Electrical and electronic equipment testing equipment and electrical and electronic equipment testing systems

Abstract

To realize an inexpensive and miniaturized test device for electrical and electronic equipment. [Solution] The present invention proposes an electrical and electronic equipment testing apparatus for housing an electrical and electronic equipment to be tested in an internal space and testing the electrical and electronic equipment, comprising: a voltage connector to which voltage is applied via a coaxial cable; a housing that includes the voltage connector at its end, constitutes an outer conductor, and forms an internal space; and an inner conductor provided inside the housing, extending from the coaxial conductor of the voltage connector, and constituting a conductor septum, wherein a resin-based insulating material that suppresses the discharge of high-voltage pulses is filled in a predetermined range from the end, determined based on the applied voltage and the distance from the inner conductor to the outer conductor.

Description

Technical Field

[0001] The present invention relates to an electric and electronic equipment test device and an electric and electronic equipment test system, and particularly to an insulation structure for suppressing discharge at a high voltage application end. Note that the present invention is a patent application subject to the application of the Security Technology Research Promotion System of the Ministry of Defense and Article 17 of the Industrial Technology Enhancement Act in fiscal year 2022.

Background Art

[0002] In a test for verifying the operation of electric and electronic equipment, a high electric field may be irradiated on the electric and electronic equipment to be tested to verify whether it malfunctions. When conducting such a test, for example, a TEM waveguide or a GTEM cell as disclosed in Patent Document 1 may be used. Patent Document 1 discloses an electromagnetic interference inspection device for electronic equipment having a TEM waveguide that expands in a pyramid shape. The electromagnetic interference inspection device includes a wall of a high-frequency tip absorber provided at the end of the device, a plate-shaped inner conductor asymmetrically arranged inside the device, and an outer conductor (TEM waveguide) constituting the outer housing of the device. Here, the absorption wall is curved in a cap shape, and the center of this curvature is provided in the tip region of the pyramid-shaped outer conductor (TEM waveguide).

Prior Art Documents

Patent Documents

[0003]

Patent Document 1

Summary of the Invention

Problems to be Solved by the Invention

[0004] In the conventional test device as described above, in order to suppress discharge at the high voltage application end, a gas such as SF6 gas (a highly insulating gas) is enclosed in the device for the test. Further, the test needs to be conducted in a large anechoic chamber so that radio waves do not leak into space.

[0005] However, using SF6 gas or similar gases to suppress discharge presents several challenges. The gas itself is expensive, leading to high-cost testing equipment. Furthermore, the need for maintenance—including gas refilling, pressure adjustment, and extraction—after each test places a significant burden on the testing process. Additionally, the use of SF6 gas necessitates the installation of dedicated airtight containers and auxiliary equipment, resulting in a larger overall system size. In view of these circumstances, the present invention proposes an inexpensive and miniaturizable testing apparatus for electrical and electronic equipment. [Means for solving the problem]

[0006] To solve the above problems, the present invention, as an example, An electrical and electronic equipment testing apparatus that houses electrical and electronic equipment to be tested in an internal space and tests said electrical and electronic equipment, A voltage connector to which voltage is applied via a coaxial cable, A housing that includes the aforementioned voltage connector at its end, constitutes an external conductor, and forms the internal space, The enclosure is provided with an internal conductor that extends from the coaxial conductor of the voltage connector and constitutes a conductor septum, We propose an electrical and electronic equipment testing apparatus in which a resin-based insulating material that suppresses the discharge of high-voltage pulses is filled in a predetermined range from the end, determined based on the applied voltage and the distance from the inner conductor to the outer conductor.

