An x-ray diffractometer sample stage for bulk solid samples

Abstract

An X-ray diffractometer sample stage for bulk solid samples is disclosed. In use, the base is moved to the designated position, and the bulk solid sample is placed on the sample stage within the sample placement groove and secured with modeling clay. Since there are three wedge mechanisms arranged in a triangle, based on the principle that three points not on the same straight line can define a plane, the three wedge mechanisms can support the sample stage. Furthermore, because the wedge mechanisms drive the bottom of the sample stage and can convert horizontal movement into vertical movement, the corresponding parts of the sample stage can be raised or lowered by the wedge mechanisms, thereby adjusting the height and angle of the sample stage. This eliminates the need for cutting or processing the bulk solid sample, simplifying operation. When the sample quantity is small, there is no need to lay a large amount of modeling clay on the sample stage, making it more convenient to use. In summary, by using this sample stage, the depth and angle of the sample stage can be adjusted.

Description

Technical Field

[0001] This utility model relates to the field of experimental instrument technology, specifically to an X-ray diffractometer sample stage for bulk solid samples. Background Technology

[0002] X-ray diffractometers are the most effective and widely used tool for studying the microstructure of matter. They utilize the principle of diffraction to perform phase analysis, qualitative analysis, and other tasks. The Bruker D8-Advance series diffractometer uses three contact points on the goniometer sample holder to contact the reference plane of the sample stage, thereby determining the sample test surface. The sample stage does not rotate during the test.

[0003] Currently, in the development of innovative drugs, new food processing technologies and processes, and micro / nano functional materials, the yield of many synthesized compounds is very low due to limitations such as experimental conditions and synthesis methods. The final sample amount obtained is only tens of milligrams or even less. X-ray diffraction tests using sample stages provided by manufacturers yield unsatisfactory results, and sometimes tests cannot even be performed due to insufficient sample volume, which seriously restricts the progress of new drug, new process, and new material development.

[0004] Currently, most X-ray diffractometers on the market use a fixed trough structure for holding the sample. For testing bulk solid samples, the common practice is to lay modeling clay at the bottom of the trough to fix the sample. However, existing diffractometer sample stages have many drawbacks. Specifically, they lack depth and angle adjustment functions, often requiring bulk solid samples to be cut and processed, and some samples even require grinding and polishing. Furthermore, when the sample volume is small, a large amount of modeling clay needs to be laid, resulting in significant waste during X-ray diffraction experiments. Utility Model Content

[0005] (a) Technical problems to be solved

[0006] To address the above problems, this invention provides an X-ray diffractometer sample stage for bulk solid samples, with adjustable depth and angle of the stage.

[0007] (II) Technical Solution

[0008] To achieve the above objectives, this utility model provides the following technical solution:

[0009] An X-ray diffractometer sample stage for bulk solid samples, comprising:

[0010] A base, the top of which is provided with a sample placement groove for holding blocky solid samples;

[0011] A sample placement stage is slidably connected within the sample placement groove to support powdery samples. The distance between the top of the sample placement stage and the top of the sample placement groove is the accommodating depth of the blocky solid sample.

[0012] Three wedge mechanisms are provided, all of which are mounted on the base and drive the bottom of the sample placement stage. The three wedge mechanisms are arranged in a triangle. The wedge mechanisms can convert horizontal movement into vertical movement and drive the sample placement stage to move up and down along the direction of the sample placement groove, thereby adjusting the accommodating depth and the tilt angle of the sample placement stage.

[0013] Preferably, the base, the sample placement slot, and the sample placement platform are all cylindrical and coaxially arranged, and the base has chamfered edges.

[0014] Preferably, the upper part of the sample placement stage and the base are made of either plexiglass or quartz glass.

[0015] Preferably, the bottom of the sample placement groove is provided with three first sliding grooves and three second sliding grooves corresponding one-to-one with the three wedge mechanisms. The three first sliding grooves are horizontally arranged, and the three second sliding grooves are vertically arranged. The wedge mechanism includes:

[0016] An adjustment component, which is horizontally mounted on the base and corresponding to the first sliding groove;

[0017] The movable component has its top abutting against the sample placement stage, its bottom being driven and connected to the adjustment assembly, and its side being slidably connected to the second slide groove.

[0018] Preferably, the side of the base is provided with first threaded holes that respectively connect to the three first sliding grooves, the extending direction of the first threaded holes being consistent with the extending direction of the first sliding grooves, and the adjustment component includes:

[0019] An adjusting stud, which engages in the first threaded hole;

[0020] The slider is slidably connected in the first groove, and one end is rotatably connected to the adjusting stud, so that when the adjusting stud rotates, the slider can move horizontally along the first groove.

