A LED lamp test circuit

Abstract

The invention discloses an LED lamp test circuit, which belongs to the technical field of test circuits and comprises: a plurality of program-controlled constant current modules for providing a constant current for each loop to light up an LED and isolating and collecting VF on a MOS, wherein the plurality of program-controlled constant current modules are connected in parallel; a PIN short-circuit scanning module for realizing a PIN short-circuit test function, wherein the PIN short-circuit scanning module is connected to the plurality of program-controlled constant current modules; a constant current reference module for providing a voltage reference for each constant current module, wherein the constant current reference module is connected to the plurality of program-controlled constant current modules; a voltage-resistant module control signal and switch feedback output module, wherein the voltage-resistant module control signal and switch feedback output module are connected to the constant current reference module; and a DCDC module for providing a corresponding voltage source for the entire circuit, wherein the DCDC module is connected to the program-controlled constant current module.

Description

Technical Field

[0001] The present invention relates to the technical field of test circuits, and in particular to a LED lamp test circuit. Background Art

[0002] The traditional LED test equipment for withstand voltage testing is an independent device that can only perform withstand voltage testing, but not other functions, and is a single PCS operation. To complete multiple LED tests, it is necessary to purchase different equipment for testing, which is costly and difficult. Therefore, a circuit that can perform VF electrical testing and withstand voltage testing on LEDs is needed.

[0003] However, in the prior art, since the test circuit in the traditional LED test equipment can only perform voltage withstand test and cannot test other functions, and is a single PCS operation, the cost is high and the test difficulty is great. Summary of the invention

[0004] The technical problem to be solved by the present invention is to provide an LED lamp test circuit capable of performing VF electrical test and voltage resistance test on the LED lamp.

[0005] In order to solve the above technical problems, the technical solution of the present invention is:

[0006] An LED lamp test circuit, comprising:

[0007] A plurality of program-controlled constant current modules for providing a constant current for each loop to light up the LED and isolate the VF on the acquisition MOS, wherein the plurality of program-controlled constant current modules are connected in parallel;

[0008] A PIN short circuit scanning module for realizing a PIN short circuit test function, wherein the PIN short circuit scanning module is connected to a plurality of program-controlled constant current modules;

[0009] A constant current reference module for providing a voltage reference for each constant current module, wherein the constant current reference module is connected to a plurality of program-controlled constant current modules;

[0010] The voltage-resistant module control signal and switch feedback output module, the voltage-resistant module control signal and switch feedback

[0011] The output module is connected to the constant current reference module;

[0012] A DCDC module is used to provide a corresponding voltage source for the entire circuit, and the DCDC module is connected to the program-controlled constant current module.

[0013] Preferably, the programmable constant current module includes a first IC chip and a second IC chip, and the IN1+ pin and the IN2+ pin of the second IC chip are connected to the constant current reference module.

[0014] Preferably, the first IC chip and the second IC chip are LM358 chips.

[0015] Preferably, the short-circuit scanning module between PINs comprises a CD4514 chip, and the Q0 pin, Q1 pin, Q2 pin, Q3 pin, Q4 pin, Q5 pin, Q6 pin and Q7 pin of the CD4514 chip are connected in parallel to the programmable constant current module.

[0016] Preferably, the constant current reference module includes a TLC5615 digital-to-analog converter, an OUT pin of the TLC5615 digital-to-analog converter is connected to a plurality of resistors, and the plurality of resistors are connected in parallel to the second IC chip.

[0017] By adopting the above technical scheme, since a program-controlled constant current module is provided, a constant current can be provided for each loop to light up the LED and isolate the VF on the acquisition MOS; since a short-circuit scanning module is provided between PINs, a PIN short-circuit test function can be realized in cooperation with the program-controlled constant current module; since a constant current reference module is provided, a voltage reference can be provided for each constant current module; since a DCDC module is provided, a voltage source can be provided for the entire circuit; the scheme is suitable for LED light bar manufacturers to perform various electrical performance tests on LED light bars, and the main features are that the LEDVF electrical test and the withstand voltage test are integrated, and multiple-board test is supported, and the test efficiency is greatly improved compared with traditional test equipment. BRIEF DESCRIPTION OF THE DRAWINGS

[0018] Figure 1 Schematic diagram of the program-controlled constant current module circuit of the present invention;

[0019] Figure 2 It is a schematic diagram of the PIN short circuit scanning module circuit of the present invention;

[0020] Figure 3 is a schematic diagram of a constant current reference module circuit of the present invention;

[0021] Figure 4 It is a schematic diagram of the voltage-withstand module control signal and switch feedback output module circuit of the present invention;

[0022] Figure 5 Schematic diagram of the DCDC module circuit of the present invention. DETAILED DESCRIPTION

[0023] The specific embodiments of the present invention are further described below in conjunction with the accompanying drawings. It should be noted that the description of these embodiments is used to help understand the present invention, but does not constitute a limitation of the present invention. In addition, the technical features involved in the various embodiments of the present invention described below can be combined with each other as long as they do not conflict with each other.

