Temperature Control Method and System for Laser Detection System Based on Pulse Waveform Feature Feedback

Abstract

This invention relates to a temperature control method and device for a laser detection system based on pulse waveform feature feedback. The laser detection system includes a laser, an integrating sphere, and a laser detector arranged sequentially. The laser detector is equipped with a cooling system for cooling the laser detector. The laser, integrating sphere, laser detector, and cooling system are each connected to a control terminal. The method is applied to the control terminal and includes: acquiring the pulse waveform characteristics and a first real-time temperature of the laser detector; determining whether the cooling system meets the temperature adjustment conditions based on the pulse waveform characteristics; querying the target adjustment temperature corresponding to the current signal deviation from a database based on the current signal deviation; determining a comprehensive error based on the target adjustment temperature, the first real-time temperature, and the target temperature of the laser detector; inputting the comprehensive error into a PID algorithm to obtain control commands for the cooling system. Timely and accurate temperature control of the laser detection system is achieved based on pulse waveform feature feedback.

Description

Technical Field

[0001] This invention relates to the field of detector technology, and in particular to a temperature control method and system for a laser detection system based on pulse waveform feature feedback. Background Technology

[0002] In laser processing, to achieve better processing results, such as higher aspect ratio, smaller heat-affected zone, and smoother processed surfaces, higher requirements are placed on the laser pulse. Generally, the higher the single-pulse energy and the narrower the pulse width of the laser pulse signal, the better the actual processing effect. Therefore, to ensure good processing results, it is necessary to detect and control the pulse signal of the laser output beam. This requires the laser detector to operate stably and accurately for a long time. However, prolonged exposure to light signals will cause the laser detector to generate heat, leading to signal distortion. Specific factors causing the photodetector to heat up include: heat generated by the device itself during prolonged operation and heat generated by the laser striking the detector. Therefore, cooling control of the laser detector is essential while ensuring signal accuracy.

[0003] Traditional cooling methods such as water cooling and air cooling typically rely on simple temperature monitoring to cool laser detectors. However, these methods ignore the significant hysteresis effect of temperature sensors in physical heat conduction. When a high-energy laser pulse causes instantaneous overheating of the detector core and leads to microscopic distortion of the photoelectric signal, the externally packaged temperature sensor often requires several seconds or even longer to produce a noticeable temperature jump. This single and severely lagging feedback mechanism cannot provide transient feedforward intervention at the initial stage of optical signal distortion, ultimately resulting in cooling actions that are always "half a beat too late." This not only easily causes irreversible thermal damage to the detector but also leads to a significant decrease in manufacturing yield due to waveform distortion. Therefore, there is an urgent need for a method that can precisely control the temperature of laser detectors. Summary of the Invention

[0004] The purpose of this invention is to provide a temperature control method and system for a laser detection system based on pulse waveform feature feedback.

[0005] According to one aspect of this application, a temperature control method for a laser detection system based on pulse waveform feature feedback is provided. The laser detection system includes a laser, an integrating sphere, and a laser detector arranged sequentially. The laser detector is equipped with a cooling system for cooling the laser detector. The laser, integrating sphere, laser detector, and cooling system are respectively connected to a control terminal. The method is applied to the control terminal and includes: The pulse waveform characteristics and the first real-time temperature of the laser detector are obtained; wherein, the pulse waveform characteristics are obtained based on the electrical signals detected by the laser detector. The system determines whether it meets the temperature adjustment conditions based on the pulse waveform characteristics. If the temperature adjustment conditions are met, the current signal deviation is determined based on the pulse waveform characteristics and the target pulse waveform characteristics. The target adjustment temperature corresponding to the current signal deviation is then retrieved from the database based on the current signal deviation. The database records multiple signal deviations and the adjustment temperature corresponding to each signal deviation. The comprehensive error is determined based on the target adjustment temperature, the first real-time temperature, and the target temperature of the laser detector. The comprehensive error is then input into the PID algorithm to obtain control commands for the cooling system. The comprehensive error includes the difference between the first real-time temperature and the dynamic target temperature. The dynamic target temperature includes the difference between the target temperature of the laser detector and the target adjustment temperature.

[0006] According to another aspect of this application, a computer device is provided, including a memory and a processor, wherein a computer program capable of being loaded by the processor and executing the methods described above is stored in the memory.

[0007] According to another aspect of this application, a computer-readable storage medium is provided, storing a computer program that can be loaded by a processor and executed as described above.