[0007] Further features relating to the present invention will become apparent from the description herein and the accompanying drawings. Furthermore, aspects of the present invention are achieved and realized by elements and various combinations of elements and by the modes of the hereafter detailed description and the accompanying claims. The descriptions herein are merely typical examples and do not limit in any way the claims or applications of the present invention. [Effects of the Invention]

[0008] According to the present invention, it becomes possible to realize an inexpensive and miniaturized test apparatus for electrical and electronic equipment. [Brief explanation of the drawing]

[0009] [Figure 1] This figure shows an example of the external configuration of the electrical and electronic equipment testing apparatus 1 according to an embodiment of the present invention. [Figure 2] This is a cross-sectional view showing an example of the internal configuration of the electrical and electronic equipment testing apparatus 1. [Figure 3] This figure shows the state in which a resin-based insulating material has been filled inside the tip 13 of the electrical and electronic equipment testing device 1. [Figure 4] This figure shows an example of a block configuration of a measurement system used to measure the presence or absence of discharge using the electrical and electronic equipment testing apparatus 1 according to an embodiment of the present invention. [Figure 5] This figure shows the results of discharge status measurement when a resin-based insulating material is filled into the filling area (filling region) 112 of the tip (device end: application end) 11 of the electrical and electronic equipment testing device 1. [Figure 6] This figure shows an example of the block configuration of the measurement system used for measuring the discharge status of the filling material (preliminary study). [Figure 7] This figure shows the results of the material evaluation (whether or not electrical discharge occurs). [Figure 8] This table shows reference values ​​for various insulating materials. [Modes for carrying out the invention]

[0010] Embodiments of the present invention propose to suppress the occurrence of discharge between the central axis (internal conductor) and the ground side (device housing = external conductor) when a high voltage such as a hemp waveform is applied to a coaxial structure by employing a configuration in which an inexpensive insulator (e.g., silicon) is filled at the high voltage (in this specification, in addition to "high voltage", it may also be referred to as "high voltage pulse" or "HEMP waveform") application terminal of the test device. In other words, this embodiment provides a novel "discharge suppression technology using an insulating resin-filled structure at the high voltage application terminal", and specifically, the discharge suppression technology will be explained using a GTEM cell as an example.

[0011] Hereinafter, embodiments and examples of the present invention will be described with reference to the accompanying drawings. In the accompanying drawings, functionally identical elements may sometimes be denoted by the same number. Note that the accompanying drawings show specific embodiments and implementation examples in accordance with the principles of the present disclosure, but these are for the purpose of understanding the present invention and are not used to limit the interpretation of the present invention in any way.

[0012] <Example of the external configuration of an electrical and electronic equipment test apparatus> FIG. 1 is a diagram showing an example of the external configuration of an electrical and electronic equipment test apparatus 1 according to an embodiment of the present invention. In the present embodiment, a GTEM (Gigahertz Transverse Electromagnetic) cell (one row) is taken as an example of the electrical and electronic equipment test apparatus 1, but the present invention is not limited thereto.

[0013] The electrical and electronic equipment test apparatus 1 includes a side housing 10 that constitutes an external conductor, a tip portion (application end) 11 to which a high voltage waveform is applied from a high voltage waveform generator via a coaxial cable, a device termination end 13 (see FIG. 2), and a door (not shown) for accommodating and taking out the electrical and electronic equipment to be tested inside the apparatus. The side housing 10 according to the present embodiment has a quadrangular pyramid shape, but is not limited to a quadrangular pyramid as long as it can form a predetermined gap between the external conductor and a central conductor (also referred to as a septum or an internal conductor) described later. For example, the side housing 10 may be configured such that its cross section is trapezoidal. In this case, the electrical and electronic equipment test apparatus 1 can be configured as a TEM cell or a stripline. Note that the size of the electrical and electronic equipment test apparatus 1 can be changed according to the size of the electrical and electronic equipment to be tested.

[0014] <Example of the internal structure of an electrical and electronic equipment test apparatus> FIG. 2 is a cross-sectional view showing an example of the internal configuration of the electrical and electronic equipment test apparatus 1. FIG. 2A shows the overall cross-sectional configuration in the longitudinal direction of the electrical and electronic equipment test apparatus 1, and FIG. 2B shows the cross-sectional configuration of the tip portion 11 of the electrical and electronic equipment test apparatus 1.

