Falling ball impact test device and use method thereof

By designing a ball impact testing device that includes a platform, a ball dropping mechanism, and a controller, the problem of secondary ball drops affecting test accuracy and sample damage was solved, and rapid ball collection was achieved, thus improving the accuracy and efficiency of the test.

CN121678091APending Publication Date: 2026-03-17GUANGZHOU GOVISIONOX TECH CO LTD +1
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Patent Information

Application Number
CN202511918803.X
Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
Filing Date
2025-12-17
Publication Date
2026-03-17

AI Technical Summary

Technical Problem

In existing ball impact tests, the ball's secondary drop affects test accuracy and sample damage, and the falling ball cannot be collected quickly, increasing the uncertainty of test results.

Method used

Design a ball drop impact test device, including a platform, a ball drop mechanism, a ball drop collection fixture and a controller. The controller is electrically connected to the ball drop collection fixture, and controls the ball drop collection fixture to start when a preset time is reached or when the detection device detects contact with the ball, so as to timely absorb the ball and avoid secondary drop.

Benefits of technology

Ensuring that the mechanical impact energy is only the energy of the initial drop prevents accidental damage to the sample from secondary drops, simplifies the ball collection process, and improves testing accuracy and efficiency.

✦ Generated by Eureka AI based on patent content.

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Abstract

The invention provides a falling ball impact test device and a using method thereof. The falling ball impact test device comprises a carrying table, a falling ball mechanism, a falling ball collecting jig and a controller. The carrying table is used for carrying a display panel to be detected; the ball falling mechanism is located over the carrying table and used for releasing balls to the carrying table. The falling ball collecting jig is located on one side of the carrying table and used for adsorbing rebounded balls. The controller is located on one side of the falling ball collecting jig, and the controller is electrically connected with the falling ball collecting jig, receives a response signal and controls the falling ball collecting jig to be started; and the fast and accurate adsorption of the falling ball collecting jig on the rebounded balls is realized.
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Description

Technical Field

[0001] This disclosure relates to the field of display technology, and in particular to a falling ball impact testing device and its usage method. Background Technology

[0002] In real life, as people use mobile phones, tablets, and other display devices more frequently, the frequency of these devices being dropped also increases. Therefore, the importance of the impact resistance of display devices is self-evident. To ensure product quality and improve user experience, drop tests are essential to simulate the actual situation of different edges, corners, and surfaces falling to the ground from different heights in daily life.

[0003] Existing techniques typically use drop ball tests to examine a sample's stress release performance after a small-area impact, in order to assess its resistance to impact under external forces. However, in traditional drop ball impact tests, the ball cannot be retrieved promptly after the initial impact, leading to a secondary drop. This not only affects the accuracy of the test but may also cause additional damage to the test sample, increasing the uncertainty of the test results.

[0004] Therefore, a new technical solution is urgently needed. Summary of the Invention

[0005] In view of this, the purpose of this disclosure is to provide a ball impact testing device and its usage method to solve the problem of the impact of secondary ball drop on the accuracy of the test.

[0006] For the purposes described above, this disclosure discloses a falling ball impact testing apparatus, comprising:

[0007] A platform is used to support the display panel to be tested.

[0008] The ball-dropping mechanism is located directly above the platform and is used to release the ball onto the platform.

[0009] The ball collection fixture is located on one side of the platform and is used to collect the rebounded ball.

[0010] The controller is located on one side of the ball collection fixture and is electrically connected to the ball collection fixture. It is used to receive response signals and control the start of the ball collection fixture.

[0011] Furthermore, the controller is electrically connected to the ball-dropping mechanism. When the ball-dropping mechanism releases the ball, it sends a first signal. The controller receives the first signal and controls the ball-dropping collection fixture to start after a preset time.

[0012] Furthermore, it also includes a detection device, which is electrically connected to the controller. When the detection device detects that the ball is in contact with the display panel to be detected, it sends a second signal to the controller. The controller receives the second signal and controls the ball collection fixture to start.

[0013] Preferably, the detection device is a pressure sensor, which is located inside the stage and close to the side of the display panel to be detected, and the pressure sensor is electrically connected to the controller.

[0014] Furthermore, the ball-collecting fixture includes an electromagnetic adsorption device;

[0015] Preferably, the electromagnetic adsorption device is an electromagnet, which includes an iron core and a coil wound around the outside of the iron core.

[0016] Preferably, the core material is electrical steel or permalloy.

[0017] Furthermore, a ball-collecting sleeve is fitted around the electromagnetic adsorption device;

[0018] Preferably, the material of the ball collection sleeve is a cushioning material;

[0019] Preferably, the material of the ball collection sleeve is rubber.

[0020] Furthermore, the ball collecting sleeve has multiple recesses formed on the side near the platform;

[0021] Preferably, multiple groove arrays are distributed on the ball collection sleeve;

[0022] Preferably, the inner diameter of the groove is greater than or equal to the diameter of the sphere.

