Wavelength measurement method, device, equipment and computer readable storage medium

Abstract

The present invention discloses a wavelength measurement method, device, equipment and computer-readable storage medium, the method comprising: when a measurement instruction is detected, inputting a light source to be measured into a polarizer to obtain a linear polarized light to be measured; inputting the linear polarized light to be measured into a fixed optical path to obtain the number of first interference fringes, and calculating the first wavelength of the light source to be measured according to the number of the first interference fringes and data in a preset processor. The present invention reduces the cost of wavelength measurement by inputting the light source to be measured into a polarizer to obtain a linear polarized light to be measured, inputting the linear polarized light to be measured into a fixed optical path to obtain the number of first interference fringes, and then calculating the first wavelength of the light source to be measured according to the number of the first interference fringes and data in a preset processor.

Description

Technical Field

[0001] The present invention relates to the field of optical communication technology, and in particular to a wavelength measurement method, device, equipment and a computer-readable storage medium. Background Art

[0002] In the field of optical fiber communication, lasers are widely used in various products as key core components. Various application environments have different requirements for laser wavelengths. Measuring laser wavelength is a basic test that every optical module manufacturer must do. Existing measuring instruments such as wavelength meters and spectrometers can achieve accurate measurement of optical wavelengths. However, since wavelength meters and spectrometers are expensive to purchase and have large sizes, how to reduce the cost of wavelength measurement is an urgent problem to be solved. Summary of the invention

[0003] The main purpose of the present invention is to provide a wavelength measurement method, device, equipment and computer-readable storage medium, aiming to solve the problem of how to reduce the cost of wavelength measurement.

[0004] To achieve the above object, the present invention provides a wavelength measurement method, which comprises the following steps:

[0005] When the measurement instruction is detected, the light source to be measured is input into the polarizer to obtain the linear polarized light to be measured;

[0006] The linearly polarized light to be measured is input into a fixed optical path to obtain the number of first interference fringes, and the first wavelength of the light source to be measured is calculated according to the number of the first interference fringes and data in a preset processor.

[0007] Preferably, when the measurement instruction is detected, before the step of inputting the light source to be measured into the polarizer to obtain the linearly polarized light to be measured, the wavelength measurement method further comprises:

[0008] Acquire a second wavelength of the standard light source, and store the second wavelength in the preset processor;

[0009] Inputting the standard light source into the polarizer to obtain standard linear polarized light with an initial phase;

[0010] The standard linear polarized light is input into the fixed optical path to obtain second interference fringes, the number of the second interference fringes is counted, and the number of the second interference fringes is stored in the preset processor.

[0011] Preferably, the step of inputting the light source to be measured into a polarizer to obtain the linearly polarized light to be measured comprises:

[0012] The light source to be measured is input into the polarizer, so that the light source to be measured is polarized and converted into the linear polarized light to be measured, and the linear polarized light to be measured has the same initial phase as the standard linear polarized light.

[0013] Preferably, the step of inputting the linearly polarized light to be measured into a fixed optical path to obtain the number of second interference fringes comprises:

[0014] Inputting the linear polarized light to be measured into the fixed optical path, so that the linear polarized light to be measured is simultaneously input into a first optical path and a second optical path in the fixed optical path, and there is an optical path difference between the first optical path and the second optical path;

[0015] The linearly polarized light to be measured that passes through the first optical path and the second optical path is projected onto a preset baffle to obtain the first interference fringes, and the number of the first interference fringes is counted.

[0016] Preferably, the step of counting the number of the first interference fringes comprises:

[0017] Scanning the first interference fringes on the preset baffle by using an infrared CCD camera to obtain a scanning result corresponding to the first interference fringes;

[0018] A preset operation is performed on the scanning result to obtain the number of the first interference fringes.

[0019] Preferably, the step of calculating the first wavelength of the light source to be measured according to the number of the first interference fringes and the data in the preset processor includes:

[0020] The second wavelength and the number of the second interference fringes in the preset processor are obtained, and the first wavelength of the light source to be measured is calculated according to the second wavelength, the number of the second interference fringes and the number of the first interference fringes.

[0021] Preferably, after the step of obtaining the second wavelength and the number of the second interference fringes in the preset processor, and calculating the first wavelength of the light source to be measured according to the second wavelength, the number of the second interference fringes and the number of the first interference fringes, the wavelength measurement method further includes:

[0022] The first wavelength is compared with the second wavelength. If the difference between the first wavelength and the second wavelength is within a preset difference threshold, it is determined that the light source to be measured meets the preset wavelength requirement.