[0015] The electrical and electronic equipment test apparatus 1 has an internal conductor (also referred to as a conductor septum or a center conductor) 12 in an internal space formed by an outer housing 10 and an apparatus terminal portion 13. As shown in Fig. 2A, the internal conductor 12 extends with a predetermined angle toward the terminal portion 13. However, the angle between the internal conductor 12 and the bottom surface portion 10-2 of the outer housing (external conductor) 10 is set larger than the angle between the internal conductor 12 and the top surface portion 10-1 of the external conductor 10 (installed asymmetrically in the vertical direction). Therefore, the distance between the internal conductor 12 and the external conductor 10 is larger from the bottom surface portion 10-2 to the internal conductor 12 than from the top surface portion 10-1 to the internal conductor 12 at the same cross-sectional position.

[0016] A high-voltage signal is applied to the internal conductor 12 from a high-voltage waveform generator 20 (see Fig. 4) connected externally via the tip portion 11. The signal applied to the internal conductor 12 forms an electromagnetic field in the internal space (the test space of the electrical and electronic equipment), irradiates an electromagnetic wave to the electrical and electronic equipment to be tested (not shown), and has a role of controlling the propagation of the electromagnetic wave inside the irradiation and maintaining the characteristic impedance. That is, the internal conductor 12 has a role of transmitting the high-voltage signal from the high-voltage waveform generator 20, similar to the coaxial cable 21 (see Fig. 4) connected to the tip portion 11, thereby making the electric field formed between the internal conductor 12 and the side housing (external conductor) 10 uniform. Further, the internal conductor 12 has a termination resistor 131 at the apparatus terminal portion 13, whereby the internal conductor 12 is maintained at a predetermined characteristic impedance value (for example, 50 Ω), and the reflection of the propagated signal is suppressed.

[0017] The apparatus terminal portion 13 includes, in addition to the above termination resistor 131, a plurality of RF wave absorbers 132 arranged adjacent to each other in the vertical, horizontal, and left-right directions on the inner surface (inside the apparatus) of the apparatus terminal portion 13. The RF wave absorber 132 can be formed of, for example, foamed polyethylene added with conductive particles. Note that the RF wave absorber 132 has extremely low conductivity (even if conductive particles are added) and has a pyramid shape, so that it converts high-frequency energy into heat. Therefore, the high-voltage signal propagated through the internal conductor 12 is converted into heat and absorbed by the RF wave absorber 132.

[0018] The tip section 11 includes a high-voltage coaxial connector 111 to which a coaxial cable 21 is connected. At the tip section 11, the central conductor of the coaxial cable 21 is connected to the internal conductor 12. Furthermore, the tip section 11 is filled with a resin-based insulating material (e.g., silicon) over a predetermined range (filling range 112) from the end (insertion tip portion) of the high-voltage coaxial connector 111. This filling range 112 is determined based on the voltage applied by the high-voltage signal transmitted from the high-voltage waveform generator 20 and the distance from the internal conductor 12 to the side housing (outer conductor) 10. In other words, whether or not discharge occurs is determined by the level of the applied voltage and the distance from the internal conductor 12 to the outer conductor 10, and the resin-based insulating material (silicon) is filled over the range where discharge would occur. To put it another way, the filling range 112 is determined to ensure a distance between the internal conductor 12 and the outer conductor 10 that prevents discharge and maintains a stable electric field distribution. In detail, discharge characteristics vary depending on the type of filler material, the surrounding environment (test environment), and the characteristics of the applied waveform (frequency, rise time, peak voltage, etc.). Therefore, the discharge distance at the applied voltage is calculated based on the 1kV / mm (discharge (insulation) distance at 1kV) standard of the filler material (discharge withstand voltage standard of 1mm per 1kV), and the filler range 112 is determined (designed). The validity of the calculated distance and filler range 112 is then confirmed (verified) by applying a high-voltage signal with the waveform (voltage waveform) and peak value actually used in the operation test of electrical and electronic equipment to the electrical and electronic equipment test device 1 (filler range 112 filled with the target material) and checking whether or not discharge occurs inside. For example, if a resin-based insulating material with a 1kV discharge distance of 1mm is used as the filler material and the applied voltage is 30kV, the discharge distance is calculated to be approximately 30mm. Then, the area up to the point where the shortest distance from the inner conductor 12 to the outer conductor 10 (the length of the perpendicular from the inner conductor 12 to the outer conductor 10) is 30 mm is filled with a resin-based insulating material.

