Method for testing the tracking resistance of the insulation of new energy cables
By using a control device to promptly handle unsuccessful test cases during the tracking resistance test of the insulation layer of new energy cables, and ensuring continuous input of test information, the problem of test result accuracy was solved, and the continuity and accuracy of test results were achieved.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- JIANGXI MINZAN WIRE & CABLE CO LTD
- Filing Date
- 2026-03-03
- Publication Date
- 2026-06-02
Smart Images
Figure CN122131095A_ABST
Abstract
Description
Technical Field
[0001] This application belongs to the field of cable performance testing technology, and in particular relates to a method for testing the resistance to tracking of insulation layers in new energy cables. Background Technology
[0002] New energy cables refer to power transmission and connection cables designed and manufactured to adapt to the new energy field (such as wind power, photovoltaic, energy storage, electric vehicles and their charging facilities, etc.) to meet the requirements of high voltage, high current, long distance transmission, frequent dynamic load and complex installation environment.
[0003] In the testing scenario of tracking resistance of insulation layers in new energy cables, high-temperature testing devices and room-temperature testing devices are used simultaneously to conduct parallel tests on the insulation layer areas of the same group of cable samples. At this time, the control device inputs a set of test information to these two testing devices. The parameter parsing unit parses and processes the test information input from the control device obtained from multiple testing devices, and then inputs the parsed and processed test information to multiple testing devices. In this way, multi-dimensional performance data of the insulation layer at the same time dimension (such as performance data under two different environments) can be obtained.
[0004] However, if a test device fails to parse the test information (e.g., a test device malfunctions), the test device will immediately request test information from the control device. To ensure that the test progress of the two test devices is the same, the control device will input another set of test information into the two test devices. As a result, the first set of test information of the normally operating test device has not yet participated in the entire trace detection process before it is replaced by the new test information, causing the subsequent test results to be broken, which in turn affects the accuracy of the test results of the normally operating test device. Summary of the Invention
[0005] This application provides a method for testing the tracking resistance of insulation layers in new energy cables. This method can solve the problem that if a test device fails to parse the test information during the testing process, it will affect the accuracy of the test results of the normally functioning test device.
[0006] In a first aspect, embodiments of this application provide a method for testing the tracking resistance of insulation layers in new energy cables, applied to a cable performance testing device. The cable performance testing device includes a control device, multiple testing devices, and a parameter parsing unit. The parameter parsing unit is capable of parsing and processing test information input from the control device obtained from the multiple testing devices, and inputting the parsed and processed test information back to the multiple testing devices. The method includes: The control device inputs the test information to the multiple testing devices at a preset time node so that the parameter parsing unit can obtain the test information; wherein, the parsing time of the parameter parsing unit in parsing and processing the test information obtained from the multiple testing devices is the target time; When the control device inputs the test information to one of the plurality of test devices, if a test failure service is obtained, a test instruction generated by one of the plurality of test devices is obtained at a specified time node; wherein, the test failure service is that the test information fails to parse the prescribed test rules or fails to parse the test information successfully; the time difference between the specified time node and the preset time node is the target time; When the control device receives the test instruction, it inputs new test information to the multiple test devices at the first time point, so that the multiple test devices can perform the cable insulation layer tracking resistance test.
[0007] The technical solutions described in this application embodiment have at least the following technical effects: The method for testing the tracking resistance of new energy cable insulation layers provided in this application involves a control device inputting test information to multiple testing devices at preset time points so that the parameter parsing unit can acquire the test information. If the control device inputs test information to one of the multiple testing devices and a test failure is detected, a test instruction generated by one of the multiple testing devices is acquired at a specified time point. Upon acquiring the test instruction, the control device inputs new test information to the multiple testing devices at a first time point so that the multiple testing devices can perform the tracking resistance test of the cable insulation layer. The method provided in this application allows for the determination of a target time when inputting the test information to multiple testing devices at preset time points. If a test failure is detected when one of the multiple testing devices inputs the test information, new test information can be input to the multiple testing devices at a first time point so that the multiple testing devices can perform the tracking resistance test of the cable insulation layer. This avoids the problem that if test information fails to be parsed in one testing device, the first set of test information from a normally operating testing device may be replaced by new test information before completing the entire tracking detection process, thus affecting the accuracy of the test results of the normally operating testing device.
[0008] In one possible implementation of the first aspect, the method further includes: When the control device inputs the test information to one of the plurality of test devices, if the current time node is the specified time node and the test information is not successfully parsed, it is determined that the test failed.
[0009] In one possible implementation of the first aspect, after the control device inputs the test information to the plurality of test devices at a preset time node so that the parameter parsing unit can obtain the test information, the method further includes: The target time is determined when the control device inputs the test information to the plurality of test devices at a preset time node.
[0010] In one possible implementation of the first aspect, the method further includes: When the control device inputs the test information to one of the plurality of test devices, the cumulative time action is executed starting from the current time point; If the accumulated time is the target time and no specified test rules are parsed from the test information, then it is determined that the test failed.
