Intelligent x-ray diffractometer based on skill transferability and control method thereof
By introducing a large language model and a skills transfer mechanism, operational experience is transformed into structured skills documents, which solves the problem that X-ray diffractometer operation skills depend on personal experience, realizes the standardization and reuse of skills across different instruments, lowers the operational threshold, and improves the consistency of analysis results.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- TRUTH INSTRUMENTS CO LTD
- Filing Date
- 2026-03-27
- Publication Date
- 2026-06-30
AI Technical Summary
Existing X-ray diffractometer operation skills rely on personal experience, which is difficult to standardize, transfer, and reuse, resulting in high operating thresholds and limited repeatability and accuracy of analysis results.
The system employs a skill-transferable intelligent X-ray diffractometer, comprising a diffractometer main unit, a large language model unit, a skill file unit, and a skill transfer and execution unit. It understands the operational logic and generates standardized instructions through the large language model, supporting the transfer and reuse of skill files between similar or different models of instruments.
It achieves standardization, transferability, and iterability of operational skills, lowers the operational threshold, improves the consistency and comparability of analytical results across different instruments, and supports the continuous optimization and evolution of skills.
Smart Images

Figure CN122306850A_ABST