[0023] Furthermore, the bottom surface of the ball-collecting fixture is higher than the display panel to be tested on the platform;

[0024] Along the thickness direction of the carrier plate, the height of the ball collection fixture is 20-40cm;

[0025] Preferably, at least part of the falling ball collecting fixture has its orthographic projection on the platform located on the platform.

[0026] Furthermore, it also includes a first moving device, which is used to drive the ball-collecting fixture to move to a position close to the trajectory of the falling ball;

[0027] Preferably, the horizontal distance between the first moving device and the ball-collecting fixture and the ball's falling trajectory is 3-6 cm;

[0028] Preferably, the first moving device is located at the bottom of the ball collecting fixture, and the moving device is provided with a first support column that is fixedly connected to the ball collecting fixture;

[0029] Preferably, the top of the first support column is fixed to the center of the bottom of the ball collecting fixture, and the area of ​​the top of the first support column is smaller than the area of ​​the bottom of the ball collecting fixture.

[0030] Furthermore, it also includes a second moving device for driving the platform to move along the horizontal plane;

[0031] Preferably, the second moving device is disposed at the bottom of the platform, and the second moving device is provided with a second support column fixedly connected to the second moving device.

[0032] Based on the same inventive concept, this application also discloses a method of using a falling ball impact testing device, including the following steps:

[0033] The ball-dropping mechanism releases the ball, which falls freely onto the surface of the display panel to be tested.

[0034] When the ball is just released, a first signal is sent to the controller. The controller receives the first signal and controls the ball collection fixture to start after a preset time. Alternatively, when the detection device detects that the ball has just touched the display panel to be detected, a second signal is sent to the controller and the ball collection fixture is controlled to start within a first time threshold.

[0035] The ball collection fixture absorbs the balls after startup.

[0036] Compared with the prior art, this application has the following technical effects:

[0037] This application employs a ball-collecting fixture electrically connected to a controller. The fixture is activated promptly, capturing the ball immediately after its first fall to prevent it from falling a second time onto the surface of the object being tested, thus avoiding any impact on the test results. This ensures that the mechanical impact energy at the ball's landing point is only the energy of the initial free fall. It also prevents the ball from falling into non-test areas and causing unexpected damage to the sample. The ball is collected immediately upon impact, eliminating the need for repeated ball-picking operations by the testing personnel, making ball collection easier. Attached Figure Description

[0038] To more clearly illustrate the technical solutions in this disclosure or related technologies, the accompanying drawings used in the description of the embodiments or related technologies will be briefly introduced below. Obviously, the accompanying drawings described below are only embodiments of this disclosure. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0039] Figure 1 This is a schematic diagram of the falling ball impact test device in one embodiment of this application;

[0040] Figure 2This is a schematic diagram of the moving device structure of the ball impact test apparatus in one embodiment of this application;

[0041] Figure 3 This is a schematic diagram of the ball drop point of the ball impact test device in one embodiment of this application;

[0042] Figure 4 This is a schematic diagram of the lifting mechanism of the ball-dropping mechanism of the ball-dropping impact test device in one embodiment of this application;

[0043] Figure 5 This is a schematic diagram of the ball collection fixture structure of the ball impact test device in one embodiment of this application;

[0044] Figure 6 This is a schematic diagram of the ball collection sleeve structure of the ball collection fixture of the ball impact test device in one embodiment of this application;

[0045] Figure 7 This is a schematic diagram showing the position of the ball collection fixture in a ball impact testing device according to one embodiment of this application;

[0046] Figure 8 This is a schematic diagram of the pressure sensor of the ball-dropping impact test device in one embodiment of this application;

[0047] Figure 9 This is a flowchart illustrating the method of using the ball-dropping impact testing device according to one embodiment of this application;

[0048] Figure 10 This is a schematic diagram of the arc-shaped ball collection sleeve of the ball impact testing device in one embodiment of this application;

[0049] Among them, 100 is the platform; 200 is the ball-dropping mechanism; 300 is the ball-dropping collection fixture; 310 is the electromagnetic adsorption device; 320 is the ball-dropping collection sleeve; 400 is the controller; 500 is the ball; 600 is the pressure sensor; 700 is the first moving device; 800 is the second moving device; and 900 is the lifting mechanism. Detailed Implementation

[0050] To make the objectives, technical solutions, and advantages of this disclosure clearer, the following detailed description is provided in conjunction with specific embodiments and the accompanying drawings.

