Method and test device for checking the state of a vacuum interrupter unit on the basis of x-ray diagnostics, and test system

Abstract

The invention relates to a method for checking the state of a vacuum interrupter unit (1), having the steps of: - detecting X-ray radiation (8) emitted by the vacuum interrupter unit (1), - generating an image (11) of at least one radiation source (R1, R2, R3) in and / or on the vacuum interrupter unit (1) on the basis of the detected X-ray radiation (8), the X-ray radiation (8) being emitted from the at least one radiation source (R1, R2, R3), - determining at least one piece of information about the at least one radiation source (R1, R2, R3) on the basis of the generated image (11), and - checking the state of the vacuum interrupter unit (1) on the basis of the at least one piece of determined information about the at least one radiation source (R1, R2, R3). The invention also relates to a test device (6) and a test system (7).

Description

[0001] 2023PF12495

[0002] 1

[0003] Description

[0004] Method and test device for checking the condition of a vacuum interrupter unit based on X-ray diagnostics, as well as test system

[0005] Regardless of the grammatical gender of a particular term, persons with male, female or other gender identities are included.

[0006] The present invention relates to a method for checking the condition of a vacuum interrupter unit.

[0007] Furthermore, the invention relates to a test device for checking the condition of a vacuum interrupter unit.

[0008] Furthermore, the invention relates to a test system with at least one vacuum interrupter unit and at least one test device.

[0009] Vacuum interrupter units are used, for example, in high-voltage circuit breakers. High voltage, as defined by the standard, is an alternating voltage greater than 1000 V, or a direct voltage greater than 1500 V.

[0010] A vacuum interrupter unit can be, for example, a vacuum switch. Specifically, multiple vacuum interrupters can be used in a vacuum switchgear assembly.

[0011] Vacuum interrupter units are electrical components for switching electrical currents in, for example, a gas-free glass, ceramic, or metal housing.

[0012] A high-voltage circuit breaker or power switch is basically an electrical switching device that serves to protect against high voltage in electrical power supply systems. 2023PF12495

[0013] 2. Provision, to switch an electric current in a line of the power supply network.

[0014] During the development and operation of the vacuum interrupter unit, the switching processes and, in particular, the applied voltages inevitably cause electron emission if the contacts of the vacuum interrupter unit or other components of the unit exhibit a potential difference. Such emission leads to the undesirable effect of the vacuum interrupter unit emitting X-rays. The intensity of this radiation varies considerably between otherwise identical vacuum interrupter units. In particular, the emission of electrons can be considered a source of interference. Furthermore, the intensity of the X-ray radiation emitted by a vacuum interrupter unit can change over its lifetime.

[0015] Generally, the intensity of the interfering radiation is measured and recorded integrally. If necessary, radiation emanating from the vacuum interrupter unit is measured in various directions. However, this information does not allow us to determine the source of the X-rays or other radiation, and consequently, it does not reveal the cause or the problem with the vacuum interrupter unit.

[0016] Currently, integral dose rates of X-rays are recorded, measuring the portion of the radiation directed towards a detector. These measurements are sometimes performed with the detector at different locations. This only reveals a directional characteristic of the radiation distribution; the location of the radiation origin is not determined. In the past, measurements were also conducted using a non-positionally resolved detector, which was moved along an axis parallel to the rotation axis of the vacuum interrupter unit. 2023PF12495

[0017] 3

[0018] Therefore, one object of the present invention is to be able to check the condition of at least one vacuum interrupter unit more efficiently by detecting potential faults more reliably.

[0019] This task is solved by a method, a testing device, and a test system according to the independent patent claims. Meaningful further developments arise from the dependent patent claims.

[0020] One aspect of the invention relates to a method for checking the condition of a vacuum interrupter unit by,

[0021] - Detection of X-ray radiation emitted by the vacuum interrupter unit,

[0022] - Generating an image of at least one radiation source in and / or on the vacuum interrupter unit based on the detected X-ray radiation, wherein the X-ray radiation is emitted from the at least one radiation source,

[0023] - Determining at least one piece of information about the at least one radiation source based on the generated image, and

[0024] - Checking the condition of the vacuum interrupter unit based on at least one specific piece of information about at least one radiation source.