[0023] In addition, to achieve the above object, the present invention further provides a wavelength measurement device, the wavelength measurement device comprising:

[0024] The detection module is used to input the light source to be measured into the polarizer to obtain the linear polarized light to be measured when the measurement instruction is detected;

[0025] The measuring module is used to input the linear polarized light to be measured into a fixed optical path to obtain the number of first interference fringes, and to measure the first wavelength of the light source to be measured according to the number of the first interference fringes and the data in the preset processor.

[0026] Preferably, the detection module further comprises a storage module, and the storage module is used for:

[0027] Acquire a second wavelength of the standard light source, and store the second wavelength in the preset processor;

[0028] Inputting the standard light source into the polarizer to obtain standard linear polarized light with an initial phase;

[0029] The standard linear polarized light is input into the fixed optical path to obtain second interference fringes, the number of the second interference fringes is counted, and the number of the second interference fringes is stored in the preset processor.

[0030] Preferably, the detection module further comprises a polarization module, and the polarization module is used for:

[0031] The light source to be measured is input into the polarizer, so that the light source to be measured is polarized and converted into the linear polarized light to be measured, and the linear polarized light to be measured has the same initial phase as the standard linear polarized light.

[0032] Preferably, the measuring module further comprises a fixed optical path module, and the fixed optical path module is used for:

[0033] Inputting the linear polarized light to be measured into the fixed optical path, so that the linear polarized light to be measured is simultaneously input into a first optical path and a second optical path in the fixed optical path, and there is an optical path difference between the first optical path and the second optical path;

[0034] The linearly polarized light to be measured that passes through the first optical path and the second optical path is projected onto a preset baffle to obtain the first interference fringes, and the number of the first interference fringes is counted.

[0035] Preferably, the measuring module further comprises a scanning module. The scanning module is used for:

[0036] Scanning the first interference fringes on the preset baffle by using an infrared CCD camera to obtain a scanning result corresponding to the first interference fringes;

[0037] A preset operation is performed on the scanning result to obtain the number of the first interference fringes.

[0038] Preferably, the calculation module is also used for:

[0039] The second wavelength and the number of the second interference fringes in the preset processor are obtained, and the first wavelength of the light source to be measured is calculated according to the second wavelength, the number of the second interference fringes and the number of the first interference fringes.

[0040] Preferably, the measuring module further comprises a comparing module, and the comparing module is used for:

[0041] The first wavelength is compared with the second wavelength. If the difference between the first wavelength and the second wavelength is within a preset difference threshold, it is determined that the light source to be measured meets the preset wavelength requirement.

[0042] In addition, to achieve the above-mentioned purpose, the present invention also provides a wavelength measurement device, which includes: a memory, a processor, and a wavelength measurement program stored in the memory and executable on the processor, and when the wavelength measurement program is executed by the processor, the steps of the wavelength measurement method described above are implemented.

[0043] In addition, to achieve the above-mentioned purpose, the present invention also provides a computer-readable storage medium, on which a wavelength measurement program is stored, and when the wavelength measurement program is executed by a processor, the steps of the wavelength measurement method described above are implemented.

[0044] The wavelength measurement method proposed by the present invention, when a measurement instruction is detected, inputs the light source to be measured into a polarizer to obtain the linear polarized light to be measured; inputs the linear polarized light to be measured into a fixed optical path to obtain the number of first interference fringes, and calculates the first wavelength of the light source to be measured according to the number of the first interference fringes and the data in the preset processor. The present invention reduces the cost of wavelength measurement by inputting the light source to be measured into a polarizer to obtain the linear polarized light to be measured, inputting the linear polarized light to be measured into a fixed optical path to obtain the number of first interference fringes, and then calculating the first wavelength of the light source to be measured according to the number of the first interference fringes and the data in the preset processor. BRIEF DESCRIPTION OF THE DRAWINGS

[0045] Figure 1 It is a schematic diagram of the device structure of the hardware operating environment involved in the embodiment of the present invention;

[0046] Figure 2 It is a schematic diagram of the flow chart of the first embodiment of the wavelength measurement method of the present invention;

[0047] Figure 3 This is a schematic diagram of an application scenario of the first embodiment of the present invention;

[0048] Figure 4 This is a schematic diagram of an application scenario of the second embodiment of the present invention;

[0049] Figure 5 It is a structural schematic diagram of the wavelength measuring device of the present invention;

[0050] The realization of the purpose, functional features and advantages of the present invention will be further explained in conjunction with embodiments and with reference to the accompanying drawings. DETAILED DESCRIPTION

[0051] It should be understood that the specific embodiments described herein are only used to explain the present invention, and are not used to limit the present invention.

[0052] like Figure 1 As shown, Figure 1 It is a schematic diagram of the device structure of the hardware operating environment involved in the embodiment of the present invention.