[0051] It should be noted that, unless otherwise defined, the technical or scientific terms used in the embodiments of this disclosure should have the ordinary meaning understood by one of ordinary skill in the art to which this disclosure pertains. The terms "first," "second," and similar terms used in the embodiments of this disclosure do not indicate any order, quantity, or importance, but are merely used to distinguish different components. Terms such as "comprising" or "including" mean that the element or object preceding the word encompasses the elements or objects listed following the word and their equivalents, without excluding other elements or objects. Terms such as "connected" or "linked" are not limited to physical or mechanical connections, but can include electrical connections, whether direct or indirect. Terms such as "upper," "lower," "left," and "right" are used only to indicate relative positional relationships; when the absolute position of the described object changes, the relative positional relationship may also change accordingly.

[0052] In real life, as people use mobile phones, tablets, and other display devices more frequently, the frequency of these devices being dropped also increases. Therefore, the importance of the impact resistance of display devices is self-evident. To ensure product quality and improve user experience, drop tests are essential to simulate the actual situation of different edges, corners, and surfaces falling to the ground from different heights in daily life.

[0053] Existing techniques typically use drop ball tests to examine a sample's stress release performance after a small-area impact, in order to assess its resistance to impact under external forces. However, in traditional drop ball impact tests, the ball cannot be retrieved promptly after the initial impact, leading to a secondary drop. This not only affects the accuracy of the test but may also cause additional damage to the test sample, increasing the uncertainty of the test results.

[0054] In related technologies, a falling ball impact testing device includes an adsorption device and a steel ball. The adsorption and release of the steel ball are controlled by electromagnetic adsorption or vacuum adsorption. When the adsorption device is in the release state, the steel ball undergoes free fall and falls onto the surface of the display screen, forming a mechanical impact.

[0055] The inventors of this application have discovered the following problems in the relevant technology during long-term practical work:

[0056] In the above-mentioned scheme, the steel ball falls onto the sample surface, bounces, and falls again, causing secondary or even tertiary impacts on the sample surface. The energy of the secondary and tertiary impacts is difficult to calculate compared to the initial impact of free fall, making it impossible to accurately assess the degree of damage caused to the sample by the corresponding mechanical impact energy. Secondly, the above-mentioned scheme cannot collect the released steel ball. If the initial drop height is high, the controllable range of the two drops is greater, which may result in the secondary drop location being in other non-ball drop test areas of the display area, causing the display screen to fail to light up, making it impossible to determine the impact of the ball drop impact test itself on the display screen. When conducting multi-sample or multi-drop point tests, it is impossible to quickly collect the dropped balls, requiring testers to spend more time repeatedly on operations such as ball collection.

[0057] For the reasons mentioned above, this application proposes a falling ball impact testing device, including a platform, a falling ball mechanism, a falling ball collection fixture, and a controller. The platform is used to support the display panel to be tested; the falling ball mechanism is located directly above the platform and is used to release the ball onto the platform; the falling ball collection fixture is located on one side of the platform and is used to absorb the rebounded ball; the controller is electrically connected to the falling ball collection fixture and is used to receive a response signal and control the starting of the falling ball collection fixture.

[0058] This application employs a ball-collecting fixture electrically connected to a controller. The fixture is activated promptly, capturing the ball immediately after its first fall to prevent it from falling a second time onto the surface of the object being tested, thus avoiding any impact on the test results. This ensures that the mechanical impact energy at the ball's landing point is only the energy of the initial free fall. It also prevents the ball from falling into non-test areas and causing unexpected damage to the sample. The ball is collected immediately upon impact, eliminating the need for repeated ball-picking operations by the testing personnel, making ball collection easier.

[0059] The technical solutions of the embodiments of this disclosure will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of this disclosure, and not all embodiments. Based on the embodiments of this disclosure, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of this disclosure.

[0060] Specifically, Figure 1 This is a schematic diagram of the falling ball impact test device in one embodiment of this application; Figure 2 This is a schematic diagram of the moving device structure of the ball impact test apparatus in one embodiment of this application; Figure 3 This is a schematic diagram of the ball drop point of the ball impact test device in one embodiment of this application; Figure 4 This is a schematic diagram of the lifting mechanism of the ball-dropping mechanism of the ball-dropping impact test device in one embodiment of this application; Figure 5 This is a schematic diagram of the ball collection fixture structure of the ball impact test device in one embodiment of this application; Figure 6 This is a schematic diagram of the ball collection sleeve structure of the ball collection fixture of the ball impact test device in one embodiment of this application; Figure 7 This is a schematic diagram showing the position of the ball collection fixture in a ball impact testing device according to one embodiment of this application; Figure 8 This is a schematic diagram of the pressure sensor of the ball-dropping impact test device in one embodiment of this application; Figure 9 This is a flowchart illustrating the usage method of the falling ball impact testing device in one embodiment of this application.

