A signal source test system and method based on a radio frequency switch matrix

Abstract

The present application relates to the technical field of radio frequency automation test, and more particularly to a signal source test system and method based on a radio frequency switch matrix, comprising a calibration module, an analysis module, a correction module, a sending module, an acquisition module, a closed-loop calibration module and a determination module. The calibration module obtains matrix switching time consumption, signal source parameter adjustment time consumption and temperature aging coefficient and calculates a reference time delay difference; the analysis module generates path switching instructions and waveform characteristic adjustment parameters according to a test sequence; the correction module corrects the reference time delay difference using the current temperature and the cumulative number of actions to obtain a current time delay difference value; the sending module determines the instruction sending sequence and interval according to the time delay difference sign and sends in sequence; the acquisition module controls the signal analysis unit to perform data acquisition after the instruction sending is completed; the closed-loop calibration module corrects the waveform characteristic adjustment parameters according to the reflection coefficient deviation; and the determination module compares the test data with a preset index threshold and outputs a test conclusion.

Description

Technical Field

[0001] This invention relates to the field of radio frequency automated testing technology, and in particular to a signal source testing system and method based on a radio frequency switch matrix. Background Technology

[0002] In automated testing scenarios for RF switch matrices, the system needs to use matrix units to time-division multiplex the excitation signals output from a vector signal source to multiple target test ports to simulate the signal reception status of the device under test (DUT) under different spatial locations or channel conditions. Since the channel characteristics corresponding to different test ports differ, the signal source needs to synchronously adjust the characteristic parameters of the output waveform after each switch to match the physical channel model corresponding to the target port. Therefore, during each port switch, the test system must sequentially execute the physical switching action of the matrix path and the adjustment action of the signal source parameters.

[0003] However, when the RF switch matrix performs path switching, the internal mechanical relays require a certain physical engagement time, and the vector signal source also requires a certain locking time after receiving parameter adjustment commands. The time consumption of these two actions is not only unequal, but their completion times are also unrelated, resulting in timing asynchrony between the physical switching action and the signal source parameter adjustment action. Existing technologies typically address this problem using fixed delay waiting or one-sided state polling. However, fixed delays cannot adapt to time drift caused by temperature changes and hardware aging, while one-sided polling cannot simultaneously consider the stable states at both ends of the matrix and the signal source. This timing asynchrony leads to the device under test receiving transient interference signals introduced by the test system itself within the link instability window at the moment of switching. This interference signal is incorrectly recorded as a performance defect of the device under test, causing test data contamination and increased measurement uncertainty. Summary of the Invention

[0004] To overcome the above deficiencies, this invention provides a signal source testing system and method based on a radio frequency switch matrix, aiming to improve the timing asynchrony problem caused by the unequal time consumption and unrelated completion times between the physical switching action of the radio frequency switch matrix and the signal source parameter adjustment action.

[0005] In a first aspect, the present invention provides the following technical solution: a signal source testing system based on a radio frequency switch matrix, comprising:

[0006] The calibration module is used to obtain the reference switching time of the RF switch matrix unit, the reference parameter adjustment time of the vector signal source unit, and the temperature coefficient and aging coefficient of the RF switch matrix unit during the initialization phase, and to calculate the reference delay difference.

[0007] The parsing module is used to receive test sequence instructions, extract the target test port identifier and waveform feature parameter set, and generate path switching instructions and waveform feature adjustment parameters accordingly.

[0008] The correction module is used to obtain the current temperature value and the cumulative number of actions of the target channel, and to correct the reference delay difference using the temperature coefficient and the aging coefficient to obtain the current delay difference value.

[0009] The sending module is used to determine the sending order and sending interval of the path switching command and the waveform feature adjustment parameters according to the sign of the current delay difference, and send them in sequence;

[0010] The acquisition module is used to send an acquisition gate opening command to the signal analysis unit after the path switching command and the waveform feature adjustment parameters have been sent, so as to acquire data of the signal output through the target test port;

[0011] The closed-loop calibration module is used to acquire the reflection coefficient measurement value of the target test port during data acquisition, and to correct the waveform feature adjustment parameters according to the deviation of the measurement value from the reference value.

[0012] The judgment module is used to compare the test data collected by the signal analysis unit with the preset index threshold and output the test conclusion corresponding to the target test port.

[0013] Preferably, in the calibration module, the steps of obtaining the reference switching time, reference parameter adjustment time, temperature coefficient, and aging coefficient, and calculating the reference delay difference specifically include:

[0014] A switching command is sent to the radio frequency switch matrix unit, and the first time interval from the time of transmission to the time of receiving the switching completion signal is recorded as the reference switching time.

[0015] Send a parameter adjustment command to the vector signal source unit and record the second time interval from the time of transmission to the time of receiving the lock completion signal as the time consumed by the reference parameter adjustment;

[0016] Calculate the difference between the reference switching time and the reference parameter adjustment time to obtain the reference delay difference;

[0017] The relay specification parameters are queried from the radio frequency switch matrix unit. The change in switching time corresponding to a unit temperature change is extracted from the specification parameters as the temperature coefficient, and the change in switching time corresponding to a unit increase in the number of operations is extracted as the aging coefficient.

[0018] Preferably, in the parsing module, the steps of receiving test sequence instructions and generating path switching instructions and waveform feature adjustment parameters specifically include:

[0019] Receive test sequence instructions and parse the port field and parameter field carried in the test sequence instructions;

[0020] Extract the target test port identifier from the port field, and generate a path switching instruction based on the target test port identifier;

[0021] Extract the waveform feature parameter set from the parameter fields;

[0022] A waveform feature adjustment instruction is generated based on the waveform feature parameter set.

