SENSOR DEVICE, SENSOR SYSTEM AND MICROCONTROL

Abstract

Sensor device (10) comprising the following: at least one first sensor element (13) with a first detection direction configured to generate at least one first sensor signal (Sx, Sx1) based on the detection of a first magnetic field component of a varying magnetic field oriented in the first detection direction; at least one second sensor element (14) with a second detection direction, configured to generate at least one second sensor signal (Sy, Sx2) based on the detection of a second magnetic field component of the varying magnetic field, which is oriented in the second detection direction; a signal processing circuit (15, 16) configured to generate a first pulse signal (S1) based on the at least one first sensor signal (Sx, Sx1) and to generate a second pulse signal (S2) based on the at least one second sensor signal (Sy, Sx2); a fault detector (18) configured to detect at least one fault and to generate a fault signal indicating the at least one fault in response to the detection of the at least one fault; and an output generator (17) configured to receive the first pulse signal (S1) and the second pulse signal (S2), the error signal based on a first condition that the error detector (18) detects the at least one error, and simultaneously output a first output signal (OUT1) and a second output signal (OUT2), wherein, based on a second condition that the fault detector (18) does not detect the at least one fault, the output generator is configured to output the first pulse signal (S1) as the first output signal (OUT1) and to output the second pulse signal (S2) as the second output signal (OUT2), and wherein, in response to the first condition being satisfied, the output generator (18) is configured to keep the first output signal (OUT1) in a steady state and to output the second pulse signal (S2) as the second output signal (OUT2), wherein: the first pulse signal (S1) comprises several transition edges that define several first pulses, the second pulse signal (S2) comprises several transition edges that define multiple second pulses, and the first several transition flanks are synchronized with the second several transition flanks.

Description

BACKGROUND

[0001] Magnetic speed sensors are used for speed measurement in many applications across numerous industries, including the automotive industry, for measuring wheel speed, engine speed, transmission speed, and similar parameters. In speed measurement, a magnetic sensor can generate a sinusoidal signal in response to the rotation of a target object such as a wheel, camshaft, crankshaft, or similar component. This sinusoidal signal can be converted into pulses, which can then be used for motion detection or speed output.

[0002] One purpose of an engine speed sensor, or crankshaft sensor, is to determine the speed at which the crankshaft rotates. That is, it measures the speed and direction of crankshaft rotation. These speed sensors are electronic control devices used in internal combustion engines in motor vehicles. This component sends crucial information to an electronic control unit (ECU) (such as an engine control module (ECM)). The information from a crankshaft speed sensor is used to control engine management, fuel injection, and ignition timing systems.

[0003] Information from a speed sensor can generate a speed signal, representing the rotational speed of a target object, and a direction signal, representing the direction of rotation of the target object. Consequently, a speed sensor can include a first output pin for outputting a speed signal and a second output pin for outputting a direction signal.

[0004] Furthermore, the speed sensor can be configured to provide diagnostic information to a microcontroller such as the ECU. Conventional speed sensors use a third output pin to output this diagnostic information. However, implementing a third pin adds cost to the device and the overall system.

[0005] A so-called "life sign" can, for example, be generated and output via a third output pin. Implementing such a life sign is difficult because it requires defining what happens when a life sign occurs alongside a signal change. A specific time must also be defined. This also means that the fault response time is defined at the system level, making the implementation less flexible in safety-critical applications. The microcontroller must also measure all these time points.

[0006] US Patent 5,497,082 A discloses a sensor device comprising a Hall sensor and a magnetoresistive sensor. The Hall sensor detects a magnetic field component perpendicular to a substrate, and the magnetoresistive sensor detects a magnetic field component in the plane of the substrate. Signals from both sensors are output as pulse signals. Another device with two sensors is known from US Patent 2008 / 0180,089 A1.

[0007] German patent application DE 10 2015 110 225 A1 discloses a sensor device with a fault detector that can detect a fault based on sensor signals and outputs a corresponding fault signal. Further fault detectors are known from US patent 2020 / 0 025 837 A1, DE 10 2018 120 710 A1, and DE 10 2017 219 448 A1.

[0008] Therefore, an improved speed sensor capable of providing speed, direction, and diagnostic information, or speed and two diagnostic information, with maximum utilization of two output pins, may be desirable. SUMMARY

[0009] A sensor device as defined in claim 1, 12, 14 or 19, a sensor system as defined in claim 7, and a microcontroller as defined in claim 8 or 10 are provided. The dependent claims define further embodiments.

[0010] Embodiments are directed towards a speed sensor that is capable of providing speed, direction and diagnostic information with a maximum use of two output pins.

[0011] One or more embodiments are directed towards a sensor device comprising at least one first sensor element with a first detection direction, configured to generate at least one first sensor signal based on the detection of a first magnetic field component of a varying magnetic field oriented in the first detection direction; at least one second sensor element with a second detection direction, configured to generate at least one second sensor signal based on the detection of a second magnetic field component of the varying magnetic field oriented in the second detection direction; a signal processing circuit configured to generate a first pulse signal based on the at least one first sensor signal and a second pulse signal based on the at least one second sensor signal; and a fault detector configured toto detect at least one fault and to generate a fault signal indicating the at least one fault in response to the detection of the at least one fault; and an output generator configured to receive the first pulse signal and the second pulse signal, the fault signal, based on a first condition that the fault detector detects the at least one fault, and to simultaneously output a first output signal and a second output signal. Based on a second condition that the fault detector does not detect the at least one fault, the output generator is configured to output the first pulse signal as the first output signal and the second pulse signal as the second output signal. In response to the first condition being met, the output generator is configured toThe first output signal is held in a steady state, and the second pulse signal is output as the second output signal. The first pulse signal comprises several transition edges that define several first pulses, the second pulse signal comprises several transition edges that define several second pulses, and the first transition edges are synchronized with the second transition edges.

[0012] One or more embodiments are directed towards a sensor system comprising a sensor device and a microcontroller. The sensor device comprises at least one first sensor element configured to generate at least one first sensor signal based on the detection of a first magnetic field component of a varying magnetic field; at least one second sensor element configured to generate at least one second sensor signal based on the detection of an aligned second magnetic field component of the varying magnetic field; a signal processing circuit configured to generate a first pulse signal based on the at least one first sensor signal and a second pulse signal based on the at least one second sensor signal; a fault detector configured to detect at least one fault and a fault signal indicating the at least one fault.in response to the detection of the at least one fault; and an output generator configured to receive the first pulse signal and the second pulse signal, the fault signal, based on a first condition that the fault detector detects the at least one fault, and simultaneously output a first output signal and a second output signal. The first pulse signal comprises several transition edges defining several first pulses, the second pulse signal comprises several transition edges defining several second pulses, and the first transition edges are synchronized with the second transition edges. Based on a second condition that the fault detector does not detect the at least one fault, the output generator is configured to output the first pulse signal as the first output signal and the second pulse signal as the second output signal. In response to this,Provided the first condition is met, the output generator is configured to maintain the first output signal in a steady state and output the second pulse signal as the second output signal. The microcontroller is coupled to the sensor device and is configured to receive the first and second output signals and to detect at least one error based on these two signals.

[0013] One or more embodiments are directed to a microcontroller comprising: a first input pin configured to receive a first signal from a sensor device, wherein the first signal is a first pulse signal at least under normal conditions; a second input pin configured to receive a second signal from the sensor device, wherein the second signal is a second pulse signal at least under normal conditions, wherein the first signal and the second signal are received simultaneously and together indicate either the normal condition, a first fault condition, or a second fault condition; and at least one processor configured to evaluate the first signal and the second signal and to detect the normal condition, the first fault condition, or the second fault condition based on the evaluated first signal and the evaluated second signal.The first pulse signal comprises several transition edges defining multiple first pulses; the second pulse signal comprises several transition edges defining multiple second pulses; and the first transition edges are synchronized with the second transition edges. The at least one processor is configured to detect transition edges of the first and second signals and, for each detected transition edge of the first and second signals, to determine whether two synchronous edges are detected, wherein the two synchronous edges include the fact that a first transition edge of the first signal is synchronized with a second transition edge of the second signal.Under a condition that the two synchronous edges are detected, the at least one processor is configured to determine that the normal condition exists, and under a condition that the two synchronous edges are not detected, the at least one processor is configured to detect that one of the first error conditions or the second error condition has occurred.

[0014] One or more embodiments are directed to a microcontroller comprising: a first input pin configured to receive a first signal from a sensor device, wherein the first signal is a first pulse signal at least under normal conditions; a second input pin configured to receive a second signal from the sensor device, wherein the second signal is a second pulse signal at least under normal conditions, the first signal and the second signal being received simultaneously and together indicating either the normal condition or a fault condition; and at least one processor configured to evaluate the first signal and the second signal and to detect the normal condition or the fault condition based on the evaluated first signal and the evaluated second signal.The first pulse signal comprises several transition edges that define several first pulses; the second pulse signal comprises several transition edges that define several second pulses; and the first transition edges are synchronized with the second transition edges. The at least one processor is configured to detect transition edges of the first and second signals. For each detected transition edge of the first and second signals, the at least one processor is configured to determine whether two synchronous edges are detected, where the two synchronous edges include a first transition edge of the first signal being synchronized with a second transition edge of the second signal.Given that the two synchronous edges are detected, the at least one processor is configured to determine that the normal condition exists, and given that the two synchronous edges are not detected, the at least one processor is configured to detect that the error condition has occurred.

[0015] One or more embodiments are directed towards a sensor device comprising: at least one first sensor element configured to generate at least one first sensor signal based on the detection of a varying magnetic field; at least one second sensor element configured to generate at least one second sensor signal based on the detection of the varying magnetic field, wherein the varying magnetic field is caused by a rotational movement of an object, such that the first sensor signal and the second sensor signal are sinusoidal signals and wherein the at least one first sensor signal is phase-shifted from the at least one second sensor signal; a signal processing circuit configured to generate a first pulse signal based on the at least one first sensor signal.to determine a phase shift direction of a phase shift between the at least one first sensor signal and the at least one second sensor signal and to generate a second pulse signal based on the determined phase shift direction, wherein the signal processing circuit is further configured to detect a phase shift inversion of the phase shift, in which the direction of the phase shift changes, and toggling a state of the second pulse signal in response to the detection of the phase shift inversion; a fault detector configured to detect at least one fault and to generate a fault signal indicating the at least one fault in response to the detection of the at least one fault; and an output generator configured to receive the first pulse signal and the second pulse signal, and to generate the fault signal based on a first condition,The output generator is configured to receive a signal from the fault detector if it detects at least one fault and simultaneously outputs a first and a second output signal. The first pulse signal comprises several transition edges that define multiple first pulses, the second pulse signal comprises several transition edges that define multiple second pulses, and the first transition edges are synchronized with the second transition edges. Based on a second condition that the fault detector does not detect the at least one fault, the output generator is configured to output the first pulse signal as the first output signal and the second pulse signal as the second output signal. If the first condition is met, the output generator is configured to hold the first output signal in a steady state and output the second pulse signal as the second output signal.

[0016] One or more embodiments are directed to a sensor device comprising: at least one first sensor element configured to generate at least one first sensor signal based on the detection of a magnetic field component of a varying magnetic field; a signal processing circuit configured to generate a first pulse signal based on the at least one first sensor signal and to generate a second pulse signal in duplicate to the first pulse signal; a fault detector configured to detect at least one first fault and to generate a first fault signal indicating the at least one first fault in response to the detection of the at least one first fault; and an output generator configured to receive the first pulse signal and the second pulse signal, the first fault signal based on a first condition,The output generator is configured to receive a signal from the fault detector upon detecting at least one first fault and simultaneously output a first and a second output signal. The first pulse signal comprises several transition edges defining multiple first pulses, the second pulse signal comprises several transition edges defining multiple second pulses, and the first transition edges are synchronized with the second transition edges. Based on a second condition, that the fault detector does not detect the at least one first fault, the output generator is configured to output the first pulse signal as the first output signal and the second pulse signal as the second output signal. If the first condition is met, the output generator is configured to hold the first output signal in a steady state and output the second pulse signal as the second output signal.