[0025] The proposed method allows for an efficient inspection and assessment of the condition of the vacuum interrupter unit. By capturing the X-rays emitted by the vacuum interrupter unit, potential defects or faults in and / or on the unit can be identified using image processing and analysis. This information can be represented. Crucially, the inspection of the vacuum interrupter unit's condition can be performed without direct intervention, i.e., without direct contact or physical touch. Thus, the setup for inspecting and measuring the condition of the vacuum interrupter unit can be optimized. 2023PF12495

[0026] 4. It can be carried out more easily, in a more space-saving and cost-effective manner.

[0027] Information about at least one radiation source can represent location information about an actual defect.

[0028] For example, a potential difference may exist between two electrical components of the vacuum interrupter unit. Such a potential difference can lead to a locally increased electric field strength. This locally increased electric field strength may also occur at a defect in the vacuum interrupter unit. The increased electric field strength can lead to electron emission. If the emitted electrons encounter obstacles and are thereby slowed down, bremsstrahlung can be emitted. This emitted bremsstrahlung is X-ray radiation.

[0029] By capturing and evaluating this X-ray radiation using image processing, the radiation sources can be detected or identified.

[0030] For example, reasons for changes in the functionality of the vacuum interrupter unit can be better determined by using X-ray diagnostics and, in particular, by pinpointing the location of the changes.

[0031] By examining the condition using the detected X-rays, the area of ​​the defect or the area affected by electron emission can be identified early on. Appropriate repair or replacement measures for the vacuum interrupter unit can then be carried out accordingly.

[0032] The proposed method allows for the local determination of the X-ray source points, i.e., the radiation sources, 2023PF12495

[0033] 5 within the vacuum interrupter unit can be determined with high accuracy. For example, the local determination can be performed with an accuracy of 1 mm. Furthermore, spectral properties of the X-rays can be used to obtain further information about their origin. Additionally, temporal intensity fluctuations can be averaged equally for all X-ray source points by capturing them simultaneously, i.e., in a single shot. Slow scanning would lead to inaccurate results. Therefore, a traversing mechanism is unnecessary.

[0034] The proposed method can be used or carried out especially during development, testing, laboratory tests or in the field.

[0035] Based on the detected X-rays, an image of at least one radiation source can be generated. From this image, corresponding information regarding the radiation source in and / or on the vacuum interrupter unit can then be determined or ascertained using image processing or other processing steps.

[0036] Based on the detected X-ray radiation, a partial area of ​​the vacuum interrupter unit, where electrons strike due to the potential difference, can be imaged. In other words, a complete image of the vacuum interrupter unit is not generated; rather, the "luminous" or "radiating" points, i.e., radiation points, are made visible in the image.

[0037] The generated image is not a "shadow," contour, or outline of the vacuum interrupter unit produced by an external X-ray source. Rather, the generated image is a photograph of a body that itself emits light. Therefore, no external 2023PF12495 is used.

[0038] 6

[0039] A radiation source is required to generate the image, since the vacuum interrupter unit itself serves as the light source or radiation source in order to generate a corresponding image or representation.

[0040] For example, the proposed method could be a computer-implemented method.

[0041] In one embodiment, it is provided that the position of at least one radiation source is determined based on the generated image, whereby the position of the at least one radiation source is taken into account when determining the at least one piece of information about the at least one radiation source. The generated image thus provides a picture in which, above all, the radiation sources are recognizable or detectable. From the image, the position of at least one radiation source or multiple radiation sources can be determined, for example, using image processing or an imaging technique. This allows conclusions to be drawn about where potential defects in and / or on the vacuum interrupter unit are located.Thus, with information from at least one radiation source, which may be location information, a reliable check of the condition of the vacuum interrupter unit can be carried out.

[0042] Additionally or alternatively, depending on the generated image, an area of ​​the at least one radiation source can be determined or detected, so that this area can, in turn, be considered when determining the information about the at least one radiation source. With the help of the determined information about the at least one radiation source, the causes and / or problem areas of the vacuum interrupter unit can be analyzed. In particular, with the help of this information, a location of radiation generation can be identified, so that on 2023PF12495

[0043] 7. The problem areas of the vacuum interrupter unit can either be closed directly or, in particular, precisely calculated backwards. This allows, for example, a targeted problem solution regarding the vacuum interrupter unit. With the help of this specific information, a spatially resolved investigation or a review of systematic problems of vacuum interrupter units can also be carried out. This can be used to obtain more comprehensive information regarding a design and / or a switching system concerning the vacuum interrupter unit. Above all, this specific information can be advantageously considered in the repair, development, and / or production of vacuum interrupter units.