[0061] Please refer to Figures 1-8 This application provides a falling ball impact testing device, including a platform 100, a falling ball mechanism 200, a falling ball collection fixture 300, and a controller. The platform 100 is used to support the display panel 110 to be tested. The falling ball mechanism 200 is located directly above the platform 100 and is used to release a ball 500 onto the platform 100. The falling ball collection fixture 300 is located on one side of the platform 100 and is used to absorb the rebounding ball 500. The controller is located on one side of the falling ball collection fixture 300 and is electrically connected to the falling ball collection fixture 300. The controller is used to receive a response signal and control the starting of the falling ball collection fixture 300. In this embodiment, the controller is also electrically connected to the falling ball mechanism 200. When the falling ball mechanism 200 releases the ball 500, it sends a first signal. The controller receives the first signal and controls the starting of the falling ball collection fixture 300 after a preset time.

[0062] In this embodiment, the stage 100 is used to support the display panel 110 to be tested. Specifically, the display panel 110 to be tested can be a screen, an OLED module, or a cover plate, etc.

[0063] Optionally, a vacuum adsorption device is installed on the bearing surface of the stage 100 for adsorbing the display panel 110 to be tested. Vacuum adsorption of the display panel 110 can reduce damage to it. Furthermore, the vacuum adsorption device is electrically connected to a second controller, which can adjust the adsorption force of the vacuum adsorption device to adapt to different sizes and types of display panels 110 to be tested.

[0064] It should be noted that, as Figure 2 As shown, this embodiment also includes a second moving device 800, which drives the stage 100 to move horizontally, enabling positioning tests at different points on the display panel 110 to be tested. Optionally, the second moving device 800 is an electric moving device, capable of precisely aligning with any preset point on the display panel 110 to be tested, such as its corners, center, or specific test areas. For example, as... Figure 2 and Figure 3 As shown, Figure 2 A ball drop test was conducted at the center point of the display panel 110 to be tested. Figure 3A ball drop test was conducted on the edge points of the display panel 110 to be tested.

[0065] Specifically, the second moving device 800 is located at the bottom of the platform 100, and a second support column 810 is fixedly connected to the second moving device 800. By moving the second support column 810, the platform 100 is moved, avoiding the center of gravity shift and structural swaying caused by directly moving the platform 100, ensuring that the platform 100 remains stable during the test and guaranteeing the accuracy of the ball impact position.

[0066] For example, the second moving device 800 is a cross-slide type structure. The Y-axis assembly is fixed to the base, and the X-axis assembly is mounted on the Y-axis assembly, forming a planar orthogonal motion system capable of precise positioning to any point within the test area. Specifically, the Y-axis assembly includes a Y-axis guide rail, a slider, a lead screw, and a motor; the X-axis assembly is mounted on the Y-axis slider and includes an X-axis guide rail, a slider, a lead screw, and a motor. The bottom of the second support column 810 is fixed to the X-axis slider.

[0067] In this embodiment, the ball-dropping mechanism 200 is located directly above the platform 100 and is used to release the ball 500 onto the platform 100. Specifically, the ball-dropping mechanism 200 can be understood as being able to launch the ball 500 vertically downward with an initial velocity of 0 and an acceleration of g, that is, the ball 500 undergoes free fall motion.

[0068] Optionally, such as Figure 4 As shown, one end of the ball-dropping mechanism 200 is slidably connected to the lifting mechanism 900 in the height direction. The lifting mechanism 900 is used to control the ball-dropping mechanism 200 to move up and down along the lifting axis to change the falling height of the ball, so as to facilitate testing the degree of damage to the display panel under test by the ball 500 falling freely at different heights.

[0069] In one embodiment, a ball 500 is mounted on the side of the ball-falling mechanism 200 near the platform 100. The ball 500 can be fixed to the ball-falling mechanism 200 by an electromagnet. When energized, the ball 500 remains attached to the ball-falling mechanism 200 due to the presence of electromagnetic force; when de-energized, the electromagnetic force disappears, and the ball 500 can no longer be attached to the ball-falling mechanism 200, thus undergoing free fall. It should be noted that the ball-falling mechanism 200 is also equipped with a sensor, such as a light sensor, to detect the moment the ball 500 falls and release a first signal.

[0070] In this embodiment, the ball-collecting fixture 300 is located on one side of the platform 100 and is used to attract the rebounding ball 500. Normally, after the ball 500 falls and contacts the platform 100, it will rebound randomly in any direction. However, since the ball-collecting fixture 300 will be activated immediately after the ball 500 contacts the platform 100, the charged ball-collecting fixture 300 has a strong magnetic attraction force. As long as the ball-collecting fixture 300 is placed on either side of the platform 100, the ball 500 will rebound in the direction of the ball-collecting fixture 300, thus achieving successful attraction of the ball 500 by the ball-collecting fixture 300.

[0071] Specifically, such as Figure 5 As shown, the ball collection fixture 300 includes an electromagnetic adsorption device 310 and a ball collection sleeve 320.