[0017] One or more embodiments are directed towards a sensor device comprising: at least one first sensor element configured to generate at least one first sensor signal based on the detection of a magnetic field component of a varying magnetic field; a signal processing circuit configured to generate a first pulse signal based on the at least one first sensor signal and to generate a second pulse signal in duplicate to the first pulse signal; a fault detector configured to detect at least one first fault and to generate a first fault signal indicating the at least one first fault in response to the detection of the at least one first fault, and to detect at least one second fault and to generate a second fault signal indicating the at least one second fault in response to the detection of the at least one second fault.to detect at least one third fault and to generate a third fault signal indicating the at least one third fault in response to the detection of the at least one third fault, and to detect at least one fourth fault and to generate a fourth fault signal indicating the at least one first fourth fault in response to the detection of the at least one fourth fault; and an output generator configured to receive the first pulse signal and the second pulse signal, to receive the first fault signal based on a first condition that the fault detector detects the at least one first fault, to receive the second fault signal based on a second condition that the fault detector detects the at least one second fault, to receive the third fault signal based on a third condition that the fault detector detects the at least one third fault,The fourth error signal is received based on a fourth condition, namely that the error detector detects at least one fourth error, and simultaneously outputs a first output signal and a second output signal. The first pulse signal comprises several transition edges defining multiple first pulses, the second pulse signal comprises several transition edges defining multiple second pulses, and the first transition edges are synchronized with the second transition edges. Based on a fifth condition, namely that the error detector does not detect at least one first error, at least one second error, at least one third error, or at least one fourth error, the output generator is configured to output the first pulse signal as a first output signal and the second pulse signal as a second output signal. In response to the first condition being met,The output generator is configured to maintain the first output signal in a high steady state and output the second pulse signal as the second output signal. In response to the second condition being met, the output generator is configured to maintain the first output signal in a low steady state and output the second pulse signal as the second output signal. In response to the third condition being met, the output generator is configured to maintain the second output signal in a high steady state and output the first pulse signal as the first output signal. In response to the fourth condition being met, the output generator is configured to maintain the second output signal in a low steady state and output the first pulse signal as the first output signal. BRIEF DESCRIPTION OF THE DRAWINGS

[0018] The embodiments are described here with reference to the attached drawings. Fig. Figure 1 is a schematic block diagram of a sensor system with a 2D magnetic sensor according to one or more embodiments; Fig. Figure 2 is a diagram of a measurement signal and corresponding output signals when no error occurs, according to one or more embodiments; Fig. Figure 3 is a diagram of a measurement signal and corresponding output signals when an error occurs according to one or more embodiments; Fig. Figure 4 is a diagram of a measurement signal and corresponding output signals when an error occurs according to one or more embodiments; Fig. Figure 5A is a schematic block diagram of a sensor system with a 2D magnetic sensor according to one or more embodiments; Fig. Figure 5B is a schematic block diagram of a sensor system with a 1D magnetic sensor according to one or more embodiments; Fig. Figure 6A is a diagram of sensor measurement signals and corresponding output signals according to the embodiment of Fig. 5B; Fig. Figure 6B is another diagram of sensor measurement signals and corresponding output signals according to the embodiment of Fig. 5B; Fig. Figure 6C is another diagram of sensor measurement signals and corresponding output signals according to the embodiment of Fig. 5B; Fig. Figure 6D is another diagram of sensor measurement signals and corresponding output signals according to the embodiment of Fig. 5B; Fig. Figure 7 is a diagram of a measurement signal and corresponding output signals when no error occurs and when an error occurs, according to the embodiment of Fig. 5B; Fig. Figure 8 is a schematic block diagram of a sensor system with a 3D magnetic sensor according to one or more embodiments; Fig. 9 is a schematic block diagram of a sensor system with a magnetic sensor according to one or more embodiments; Fig. 10A is a diagram of a measurement signal and corresponding output signals when no error occurs and when at least one error occurs, according to the embodiment of Fig. 9; and Fig. 10B is a diagram of a measurement signal and corresponding output signals when no error occurs and when at least one error occurs, according to the embodiment of Fig. 9. DETAILED DESCRIPTION

[0019] Details are set forth below to provide a more thorough explanation of the exemplary embodiments. However, it will be apparent to those skilled in the art that embodiments can be implemented without these specific details. In other cases, well-known structures and devices are shown in block diagram form or in a schematic view rather than in detail, in order to avoid obscuring the embodiments. Furthermore, features of the various embodiments described below can be combined unless specifically noted otherwise. It should also be understood that other embodiments can be used and structural or logical modifications can be made without deviating from the scope of protection defined by the claims. The following detailed description should therefore not be interpreted as limiting.

[0020] Furthermore, equivalent or similar elements, or elements with equivalent or similar functionality, are designated by equivalent or similar reference symbols in the following description. Since the same reference symbols are given to the same or functionally equivalent elements in the figures, repeated descriptions for elements with the same reference symbols are unnecessary. Therefore, descriptions provided for elements with the same or similar reference symbols are mutually interchangeable.

[0021] Directional terminology, such as "above," "below," "above," "below," "front," "back," "behind," "in front," "rear," "over," "under," etc., may be used with reference to the orientation of the figures and / or elements being described. Since the embodiments may be arranged in a number of different orientations, the directional terminology is used for explanatory purposes and is by no means limiting. In some cases, the directional terminology may be replaced with equivalent directional terminology based on the orientation of an embodiment, provided that the general directional relationships between elements and the overall purpose are maintained.

[0022] In the present disclosure, expressions, including ordinal numbers such as "first," "second," and / or the like, may modify various elements. However, such elements are not limited by the above expressions. For example, the above expressions do not limit the sequence and / or meaning of the elements. The above expressions are used solely for the purpose of distinguishing one element from the other elements. For example, a first box and a second box denote different boxes, although both are boxes. As another example, a first element could be referred to as a second element, and likewise, a second element could also be referred to as a first element, without departing from the scope of protection of the present disclosure.

[0023] It is self-evident that when an element is described as "connected" or "coupled" to another element, it may be directly connected or coupled to that other element, or there may be intermediate elements. Conversely, when an element is described as "directly connected" or "directly coupled" to another element, there are no intermediate elements. Other words used to describe the relationship between elements should be interpreted similarly (e.g., "between" versus "directly between," "adjacent" versus "directly adjacent," etc.).

[0024] In the embodiments described herein or shown in the drawings, any direct electrical connection or coupling, i.e., any connection or coupling without additional intermediate elements, can also be implemented by an indirect connection or coupling, i.e., a connection or coupling with one or more additional intermediate elements, or vice versa, as long as the general purpose of the connection or coupling, for example, to transmit a certain type of signal or to transmit a certain type of information, is substantially maintained. Features of different embodiments can be combined to form further embodiments. Variations or modifications described with reference to one of the embodiments may, for example, also be applicable to other embodiments unless noted otherwise.

[0025] Depending on specific implementation requirements, a storage medium can comprise RAM, ROM, PROM, EPROM, EEPROM, flash memory, or any other medium containing electronically readable control signals that interact with (or are capable of interacting with) a programmable computer system to execute the relevant procedure. Therefore, a storage medium can be considered a non-transitory storage medium that is computer-readable.

[0026] Furthermore, instructions can be executed by one or more processors, such as one or more central processing units (CPUs), digital signal processors (DSPs), general-purpose microprocessors, application-specific integrated circuits (ASICs), free form factor arrays (FPGAs), or any other equivalent integrated or discrete logic circuit arrangement. Consequently, the term "processor," as used herein, refers to any of the foregoing structures or any other structure suitable for implementing the techniques described herein. Additionally, in some aspects, the functionality described herein may be provided within purpose-built hardware and / or software modules. The techniques could also be implemented entirely within one or more circuits or logic elements.A “controller”, including one or more processors, can use electrical signals and digital algorithms to perform its receiving, analyzing and controlling functions, which may further include correction functions.

[0027] A sensor can refer to a component that converts a physical quantity to be measured into an electrical signal, such as a current signal or a voltage signal. The physical quantity can include, but is not limited to, a magnetic field, an electric field, pressure, force, temperature, current, or voltage. A sensor device, as described here, can be a voltage sensor, a current sensor, a temperature sensor, a magnetic sensor, and the like.

[0028] A magnetic field sensor comprises, for example, one or more magnetic field sensing elements that measure one or more characteristics of a magnetic field (e.g., the magnitude of a magnetic flux density, field strength, field angle, field direction, field orientation, etc.). The magnetic field can be generated by a magnet, a current-carrying conductor (e.g., a wire), the ground, or another magnetic field source. Each magnetic field sensing element is configured to generate a sensor signal (e.g., a voltage signal) in response to one or more magnetic fields acting upon the sensing element. Consequently, a sensor signal indicates the magnitude and / or orientation of the magnetic field acting upon the sensing element.

[0029] Magnetic sensors include, for example, magnetoresistive sensors, inductive sensors, and Hall-effect sensors (Hall sensors). Magnetic resistance is a property of a material that changes the value of its electrical resistance when an external magnetic field is applied to it.Some examples of magnetoresistive effects include giant magnetoresistive (GMR), a quantum mechanical magnetoresistive effect observed in thin-film structures composed of alternating ferromagnetic and non-magnetic conductive layers; tunnel magnetoresistive (TMR), a magnetoresistive effect occurring in a magnetic tunnel junction (MTJ), a component consisting of two ferromagnets separated by a thin insulator; and anisotropic magnetoresistive (AMR), a property of a material in which the electrical resistance depends on the angle between the direction of the electric current and the direction of the magnetization. For example, in the case of an AMR sensor, the resistance of an AMR sensor element changes according to the square of the sine of the angle of the magnetic field component projected onto a sensing axis of the AMR sensor element.

[0030] The several different magnetoresistive effects are collectively abbreviated as xMR, where the "x" acts as a placeholder for the various magnetoresistive effects. xMR sensors can detect the orientation of an applied magnetic field by measuring sine and cosine angle components with monolithically integrated magnetoresistive sensor elements.

[0031] Magnetoresistive sensing elements of such xMR sensors typically comprise multiple layers, at least one of which is a reference layer with a reference magnetization (i.e., a reference direction). The reference magnetization provides a sensing direction corresponding to a sensing axis of the xMR sensor, thus making the sensing element a magnetic field component aligned with the sensing direction. A magnetic field component can be, for example, an x-magnetic field component (Bx), a y-magnetic field component (By), or a z-magnetic field component (Bz), where, in the examples provided, the Bx and By field components are in-plane with respect to the chip, and Bz is out-of-plane with respect to the chip.If a magnetic field component points in exactly the same direction as the reference direction, the resistance of the xMR sensor element is consequently at a maximum, and if a magnetic field component points in exactly the opposite direction to the reference direction, the resistance of the xMR sensor element is at a minimum.

[0032] In some applications, an xMR sensor comprises multiple magnetoresistive sensor elements that have the same or different reference magnetizations. Examples of such applications using different reference magnetizations include angle sensors, compass sensors, or special types of velocity sensors (e.g., velocity sensors in a bridge arrangement, referred to as monocells).

[0033] For example, such magnetoresistive sensor elements are used in speed, angle, or rotational speed measuring devices, where magnets can be moved relative to the magnetoresistive sensor element. Therefore, the magnetic field at the location of the magnetoresistive sensor element changes in the event of movement, which in turn leads to a measurable change in resistance. For the purpose of an angle sensor, a magnet or a magnet array can be mounted on a rotatable shaft, and an xMR sensor can be positioned stationary relative to it.