[0044] In one embodiment, at least one pixel in the generated image represents the position of at least one radiation source, and the position of the at least one radiation source is determined based on this pixel. During the acquisition and generation of the image, the image is created using pixels based on the detected X-rays. At least one pixel is generated on the image based on the radiation source that emitted the X-rays. Thus, the position or location of the radiation source can be determined based on this pixel. For example, one pixel or image area can be present in the image for each radiation source located in and / or on the vacuum interrupter unit.Thus, an analysis regarding the radiation sources can be made based on the pixel or multiple pixels.

[0045] In one embodiment, it is provided that a potential defect in the vacuum interrupter unit is characterized using at least one specific piece of information from at least one radiation source. The radiation source is, in particular, such an area or point in 2023PF12495.

[0046] 8 and / or at the vacuum interrupter unit, which generates X-rays based on field electron emission. This X-ray emission is generated in specific areas only when a potential difference exists between components of the vacuum interrupter unit. This potential difference can be the cause of the electron emission. Based on the information from the at least one radiation source generated from the image, a potential defect or faulty areas in and / or at the vacuum interrupter unit can be detected or identified. In other words, a fault analysis of the vacuum interrupter unit can be performed based on the generated image and, in particular, on the specific information from the at least one radiation source.

[0047] In one embodiment, it is provided that the at least one potential defect is located based on particle tracing starting from the at least one radiation source. In other words, the starting point, namely the defect, can be located using particle tracing from the location of the X-ray emission.

[0048] In one embodiment, it is provided that the image is generated on the basis of a photographic element or a flat-panel detector, wherein the X-ray radiation at least partially strikes the photographic element or the flat-panel detector. In particular, the detection of the X-ray radiation can be carried out such that the X-ray radiation at least partially strikes the photographic element or the flat-panel detector. The image can be generated with the aid of the photographic element or the flat-panel detector. In particular, an image plane or projection plane of the generated image is located in the area of ​​the photographic element or the flat-panel detector. The photographic element can, for example, be a photosensitive material, such as an X-ray film, 2023PF12495

[0049] 9. The flat panel detector can be referred to simply as a flat panel detector.

[0050] With the aid of a flat-panel detector, images can be generated in digital form. In other words, the flat-panel detector can be a solid-state detector or a flat X-ray detector. This allows the image to be generated digitally for evaluation and analysis. The X-rays are primarily detected when they strike the photographic element or the flat-panel detector.

[0051] In one embodiment, it is provided that an aperture, arranged between the vacuum interrupter unit and the photographic element or between the vacuum interrupter unit and the flat-panel detector, influences the X-ray radiation incident on the photographic element or the flat-panel detector. The aperture can be an optical aperture, in particular a pinhole aperture. The aperture can be designed, for example, particularly in its shape and size, such that a required imaging resolution can be provided.

[0052] The aperture and the photographic element or the flat-panel detector capture the X-rays and generate the image, similar to a pinhole camera or based on the same principle. Thus, the X-rays can be captured or recorded according to a simple principle, allowing a desired image with a corresponding resolution to be produced.

[0053] In one embodiment, it is provided that a distance between an aperture plane relating to the aperture and an image plane relating to the generated image is adjusted so that the image resolution of the image is changed. 2023PF12495

[0054] 10. In other words, different magnifications, and thus different resolutions, can be achieved by varying the ratio of the distances between the aperture plane and the image plane to the vacuum interrupter unit. This allows the respective planes to be selected appropriately for checking the condition of the vacuum interrupter unit.

[0055] For example, a change in the distance of a particular plane can be carried out automatically using an adjustment mechanism.

[0056] In one embodiment, a filter element arranged on the aperture is used to modify the intensity of the X-ray radiation striking the photographic element or the flat-panel detector, depending on the respective spectrum. The filter element can be positioned accordingly on the aperture. This filter element allows for a spectral modification of the intensity.

[0057] Another aspect of the invention relates to a test device for checking the condition of a vacuum interrupter unit, comprising

[0058] - a detection unit for detecting X-rays emitted by the vacuum interrupter unit and for generating an image of at least one radiation source in and / or on the vacuum interrupter unit based on the detected X-rays, wherein the X-rays are emitted from the at least one radiation source, and

[0059] - an evaluation unit for determining at least one piece of information about the at least one radiation source based on the generated image, wherein

[0060] - the evaluation unit is designed to check the state of the vacuum interrupter unit based on at least one specific piece of information about at least one radiation source. 2023PF12495

[0061] 11

[0062] With the aid of the testing device, which may at least partially be an image processing system, the condition of the vacuum interrupter unit can be automatically checked or assessed.