[0072] Optionally, the electromagnetic adsorption device 310 is an electromagnet, which includes an iron core and a coil wound around the outside of the iron core. The iron core can be made of electrical steel or permalloy. This material has a fast magnetic conductivity, enabling it to quickly generate a magnetic field when energized and rapidly disappear when de-energized. The coil is made of enameled wire, and the winding method must be designed in conjunction with the shape of the iron core to maximize the utilization of the magnetic field.

[0073] The electromagnetic adsorption device 310 is surrounded by a ball-collecting sleeve 320. Specifically, the ball-collecting sleeve 320 is made of a cushioning material. For example, the ball-collecting sleeve 320 is made of rubber. The ball-collecting sleeve 320 effectively reduces the impact force when the ball 500 collides with the electromagnet, protecting the electromagnet structure and the ball itself.

[0074] In this embodiment, as Figure 5 As shown, the ball collecting sleeve has multiple recesses 321 recessed on the side near the stage of the ball collecting fixture 320. The recesses 321 can increase the contact surface between the ball collecting fixture 300 and the ball 500, thereby improving the reliability of their magnetic connection.

[0075] In a preferred embodiment, such as Figure 10 As shown, the side of the ball collecting sleeve 320 closest to the platform is entirely hemispherical or curved. Alternatively, the area between adjacent grooves 321 is hemispherical or curved. This prevents the ball 500 from hitting the raised area between adjacent grooves when it is attracted by the ball collecting fixture 300.

[0076] Specifically, such as Figure 6As shown, multiple grooves 321 are arrayed on the ball collecting sleeve 320. Furthermore, along the thickness direction of the carrier plate, the height h of the ball collecting fixture 300 is 20-40 cm. The rectangular array of grooves 321 can effectively cover the area where the ball collecting fixture 300 adsorbs the balls, reducing the need for frequent position adjustments. When the ball collecting fixture 300 is brought close to the ball's trajectory, the ball is immediately adsorbed into any one of the grooves 321 after touching the display panel 110 to be tested. Only a rough adjustment of the ball collecting fixture 300's position is needed, greatly improving the efficiency of the ball collecting fixture 300.

[0077] Better, such as Figure 1 As shown, the inner diameter d1 of the groove 321 is greater than or equal to the diameter d2 of the sphere 500. Specifically, the contact surface between the groove 321 and the sphere 500 can be a concave spherical surface, and the inner diameter d1 of the spherical surface can be the same as or slightly larger than the diameter d2 of the sphere 500 to ensure sufficient contact surface with the sphere 500. In other embodiments, the groove 321 can also be a U-shaped groove, etc.

[0078] It should be noted that multiple ball collecting sleeves 320 are provided in this embodiment. Each ball collecting sleeve 320 has a different groove 321 to match balls 500 of various sizes.

[0079] In this embodiment, as Figure 7 As shown, the bottom surface of the ball collecting fixture 300 is higher than the display panel 110 to be tested on the stage 100. Therefore, the ball collecting fixture 300 can be moved above the display panel 110 to be tested, so that the ball collecting fixture 300 is closer to the ball trajectory and can more accurately attract the rebounding ball.

[0080] Optionally, at least part of the ball-collecting fixture 300 has its orthographic projection on the stage 100 located on the stage 100.

[0081] like Figure 2 As shown, this embodiment also includes a first moving device 700, which drives the ball-collecting fixture 300 to move to a position close to the falling trajectory of the ball 500. Because the calculation of the rebound trajectory of the ball after contacting the display panel 110 to be tested is complex, it is difficult to accurately determine the direction of the rebound trajectory, making it impossible to accurately adjust the position of the ball-collecting fixture 300 to promptly attract the ball 500. Therefore, by simply moving the ball-collecting fixture 300 to a position close to the falling trajectory of the ball 500, and promptly activating the ball-collecting fixture 300 after the ball touches the display panel to be tested, the attraction of the ball 500 can be completed quickly and accurately.

[0082] Optionally, the first moving device 700 is located at the bottom of the ball-collecting fixture 300, and a first support column 710 fixedly connected to the ball-collecting fixture 300 is provided on the first moving device 700. Exemplarily, the first moving device 700 is a cross-slide type structure. The Y-axis assembly is fixed to the base, and the X-axis assembly is mounted on the Y-axis assembly, forming a planar orthogonal motion system that can accurately position any point in the test area. Specifically, the Y-axis assembly includes a Y-axis guide rail, a slider, a lead screw, and a motor; the X-axis assembly is mounted on the Y-axis slider and includes an X-axis guide rail, a slider, a lead screw, and a motor. The bottom of the first support column 710 is fixed to the X-axis slider.

