MODEL-BASED MONITORING AND REFINING OF MODEL PREDICTIVE CONTROL SYSTEMS AND APPLICATIONS

DE102025155276A1Undetermined Publication Date: 2026-07-02NVIDIA CORP
1 Cites 0 Cited by

Patent Information

Application Number
DE102025155276
Authority / Receiving Office
DE · DE
Patent Type
Applications
Current Assignee / Owner
Priority Date
2025-01-16
Filing Date
2025-12-29
Publication Date
2026-07-02
Patent Text Reader

Abstract

In various examples, the systems and methods of this disclosure can use a machine learning model (e.g., a Kolmogorov-Arnold network) to monitor and improve the performance of a model predictive control (MPC) system associated with a machine. For example, the machine learning model can be trained and used to predict errors between measured and predicted states of the machine. Based at least on the predicted errors, the systems can update one or more parameters of a predictive model associated with the MPC system to reduce the differences between the measured and predicted states in subsequent iterations.In some examples, the systems of the present disclosure can retrain the machine learning model using new data when the magnitudes of the predicted errors reach or exceed a threshold, thereby enabling the machine learning model to adapt to changing conditions in real time.
Need to check novelty before this filing date? Find Prior Art

Citation Information

Patent Citations

  • US16101232B1

  • 16/101,232