[0019] <State (appearance) of filling with resin-based insulating material> Figure 3 shows the state in which a resin-based insulating material is filled inside the tip 13 of the electrical and electronic equipment testing device 1. Both Figures 3A and 3B show the filling process, but Figure 3A shows the state viewed from below the internal conductor 12, and Figure 3B shows the state viewed from approximately the same angle as the angle at which the internal conductor 12 extends.

[0020] The resin-based insulating material is filled (poured) after undergoing a "degassing treatment" to remove air bubbles mixed in the resin by holding it under reduced pressure in a vacuum chamber for a certain period of time. The resin-based insulating material (specific examples will be described later) can be a thermoplastic resin, a thermosetting resin, or a resin that solidifies by polymerization reaction (such as an adhesive), and can have a predetermined dielectric constant (for example, 2 to 20).

[0021] Furthermore, when filling the filling area 112 with a resin-based insulating material (for example, a silicone-based resin), the internal space of the electrical and electronic equipment testing apparatus 1 is made into a vacuum to eliminate air bubbles inside the resin-based insulating material. This is because if internal air bubbles are present, voids will be formed inside the resin-based insulating material when it solidifies, reducing its dielectric strength (and thus its discharge prevention function).

[0022] Furthermore, while a lower dielectric constant is preferable for resin-based insulating materials when considering insulation, a slightly higher dielectric constant can prevent discharge if sufficient distance is maintained between the inner conductor 12 and the outer conductor (outer housing) 10. However, increasing this distance too much will increase the size of the electrical and electronic equipment testing apparatus 1, so it is necessary to select an insulating material based on the desired size.

[0023] <Example of block configuration for measurement system> Figure 4 shows an example of a block configuration of a measurement system used to measure the presence or absence of discharge using the electrical and electronic equipment testing apparatus 1 according to an embodiment of the present invention. This measurement system can also be used when the electrical and electronic equipment to be tested is housed inside the electrical and electronic equipment testing apparatus 1 and an operational verification test (whether or not it malfunctions) is performed.

[0024] The measurement system comprises an electrical and electronic equipment test apparatus 1 in which a resin-based insulating material is filled in the filling area 112 of the tip portion 11; a high-voltage waveform generator 20 that generates a high voltage in the kilovolt range which is applied to the high-voltage coaxial connector 111 of the tip portion (appliance end: application end) 11 via a coaxial cable 21; an optical electric field sensor 30 installed in the internal space of the electrical and electronic equipment test apparatus 1 to detect the electric field generated in the internal space; an O / E converter (Optical signal / Electrical signal converter) 40 that converts the electric field (optical signal) detected by the optical electric field sensor 30 into an electrical signal; and a measuring instrument 50 that measures the voltage level of the electrical signal received from the O / E converter 40 via the coaxial cable 41.