[0023] Preferably, in the correction module, the steps of obtaining the current temperature value and the cumulative number of actions of the target channel, and correcting the reference delay difference specifically include:

[0024] Send a temperature query command to the radio frequency switch matrix unit to obtain the current temperature value inside the radio frequency switch matrix unit as the current temperature value;

[0025] Read the cumulative number of switching corresponding to the target test port identifier from the locally maintained channel action count table, and use it as the cumulative number of actions for the target channel;

[0026] Calculate the temperature deviation between the current temperature value and the reference temperature value during the initialization calibration phase, and multiply the temperature deviation by the temperature coefficient to obtain the temperature correction amount;

[0027] Calculate the deviation between the cumulative number of actions of the target channel and the baseline number of actions during the initialization calibration phase, and multiply the deviation by the aging coefficient to obtain the aging correction amount;

[0028] The temperature correction and the aging correction are added to the reference delay difference to obtain the current delay difference value.

[0029] Preferably, in the sending module, the step of determining the sending order and sending interval based on the sign of the current delay difference and sending in sequence specifically includes:

[0030] Obtain the current delay difference value and determine the sign of the current delay difference value;

[0031] When the current delay difference is greater than zero, the path switching command is first sent to the radio frequency switch matrix unit, and after waiting for the duration corresponding to the current delay difference, the waveform feature adjustment command is sent to the vector signal source unit.

[0032] When the current delay difference is less than or equal to zero, the waveform feature adjustment command is first sent to the vector signal source unit, and after waiting for the duration corresponding to the absolute value of the current delay difference, the path switching command is then sent to the radio frequency switch matrix unit.

[0033] Record the completion status of the path switching command and the waveform feature adjustment command, and send a completion notification to the acquisition module.

[0034] Preferably, in the acquisition module, the step of sending an acquisition gating start command to the signal analysis unit to perform data acquisition specifically includes:

[0035] Receive a transmission completion notification to confirm that both the path switching instruction and the waveform feature adjustment instruction have been successfully sent.

[0036] After confirming the transmission, wait for a preset fixed microsecond delay;

[0037] After the fixed microsecond delay ends, a data acquisition gating start command is sent to the signal analysis unit so that the signal analysis unit can start data acquisition of the signal output through the target test port.

[0038] After the preset acquisition time has elapsed, a data acquisition gate closing command is sent to the signal analysis unit to end the current data acquisition.

[0039] Preferably, in the closed-loop calibration module, the steps of acquiring the reflection coefficient measurement value and correcting the waveform feature adjustment parameters specifically include:

[0040] During the data acquisition controlled by the acquisition module, the current reflection coefficient measurement value of the target test port is obtained;

[0041] Read the reference reflection coefficient value of the target test port in its initial state from the locally stored calibration parameter table;

[0042] Calculate the deviation between the current reflection coefficient measurement and the reference reflection coefficient value;

[0043] Based on the deviation, the parameter correction amount is calculated according to a preset proportional-integral correction algorithm, and the parameter correction amount is superimposed on the currently used waveform feature adjustment parameters to obtain the corrected waveform feature adjustment parameters.

[0044] The corrected waveform feature adjustment parameters are sent to the vector signal source unit to update the baseband waveform features currently output by the vector signal source unit.

[0045] Preferably, in the determination module, the step of comparing the test data with the indicator threshold and outputting the test conclusion specifically includes:

[0046] Receive test data collected by the signal analysis unit during data acquisition;

[0047] Read the preset indicator threshold corresponding to the target test port from the locally stored indicator threshold table;

[0048] The test data is compared item by item with the preset indicator threshold of the corresponding type, and the comparison results of each indicator are recorded.

[0049] When all comparison results are qualified, the output indicates that the signal source channel corresponding to the target test port has passed the test.

[0050] When at least one comparison result is unqualified, the output indicates that the signal source channel test corresponding to the target test port has failed, and the unqualified indicator item is noted.

[0051] Secondly, the present invention provides the following technical solution: a signal source testing method based on a radio frequency switch matrix, the method comprising:

[0052] During the initialization phase, the reference switching time of the RF switch matrix unit, the reference parameter adjustment time of the vector signal source unit, and the temperature coefficient and aging coefficient of the RF switch matrix unit are obtained, and the reference delay difference is calculated.

[0053] Receive test sequence instructions, extract target test port identifiers and waveform feature parameter sets, and generate path switching instructions and waveform feature adjustment parameters accordingly;

[0054] Obtain the current temperature value and the cumulative number of actions of the target channel, and use the temperature coefficient and the aging coefficient to correct the reference delay difference to obtain the current delay difference value;

[0055] Based on the sign of the current delay difference, determine the sending order and sending interval of the path switching command and the waveform feature adjustment parameters, and send them in sequence;

[0056] After the path switching command and the waveform feature adjustment parameters are both sent, a data acquisition gating start command is sent to the signal analysis unit to acquire data from the signal output through the target test port.

[0057] During data acquisition, the reflection coefficient measurement value of the target test port is obtained, and the waveform feature adjustment parameters are corrected according to the deviation of the measurement value from the reference value.

[0058] The test data collected by the signal analysis unit is compared with the preset index threshold, and the test conclusion corresponding to the target test port is output.

[0059] The present invention has the following beneficial effects:

[0060] 1. In this invention, a calibration module pre-obtains the reference delay difference between the matrix switching time and the signal source parameter adjustment time, and a correction module dynamically corrects this reference delay difference using temperature and aging coefficients to obtain the current delay difference value. The sending module, based on the sign of the current delay difference value, sends path switching and waveform feature adjustment commands in a staggered manner, automatically aligning the matrix switching completion time with the signal source parameter adjustment completion time on the physical time axis. This mechanism eliminates the timing asynchronous window between the two actions, ensuring that the device under test (DUT) does not receive transient interference signals introduced by the test system itself during the switching process. The acquired test data only reflects the true performance of the DUT under steady-state channel conditions, significantly reducing measurement uncertainty.

