Electric field measuring device
JP2026095597APending Publication Date: 2026-06-11HAMAMATSU PHOTONICS KK
Patent Information
- Authority / Receiving Office
- JP · JP
- Patent Type
- Applications
- Current Assignee / Owner
- HAMAMATSU PHOTONICS KK
- Filing Date
- 2026-04-01
- Publication Date
- 2026-06-11
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Figure 2026095597000001_ABST
Abstract
To provide an electric field measuring device that can improve the accessibility of the measuring unit to the object being measured. [Solution] The spectroscopic measurement device 1 comprises a light source unit 11 that outputs pump light La and probe light Lb, a terahertz wave generation unit 21 that generates a terahertz wave T upon input of the pump light La, a terahertz wave detection unit 23 that receives the terahertz wave T and probe light Lb respectively and modulates the probe light Lb based on the refractive index as the refractive index changes due to the electro-optic effect associated with the input of the terahertz wave T, and a photodetection unit 13 that detects the probe light Lb modulated by the terahertz wave detection unit 23, and has a main body unit 2 which includes the light source unit 11 and the photodetection unit 13, and a measurement unit 3 which includes the terahertz wave generation unit 21 and the terahertz wave detection unit 23, and the main body unit 2 and the measurement unit 3 are optically connected by a polarization-maintaining fiber F.
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