[0008] Compared with existing technologies, this application obtains the pulse waveform characteristics of the laser detector, determines whether the cooling system meets the temperature adjustment conditions based on these characteristics, and if the temperature adjustment conditions are met, determines the current signal deviation based on the pulse waveform characteristics and the target pulse waveform characteristics. It then queries the database for the target adjustment temperature corresponding to the current signal deviation, and determines the comprehensive error based on the target adjustment temperature, the first real-time temperature of the laser detector, and the target temperature of the laser detector. This comprehensive error is then input into a PID algorithm to obtain control commands for the cooling system. This approach changes the traditional method of relying solely on temperature sensors for temperature control, instead controlling the cooling system based on feedback from the pulse waveform characteristics of the laser detector, thereby achieving precise temperature control of the laser detector. Attached Figure Description

[0009] Figure 1 A flowchart of a method for temperature control of a laser detection system based on pulse waveform feature feedback according to an embodiment of this application is shown; Figure 2 A schematic diagram of the device structure of the control terminal according to an embodiment of this application is shown; Figure 3 Exemplary systems that can be used to implement the various embodiments described in this application are shown. Detailed Implementation

[0010] The present application will now be described in further detail with reference to the accompanying drawings.

[0011] In a typical configuration of this application, the terminal, the device of the service network, and the trusted party all include one or more processors (e.g., a central processing unit (CPU)), input / output interfaces, network interfaces, and memory.

[0012] Memory may include non-persistent storage in computer-readable media, such as random access memory (RAM) and / or non-volatile memory, such as read-only memory (ROM) or flash memory. Memory is an example of computer-readable media.

[0013] Computer-readable media, including both permanent and non-permanent, removable and non-removable media, can store information using any method or technology. Information can be computer-readable instructions, data structures, program modules, or other data. Examples of computer storage media include, but are not limited to, phase-change memory (PCM), programmable random access memory (PRAM), static random access memory (SRAM), dynamic random access memory (DRAM), other types of random access memory (RAM), read-only memory (ROM), electrically erasable programmable read-only memory (EEPROM), flash memory or other memory technologies, compact disc read-only memory (CD-ROM), digital versatile disc (DVD) or other optical storage, magnetic tape, magnetic disk storage or other magnetic storage devices, or any other non-transfer medium that can be used to store information accessible by a computing device.

[0014] The devices referred to in this application include, but are not limited to, terminals, network devices, or devices formed by integrating terminals and network devices through a network. The terminals include, but are not limited to, any mobile electronic product capable of human-computer interaction (e.g., via a touchpad), such as smartphones and tablets. These mobile electronic products can use any operating system, such as Android or iOS. The network devices include electronic devices capable of automatically performing numerical calculations and information processing according to pre-set or stored instructions. Their hardware includes, but is not limited to, microprocessors, application-specific integrated circuits (ASICs), programmable logic devices (PLDs), field-programmable gate arrays (FPGAs), digital signal processors (DSPs), and embedded devices. The network devices include, but are not limited to, computers, network hosts, single network servers, multiple network server clusters, or clouds composed of multiple servers. Here, a cloud consists of a large number of computers or network servers based on cloud computing, where cloud computing is a type of distributed computing, consisting of a virtual supercomputer composed of a group of loosely coupled computer clusters. The network includes, but is not limited to, the Internet, wide area network, metropolitan area network, local area network, VPN network, wireless ad hoc network, etc. Preferably, the device can also be a program running on the terminal, network device, or a device formed by integrating the terminal and network device, network device, touch terminal, or network device and touch terminal through a network.

[0015] Of course, those skilled in the art should understand that the above-described devices are merely examples, and other existing or future devices that are applicable to this application should also be included within the scope of protection of this application, and are hereby incorporated by reference.

[0016] In the description of this application, "multiple" means two or more, unless otherwise expressly and specifically defined.