[0083] In a preferred embodiment, the top of the first support column 710 is fixed to the center of the bottom of the ball-collecting fixture 300, and the area of ​​the top of the first support column 710 is smaller than the area of ​​the bottom of the ball-collecting fixture 300. It should be noted that the area of ​​the top of the first support column 710 is much smaller than the area of ​​the bottom of the ball-collecting fixture 300, ensuring that a large portion of the bottom of the ball-collecting fixture 300 is suspended in the air, thereby shortening the horizontal distance between the ball-collecting fixture 300 and the trajectory of the falling ball, meaning that the ball-collecting fixture 300 can be moved to a position close to the trajectory of the falling ball 500.

[0084] Preferably, the first moving device 700 moves the ball-collecting fixture 300 to a horizontal distance of 3-6 cm from the trajectory of the falling ball 500. Within this range, the ball-collecting fixture 300 can achieve immediate adsorption of the ball 500.

[0085] In this embodiment, the controller is electrically connected to the ball-dropping mechanism 200 and the ball-dropping collection fixture 300 respectively. When the ball-dropping mechanism 200 releases the ball 500, it sends a first signal. The controller receives the first signal and controls the ball-dropping collection fixture 300 to start after a preset time.

[0086] Specifically, in free fall, the preset time is related to the height the sphere falls. The formula for calculating the preset time t is:

[0087]

[0088] Where h is the height the sphere falls, and g is the acceleration due to gravity.

[0089] This application employs a ball-collecting fixture 300 electrically connected to a controller. The fixture 300 is activated the instant the ball 500 is released, after a preset time t. This ensures that the ball 500 is promptly absorbed after its first fall, preventing it from falling a second time onto the surface of the object 110 to the test, thus avoiding any impact on the test results. This guarantees that the mechanical impact energy at the ball's landing point is only the energy of the initial free fall. It also prevents the ball 500 from falling a second time into a non-test area, causing unexpected damage to the sample. Furthermore, the ball 500 is collected immediately, eliminating the need for repeated ball-picking operations by the test personnel, thus facilitating the collection of the ball 500.

[0090] In another embodiment, this application provides a ball-dropping impact testing device, including a platform 100, a ball-dropping mechanism 200, a ball-dropping collection fixture 300, a controller, and a detection device. The platform 100 is used to support the display panel 110 to be tested. The ball-dropping mechanism 200 is located directly above the platform 100 and is used to release a ball 500 onto the platform 100. The ball-dropping collection fixture 300 is located on one side of the platform 100 and is used to absorb the rebounded ball 500. The detection device is used to detect the first contact of the ball 500 with the display panel 110 to be tested. The controller is electrically connected to the ball-dropping collection fixture 300 and the detection device. When the detection device detects the first contact of the ball 500 with the display panel 110 to be tested, it sends a second signal. The controller receives the second signal and immediately controls the ball-dropping collection fixture 300 to start.

[0091] For example, such as Figure 8 As shown, the detection device is a pressure sensor 600. Specifically, the pressure sensor 600 is located inside the stage 100 and on one side close to the display panel 110 to be tested, and the pressure sensor 600 is electrically connected to the controller.

[0092] This application uses a pressure sensor 600 to control the ball collection fixture 300 to adsorb the ball 500, thus preventing the ball 500 from falling onto the surface of the display panel 110 to be tested and affecting the test results; it also prevents the ball 500 from falling into non-test areas and causing unexpected damage to the sample; the ball 500 is collected immediately, and the tester does not need to repeatedly pick up the ball, making it convenient for the tester to collect the ball 500.

[0093] Alternatively, the detection device can also be a sound pressure sensor, a light sensor, etc., the specific process of which will not be described in detail here.

[0094] Based on the same inventive concept, such as Figure 9 As shown, this application also provides a method for using the falling ball impact testing device, specifically including the following steps:

[0095] S1: The ball-dropping mechanism releases the ball, which falls freely onto the surface of the display panel to be tested;

[0096] In this embodiment, the ball-dropping mechanism 200 is located directly above the platform 100 and is used to release the ball 500 onto the platform 100. Specifically, the ball-dropping mechanism 200 can be understood as being able to launch the ball 500 vertically downward with an initial velocity of 0 and an acceleration of g, that is, the ball undergoes free fall motion.

[0097] Optionally, one end of the ball-dropping mechanism 200 is slidably connected to the lifting mechanism 210 in the height direction. The lifting mechanism 210 is used to control the ball-dropping mechanism 200 to move up and down along the lifting axis to change the falling height of the ball, so as to facilitate testing the degree of damage to the display panel under test by the ball 500 falling freely at different heights.

[0098] A ball 500 is mounted on the side of the ball-dropping mechanism 200 near the platform 100. In one embodiment, the ball 500 can be fixed to the ball-dropping mechanism 200 by an electromagnet. That is, when the electromagnet is energized, the ball 500 is fixed to the ball-dropping mechanism 200; when the electromagnet is de-energized, the ball 500 detaches from the ball-dropping mechanism 200 and undergoes free fall.