[0063] With the aid of the proposed test device, the procedure of the aforementioned aspect can be carried out. In particular, the previously described procedure or an advantageous further development of the previously described procedure can be carried out with the test device just described.

[0064] The test device can be designed as an electrical, electromechanical and / or electronic system.

[0065] The X-rays can be detected using the detection unit. With the aid of the detection unit and / or an image generation unit, an image can be generated based on the detected X-rays. The generated image can then be transmitted to or provided to the electronic evaluation unit, which may be a processing unit. The evaluation unit primarily processes the generated image to identify or detect potential defects in the vacuum interrupter unit. For this purpose, the image is evaluated accordingly so that radiation sources can be identified. These radiation sources are caused by corresponding defects in the vacuum interrupter unit.

[0066] The radiation source can be located spatially close to or further away from a causal defect where electron emission occurs, within and / or on the vacuum interrupter unit. 2023PF12495

[0067] 12

[0068] With the help of the test device, a system-side evaluation or analysis of the vacuum interrupter unit can be carried out.

[0069] In one embodiment of this further aspect, the detection unit comprises a photographic element or a flat-panel detector. The X-rays detected by the unit can strike the photographic element or the flat-panel detector. The photographic element can be a photosensitive material. Thus, the image can be generated with the aid of the photographic element or the flat-panel detector. The image plane or projection plane of the generated image is located in the area of ​​the flat-panel detector or the photographic element.

[0070] In one embodiment of this further aspect, the detection unit is provided with an aperture located between the vacuum interrupter unit and the photographic element, or between the vacuum interrupter unit and the flat-panel detector. The aperture allows the X-ray radiation incident on the photographic element or the flat-panel detector to be influenced. In particular, the resolution of the generated image can be influenced by means of the aperture. The aperture can be designed in different shapes and sizes, depending on the required resolution of the generated image. Above all, the aperture can be selected or designed depending on the required resolution and the available radiation intensity of the X-ray radiation.

[0071] In one embodiment of this further aspect, the aperture is designed as a pinhole or slit aperture. With the aid of a pinhole aperture, an image can be produced even without a lens. Thus, with the aid of the pinhole aperture 2023PF12495

[0072] 13. The image generation is similar to the principle of a pinhole camera.

[0073] Since the aperture is used for X-rays, it can be made of metal with a high atomic number, such as lead. When using a slit aperture, spatial resolution in one direction can be completely disregarded, depending on the circumstances. In this case, the slit aperture is positioned in the corresponding direction. Thus, image generation can be carried out as needed.

[0074] Other designs or configurations of apertures are also conceivable or usable.

[0075] In one embodiment of this further aspect, it is provided that the shape and / or dimensions of the aperture are designed depending on the radiation intensity with respect to the X-rays and / or the image resolution requirement with respect to the imaging. For example, the aperture can be selected such that different resolutions result for different directions with respect to the X-rays. In particular, with the aid of the image generation unit, the distance between an aperture plane with respect to the aperture and an image plane with respect to the generated image can be changed so that the desired image resolution can be set.

[0076] In one embodiment of this further aspect, the detection unit is provided with a filter element arranged on the aperture, wherein the filter element is designed to change the intensity of the X-rays striking the photographic element or the flat-panel detector. In other words, a filter attachment can be placed in front of the aperture, which affects the photon energy differently with respect to the X-ray radiation and thus, by changing the intensity on the photographic element or the flat-panel detector, allows further conclusions to be drawn about the origin of the X-ray radiation. 2023PF12495

[0077] 14

[0078] This means that if the signal of an X-ray point is attenuated to a relatively large extent, the radiation-generating electrons originate from an electrode whose voltage difference to the other electrode, on which the X-ray source points are located, is smaller than the corresponding voltage differences of the other X-ray source points whose signal is attenuated less. Thus, a selection of the radiation sources can be made.

[0079] Another aspect of the invention relates to a test system with at least one vacuum interrupter unit and at least one test device according to the previous aspect. Thus, the test device described earlier can be used for the test system. With the aid of the test system or test arrangement, the at least one vacuum interrupter unit or several vacuum interrupter units, vacuum switches, or vacuum switching systems can be tested. In particular, the test system enables automated verification of the condition of a vacuum interrupter unit.

[0080] The test system may be a test setup.

[0081] For example, the test system can include one or more mechanical devices so that the vacuum interrupter unit can be positioned at a distance from the test fixture, primarily to enable the detection of X-rays passing through the test fixture. The test system allows for efficient verification of the vacuum interrupter unit.