[0061] 2. In this invention, the current temperature value inside the matrix chassis and the cumulative number of actions of the target channel are obtained in real time through a correction module. Temperature deviation and number deviation are calculated respectively, and the above deviations are converted into time delay correction amounts using the temperature coefficient and aging coefficient obtained during the calibration phase, dynamically correcting the reference time delay difference. This mechanism enables the system to automatically adapt to temperature cycling changes in the chamber environment and mechanical aging drift of relays after long-term use, maintaining the accuracy of the misaligned transmission strategy throughout its entire lifespan and over a wide temperature range, avoiding the problem of fixed delay schemes gradually failing due to environmental changes.

[0062] 3. In this invention, an open-loop feedforward staggered transmission strategy is adopted. The transmission module determines the instruction transmission order based on the sign of the current delay difference: when the delay difference is greater than zero, the matrix instruction is sent first, followed by the signal source instruction; when the delay difference is less than or equal to zero, the signal source instruction is sent first, followed by the matrix instruction. This strategy allows the time consumption of the two actions to overlap in parallel on the time axis, and the total waiting time is equal to the time consumption of the slower of the two, rather than the sum of the two. Compared with the total waiting time of serial execution in the prior art, this solution can save the waiting time of one action with each switch, resulting in a significant cumulative efficiency improvement in test sequences containing a large number of switching actions. Attached Figure Description

[0063] Figure 1 This is a schematic diagram of the architecture of a signal source testing system based on a radio frequency switch matrix proposed in this invention;

[0064] Figure 2 This is a flowchart illustrating a signal source testing method based on a radio frequency switch matrix proposed in this invention. Detailed Implementation

[0065] The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of the present invention, and not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of the present invention.

[0066] Example 1:

[0067] In a first embodiment of the present invention, the present invention provides a signal source testing system based on a radio frequency switch matrix, such as... Figure 1 As shown, it includes:

[0068] The calibration module is used to acquire the reference switching time of the RF switch matrix unit, the reference parameter adjustment time of the vector signal source unit, and the temperature coefficient and aging coefficient of the RF switch matrix unit during the initialization phase, and to calculate the reference delay difference.

[0069] Furthermore, in the calibration module, the steps of obtaining the reference switching time, reference parameter adjustment time, temperature coefficient, and aging coefficient, and calculating the reference delay difference specifically include:

[0070] A switching command is sent to the radio frequency switch matrix unit, and the first time interval from the time of transmission to the time of receiving the switching completion signal is recorded as the reference switching time.

[0071] Send a parameter adjustment command to the vector signal source unit and record the second time interval from the time of transmission to the time of receiving the lock completion signal as the time consumed by the reference parameter adjustment;

[0072] Calculate the difference between the reference switching time and the reference parameter adjustment time to obtain the reference delay difference;

[0073] The relay specification parameters are queried from the radio frequency switch matrix unit. The change in switching time corresponding to a unit temperature change is extracted from the specification parameters as the temperature coefficient, and the change in switching time corresponding to a unit increase in the number of operations is extracted as the aging coefficient.

[0074] Specifically, the calibration module is executed during the system initialization phase. It is used to obtain the reference switching time of the RF switch matrix unit, the reference parameter adjustment time of the vector signal source unit, and the temperature coefficient and aging coefficient of the RF switch matrix unit, and to calculate the reference delay difference.

[0075] First, the control device sends a switching command to the RF switch matrix unit and records the command transmission time as the first start time. During the port switching process, the internal mechanical relays of the RF switch matrix unit require physical engagement time. After the contacts are fully closed and the RF path is stably conducting, the RF switch matrix unit generates a switching completion signal through the TTL trigger output port. When the control device detects this switching completion signal, it records the current time as the first end time. The control device calculates the difference between the first end time and the first start time to obtain the first time interval, which is the reference switching time, denoted as . Next, the control device sends a parameter adjustment command to the vector signal source unit, and simultaneously records the command transmission time as the second start time. After receiving the parameter adjustment command, the vector signal source unit's internal phase-locked loop needs to re-acquire and lock the carrier frequency. Once locking is complete, the vector signal source unit feeds back a locking completion signal through the status register or the LockDetect output port. When the control device detects this locking completion signal, it records the current time as the second end time. The control device calculates the difference between the second end time and the second start time to obtain the second time interval, which is the reference parameter adjustment time, denoted as... .

[0076] The first and second time intervals mentioned above can be obtained by performing multiple measurements and averaging them during the initial system startup to eliminate random jitter from a single measurement. Then, the control device calculates the reference switching time. Adjustment time with reference parameters The difference is used to obtain the reference delay difference, denoted as . The calculation formula is:

[0077] ;

[0078] in, The baseline delay difference is expressed in milliseconds. The baseline switching time is in milliseconds. The time taken to adjust the baseline parameters, in milliseconds.

[0079] Finally, the control device queries the RF switch matrix unit for relay specifications. These specifications are stored in the firmware of the RF switch matrix unit and can be read via standard SCPI commands. The control device extracts two coefficients from the returned specifications: one is the change in switching time corresponding to a unit temperature change, which serves as the temperature coefficient, denoted as... The first is the unit, measured in milliseconds per degree Celsius; the second is the change in switching time corresponding to an increase in the number of unit actions, which is used as the aging factor and denoted as... The unit is milliseconds per 10,000 cycles. If the relay specifications do not directly provide the above coefficients, the control device can use typical values ​​of similar relays as default values, or obtain them by performing calibration measurements at different temperature points and different number of operations.

[0080] At this point, the calibration module has completed all calibration operations, setting the reference time delay difference. Temperature coefficient aging coefficient and the reference temperature value at the calibration time. and the baseline number of actions for each channel Store it in a local configuration file for the correction module to call during subsequent testing phases.

[0081] The parsing module is used to receive test sequence instructions, extract the target test port identifier and waveform feature parameter set, and generate path switching instructions and waveform feature adjustment parameters accordingly.