[0099] It should be noted that this step also includes: placing the display panel to be tested on the platform and moving the ball collection fixture to a position close to the trajectory of the falling ball.

[0100] Specifically, the display panel 110 to be tested can be a screen, an OLED module, or a cover plate, etc.

[0101] Optionally, a vacuum adsorption device is installed on the bearing surface of the stage 100 for adsorbing the display panel 110 to be tested. Vacuum adsorption of the display panel 110 can reduce damage to it. Furthermore, the vacuum adsorption device is electrically connected to a second controller, which can adjust the adsorption force of the vacuum adsorption device to adapt to different sizes and types of display panels 110 to be tested.

[0102] S2: When the ball is just released, a first signal is sent to the controller. The controller receives the first signal and controls the ball collection fixture to start after a preset time. Alternatively, when the detection device detects that the ball has just touched the display panel to be detected, a second signal is sent to the controller and the ball collection fixture is controlled to start within a first time threshold.

[0103] Specifically, in free fall, the preset time is related to the height the sphere falls. The formula for calculating the preset time t is:

[0104]

[0105] Where H is the height the sphere falls from, and g is the acceleration due to gravity.

[0106] This application employs a ball-collecting fixture 300 electrically connected to a controller. The fixture 300 is activated the instant the ball 500 is released, after a preset time t. This ensures that the ball 500 is promptly absorbed after its first fall, preventing it from falling a second time onto the surface of the object 110 to the test, thus avoiding any impact on the test results. This guarantees that the mechanical impact energy at the ball's landing point is only the energy of the initial free fall. It also prevents the ball 500 from falling a second time into a non-test area, causing unexpected damage to the sample. Furthermore, the ball 500 is collected immediately, eliminating the need for repeated ball-picking operations by the test personnel, thus facilitating the collection of the ball 500.

[0107] It should be noted that the ball collection fixture 300 includes an electromagnetic adsorption device 310 and a ball collection sleeve 320.

[0108] Optionally, the electromagnetic adsorption device 310 is an electromagnet, which includes an iron core and a coil wound around the outside of the iron core. The iron core can be made of electrical steel or permalloy. This material has a fast magnetic conductivity, enabling it to quickly generate a magnetic field when energized and rapidly disappear when de-energized. The coil is made of enameled wire, and the winding method must be designed in conjunction with the shape of the iron core to maximize the utilization of the magnetic field.

[0109] The electromagnetic adsorption device 310 is surrounded by a ball-collecting sleeve 320. Specifically, the ball-collecting sleeve 320 is made of a cushioning material. For example, the ball-collecting sleeve 320 is made of rubber. The ball-collecting sleeve 320 effectively reduces the impact force when the ball 500 collides with the electromagnet, protecting the electromagnet structure and the ball 300 itself.

[0110] In this embodiment, as Figure 5 As shown, the ball collecting sleeve has multiple recesses 321 recessed on the side near the stage of the ball collecting fixture 320. The recesses 321 can increase the contact surface between the ball collecting fixture 300 and the ball 500, thereby improving the reliability of their magnetic connection.

[0111] Specifically, such as Figure 6 As shown, multiple grooves 321 are arrayed on the ball collecting sleeve 320. Furthermore, along the thickness direction of the carrier plate, the height h of the ball collecting fixture 300 is 20-40 cm. The rectangular array of grooves 321 can effectively cover the area where the ball collecting fixture 300 adsorbs the balls, reducing the need for frequent position adjustments. When the ball collecting fixture 300 is brought close to the ball's trajectory, the ball is immediately adsorbed into any one of the grooves 321 after touching the display panel 110 to be tested. Only a rough adjustment of the ball collecting fixture 300's position is needed, greatly improving the efficiency of the ball collecting fixture 300.

[0112] Preferably, the inner diameter d1 of the groove 321 is greater than or equal to the diameter d2 of the sphere 500. Specifically, the contact surface between the groove 321 and the sphere 500 can be a concave spherical surface, and the inner diameter d1 of the spherical surface can be the same as or slightly larger than the diameter d2 of the sphere 500 to ensure sufficient contact surface with the sphere 500. In other embodiments, the groove 321 can also be a U-shaped groove, etc.

[0113] It should be noted that multiple ball collecting sleeves 320 are provided in this embodiment. Each ball collecting sleeve 320 has a different groove 321 to match balls 500 of various sizes.

[0114] In another embodiment, when the detection device detects that the ball has just touched the display panel to be detected, it sends a second signal to the controller and controls the ball collection fixture to start.

[0115] For example, such as Figure 8 As shown, the detection device is a pressure sensor 600. Specifically, the pressure sensor 600 is located inside the stage 100 and on one side close to the display panel 110 to be tested, and the pressure sensor 600 is electrically connected to the controller.