[0017] refer to Figure 1This invention provides a flowchart of a method for temperature control of a laser detection system based on pulse waveform feature feedback. The laser detection system includes a laser, an integrating sphere, and a laser detector arranged sequentially. The laser detector is equipped with a cooling system for cooling the laser detector. The laser, integrating sphere, laser detector, and cooling system are connected to a control terminal. The method is applied to the control terminal and includes steps S11, S12, and S13. In step S11, the pulse waveform characteristics and the first real-time temperature of the laser detector are acquired. The pulse waveform characteristics are acquired based on the electrical signal detected by the laser detector. In step S12, it is determined whether the cooling system meets the temperature adjustment conditions based on the pulse waveform characteristics. If the temperature adjustment conditions are met, the current signal deviation is determined based on the pulse waveform characteristics and the target pulse waveform characteristics. The target adjustment temperature corresponding to the current signal deviation is queried from the database based on the current signal deviation. The database records multiple signal deviations and the adjustment temperature corresponding to each signal deviation. In step S13, a comprehensive error is determined based on the target adjustment temperature, the first real-time temperature, and the target temperature of the laser detector. The comprehensive error is input into a PID algorithm to obtain control commands for the cooling system. The comprehensive error includes the difference between the first real-time temperature and the dynamic target temperature. The dynamic target temperature includes the difference between the target temperature of the laser detector and the target adjustment temperature. In some embodiments, a first real-time temperature is obtained by a first temperature sensor disposed on the laser detector. Specifically, the first temperature sensor can be disposed on a heat-conducting base (copper or aluminum block) on the back of the core optoelectronic chip (e.g., photodiode) of the laser detector, or on a PCB board adjacent to the chip, so that the first temperature sensor is as close as possible to the heat source (chip). However, due to physical isolation, there is still a time difference in heat conduction, i.e., hysteresis. This solution addresses the hysteresis problem of physical isolation by incorporating pulse waveform characteristic feedback. In some embodiments, a second temperature sensor is disposed on the surface of the integrating sphere, and a second real-time temperature of the integrating sphere is obtained by the second temperature sensor. In some embodiments, the cooling system includes, but is not limited to, a water cooling system and an air cooling system. Taking a water cooling system as an example, the water cooling system includes a chiller and water pipes. The chiller includes a compressor and a water pump, and is connected to a water-cooled plate on the back of the laser detector through inlet and outlet pipes. The water pump delivers water to the back of the laser detector through a valve, carrying away heat. The compressor cools the return water.

[0018] Specifically, in step S11, the pulse waveform characteristics of the laser detector and the first real-time temperature are acquired; wherein, the pulse waveform characteristics are acquired based on the electrical signal detected by the laser detector. In some embodiments, the pulse waveform characteristics include, but are not limited to, the current pulse width and the current peak voltage. For example, the electrical signal is fitted using a Gaussian curve formula, and the current peak voltage and the current pulse width are obtained based on the fitting result. In some embodiments, the current pulse width includes 1 / e of the Gaussian curve. 2 The corresponding transverse pulse width value, and the current peak voltage includes the highest fitted voltage value.

[0019] In step S12, it is determined whether the cooling system meets the temperature adjustment conditions based on the pulse waveform characteristics. If the temperature adjustment conditions are met, the current signal deviation is determined based on the pulse waveform characteristics and the target pulse waveform characteristics. The target adjustment temperature corresponding to the current signal deviation is queried from the database based on the current signal deviation. The database records multiple signal deviations and the adjustment temperature corresponding to each signal deviation. In some embodiments, the target adjustment temperature includes, but is not limited to, the equivalent temperature value of the cooling system outlet water temperature adjustment theoretically required to restore the distorted pulse waveform characteristics of the laser detector to the target pulse waveform characteristics. In this embodiment, determining the corresponding adjustment temperature by judging whether the pulse waveform characteristics meet the temperature adjustment conditions is more accurate and timely than the method of cooling the laser detector by simply monitoring the temperature. For a detailed explanation of the temperature adjustment conditions, please refer to the corresponding embodiments below, which will not be repeated here. In some embodiments, the target pulse waveform characteristics include, but are not limited to, the pulse width and peak voltage of the laser detector under ideal conditions. In some embodiments, the pulse width and peak voltage of the laser detector under ideal conditions can be obtained experimentally. Then, a mapping relationship between the signal deviation and the adjustment temperature in the database is established through a pre-performed thermal distortion-temperature compensation calibration test. Specifically, the laser thermal load input to the laser detector can be manually controlled and gradually increased, causing varying degrees of microscopic overheating of the internal chip of the laser detector. During this process, a high-frequency acquisition card is used to record in real time the distorted pulse waveforms generated by the laser detector under different overheating states, and the difference (i.e., signal deviation) between the current pulse width, current peak voltage, and the target pulse waveform characteristics under ideal conditions is calculated. For each degree of signal deviation, the target set temperature of the cooling system (e.g., the set value of the cooling system's outlet water temperature) is gradually lowered manually or through an algorithm, and the cooling capacity is increased until the distorted pulse waveform is observed to return to the ideal state (or within the allowable error range). At this point, the temperature reduction value required to restore the waveform to normal (i.e., the adjustment temperature ΔT) is recorded. This database is constructed by recording multiple sets of signal deviations of different degrees and the adjustment temperatures required to successfully correct the deviation. In some embodiments, the above database (i.e., the mapping relationship between multiple signal deviations and the adjustment temperatures corresponding to each signal deviation) can also be generated based on long-term historical operating log data of the laser detection system, using multiple linear regression or machine learning algorithms. This invention does not limit the specific generation method of this database. As those skilled in the art will understand, the adjustment temperature recorded in this embodiment when establishing the database is essentially an equivalent thermal penalty or virtual cooling demand compensation value that characterizes the degree of optical signal distortion.