[0082] Furthermore, in the parsing module, the steps of receiving test sequence instructions and generating path switching instructions and waveform feature adjustment parameters specifically include:

[0083] Receive test sequence instructions and parse the port field and parameter field carried in the test sequence instructions;

[0084] Extract the target test port identifier from the port field, and generate a path switching instruction based on the target test port identifier;

[0085] Extract the waveform feature parameter set from the parameter fields;

[0086] A waveform feature adjustment instruction is generated based on the waveform feature parameter set.

[0087] Specifically, the parsing module is used to receive test sequence instructions, extract the target test port identifier and waveform feature parameter set, and generate path switching instructions and waveform feature adjustment parameters accordingly.

[0088] First, the control device receives test sequence instructions from the host computer. These instructions are in a structured data format and include at least a port field and a parameter field. The control device parses the instructions, extracting the contents of the port and parameter fields. Second, the control device extracts the target test port identifier from the port field. This identifier is a unique number for the output port of the RF switch matrix unit, used to specify the signal path for this test. The control device generates a path switching instruction based on the target test port identifier. This instruction conforms to the standard SCPI instruction format supported by the RF switch matrix unit and controls the unit to switch its internal signal path to the physical port corresponding to the target test port identifier. Then, the control device extracts a waveform feature parameter set from the parameter field. This set includes at least one or more combinations of frequency offset, amplitude, and phase parameters, used to describe the channel physical characteristics corresponding to the target test port. The control device generates a waveform feature adjustment instruction based on the parameter set. This instruction conforms to the standard SCPI instruction format supported by the vector signal source unit and controls the vector signal source unit to adjust the parameters of the currently output baseband waveform.

[0089] At this point, the parsing module has completed the parsing and command generation operations of the test sequence commands, and outputs path switching commands and waveform feature adjustment commands for the sending module to call.

[0090] The correction module is used to obtain the current temperature value and the cumulative number of actions of the target channel, and to correct the reference delay difference using the temperature coefficient and the aging coefficient to obtain the current delay difference value.

[0091] Furthermore, in the correction module, the steps of obtaining the current temperature value and the cumulative number of actions of the target channel, and correcting the reference delay difference specifically include:

[0092] Send a temperature query command to the radio frequency switch matrix unit to obtain the current temperature value inside the radio frequency switch matrix unit as the current temperature value;

[0093] Read the cumulative number of switching corresponding to the target test port identifier from the locally maintained channel action count table, and use it as the cumulative number of actions for the target channel;

[0094] Calculate the temperature deviation between the current temperature value and the reference temperature value during the initialization calibration phase, and multiply the temperature deviation by the temperature coefficient to obtain the temperature correction amount;

[0095] Calculate the deviation between the cumulative number of actions of the target channel and the baseline number of actions during the initialization calibration phase, and multiply the deviation by the aging coefficient to obtain the aging correction amount;

[0096] The temperature correction and the aging correction are added to the reference delay difference to obtain the current delay difference value.

[0097] Specifically, the correction module obtains the current temperature value and the cumulative number of actions of the target channel, and uses the temperature coefficient and aging coefficient provided by the calibration module to correct the reference delay difference to obtain the current delay difference value. First, the control device sends a temperature query command to the RF switch matrix unit. This temperature query command is a standard SCPI command. After receiving the command, the RF switch matrix unit returns the temperature value currently measured by its internal temperature sensor. The control device uses this returned temperature value as the current temperature value, denoted as... Secondly, the control device reads the cumulative number of switches corresponding to the target test port identifier from the locally maintained channel action count table. The channel action count table is a data table that the control device updates and persists after each path switch, recording the cumulative number of switches for each target test port since the system's initial operation. The control device uses the read cumulative number of switches as the cumulative number of actions for the target channel, denoted as... .

[0098] Then, the control unit calculates the temperature correction. The control unit reads the reference temperature value stored during the calibration phase from its local configuration file. and temperature coefficient The control device calculates the current temperature value. Compared with the reference temperature value The temperature deviation is multiplied by a temperature coefficient. The temperature correction amount is obtained and denoted as... The calculation formula is:

[0099] ;

[0100] in, This is the temperature correction amount, in milliseconds. This is a temperature coefficient, measured in milliseconds per degree Celsius. This is the current temperature value, in degrees Celsius. This is the reference temperature value, in degrees Celsius.

[0101] Next, the control unit calculates the aging correction amount. The control unit reads the baseline number of actions stored in the calibration phase from the local configuration file. and aging coefficient The control device calculates the cumulative number of actions for the target channel. Compared with the baseline number of movements The frequency deviation is multiplied by the aging factor. The aging correction amount is obtained and denoted as The calculation formula is:

[0102] ;

[0103] in, This is the aging correction amount, in milliseconds; This is the aging factor, expressed in milliseconds per 10,000 cycles. The total number of actions is expressed in times. The baseline number of actions is expressed in times.

[0104] Finally, the control device will adjust the temperature correction amount. and aging correction amount The reference delay difference superimposed on the calibration phase Obtain the current delay difference, denoted as The calculation formula is:

[0105] ;

[0106] in, This represents the current latency difference, in milliseconds. The baseline delay difference is expressed in milliseconds. This is the temperature correction amount, in milliseconds. This is the aging correction amount, in milliseconds.

[0107] The sending module is used to determine the sending order and sending interval of the path switching command and the waveform feature adjustment parameters according to the sign of the current delay difference, and send them in sequence.

[0108] Furthermore, in the sending module, the step of determining the sending order and sending interval based on the sign of the current delay difference and sending them in sequence specifically includes:

[0109] Obtain the current delay difference value and determine the sign of the current delay difference value;

[0110] When the current delay difference is greater than zero, the path switching command is first sent to the radio frequency switch matrix unit, and after waiting for the duration corresponding to the current delay difference, the waveform feature adjustment command is sent to the vector signal source unit.