[0034] A Hall effect sensor is a transducer that changes its output voltage (Hall voltage) in response to a magnetic field. It is based on the Hall effect, which utilizes the Lorentz force. The Lorentz force deflects moving charges in the presence of a magnetic field perpendicular to the current flow through the sensor or Hall plate. A Hall plate can therefore be a thin piece of semiconductor or metal. The deflection causes charge separation, which generates an electric Hall field. This electric field acts on the charge in the opposite direction to the Lorentz force. The two forces balance each other, creating a potential difference perpendicular to the direction of current flow. This potential difference can be measured as the Hall voltage and varies linearly with the magnetic field for small values.Hall effect sensors can be used for proximity switching, position detection, speed detection, and current sensing applications.

[0035] A vertical Hall sensor is a magnetic field sensor constructed with the Hall element perpendicular to the plane of the chip (extending, for example, from a main surface of the chip into the chip body). It detects magnetic fields perpendicular to its defined sensitive edge (top, right, or left relative to the main surface of the chip). This generally means that a vertical Hall sensor is sensitive to a magnetic field component that extends parallel to its surface and parallel to, or in the plane of, the main surface of the chip into which the vertical Hall sensor is integrated. In particular, a vertical Hall sensor can extend from the main surface into the chip. The plane of sensitivity can be referred to here as the "sensitivity axis" or "sensing axis," and each sensing axis has a reference direction.For vertical Hall sensor elements, the voltage values ​​output by the sensor elements change according to the magnetic field strength in the direction of its sensing axis.

[0036] On the other hand, a lateral (planar) Hall sensor is constructed with the Hall element in the same plane as the main surface of the chip. It detects magnetic fields perpendicular to its planar surface. This means that it is sensitive to magnetic fields that are vertical to, or out of, the plane of the chip's main surface. The plane of sensitivity can be referred to here as the "sensitivity axis" or "sensing axis," and each sensing axis has a reference direction. Similar to vertical Hall sensor elements, voltage values ​​output by lateral Hall sensor elements change according to the magnetic field strength in the direction of its sensing axis.

[0037] According to one or more embodiments, multiple magnetic field sensors and a sensor circuit arrangement can both be included (i.e. integrated) in the same chip.

[0038] The sensor circuit can be described as a signal processing circuit and / or signal conditioning circuit that receives one or more signals (i.e., sensor signals) from one or more magnetic field sensor elements in the form of raw measurement data and derives a measurement signal from the sensor signal that represents the magnetic field.

[0039] In some cases, a measurement signal can be a differential signal derived from sensor signals generated by two sensor elements with the same sensing axis (e.g., two sensor elements sensitive to the same magnetic field component) using differential calculus. A differential signal provides robustness against homogeneous external stray magnetic fields.

[0040] Signal conditioning, as used here, refers to processing an analog signal in such a way that the signal meets the requirements of the next processing stage. Signal conditioning can include analog-to-digital conversion (e.g., via an analog-to-digital converter), amplification, filtering, conversion, influencing, range adjustment, isolation, and any other processes necessary to make a sensor output suitable for post-conditioning processing.

[0041] Consequently, the sensor circuit can include an analog-to-digital converter (ADC) that converts the analog signal from one or more sensor elements into a digital signal. The sensor circuit can also include a digital signal processor (DSP) that performs some processing on the digital signal, which will be discussed below. Therefore, a chip, which can also be called an integrated circuit (IC), can include a circuit that processes and amplifies the small signal from one or more magnetic field sensor elements through signal processing and / or signal conditioning.

[0042] A sensor device, as used here, can refer to a device comprising a sensor and a sensor circuit, as described above. A sensor device can be integrated on a single semiconductor device (e.g., a silicon device or silicon chip). Consequently, the sensor and the sensor circuit are located on the same semiconductor device.

[0043] Fig. Figure 1 is a schematic block diagram of a sensor system 100 with a 2D magnetic sensor according to one or more embodiments. The sensor system 100 comprises a magnetic sensor 10 configured to generate two output signals OUT1 and OUT2, and a microcontroller 30 configured to receive the two output signals OUT1 and OUT2 for additional analysis and / or processing.

[0044] Consequently, the magnetic sensor 10 comprises a first output pin 11, configured to output the first output signal OUT1, and a second output pin 12, configured to output the second output signal OUT2. The magnetic sensor 10 is a single semiconductor device (e.g., silicon device or silicon chip) with each of its respective components integrated on it. The magnetic sensor 10 also includes supply pins 21 and 22, configured to receive a first supply potential (e.g., voltage supply Vs) and a second supply potential (e.g., ground GND), respectively.

[0045] The microcontroller 30 comprises input pins 31 and 32 for receiving the output signals OUT1 and OUT2, respectively, and two supply pins 33 and 34, configured to receive a first supply potential (e.g., voltage supply Vµc) and a second supply potential (e.g., ground GNDµc), respectively. The microcontroller 30 is configured to analyze the output signals OUT1 and OUT2, including the detection and decoding of any fault indicated by either output signal.

[0046] The first output signal OUT1 can be a speed signal, and the second output signal OUT2 can be a direction signal, or vice versa. Furthermore, diagnostic information can be generated by modifying either output signal OUT1 or OUT2. Therefore, the magnetic sensor 10 is a speed sensor capable of providing speed and diagnostic information using only two output pins 11 and 12, thus reducing costs and complexity. Additionally, the magnetic sensor 10 can be configured to provide direction information using only two output pins 11 and 12, again offering the advantages of reduced costs and complexity.

[0047] The example of Fig. The magnetic sensor 10 shown is a two-dimensional (2D) magnetic sensor comprising a first sensing element 13 and a second sensing element 14. “2D” means that the sensor is configured to detect magnetic fields in only two sensing directions. The sensing elements 13 and 14 can be xMR sensing elements, inductive sensing elements, Hall sensing elements, or any other magnetic sensing element that generates sensor signals in response to a magnetic field. In particular, the first sensing element 13 can be an x-sensor, having a sensitivity axis (i.e., its sensitivity direction) oriented in an x-direction, and generating sensor signals Sx in response to an x-component Bx of the magnetic field. In contrast, the second sensing element 14 can be a y-sensor, having a sensitivity axis (i.e.,its sensitivity direction), which is oriented in a y-direction, and generates sensor signals Sy in response to a y-component By of the magnetic field. Consequently, the sensitivity axes of the first sensor element 13 and the second sensor element 14 are orthogonal to each other. Consequently, the sensor signals generated by the sensor elements 13 and 14 are shifted by 90° relative to each other.

[0048] The sensor signals generated by sensor element 13 can, for example, be sinusoidal, and the sensor signals generated by sensor element 14 can be cosinusoidal relative to those generated by sensor element 13. Together, sensor elements 13 and 14 detect a change in the x-axis and y-axis magnetic field strength, which varies as a sinusoidal waveform (i.e., as signal modulation) whose frequency corresponds to the rotational speed of a rotating target object, such as a wheel or a drive shaft.

[0049] Furthermore, it can be seen that the first sensor element 13 and the second sensor element 14 can each consist of one or more sensing elements. If, for example, the first sensor element 13 and the second sensor element 14 comprise two or more sensing elements, the sensing elements of each respective sensor element 13 and 14 can be arranged in a differential configuration and / or a bridge configuration.

[0050] Although a 2D magnetic sensor in Fig. As shown in 1, this can be illustrated in other examples, such as the one in Fig. In the example shown in Figure 5B, the magnetic sensor 10 is a one-dimensional rotational speed sensor in which the two sensor elements are Hall effect sensors configured to detect magnetic fields in the same sensing direction. In this case, the two Hall effect sensors are laterally spaced apart in the sensing direction. Consequently, the two Hall effect sensors generate sensor signals Sx1 and Sx2, respectively, which are phase-shifted with respect to each other, with the phase shift being proportional to the lateral distance. This phase shift can be used to detect the direction of rotation of a rotating magnetic field and, in particular, the direction of rotation of a target object.

[0051] When you get back Fig. As directed at 1, the magnetic sensor 10 includes a sensor processing circuit 15 configured to receive the analog sensor signals from the sensor elements 13 and 14 and to perform signal processing and / or conditioning on them. The sensor processing circuit 15 can, for example, generate a first measurement signal Sx' from sensor signals received by the first sensor element 13 and a second measurement signal Sy' from sensor signals received by the first sensor element 13. The sensor processing circuit 15 includes, for example, analog-to-digital converters (ADCs) that convert the analog sensor signals Sx and Sy into digital sensor signals Sx' and Sy'. The sensor processing circuit 15 can also include a digital signal processor (DSP) that performs some processing on the digital sensor signals Sx' and Sy'.

[0052] Additionally or alternatively, the sensor processing circuit 15 can generate the first measurement signal Sx' as the first differential measurement signal Sx' of sensor signals received by the first sensor element 13 using differential calculus, which can be used to cancel homogeneous stray fields in one sensor plane direction. Likewise, the sensor processing circuit 15 can generate the second measurement signal Sy' as the second differential measurement signal Sy' of sensor signals received by the second sensor element 14. To derive a differential measurement signal, sensor signals from at least two sensing elements sensitive to the same magnetic field component are used.

[0053] The measurement signals Sx' and Sy' are output by the sensor processing circuit 15 and supplied to a speed and direction processing circuit 16. In this example, the speed and direction processing circuit 16 uses the measurement signal Sx' as the speed signal and the measurement signal Sy' as the direction signal. However, the roles could be reversed. If the measurement signals Sx' and Sy' are analog signals, the speed and direction processing circuit 16 can additionally include ADCs to convert the signals to the digital domain.

[0054] The speed and direction processing circuit 16 analyzes the measurement signal Sx' and generates a pulse output signal S1. Specifically, the speed and direction processing circuit 16 can include a current modulator, also referred to as a protocol generator, which receives the measurement signal Sx' and generates the output signal S1 as an output current according to a programmed current-switching protocol or current-switching control set, which may consist of comparators, for example. The output current can lie between two current values ​​to generate current pulses. The frequency of the current pulses is directly related to the rotational speed of the target object.

[0055] The speed and direction processing circuit 16 also analyzes the measurement signal Sy' and generates a pulse output signal S2. The pulse output signal S2 has the same frequency as the pulse output signal S1. However, depending on the direction of movement of the target object, the pulses of the pulse output signal S2 are either in phase with the pulses of the pulse output signal S1 (i.e., with a phase shift of zero) or completely out of phase with the pulses of the pulse output signal S1 (i.e., with a phase shift of 180°). For example, for a rotating target object, the edges of the pulses of the S1 and S2 signals can be aligned and in phase with each other under the condition that the target object is rotating in a first direction (e.g., counterclockwise).In contrast, the edges of the pulses of the S1 and S2 signals can be aligned and phase-shifted relative to each other under a condition that the target object rotates in a second direction (e.g., clockwise). The speed and direction processing circuit 16 can determine the direction based on whether the 90° phase shift between the measurement signals Sx' and Sy' (i.e., between the sensor signals Sx and Sy) is positive or negative.

[0056] The magnetic sensor 10 further comprises an output generator 17 and a fault detector 18. The output generator 17 is configured to monitor for a fault signal S3 generated by the fault detector 18 in response to a detected fault in the magnetic sensor 10.

[0057] Under the first condition that no error signal S3 is received, the output generator 17 can receive the S1 and S2 signals and pass them to their respective output pins 11 and 12 with some or no additional signal processing or conditioning. Consequently, the first output signal OUT1 represents the pulse output signal S1, and the second output signal OUT2 represents the pulse output signal S2. As noted above, the pulse output signal S1 and the pulse output signal S2 have edge transitions that occur simultaneously, regardless of whether the signals are in phase or 180° out of phase. Likewise, under the first condition, the output signals OUT1 and OUT2 are pulse output signals with pulses that are either in phase or 180° out of phase with each other. Therefore, if the error signal S3 is not present, they both transition between two states simultaneously.