[0011] In one possible implementation of the first aspect, if the accumulated time is the target time and no prescribed test rule is parsed from the test information, after determining that the test failed, the method further includes: If it is determined that the test failed because the specified test rules were not parsed from the test information, the parameter parsing unit is instructed to stop parsing and processing.
[0012] In one possible implementation of the first aspect, the method further includes: If the control device inputs the test information to one of the plurality of test devices, and the action of parsing and processing the test information has been completed before the specified time node, it is determined that the test information was not successfully parsed.
[0013] In one possible implementation of the first aspect, the plurality of testing devices are a high-temperature testing device, a room-temperature testing device, and a low-temperature testing device.
[0014] In one possible implementation of the first aspect, the method further includes: When the control device inputs the test information to one of the plurality of test devices, if the current time node is the specified time node and the test information is successfully parsed, it is determined that the test failed service was not obtained.
[0015] Secondly, embodiments of this application provide a testing system for the tracking resistance performance of the insulation layer of a new energy cable, applied to a cable performance testing device, for implementing the tracking resistance performance testing method for the insulation layer of a new energy cable as described in any one of the first aspects above. The testing system for the tracking resistance performance of the insulation layer of a new energy cable includes: An input unit is used by the control device to input the test information to the plurality of test devices at a preset time node, so that the parameter parsing unit can obtain the test information; wherein, the parsing time of the parameter parsing unit in parsing and processing the test information obtained from the plurality of test devices is the target time; The acquisition unit is configured to, when the control device inputs the test information to one of the plurality of test devices, if a test failure service is acquired, acquire a test instruction generated by one of the plurality of test devices at a specified time node; wherein, the test failure service is that the test information fails to parse out the prescribed test rules or fails to parse the test information successfully; the time difference between the specified time node and the preset time node is the target time; The instruction unit is used to input new test information to the plurality of test devices at a first time node when the control device receives the test instruction, so that the plurality of test devices can perform test operations.
[0016] Thirdly, embodiments of this application provide a cable performance testing device, including a memory, a processor, and a computer program stored in the memory and executable on the processor. When the processor executes the computer program, it implements the method for testing the resistance to tracking of the insulation layer of new energy cables as described in any of the first aspects above.
[0017] It is understood that the beneficial effects of the second and third aspects mentioned above can be found in the relevant descriptions in the first aspect mentioned above, and will not be repeated here. Attached Figure Description
[0018] To more clearly illustrate the technical solutions in the embodiments of this application, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this application. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.
[0019] Figure 1 This is a flowchart illustrating a method for testing the resistance to tracking of the insulation layer of a new energy cable according to an embodiment of this application. Figure 2 This is a schematic diagram of the structure of a new energy cable provided in an embodiment of this application; Figure 3 This is a flowchart illustrating a method for testing the resistance to tracking of insulation layers in new energy cables according to another embodiment of this application. Figure 4 This is a schematic diagram of the structure of the new energy cable insulation layer tracking resistance test system provided in the embodiments of this application; Figure 5 This is a schematic diagram of the cable performance testing device provided in the embodiments of this application. Detailed Implementation
[0020] In the following description, specific details such as particular system architectures and techniques are set forth for illustrative purposes and not for limitation, in order to provide a thorough understanding of the embodiments of this application. However, those skilled in the art will understand that this application may also be implemented in other embodiments without these specific details. In other instances, detailed descriptions of well-known systems, apparatuses, circuits, and methods have been omitted so as not to obscure the description of this application with unnecessary detail.
[0021] It should be understood that, when used in this application specification and the appended claims, the term "comprising" indicates the presence of the described features, integrals, steps, operations, elements and / or components, but does not exclude the presence or addition of one or more other features, integrals, steps, operations, elements, components and / or a collection thereof.
[0022] It should also be understood that the term “and / or” as used in this application specification and the appended claims means any combination of one or more of the associated listed items and all possible combinations, and includes such combinations.
[0023] As used in this application specification and the appended claims, the term "if" may be interpreted, depending on the context, as "when," "once," "in response to determination," or "in response to detection." Similarly, the phrase "if determined" or "if the described condition or event is detected" may be interpreted, depending on the context, as "once determined," "in response to determination," "once the described condition or event is detected," or "in response to the detection of the described condition or event."
[0024] Furthermore, in the description of this application and the appended claims, the terms "first," "second," "third," etc., are used only to distinguish descriptions and should not be construed as indicating or implying relative importance.
[0025] References to "one embodiment" or "some embodiments" as described in this specification mean that one or more embodiments of this application include a specific feature, structure, or characteristic described in connection with that embodiment. Therefore, the phrases "in one embodiment," "in some embodiments," "in other embodiments," "in still other embodiments," etc., appearing in different parts of this specification do not necessarily refer to the same embodiment, but rather mean "one or more, but not all, embodiments," unless otherwise specifically emphasized. The terms "comprising," "including," "having," and variations thereof mean "including but not limited to," unless otherwise specifically emphasized.
[0026] The related technologies have the problems described below.