[0021] Preferably, the top of the slider is provided with a first inclined surface, and the bottom of the moving part is provided with a second inclined surface. The first inclined surface and the second inclined surface are slidably connected, and the thickness of the slider gradually decreases along the direction from the first threaded hole to the first slide groove, so that when the adjusting stud moves in the direction of the first slide groove, the corresponding moving part can move vertically upward along the second slide groove.

[0022] Preferably, the base is made of transparent material, and the top of the base has three sets of scales corresponding to the three adjusting studs to determine the receiving depth. Each set of scales is linearly arranged along the extension direction of the corresponding first threaded hole. The adjusting studs are headless internal hexagonal adjusting studs so that the adjusting studs can be fully inserted into the first threaded hole, and the end of the adjusting stud located in the first threaded hole can be read by matching the scale.

[0023] Preferably, it further includes an elastic element, the top of which is fixedly connected to the bottom of the sample placement stage and the bottom of which is fixedly connected to the bottom of the sample placement groove. The elastic element is always in a stretched state so that the bottom of the sample placement stage can always abut against and press against the top of the moving element.

[0024] Preferably, it also includes an adjusting bolt. The upper part of the elastic element is a spring structure and the lower part is a block structure. The lower part of the elastic element is provided with a vertical second threaded hole. The bottom of the base is provided with a countersunk hole that communicates with the sample placement groove. The lower diameter of the countersunk hole is larger than the upper diameter. The head of the adjusting bolt is located at the lower part of the countersunk hole, and the rod part passes through the countersunk hole and engages in the second threaded hole. It is used to adjust the stretching degree of the elastic element and make the elastic element detachable from the base.

[0025] (III) Beneficial Effects

[0026] Compared with the prior art, the beneficial effects of this utility model are:

[0027] In practical use, the base is moved to the designated position, and then the blocky solid sample is placed on the sample stage in the sample slot and fixed with modeling clay. Since there are three wedge mechanisms arranged in a triangle, according to the principle that three points not on the same straight line can determine a plane, it can be seen that the three wedge mechanisms can support the sample stage. Furthermore, since the wedge mechanisms drive the bottom of the sample stage, and the wedge mechanisms can convert horizontal movement into vertical movement, the corresponding parts of the sample stage can be raised or lowered by driving the wedge mechanisms, thereby adjusting the height and angle of the sample stage. Therefore, during the use of this sample stage, the blocky solid sample does not need to be cut or processed according to the size parameters of the sample slot, making the operation simpler. When the sample quantity is small, there is no need to lay a large amount of modeling clay on the sample stage, making it more convenient to use. In summary, by using this X-ray diffractometer sample stage for blocky solid samples, the depth and angle of the sample stage can be adjusted. Attached Figure Description

[0028] The accompanying drawings are provided to further illustrate the present invention and form part of the specification. They are used together with the embodiments of the present invention to explain the present invention, but do not constitute a limitation thereof. In the drawings:

[0029] Figure 1 A perspective view of the X-ray diffractometer sample stage for bulk solid samples according to this invention is shown.

[0030] Figure 2 It shows Figure 1 A cross-sectional view of a vertical section of the sample stage of an X-ray diffractometer used for bulk solid samples.

[0031] In the diagram: 1. Base; 11. Sample placement groove; 12. First slide groove; 13. Second slide groove; 14. First threaded hole; 15. Countersunk hole; 2. Sample placement stage; 3. Wedge mechanism; 31. Adjustment component; 311. Adjustment stud; 312. Slider; 3121. First inclined plane; 32. Moving part; 321. Second inclined plane; 4. Scale; 5. Elastic element; 51. Spring structure; 52. Block structure; 521. Second threaded hole; 6. Adjustment bolt; 7. Clay. Detailed Implementation

[0032] The technical solutions of the present utility model will be clearly and completely described below with reference to the accompanying drawings of the embodiments. Obviously, the described embodiments are only some embodiments of the present utility model, and not all embodiments. Based on the embodiments of the present utility model, all other embodiments obtained by those of ordinary skill in the art without creative effort are within the protection scope of the present utility model.