[0053] The device in the embodiment of the present invention may be a PC or a server device.

[0054] like Figure 1 As shown, the device may include: a processor 1001, such as a CPU, a network interface 1004, a user interface 1003, a memory 1005, and a communication bus 1002. Among them, the communication bus 1002 is used to realize the connection and communication between these components. The user interface 1003 may include a display screen (Display), an input unit such as a keyboard (Keyboard), and the optional user interface 1003 may also include a standard wired interface and a wireless interface. The network interface 1004 may optionally include a standard wired interface and a wireless interface (such as a WI-FI interface). The memory 1005 may be a high-speed RAM memory, or it may be a stable memory (non-volatile memory), such as a disk memory. The memory 1005 may also be a storage device independent of the aforementioned processor 1001.

[0055] Those skilled in the art will understand that Figure 1 The device structure shown in the figure does not constitute a limitation of the device, and may include more or less components than shown in the figure, or combine certain components, or arrange the components differently.

[0056] like Figure 1 As shown, the memory 1005 as a computer storage medium may include an operating system, a network communication module, a user interface module, and a wavelength measurement program.

[0057] Among them, the operating system is a program for managing and controlling the portable wavelength measurement device and software resources, supporting the operation of the network communication module, user interface module, wavelength measurement program and other programs or software; the network communication module is used to manage and control the network interface 1002; the user interface module is used to manage and control the user interface 1003.

[0058] exist Figure 1 In the wavelength measurement device shown, the wavelength measurement device calls the wavelength measurement program stored in the memory 1005 through the processor 1001, and executes the operations in each embodiment of the following wavelength measurement method.

[0059] Based on the above hardware structure, an embodiment of the wavelength measurement method of the present invention is proposed.

[0060] Reference Figure 2 , Figure 2 This is a flow chart of a first embodiment of a wavelength measurement method of the present invention, the method comprising:

[0061] Step S10, when a measurement instruction is detected, inputting the light source to be measured into a polarizer to obtain the linearly polarized light to be measured;

[0062] Step S20, inputting the linearly polarized light to be measured into a fixed optical path to obtain the number of first interference fringes, and calculating the first wavelength of the light source to be measured according to the number of the first interference fringes and data in a preset processor.

[0063] The wavelength measurement method of this embodiment is applied to a wavelength measurement device of an optical communication module mechanism. The wavelength measurement device may be a terminal or a PC device. For the convenience of description, the wavelength measurement device is taken as an example for description. The wavelength measurement device includes but is not limited to a polarizer and a fixed optical path. When the wavelength measurement device detects a measurement instruction, the light source to be measured is input into the polarizer to obtain a linear polarized light to be measured, and the linear polarized light has an initial phase. The wavelength measurement device inputs the obtained linear polarized light to be measured into the fixed optical path to obtain a first interference fringe, and counts the number of the first interference fringes, and then obtains the second wavelength and the number of the second interference fringes corresponding to the standard light source stored in the preset processor, and measures the first wavelength of the light source to be measured according to the second wavelength, the number of the second interference fringes and the number of the first interference fringes. It should be noted that the polarizer refers to a device for obtaining polarized light from natural light, and the light emitted by the light source to be measured belongs to natural light. The optical path lengths set in the fixed optical path are all in the millimeter level. One optical path or two optical paths may be set in the fixed optical path. The function of the fixed optical path is mainly to form interference fringes for the linear polarized light to be measured. The data in the preset processor includes the second wavelength and the number of the second interference fringes corresponding to the standard light source.

[0064] The wavelength measurement method of this embodiment, when a measurement instruction is detected, inputs the light source to be measured into a polarizer to obtain the linear polarized light to be measured; inputs the linear polarized light to be measured into a fixed optical path to obtain the number of first interference fringes, and calculates the first wavelength of the light source to be measured according to the number of the first interference fringes and the data in the preset processor. The present invention reduces the cost rate of wavelength measurement by inputting the light source to be measured into a polarizer to obtain the linear polarized light to be measured, inputting the linear polarized light to be measured into a fixed optical path to obtain the number of first interference fringes, and then calculating the first wavelength of the light source to be measured according to the number of the first interference fringes and the data in the preset processor.

[0065] The following is a detailed description of each step:

[0066] Step S10, when a measurement instruction is detected, inputting the light source to be measured into a polarizer to obtain the linearly polarized light to be measured;

[0067] In this embodiment, when the wavelength measurement device detects the measurement instruction, the light source to be measured is input into the polarizer, and the light source to be measured after passing through the polarizer is converted into the linear polarized light to be measured; for example, when the wavelength measurement device needs to measure the wavelength of the light emitted by a certain laser, the relevant tester first fixes the laser in the test position, and starts the laser and the wavelength measurement device. When the wavelength measurement device detects the measurement instruction, the light emitted by the laser is input into the polarizer, and after conversion by the polarizer, the linear polarized light to be measured is obtained. It should be noted that the polarizer in the present invention can be one or more of a reflective polarizer, a complex refractive polarizer, a dichroic microcrystalline polarizer, and a polymer dichroic polarizer, which are not limited here.

