Deviation system including metasurfaces
FR3168638A1Pending Publication Date: 2026-05-22SAFRAN ELECTRONICS & DEFENSE (FR)
Patent Information
- Application Number
- FR2024012536
- Authority / Receiving Office
- FR · FR
- Patent Type
- Applications
- Current Assignee / Owner
- Filing Date
- 2024-11-18
- Publication Date
- 2026-05-22
Smart Images
Figure 00000000_0000_ABST
Abstract
This laser beam measurement system comprises a laser source configured to emit laser radiation towards a target and a detector (2) arranged to receive said reflected laser radiation (8) from the target, which is equipped with a pixel array (10) and configured to measure the location of said reflected laser radiation (8) on the pixel array (10). The laser beam measurement system further comprises a diapometer (4) equipped with first and second optical components (4A, 4B) arranged along the optical path of said reflected laser radiation (8) and which are free to rotate independently of each other about an optical axis (A) of the laser beam measurement system. The first and second optical components (4A, 4B) are each equipped with a metasurface (12A, 12B) configured to deflect said reflected laser radiation at first and second deflection angles (α1, α2), respectively. (See Figure 2 for abbreviations.)
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Claims
metasurface (12A, 12B) is arranged in columns such that each column comprises a single type of sub-wavelength structure (14A). [Fig. 1] 6B [Fig. 2] 6A
Citation Information
Patent Citations
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