[0033] See appendix Figure 1 and attached Figure 2 This utility model discloses an X-ray diffractometer sample stage for bulk solid samples, including a base 1, a sample stage 2, and three wedge mechanisms 3. The top of the base 1 is provided with a sample groove 11 for accommodating bulk solid samples. The sample stage 2 is slidably connected in the sample groove 11 for supporting powdered samples. The distance between the top of the sample stage 2 and the top of the sample groove 11 is the accommodating depth of the bulk solid sample. The three wedge mechanisms 3 are all set on the base 1 and drive the bottom of the sample stage 2. The three wedge mechanisms 3 are arranged in a triangle. The wedge mechanisms 3 can convert horizontal movement into vertical movement and drive the sample stage 2 to move up and down along the direction of the sample groove 11, thereby adjusting the accommodating depth and the tilt angle of the sample stage 2.

[0034] In practical use, the base 1 is moved to the designated position, and then the block solid sample is placed on the sample stage 2 in the sample placement groove 11 and fixed with modeling clay 7. Since there are three wedge mechanisms 3 arranged in a triangle, according to the principle that three points not on the same straight line can determine a surface, it can be known that the three wedge mechanisms 3 can support the sample stage 2. Since the wedge mechanisms 3 drive the bottom of the sample stage 2 and can convert horizontal movement into vertical movement, the corresponding part of the sample stage 2 can be raised or lowered by driving the wedge mechanisms 3, thereby adjusting the height and angle of the sample stage 2. Therefore, during the use of this sample stage, the block solid sample does not need to be cut or processed according to the size parameters of the sample placement groove, making the operation simpler. When the sample quantity is small, there is no need to lay a large amount of modeling clay on the sample stage 2, making it more convenient to use. In summary, by using this X-ray diffractometer sample stage for block solid samples, the depth and angle of the sample stage can be adjusted.

[0035] This application does not limit the shape of the base 1, the sample placement groove 11, and the sample placement platform 2, so they can be flexibly designed according to actual needs. In this embodiment, one structure is described. Specifically, the base 1, the sample placement groove 11, and the sample placement platform 2 are all cylindrical and arranged on the same axis. In this embodiment, chamfers are also provided at the corners of the base 1, so as to prevent the corners from being too sharp and causing hand cuts, and also to enhance the comfort of holding.

[0036] This application does not limit the materials of the base 1 and the sample stage 2, so they can be flexibly designed according to actual needs. Some materials are introduced in this embodiment. Specifically, the upper part of the sample stage 2 and the base 1 are made of either plexiglass or quartz glass. Both of these materials have the advantages of high hardness, good light transmission, and stable physical and chemical properties, and can be used as experimental instruments.

[0037] In order to enable the wedge mechanism 3 to adjust the height and angle of the sample placement platform 2, the structure of the wedge mechanism 3 is designed as follows in this embodiment. Specifically, the bottom of the sample placement groove 11 is provided with three first sliding grooves 12 and three second sliding grooves 13 corresponding to the three wedge mechanisms 3. The three first sliding grooves 12 are horizontally arranged and the three second sliding grooves 13 are vertically arranged. The wedge mechanism 3 includes an adjustment component 31 and a moving component 32. The adjustment component 31 is horizontally installed on the base 1 and is set corresponding to the first sliding groove 12. The top of the moving component 32 abuts against the sample placement platform 2, the bottom is driven to connect to the adjustment component 31, and the side is slidably connected to the second sliding groove 13.

[0038] Through the design of the above structure, the adjustment component 31 can drive the moving part 32 to move up and down along the second slide groove 13 during the adjustment process, thereby causing the corresponding part of the sample placement stage 2 to move up and down.

[0039] In order to enable the adjusting component 31 to drive the moving component 32 to move, the structure of the adjusting component 31 is designed as follows in this embodiment. Specifically, the side of the base 1 is provided with a first threaded hole 14 that connects to three first slide grooves 12 respectively. The extension direction of the first threaded hole 14 is consistent with the extension direction of the first slide groove 12. The adjusting component 31 includes an adjusting stud 311 and a slider 312. The adjusting stud 311 is engaged in the first threaded hole 14. The slider 312 is slidably connected in the first slide groove 12, and one end is rotatably connected to the adjusting stud 311, so that when the adjusting stud 311 rotates, the slider 312 can move horizontally along the first slide groove 12.

[0040] With the design of the above structure, when the adjusting stud 311 in the first threaded hole 14 is rotated, the slider 312 will move horizontally along the first slide groove 12, and the horizontal movement of the wedge mechanism will be converted into vertical movement by the moving part 32.