[0082] For example, the test system can be used for laboratory testing of vacuum interrupter units. The test system can be used not only in a testing laboratory but also in the field. 2023PF12495

[0083] 15

[0084] For use cases or application situations that may arise during the procedure and are not explicitly described here, it may be provided that, according to the procedure, an error message and / or a request for user feedback is issued and / or a default setting and / or a predetermined initial state is set.

[0085] Advantageous embodiments of one aspect are to be regarded as advantageous embodiments of all other aspects. The reverse is also true.

[0086] The invention also includes further developments of the inventive testing device and the inventive test system, which have features already described in connection with the further developments of the inventive method. For this reason, the corresponding further developments of the inventive testing device and the inventive test system are not described again here.

[0087] The invention also includes combinations of the features of the described embodiments.

[0088] The exemplary embodiments described below are preferred embodiments of the invention. In these embodiments, the described components each represent individual features of the invention, which can be considered independently of one another and further develop the invention independently. Each of these features can therefore be considered part of the invention, either individually or in a combination other than that shown. Furthermore, the described embodiments can also be supplemented by other features of the invention already described.

[0089] In the figures, functionally equivalent elements are each provided with the same reference symbols. 2023PF12495

[0090] 16

[0091] The following figures illustrate this in:

[0092] FIG 1 shows a schematic representation of a test system comprising a vacuum interrupter unit and a test device, wherein the test device can be used to check the condition of the vacuum interrupter unit; and

[0093] FIG 2 shows a schematic sequence of a verification process of the vacuum interrupter unit from FIG 1, where spatially resolved X-ray diagnostics are used.

[0094] FIG. 1 schematically shows a vacuum interrupter unit 1. For example, the vacuum interrupter unit 1 is a component of a vacuum switchgear, which may have several vacuum interrupter units.

[0095] The vacuum interrupter unit 1 can, for example, be used as a circuit breaker. It can be used in high-voltage applications with voltages greater than 72 kV.

[0096] Optionally, a first voltage terminal 2 can be electrically connected to a second voltage terminal 3 using the vacuum interrupter unit 1. These voltage terminals 2 and 3 can be high-voltage terminals. To establish or disconnect an electrical connection between the high-voltage terminals 2 and 3, the vacuum interrupter unit 1 has a first electrical contact element 4 and a second electrical contact element 5 spaced apart from it. The two electrical contact elements 4 and 5 can be moved towards each other by a mechanical switching movement to establish an electrical connection, or at least a 2023PF12495

[0097] 17 of these electrical contact elements 4 , 5 can in turn be moved away from the other to create an electrical separation .

[0098] Due to the application areas of the vacuum interrupter unit 1, and especially the high voltages that can be switched with the vacuum interrupter unit 1, significant potential differences can occur between components of the vacuum interrupter unit 1. A potential difference, i.e., a voltage difference, can occur between individual components or between a component and one of the electrical contact elements 4, 5. This potential difference can cause or result in field electron emission, i.e., the emission of electrons. This, in turn, can lead to the generation of X-rays.

[0099] Excessive field strengths can occur due to a potential difference or multiple potential differences in and / or at the vacuum interrupter unit 1. These can be problematic with regard to flashover probability and / or dielectric strength. The proposed method can be used to achieve a high probability of detection in this respect.

[0100] It is important that such weaknesses or defects in and / or on the vacuum interrupter unit 1 can be identified, and in particular detected at an early stage. For this purpose, a test device 6 can be used, for example. With this test device 6, the condition and thus the functionality of the vacuum interrupter unit 1 can be checked. The test device 6 and the vacuum interrupter unit 1 constitute a test system 7. The vacuum interrupter unit 1 and the test device 6 can be arranged or positioned relative to each other in such a way that the test device 6 can be used to test the 2023PF12495

[0101] 18

[0102] The condition of the vacuum interrupter unit 1 can be checked or assessed. In order to carry out a non-destructive inspection and, above all, to avoid direct contact or touching of the vacuum interrupter unit 1, the condition is checked based on the X-ray radiation emitted by the vacuum interrupter unit 1 8.

[0103] As already mentioned, X-rays 8 are emitted to a certain extent based on existing potential differences within the vacuum interrupter unit 1. Thus, conclusions can be drawn about potential defects or weaknesses in and / or on the vacuum interrupter unit 1 based on the X-rays 8.

[0104] The damaged area, i.e., the defect or defects, can be determined by working backwards or using other calculation methods. For example, the defect may be in a different component than the one that emitted the radiation.