[0068] Specifically, step S10 also includes:

[0069] Step a, inputting the light source to be measured into the polarizer, so that the light source to be measured is polarized and converted into the linear polarized light to be measured, and the linear polarized light to be measured has the same initial phase as the standard linear polarized light.

[0070] In this step, the wavelength device inputs the light source to be measured into the polarizer, so that the light source to be measured is polarized and converted into the linear polarized light to be measured, and the linear polarized light to be measured has an initial phase, and the initial phase is the same as the initial phase of the standard linear polarized light obtained by inputting the standard light source into the polarizer. It should be noted that since the polarizers passed by the standard light source and the light source to be measured are the same, the initial phases of the standard linear polarized light and the linear polarized light to be measured are the same, which lays the foundation for the subsequent steps.

[0071] Step S20, inputting the linearly polarized light to be measured into a fixed optical path to obtain the number of first interference fringes, and calculating the first wavelength of the light source to be measured according to the number of the first interference fringes and data in a preset processor.

[0072] In this embodiment, the wavelength measuring device inputs the obtained linearly polarized light to be measured into a fixed optical path. The linearly polarized light to be measured passing through the fixed optical path will interfere and form first interference fringes on a preset baffle. The wavelength measuring device counts the number of the first interference fringes and calculates the first wavelength corresponding to the light source to be measured based on the number of the first interference fringes and the data in the preset processor.

[0073] Specifically, step S20 also includes:

[0074] Step b, inputting the linear polarized light to be measured into the fixed optical path, so that the linear polarized light to be measured is simultaneously input into a first optical path and a second optical path in the fixed optical path, and there is an optical path difference between the first optical path and the second optical path;

[0075] In this step, the wavelength measuring device inputs the obtained linear polarized light to be measured into a fixed optical path, which includes a first optical path and a second optical path, and there is an optical path difference between the first optical path and the second optical path, and the linear polarized light to be measured is input into the first optical path and the second optical path at the same time; it should be noted that the optical path difference between the first optical path and the second optical path means that the lengths of the first optical path and the second optical path are different. In the wavelength measuring device of the present invention, if two optical paths are set in the fixed optical path, the lengths of the first optical path and the second optical path must be set to be different, which makes the phase of the linear polarized light to be measured after passing through the first optical path and the phase of the linear polarized light to be measured after passing through the second optical path unequal, that is, there is a phase difference, which is conducive to the next step.

[0076] Step c: projecting the linearly polarized light to be measured that passes through the first optical path and the second optical path onto a preset baffle to obtain the first interference fringes, and counting the number of the first interference fringes.

[0077] In this step, the wavelength measuring device projects the linear polarized light to be measured that passes through the first optical path and the second optical path onto a preset baffle to obtain first interference fringes, and counts the number of the first interference fringes. It should be noted that since the phase of the linear polarized light to be measured after passing through the first optical path is not equal to the phase of the linear polarized light to be measured after passing through the second optical path, interference fringes will be formed on the preset baffle. For example, when the phase difference between the linear polarized light to be measured after passing through the first optical path and the linear polarized light to be measured after passing through the second optical path is π, level 1 bright fringes or dark fringes will be generated, and the generated bright fringes and dark fringes will be symmetrically distributed near the level 0 bright fringes. At this time, the number of level 1 bright fringes or level 1 dark fringes is 2.

[0078] Furthermore, the step of counting the first interference fringes includes:

[0079] Scanning the first interference fringes on the preset baffle by using an infrared CCD camera to obtain a scanning result corresponding to the first interference fringes;

[0080] In this step, after the wavelength measuring device projects the linearly polarized light to be measured through the first optical path and the second optical path onto the preset baffle, the first interference fringes on the preset baffle are scanned by the infrared CCD camera to obtain the scanning results corresponding to the first interference fringes; it should be noted that the specific number of the first interference fringes cannot be determined by naked eye observation alone, and it is necessary to scan with an infrared CCD camera to capture the linearly polarized light signal to be measured; the infrared CCD camera mentioned here is just a name, and it can also be called an infrared CCD sensor, infrared CCD tester, etc., which is not limited here.

[0081] A preset operation is performed on the scanning result to obtain the number of the first interference fringes.