[0025] When the high voltage in kilovolts generated by the high-voltage waveform generator 20 is applied to the tip (application end) 11 of the electrical and electronic equipment test device 1, the internal conductor (conductor septum) 12 propagates the high-voltage signal based on the applied voltage to the terminal 13. Since the filling area 112 of the tip 11 is filled with a resin-based insulating material, even if the distance between the internal conductor 12 and the external conductor 10 is close (close enough that a discharge would occur between the internal conductor 12 and the external conductor 10 due to the application of voltage), no discharge occurs between them. Then, an electric field is generated between the internal conductor 12 and the external conductor 10 at the position from the filling area 112 of the tip 11, which is filled with the resin-based insulating material, to the terminal 13. The optical electric field sensor 30 detects the generated electric field and supplies the optical signal to the O / E converter 40 via the optical cable 31. The O / E converter 40 converts the optical signal into an electrical signal and supplies the electrical signal to the measuring instrument 50 via the coaxial cable 41. The measuring instrument 50 measures the level of the electrical signal and outputs it to a display device (not shown).

[0026] The electric field (high electric field waveform) generated inside the electrical and electronic equipment test device 1 by the application of the above voltage is irradiated onto the electrical and electronic equipment under test. The electrical and electronic equipment is in an operating state with the power ON, and is tested (verified) to see whether it can continue to operate (operate without malfunction) in an environment irradiated with the high electric field waveform.

[0027] Figure 5 shows the discharge measurement results when the filling range 112 of the tip (device end: application end) 11 of the electrical and electronic equipment test device 1 is filled with a resin-based insulating material. Figure 5A shows an example of the waveform output from the high-voltage waveform generator 20 (high-voltage signal applied to the tip 11). Figure 5B shows the discharge measurement results when the tip 11 is not filled with resin-based insulating material, and Figure 5C shows the discharge measurement results when the filling range 112 of the tip 11 is filled with resin-based insulating material.

[0028] As shown in Figure 5B, when the tip portion 11 is not filled with a resin-based insulating material, discharge occurs from the internal conductor 12 to the external conductor 10 at the tip portion 11, causing distortion of the applied waveform from the high-voltage waveform generator 20. On the other hand, as shown in Figure 5C, when the filling range 112 of the tip portion 11 is filled with a resin-based insulating material, no discharge occurs from the internal conductor 12 to the external conductor 10 at the filling range 112 of the tip portion 11, and the applied waveform from the high-voltage waveform generator 20 remains stable and almost unchanged. Furthermore, outside the filling range 112, there is sufficient space between the internal conductor 12 and the external conductor 10, so no discharge occurs.

[0029] Thus, by filling the filling area 112 of the tip (applied end) 11 of the electrical and electronic equipment testing device 1 with a resin-based insulating material, it is possible to obtain a discharge suppression effect with an inexpensive configuration without having to seal in expensive SF6 gas (high insulating gas).

[0030] <Selection of filling material: preliminary consideration> The inventors investigated which insulating materials could suppress discharge. Figure 6 shows an example of the block configuration of the measurement system used for measuring the discharge status of the filler material (preliminary study).

[0031] The measurement system described in the preliminary study comprises a filler-mounted substrate 60 having a first electrode 61 corresponding to (simulating) an internal conductor 12 and a second electrode 62 corresponding to (simulating) an external conductor 10; a high-voltage waveform generator 20 that applies a high-voltage signal in kilovolts to a voltage application point 64 of the filler-mounted substrate 60 via a coaxial cable 21; a photoelectric sensor 30 that detects the electric field generated between the first electrode 61 and the second electrode 62; an O / E converter (Optical signal / Electrical signal converter) 40 that converts the electric field (optical signal) detected by the photoelectric field sensor 30 and supplied via the optical cable 31 into an electrical signal; and a measuring instrument 50 that measures the voltage level of the electrical signal received from the O / E converter 40 via the coaxial cable 41.

[0032] The material under consideration is filled into region 63 of the filler-mounted substrate 60. If the filling material can suppress discharge, no discharge will occur (no conductivity) between the first electrode 61 and the second electrode 62, and an electric field will be generated, which will be detected by the photoelectric field sensor 30.