[0020] In step S13, a comprehensive error is determined based on the target adjustment temperature, the first real-time temperature, and the target temperature of the laser detector. This comprehensive error is then input into a PID algorithm to obtain control commands for the cooling system. The comprehensive error includes the difference between the first real-time temperature and the dynamic target temperature, and the dynamic target temperature includes the difference between the target temperature of the laser detector and the target adjustment temperature. In some embodiments, the target temperature includes, but is not limited to, the ideal temperature that the first real-time temperature needs to reach. In some embodiments, the control commands for the cooling system include, but are not limited to, flow rate control commands for adjusting the speed of the water pump and water temperature control commands for setting the temperature of the compressor. For example, after calculating the comprehensive error, the system inputs this comprehensive error into a preset PID algorithm module for proportional-integral-derivative (PI) calculations. The PID algorithm outputs a normalized comprehensive cooling demand (e.g., a control action quantity of 0%-100%). Subsequently, based on this comprehensive cooling demand, the system maps and generates specific hardware control commands (e.g., converting the demand quantity into a specific water pump variable frequency speed value or a compressor target water temperature setpoint).

[0021] In some embodiments, the pulse waveform characteristics include the current pulse width and the current peak voltage, and the temperature adjustment conditions include at least one of the following: (1) The difference between the current pulse width and the target pulse width is not within the preset pulse width range; for example, the pulse waveform features include the current pulse width, and the target pulse waveform features include the target pulse width. The system presets a pulse width range, and detects whether the temperature adjustment conditions are met by detecting whether the current pulse width is within the preset pulse width range.

[0022] (2) The difference between the current peak voltage and the target peak voltage is not within the preset peak voltage range; for example, the pulse waveform features include the current peak voltage, and the target pulse waveform features include the target peak voltage. The system presets a peak voltage range, and detects whether the temperature adjustment conditions are met by detecting whether the current peak voltage is within the preset peak voltage range.

[0023] (3) The pulse distortion rate of change is equal to or greater than the target rate of change. For example, the pulse distortion rate of change is used to detect whether the temperature adjustment conditions are met. In some embodiments, the pulse distortion rate of change is determined based on the current pulse width and the current peak voltage. For the specific process of obtaining the pulse distortion rate of change, please refer to the corresponding embodiments below, which will not be repeated here.

[0024] Of course, those skilled in the art will understand that the above temperature adjustment conditions are merely examples, and other existing or future temperature adjustment conditions that are applicable to this application are also within the scope of protection of this application and are incorporated herein by reference.

[0025] In some embodiments, the pulse distortion rate of change is obtained by: for the current pulse width and current peak voltage at each time point, determining the pulse distortion coefficient at each time point based on the ratio between the current pulse width and the current peak voltage; and differentiating the pulse distortion coefficient with respect to time to obtain the pulse distortion rate of change. In this embodiment, monitoring the pulse distortion rate of change enables faster detection of whether temperature adjustment is needed, thus providing a quick response to temperature changes in the laser detector. For example, for the current pulse width and current peak voltage acquired at each time point, the ratio of the current pulse width to the current peak voltage is calculated as the pulse distortion coefficient at that time point. Subsequently, the system calculates the difference between the pulse distortion coefficients within adjacent or preset time intervals and divides it by the time interval to achieve discrete differentiation, thereby obtaining the pulse distortion rate of change.

[0026] In some embodiments, the method further includes step S14 (not shown), in which the product of the current pulse width and the current peak voltage is used as the current single pulse energy; if the current single pulse energy is greater than the pulse energy threshold, an alarm message is directly generated. For example, when the current single pulse energy is greater than the pulse energy threshold, it indicates that the laser detector is experiencing a transient thermal shock or optical power overload far exceeding its tolerance. If the system waits for the first temperature sensor to heat up before initiating cooling, the core chip of the laser detector may have already suffered irreversible photothermal damage. Therefore, this embodiment introduces this condition as a safety fuse mechanism for the system. Once triggered, an alarm message needs to be generated immediately and the laser output cut off to avoid damaging the laser detector.