[0082] In this step, after the wavelength measuring device obtains the scanning result of the infrared CCD camera, it sends the scanning result to the computer, and analyzes it through the analysis software in the computer, and finally obtains the accurate number of the first interference fringes. It should be noted that the computer can be an ordinary computer connected to the wavelength measuring device through a data transmission line, or it can be a microcomputer integrated into the wavelength measuring device. The analysis software can use software such as Matlab.

[0083] Step d: obtaining the second wavelength and the number of the second interference fringes in the preset processor, and calculating the first wavelength of the light source to be measured according to the second wavelength, the number of the second interference fringes and the number of the first interference fringes.

[0084] In this step, after the wavelength measurement device obtains the number of the first interference fringes, it obtains the second wavelength and the number of the second interference fringes corresponding to the standard light source in the preset processor, and measures the first wavelength of the light source to be measured according to the second wavelength, the number of the second interference fringes and the number of the first interference fringes, such as: the second wavelength corresponding to the standard light source in the preset processor is λ1, the number of the second interference fringes is N1, the number of the first interference fringes obtained by the wavelength measurement device is N2, the first wavelength corresponding to the light source to be measured is λ2, and the wavelength measurement device obtains the first wavelength λ2=λ1*N1 / N2 according to the calculation formula λ2 / λ1=N1 / N2. It should be noted that the calculation process of the calculation formula λ2 / λ1=N1 / N2 is as follows: the second wavelength λ1 corresponding to the standard light source is known, L1 and L2 represent the first light path and the second light path in the fixed light path respectively, wherein the lengths of L1 and L2 are not completely equal and the lengths are unknown. The phase shift H1=ω1t1+ψ0 generated by the standard light source after passing through the polarizer and then the first optical path L1, where the angular phase ω1=2*π*f1, the frequency f1=C / λ1 of the standard light source, C is the speed of light, t1=L1 / C, and ψ0 is the initial phase. It can be seen from the formula that ω1 is only related to the second wavelength λ1, and has nothing to do with the length of the first optical path. Therefore, the phase shift H2=ω1t2+ψ0 generated by the standard light source after passing through the second optical path L2 is t2=L2 / C; when the phase difference between H1 and H2 is π, a 1st-level bright or dark stripe will be generated, and the generated bright and dark stripes will be symmetrically distributed on both sides of the 0th-level bright stripe. For the convenience of measurement, the number of dark stripes generated is selected to be counted N1. Then the total phase difference generated by the standard light source after passing through the polarizer and then the first optical path L1 and the second optical path L2 is N1*π / 2, and |H1-H2|=N1*π / 2. The simplified formula is 2*π* C*T1 / λ1=N1*π / 2, T1=|L1-L2| / C; the first wavelength corresponding to the light source to be measured is λ2, the phase H3=ω2t3+ψ1 generated by the light source to be measured after passing through the polarizer and then the first optical path L1, t3=L1 / C, and the phase H4=ω2t4+ψ1 generated after passing through the second optical path L2, t4=L2 / C. Therefore, the total phase difference generated by the light source to be measured after passing through the polarizer and then the first optical path L1 and the second optical path L2 is |H4-H3|=N2*π / 2. After simplifying the formula, 2*π*C*T2 / λ2=N2*π / 2, T2=|L1-L2| / C. Combined with the formula of T1, we can know that T1=T2. Finally, divide the two formulas 2*π*C*T1 / λ1=N1*π / 2, T1=|L1-L2| / C and 2*π*C*T2 / λ2=N2*π / 2, T2=|L1-L2| / C to get the formula: λ2 / λ1=N1 / N2; it should be noted that if the number of the second interference fringes corresponding to the standard light source stored in the preset processor is the number of dark fringes, then when counting the first interference fringes corresponding to the light source to be measured, the number of dark fringes is also counted, and vice versa.

[0085] Furthermore, after the first wavelength of the light source to be measured is calculated:

[0086] The first wavelength is compared with the second wavelength. If the difference between the first wavelength and the second wavelength is within a preset difference threshold, it is determined that the light source to be measured meets the preset wavelength requirement.

[0087] In this step, the wavelength measurement equipment compares the first wavelength corresponding to the light source to be measured and the second wavelength corresponding to the standard light source to obtain a comparison result. If the comparison result is that the difference between the first wavelength and the second wavelength is within the preset difference threshold, it is determined that the light source to be measured meets the preset wavelength requirement. It should be noted that the preset wavelength requirement is set by relevant test personnel according to specific production needs, because light sources of different wavelengths carry different information.

