T(i) are set to 0, and gray values ​​greater than the energy threshold are retained. The sequence Y is then regenerated. m '(p,i; S94. Using the gray-scale centroid method, calculate the sequence Y corresponding to all flicker frequencies f(i). m The subpixel value C(i) of the centroid position of (p, i); S95. Search and find the distance dw between two characteristic cursors in the plane of all W targets to be tested in the direction of deformation to be tested in the corresponding w-th target plane, and their corresponding centroid position sub-pixel values ​​Cw(j) and Cw(k). The distance Lw from the first linear array sensor to the w-th target plane is calculated based on the focal length of the cylindrical lens, the distance dw between the two characteristic cursors in the target plane, and their corresponding centroid position sub-pixel values ​​Cw(j) and Cw(k). S96. Based on the focal length of the cylindrical mirror and the distance Lw from the linear array sensor to the target plane, the sequence Y corresponding to all flicker frequencies f(i) can be calculated. m '(p,i) The subpixel value C(i) of the centroid position corresponds to the displacement value D(i).

6. A multi-spot anti-interference deformation measurement device based on stroboscopic energy spectrum, wherein the device is implemented based on the multi-spot anti-interference deformation measurement method based on stroboscopic energy spectrum as described in claim 1, characterized in that, The system includes a point light source, characterized in that a cylindrical mirror is disposed below the point light source, and a linear array sensor is disposed below the cylindrical mirror. The linear array sensor is electrically connected to a data acquisition device. The light emitted by the point light source is focused into a line segment and imaged onto the linear array sensor after passing through the cylindrical mirror. The linear array sensor converts the light signal of the focused line segment into a digital signal and outputs it to the data acquisition device. The data acquisition device determines the position of the focused line segment on the linear array sensor based on the digital signal of the focused line segment on the linear array sensor, and calculates the position change of the focused line segment at different times. This position change corresponds one-to-one with the displacement of the point light source in the direction of the linear array sensor. Furthermore, the displacement of the point light source in the direction of the linear array sensor is calculated based on the imaging relationship.

7. The multi-spot anti-interference deformation measuring device based on stroboscopic energy spectrum according to claim 6, characterized in that, It also includes a beam splitter 1, which is located between a point light source and a cylindrical mirror 1. A cylindrical mirror 2 is disposed on one side of the beam splitter 1, and a linear array sensor 2 is disposed on the other side of the cylindrical mirror 2. The linear array sensor 2 is electrically connected to a data acquisition device. The cylindrical mirror 1, the linear array sensor 1, the beam splitter 1, the cylindrical mirror 2, and the linear array sensor 2 constitute a two-dimensional displacement sensor.

8. The multi-spot anti-interference deformation measuring device based on stroboscopic energy spectrum according to claim 7, characterized in that, The first cylindrical mirror is a cylindrical mirror placed horizontally perpendicular to the direction of light illumination. The first cylindrical mirror has curvature in the vertical direction but no curvature in the horizontal direction. The second cylindrical mirror is a cylindrical mirror placed perpendicular to the direction of light illumination. The second cylindrical mirror has no curvature in the vertical direction but has curvature in the horizontal direction.

9. The multi-spot anti-interference deformation measuring device based on stroboscopic energy spectrum according to claim 8, characterized in that, The first linear array sensor is a linear CCD, a linear CMOS, or a linear photon counting sensor, and the second linear array sensor is a linear CCD, a linear CMOS, or a linear photon counting sensor.

10. The multi-spot anti-interference deformation measuring device based on stroboscopic energy spectrum according to claim 9, characterized in that, It also includes a second beam splitter, a third cylindrical mirror is disposed below the second beam splitter, a third linear array sensor is disposed below the third cylindrical mirror, the third linear array sensor is electrically connected to a data acquisition device, the second beam splitter is located between the point light source and the third cylindrical mirror, a fourth cylindrical mirror is disposed on one side of the second beam splitter, a fourth linear array sensor is disposed on the other side of the fourth cylindrical mirror, and the fourth linear array sensor is electrically connected to the data acquisition device; The cylindrical mirror 1, linear array sensor 1, beam splitter 1, cylindrical mirror 2, linear array sensor 2 and cylindrical mirror 3, linear array sensor 3, beam splitter 2, cylindrical mirror 4, linear array sensor 4 respectively constitute two two-dimensional displacement sensors. The two two-dimensional displacement sensors jointly image the point light source, and the two two-dimensional displacement sensors constitute a three-dimensional displacement sensor.

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