[0058] Under a second condition, that an error signal S3 is received by the output generator 17, the output generator 17 can modify one of the S1 and S2 signals to indicate not only that an error has occurred, but also the type of error that has occurred. For example, the error detector 18 can monitor for two or more different types or classes of errors, including an undervoltage fault or a Hall effect supply fault, and the error detector 18 is configured to generate the error signal S3, which includes error information. The error information specifies the type of error that has occurred or a combination of errors that has occurred.

[0059] In some embodiments, the fault detector 18 can be used to monitor for one or two specific faults and to generate the fault signal S3 upon detection of one of these specific faults. Alternatively, the fault detector 18 can be used to monitor for the occurrence of any fault or any combination of possible faults and to generate the fault signal S3 upon detection of any fault or one or more combinations of faults. For example, the fault detector 18 can monitor for a first type of fault or a first combination of faults and can monitor for a second type of fault or a second combination of faults. Consequently, any type of fault detection based on one or more faults is possible.

[0060] In response to receiving the first error signal S3, the output generator 17 determines the type of error based on the error information and determines which output signal to modify based on the identified error. For example, based on the occurrence of a first error type, the output generator 17 can decide to modify the pulse output signal S1 such that the output signal OUT1 remains in a steady state (i.e., a continuously stable signal that no longer switches between output states) or that a transition edge of the output signal OUT1 is no longer synchronized with a transition edge of the output signal OUT2. A combination of the two modifications can also be used.

[0061] Based on the occurrence of a second type of error, the output generator 17 can also decide to modify the pulse output signal S2 so that the output signal OUT2 remains in a steady state or a transition edge of the output signal OUT2 is no longer synchronized with a transition edge of the output signal OUT1. A combination of the two modifications can also be used.

[0062] The microcontroller 30 is configured to receive the two output signals OUT1 and OUT2 at two corresponding input pins 21 and 22 and to monitor for errors based on the analysis and interpretation of these two output signals. Specifically, if a fault occurs in the magnetic sensor 10, one of the two output signals, OUT1 or OUT2, is appropriately processed by the output generator 17 based on the fault signal S3. The microcontroller 30 is configured to perform edge detection on both output signals OUT1 and OUT2 and to perform edge analysis on each detected edge of each output signal OUT1 and OUT2. If the microcontroller 30 detects an edge transition in one signal without a simultaneous edge transition in the other signal, the microcontroller 30 determines that an error has occurred.The microcontroller 30 can determine the type of fault that has occurred based on a further analysis of the two output signals OUT1 and OUT2. Consequently, at least two types of faults can be transmitted to the microcontroller 30 by the magnetic sensor 10 using the two output signals OUT1 and OUT2, and the fault can be detected by the microcontroller 30 and its type identified.

[0063] Fig. Figure 2 is a diagram of a measurement signal and corresponding output signals according to one or more embodiments. In particular, an upper, a middle, and a lower diagram are shown.

[0064] The upper diagram of Fig. Figure 2 shows a signal diagram of a measurement signal Sx', which represents an oscillating magnetic field. Two switching thresholds are also shown. These two switching thresholds comprise a magnetic operating point BOP and a magnetic release point BRP. The speed and direction processing circuit 16 is configured to compare the measurement signal Sx with the two switching thresholds BOP and BRP and toggle the states of the two pulse output signals S1 and S2 at each crossing of either threshold. If no fault is detected by the fault detector 18, the two pulse output signals S1 and S2 from the magnetic sensor 10 are output as output signals OUT1 and OUT2, respectively. It is noted that the midpoint between the BOP and the BRP can be referred to as the zero-crossing threshold.

[0065] The middle diagram of Fig. Figure 2 is a signal diagram of output signals OUT1 and OUT2, which are generated and output simultaneously while the target object rotates counterclockwise. In this case, the two output signals OUT1 and OUT2 switch synchronously and in phase with each other. Consequently, each transition edge of one signal occurs simultaneously with a transition edge of the other signal in the same direction. That is, transitions from low to high states occur simultaneously, and transitions from high to low states occur simultaneously. Furthermore, the time interval between successive edges corresponds to the same speed (e.g., rotational speed) of the target object. From the output signals OUT1 and OUT2, the microcontroller 30 can determine that the output signals OUT1 and OUT2 switch normally (i.e.,, that there is no error), determine the rotational speed from one of the output signals OUT1 or OUT2 and determine the direction of rotation from the phase relationship between the output signals OUT1 and OUT2.

[0066] The lower diagram of Fig. Figure 2 is a signal diagram of output signals OUT1 and OUT2, which are generated and output simultaneously while the target object rotates clockwise. In this case, the two output signals OUT1 and OUT2 switch synchronously, with a 180° phase shift relative to each other. Consequently, each transition edge of one signal occurs synchronously with a transition edge of the other signal in opposite directions. That is, a transition from a low to a high state in one output signal occurs simultaneously with a transition from a high to a low state in the other signal, and vice versa. Furthermore, the time interval between successive edges corresponds to the speed (e.g., rotational speed) of the target object. From the output signals OUT1 and OUT2, the microcontroller 30 can determine that the output signals OUT1 and OUT2 switch normally (i.e.,, that there is no error), determine the rotational speed from one of the output signals OUT1 or OUT2 and determine the direction of rotation from the phase relationship between the output signals OUT1 and OUT2.

[0067] Fig. Figure 3 is a diagram of a measurement signal and corresponding output signals according to one or more embodiments. In particular, an upper, a middle, and a lower diagram are shown. In contrast to Fig. However, if the fault detector 18 detects a fault, the output generator 17 modifies the output signal OUT1 to indicate the fault. For example, the output generator 17 sets the output signal OUT1 to a steady state, so that it no longer switches between two states.

[0068] In particular, the output signal OUT1 can be mapped to the first fault type detected by the fault detector 18, and the output generator 17 can select the output signal OUT1 as a modified output signal based on the fault information received in the fault signal S3, the fault information identifying the first fault type.

[0069] Similarly, the output signal OUT2 can be mapped to the second fault type detected by the fault detector 18, and the output generator 17 can select the output signal OUT2 as a modified output signal based on the fault information received in the fault signal S3, where the fault information identifies the second fault type. In the case of Fig. 3. In this case, the output signal OUT1 indicates the fault, while the output signal OUT2 continues to switch as normal based on the pulse output signal S2. However, these roles can be reversed depending on the type of fault detected.

[0070] As the upper diagram of Fig. 2 is the upper diagram of Fig. 3 A signal diagram of a measurement signal Sx' representing an oscillating magnetic field. The middle and bottom diagrams of Fig. These 3 are two ways to indicate the same error (i.e., the first type of error).

[0071] In the middle diagram, output generator 17 sets the output signal OUT1 to a high steady state. This can be because output generator 17 receives the error signal S3 when the pulse output signal S1, and consequently the output signal OUT1, is in a high state. Therefore, output generator 17 maintains the output signal OUT1 in its current state at the time the error signal S3 is received. Output generator 17 ignores the pulse output signal S1 upon receiving the error signal S3, as it no longer affects the output signal OUT1.

[0072] In the lower diagram, output generator 17 sets the output signal OUT1 to a low steady state for similar reasons. Specifically, output generator 17 can receive the error signal S3 when the pulse output signal S1, and consequently the output signal OUT1, is in the low state, in which output generator 17 imposes a hold on the signal switching.

[0073] A similar process is carried out at output signal OUT2 if a second fault type, different from the first, is detected. In this case, output signal OUT1 continues to switch as normal based on the pulse output signal S1, whereas output signal OUT2 is set to a steady state.

[0074] The microcontroller 30 receives the two output signals OUT1 and OUT2 and detects that one output signal is still switching and the other is in a steady state. As noted above, the microcontroller 30 performs an edge detection analysis when it detects a transition edge in the output signal OUT1 and / or OUT2. Since the output signal OUT2 is still switching, the microcontroller 30 detects a transition edge in the output signal OUT2 and further determines that a corresponding, synchronous transition edge has not occurred in the output signal OUT1. Consequently, based on this initial edge misalignment, the microcontroller 30 can determine that the output signal OUT1 is no longer switching (i.e., it is in a steady state).In response to the determination that the output signal OUT1 is in a steady state, the microcontroller 30 identifies the output signal OUT1 as an error signal and determines the type of error based on the mapping information between error types and output signals OUT1 and OUT2. Here, the microcontroller 30 identifies the error as corresponding to the first error type that corresponds to the output signal OUT1.

[0075] Furthermore, the microcontroller 30 can detect a first edge misalignment, as described above, to detect a potential fault, and can detect a second edge misalignment at the next transition edge of the output signal OUT2 to confirm that the output signal OUT1 is in a steady state, thus confirming the existence of the fault before any further action is taken. This additional step can help prevent false fault detections.

[0076] Furthermore, the microcontroller 30 can still use the normally switching output signal to calculate the rotational speed of the target object. However, determining the direction is no longer possible while one of the output signals is in a steady state.

[0077] Fig. Figure 4 is a diagram of a measurement signal and corresponding output signals according to one or more embodiments. In particular, an upper, a middle, and a lower diagram are shown. In contrast to Fig. However, if the fault detector 18 detects a fault, the output generator 17 modifies the output signal OUT1 or the output signal OUT2 to indicate the fault. For example, the output generator 17 modifies a switching pattern of either the output signal OUT1 or the output signal OUT2 so that their edge transitions are no longer synchronized.

[0078] The output signal OUT1 can be mapped to the first fault type detected by the fault detector 18, and the output generator 17 can select the output signal OUT1 as a modified output signal based on the fault information received in the fault signal S3, where the fault information identifies the first fault type. Likewise, the output signal OUT2 can be mapped to the second fault type detected by the fault detector 18, and the output generator 17 can select the output signal OUT2 as a modified output signal based on the fault information received in the fault signal S3, where the fault information identifies the second fault type. In the case of Fig. In step 4, output signal OUT1 indicates the error, while output signal OUT2 continues to switch normally based on the pulse output signal S2. However, these roles can be reversed depending on the definition.

[0079] As the upper diagram of Fig. 2 is the upper diagram of Fig. 3 A signal diagram of a measurement signal Sx' representing an oscillating magnetic field. The middle and bottom diagrams of Fig. Figure 3 represents two ways to indicate the same error (i.e., the first error type). In the middle diagram, output generator 17 initiates a transition to set the output signal OUT1 to a high steady state. In other words, in response to receiving an error signal S3, which indicates an error type mapped to output signal OUT1, output generator 17 causes output signal OUT1 to transition to its opposite state, triggering an edge transition that is not synchronized with an edge transition of output signal OUT2. The triggered edge in output signal OUT1 can be produced at the time the error signal S3 is received, thus ignoring the pulse output signal S1. Consequently, output signal OUT2 continues to switch as normal based on the pulse output signal S2, while output signal OUT1 is set to a steady state.

[0080] The microcontroller 30 is configured to detect the edge transition in the output signal OUT1 and to determine that a corresponding, synchronous edge transition has not occurred in the output signal OUT2, thus indicating that a first edge misalignment has occurred. In response to the detection of the first edge misalignment, the microcontroller 30 detects a potential fault. However, the microcontroller 30 requires additional information to determine which output signal indicates the fault.