[0033] Figure 7 shows the results of the material analysis (whether or not discharge occurs). Figure 7A shows the waveform when discharge occurs, and Figure 7B shows the waveform when no discharge occurs.

[0034] As shown in Figure 7A, if the material under consideration cannot suppress discharge between electrodes, the voltage measured by the measuring instrument 50 (measured voltage) initially rises, but then becomes almost zero due to the discharge. On the other hand, as shown in Figure 7B, if the material under consideration can promote discharge between electrodes, no discharge occurs, the electric field generated between electrodes can be maintained, and the measured voltage shows a predetermined value.

[0035] In the preliminary study, the presence or absence of discharge in various silicones (silicone oil, epoxy-modified silicone resin adhesive, and two-component liquid silicone, etc.) and epoxy resin adhesives in the filling area 63 was investigated, and no discharge occurred in any of the resin-based insulating materials. Therefore, these materials can be selected as resin-based insulating materials to be filled in the filling area 112 of the tip (applied end) 11 of the electrical and electronic equipment testing device 1.

[0036] <Reference values ​​for various insulating materials: Comparison with silicon> Figure 8 is a table showing reference values ​​for various insulating materials. In Figure 8, the dielectric constant of silicon is shown to be between 12 and 14, indicating that the silicon-based materials examined had dielectric constants within this range. Therefore, the inventors' intention is not that silicon-based materials with discharge suppression effects have dielectric constants within the range of 12 to 14, but rather that silicon-based materials with dielectric constants within this range are suitable. The same applies to other items (such as 1kV discharge distance, sintering temperature, and melting temperature).

[0037] Furthermore, as shown in Figure 8, the dielectric constant and conductivity of SF6 gas (high insulating gas) hardly change even with temperature changes, but in the case of silicon, the conductivity increases with rising temperature. Therefore, when conducting tests on electrical and electronic equipment by filling the tip 11 of the electrical and electronic equipment testing apparatus 1 according to this embodiment with silicon, it is necessary to control the test environment temperature so that the conductivity of silicon reaches an appropriate value (a value that ensures insulating performance).

[0038] <Summary> (i) The electrical and electronic equipment test apparatus 1 according to this embodiment is a device for housing an electrical and electronic device to be tested in its internal space and confirming its operating state when irradiated with a high electric field waveform. For this purpose, the electrical and electronic equipment test apparatus 1 comprises a voltage connector 111 to which voltage is applied via a coaxial cable 21, a housing (the outer conductor constitutes the housing) which includes the voltage connector 111 at its end and constitutes an outer conductor 10, forming an internal space, and an inner conductor 12 provided inside the housing (internal space of the device), extending from the coaxial conductor of the voltage connector 111 and constituting a conductor septum. In the electrical and electronic equipment test apparatus 1, a resin-based insulating material that suppresses the discharge of high voltage pulses is filled in a predetermined range from the end (tip) of the device, which is determined based on the applied voltage and the distance from the inner conductor 12 to the outer conductor 10. In this way, it is possible to perform operation tests on electrical and electronic equipment easily and inexpensively without using expensive highly insulating gases such as SF6 gas, without preparing large-scale equipment (facilities) for that purpose (realizing miniaturization of the test apparatus), and without generating discharge in the test environment.

[0039] (ii) As the resin-based insulating material to be filled, silicone resins or epoxy resins, such as silicone oil, epoxy-modified silicone resin adhesives, two-component liquid silicone, and epoxy resin adhesives, can be used. Since readily available materials can be used as fillers, operational tests of electrical and electronic equipment can be conducted at low cost. In addition, the resin-based insulating material may be a material whose dielectric constant at room temperature is in the range of 2 to 20.