[0111] When the current delay difference is less than or equal to zero, the waveform feature adjustment command is first sent to the vector signal source unit, and after waiting for the duration corresponding to the absolute value of the current delay difference, the path switching command is then sent to the radio frequency switch matrix unit.

[0112] Record the completion status of the path switching command and the waveform feature adjustment command, and send a completion notification to the acquisition module.

[0113] Specifically, the sending module determines the sending order and interval of the path switching command and waveform characteristic adjustment command based on the sign of the current delay difference value output by the correction module, and sends them in sequence. First, the control device obtains the current delay difference value from the correction module. And determine the current delay difference. The symbol. When the current delay difference A value greater than zero indicates that the reference switching time of the RF switch matrix unit is greater than the reference parameter adjustment time of the vector signal source unit, meaning the matrix switching action is slower than the signal source parameter adjustment action. In this case, the control device first sends a path switching command to the RF switch matrix unit, causing the matrix to begin executing the path switching action; from the moment the path switching command is sent, the control device waits... After the corresponding duration, the waveform feature adjustment command is sent to the vector signal source unit. Since matrix switching takes a long time while signal source parameter adjustment takes a short time, the above-mentioned staggered transmission strategy automatically aligns the time of matrix switching completion with the time of signal source parameter adjustment completion on the physical time axis.

[0114] When the current delay difference When the value is less than or equal to zero, it indicates that the reference switching time of the RF switch matrix unit is less than or equal to the reference parameter adjustment time of the vector signal source unit, meaning the matrix switching action is faster than or equal to the signal source parameter adjustment action. At this time, the control device first sends the waveform characteristic adjustment command to the vector signal source unit, causing the signal source to begin performing parameter adjustment; from the moment the waveform characteristic adjustment command is sent, the control device waits... After determining the absolute value of the duration, the path switching command is sent to the RF switch matrix unit. Similarly, the above-mentioned staggered transmission strategy aligns the completion times of the two actions. The waiting time can be implemented using a software timer within the control device, with a timing accuracy in the millisecond range, meeting the synchronization accuracy requirements of this scheme.

[0115] Finally, the control device records the completion status of the path switching command and waveform feature adjustment command, and sends a completion notification to the acquisition module. The completion notification informs the acquisition module that both commands have been sent and that it can prepare to begin the subsequent data acquisition process. At this point, the sending module has completed the staggered command transmission operation.

[0116] The acquisition module is used to send an acquisition gating start command to the signal analysis unit after the path switching command and the waveform feature adjustment parameters have been sent, so as to acquire data of the signal output through the target test port.

[0117] Furthermore, in the acquisition module, the step of sending an acquisition gating start command to the signal analysis unit to perform data acquisition specifically includes:

[0118] Receive a transmission completion notification to confirm that both the path switching instruction and the waveform feature adjustment instruction have been successfully sent.

[0119] After confirming the transmission, wait for a preset fixed microsecond delay;

[0120] After the fixed microsecond delay ends, a data acquisition gating start command is sent to the signal analysis unit so that the signal analysis unit can start data acquisition of the signal output through the target test port.

[0121] After the preset acquisition time has elapsed, a data acquisition gate closing command is sent to the signal analysis unit to end the current data acquisition.

[0122] Specifically, the acquisition module sends an acquisition gating start command to the signal analysis unit after both the path switching command and waveform characteristic adjustment command have been sent, in order to acquire data from the signal output through the target test port. First, the control device receives a transmission completion notification from the transmission module, confirming that both the path switching command and waveform characteristic adjustment command have been sent. Second, after confirming transmission completion, the control device waits for a preset fixed microsecond delay. This fixed microsecond delay is used to cover the worst-case jitter during command transmission, parsing, and hardware response within the instrument, ensuring that the physical path of the RF switch matrix unit is fully established and the output waveform of the vector signal source unit is fully stable before the acquisition gating is activated. The value of the fixed microsecond delay can be determined based on the actual test calibration of the system, with a typical range of fifty to two hundred microseconds.

[0123] Then, after a fixed microsecond delay, the control device sends a data acquisition gating start command to the signal analysis unit. Upon receiving the data acquisition gating start command, the signal analysis unit begins data acquisition of the signal output through the target test port. During the acquisition process, the signal acquired by the signal analysis unit is the steady-state radio frequency signal output at the target test port after being switched by the radio frequency switch matrix unit. This signal has been superimposed with the waveform characteristics adjusted by the vector signal source unit according to the waveform characteristic adjustment command.

[0124] Finally, after the preset acquisition duration has elapsed, the control device sends an acquisition gating shutdown command to the signal analysis unit, which then stops the current data acquisition. The preset acquisition duration is set according to the specific requirements of the test project; for example, the duration of a single acquisition can be set from ten milliseconds to one hundred milliseconds. At this point, the acquisition module has completed the data acquisition control operation following this switchover.

[0125] The closed-loop calibration module is used to acquire the reflection coefficient measurement value of the target test port during data acquisition, and to correct the waveform feature adjustment parameters based on the deviation of the measurement value from the reference value.

[0126] Furthermore, in the closed-loop calibration module, the steps of acquiring the reflection coefficient measurement value and correcting the waveform feature adjustment parameters specifically include:

[0127] During the data acquisition controlled by the acquisition module, the current reflection coefficient measurement value of the target test port is obtained;

[0128] Read the reference reflection coefficient value of the target test port in its initial state from the locally stored calibration parameter table;

[0129] Calculate the deviation between the current reflection coefficient measurement and the reference reflection coefficient value;

[0130] Based on the deviation, the parameter correction amount is calculated according to a preset proportional-integral correction algorithm, and the parameter correction amount is superimposed on the currently used waveform feature adjustment parameters to obtain the corrected waveform feature adjustment parameters.