[0041] In order to enable the slider 312 to drive the moving part 32 to move up and down, the following design is made in this embodiment. Specifically, the top of the slider 312 is provided with a first inclined surface 3121, and the bottom of the moving part 32 is provided with a second inclined surface 321. The first inclined surface 3121 and the second inclined surface 321 are slidably connected, and the thickness of the slider 312 gradually decreases along the direction from the first threaded hole 14 to the first slide groove 12, so that when the adjusting stud 311 moves in the direction of the first slide groove 12, the corresponding moving part 32 can move vertically upward along the second slide groove 13.

[0042] With the design of the above structure, under the limit of the first slide groove 12, the slider 312 will not rotate with the rotation of the adjusting stud 311, but will move horizontally along the first slide groove 12; under the limit of the second slide groove 13, the moving part 32 will not move horizontally with the horizontal movement of the slider 312, but will move vertically along the second slide groove 12, thereby achieving the purpose of adjusting the height of the sample placement stage 2.

[0043] To determine the accommodating depth more accurately and quickly, the following design is implemented in this embodiment. Specifically, the base 1 is made of transparent material, and the top of the base 1 is provided with three sets of scales 4 corresponding to the three adjusting studs 311 to determine the accommodating depth. Each set of scales 4 is linearly arranged along the extension direction of the corresponding first threaded hole 14. The adjusting studs 311 are selected as headless internal hexagonal adjusting studs 311 so that the adjusting studs 311 can be fully inserted into the first threaded hole 14, so that the end of the adjusting stud 311 located in the first threaded hole 14 can be read in conjunction with the scale 4.

[0044] With the design of the above structure, the accommodating depth can be determined according to the value of the scale 4 corresponding to the end of the adjusting stud 311 located in the first threaded hole 14. Compared with a sample stage without scale, this application can determine the accommodating depth more accurately and quickly. Compared with a sample stage where the scale 4 is set in the sample slot 11, the scale 4 in this application will not be obstructed by the sample before and after the use of the sample stage, or during the use process, making it more convenient to read the value.

[0045] To prevent the sample placement platform 2 from getting stuck in the sample placement groove 11 and thus being unable to descend, the following design is implemented in this embodiment. Specifically, it also includes an elastic member 5. The top of the elastic member 5 is fixedly connected to the bottom of the sample placement platform 2, and the bottom is fixedly connected to the bottom of the sample placement groove 11. The elastic member 5 is always in a stretched state so that the bottom of the sample placement platform 2 can always abut against the top of the pressing and tightening member 32.

[0046] The above-mentioned structural design not only enables the sample placement platform 2 to rise and fall simultaneously with the moving part 32, but also enhances the stability of the sample placement platform 2 and prevents it from shaking.

[0047] Furthermore, this embodiment also includes the following design: specifically, it includes an adjusting bolt 6, the upper part of the elastic element 5 is a spring structure 51 and the lower part is a block structure 52, the lower part of the elastic element 5 is provided with a vertical second threaded hole 521, the bottom of the base 1 is provided with a countersunk hole 15 that connects to the sample placement groove 11, the lower diameter of the countersunk hole 15 is larger than the upper diameter, the head of the adjusting bolt 6 is located at the lower part of the countersunk hole 15, the rod passes through the countersunk hole 15 and engages in the second threaded hole 521, which is used to adjust the stretching degree of the elastic element 5 and make the elastic element 5 detachable from the base 1.

[0048] With the above structural design, since the elastic element 5 is always in a stretched state, the head of the adjusting bolt 6 will be tightened at the countersunk hole 15 on the base 1 under the elastic action of the elastic element 5, regardless of whether the adjusting bolt 6 is rotated clockwise or counterclockwise. That is, the relative position of the adjusting bolt 6 and the base 1 remains unchanged. Therefore, when the relative position of the sample platform 2 and the base 1 remains unchanged, rotating the adjusting bolt 6 will reduce the deformation of the spring structure 51 when the block structure 52 approaches the sample platform 2, and the tension on the sample platform 2 due to the elastic force will also decrease. When the block structure 52 moves away from the sample platform 2, the deformation of the spring structure 51 will increase, and the tension on the sample platform 2 due to the elastic force will also increase. In addition, after the adjusting bolt 6 is unscrewed from the second threaded hole 521, the elastic element 5 can be removed from the base 1, thereby removing the sample platform 2 and the elastic element 5 from the sample slot 11.

[0049] It should be noted that the terminology used herein is for the purpose of describing particular implementations only and is not intended to limit the exemplary implementations according to this application. As used herein, the singular form is intended to include the plural form as well, unless the context clearly indicates otherwise. Furthermore, it should be understood that when the terms "comprising" and / or "including" are used in this specification, they indicate the presence of features, steps, operations, devices, components, and / or combinations thereof.