[0027] For example, during the tracking resistance test, the control device can input test information (such as test current, voltage value, corresponding test rules, for example, starting the test from small to large voltage value, applying AC or DC current, test duration corresponding to different voltages or currents, etc.) to multiple test devices according to a preset cycle. The test information will be collected into the parameter set. When a set of test information that meets the detection requirements (such as 5 different breakdown voltage values, 5 different test currents, and corresponding test rules) is collected in the parameter set, the parameter parsing unit will parse and process the test information input from the control device obtained from multiple test devices. If the test device fails, that is, the test information collected in the parameter set corresponding to a certain test device does not reach the minimum sample number required for tracer testing, causing the parameter parsing unit to be unable to complete the analysis according to the standard procedure (i.e., the test is unsuccessful), the parameter parsing unit has no test information to analyze. Since it is necessary to ensure that the test progress of the two test devices is the same, the test pace of other normal test devices will be forced to slow down or be interrupted to wait for the test information collected in the parameter set corresponding to the faulty test device to reach the minimum sample number required for tracer testing. That is, the sudden change in the test rhythm cannot maintain the continuity with the previous stable test state, resulting in the subsequent collected test results (such as leakage current curves) showing unrealistic abrupt changes, which in turn affects the accuracy of the test results of the originally normally working test devices.
[0028] For example, during the tracking resistance test, the control device can input test information (such as test current, voltage value, etc.) to multiple test devices according to a preset cycle. If the parameter parsing unit cannot configure the parsed test information (such as voltage value) to a certain test device (i.e., the test is unsuccessful), then a certain test device will request test information from the control device again because it has no test information. However, in order to ensure that the test progress of the two test devices is the same, the control device will immediately input a new set of test information to the two test devices. As a result, the first set of test information of the normally operating test device has not yet participated in the entire tracking detection process before it is replaced by the new test information, causing the subsequent test results to be broken, which in turn affects the accuracy of the test results of the normally operating test device.
[0029] The description of the discontinuity in test results is as follows: A normal testing setup may still be in the process of testing according to the initially configured test information (e.g., the test duration is 2 hours, but only 1.5 hours have been tested, and 90 minutes of test results have been collected). New test information will forcibly interrupt the subsequent collection of the initially configured test information, causing the test results of the normal testing setup to only include a segment from 0 to 90 minutes, missing the segment from 90 minutes to 120 minutes, thus breaking the originally continuous time series. At the same time, the test corresponding to the new test information starts directly from the 90-minute node, which cannot be connected with the previous test information, ultimately causing the subsequent test results to be discontinuous.
[0030] It should be noted that the testing progress of the two testing devices is the same in order to obtain multi-dimensional performance data of the insulation layer at the same time dimension. That is, by testing the same batch of samples, the performance differences under different environments can be compared. By making the environment a variable and keeping the rhythm of the test information consistent (such as the current value or voltage value at the same time point), the performance differences under different environments can be obtained at one time point, thereby saving test time.
[0031] To address the aforementioned issues, this application provides a method for testing the tracking resistance of insulation layers in new energy cables.
[0032] In this method, the control device inputs test information to multiple testing devices at preset time nodes so that the parameter parsing unit can obtain the test information. If the control device inputs test information to one of the multiple testing devices and a test failure is detected, a test instruction generated by one of the multiple testing devices is obtained at a specified time node. When the test instruction is obtained, the control device inputs new test information to the multiple testing devices at a first time node so that the multiple testing devices can perform the cable insulation tracking resistance test. The method provided in this application can determine the target time when inputting the test information to multiple testing devices at preset time nodes. If a test failure is detected when one of the multiple testing devices inputs the test information, new test information can be input to the multiple testing devices at a first time node so that the multiple testing devices can perform the cable insulation tracking resistance test. This avoids the problem that if test information fails to be parsed in a certain testing device, the first set of test information from a normally operating testing device may not have participated in the entire tracking detection process before being replaced by new test information, thus affecting the accuracy of the test results of the normally operating testing device.
[0033] When the test information collected by the parameter set corresponding to a certain test device does not reach the minimum sample number required for the tracerization test, the system will not wait for the test information collected by the parameter set corresponding to the faulty test device to reach the minimum sample number required for the tracerization test. Instead, it will input new test information to multiple test devices at the first moment, so that multiple test devices can perform the cable insulation tracerization performance test according to the new test information. This will not cause the testing pace of other normal test devices to be forced to slow down or be interrupted, thereby avoiding the problem that the subsequent collected test results (such as leakage current curves) will have unrealistic sudden changes or breaks, which will affect the accuracy of the test results of the normally operating test devices.
[0034] If the parameter parsing unit cannot configure the parsed test information (such as voltage value) to a certain test device, it will not immediately input a set of test information just because the test device requests test information from the control device. Instead, it will input new test information to multiple test devices at the first moment, so that multiple test devices can perform the cable insulation tracking resistance test according to the new test information. This avoids the problem of immediately inputting a set of test information to the two test devices, which would cause the first set of test information of the normally operating test device to be replaced by the new test information before it has participated in the entire tracking detection process, resulting in a break in the subsequent test results and affecting the accuracy of the test results of the normally operating test device.