[0081] Since the output signal OUT2 continues to switch normally based on the pulse output signal S2, the microcontroller 30 can use the output signal OUT2 to confirm that the output signal OUT1 is in a steady state, thus confirming the existence of the fault. For example, the microcontroller 30 detects a second edge misalignment at the next edge transition of the output signal OUT2, following the first edge misalignment. Here, the microcontroller 30 can confirm that the output signal OUT2 is still switching and that the output signal OUT1 is in a steady state. In other words, the output signal that exhibits an edge transition after the first edge misalignment is detected and determined to be the normal operating signal, while the other signal is determined to be indicating the fault.In response to the determination that the output signal OUT1 is in a steady state, the microcontroller 30 identifies the output signal OUT1 as an error signal and determines the type of error based on the mapping information between error types and output signals OUT1 and OUT2. Here, the microcontroller 30 identifies the error as corresponding to the first error type that corresponds to the output signal OUT1.

[0082] In the lower diagram, output generator 17 initiates a transition to set the output signal OUT1 to a low steady state. In other words, in response to receiving an error signal S3, which specifies an error type that is mapped to the output signal OUT1, output generator 17 causes the output signal OUT1 to transition to its opposite state, triggering an edge transition that is not synchronized with an edge transition of the output signal OUT2. The triggered edge in the output signal OUT1 can be produced at the time the error signal S3 is received, thus ignoring the pulse output signal S1. Consequently, the output signal OUT2 continues to switch as normal based on the pulse output signal S2, whereas the output signal OUT1 is set to a steady state.The microcontroller 30 proceeds to detect the two flank misalignments in order to confirm and identify the fault in a similar manner to that described above.

[0083] Since the output signal OUT1 is mapped to a type of error, both the middle and bottom diagrams of Fig. 4 the same type of error. Furthermore, the microcontroller 30 can still use the output signal, which switches normally, to calculate the rotational speed of the target object. However, determining the direction is no longer possible while one of the output signals is in a steady state.

[0084] Fig. Figure 5A is a schematic block diagram of a sensor system 200A with a 2D magnetic sensor according to one or more embodiments. The sensor system 200A is similar to the sensor system 100, but further elaborates a possible configuration of the fault detector 18. Consequently, features that are the same as or similar to those in the sensor system 100 are not described again.

[0085] In this example, sensor elements 13 and 14 are Hall effect sensors. Therefore, the magnetic sensor 10 includes a Hall effect voltage supply 23 configured to supply a DC voltage to each of the Hall effect sensors 13 and 14. The supplied DC voltage generates a current that flows through each sensor element, ultimately resulting in a Hall effect voltage that represents the magnetic field strength detected in the sensing direction. Consequently, the Hall effect voltage supply 23 provides a bias voltage to the Hall effect sensors 13 and 14.

[0086] The fault detector 18 comprises an undervoltage detector 24, a Hall-effect supply monitoring device 25, and a fault signal generator 26. The undervoltage detector 24 monitors the supply voltage Vs for an undervoltage event. Upon detecting an undervoltage event, the undervoltage detector 24 generates a first fault signal S4 and transmits the first fault signal S4 to the fault signal generator 26.

[0087] The Hall supply monitoring device 25 monitors the Hall supply voltage for irregularities. Upon detecting a Hall supply voltage fault event, the Hall supply monitoring device 25 generates a second fault signal S5 and transmits the second fault signal S5 to the fault signal generator 26.

[0088] The fault signal generator 26 monitors for fault signals S4 and S5 and, upon receiving one of these signals, generates fault signal S3, which contains fault information identifying the type of detected fault (i.e., based on whether fault signal S4 or S5 is received). The output generator 17 receives fault signal S3 and proceeds as described above.

[0089] In light of the above, the following advantages can be realized: rotational speed, direction, and two different fault diagnoses are provided by only two pins (two wires), which saves costs; the failure is indicated almost immediately, so that the failure response time is mainly determined by the system and not by the device, which provides flexibility regarding operational reliability for the system integrator; and the system does not require any additional timing measurements for signs of life.

[0090] Fig. Figure 5B is a schematic block diagram of a sensor system 200B with a 1D magnetic sensor according to one or more embodiments. The sensor system 200B comprises Hall sensor elements 13 and 14 configured to detect magnetic fields of the same detection direction, thereby generating sensor signals Sx1 and Sx2, respectively. Furthermore, the two Hall sensor elements are laterally spaced apart in the detection direction by a lateral distance. Consequently, the two sensor signals Sx1 and Sx2 are phase-shifted with respect to each other, the phase shift being proportional to the lateral distance. This phase shift can be used to detect the direction of rotation of a rotating magnetic field and, in particular, the direction of rotation of a target object.

[0091] The sensor processing circuit 15 is configured to receive the analog sensor signals from the sensor elements 13 and 14 and to generate measurement signals Sx1' and Sx2' according to the above description.

[0092] The speed and direction processing circuit 16 generates a corresponding pulse output signal S1 and S2 for each of the measurement signals Sx1' and Sx2', respectively, with synchronized edge transitions as described above. Specifically, the speed and direction processing circuit 16 analyzes the measurement signal Sx1' and generates a pulse output signal S1. The speed and direction processing circuit 16 can include a current modulator, also referred to as a protocol generator, which receives the measurement signal Sx1' and generates the output signal S1 as an output current according to a programmed current-switching protocol or current-switching control set, which may be composed of comparators, for example. The output current can lie between two current values ​​to generate current pulses. The frequency of the current pulses is directly related to the rotational speed of the target object.

[0093] The speed and direction processing circuit 16 also analyzes the measurement signal Sx2' and generates a pulse output signal S2. The pulse output signal S2 has the same frequency as the pulse output signal S1. However, depending on the direction of movement of the target object, the pulses of the pulse output signal S2 are either in phase with the pulses of the pulse output signal S1 (i.e., with a phase shift of zero) or completely out of phase with the pulses of the pulse output signal S1 (i.e., with a phase shift of 180°). For example, for a rotating target object, the edges of the pulses of the S1 and S2 signals can be aligned and in phase with each other under the condition that the target object is rotating in a first direction (e.g., counterclockwise).In contrast, the edges of the pulses of the S1 and S2 signals can be aligned and phase-shifted relative to each other under a condition that the target object rotates in a second direction (e.g., clockwise). The speed and direction processing circuit 16 can determine the direction based on whether the phase shift between the measurement signals Sx1' and Sx2' (i.e., between the sensor signals Sx1 and Sx2) is positive or negative.

[0094] The speed and direction processing circuit 16 can further be configured to detect a change in the direction of rotation at which time the phase shift between the measurement signals Sx1' and Sx2' is inverted or reversed.

[0095] Fig. Figure 6A is a diagram of sensor measurement signals and corresponding output signals according to one or more embodiments. In particular, an upper and a lower diagram are shown. The upper diagram represents two phase-shifted measurement signals Sx1' and Sx2' according to the diagram in Figure 6A. Fig. The embodiment shown in 5B features a change in the direction of rotation. It can be seen that the two phase-shifted measurement signals Sx' and Sy', which are related to Fig. 1 and Fig. 5A and later with reference to Fig. The two phase-shifted measurement signals Sx1' and Sx2' described in section 8 can also be used instead. Consequently, any two phase-shifted measurement signals capable of indicating a change in direction can be used, and the signals Sx1' and Sx2' are merely a possible example for elaborating on the relationship with reference to Fig. 6A and Fig. The 7 described characteristics are representative.

[0096] In particular, it can be seen that before the change of direction, the measurement signal Sx2' lags behind the measurement signal Sx1'. After the change of direction, however, the phase shift is inverted, so that the measurement signal Sx1' lags behind the measurement signal Sx2'. During the change of direction, both measurement signals Sx1' and Sx2' become flat or constant for a respective time interval.

[0097] The lower diagram of Fig. 6A shows a speed signal S1 (out1) and a direction signal S2 (out2). Before the change in direction, the edges of signals S1 and S2 are in phase. After the change in direction, the edges of signals S1 and S2 are out of phase, indicating the change in the direction of rotation.

[0098] There are several methods that the speed and direction processing circuit 16 can use to detect the phase shift inversion between the two measurement signals Sx1' and Sx2'. One method is to evaluate the sign of the measurement signal Sx2' at each zero crossing of the measurement signal Sx1', or vice versa. If the sign of the measurement signal Sx2' alternates between two consecutive zero crossings of the measurement signal Sx1' (i.e., + - or - +), the direction of rotation remains the same. However, if the sign of the measurement signal Sx2' remains the same between two consecutive zero crossings of the measurement signal Sx1' and does not alternate (i.e., + + or - -), a change in direction is detected by the speed and direction processing circuit 16.

[0099] Another method used by the speed and direction processing circuit 16 to detect the change in direction is to monitor both measurement signals Sx1' and Sx2' for two consecutive crossings of a switching threshold (e.g., BOP, BRP, and / or the zero crossing) by one measurement signal without an intervening crossing of the same switching threshold by the other measurement signal. If such a condition is met, a phase shift inversion has occurred, and a change in direction is detected.

[0100] The BRP can be used, for example, as a switching threshold to monitor for a change in direction. While the magnetic field is rotating in a first direction (i.e., before the change in direction), it can be seen that measurement signals Sx2' and Sx1' alternate as they cross the BRP. Consequently, measurement signal Sx1' crosses the BRP between two successive crossings of the BRP by measurement signal Sx2'. In other words, measurement signal Sx1' has an intermediate BRP crossing that occurs between two successive crossings of the BRP by measurement signal Sx2'.

[0101] If a change in direction occurs, this condition cannot be met. In the Fig. In the case shown in Figure 6A, for example, the measurement signal Sx2' crosses the BRP twice without an intermediate crossing of the BRP by the measurement signal Sx1'. This scenario indicates that a change in direction (i.e., a phase inversion) has occurred. A similar evaluation can be performed using the zero crossing as the switching threshold and / or using the BOP as the switching threshold. Two or all three switching thresholds can be used simultaneously to monitor the crossings of both measurement signals Sx1' and Sx2.

[0102] When you get back Fig. As referred to in section 5B, the fault detector 18 is configured to monitor for one or more types of faults, including any fault and any combination of all possible failures. Consequently, the fault detector 18 can be used to monitor for a specific fault and generate the fault signal S3 upon detection of that one specific fault. For example, one of the undervoltage detector 24 or the Hall supply monitoring device 25 can be selectively activated while the other is selectively deactivated. Alternatively, the fault detector 18 can be used to monitor for the occurrence of any fault or any combination of possible faults and generate the fault signal S3 upon detection of any fault or one or more combinations of faults. Consequently, any type of fault detection based on one or more faults is possible.For example, both the undervoltage detector 24 and the Hall supply monitoring device 25 can be activated, and the fault detector 18 can generate the fault signal S3 when detecting one or both faults from the undervoltage detector 24 and the Hall supply monitoring device 25.

[0103] In this example, output signal OUT1 is used to indicate a failure and switches to a continuously stable signal when the monitored fault is detected. This means that the speed signal S1 is no longer used for output signal OUT1 and is ignored. Output signal OUT2 is still used to indicate changes in direction and is not used to indicate a fault.

[0104] Fig. Figures 6B-6D show additional diagrams of sensor measurement signals and corresponding output signals according to one or more further embodiments. How Fig. 6A Any two phase-shifted measurement signals capable of indicating a change in direction can be used to generate the corresponding output signals OUT1 and OUT2. In these examples, the speed and direction processing unit 16 uses the measurement signals Sx1' and Sx2' to detect changes in direction based on the detection of a phase shift inversion between the two measurement signals.

[0105] In particular, Fig. 6B presents examples of direction changes with one measurement signal above the BOP or below the BRP and the other measurement signal in hysteresis. In particular, during a direction change, the measurement signal Sx1' remains above or below the BOP for an extended interval, allowing the measurement signal Sx2' to have two consecutive crossings at the same switching threshold (i.e., either at the BOP or BRP) without an intermediate crossing at the same switching threshold performed by the measurement signal Sx1'. Consequently, the phase shift between the two measurement signals Sx1' and Sx2' changes via an inversion from a positive phase shift (Δφ > 0) to a negative phase shift (Δφ < 0).

