An integrated design millimeter wave dual-polarized DRA wide-angle scanning phased array based on a directional diagram reconfigurable unit
By constructing a millimeter-wave dual-polarization DRA wide-angle scanning phased array based on the integrated design of pattern reconfigurable units, the problems of high processing difficulty and limited performance improvement in the existing technology are solved, and a high-performance millimeter-wave dual-polarization DRA wide-angle scanning phased array that is easy to process is realized.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- SOUTH CHINA UNIV OF TECH
- Filing Date
- 2026-03-27
- Publication Date
- 2026-06-12
AI Technical Summary
There is a lack of research on existing millimeter-wave dual-polarized DRA wide-angle scanning arrays, and their fabrication is difficult, which limits performance improvement and makes them difficult to use effectively in engineering applications.
An integrated design based on pattern reconfigurable units is adopted. A millimeter-wave dual-polarization DRA wide-angle scanning phased array is constructed through a dielectric substrate, a metal ground plane, a feeding structure, and a decoupling structure. The beam coverage range is extended by using microstrip line excitation and phase difference adjustment to construct linear and planar phased arrays.
A millimeter-wave dual-polarization DRA wide-angle scanning phased array that is easy to manufacture has been realized, which expands the beam scanning range, solves the problems of manufacturing complexity and positioning difficulty, and improves the scanning performance of the array.
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Figure CN122202867A_ABST