Multifunctional X-ray diffractometer
CN310012783SActive Publication Date: 2026-06-02SHENZHEN ANGSTROM EXCELLENCE TECH CO LTD
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Designs(China)
- Current Assignee / Owner
- SHENZHEN ANGSTROM EXCELLENCE TECH CO LTD
- Filing Date
- 2025-11-20
- Publication Date
- 2026-06-02
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Figure 000007_ABST
Abstract
1. Name of the product in this design: Multifunctional X-ray Diffractometer. 2. Purpose of this design: For research on material properties in scientific research, medical and industrial fields. 3. The key design feature of this product is its shape. 4. The image or photograph that best illustrates the design's key points: 3D view 1.
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