[0035] The method for testing the resistance to tracking of the insulation layer of new energy cables provided in this application embodiment can be applied to a cable performance testing device. In this case, the cable performance testing device is the main body for executing the method for testing the resistance to tracking of the insulation layer of new energy cables provided in this application embodiment. This application embodiment does not impose any restrictions on the specific type of cable performance testing device.
[0036] For example, a cable performance testing device may include a control device, multiple testing devices (e.g., a high-temperature testing device for measuring leakage current or voltage of cables in high-temperature environments, and a normal-temperature testing device for measuring leakage current or voltage of cables in normal-temperature environments), and a parameter parsing unit (such as a parser and a command scheduler). The control device is electrically connected to the testing device, and the parameter parsing unit is electrically connected to the testing device. The parameter parsing unit can parse and process the test information input from the control device obtained from the testing device, and input the parsed and processed test information back to the testing device, so that the testing device can perform tests on new energy cables (such as...) based on the parsed and processed test information. Figure 2 Perform electrical tracking resistance testing on cable insulation.
[0037] For example, a high-temperature testing device may include a high-temperature constant temperature chamber, tracking resistance test electrodes arranged inside the high-temperature constant temperature chamber, and a voltage sensor. A room-temperature testing device may include a room-temperature constant temperature chamber, tracking resistance test electrodes arranged inside the room-temperature constant temperature chamber, and a voltage sensor.
[0038] For example, the control device can be a microcontroller, mobile phone, tablet computer, laptop computer, ultra-mobile personal computer (UMPC), netbook, desktop computer, computing device, or computer, laptop computer, handheld communication device, handheld computing device, etc. connected to a wireless modem.
[0039] To better understand the method for testing the resistance to tracking of the insulation layer of new energy cables provided in this application, the specific implementation process of the method for testing the resistance to tracking of the insulation layer of new energy cables provided in this application will be described by way of example below.
[0040] Figure 1 This paper presents a schematic flowchart of a method for testing the tracking resistance of insulation layers in new energy cables, as provided in an embodiment of this application. The method includes: S100, the control device inputs test information to multiple testing devices at preset time nodes so that the parameter parsing unit can acquire the test information. The parsing time of the parameter parsing unit in parsing and processing the test information acquired from the multiple testing devices is the target time.
[0041] It is understood that test information is used to indicate the test parameters configured in the test device, such as test voltage, test duration, data acquisition frequency, and test rules (e.g., thresholds corresponding to test results). Preset time nodes reflect the starting time of a complete test cycle (e.g., a constant voltage test phase or a boost step), such as the start time of the test process. Target time reflects the time required for the parameter parsing unit to parse and process the test information after test startup, such as the time required to parse the test information and the time required to configure the parsed test information (e.g., voltage value) to a specific test device. For example, the target time can be determined according to industry test standard requirements or user needs.
[0042] S200: When the control device inputs test information to one of multiple test devices, if a test failure is detected, a test instruction generated by one of the test devices is retrieved at a specified time node. The test failure occurs when the test information fails to parse out the prescribed test rules or fails to parse the test information successfully. The time difference between the specified time node and the preset time node is the target time.
[0043] It is understandable that the "Test Failure" message indicates that no test action was completed or no test state was reached within the time frame for parsing and processing test information (i.e., from the preset time node to the target time end, i.e., within the target time). For example, during the time frame for parsing and processing test information, the test information collected in the parameter set corresponding to a certain test device does not reach the minimum sample size required for trace testing, causing the parameter parsing unit to be unable to complete the analysis according to the standard procedure. Another example is that during the time frame for parsing and processing test information, the parameter parsing unit is unable to configure the parsed test information (such as voltage values) to a certain test device. The test command is used to instruct the control device to input new test information to the test device.
[0044] For example, when a test fails, it indicates that the test information collected in the parameter set corresponding to a certain test device has not reached the minimum number of samples required for trace testing, or it indicates that the parameter parsing unit cannot configure the parsed test information (such as voltage value) to a certain test device.
[0045] When a test fails because the collected test information from the parameter set corresponding to a certain test device has not reached the minimum sample size required for tracer testing, a test instruction generated by one of the multiple test devices is obtained at a specified time node. That is, it does not wait for the collected test information from the parameter set corresponding to the faulty test device to reach the minimum sample size required for tracer testing, but instead inputs new test information to multiple test devices at the first time node. This will not cause the testing pace of other normal test devices to be forced to slow down or be interrupted, thereby avoiding the problem of false abrupt changes or breakpoints in the subsequently collected test results (such as leakage current curves), which would affect the accuracy of the test results of the normally operating test devices.