[0105] With the aid of the test device 6 and in particular with a detection unit 9 of the test device 6, the X-ray radiation 8 can be detected or captured at least partially, in particular completely.

[0106] In other words, a mechanical adjustment mechanism can be used to position the test device 6 so that it is in the path of the X-ray beam 8. The adjustment mechanism can be advantageous if the radiation source is located on the side facing away from the apparatus. The adjustment mechanism (as well as a second or additional system) can also be advantageous for obtaining further information (2D or 3D information). For example, depth information can be obtained. 2023PF12495

[0107] 19

[0108] It is also conceivable that no adjustment mechanism is required to represent the entire tube or an entire vacuum interrupter unit.

[0109] Based on the detected X-ray radiation 8, an image 11, or rather a photograph, an X-ray image, or a photograph can optionally be generated using an image generation unit 10 of the test device 6. Image 11 is specifically not a silhouette or an X-ray image of the vacuum interrupter unit 1, which is exposed or irradiated by means of an external X-ray source. Rather, image 11 corresponds to a photograph of a body that itself emits light. In other words, image generation can be performed here, whereby the "light source" or radiation source is the object to be imaged, i.e., the vacuum interrupter unit 1 itself. Based on this generated image 11, image processing, image evaluation, and / or image analysis can be performed, for example, using an electronic evaluation unit 12 of the test device 6.This allows information about at least one radiation source RI, R2, R3 to be determined. The radiation source RI, R2, R3 can be an X-ray source point or X-ray source area from which the X-ray radiation 8 is emitted. The radiation sources RI, R2, R3 are represented in Figure 11 by pixels Bl, B2, B3. As shown in Figure 1, and as is known in imaging technology and camera technology, Figure 11 is initially upside down. Thus, the pixels Bl, B2, B3 allow conclusions to be drawn about the location or position of the radiation source RI, R2, R3.

[0110] Specifically, the test device 6 can be used to determine the local location of the X-ray source points, i.e., the radiation sources 2023PF12495

[0111] 20

[0112] Measurements of the positions of the X-ray source points RI, R2, and R3 within the vacuum interrupter unit 1 can be performed with high accuracy. Furthermore, the spectral properties of the X-ray radiation 8 can be used to obtain additional information about the origin of the X-rays. Temporal intensity fluctuations are averaged equally for all X-ray source points, as they are captured simultaneously "in one shot." Thus, more than one piece of information for condition monitoring can be obtained from two-dimensional images. In other words, by projecting the source points, i.e., the radiation sources RI, R2, and R3, their positions on or within the vacuum interrupter unit 1 can be determined.

[0113] In FIG. 1, potential defects Fl, F2, and F3 are shown, for example. These defects can cause increases in field strength, resulting in corresponding electric fields. The respective potential differences give rise to corresponding electric fields. For example, defect Fl is the cause of radiation source RI, defect F2 is the cause of radiation source R2, and defect F3 is the cause of radiation source R3. Due to electron emission occurring in the defect regions, the radiation sources can originate at any position in and / or on the vacuum interrupter unit 1. In FIG. 11, for example, pixel Bl represents radiation source RI, pixel B2 represents radiation source R2, and pixel B3 represents radiation source R3.

[0114] Thus, with the aid of the test device 6, spatially resolved X-ray diagnostics for vacuum interrupters or vacuum interrupter units and corresponding vacuum switchgear can be provided, and in particular carried out. Since it is essentially only possible to reflect or refract X-rays with very great effort, lens and mirror systems are available for the purpose presented here (2023PF12495).

[0115] 21

[0116] Image generation is not available. Instead, an aperture 13 is used. This can be part of the image generation unit 10 or the detection unit 9. By using the aperture 13, image generation can be equivalent to image generation using a pinhole camera. The aperture 13 can be designed differently in shape and size. In particular, it can be selected depending on the required resolution with respect to image 11 and the available radiation intensity of the X-ray radiation 8. In particular, the aperture 13 can be selected such that different resolutions result for different directions, especially the spatial direction.

[0117] Furthermore, the detection unit 9 can include a photographic element 14. This photographic element 14 can be, for example, an X-ray film or another photosensitive material. A flat-panel detector can also be used instead of the photographic element 14. In particular, the photographic element 14 can be designed as a photosensitive screen. As shown by way of example in FIG. 1, the aperture 13 is arranged between the vacuum interrupter unit 1 and the photographic element 14. An image plane or projection plane of Figure 11 corresponds to a principal extension plane of the photographic element 14. A principal extension plane of the aperture 13 represents an aperture plane.