[0131] The corrected waveform feature adjustment parameters are sent to the vector signal source unit to update the baseband waveform features currently output by the vector signal source unit.

[0132] Specifically, the closed-loop calibration module is used to acquire the reflection coefficient measurement value of the target test port during data acquisition, and to correct the waveform characteristic adjustment parameters based on the deviation of this measurement value from the reference reflection coefficient value. First, during data acquisition controlled by the acquisition module, the control device sends a reflection coefficient reading command to the directional coupler connected to the target test port to acquire the current reflection coefficient measurement value of the target test port, denoted as... The reflection coefficient measurement can be obtained using a vector network analyzer or reflectometer, characterizing the degree of signal reflection at the target test port due to changes in impedance matching. Next, the control device reads the reference reflection coefficient value of the target test port in its initial state from the locally stored calibration parameter table, denoted as... The calibration parameter table is established during initial system installation or environmental calibration, storing the initial reflection coefficient values ​​of each target test port under standard test conditions.

[0133] Then, the control device calculates the current reflection coefficient measurement value. Compared with the reference reflection coefficient value The deviation is denoted as The calculation formula is:

[0134] ;

[0135] in, The deviation of the reflection coefficient is dimensionless. This is the current measured value of the reflection coefficient, which is dimensionless. The reference reflection coefficient value is dimensionless.

[0136] Next, the control device determines the amount of reflection coefficient deviation. The parameter correction is calculated according to a preset proportional-integral correction algorithm. The proportional-integral correction algorithm consists of two parts: a proportional term and an integral term. The calculation formula is as follows:

[0137] ;

[0138] in, This is the parameter correction amount, and the unit is consistent with the unit of the waveform characteristic adjustment parameter; This is the proportionality coefficient. These are the integral coefficients, both of which are preset constants; This is the deviation of the reflection coefficient; This is the integral of the reflection coefficient deviation over time.

[0139] Proportional Term Used for rapid response to instantaneous changes in the reflection coefficient, integral term It is used to eliminate steady-state errors caused by the slow drift of environmental parameters during long-term testing.

[0140] The control device will adjust the parameter amount Superimposed on the currently used waveform feature adjustment parameters The corrected waveform characteristic adjustment parameters are obtained, denoted as... The calculation formula is:

[0141] ;

[0142] in, Adjust parameters to modify the waveform characteristics; Adjust the parameters for the currently used waveform characteristics; This is the parameter correction amount.

[0143] Finally, the control device adjusts the parameters of the corrected waveform characteristics. The signal is sent to the vector signal source unit, which updates the current output baseband waveform characteristics based on the corrected parameters, thus completing one closed-loop calibration.

[0144] The closed-loop calibration module continuously executes the above steps during data acquisition, enabling the waveform characteristic parameters output by the vector signal source unit to track changes in the test environment in real time, and maintaining a high degree of matching between the test excitation signal and the actual physical state of the target test port.

[0145] The judgment module is used to compare the test data collected by the signal analysis unit with the preset index threshold and output the test conclusion corresponding to the target test port.

[0146] Further, in the determination module, the steps of comparing the test data with the index threshold and outputting a test conclusion specifically include:

[0147] Receiving the test data collected by the signal analysis unit during data acquisition;

[0148] Reading the preset index threshold corresponding to the target test port from the locally stored index threshold table;

[0149] Comparing the test data item by item with the preset index threshold of the corresponding type, and recording the comparison results of each index;

[0150] When all comparison results are qualified, outputting a test conclusion indicating that the signal source channel corresponding to the target test port passes the test;

[0151] When there is at least one unqualified comparison result, outputting a test conclusion indicating that the signal source channel corresponding to the target test port fails the test, and附注ing the unqualified index items.

[0152] Specifically, the determination module is used to compare the test data collected by the signal analysis unit with the preset index threshold and output the test conclusion corresponding to the target test port. First, the control device receives the test data collected by the signal analysis unit during data acquisition. The test data includes at least one or a combination of power value, error vector magnitude value, and spectrum mask compliance index. The above test data is generated by the signal analysis unit after demodulating the collected radio frequency signal and measuring parameters. Second, the control device reads the preset index threshold corresponding to the target test port from the locally stored index threshold table. The index threshold table is a pre-configured data table that stores the threshold values corresponding to different types of test data for each target test port. For example, the threshold for the power value index can be set as an interval composed of the minimum power threshold and the maximum power threshold, and the threshold for the error vector magnitude value can be set as the maximum allowable value. The preset index threshold corresponds to the type of test data one by one. Then, the control device compares the test data item by item with the preset index threshold of the corresponding type and records the comparison results of each index. For the test data of the power value type, when the measured power value falls between the minimum power threshold and the maximum power threshold, it is determined that this index is qualified, otherwise it is determined as unqualified. For the test data of the error vector magnitude value type, when the measured error vector magnitude value is less than or equal to the maximum allowable value, it is determined that this index is qualified, otherwise it is determined as unqualified. For the spectrum mask compliance index, when the measured spectrum distribution is within the specified mask range, it is determined that this index is qualified, otherwise it is determined as unqualified.

[0153] It should be noted that there is an incorrect character "附注" in the original text. It should probably be "附注", and the translation is adjusted accordingly. If this is not what you meant, please clarify.Finally, the control device generates and outputs test conclusions based on the comparison results of various indicators. When all indicators are qualified, the control device outputs a test conclusion indicating that the signal source channel corresponding to the target test port has passed the test. When at least one indicator fails, the control device outputs a test conclusion indicating that the signal source channel corresponding to the target test port has failed the test, and includes the name and measured value of the failed indicator in the test conclusion to help testers locate the cause of the fault. At this point, the judgment module completes the conclusion judgment and output operation for this test.