[0046] If the test fails and the service indication is that the parameter parsing unit cannot configure the parsed test information (such as voltage value) to a certain test device, then at a specified time node, the test instruction generated by one of the multiple test devices is obtained. That is, it will not immediately input a set of test information just because the test device requests test information from the control device. Instead, the test instruction is obtained at the first time node to input new test information to multiple test devices. This avoids immediately inputting a set of test information to two test devices, which would cause the first set of test information of the normally operating test device to be replaced by new test information before it has participated in the entire trace detection process. This would cause subsequent test results to be broken, thus affecting the accuracy of the test results of the normally operating test device.
[0047] S300: When the control device receives a test instruction, it inputs new test information to multiple test devices at the first time point so that the multiple test devices can perform the cable insulation layer tracking resistance test.
[0048] It is understandable that the first time point can be the time point after receiving the test instruction. The testing process for new energy cables can involve multiple rounds of testing, with each round executed based on the test information.
[0049] For example, new test information is input to multiple testing devices at the first time point so that the multiple testing devices can perform the next round of cable insulation tracking resistance test according to the same set of new parameters at the same time dimension.
[0050] This configuration allows for the determination of a target time when the test information is input to multiple testing devices at a preset time node. If a test fails to complete its test when the test information is input to one of the multiple testing devices, new test information can be input to all testing devices at the first time node. This enables the multiple testing devices to perform the cable insulation tracking resistance test. This avoids the problem of a single testing device failing to parse the test information, causing the first set of test information from a normally operating testing device to be replaced by new test information before completing the entire tracking detection process, thus affecting the accuracy of the test results from the normally operating testing device.
[0051] In one possible implementation, the method for testing the tracking resistance of the insulation layer of new energy cables also includes: If the control device inputs test information to one of the multiple test devices, and the current time node is the specified time node, and the test information is not successfully parsed, then it is determined that the test failed.
[0052] It is understandable that when the control device inputs test information to one of the multiple test devices, if the current time node is the specified time node and the test information is not successfully parsed, it means that the time for parsing and processing the test information (i.e., the target time) has been exhausted. However, the test information collected in the parameter set corresponding to a certain test device has not yet reached the minimum number of samples required for trace testing. At this time, it can be determined that the current test is an unsuccessful service.
[0053] This setup allows for the identification of any unsuccessful business tests within a target timeframe, providing data support for subsequent decision-making.
[0054] In one possible implementation, after the control device inputs test information to multiple testing devices at a preset time node in step S100, so that the parameter parsing unit can obtain the test information, the method for testing the tracking resistance of the insulation layer of new energy cables further includes: The target time is determined when the control device inputs test information to multiple test devices at a preset time node.
[0055] It is understandable that the target time can be set based on the parsing capability and command scheduling capability of the parameter parsing unit. When the control device inputs test information to multiple test devices at preset time nodes, the target time can be queried by traversing the logs.
[0056] This setting determines when test information parsing and processing should be completed, helping to avoid inaccurate test results due to unsuccessful business tests.
[0057] In one possible implementation, the method for testing the tracking resistance of the insulation layer of new energy cables also includes: S210, when the control device inputs test information to one of the multiple test devices, the action of accumulating time is executed starting from the current time point.
[0058] It is understandable that when the control device inputs test information to one of the multiple test devices, the current time point is recorded, and the time is accumulated from the current time point.
[0059] S220, if the accumulated time is the target time and no specified test rules are parsed from the test information, then it is determined that the test failed.
[0060] It is understandable that the testing rules could be whether to start testing from low to high voltage values or from high to low voltage values, whether to apply alternating current or direct current, and the test duration corresponding to different voltages or currents, etc.
[0061] For example, when the accumulated time reaches the target time, it means that the time for parsing and processing test information has been exhausted, and the prescribed test rules have not been parsed from the test information. This indicates that the test information collected in the parameter set corresponding to the test device has not reached the minimum number of samples required for tracer testing, that is, not enough test rules corresponding to the test current and voltage values have been collected. At this time, it can be determined that the test failed.
[0062] This setup, which uses both the unresolved test rules and the accumulated time as the target time as judgment conditions, can accurately identify whether any business processes failed to pass the test within the target time, providing data support for subsequent decision-making.
[0063] In one possible implementation, in step S220, if the accumulated time is the target time and no prescribed test rules are parsed from the test information, then after determining that the test failed, the method for testing the tracking resistance of the insulation layer of new energy cables further includes: If the test fails because the specified test rules were not parsed from the test information, the parameter parsing unit is instructed to stop parsing and processing.
[0064] It is understandable that, in cases where a test fails because the specified test rules were not parsed from the test information, in order to avoid the testing pace of other normal test devices being forced to slow down or be interrupted while waiting for the test information collected from the parameter set corresponding to the faulty test device to reach the minimum sample number required for trace testing, the parameter parsing unit can be instructed to stop performing parsing and processing actions. This ensures that the testing pace of normally functioning test devices will not be forced to slow down or be interrupted.
[0065] This setup helps improve the accuracy of test results from normally functioning test devices to avoid the problem of other normal test devices being forced to slow down or be interrupted while waiting for the test information collected from the parameters of the malfunctioning test device to reach the minimum sample size required for tracer testing.