[0050] Furthermore, it should be noted that the use of terms such as "first" and "second" to define components is merely for the purpose of distinguishing the corresponding components. Unless otherwise stated, the above terms have no special meaning and therefore cannot be construed as limiting the scope of protection of this application.

[0051] Although embodiments of the present invention have been shown and described, it will be understood by those skilled in the art that various changes, modifications, substitutions and alterations can be made to these embodiments without departing from the principles and spirit of the present invention, the scope of which is defined by the appended claims and their equivalents.

Claims

1. An X-ray diffractometer sample stage for a bulk solid sample, characterized by, include: A base, the top of which is provided with a sample placement groove for holding blocky solid samples; A sample placement stage is slidably connected within the sample placement groove to support powdery samples. The distance between the top of the sample placement stage and the top of the sample placement groove is the accommodating depth of the blocky solid sample. Three wedge mechanisms are provided, all of which are mounted on the base and drive the bottom of the sample placement stage. The three wedge mechanisms are arranged in a triangle. The wedge mechanisms can convert horizontal movement into vertical movement and drive the sample placement stage to move up and down along the direction of the sample placement groove, thereby adjusting the accommodating depth and the tilt angle of the sample placement stage.

2. An X-ray diffractometer sample stage for a bulk solid sample according to claim 1, wherein, The base, the sample placement slot, and the sample placement platform are all cylindrical and coaxially arranged, and the base has chamfered edges.

3. An X-ray diffractometer sample stage for a bulk solid sample according to claim 1, wherein, The upper part of the sample placement stage and the base are made of either plexiglass or quartz glass.

4. An X-ray diffractometer sample stage for a bulk solid sample according to claim 1, wherein, The bottom of the sample placement groove is provided with three first sliding grooves and three second sliding grooves corresponding one-to-one with the three wedge mechanisms. The three first sliding grooves are horizontally arranged, and the three second sliding grooves are vertically arranged. The wedge mechanism includes: An adjustment component, which is horizontally mounted on the base and corresponding to the first sliding groove; The movable component has its top abutting against the sample placement stage, its bottom being driven and connected to the adjustment assembly, and its side being slidably connected to the second slide groove.

5. An X-ray diffractometer sample stage for a bulk solid sample according to claim 4, wherein, The base has first threaded holes on its side that connect to the three first sliding grooves respectively. The extension direction of the first threaded holes is the same as the extension direction of the first sliding grooves. The adjustment component includes: An adjusting stud, which engages in the first threaded hole; The slider is slidably connected in the first groove, and one end is rotatably connected to the adjusting stud, so that when the adjusting stud rotates, the slider can move horizontally along the first groove.

6. An X-ray diffractometer sample stage for a bulk solid sample according to claim 5, wherein, The top of the slider is provided with a first inclined surface, and the bottom of the moving part is provided with a second inclined surface. The first inclined surface and the second inclined surface are slidably connected, and the thickness of the slider gradually decreases along the direction from the first threaded hole to the first slide groove, so that when the adjusting stud moves in the direction of the first slide groove, the corresponding moving part can move vertically upward along the second slide groove.

7. An X-ray diffractometer sample stage for a bulk solid sample according to claim 5, wherein, The base is made of transparent material. The top of the base has three sets of scales corresponding to the three adjusting studs to determine the accommodating depth. Each set of scales is linearly arranged along the extension direction of the corresponding first threaded hole. The adjusting studs are headless internal hexagonal adjusting studs so that the adjusting studs can be fully inserted into the first threaded hole, and the end of the adjusting stud located in the first threaded hole can be read by matching the scale.

8. An X-ray diffractometer sample stage for a bulk solid sample according to claim 4, wherein, It also includes an elastic element, the top of which is fixedly connected to the bottom of the sample placement stage and the bottom of which is fixedly connected to the bottom of the sample placement groove. The elastic element is always in a stretched state so that the bottom of the sample placement stage can always abut against and press against the top of the moving part.

9. An X-ray diffractometer sample stage for a bulk solid sample according to claim 8, wherein, The adjusting screw is arranged in the second threaded hole of the lower part of the elastic member and the head of the adjusting screw is located in the lower part of the counter-sunk hole of the base, and the rod of the adjusting screw is engaged in the second threaded hole, so as to adjust the stretching degree of the elastic member and make the elastic member detachable with the base.

Images