[0027] In some embodiments, the cooling system includes a water-cooling system, and the method further includes step S15 (not shown), in which the temperature difference between the first real-time temperature of the laser detector and the second real-time temperature of the integrating sphere is calculated; the ratio between the temperature difference and the actual power of the laser is used as the current thermal resistance index; if the current thermal resistance index is greater than the thermal resistance safety threshold, the control command for the cooling system is determined to specifically include a flow rate control command to adjust the speed of the water pump; otherwise, the control command for the cooling system is determined to specifically include a water temperature control command to set the temperature of the compressor. In this embodiment, the current thermal resistance index is determined based on the first real-time temperature, the second real-time temperature, and the actual power of the laser, so as to determine whether the current cooling system needs flow rate control or water temperature control based on the current thermal resistance index. In some embodiments, the actual power of the laser includes, but is not limited to, the actual power of the incident beam of the laser, where the incident beam refers to the original laser beam directly output by the laser and injected into the inlet of the integrating sphere. This actual power characterizes the true total heat load injected into the entire laser detection system. For example, when the current thermal resistance index is greater than the thermal resistance safety threshold, it indicates that most of the heat is concentrated inside the laser detector and cannot be dissipated. Therefore, increasing the flow rate will improve the heat dissipation effect on the laser detector. When the current thermal resistance index is less than or equal to the thermal resistance safety threshold, it indicates that the heat is more evenly distributed on the laser detector and integrating sphere, requiring cooling by lowering the overall water temperature. In this embodiment, the current thermal resistance index is creatively introduced to determine the specific control routing commands for the cooling system, thereby improving heat dissipation efficiency.

[0028] In some embodiments, the actual power of the laser is obtained through the following methods: acquiring a measured power value using a laser detector; determining a candidate actual power of the laser based on the measured power value, the attenuation coefficient of the integrating sphere, and the transmittance; querying a database for a target correction coefficient corresponding to the current pulse frequency and current pulse duty cycle based on the current pulse frequency and current pulse duty cycle; wherein the database records correction coefficients corresponding to different pulse frequencies and pulse duty cycles; and multiplying the target correction coefficient by the candidate actual power as the actual power. For example, the system first directly acquires the measured power value after attenuation through the integrating sphere using a laser detector, divides the measured power value by the factory attenuation coefficient and transmittance of the integrating sphere, and calculates the candidate actual power without considering dynamic operating conditions; subsequently, considering the nonlinear slight changes in the response characteristics of the laser detector and integrating sphere under different high-frequency pulses and duty cycles, the system uses the current pulse frequency and duty cycle as an index to look up the target correction coefficient in a preset database; finally, the candidate actual power is multiplied by the target correction coefficient for dynamic fine-tuning, thereby obtaining the accurately restored actual power that is the true input of the laser.

[0029] In some embodiments, the method further includes step S16 (not shown), in which if the temperature adjustment conditions are not met and the difference between the first real-time temperature and the target temperature is greater than the target temperature threshold, the target adjustment temperature is determined based on the difference between the first real-time temperature and the target temperature. For example, when the extracted pulse waveform features do not undergo significant distortion (e.g., the temperature adjustment conditions are not met), but due to prolonged continuous operation of the device or an increase in the external ambient temperature, the first real-time temperature of the laser detector slowly drifts and exceeds the preset target temperature threshold, the target adjustment temperature is directly determined based on the difference between the first real-time temperature and the target temperature, and input into the PID algorithm to generate control commands, thereby ensuring that the laser detection system can reliably maintain a safe operating temperature range under stable conditions without transient thermal shock.

[0030] Figure 2 A schematic diagram of the device structure of a control terminal according to an embodiment of this application is shown. The laser detection system includes a laser, an integrating sphere, and a laser detector arranged sequentially. The laser detector is equipped with a cooling system for cooling the laser detector. The laser, integrating sphere, laser detector, and cooling system are respectively connected to the control terminal. The control terminal includes a first module for acquiring the pulse waveform characteristics and a first real-time temperature of the laser detector; wherein, the pulse waveform characteristics are acquired based on the electrical signal detected by the laser detector. A second module is used to determine whether the cooling system meets the temperature adjustment conditions based on the pulse waveform characteristics; wherein, if the temperature adjustment conditions are met, the current signal deviation is determined based on the pulse waveform characteristics and the target pulse waveform characteristics; the target adjustment temperature corresponding to the current signal deviation is queried from the database based on the current signal deviation; wherein, the database records multiple signal deviations and the adjustment temperature corresponding to each signal deviation. A third module is used to determine a comprehensive error based on the target adjustment temperature, the first real-time temperature, and the target temperature of the laser detector, and input the comprehensive error into a PID algorithm to obtain control commands for the cooling system; wherein, the comprehensive error includes the difference between the first real-time temperature and the dynamic target temperature, and the dynamic target temperature includes the difference between the target temperature of the laser detector and the target adjustment temperature.