[0116] This application uses a pressure sensor 600 to control the ball collection fixture 300 to adsorb the ball 500, thus preventing the ball 500 from falling onto the surface of the display panel 110 to be tested and affecting the test results; and preventing the ball 500 from falling into non-test areas and causing unexpected damage to the sample.

[0117] Alternatively, the detection device can also be a sound pressure sensor, a light sensor, etc., the specific process of which will not be described in detail here.

[0118] S3: The ball collection fixture absorbs the balls after startup.

[0119] It should be noted that the controller can activate the ball-collecting fixture 300 within the first time threshold. The first time threshold is the time from the ball's first landing to its second landing after bouncing.

[0120] Specifically, the first time threshold can be obtained by the falling height H of the sphere and the recovery coefficient e of the corresponding material. The first time threshold T is:

[0121]

[0122] Where H is the height the sphere falls from, and g is the acceleration due to gravity.

[0123] For example, the falling height is determined to be 1.5m. The material of the display panel 100 to be tested is tempered glass, e is 0.6, then T is approximately 0.66s, that is, the first time threshold is 0.66s, and the controller only needs to control the falling ball collection fixture 300 to start within 0.66s.

[0124] Optionally, the ball must be removed and the ball collection fixture turned off.

[0125] Sphere 500 was collected immediately, eliminating the need for testers to repeatedly retrieve the spheres, thus facilitating their collection.

[0126] Repeat the above steps to test the same or different points on the display panel to be tested multiple times to obtain more accurate test results.

[0127] It should be noted that the above description describes some embodiments of this disclosure. Other embodiments are within the scope of the appended claims. In some cases, the actions or steps recorded in the claims can be performed in a different order than that shown in the above embodiments and still achieve the desired result. Furthermore, the processes depicted in the drawings do not necessarily require a specific or sequential order to achieve the desired result. In some embodiments, multitasking and parallel processing are also possible or may be advantageous.

[0128] This disclosure is intended to cover all such substitutions, modifications, and variations that fall within the broad scope of the appended claims. Therefore, any omissions, modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of this disclosure should be included within the scope of protection of this disclosure.

Claims

1. A falling weight impact test apparatus for testing a display panel, characterized by, The device comprises: a carrier for carrying a display panel to be tested; a ball dropping mechanism above the carrier for releasing a ball to the display panel to be tested; a ball collecting jig on one side of the carrier for adsorbing the ball rebounded from the display panel to be tested; a controller on one side of the ball collecting jig, electrically connected with the ball collecting jig, for receiving a response signal and controlling the ball collecting jig to start.

2. The ball drop impact testing device according to claim 1, wherein the controller is electrically connected with the ball dropping mechanism, the ball dropping mechanism sends a first signal when releasing the ball, and the controller receives the first signal and controls the ball collecting jig to start after a preset time.

3. The ball drop impact testing device according to claim 1, further comprising a detection device electrically connected with the controller, the detection device sends a second signal to the controller when detecting that the ball contacts the display panel to be tested, and the controller receives the second signal and controls the ball collecting jig to start.

4. The ball drop impact testing device according to claim 1, wherein the ball collecting jig comprises an electromagnetic adsorption device.

5. The ball drop impact testing device according to claim 4, wherein a periphery of the electromagnetic adsorption device is sleeved with a ball collecting sleeve.

6. The ball drop impact testing device according to claim 5, wherein a side of the ball collecting sleeve close to the carrier is concave and formed with a plurality of grooves.

7. The ball drop impact testing device according to claim 1, wherein a bottom surface of the ball collecting jig is higher than the display panel to be tested on the carrier.

8. The ball drop impact testing device according to claim 1, further comprising a first moving device for driving the ball collecting jig to move close to a ball falling track. ​ ​ ​ ​ ​ ​ ​ ​ ​ ​ ​ ​ ​ ​ ​ ​ ​ Preferably, the first moving device is located at the bottom of the ball collection jig, and a first support column fixedly connected with the ball collection jig is arranged on the first moving device. Preferably, the top of the first support column is fixed with the center of the bottom of the ball collection jig, and the area of the top of the first support column is smaller than the area of the bottom of the ball collection jig.

9. The ball impact test device according to claim 1, wherein, a second moving device is further included, and the second moving device is used to drive the carrier to move along the horizontal plane direction; Preferably, the second moving device is arranged at the bottom of the carrier, and a second support column fixedly connected with the second moving device is arranged on the second moving device.

10. A method of using a falling sphere impact testing device, characterized by, The method comprises the following steps: The ball body is released by the ball mechanism, and the ball body freely falls to the surface of the display panel to be detected; A first signal is sent to the controller when the ball body is just released, the controller receives the first signal and controls the ball collection jig to start after a preset time; or, a second signal is sent to the controller when the detection device detects that the ball body just contacts the display panel to be detected, and the ball collection jig is controlled to start within a first time threshold; The ball collection jig starts to adsorb the ball body.