[0066] In one possible implementation, the method for testing the tracking resistance of the insulation layer of new energy cables also includes: If the control device inputs test information to one of the multiple test devices, and the action of parsing and processing the test information has been completed before the specified time node, it is determined that the test information was not successfully parsed.
[0067] It is understandable that when the control device inputs test information to one of the multiple test devices, if the action of parsing and processing the test information has ended before the specified time node, it means that the parameter parsing unit cannot configure the parsed test information (such as voltage value) to a certain test device, causing the action of parsing and processing the test information to end before the specified time node. At this time, it can be determined that the test information was not successfully parsed, that is, the test failure service was detected.
[0068] This setup can identify whether a situation occurs within the target time frame where the parsed test information cannot be configured to a certain test device, providing data support for subsequent decision-making.
[0069] In one possible implementation, the multiple testing devices are a high-temperature testing device, a room-temperature testing device, and a low-temperature testing device.
[0070] It is understood that a high-temperature testing device may include a high-temperature constant-temperature chamber, a tracking resistance test electrode and a voltage sensor arranged within the high-temperature constant-temperature chamber. A room-temperature testing device may include a room-temperature constant-temperature chamber, a tracking resistance test electrode and a voltage sensor arranged within the room-temperature constant-temperature chamber. A low-temperature testing device may include a low-temperature constant-temperature chamber, a tracking resistance test electrode and a voltage sensor arranged within the low-temperature constant-temperature chamber.
[0071] In one possible implementation, please refer to Figure 3 The testing methods for the tracking resistance of new energy cable insulation layers also include: If the control device inputs test information to one of the multiple test devices, and the current time node is the specified time node, and the test information is successfully parsed, then it is determined that the test failed service was not obtained.
[0072] It is understandable that when the control device inputs test information to one of the multiple test devices, if the current time node is the specified time node and the test information is successfully parsed, it means that the time for parsing and processing the test information (i.e. the target time) has been exhausted, and the test information collected in the parameter set corresponding to a certain test device has reached the minimum number of samples required for trace testing. At this time, it can be determined that the unsuccessful test service was not obtained.
[0073] For example, if it is determined that the test was unsuccessful, a test instruction can be generated after the previous test information has been used to complete the entire tracking detection process. This will enable the control device to continue to input new test information to multiple test devices to conduct a new cable insulation tracking resistance test.
[0074] This setting can prevent test tasks that should be valid from being mistakenly judged as unsuccessful, reduce the false alarm rate, and thus help improve the accuracy of subsequent tests.
[0075] It should be understood that the sequence number of each step in the above embodiments does not imply the order of execution. The execution order of each process should be determined by its function and internal logic, and should not constitute any limitation on the implementation process of the embodiments of this application.
[0076] Corresponding to the method for testing the resistance to tracking of the insulation layer of new energy cables described in the above embodiments, this application also provides a system for testing the resistance to tracking of the insulation layer of new energy cables. Each unit of this system can realize each step of the method for testing the resistance to tracking of the insulation layer of new energy cables. Figure 4 The diagram shows a structural block diagram of the tracking resistance test system for new energy cable insulation provided in an embodiment of this application. For ease of explanation, only the parts related to the embodiment of this application are shown.
[0077] Reference Figure 4 The testing system for the tracking resistance of new energy cable insulation includes: The input unit is used to control the device to input test information to multiple testing devices at preset time nodes, so that the parameter parsing unit can obtain the test information. The parsing time of the parameter parsing unit in parsing and processing the test information obtained from the multiple testing devices is the target time.
[0078] The acquisition unit is used to acquire a test instruction generated by one of the multiple test devices at a specified time node when the control device inputs test information to one of the test devices and a test failure is acquired. The test failure occurs when the test information fails to parse out the specified test rules or fails to parse the test information successfully. The time difference between the specified time node and the preset time node is the target time.
[0079] The instruction unit is used to input new test information to multiple test devices at the first time node when the control device receives a test instruction, so that the multiple test devices can perform test operations.
[0080] It should be noted that the information interaction and execution process between the above systems / units are based on the same concept as the method embodiments of this application. For details on their specific functions and technical effects, please refer to the method embodiments section, and they will not be repeated here.
[0081] Those skilled in the art will clearly understand that, for the sake of convenience and brevity, the above-described division of functional units is merely an example. In practical applications, the above functions can be assigned to different functional units as needed, that is, the internal structure of the system can be divided into different functional units to complete all or part of the functions described above. The functional units in the embodiments can be integrated into one processing unit, or each unit can exist physically separately, or two or more units can be integrated into one unit. The integrated unit can be implemented in hardware or as a software functional unit. Furthermore, the specific names of the functional units are only for easy differentiation and are not intended to limit the scope of protection of this application. The specific working process of the units in the above system can be referred to the corresponding process in the foregoing method embodiments, and will not be repeated here.