[0118] For example, the aperture 13 can be designed as a pinhole or slit aperture. A distance 15 between the aperture plane, i.e., the aperture 13, and the image plane, i.e., the photographic element 14, and thus a ratio of the distances of the two components to the vacuum interrupter unit 1, can be changed. For this purpose, the test device 6 can have a corresponding adjustment device. Different magnifications and thus also different resolutions with respect to Figure 11 can be achieved via the distance 15. 2023PF12495

[0119] 22

[0120] For example, when using a slit aperture as aperture 13, the spatial resolution can be adjusted with regard to image generation.

[0121] For example, aperture 13 can have a circular aperture.

[0122] Furthermore, the test device 6 can be designed to generate several recordings or images of the vacuum interrupter unit 1 from different directions or perspectives, thereby achieving a spatial resolution of the X-ray source points.

[0123] X-ray radiation 8 is characterized not only by its intensity but also by its spectrum. This radiation spectrum depends on the potential difference traversed by the radiation-generating electrons and thus on the potential difference of the electrodes involved. Furthermore, a filter attachment, i.e., a filter element 16, can be arranged, for example, on the aperture 13. With this filter attachment, which may affect the photon energy of the X-ray radiation 8 in different ways, relative intensity changes can be induced on the photosensitive screen, allowing further conclusions to be drawn regarding the origin of the radiation.This means that if the signal of an X-ray source point is attenuated to a greater extent, the radiation-generating electrons originate from an electrode whose voltage difference to the other electrode, on which the X-ray source points are located, is smaller than the corresponding voltage differences of the other X-ray source points, whose signals are attenuated less. Thus, a more precise spatial resolution and therefore a position determination with respect to the radiation source RI, R2, R3 can be achieved. This is accomplished by using a light-sensitive detector or film, with the 2023PF12495 unchanged.

[0124] 23

[0125] By positioning the X-ray pinhole camera, i.e., the acquisition unit 9, a very simple assignment of the geometry of the vacuum interrupter unit 1 to the X-ray images can be made.

[0126] In the following FIG 2, an exemplary procedure for checking the condition of the vacuum interrupter unit 1 is explained, and thus an example of spatially resolved X-ray diagnostics of the vacuum interrupter unit 1 is explained.

[0127] In a first step S 1, the vacuum interrupter unit can

[0128] I and the test device 6 are arranged or positioned relative to each other, so that the test system 7 is present here.

[0129] In a subsequent optional step S2, a voltage can be applied to the vacuum interrupter unit 1 and, in particular, to the voltage terminals 2 and 3. If a defect is present, then a (positive) potential difference exists between the component with the defect and another component. This defect can be detected based on the detected X-ray radiation.

[0130] In a subsequent step S3, the X-ray radiation 8 can now be detected with the aid of the test device 6. For this purpose, the detection unit 9 or an X-ray pinhole camera or another X-ray detecting unit can be used.

[0131] In a subsequent step S4, the figure 11 can be generated based on the detected X-ray radiation 8, which could be influenced accordingly by means of the filter element 16 and / or the aperture 13.

[0132] In a subsequent step S5, the generated image can be

[0133] II. can be analyzed or evaluated using image processing or image processing algorithms, 2023PF12495

[0134] 24 so that, primarily based on the recorded or determined pixels Bl, B2, B3, conclusions can be drawn about the respective location of the radiation sources RI, R2, R3. Thus, the condition check can be carried out here by identifying potential defects based on the locally determined radiation sources RI, R2, R3.

[0135] 2023PF12495

[0136] 25

[0137] Reference character list

[0138] vacuum interrupter unit

[0139] 2 first voltage connection

[0140] 3 second voltage connection

[0141] 4 first electrical contact element

[0142] 5 second electrical contact element

[0143] 6 Test device

[0144] 7 Test system

[0145] 8 X-rays

[0146] 9 recording unit

[0147] 10 Image generation unit

[0148] Figure 11

[0149] 12 electronic evaluation units

[0150] 13 Aperture

[0151] 14 photographic elements

[0152] 15 distance

[0153] 16 filter elements

[0154] Bl - B3 pixels

[0155] Fl - F3 electron emission points

[0156] RI - R3 radiation sources

[0157] S1 to S5 steps

Claims

2023PF12495 26 Patent claims 1. Method for checking the condition of a vacuum interrupter unit (1) , characterized by, - Detection of X-ray radiation (8) emitted by the vacuum interrupter unit (1) , - Generating an image (11) of at least one radiation source (RI, R2, R3) in and / or on the vacuum interrupter unit (1) based on the detected X-ray radiation (8) , wherein the X-ray radiation (8) is emitted from the at least one radiation source (RI, R2, R3), - Determine at least one piece of information about the at least one radiation source (RI, R2, R3) based on the generated image (11) , and - Checking the condition of the vacuum interrupter unit (1) based on at least one specific piece of information about the at least one radiation source (RI, R2, R3) .