[0106] The speed and direction processing unit 16 detects the phase shift inversion by detecting the double crossing of the measurement signal Sx2' described above. In response to the detected change in direction, the speed and direction processing unit 16 changes the state of the output signal OUT2. Since the output signal OUT2 has an edge transition that is not synchronized with an edge transition of OUT1, the microcontroller 30 can detect the change in direction based on the analysis of the edge transitions of OUT2 with respect to the edge transitions of OUT1.

[0107] Fig. Figure 6C presents examples of direction changes with both signals Sx1' and Sx2' above the BOP or both signals below the BRP. As a result of the direction change, the measurement signal Sx2' exhibits two consecutive crossings at the same switching threshold (i.e., either at the BOP or BRP) without an intermediate crossing at the same switching threshold performed by the measurement signal Sx1'. Consequently, the speed and direction processing unit 16 detects the phase shift inversion and changes the state of the output signal OUT2.

[0108] Fig. Figure 6D presents examples of direction changes with both signals Sx1' and Sx2' in hysteresis. As a result of the direction change, the measurement signal Sx1' exhibits two consecutive crossings at the same switching threshold (i.e., either at the BOP or BRP) without an intermediate crossing at the same switching threshold performed by the measurement signal Sx2'. Consequently, the speed and direction processing unit 16 detects the phase shift inversion and changes the state of the output signal OUT2.

[0109] Fig. Figure 7 is a diagram of a measurement signal and corresponding output signals when no fault occurs and when a fault occurs, according to one or more embodiments. The upper diagram of Fig. Figure 7 is a signal diagram of a measurement signal Sx2' representing an oscillating magnetic field. The other signal diagrams represent corresponding output signals under various conditions, including: a change in direction from counterclockwise to clockwise without error, a change in direction from clockwise to counterclockwise without error, a change in direction from counterclockwise to clockwise with an error, and a change in direction from clockwise to counterclockwise with an error.

[0110] The change in direction is detected and signaled by the output signal OUT2, similar to how it works in conjunction with Fig. 6A-6D described, except that the change of direction does not occur on an edge of the output signals OUT1 and OUT2. In this case, the output generator 17 generates a short pulse before the edges of the output signals OUT1 and OUT2 realign to signal the change of direction to the microcontroller 30.

[0111] In these examples, the output signal OUT1 is used to indicate the fault. When the fault is detected and signaled to output generator 17, output generator 17 changes the state of output signal OUT1 and sets the signal to a steady state (i.e., a continuously stable signal). The speed signal S1 is no longer used for output signal OUT1 and is ignored. In this example, output signal OUT1 is in a high state when the fault is detected. Consequently, output signal OUT1 is switched to a low steady state. Output generator 17 continues to provide output signal OUT2 based on the direction signal S2 and the direction change protocol.

[0112] Overall, this method can be used in other applications, including analog rotary (sine) signals with direction and diagnostics, angle sensors and three-dimensional (3D) sensors with three output pins, but uses the same method.

[0113] Fig. Figure 8 is a schematic block diagram of a sensor system 300 with a 3D magnetic sensor according to one or more embodiments. A 3D magnetic sensor 40 is configured to measure three different orthogonal magnetic field components of a magnetic field and to generate sensor signals in response to the three measured magnetic field components. Three sensor elements, including sensor elements 13, 14, and 19, are provided with three different detection directions. Each sensor element 13, 14, and 19 generates sensor signals Sx, Sy, and Sz, respectively.

[0114] The sensor processing circuit 15 is configured to receive the analog sensor signals from the sensor elements 13, 14 and 19, and to generate measurement signals Sx', Sy' and Sz' according to the above description.

[0115] The speed and direction processing circuit 16 generates a corresponding pulse output signal S1, S2 and S6 for each of the measurement signals Sx', Sy' and Sz' with synchronized edge transitions according to the above description.

[0116] Consequently, the output generator 17 receives three pulse output signals S1, S2, and S6 and forwards them to the microcontroller 30 as output signals OUT1, OUT2, and OUT3, respectively, when no fault is detected. However, three different types of faults, each mapped to one of the output signals OUT1, OUT2, and OUT3, can be detected by the fault detector 18 and signaled to the output generator 17. In response to receiving the fault signal S3, the output generator 17 is configured to set one of the output signals, which is mapped to the detected fault, to a steady state. The microcontroller 30 is configured to detect one of the output signals as being in a steady state, thereby detecting the fault, and furthermore to determine the fault type based on the mapping between the output signals and fault types.

[0117] Consequently, the number N of output pins is equal to the number N of magnetic field components, or dimensions, that the magnetic sensor is configured to detect. Under normal operating conditions (i.e., without a detected fault), each output pin provides its respective sensor data. When a fault condition occurs, the output pin is used to indicate the fault, while the remaining output pins continue to provide their respective sensor data.

[0118] It can be seen that this is in connection with Fig. 5B, Fig. 6 and Fig. The direction change protocol described in section 7 can also be used in combination with any of the embodiments described above.

[0119] Fig. Figure 9 is a schematic block diagram of a sensor system 400 with a magnetic sensor according to one or more embodiments. The sensor system 400 is related to the sensor system 200B in Fig. 5B is similar, except that sensor system 400 uses a sensor element for a velocity detection application. Features that are the same as or similar to those in sensor system 200B are not described again.

[0120] In this example, sensor element 13 is a Hall sensor element. Sensor element 13 detects a sine wave of the magnetic field. The sensor processing circuit 15 is configured to receive the analog sensor signal(s) from sensor element 13 and perform signal processing and / or conditioning to generate the measurement signal Sx' as described above. The sensor processing circuit 15 also generates an additional measurement signal Sx'', duplicated from the measurement signal Sx'. Consequently, the measurement signals Sx' and Sx'' are velocity signals representing the motional speed (e.g., rotational speed or linear velocity) of a target object.

[0121] The measurement signals Sx' and Sx'' are output from the sensor processing circuit 15 and supplied to a velocity processing circuit 46. The velocity processing circuit 46 performs similar functions to those described with reference to the speed and direction processing circuit 16, except that the velocity processing circuit 46 does not perform direction processing or direction analysis. Consequently, the velocity processing circuit 46 generates a corresponding pulse output signal S1 and S2 for each of the measurement signals Sx' and Sx'', respectively, with synchronized edge transitions as described above. Since the measurement signals Sx' and Sx'' are identical, the pulse output signals S1 and S2 are also identical.

[0122] To generate the pulse output signal S1, the velocity processing circuit 16 analyzes the measurement signal Sx' and generates a pulse output signal S1. Specifically, the velocity processing circuit 46 may include a current modulator, also referred to as a protocol generator, which receives the measurement signal Sx' and generates the output signal S1 as an output current according to a programmed current-switching protocol or current-switching rule set, which may be composed of comparators, for example. The output current can range between two current values ​​to generate current pulses. The frequency of the current pulses is directly related to the velocity of the target object. A similar analysis using the same programmed current-switching protocol or current-switching rule set is performed on the measurement signal Sx'' to generate the pulse output signal S2.

[0123] It is also conceivable that the sensor processing circuit 15 generates only a single measurement signal Sx' for the velocity processing circuit 46. In this case, the velocity processing circuit 46 can generate the pulse output signal S1 and then double the pulse output signal S1 to generate the pulse output signal S2. In both cases, both pulse output signals S1 and S2 are identical with synchronized pulse transition edges. The frequency of the pulses indicates the velocity of the magnetic sine wave signal.

[0124] The magnetic sensor 10 further comprises an output generator 17 and a fault detector 18. The output generator 17 is configured to monitor for a fault signal S3 generated by the fault detector 18 in response to a detected fault in the magnetic sensor 10.

[0125] Under the first condition that no error signal S3 is received, the output generator 17 can receive the pulse output signals S1 and S2 and forward the signals to their respective output pins 11 and 12 with some or no additional signal processing or conditioning. Consequently, the first output signal OUT1 represents the pulse output signal S1, and the second output signal OUT2 represents the pulse output signal S2. As noted above, the pulse output signal S1 and the pulse output signal S2 have edge transitions that occur simultaneously. Likewise, under the first condition, the output signals OUT1 and OUT2 are pulse output signals with pulses that are synchronized with each other. Therefore, if the error signal S3 is not present, they both transition between two states simultaneously.

[0126] Under a second condition, that an error signal S3 is received by the output generator 17, the output generator 17 can modify one of the pulse output signals S1 or S2 to indicate not only that an error has occurred, but also the type of error that has occurred. For example, the error detector 18 can monitor for two or more different types or classes of errors, and the error detector 18 is configured to generate the error signal S3, which includes error information. The error information specifies the type of error that has occurred, or a combination of errors that has occurred.

[0127] In some embodiments, the fault detector 18 can be used to monitor for two specific faults and generate the fault signal S3 upon detection of one of these specific faults. Alternatively, the fault detector 18 can be used to monitor for the occurrence of two specific combinations of possible faults and generate the fault signal S3 upon detection of one of these combinations. For example, the fault detector 18 can monitor for a first type of fault or a first combination of faults and can monitor for a second type of fault or a second combination of faults. Consequently, any type of fault detection based on two or more faults is possible.

[0128] The fault detector 18, for example, includes a fault signal generator 26, which monitors for two different types of faults via the fault signals S4 and S5. Upon receiving one of the fault signals, it generates a fault signal S3 containing fault information that identifies the type of detected fault (i.e., based on whether fault signal S4 or S5 is received). It can be seen that other types or classes of faults can be monitored by the fault signal generator 26. The fault signal generator 26 is configured to detect a specific type of fault or combination of faults and to trigger the fault signal S3 in response to its detection.

[0129] In response to receiving the error signal S3, the output generator 17 determines the type of error based on the error information and determines which output signal should be modified based on the identified error. For example, based on the occurrence of a first type of error, the output generator 17 can decide to modify the pulse output signal S1 so that the output signal OUT1 remains in a steady state (i.e., a continuously stable signal that no longer switches between output states).

[0130] Similarly, based on the occurrence of a second type of error, the output generator 17 can decide to modify the pulse output signal S2 so that the output signal OUT2 remains in a steady state.

[0131] The microcontroller 30 is configured to receive the two output signals OUT1 and OUT2 at two corresponding input pins 21 and 22 and to monitor for faults based on an analysis and interpretation of the two output signals OUT1 and OUT2. Specifically, if a fault occurs in the magnetic sensor 10, one of the two output signals OUT1 or OUT2 is appropriately influenced by the output generator 17 based on the fault signal S3. The microcontroller 30 is configured to perform edge detection on both output signals OUT1 and OUT2 and to perform an edge analysis on each detected edge of each output signal OUT1 and OUT2. If the microcontroller 30 detects that an edge transition occurs in one signal without a simultaneous edge transition in the other signal, the microcontroller 30 determines that a fault has occurred.

[0132] The microcontroller 30 can determine the type of fault that has occurred based on a further analysis of which output signal is in a steady state. The output signal in a steady state indicates the type of fault based on mapping information stored in the microcontroller 30. If the microcontroller 30 determines that the output signal OUT1 is in a steady state, it consequently determines that the first fault type or combination of faults has occurred. Conversely, if the microcontroller 30 determines that the output signal OUT2 is in a steady state, it determines that a second fault type or combination of faults has occurred. Meanwhile, one of the output signals remains functional as a speed signal.Consequently, the microcontroller 30 can still use this other pulse output signal (i.e., OUT1 or OUT2) for speed information in speed applications. Appropriate troubleshooting or precautionary measures can be initiated by the microcontroller 30 based on the specific type or combination of errors.