[0031] Here, the specific implementation methods corresponding to Module 1, Module 2, and Module 3 are the same as or similar to the specific embodiments of steps S11, S12, and S13 above, and therefore will not be repeated here, but are included by reference.

[0032] In addition to the methods and devices described in the above embodiments, this application also provides a computer-readable storage medium storing computer code that, when executed, performs the method described in any of the preceding embodiments.

[0033] This application also provides a computer program product that, when executed by a computer device, performs the method described in any of the preceding claims.

[0034] This application also provides a computer device, the computer device comprising: One or more processors; Memory, used to store one or more computer programs; When the one or more computer programs are executed by the one or more processors, the one or more processors cause the one or more processors to perform the method as described in any of the preceding methods.

[0035] Figure 3 Exemplary systems that can be used to implement the various embodiments described in this application are shown; like Figure 3 As shown in some embodiments, system 300 can function as any of the devices described in each of the embodiments. In some embodiments, system 300 may include one or more computer-readable media having instructions (e.g., system memory or NVM / storage device 320) and one or more processors (e.g., one or more processors 305) coupled to the one or more computer-readable media and configured to execute the instructions to implement the module and thus perform the actions described in this application.

[0036] In one embodiment, the system control module 310 may include any suitable interface controller to provide any suitable interface to at least one of the processors 305 and / or any suitable device or component communicating with the system control module 310.

[0037] The system control module 310 may include a memory controller module 330 to provide an interface to the system memory 315. The memory controller module 330 may be a hardware module, a software module, and / or a firmware module.

[0038] System memory 315 can be used, for example, to load and store data and / or instructions for system 300. In one embodiment, system memory 315 may include any suitable volatile memory, such as suitable DRAM. In some embodiments, system memory 315 may include double data rate type quad synchronous dynamic random access memory (DDR4 SDRAM).

[0039] In one embodiment, the system control module 310 may include one or more input / output (I / O) controllers to provide interfaces to the NVM / storage device 320 and (one or more) communication interfaces 325.

[0040] For example, NVM / storage device 320 may be used to store data and / or instructions. NVM / storage device 320 may include any suitable non-volatile memory (e.g., flash memory) and / or may include any suitable (one or more) non-volatile storage devices (e.g., one or more hard disk drives (HDDs), one or more optical disc drives (CDs), and / or one or more digital universal optical disc (DVD) drives).

[0041] NVM / storage device 320 may include storage resources that are physically part of a device on which system 300 is mounted, or that can be accessed by the device without necessarily being part of it. For example, NVM / storage device 320 may be accessed via a network through one or more communication interfaces 325.

[0042] One or more communication interfaces 325 may provide the system 300 with an interface to communicate over one or more networks and / or with any other suitable device. The system 300 may wirelessly communicate with one or more components of a wireless network in accordance with any of one or more wireless network standards and / or protocols.

[0043] In one embodiment, at least one of the processors 305 may be logically packaged with one or more controllers of the system control module 310 (e.g., memory controller module 330). In one embodiment, at least one of the processors 305 may be logically packaged with one or more controllers of the system control module 310 to form a system-in-package (SiP). In one embodiment, at least one of the processors 305 may be integrated with the logic of one or more controllers of the system control module 310 on the same die. In one embodiment, at least one of the processors 305 may be integrated with the logic of one or more controllers of the system control module 310 on the same die to form a system-on-a-chip (SoC).

[0044] In various embodiments, system 300 may be, but is not limited to, a server, workstation, desktop computing device, or mobile computing device (e.g., laptop computing device, handheld computing device, tablet computer, netbook, etc.). In various embodiments, system 300 may have more or fewer components and / or different architectures. For example, in some embodiments, system 300 includes one or more cameras, a keyboard, a liquid crystal display (LCD) screen (including a touchscreen display), a non-volatile memory port, multiple antennas, a graphics chip, an application-specific integrated circuit (ASIC), and a speaker.