2. Method according to claim 1, wherein a position of the at least one radiation source (RI, R2, R3) is determined on the basis of the generated image (11), wherein the position of the at least one radiation source (RI, R2, R3) is taken into account when determining the at least one piece of information about the at least one radiation source (RI, R2, R3).

3. Method according to claim 2, wherein at least one pixel (Bl, B2, B3) in the generated image (11) represents the position of the at least one radiation source (RI, R2, R3), and wherein the position of the at least one radiation source (RI, R2, R3) is determined on the basis of the at least one pixel (Bl, B2, B3).

4. Method according to one of the preceding claims, wherein a potential defect of the vacuum interrupter unit (1) is characterized by the at least one specific piece of information about the at least one radiation source (RI, R2, R3). 2023PF12495 27 5. Method according to claim 4, wherein the at least one potential defect is localized on the basis of particle tracing starting from the at least one radiation source (RI, R2, R3).

6. Method according to one of the preceding claims, wherein the image (11) is generated on the basis of a photographic element (14) or a flat-panel detector, wherein the X-ray radiation (8) at least partially hits the photographic element (14) or the flat-panel detector.

7. Method according to claim 6, wherein an aperture (13) is arranged between the vacuum interrupter unit (1) and the photographic element (14) or between the vacuum interrupter unit (1) and the flat-panel detector, which influences the X-ray radiation (8) incident on the photographic element (14) or on the flat-panel detector.

8. Method according to claim 7, wherein a distance (15) between an aperture plane relating to the aperture (13) and an image plane relating to the generated image (11) is adjusted such that an image resolution of the image (11) is changed.

9. Method according to claim 7 or 8, wherein a filter element (16) arranged on the aperture (13) changes the intensity of the X-ray radiation (8) striking the photographic element (14) or the flat-panel detector as a function of the respective spectrum.

10. Test device (6) for checking the condition of a vacuum interrupter unit (1) , characterized by, - a detection unit (9) for detecting X-ray radiation (8) emitted by the vacuum interrupter unit (1) and for generating an image (11) of at least one radiation source (RI, R2, R3) in and / or on the vacuum interrupter 2023PF12495 28 unit (1) based on the detected X-ray radiation (8) , wherein the X-ray radiation (8) is emitted from the at least one radiation source (RI, R2, R3), and - an evaluation unit (12) for determining at least one piece of information about the at least one radiation source (RI, R2, R3) on the basis of the generated image (11) , wherein - the evaluation unit (12) is designed to check the state of the vacuum interrupter unit (1) on the basis of at least one specific piece of information about the at least one radiation source (RI, R2, R3).

11. Test device (6) according to claim 10, wherein the detection unit (9) comprises a photographic element (14) or a flat panel detector.

12. Test device according to claim 11, wherein the detection unit (9) has an aperture (13) which is arranged between the vacuum interrupter unit (1) and the photographic element (14) or between the vacuum interrupter unit (1) and the flat panel detector, wherein the aperture (13) can influence the X-ray radiation (8) incident on the photographic element (14) or on the flat panel detector.

13. Test device (6) according to claim 12, wherein the aperture (13) is designed as a pinhole aperture, iris aperture, aperture aperture or slit aperture.

14. Test device (6) according to claim 12 or 13, wherein a shape and / or a dimension of the aperture (13) is designed depending on a radiation intensity relating to the X-ray radiation (8) and / or an image resolution requirement relating to the imaging (11).

15. Test device (6) according to claim 12, 13 or 14, wherein the detection unit (9) has a filter element (16) arranged on the aperture (13), wherein the filter element (16) is configured to determine the intensity of the light applied to the photographic image. 2023PF12495 29 Element (14) or to change the X-ray radiation (8) incident on the flat-panel detector depending on the respective spectrum.

16. Test system (7) with at least one vacuum interrupter unit (1) and at least one test device (6) according to one of the preceding claims 10 to 15.

Images