A new automatic sample feeding device for X-ray diffractometer

CN122171591APending Publication Date: 2026-06-09SHANDONG DONGMEI TECH DEV CO LTD

Patent Information

Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
SHANDONG DONGMEI TECH DEV CO LTD
Filing Date
2026-04-24
Publication Date
2026-06-09

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Abstract

This invention belongs to the field of X-ray diffractometer sample introduction technology, and specifically relates to a novel automatic sample introduction device for X-ray diffractometers, comprising a main support and a base. The invention first uses a visual sensor to perform a high-precision scan of the sample, identifying its position, size, and external material, and transmitting the data to a controller in real time. Based on the input signal and a preset algorithm, the controller selects either a gripper or a vacuum nozzle for sample acquisition. Subsequently, the controller drives motor one and motor two to work in tandem: motor one drives swing arm one to rotate via shaft disk one, and motor two drives swing arm two to swing via shaft disk two. Simultaneously, a pressure sensor monitors the force on the shaft and provides feedback data to prevent overload and ensure smooth arm movement. The swing arm assembly moves the terminal adjustment column along an arc trajectory to above the target sample, precisely aligning the desired acquisition surface with the sample. Once the terminal adjustment column is positioned, the acquisition process uses either a vacuum nozzle or a mechanical gripper to accommodate samples with different characteristics.
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