[0045] It should be noted that this application can be implemented in software and / or a combination of software and hardware, for example, using an application-specific integrated circuit (ASIC), a general-purpose computer, or any other similar hardware device. In one embodiment, the software program of this application can be executed by a processor to implement the steps or functions described above. Similarly, the software program of this application (including related data structures) can be stored in a computer-readable recording medium, such as RAM memory, a magnetic or optical drive, a floppy disk, or similar devices. Furthermore, some steps or functions of this application can be implemented in hardware, for example, as circuitry that cooperates with a processor to perform the various steps or functions.

[0046] Furthermore, a portion of this application can be applied as a computer program product, such as computer program instructions, which, when executed by a computer, can invoke or provide the methods and / or technical solutions according to this application through the operation of the computer. Those skilled in the art will understand that the forms in which computer program instructions exist in a computer-readable medium include, but are not limited to, source files, executable files, installation package files, etc. Correspondingly, the ways in which computer program instructions are executed by a computer include, but are not limited to: the computer directly executing the instructions, or the computer compiling the instructions and then executing the corresponding compiled program, or the computer reading and executing the instructions, or the computer reading and installing the instructions and then executing the corresponding installed program. Here, the computer-readable medium can be any available computer-readable storage medium or communication medium accessible to a computer.

[0047] Communication media include media through which communication signals containing, for example, computer-readable instructions, data structures, program modules, or other data are transmitted from one system to another. Communication media can include guided transmission media (such as cables and wires (e.g., optical fibers, coaxial cables, etc.)) and wireless (unguided transmission) media capable of propagating energy waves, such as sound, electromagnetic, RF, microwave, and infrared. Computer-readable instructions, data structures, program modules, or other data can be embodied as modulated data signals in, for example, wireless media (such as carrier waves or similar mechanisms embodied as part of spread spectrum technology). The term "modulated data signal" refers to a signal whose one or more characteristics are altered or set in a manner that encodes information in the signal. Modulation can be analog, digital, or a hybrid modulation technique.

[0048] By way of example and not limitation, computer-readable storage media may include volatile and non-volatile, removable and non-removable media implemented by any method or technique for storing information such as computer-readable instructions, data structures, program modules or other data. For example, computer-readable storage media include, but are not limited to, volatile memories such as random access memory (RAM, DRAM, SRAM); and non-volatile memories such as flash memory, various read-only memories (ROM, PROM, EPROM, EEPROM), magnetic and ferromagnetic / ferroelectric memories (MRAM, FeRAM); and magnetic and optical storage devices (hard disks, magnetic tapes, CDs, DVDs); or other media now known or hereafter developed capable of storing computer-readable information / data for use by a computer system.

[0049] Herein, one embodiment of this application includes an apparatus comprising a memory for storing computer program instructions and a processor for executing the program instructions, wherein when the computer program instructions are executed by the processor, the apparatus is triggered to run a method and / or technical solution based on the foregoing embodiments of this application.

[0050] It will be apparent to those skilled in the art that this application is not limited to the details of the exemplary embodiments described above, and that this application can be implemented in other specific forms without departing from the spirit or essential characteristics of this application. Therefore, the embodiments should be considered exemplary and non-limiting in all respects, and the scope of this application is defined by the appended claims rather than the foregoing description. Thus, all variations falling within the meaning and scope of equivalents of the claims are intended to be embraced within this application. No reference numerals in the claims should be construed as limiting the scope of the claims. Furthermore, it is clear that the word "comprising" does not exclude other units or steps, and the singular does not exclude the plural. Multiple units or devices recited in the apparatus claims may also be implemented by a single unit or device in software or hardware. The terms "first," "second," etc., are used to indicate names and do not indicate any particular order.

Claims

1. A temperature control method for a laser detection system based on pulse waveform feature feedback, characterized in that, The laser detection system includes a laser, an integrating sphere, and a laser detector arranged sequentially. The laser detector is equipped with a cooling system for cooling the laser detector. The laser, integrating sphere, laser detector, and cooling system are each connected to a control terminal. The method is applied to the control terminal and includes: The pulse waveform characteristics and the first real-time temperature of the laser detector are obtained; wherein the pulse waveform characteristics are obtained based on the electrical signals detected by the laser detector. The system is determined to meet the temperature adjustment conditions based on the pulse waveform characteristics. If the temperature adjustment conditions are met, the current signal deviation is determined based on the pulse waveform characteristics and the target pulse waveform characteristics. The target adjustment temperature corresponding to the current signal deviation is queried from the database based on the current signal deviation. The database records multiple signal deviations and the adjustment temperature corresponding to each signal deviation. A comprehensive error is determined based on the target adjustment temperature, the first real-time temperature, and the target temperature of the laser detector. The comprehensive error is then input into a PID algorithm to obtain control commands for the cooling system. The comprehensive error includes the difference between the first real-time temperature and the dynamic target temperature, and the dynamic target temperature includes the difference between the target temperature of the laser detector and the target adjustment temperature.

