Temperature testing device
The temperature test device addresses uneven temperature distribution by using an air passage and plate-shaped member with air inlets and outlets to enhance airflow, achieving rapid stabilization and uniform temperature throughout the chamber.
Patent Information
- Application Number
- JP2024210565
- Authority / Receiving Office
- JP · JP
- Patent Type
- Applications
- Current Assignee / Owner
- Filing Date
- 2024-12-03
- Publication Date
- 2026-06-15
AI Technical Summary
Existing temperature test devices, particularly open temperature test tanks, face challenges in evenly distributing temperature throughout the chamber, especially in the corners, due to air from the air curtain outlet not easily reaching the back of the test chamber, leading to prolonged stabilization times.
The device incorporates an air passage within the test chamber that extends from the back to the intake port, creating negative pressure to facilitate uniform air distribution, and includes a plate-shaped member with air inlets and outlets to enhance airflow, allowing air to reach the back of the chamber efficiently.
This configuration significantly reduces the time required for the temperature inside the test chamber to stabilize at the set temperature, ensuring uniform temperature distribution without additional equipment.