[0088] When the wavelength measuring device of this embodiment detects a measuring instruction, the wavelength measuring device inputs the light source to be measured into the polarizer to obtain the linear polarized light to be measured, and the linear polarized light has an initial phase; the wavelength measuring device inputs the obtained linear polarized light to be measured into a fixed optical path to obtain the first interference fringe, and counts the number of the first interference fringes, and then obtains the second wavelength and the number of the second interference fringes corresponding to the standard light source stored in the preset processor, and calculates the first wavelength of the light source to be measured according to the second wavelength, the number of the second interference fringes and the number of the first interference fringes, thereby reducing the cost of wavelength measurement.

[0089] Furthermore, based on the first embodiment of the wavelength calculation method of the present invention, a second embodiment of the wavelength calculation method of the present invention is proposed.

[0090] The second embodiment of the wavelength calculation method is different from the first embodiment of the wavelength calculation method in that before step S10, the method further includes:

[0091] Step e, obtaining a second wavelength of the standard light source, and storing the second wavelength in the preset processor;

[0092] Step f, inputting the standard light source into the polarizer to obtain standard linear polarized light with an initial phase;

[0093] Step g, inputting the standard linear polarized light into the fixed optical path to obtain second interference fringes, counting the number of the second interference fringes, and storing the number of the second interference fringes in the preset processor.

[0094] The wavelength measurement device in this embodiment obtains the second wavelength of the standard light source and stores the second wavelength in the preset processor; inputs the standard light source into the polarizer to obtain standard linear polarized light with an initial phase; inputs the standard linear polarized light into a fixed optical path to obtain second interference fringes, counts the number of second interference fringes, and stores the number of second interference fringes in the preset processor; it should be noted that the second wavelength corresponding to the standard light source is known, but the number of second interference fringes corresponding to the standard light source is not certain, so the standard light source needs to be input into the polarizer and pass through the fixed optical path to determine the number of second interference fringes.

[0095] The following is a detailed description of each step:

[0096] Step e, obtaining a second wavelength of the standard light source, and storing the second wavelength in the preset processor;

[0097] In this step, the wavelength measuring device obtains the second wavelength corresponding to the standard light source and stores the second wavelength in the preset processor; it should be noted that the second wavelength corresponding to the standard light source can be input into the wavelength measuring device by relevant test personnel, or it can be obtained by the wavelength measuring device identifying the nameplate of the laser corresponding to the standard light source.

[0098] Step f, inputting the standard light source into the polarizer to obtain standard linear polarized light with an initial phase;

[0099] In this step, the wavelength measurement device inputs the standard light source into the polarizer to obtain a standard linear polarized light with an initial phase. It should be noted that the polarizer inputted by the standard light source is the same as the polarizer inputted by the light source to be measured.

[0100] Step g, inputting the standard linearly polarized light into the fixed optical path to obtain second interference fringes, counting the number of the second interference fringes, and storing the number of the second interference fringes in the preset processor.

[0101] In this step, the wavelength measurement involves inputting the standard linear polarized light into a fixed optical path to obtain second interference fringes, and counting the number of the second interference fringes, and storing the number of the second interference fringes in a preset processor. It should be noted that the fixed optical path for the input of the standard light source is the same as the fixed optical path for the input of the light source to be measured, and the steps for counting the number of the second interference fringes are the same as the steps for counting the number of the first interference fringes, which will not be described in detail here.

[0102] The wavelength measurement device in this embodiment obtains the second wavelength of the standard light source and stores the second wavelength in the preset processor; inputs the standard light source into the polarizer to obtain standard linear polarized light with an initial phase; inputs the standard linear polarized light into a fixed optical path to obtain second interference fringes, and counts the number of second interference fringes, and stores the number of second interference fringes in the preset processor, thereby laying a data foundation for the subsequent measurement of the first wavelength of the light source to be measured, improving the measurement efficiency when measuring the first wavelength, and reducing costs.

[0103] In specific implementation, Figure 3 and Figure 4 As shown, both the standard light source and the light source to be measured first pass through a polarizer to obtain linearly polarized light with an initial phase (standard linear polarized light and linear polarized light to be measured), and then pass through the same fixed optical path, wherein the fixed optical path includes a first optical path L1 and a second optical path L2, both the first optical path L1 and the second optical path L2 are optical waveguides, but the lengths of the first optical path L1 and the second optical path L2 are different, and after passing through the fixed optical path, the linearly polarized light interferes to obtain interference fringes.

[0104] like Figure 5 As shown, the present invention also provides a wavelength measurement device. The wavelength measurement device of the present invention comprises:

[0105] The detection module is used to input the light source to be measured into the polarizer to obtain the linear polarized light to be measured when the measurement instruction is detected;

[0106] The measuring module is used to input the linear polarized light to be measured into a fixed optical path to obtain the number of first interference fringes, and to measure the first wavelength of the light source to be measured according to the number of the first interference fringes and the data in the preset processor.