[0082] This application also provides a cable performance testing device. Figure 5 This is a schematic diagram of the cable performance testing device provided in one embodiment of this application. Figure 5 As shown, the cable performance testing device 6 of this embodiment includes: at least one processor 60 ( Figure 5 Only one is shown in the image), at least one memory 61 ( Figure 5 (Only one is shown in the image) and a computer program 62 stored in the at least one memory 61 and executable on the at least one processor 60. When the processor 60 executes the computer program 62, it causes the cable performance testing device 6 to perform the steps in any of the above-described embodiments of the new energy cable insulation layer tracking resistance test method, or causes the cable performance testing device 6 to perform the functions of each unit in the above-described system embodiments.
[0083] For example, the computer program 62 may be divided into one or more units, which are stored in the memory 61 and executed by the processor 60 to complete this application. The one or more units may be a series of computer program instruction segments capable of performing a specific function, which describe the execution process of the computer program 62 in the cable performance testing device 6.
[0084] The cable performance testing device 6 may include a control device, multiple testing devices (e.g., a high-temperature testing device for measuring the leakage current or voltage of cables in a high-temperature environment, and a normal-temperature testing device for measuring the leakage current or voltage of cables in a normal-temperature environment), and a parameter parsing unit (such as a parser and a command scheduler). The control device is electrically connected to the testing device, and the parameter parsing unit is electrically connected to the testing device. The parameter parsing unit can parse and process the test information input from the control device obtained from the testing device, and input the parsed and processed test information back to the testing device so that the testing device can perform the cable insulation layer tracking resistance test based on the parsed and processed test information. The cable performance testing device 6 may include, but is not limited to, a processor 60 and a memory 61. Those skilled in the art will understand that... Figure 5 This is merely an example of the cable performance testing device 6 and does not constitute a limitation on the cable performance testing device 6. It may include more or fewer components than shown, or combine certain components, or different components, such as input / output devices, network access devices, buses, etc.
[0085] The processor 60 can be a Central Processing Unit (CPU), or it can be other general-purpose processors, digital signal processors (DSPs), application-specific integrated circuits (ASICs), field-programmable gate arrays (FPGAs), or other programmable logic devices, discrete gate or transistor logic devices, discrete hardware components, etc. The general-purpose processor can be a microprocessor or any conventional processor.
[0086] In some embodiments, the memory 61 may be an internal storage unit of the cable performance testing device 6, such as a hard disk or memory of the cable performance testing device 6. In other embodiments, the memory 61 may be an external storage device of the cable performance testing device 6, such as a plug-in hard disk, smart media card (SMC), secure digital (SD) card, flash card, etc., equipped on the cable performance testing device 6. Further, the memory 61 may include both internal storage units and external storage devices of the cable performance testing device 6. The memory 61 is used to store operating systems, applications, bootloaders, data, and other programs, such as the program code of computer programs. The memory 61 can also be used to temporarily store data that has been output or will be output.
[0087] This application also provides a computer-readable storage medium storing a computer program that, when executed by a processor, implements the steps in any of the above method embodiments.
[0088] This application provides a computer program product that, when run on a cable performance testing device, enables the cable performance testing device to implement the steps in any of the above method embodiments.
[0089] If the integrated unit is implemented as a software functional unit and sold or used as an independent product, it can be stored in a computer-readable storage medium. Based on this understanding, all or part of the processes in the methods of the above embodiments of this application can be implemented by a computer program instructing related hardware. The computer program can be stored in a computer-readable storage medium, and when executed by a processor, it can implement the steps of the various method embodiments described above. The computer program includes computer program code, which can be in the form of source code, object code, executable files, or certain intermediate forms. The computer-readable medium can include at least: any entity or device capable of carrying the computer program code to the cable performance testing device, a recording medium, a computer memory, a read-only memory (ROM), a random access memory (RAM), an electrical carrier signal, a telecommunication signal, and a software distribution medium. Examples include USB flash drives, portable hard drives, magnetic disks, or optical disks.
[0090] In the above embodiments, the descriptions of each embodiment have different focuses. For parts that are not described in detail or recorded in a certain embodiment, please refer to the relevant descriptions of other embodiments.
[0091] Those skilled in the art will recognize that the units and algorithm steps of the various examples described in conjunction with the embodiments disclosed herein can be implemented in electronic hardware, or a combination of computer software and electronic hardware. Whether these functions are implemented in hardware or software depends on the specific application and design constraints of the technical solution. Those skilled in the art can use different methods to implement the described functions for each specific application, but such implementation should not be considered beyond the scope of this application.
[0092] In the embodiments provided in this application, it should be understood that the disclosed cable performance testing device, new energy cable insulation layer tracking resistance testing system, and new energy cable insulation layer tracking resistance testing method can be implemented in other ways. For example, the cable performance testing device and new energy cable insulation layer tracking resistance testing system embodiments described above are merely illustrative. For instance, the division of units is merely a logical functional division, and in actual implementation, there may be other division methods. For example, multiple units or components may be combined or integrated into another system, or some features may be ignored or not executed. Furthermore, the displayed or discussed mutual coupling or direct coupling or communication connection may be an indirect coupling or communication connection through some interfaces, devices, or units, and may be electrical, mechanical, or other forms.