[0154] Example 2:

[0155] In a signal source testing system based on an RF switch matrix, the physical engagement time of the internal mechanical relays required for the RF switch matrix to perform path switching is different from the locking time of the internal phase-locked loop required after the vector signal source receives parameter adjustment commands. Their completion times are unrelated, resulting in timing asynchrony between the physical switching action and the signal source parameter adjustment action. Existing technologies using fixed delay waiting or one-sided state polling cannot simultaneously consider the stable states of both the matrix and the signal source, and cannot adapt to time drift caused by temperature changes and hardware aging. This leads to the device under test receiving transient interference signals introduced by the testing system itself within the link instability window at the moment of switching. This interference signal is incorrectly recorded as a performance defect of the device under test, resulting in test data contamination and increased measurement uncertainty. To solve the above problems, this invention provides a signal source testing method based on an RF switch matrix, the structure of which is as follows: Figure 2 As shown. The specific implementation process of this method is as follows:

[0156] During the initialization phase, the reference switching time of the RF switch matrix unit, the reference parameter adjustment time of the vector signal source unit, and the temperature coefficient and aging coefficient of the RF switch matrix unit are obtained, and the reference delay difference is calculated.

[0157] Receive test sequence instructions, extract target test port identifiers and waveform feature parameter sets, and generate path switching instructions and waveform feature adjustment parameters accordingly;

[0158] Obtain the current temperature value and the cumulative number of actions of the target channel, and use the temperature coefficient and the aging coefficient to correct the reference delay difference to obtain the current delay difference value;

[0159] Based on the sign of the current delay difference, determine the sending order and sending interval of the path switching command and the waveform feature adjustment parameters, and send them in sequence;

[0160] After the path switching command and the waveform feature adjustment parameters are both sent, a data acquisition gating start command is sent to the signal analysis unit to acquire data from the signal output through the target test port.

[0161] During data acquisition, the reflection coefficient measurement value of the target test port is obtained, and the waveform feature adjustment parameters are corrected according to the deviation of the measurement value from the reference value.

[0162] The test data collected by the signal analysis unit is compared with the preset index threshold, and the test conclusion corresponding to the target test port is output.

[0163] Specifically, during the initialization phase, the control device acquires the reference switching time of the RF switch matrix unit, the reference parameter adjustment time of the vector signal source unit, and the temperature coefficient and aging coefficient of the RF switch matrix unit, and calculates the reference delay difference; the control device receives test sequence commands, extracts the target test port identifier and waveform feature parameter set, and generates path switching commands and waveform feature adjustment parameters accordingly; the control device acquires the current temperature value and the cumulative number of actions of the target channel, corrects the reference delay difference using the temperature coefficient and aging coefficient, and obtains the current delay difference value; the control device determines the path switching based on the sign of the current delay difference value. The control device determines the sending order and interval of the path switching command and waveform characteristic adjustment parameters, and sends them sequentially. After both the path switching command and waveform characteristic adjustment parameters are sent, the control device sends a data acquisition gating open command to the signal analysis unit to acquire data from the signal output through the target test port. During data acquisition, the control device obtains the reflection coefficient measurement value of the target test port and corrects the waveform characteristic adjustment parameters based on the deviation of this measurement value from the reference reflection coefficient value. The control device compares the test data acquired by the signal analysis unit with the preset index threshold and outputs the test conclusion corresponding to the target test port. The specific implementation process of each of the above steps is consistent with the implementation process of the corresponding modules in the aforementioned system embodiment, and will not be repeated here.

[0164] Finally, it should be noted that the above description is only a preferred embodiment of the present invention and is not intended to limit the present invention. Although the present invention has been described in detail with reference to the foregoing embodiments, those skilled in the art can still modify the technical solutions described in the foregoing embodiments or make equivalent substitutions for some of the technical features. Any modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of the present invention should be included within the protection scope of the present invention.

Claims

1. A signal source testing system based on a radio frequency switch matrix, characterized in that, include: The calibration module is used to obtain the reference switching time of the RF switch matrix unit, the reference parameter adjustment time of the vector signal source unit, and the temperature coefficient and aging coefficient of the RF switch matrix unit during the initialization phase, and to calculate the reference delay difference. The parsing module is used to receive test sequence instructions, extract the target test port identifier and waveform feature parameter set, and generate path switching instructions and waveform feature adjustment parameters accordingly. The correction module is used to obtain the current temperature value and the cumulative number of actions of the target channel, and to correct the reference delay difference using the temperature coefficient and the aging coefficient to obtain the current delay difference value. The sending module is used to determine the sending order and sending interval of the path switching command and the waveform feature adjustment parameters according to the sign of the current delay difference, and send them in sequence; The acquisition module is used to send an acquisition gate opening command to the signal analysis unit after the path switching command and the waveform feature adjustment parameters have been sent, so as to acquire data of the signal output through the target test port; The closed-loop calibration module is used to acquire the reflection coefficient measurement value of the target test port during data acquisition, and to correct the waveform feature adjustment parameters according to the deviation of the measurement value from the reference value. The judgment module is used to compare the test data collected by the signal analysis unit with the preset index threshold and output the test conclusion corresponding to the target test port.

2. The signal source testing system based on an RF switch matrix according to claim 1, characterized in that, In the calibration module, the steps of obtaining the reference switching time, reference parameter adjustment time, temperature coefficient, and aging coefficient, and calculating the reference delay difference specifically include: A switching command is sent to the radio frequency switch matrix unit, and the first time interval from the time of transmission to the time of receiving the switching completion signal is recorded as the reference switching time. Send a parameter adjustment command to the vector signal source unit and record the second time interval from the time of transmission to the time of receiving the lock completion signal as the time consumed by the reference parameter adjustment; Calculate the difference between the reference switching time and the reference parameter adjustment time to obtain the reference delay difference; The relay specification parameters are queried from the radio frequency switch matrix unit. The change in switching time corresponding to a unit temperature change is extracted from the specification parameters as the temperature coefficient, and the change in switching time corresponding to a unit increase in the number of operations is extracted as the aging coefficient.