[0107] Preferably, the detection module further comprises a storage module, and the storage module is used for:

[0108] Acquire a second wavelength of the standard light source, and store the second wavelength in the preset processor;

[0109] Inputting the standard light source into the polarizer to obtain standard linear polarized light with an initial phase;

[0110] The standard linear polarized light is input into the fixed optical path to obtain second interference fringes, the number of the second interference fringes is counted, and the number of the second interference fringes is stored in the preset processor.

[0111] Preferably, the detection module further comprises a polarization module, and the polarization module is used for:

[0112] The light source to be measured is input into the polarizer, so that the light source to be measured is polarized and converted into the linear polarized light to be measured, and the linear polarized light to be measured has the same initial phase as the standard linear polarized light.

[0113] Preferably, the measuring module further comprises a fixed optical path module, and the fixed optical path module is used for:

[0114] Inputting the linear polarized light to be measured into the fixed optical path, so that the linear polarized light to be measured is simultaneously input into a first optical path and a second optical path in the fixed optical path, and there is an optical path difference between the first optical path and the second optical path;

[0115] The linearly polarized light to be measured that passes through the first optical path and the second optical path is projected onto a preset baffle to obtain the first interference fringes, and the number of the first interference fringes is counted.

[0116] Preferably, the measuring module further comprises a scanning module. The scanning module is used for:

[0117] Scanning the first interference fringes on the preset baffle by using an infrared CCD camera to obtain a scanning result corresponding to the first interference fringes;

[0118] A preset operation is performed on the scanning result to obtain the number of the first interference fringes.

[0119] Preferably, the calculation module is also used for:

[0120] The second wavelength and the number of the second interference fringes in the preset processor are obtained, and the first wavelength of the light source to be measured is calculated according to the second wavelength, the number of the second interference fringes and the number of the first interference fringes.

[0121] Preferably, the measuring module further comprises a comparing module, and the comparing module is used for:

[0122] The first wavelength is compared with the second wavelength. If the difference between the first wavelength and the second wavelength is within a preset difference threshold, it is determined that the light source to be measured meets the preset wavelength requirement.

[0123] The invention also provides a wavelength measuring device.

[0124] The wavelength calculation device of the present invention comprises: a memory, a processor and a wavelength calculation program stored in the memory and executable on the processor. When the wavelength calculation program is executed by the processor, the steps of the wavelength calculation method described above are implemented.

[0125] The method implemented when the wavelength measurement program running on the processor is executed can refer to the various embodiments of the wavelength measurement method of the present invention, and will not be described in detail here.

[0126] The present invention also provides a computer-readable storage medium.

[0127] The computer-readable storage medium of the present invention stores a wavelength calculation program, and when the wavelength calculation program is executed by a processor, the steps of the wavelength calculation method described above are implemented.

[0128] The method implemented when the wavelength measurement program running on the processor is executed can refer to the various embodiments of the wavelength measurement method of the present invention, and will not be described in detail here.

[0129] It should be noted that, in this article, the terms "include", "comprises" or any other variations thereof are intended to cover non-exclusive inclusion, so that a process, method, article or system including a series of elements includes not only those elements, but also other elements not explicitly listed, or also includes elements inherent to such process, method, article or system. In the absence of further restrictions, an element defined by the sentence "comprises a ..." does not exclude the existence of other identical elements in the process, method, article or system including the element.

[0130] The serial numbers of the above embodiments of the present invention are only for description and do not represent the advantages or disadvantages of the embodiments.

[0131] Through the description of the above implementation methods, those skilled in the art can clearly understand that the above-mentioned embodiment methods can be implemented by means of software plus a necessary general hardware platform, and of course by hardware, but in many cases the former is a better implementation method. Based on such an understanding, the technical solution of the present invention is essentially or the part that contributes to the prior art can be embodied in the form of a software product, which is stored in a storage medium (such as ROM / RAM, magnetic disk, optical disk) as described above, and includes a number of instructions for a terminal device (which can be a mobile phone, a computer, a server, or a network device, etc.) to execute the methods described in each embodiment of the present invention.

[0132] The above are only preferred embodiments of the present invention, and are not intended to limit the patent scope of the present invention. Any equivalent structure or equivalent process transformation made using the contents of the present invention specification and drawings, or directly or indirectly applied in other related technical fields, are also included in the patent protection scope of the present invention.