[0024] An LED lamp test circuit, comprising:

[0025] A plurality of program-controlled constant current modules for providing a constant current for each loop to light up the LED and isolate the VF on the acquisition MOS, wherein the plurality of program-controlled constant current modules are connected in parallel;

[0026] A PIN short circuit scanning module for realizing a PIN short circuit test function, wherein the PIN short circuit scanning module is connected to a plurality of program-controlled constant current modules;

[0027] A constant current reference module for providing a voltage reference for each constant current module, the constant current reference module being connected to a plurality of program-controlled constant current modules;

[0028] The withstand voltage module control signal and switch feedback output module are connected to the constant current reference module;

[0029] A DCDC module for providing a corresponding voltage source for the entire circuit, the DCDC module being connected to a program-controlled constant current module;

[0030] like Figure 1 As shown, Figure 1 The schematic diagram of the program-controlled constant current module circuit of the present invention comprises an LM358 chip IC1 and an LM358 chip IC2, wherein the out1 pin and the IN1- pin of the LM358 chip IC1 are connected in parallel to the short-circuit scanning module between PINs, the IN1+ pin of the LM358 chip IC1 is connected to the short-circuit scanning module between PINs, the OUT2 and IN2- of the LM358 chip IC1 are connected in parallel to the short-circuit scanning module between PINs, the IN2+ pin of the LM358 chip IC1 is connected to the short-circuit scanning module between PINs, and the IN1+ pin and the IN2+ pin of the LM358 chip IC2 are connected to the constant current reference module;

[0031] like Figure 2 As shown, Figure 2 The schematic diagram of the PIN short circuit scanning module circuit of the present invention, the PIN short circuit scanning module includes a CD4514 chip, and the Q0 pin, Q1 pin, Q2 pin, Q3 pin, Q4 pin, Q5 pin, Q6 pin, and Q7 pin of the CD4514 chip are connected in parallel and connected to the program-controlled constant current module;

[0032] like Figure 3 As shown, Figure 3Schematic diagram of the constant current reference module circuit of the present invention, the constant current reference module includes a TLC5615 digital-to-analog converter, the OUT pin of the TLC5615 digital-to-analog converter is connected to resistors R7, R8, R9, R10, R11, R12, R13, and R14, and resistors R7, R8, R9, R10, R11, R12, R13, and R14 are connected in parallel and connected to the LM358 chip IC2;

[0033] like Figure 4 As shown, Figure 4 It is a schematic diagram of the voltage-withstand module control signal and switch feedback output module circuit of the present invention, and the voltage-withstand module control signal and switch feedback output module are connected to the constant current reference module;

[0034] like Figure 5 As shown, Figure 5 The present invention is a schematic diagram of a DCDC module circuit. The DCDC module includes a three-terminal voltage-stabilizing integrated circuit IC chip component LM7812 and a three-terminal voltage-stabilizing integrated circuit IC chip component LM7805. The IN pin of the three-terminal voltage-stabilizing integrated circuit IC chip component LM7812 is connected in parallel with the IN pin of the three-terminal voltage-stabilizing integrated circuit IC chip component LM7805. The OUT pin of the three-terminal voltage-stabilizing integrated circuit IC chip component LM7812 is connected in parallel with the OUT pin of the three-terminal voltage-stabilizing integrated circuit IC chip component LM7805. The GND pin of the three-terminal voltage-stabilizing integrated circuit IC chip component LM7812 is connected in parallel with the GND pin of the three-terminal voltage-stabilizing integrated circuit IC chip component LM7805.

[0035] The embodiments of the present invention are described in detail above with reference to the accompanying drawings, but the present invention is not limited to the described embodiments. For those skilled in the art, various changes, modifications, substitutions and variations of these embodiments are made without departing from the principles and spirit of the present invention, and still fall within the scope of protection of the present invention.

Claims

1. A LED lamp test circuit, characterized in that: include: Several program-controlled constant current modules for providing constant current for each loop to light up the LED and isolate and collect the VF on the MOS, and several of the program-controlled constant current modules are connected in parallel; a PIN short-circuit scanning module for realizing the PIN short-circuit test function, and the PIN short-circuit scanning module is connected to several program-controlled constant current modules; a constant current reference module for providing a voltage reference for each constant current module, and the constant current reference module is connected to several program-controlled constant current modules; a voltage-resistant module control signal and switch feedback output module, and the voltage-resistant module control signal and switch feedback output module are connected to the constant current reference module; a DCDC module for providing a corresponding voltage source for the entire circuit, and the DCDC module is connected to the program-controlled constant current module; Wherein, the program-controlled constant current module includes a first IC chip and a second IC chip, and the IN1+ pin and the IN2+ pin of the second IC chip are connected to the constant current reference module; The first IC chip and the second IC chip are LM358 chips; The PIN short circuit scanning module comprises a CD4514 chip, and the Q0 pin, Q1 pin, Q2 pin, Q3 pin, Q4 pin, Q5 pin, Q6 pin and Q7 pin of the CD4514 chip are connected in parallel to the program-controlled constant current module; The constant current reference module includes a TLC5615 digital-to-analog converter, an OUT pin of the TLC5615 digital-to-analog converter is connected to a plurality of resistors, and the plurality of resistors are connected in parallel to a second IC chip; The DCDC module includes a three-terminal voltage-stabilizing integrated circuit IC chip component LM7812 and a three-terminal voltage-stabilizing integrated circuit IC chip component LM7805. The IN pin of the three-terminal voltage-stabilizing integrated circuit IC chip component LM7812 is connected in parallel with the IN pin of the three-terminal voltage-stabilizing integrated circuit IC chip component LM7805, the OUT pin of the three-terminal voltage-stabilizing integrated circuit IC chip component LM7812 is connected in parallel with the OUT pin of the three-terminal voltage-stabilizing integrated circuit IC chip component LM7805, and the GND pin of the three-terminal voltage-stabilizing integrated circuit IC chip component LM7812 is connected in parallel with the GND pin of the three-terminal voltage-stabilizing integrated circuit IC chip component LM7805.

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