[0133] Consequently, at least two types of faults can be transmitted by the magnetic sensor 10 using the two output signals OUT1 and OUT2 to the microcontroller 30, and the fault can be detected by the microcontroller 30 and its type identified.

[0134] Fig. 10A is a diagram of a measurement signal and corresponding output signals when no fault occurs and when two faults occur, according to the embodiment of Fig. 9. Fig. 10B is a diagram of a measurement signal and corresponding output signals when no fault occurs and when four faults occur according to the embodiment of Fig. 9. The upper diagram of Fig. 10A and Fig. Figure 10B is a signal diagram of a measurement signal Sx' representing an oscillating magnetic field (i.e., the magnetic sine signal).

[0135] In Fig. Figure 10A shows the other signal diagrams representing corresponding output signals under various conditions, including: synchronized output signals OUT1 and OUT2 under normal, fault-free conditions; signaling of a first fault type via output signal OUT1 when output signal OUT1 is in a high state; signaling of a first fault type via output signal OUT1 when output signal OUT1 is in a low state; signaling of a second fault type via output signal OUT2 when output signal OUT2 is in a high state; and signaling of a second fault type via output signal OUT2 when output signal OUT2 is in a low state. An output signal remains in the state it was in at the time its corresponding fault type was detected by fault signal generator 26 and signaled by fault signal S3.If it was in a high state, it remains high; if it was in a low state, it remains low. The fault can be detected by the microcontroller 30 and its type identified.

[0136] In Fig.Figure 10B shows the other signal diagrams representing corresponding output signals under various conditions, including: synchronized output signals OUT1 and OUT2 under a normal, fault-free condition; signaling of a first fault type via output signal OUT1 when output signal OUT1 is in a high state; signaling of a second fault type via output signal OUT1 when output signal OUT1 is in a low state; signaling of a third fault type via output signal OUT2 when output signal OUT2 is in a high state; and signaling of a fourth fault type via output signal OUT2 when output signal OUT2 is in a low state.An output signal is switched to a low or high state and held in this state, out of synchronization with the edge transitions of the other output signal, in response to one of its corresponding fault types being detected by the fault signal generator 26 and signaled by the fault signal S3. The fault can be detected by the microcontroller 30 and its type identified.

[0137] Although various embodiments have been disclosed, it is apparent to the person skilled in the art that various changes and modifications can be made which achieve some of the advantages of the concepts disclosed herein without departing from the idea and scope of the invention. It is obvious to the person skilled in the art that other components performing the same functions can be suitably employed. Naturally, other embodiments can be used, and structural or logical changes can be made without departing from the scope of the present invention. It should be noted that features explained with reference to a particular figure can be combined with features of other figures, even those not explicitly mentioned.Such modifications to the general invention concept are intended to be covered by the attached claims and their legal equivalents.

[0138] Furthermore, the following claims are hereby included in the detailed description, each claim being capable of standing alone as a separate exemplary embodiment. Although each claim is capable of standing alone as a separate exemplary embodiment, it should be noted that—although a dependent claim may refer to a specific combination with one or more other claims—other exemplary embodiments may also include a combination of the dependent claim with the subject matter of any other dependent or independent claim. Such combinations are proposed here unless it is stated that a specific combination is not intended. It is also intended to include features of a claim in any other independent claim, even if that claim is not directly dependent on the independent claim.

[0139] Furthermore, it should be noted that methods disclosed in the patent description or in the claims can be implemented by a device comprising means for performing each of the respective actions of these methods. The techniques described in this disclosure can, for example, be implemented at least partially in hardware, software, firmware, or any combination thereof. Various aspects of the described techniques can, for example, be implemented within one or more processors, including one or more microprocessors, DSPs, ASICs, or any other equivalent integrated or discrete logic circuit arrangement, as well as any combination of such components.

[0140] Furthermore, the disclosure of multiple acts or functions in the patent description or claims should not, of course, be interpreted as being within a specific sequence. Therefore, the disclosure of multiple acts or functions does not limit them to a specific sequence unless such acts or functions are non-interchangeable for technical reasons. Moreover, in some embodiments, a single act may comprise or be divided into multiple sub-acts. Such sub-acts may be included and form part of the disclosure of that single act unless explicitly excluded.