Claims

1. A wavelength measurement method, It is characterized in that The wavelength measurement method comprises the following steps: When the measurement instruction is detected, the light source to be measured is input into the polarizer to obtain the linear polarized light to be measured; Input the linear polarized light to be measured into a fixed optical path to obtain the number of first interference fringes, and calculate the first wavelength of the light source to be measured according to the number of the first interference fringes and data in a preset processor; Before the step of inputting the light source to be measured into the polarizer to obtain the linearly polarized light to be measured when the measurement instruction is detected, the wavelength measurement method further comprises: Acquire a second wavelength of the standard light source, and store the second wavelength in the preset processor; Inputting the standard light source into the polarizer to obtain standard linear polarized light with an initial phase; Inputting the standard linear polarized light into the fixed optical path to obtain second interference fringes, counting the number of the second interference fringes, and storing the number of the second interference fringes in the preset processor; The step of inputting the light source to be measured into the polarizer to obtain the linearly polarized light to be measured comprises: Inputting the light source to be measured into the polarizer, so that the light source to be measured is polarized and converted into the linear polarized light to be measured, and the linear polarized light to be measured has the same initial phase as the standard linear polarized light; Wherein, the step of inputting the linearly polarized light to be measured into a fixed optical path to obtain the number of second interference fringes comprises: Inputting the linear polarized light to be measured into the fixed optical path, so that the linear polarized light to be measured is simultaneously input into a first optical path and a second optical path in the fixed optical path, there is an optical path difference between the first optical path and the second optical path, and the first optical path and the second optical path are composed of optical waveguides with different lengths; The linearly polarized light to be measured that passes through the first optical path and the second optical path is projected onto a preset baffle to obtain the first interference fringes, and the number of the first interference fringes is counted.

2. The wavelength calculation method according to claim 1, It is characterized in that The step of counting the number of the first interference fringes comprises: Scanning the first interference fringes on the preset baffle by using an infrared CCD camera to obtain a scanning result corresponding to the first interference fringes; A preset operation is performed on the scanning result to obtain the number of the first interference fringes.

3. The wavelength measurement method as claimed in claim 1, It is characterized in that The step of calculating the first wavelength of the light source to be measured according to the number of the first interference fringes and the data in the preset processor comprises: The second wavelength and the number of the second interference fringes in the preset processor are obtained, and the first wavelength of the light source to be measured is calculated according to the second wavelength, the number of the second interference fringes and the number of the first interference fringes.

4. The wavelength measurement method according to claim 3, It is characterized in that After the step of obtaining the second wavelength and the number of the second interference fringes in the preset processor, and calculating the first wavelength of the light source to be measured according to the second wavelength, the number of the second interference fringes and the number of the first interference fringes, the wavelength measurement method further includes: The first wavelength is compared with the second wavelength. If the difference between the first wavelength and the second wavelength is within a preset difference threshold, it is determined that the light source to be measured meets the preset wavelength requirement.

5. A wavelength measuring device, It is characterized in that The wavelength measuring device comprises: The detection module is used to input the light source to be measured into the polarizer to obtain the linear polarized light to be measured when the measurement instruction is detected; A measuring module, used for inputting the linearly polarized light to be measured into a fixed optical path to obtain the number of first interference fringes, and measuring the first wavelength of the light source to be measured according to the number of the first interference fringes and data in a preset processor; The detection module is further used for, when detecting the measurement instruction, inputting the light source to be measured into the polarizer to obtain the second wavelength of the standard light source before obtaining the linear polarized light to be measured, and storing the second wavelength in the preset processor; inputting the standard light source into the polarizer to obtain the standard linear polarized light with an initial phase; inputting the standard linear polarized light into the fixed optical path to obtain the second interference fringes, and counting the number of the second interference fringes, and storing the number of the second interference fringes in the preset processor; The detection module is further used to input the light source to be measured into the polarizer, so that the light source to be measured is polarized and converted into the linear polarized light to be measured, and the linear polarized light to be measured has the same initial phase as the standard linear polarized light; The measuring module is further used to input the linear polarized light to be measured into the fixed optical path, so that the linear polarized light to be measured is simultaneously input into a first optical path and a second optical path in the fixed optical path, there is an optical path difference between the first optical path and the second optical path, and the first optical path and the second optical path are composed of optical waveguides with different lengths; The linearly polarized light to be measured that passes through the first optical path and the second optical path is projected onto a preset baffle to obtain the first interference fringes, and the number of the first interference fringes is counted.

6. A wavelength measurement device, It is characterized in that The wavelength calculation device comprises: a memory, a processor, and a wavelength calculation program stored in the memory and executable on the processor. When the wavelength calculation program is executed by the processor, the steps of the wavelength calculation method according to any one of claims 1 to 4 are implemented.

7. A computer-readable storage medium, It is characterized in that The computer-readable storage medium stores a wavelength calculation program, and when the wavelength calculation program is executed by the processor, the steps of the wavelength calculation method according to any one of claims 1 to 4 are implemented.

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