[0040] (iii) The predetermined area (filled area 112) in which the resin-based insulating material is filled includes the area 112 from the end (tip 11 in the embodiment) to the position where the shortest distance (distance of the perpendicular) from the internal conductor 12 to the external conductor 10 is the discharge distance calculated based on the applied voltage and the discharge withstand voltage standard per 1kV of the resin-based insulating material. By insulating the area prone to discharge (filled area 112), discharge in the internal space of the electrical and electronic equipment test device 1 can be prevented, and the operation verification test of the electrical and electronic equipment can be performed accurately.

[0041] (iv) This embodiment also proposes an electrical and electronic equipment testing system comprising an electrical and electronic equipment testing device 1, a voltage waveform generator 20, and a measuring instrument 50.

[0042] (v) The technology described herein can be implemented by combinations of the components without requiring any specific device. Various types of general-purpose devices can also be added. Alternatively, a dedicated device may be constructed to perform the functions of this embodiment. Furthermore, various functions can be formed by appropriately combining the multiple components disclosed herein.

[0043] In this specification, specific examples (GTEM cells) are used for illustrative purposes (understanding the technology of the present invention), but these are not limiting in any respect. It is expected that a person with ordinary skill in the art will understand that there are many combinations of hardware, software, and firmware suitable for carrying out the technology of the present invention as needed.

[0044] Furthermore, in the embodiments described above, the control lines and information lines shown are those deemed necessary for illustrative purposes, and not all control lines and information lines are necessarily shown in the actual product. All components may be interconnected.

[0045] In addition, those with ordinary skill in the art can see from the consideration of this embodiment that other implementations of the present invention may be apparent. The specification and specific examples are typical, and the scope and spirit of the art of this disclosure are shown in the subsequent claims. [Explanation of symbols]

[0046] 1. Electrical and electronic equipment testing equipment 10. Enclosure (outer conductor) 11 Tip (applying end) 12 Internal conductor 13 Termination section 20 High-voltage waveform generator 21 Coaxial Cable 30. Photoelectric field sensor 31 Optical Cable 40 O / E converters 41 Coaxial Cable 50 measuring instruments 111 High-voltage coaxial connector 112 Filling range (filling area) 131 Termination resistor 132 RF radio wave absorber

Claims

1. An electrical and electronic equipment testing apparatus that houses electrical and electronic equipment to be tested in an internal space and tests said electrical and electronic equipment, A voltage connector to which voltage is applied via a coaxial cable, A housing that includes the aforementioned voltage connector at its end, constitutes an external conductor, and forms the internal space, The enclosure is provided with an internal conductor that extends from the coaxial conductor of the voltage connector and constitutes a conductor septum, An electrical and electronic equipment testing apparatus, wherein a resin-based insulating material that suppresses the discharge of high-voltage pulses is filled in a predetermined range from the end, determined based on the applied voltage and the distance from the inner conductor to the outer conductor.

2. In claim 1, The aforementioned resin-based insulating material is a silicone resin or an epoxy resin, in an electrical and electronic equipment testing apparatus.

3. In claim 2, The aforementioned resin-based insulating material is silicone oil, epoxy-modified silicone resin adhesive, two-component liquid silicone, or epoxy resin adhesive, in an electrical and electronic equipment testing apparatus.

4. In claim 1, The aforementioned resin-based insulating material includes a material having a dielectric constant in the range of 2 to 20 at room temperature, in an electrical and electronic equipment testing apparatus.

5. In claim 1, An electrical and electronic equipment testing apparatus, wherein the predetermined range in which the resin-based insulating material is filled includes a region from the end to a position where the shortest distance from the inner conductor to the outer conductor is the discharge distance calculated based on the applied voltage and the discharge withstand voltage standard per 1 kV of the resin-based insulating material.

6. The electrical and electronic equipment testing apparatus according to claim 1, A voltage waveform generator that generates the aforementioned voltage, A measuring instrument that measures and outputs the electric field strength generated between the inner conductor and the outer conductor when the aforementioned application is made, An electrical and electronic equipment testing system equipped with the following features.

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