Claims

[1] Sensor device (10) comprising the following: at least one first sensor element (13) with a first detection direction configured to generate at least one first sensor signal (Sx, Sx1) based on the detection of a first magnetic field component of a varying magnetic field oriented in the first detection direction; at least one second sensor element (14) with a second detection direction, configured to generate at least one second sensor signal (Sy, Sx2) based on the detection of a second magnetic field component of the varying magnetic field, which is oriented in the second detection direction; a signal processing circuit (15, 16) configured to generate a first pulse signal (S1) based on the at least one first sensor signal (Sx, Sx1) and to generate a second pulse signal (S2) based on the at least one second sensor signal (Sy, Sx2); a fault detector (18) configured to detect at least one fault and to generate a fault signal indicating the at least one fault in response to the detection of the at least one fault; and an output generator (17) configured to receive the first pulse signal (S1) and the second pulse signal (S2), the error signal based on a first condition that the error detector (18) detects the at least one error, and simultaneously output a first output signal (OUT1) and a second output signal (OUT2), wherein, based on a second condition that the fault detector (18) does not detect the at least one fault, the output generator is configured to output the first pulse signal (S1) as the first output signal (OUT1) and to output the second pulse signal (S2) as the second output signal (OUT2), and wherein, in response to the first condition being satisfied, the output generator (18) is configured to keep the first output signal (OUT1) in a steady state and to output the second pulse signal (S2) as the second output signal (OUT2), wherein: the first pulse signal (S1) comprises several transition edges that define several first pulses, the second pulse signal (S2) comprises several transition edges that define multiple second pulses, and the first several transition flanks are synchronized with the second several transition flanks. [2] Sensor device (10) according to claim 1, wherein, while the second condition is met: the first output signal (OUT1) comprises several transition edges that define several first pulses, the second output signal (OUT2) comprises several transition edges that define multiple second pulses, and the first multiple transition edges are synchronized with the second multiple transition edges, optionally, while the second condition is satisfied, each of the first multiple transition edges is synchronized with a corresponding transition edge of the second multiple transition edges. [3] Sensor device (10) according to claim 1 or 2, wherein the varying magnetic field is caused by a rotational movement of a target object, such that the first sensor signal (Sx, Sx1) and the second sensor signal (Sy, Sx2) are sinusoidal signals, wherein the signal processing circuit (15, 16) is configured to determine a phase shift direction of a phase shift between the at least one first sensor signal (Sx, Sx1) and the at least one second sensor signal (Sy, Sx2), and to generate the second pulse signal based on the determined phase shift direction, wherein optionally, while the first condition or the second condition is satisfied, the second pulse signal (S2) provides velocity information indicating a speed at which the varying magnetic field varies, corresponding to a rotational speed of the target object, and direction change information indicating a change in the direction of the varying magnetic field.corresponding to a direction of rotation of the target object. [4] Sensor device (10) according to claim 3, wherein: the first pulse signal (S1) indicates a speed at which the varying magnetic field varies, corresponding to a rotational speed of the target object, and The second pulse signal (S2) indicates a direction in which the varying magnetic field varies, corresponding to a direction of rotation of the target object. [5] Sensor device (10) according to claim 4, wherein the signal processing circuit (15, 16) is configured to determine whether the direction in which the varying magnetic field varies is in a first direction or a second direction, to generate the first pulse signal (S1) and the second pulse signal (S2) so that they are in phase with each other in response to the determination that the direction is in the first direction, and to generate the first pulse signal (S1) and the second pulse signal (S2) so that they are phase-shifted by 180° with each other in response to the determination that the direction is in the second direction. [6] Sensor device (10) according to any one of claims 1 to 5, wherein: - while the first condition is met, the second output signal (Out2) provides velocity information indicating the speed at which the varying magnetic field varies, and direction change information indicating a change in the direction of the varying magnetic field, and / or - the sensor device (10) is a semiconductor chip with a first output pin configured to output the first output signal (OUT1) and a second output pin configured to output the second output signal (OUT2), and / or - the first detection direction and the second detection direction are either the same direction or different directions. [7] Sensor system (100; 200A; 200B; 300) comprising the following: a sensor device (10) comprising the following: at least one first sensor element (13) configured to generate at least one first sensor signal (Sx, Sx1) based on the detection of a first magnetic field component of a varying magnetic field; at least one second sensor element (14) configured to generate at least one second sensor signal (Sy, Sx2) based on the detection of an aligned second magnetic field component of the varying magnetic field; a signal processing circuit (15, 16) configured to generate a first pulse signal (S1) based on the at least one first sensor signal (Sx, Sx1) and to generate a second pulse signal (S2) based on the at least one second sensor signal (Sy, Sx2); wherein: the first pulse signal (S1) comprises several transition edges that define several first pulses, the second pulse signal (S2) comprises several transition edges that define multiple second pulses, and the first several transition edges are synchronized with the second several transition edges, a fault detector (18) configured to detect at least one fault and to generate a fault signal indicating the at least one fault in response to the detection of the at least one fault; and an output generator (17) configured to receive the first pulse signal (S1) and the second pulse signal (S2), to receive the error signal based on a first condition that the error detector detects at least one error, and simultaneously to output a first output signal (OUT1) and a second output signal (OUT2), wherein, based on a second condition that the fault detector does not detect the at least one fault, the output generator (17) is configured to output the first pulse signal (S1) as the first output signal (OUT1) and to output the second pulse signal (S2) as the second output signal (OUT2), and wherein, in response to the first condition being met, the output generator (17) is configured to maintain the first output signal (OUT1) in a steady state and output the second pulse signal (S2) as the second output signal (OUT2); and a microcontroller (30) coupled to the sensor device (10), wherein the microcontroller (30) is configured to receive the first output signal (OUT1) and the second output signal (OUT2), and to detect the at least one fault based on the first output signal (OUT1) and the second output signal (OUT2). [8] Microcontroller (30) comprising the following: a first input pin (31) configured to receive a first signal (OUT1) from a sensor device (10), wherein the first signal (OUT1) is a first pulse signal at least under normal conditions; a second input pin (32) configured to receive a second signal from the sensor device (10), wherein the second signal (OUT2) is, at least under a normal condition, a second pulse signal, wherein the first signal (OUT1) and the second signal (OUT2) are received simultaneously and together specify either the normal condition, a first fault condition or a second fault condition, wherein: the first pulse signal (S1) comprises several transition edges that define several first pulses, the second pulse signal (S2) comprises several transition edges that define multiple second pulses, and the first several transition edges are synchronized with the second several transition edges; and at least one processor configured to evaluate the first signal (OUT1) and the second signal (OUT2), and to detect the normal condition, the first fault condition or the second fault condition based on the evaluated first signal (OUT1) and the evaluated second signal (OUT2), wherein at least one processor is configured to detect transition edges of the first signal (OUT1) and the second signal (OUT2), wherein the at least one processor is configured to determine, for each detected transition edge of the first signal (OUT1) and the second signal (OUT2), whether two synchronous edges are detected, wherein the two synchronous edges include the fact that a first transition edge of the first signal is synchronous with a second transition edge of the second signal, where, given that the two synchronous edges are detected, at least one processor is configured to determine that the normal condition is met, and where, under the condition that the two synchronous edges are not detected, at least one processor is configured to detect that either the first error condition or the second error condition has occurred. [9] Microcontroller (30) according to claim 8, wherein: Based on the condition that the two synchronous edges are not detected, at least one processor is configured to determine which of the first and second signals is in a steady state, if the first signal is in a steady state, and at least one processor is configured to determine that the first fault condition has occurred, and if the second signal is in a steady state, at least one processor is configured to determine that the second error condition has occurred, optionally: based on the condition that the two synchronous edges are detected, the first signal includes first sensor data and the second signal includes second sensor data, based on a condition that the two synchronous edges are not detected and the first signal is in a steady state, the first signal indicates the first error condition and the second signal comprises the second sensor data, and based on a condition that the two synchronous edges are not detected and the second signal is in a steady state, the first signal includes the first sensor data and the second signal specifies the second error condition. [10] Microcontroller (30) comprising the following: a first input pin (31) configured to receive a first signal (OUT1) from a sensor device (10), wherein the first signal (OUT1) is a first pulse signal at least under normal conditions; a second input pin (32) configured to receive a second signal (OUT2) from a sensor device (10), wherein the second signal (OUT2) is, at least under normal conditions, a second pulse signal, wherein: the first pulse signal (S1) comprises several transition edges that define several first pulses, the second pulse signal (S2) comprises several transition edges that define multiple second pulses, and the first multiple transition edges are synchronized with the second multiple transition edges, with the first signal (OUT1) and the second signal (OUT2) being received simultaneously and together indicating either the normal condition or an error condition; and at least one processor configured to evaluate the first signal (OUT1) and the second signal (OUT2) and to detect the normal condition or the fault condition based on the evaluated first signal (OUT1) and the evaluated second signal (OUT2), wherein at least one processor is configured to detect transition edges of the first signal (OUT1) and the second signal (OUT2), wherein the at least one processor is configured to determine, for each detected transition edge of the first signal (OUT1) and the second signal (OUT2), whether two synchronous edges are detected, wherein the two synchronous edges include the fact that a first transition edge of the first signal is synchronous with a second transition edge of the second signal, where, given that the two synchronous edges are detected, at least one processor is configured to determine that the normal condition is met, and where, under the condition that the two synchronous edges are not detected, at least one processor is configured to detect that the error condition has occurred. [11] Microcontroller (30) according to claim 10, wherein: While the normal condition is met, the microcontroller (30) determines a speed at which a varying magnetic field varies from the first signal (OUT1), determines a direction in which the varying magnetic field varies from the second signal (OUT2), including the detection of a change in direction indicating a change in the direction of the varying magnetic field, and While the fault condition is met, the microcontroller (30) determines the fault condition from the first signal, determines the speed at which the varying magnetic field varies from the second signal, and detects the change in direction, which indicates the change in the direction of the varying magnetic field, from the second signal. [12] Sensor device (10) comprising: at least one first sensor element (13) configured to generate at least one first sensor signal (Sx, Sx1) based on the detection of a varying magnetic field; at least one second sensor element (14) configured to generate at least one second sensor signal (Sy, Sx2) based on the detection of the varying magnetic field, wherein the varying magnetic field is caused by a rotational movement of an object, such that the first sensor signal (Sx, Sx1) and the second sensor signal (Sy, Sx2) are sinusoidal signals and wherein the at least one first sensor signal (Sx, Sx1) is phase-shifted from the at least one second sensor signal (Sy, Sx2); a signal processing circuit (15, 16) configured to generate a first pulse signal (S1) based on the at least one first sensor signal (Sx, Sx1), to determine a phase shift direction of a phase shift between the at least one first sensor signal (Sx, Sx1) and the at least one second sensor signal (Sy, Sx2), and to generate a second pulse signal (S2) based on the determined phase shift direction, wherein: the first pulse signal (S1) comprises several transition edges that define several first pulses, the second pulse signal (S2) comprises several transition edges that define multiple second pulses, and the first multiple transition edges are synchronized with the second multiple transition edges, wherein the signal processing circuit (15, 16) is further configured to detect a phase shift inversion of the phase shift in which the direction of the phase shift changes and toggle a state of the second pulse signal (S2) in response to the detection of the phase shift inversion; a fault detector (18) configured to detect at least one fault and to generate a fault signal indicating the at least one fault in response to the detection of the at least one fault; and an output generator (17) configured to receive the first pulse signal (S1) and the second pulse signal (S2), the error signal based on a first condition that the error detector (18) detects the at least one error, and simultaneously output a first output signal (OUT1) and a second output signal (OUT2), wherein, based on a second condition that the fault detector (18) does not detect the at least one fault, the output generator (17) is configured to output the first pulse signal (S1) as the first output signal (OUT1) and to output the second pulse signal (S2) as the second output signal (OUT2), and where, in response to the first condition being met, the output generator (17) is configured to keep the first output signal (OUT1) in a steady state and output the second pulse signal (S2) as the second output signal. [13] Sensor device (10) according to claim 12, wherein: - the signal processing circuit (15, 16) is configured to determine whether a direction in which the varying magnetic field varies, corresponding to a direction of rotation of the target object, lies in a first direction or a second direction, to generate the first pulse signal (S1) and the second pulse signal (S2) so that they are in phase with each other, in response to the determination that the direction lies in the first direction, and to generate the first pulse signal (S1) and the second pulse signal (S2) so that they are phase-shifted by 180° with each other, in response to the determination that the direction lies in the second direction, and / or - that at least one first sensor element (13) is configured to generate at least one first sensor signal (Sx, Sx1) based on the detection of a first magnetic field component of the varying magnetic field, and the at least one second sensor element (14) is configured to generate the at least one second sensor signal (Sy, Sx2) based on the detection of a second magnetic field component of the varying magnetic field, wherein the first magnetic field component and the second magnetic field component have different directions, and / or - that at least one first sensor element (13) is configured to generate at least one first sensor signal (Sx, Sx1) based on the detection of a first magnetic field component of the varying magnetic field, and the at least one second sensor element (14) is configured to generate the at least one second sensor signal (Sy, Sx2) based on the detection of the first magnetic field component of the varying magnetic field along the same detection axis as the at least one first sensor element (13), and / or - while a normal condition is met, the first output signal (OUT1) indicates a speed at which a varying magnetic field varies, corresponding to a rotational speed of the target object, and the second output signal (OUT2) indicates a direction in which the varying magnetic field varies, corresponding to a direction of rotation of the target object, including an indication of a change of direction, which indicates a change in the direction of the varying magnetic field, and While a fault condition is met, the first output signal (OUT1) indicates the fault condition, and the second output signal (OUT2) indicates the speed at which the varying magnetic field varies and the change in direction of the varying magnetic field. [14] Sensor device (10) comprising the following: at least one first sensor element (13) configured to generate at least one first sensor signal (Sx) based on the detection of a magnetic field component of a varying magnetic field; a signal processing circuit (15, 46) configured to generate a first pulse signal (S1) based on the at least one first sensor signal (Sx) and to generate a second pulse signal (S2) in duplicate to the first pulse signal (S1), wherein: the first pulse signal (S1) comprises several transition edges that define several first pulses, the second pulse signal (S2) comprises several transition edges that define multiple second pulses, and the first several transition edges are synchronized with the second several transition edges; a fault detector (18) configured to detect at least one first fault and to generate a first fault signal indicating the at least one first fault in response to the detection of the at least one first fault; and an output generator (17) configured to receive the first pulse signal (S1) and the second pulse signal (S2), to receive the first error signal based on a first condition that the error detector detects the at least one first error, and simultaneously output a first output signal (OUT1) and a second output signal (OUT2), wherein, based on a second condition that the fault detector does not detect the at least one first fault, the output generator (17) is configured to output the first pulse signal (S1) as the first output signal (OUT1) and to output the second pulse signal (S2) as the second output signal (OUT2), and where, in response to the first condition being met, the output generator (17) is configured to keep the first output signal (OUT1) in a steady state and output the second pulse signal (S2) as the second output signal (OUT2). [15] Sensor device according to claim 14, wherein: the fault detector (18) is configured to detect at least one second fault and to generate a second fault signal indicating the at least one second fault in response to the detection of the at least one second fault, the output generator (17) is configured to receive the second fault signal based on a third condition that the fault detector detects at least one second fault, While a fourth condition, that the fault detector detects neither the first fault nor the second fault, is met, the output generator is configured to output the first pulse signal (S1) as the first output signal (OUT1) and to output the second pulse signal (S2) as the second output signal (OUT2), and In response to the third condition being met, the output generator (17) is configured to keep the second output signal (OUT2) in a steady state and to output the first pulse signal (S1) as the first output signal (OUT1). [16] Sensor device (10) according to claim 15, wherein: - where at least one first error and at least one second error are different error types, and / or - the output generator (17) stores a mapping that maps the at least one first error to the first output signal (OUT1) and maps the at least one second error to the second output signal (OUT2), and / or - in response to the first condition being met, the output generator (17) is configured to ignore the first pulse signal (S1), and in response to the third condition being met, the output generator (17) is configured to ignore the second pulse signal (S2), and / or - while the fourth condition is met, the first output signal (OUT1) includes several transition edges that define several first pulses, the second output signal (OUT2) includes several transition edges that define several second pulses, and the first several transition edges are synchronized with the second several transition edges. [17] Sensor device (10) according to claim 15 or 16, wherein: the first pulse signal (S1) comprises several transition edges that define several first pulses, the second pulse signal (S2) comprises several transition edges that define multiple second pulses, and the first several transition flanks are synchronized with the second several transition flanks. [18] Sensor device (10) according to one of claims 15 to 17, wherein: The first pulse signal (S1) and the second pulse signal (S2) indicate a speed at which the varying magnetic field varies. [19] Sensor device (10) comprising: at least one first sensor element (13) configured to generate at least one first sensor signal (Sx) based on the detection of a magnetic field component of a varying magnetic field; a signal processing circuit (15, 46) configured to generate a first pulse signal (S1) based on the at least one first sensor signal (Sx) and to generate a second pulse signal (S2) in duplicate to the first pulse signal (S1), wherein: the first pulse signal (S1) comprises several transition edges that define several first pulses, the second pulse signal (S2) comprises several transition edges that define multiple second pulses, and the first several transition edges are synchronized with the second several transition edges; a fault detector (18) configured to detect at least one first fault and to generate a first fault signal indicating the at least one first fault in response to the detection of the at least one first fault, to detect at least one second fault and to generate a second fault signal indicating the at least one second fault in response to the detection of the at least one second fault, to detect at least one third fault and to generate a third fault signal indicating the at least one third fault in response to the detection of the at least one third fault, and to detect at least one fourth fault and to generate a fourth fault signal indicating the at least one first fourth fault in response to the detection of the at least one fourth fault; and an output generator (17) configured to receive the first pulse signal (S1) and the second pulse signal (S2), to receive the first error signal based on a first condition that the error detector detects at least one first error, to receive the second error signal based on a second condition that the error detector detects at least one second error, to receive the third error signal based on a third condition that the error detector detects at least one third error, to receive the fourth error signal based on a fourth condition that the error detector detects at least one fourth error, and simultaneously output a first output signal and a second output signal. wherein, based on a fifth condition that the fault detector does not detect the at least one first fault, the at least one second fault, the at least one third fault, or the at least one fourth fault, the output generator (17) is configured to output the first pulse signal (S1) as a first output signal (OUT1) and to output the second pulse signal (S2) as a second output signal (OUT2), and wherein, in response to the first condition being met, the output generator (17) is configured to maintain the first output signal (OUT1) in a high steady state and output the second pulse signal (S2) as the second output signal, wherein, in response to the second condition being met, the output generator (17) is configured to keep the first output signal (OUT1) in a low steady state and to output the second pulse signal (S2) as the second output signal, wherein, in response to the third condition being met, the output generator (17) is configured to keep the second output signal (OUT2) in the high steady state and to output the first pulse signal (S1) as the first output signal (OUT1), and where, in response to the fourth condition being met, the output generator (17) is configured to keep the second output signal (OUT2) in the low steady state and output the first pulse signal (S1) as the first output signal.

Images