2. The method according to claim 1, characterized in that, The pulse waveform characteristics include the current pulse width and the current peak voltage, and the temperature adjustment conditions include at least one of the following: The difference between the current pulse width and the target pulse width is not within the preset pulse width range; The difference between the current peak voltage and the target peak voltage is not within the preset peak voltage range; The rate of change of pulse distortion is equal to or greater than the target rate of change.

3. The method according to claim 2, characterized in that, The pulse distortion rate of change was obtained by the following method: For the current pulse width and current peak voltage at each time point, the pulse distortion coefficient at each time point is determined based on the ratio between the current pulse width and the current peak voltage. The pulse distortion rate of change is obtained by differentiating the pulse distortion coefficient with respect to time.

4. The method according to claim 2, characterized in that, The method further includes: The product of the current pulse width and the current peak voltage is used as the current single pulse energy; If the current single pulse energy is greater than the pulse energy threshold, an alarm message is generated directly.

5. The method according to claim 1, characterized in that, The cooling system includes a water cooling system, and the method further includes: Calculate the temperature difference between the first real-time temperature of the laser detector and the second real-time temperature of the integrating sphere; use the ratio between the temperature difference and the actual power of the laser as the current thermal resistance index. If the current thermal resistance index is greater than the thermal resistance safety threshold, the control command for the cooling system is determined to specifically include a flow rate control command to adjust the speed of the water pump; otherwise, the control command for the cooling system is determined to specifically include a water temperature control command to set the temperature of the compressor.

6. The method according to claim 5, characterized in that, The actual power of the laser is obtained through the following method: The measured power value is obtained through the laser detector; The candidate actual power of the laser is determined based on the measured power value, the attenuation coefficient of the integrating sphere, and the transmittance. The target correction coefficient corresponding to the current pulse frequency and current pulse duty cycle is retrieved from the database based on the current pulse frequency and current pulse duty cycle; wherein, the database records the correction coefficients corresponding to different pulse frequencies and pulse duty cycles; The product of the target correction coefficient and the candidate actual power is taken as the actual power.

7. The method according to claim 1, characterized in that, The method further includes: If the temperature adjustment conditions are not met, and the difference between the first real-time temperature and the target temperature is greater than the target temperature threshold, the target adjustment temperature is determined based on the difference between the first real-time temperature and the target temperature.

8. A laser detection system, characterized in that, The laser detection system includes a laser, an integrating sphere, and a laser detector arranged sequentially. The laser detector is equipped with a cooling system for cooling the laser detector. The laser, integrating sphere, laser detector, and cooling system are each connected to a control terminal. The control terminal includes: A module is used to acquire the pulse waveform characteristics and the first real-time temperature of the laser detector; wherein the pulse waveform characteristics are acquired based on the electrical signals detected by the laser detector. The first and second modules are used to determine whether the cooling system meets the temperature adjustment conditions based on the pulse waveform characteristics; wherein, if the temperature adjustment conditions are met, the current signal deviation is determined based on the pulse waveform characteristics and the target pulse waveform characteristics; the target adjustment temperature corresponding to the current signal deviation is queried from the database based on the current signal deviation; wherein, the database records multiple signal deviations and the adjustment temperature corresponding to each signal deviation; The first and third modules are used to determine a comprehensive error based on the target adjustment temperature, the first real-time temperature, and the target temperature of the laser detector, so as to input the comprehensive error into a PID algorithm to obtain control commands for the cooling system; wherein, the comprehensive error includes the difference between the first real-time temperature and the dynamic target temperature, and the dynamic target temperature includes the difference between the target temperature of the laser detector and the target adjustment temperature.

9. A computer device, characterized in that, It includes a memory and a processor, wherein the memory stores a laser detection system temperature control method based on pulse waveform feature feedback that can be loaded by the processor and executed as described in any one of claims 1 to 7.

10. A computer-readable storage medium, characterized in that, The system stores a pulse waveform feature feedback-based temperature control method for laser detection systems that can be loaded by a processor and executed as described in any one of claims 1 to 7.

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