3. The signal source testing system based on a radio frequency switch matrix according to claim 1, characterized in that, In the parsing module, the steps of receiving test sequence instructions and generating path switching instructions and waveform feature adjustment parameters specifically include: Receive test sequence instructions and parse the port field and parameter field carried in the test sequence instructions; Extract the target test port identifier from the port field, and generate a path switching instruction based on the target test port identifier; Extract the waveform feature parameter set from the parameter fields; A waveform feature adjustment instruction is generated based on the waveform feature parameter set.

4. The signal source testing system based on a radio frequency switch matrix according to claim 1, characterized in that, In the correction module, the steps of obtaining the current temperature value and the cumulative number of actions of the target channel, and correcting the reference delay difference specifically include: Send a temperature query command to the radio frequency switch matrix unit to obtain the current temperature value inside the radio frequency switch matrix unit as the current temperature value; Read the cumulative number of switching corresponding to the target test port identifier from the locally maintained channel action count table, and use it as the cumulative number of actions for the target channel; Calculate the temperature deviation between the current temperature value and the reference temperature value during the initialization calibration phase, and multiply the temperature deviation by the temperature coefficient to obtain the temperature correction amount; Calculate the deviation between the cumulative number of actions of the target channel and the baseline number of actions during the initialization calibration phase, and multiply the deviation by the aging coefficient to obtain the aging correction amount; The temperature correction and the aging correction are added to the reference delay difference to obtain the current delay difference value.

5. The signal source testing system based on a radio frequency switch matrix according to claim 1, characterized in that, In the sending module, the steps of determining the sending order and sending interval based on the sign of the current delay difference and sending in sequence specifically include: Obtain the current delay difference value and determine the sign of the current delay difference value; When the current delay difference is greater than zero, the path switching command is first sent to the radio frequency switch matrix unit, and after waiting for the duration corresponding to the current delay difference, the waveform feature adjustment command is sent to the vector signal source unit. When the current delay difference is less than or equal to zero, the waveform feature adjustment command is first sent to the vector signal source unit, and after waiting for the duration corresponding to the absolute value of the current delay difference, the path switching command is then sent to the radio frequency switch matrix unit. Record the completion status of the path switching command and the waveform feature adjustment command, and send a completion notification to the acquisition module.

6. The signal source testing system based on an RF switch matrix according to claim 1, characterized in that, In the acquisition module, the step of sending an acquisition gating start command to the signal analysis unit to acquire data specifically includes: Receive a transmission completion notification to confirm that both the path switching instruction and the waveform feature adjustment instruction have been successfully sent. After confirming the transmission, wait for a preset fixed microsecond delay; After the fixed microsecond delay ends, a data acquisition gating start command is sent to the signal analysis unit so that the signal analysis unit can start data acquisition of the signal output through the target test port. After the preset acquisition time has elapsed, a data acquisition gate closing command is sent to the signal analysis unit to end the current data acquisition.

7. The signal source testing system based on a radio frequency switch matrix according to claim 1, characterized in that, In the closed-loop calibration module, the steps of acquiring the reflection coefficient measurement value and correcting the waveform feature adjustment parameters specifically include: During the data acquisition controlled by the acquisition module, the current reflection coefficient measurement value of the target test port is obtained; Read the reference reflection coefficient value of the target test port in its initial state from the locally stored calibration parameter table; Calculate the deviation between the current reflection coefficient measurement and the reference reflection coefficient value; Based on the deviation, the parameter correction amount is calculated according to a preset proportional-integral correction algorithm, and the parameter correction amount is superimposed on the currently used waveform feature adjustment parameters to obtain the corrected waveform feature adjustment parameters. The corrected waveform feature adjustment parameters are sent to the vector signal source unit to update the baseband waveform features currently output by the vector signal source unit.

8. The signal source testing system based on a radio frequency switch matrix according to claim 1, characterized in that, In the determination module, the steps of comparing the test data with the indicator threshold and outputting the test conclusion specifically include: Receive test data collected by the signal analysis unit during data acquisition; Read the preset indicator threshold corresponding to the target test port from the locally stored indicator threshold table; The test data is compared item by item with the preset indicator threshold of the corresponding type, and the comparison results of each indicator are recorded. When all comparison results are qualified, the output indicates that the signal source channel corresponding to the target test port has passed the test. When at least one comparison result is unqualified, the output indicates that the signal source channel test corresponding to the target test port has failed, and the unqualified indicator item is noted.

9. A method for testing signal sources based on a radio frequency switch matrix, characterized in that, The method for a signal source test system based on a radio frequency switch matrix as described in any one of claims 1-8 includes: During the initialization phase, the reference switching time of the RF switch matrix unit, the reference parameter adjustment time of the vector signal source unit, and the temperature coefficient and aging coefficient of the RF switch matrix unit are obtained, and the reference delay difference is calculated. Receive test sequence instructions, extract target test port identifiers and waveform feature parameter sets, and generate path switching instructions and waveform feature adjustment parameters accordingly; Obtain the current temperature value and the cumulative number of actions of the target channel, and use the temperature coefficient and the aging coefficient to correct the reference delay difference to obtain the current delay difference value; Based on the sign of the current delay difference, determine the sending order and sending interval of the path switching command and the waveform feature adjustment parameters, and send them in sequence; After the path switching command and the waveform feature adjustment parameters are both sent, a data acquisition gating start command is sent to the signal analysis unit to acquire data from the signal output through the target test port. During data acquisition, the reflection coefficient measurement value of the target test port is obtained, and the waveform feature adjustment parameters are corrected according to the deviation of the measurement value from the reference value. The test data collected by the signal analysis unit is compared with the preset index threshold, and the test conclusion corresponding to the target test port is output.

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