[0093] The units described as separate components may or may not be physically separate. The components shown as units may or may not be physical units; that is, they may be located in one place or distributed across multiple network units. Some or all of the units can be selected to achieve the purpose of this embodiment according to actual needs.
[0094] The above-described embodiments are only used to illustrate the technical solutions of this application, and are not intended to limit them. Although this application has been described in detail with reference to the foregoing embodiments, those skilled in the art should understand that modifications can still be made to the technical solutions described in the foregoing embodiments, or equivalent substitutions can be made to some of the technical features. Such modifications or substitutions do not cause the essence of the corresponding technical solutions to deviate from the spirit and scope of the technical solutions of the embodiments of this application, and should all be included within the protection scope of this application.
Claims
1. A method for testing the tracking resistance of insulation layers in new energy cables, characterized in that, An application is made in a cable performance testing device, which includes a control device, multiple testing devices, and a parameter parsing unit. The parameter parsing unit is capable of parsing and processing test information input from the control device obtained from the multiple testing devices, and inputting the parsed and processed test information back to the multiple testing devices. The method includes: The control device inputs the test information to the multiple testing devices at a preset time node so that the parameter parsing unit can obtain the test information; wherein, the parsing time of the parameter parsing unit in parsing and processing the test information obtained from the multiple testing devices is the target time; When the control device inputs the test information to one of the plurality of test devices, if a test failure service is obtained, a test instruction generated by one of the plurality of test devices is obtained at a specified time node; wherein, the test failure service is that the test information fails to parse the prescribed test rules or fails to parse the test information successfully; the time difference between the specified time node and the preset time node is the target time; When the control device receives the test instruction, it inputs new test information to the multiple test devices at the first time point, so that the multiple test devices can perform the cable insulation layer tracking resistance test.
2. The method for testing the tracking resistance of the insulation layer of new energy cables as described in claim 1, characterized in that, The method further includes: When the control device inputs the test information to one of the plurality of test devices, if the current time node is the specified time node and the test information is not successfully parsed, it is determined that the test failed.
3. The method for testing the tracking resistance of the insulation layer of new energy cables as described in claim 1, characterized in that, After the control device inputs the test information to the plurality of test devices at a preset time node so that the parameter parsing unit can obtain the test information, the method further includes: The target time is determined when the control device inputs the test information to the plurality of test devices at a preset time node.
4. The method for testing the tracking resistance of the insulation layer of new energy cables as described in claim 1, characterized in that, The method further includes: When the control device inputs the test information to one of the plurality of test devices, the cumulative time action is executed starting from the current time point; If the accumulated time is the target time and no specified test rules are parsed from the test information, then it is determined that the test failed.
5. The method for testing the tracking resistance of the insulation layer of new energy cables as described in claim 4, characterized in that, If the accumulated time is the target time, and no specified test rules are parsed from the test information, then after determining that the test failed, the method further includes: If it is determined that the test failed because the specified test rules were not parsed from the test information, the parameter parsing unit is instructed to stop parsing and processing.
6. The method for testing the tracking resistance of the insulation layer of new energy cables as described in claim 1, characterized in that, The method further includes: If the control device inputs the test information to one of the plurality of test devices, and the action of parsing and processing the test information has been completed before the specified time node, it is determined that the test information was not successfully parsed.
7. The method for testing the tracking resistance of the insulation layer of new energy cables as described in claim 1, characterized in that, The multiple testing devices are high-temperature testing devices, room-temperature testing devices, and low-temperature testing devices.
8. The method for testing the tracking resistance of the insulation layer of new energy cables as described in claim 2, characterized in that, The method further includes: When the control device inputs the test information to one of the plurality of test devices, if the current time node is the specified time node and the test information is successfully parsed, it is determined that the test failed service was not obtained.
9. A system for testing the tracking resistance of insulation layers in new energy cables, characterized in that, An instrument for testing cable performance, used to implement the method for testing the tracking resistance of the insulation layer of new energy cables as described in any one of claims 1 to 8, wherein the system for testing the tracking resistance of the insulation layer of new energy cables comprises: An input unit is used by the control device to input the test information to the plurality of test devices at a preset time node, so that the parameter parsing unit can obtain the test information; wherein, the parsing time of the parameter parsing unit in parsing and processing the test information obtained from the plurality of test devices is the target time; The acquisition unit is configured to, when the control device inputs the test information to one of the plurality of test devices, if a test failure service is acquired, acquire a test instruction generated by one of the plurality of test devices at a specified time node; wherein, the test failure service is that the test information fails to parse out the prescribed test rules or fails to parse the test information successfully; the time difference between the specified time node and the preset time node is the target time; The instruction unit is used to input new test information to the plurality of test devices at a first time node when the control device receives the test instruction, so that the plurality of test devices can perform test operations.
10. A cable performance testing device, characterized in that, The method includes a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein the processor, when executing the computer program, implements the method as claimed in any one of claims 1 to 8.