Test methods for qualified inspection of photoelectric detection equipment

Abstract

The test method for qualified detection of photoelectric detection equipment of the present invention belongs to the technical field of optical axis testing of optoelectronic products, and solves the technical problem of large errors in the test methods of the prior art. It includes qualified detection suitable for photoelectric detection equipment, and the photoelectric detection equipment can receive infrared light and can emit and receive lasers. It is characterized in that it includes a first visible light collimator, a universal adjustment platform and a temperature control box arranged at intervals from left to right, and a second reflector, an optical axis adjustment device and a second visible light collimator are adjacently installed on the universal adjustment platform, and the second reflector is located on the left side of the optical axis adjustment device. The photoelectric detection equipment is placed in the temperature control box, and a light window is provided on a side wall adjacent to the universal adjustment platform. The photoelectric detection equipment is provided with a first reflector, and is electrically connected to an infrared detection display and an oscilloscope. The present invention is used to improve the detection function of the photoelectric detection equipment.

Description

Technical Field

[0001] The invention belongs to the technical field of optical axis testing of optoelectronic products, and in particular relates to a testing method for qualified detection of optoelectronic detection equipment. Background Art

[0002] The optical axis offset of airborne optoelectronic products in high and low temperature environments will lead to a decrease in the product's ranging performance and imaging quality, and is an important indicator for measuring the overall optical and mechanical performance of the device. In the past, when measuring the relative offset of the laser receiving and infrared optical axes, the angular coupling characteristics of the two-dimensional adjustment platform in the azimuth and pitch directions were not considered, and it was difficult to find obvious offset patterns from the test data, which brought great trouble to improving the optical and mechanical design.

[0003] In view of this, the present invention is proposed. Summary of the invention

[0004] The purpose of the present invention is to provide a test method for qualified detection of photoelectric detection equipment to solve the technical problem of large errors in the existing test methods. The technical solution of this case has many technical benefits, as described below:

[0005] Provided is a test method for qualified detection of photoelectric detection equipment, wherein the photoelectric detection equipment can receive infrared light and can emit and receive laser light, and comprises a first visible light collimator, a universal adjustment platform and a temperature control box arranged at intervals from left to right, a second reflector, an optical axis adjustment device and a second visible light collimator are adjacently installed on the universal adjustment platform, and the second reflector is located on the left side of the optical axis adjustment device, the photoelectric detection equipment is placed in the temperature control box, and a light window is arranged on a side wall adjacent to the universal adjustment platform, the photoelectric detection equipment is provided with a first reflector, and is electrically connected to an infrared detection display and an oscilloscope, wherein:

[0006] S101: The second visible light collimator emits visible light to the photoelectric detection device to complete the calibration of the angle deviation;

[0007] S102: lowering or raising the internal temperature of the temperature regulating box according to a preset temperature, measuring a first deviation, and judging whether the photoelectric detection device is qualified according to the first deviation;

[0008] S201: At room temperature, the photoelectric detection device receives the infrared light emitted by the optical axis adjustment device and adjusts the value of the angle deviation;

[0009] S202: The temperature control box lowers or raises the internal temperature according to the preset temperature, the laser receiving of the photoelectric detection device and the infrared receiving of the product are offset, and it is determined whether the deviation between the infrared optical axis receiving the product and the laser optical axis receiving the product is qualified;

[0010] S301: The optical axis adjustment device emits infrared light to calibrate the photoelectric detection device receiving the infrared light;

[0011] S302: The photoelectric detection device emits laser, and the optical axis adjustment device determines whether the photoelectric detection device is qualified based on the received laser.

[0012] Compared with the prior art, the technical solution provided by the present invention has the following beneficial effects:

[0013] Step S202 in this case provides a decoupling test method, which greatly reduces the reliance on the accuracy of the two-dimensional adjustment table, and can be extended to the decoupling test of the relative offset of the two optical axes of laser reception and laser emission under high and low temperature conditions. Overall, it improves the test method for product emission, laser reception and infrared reception. BRIEF DESCRIPTION OF THE DRAWINGS

[0014] In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings required for use in the embodiments or the description of the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying creative work.

[0015] Figure 1 It is a structural schematic diagram of the present invention. DETAILED DESCRIPTION

[0016] The following describes the embodiments of the present invention through specific examples, and those skilled in the art can easily understand other advantages and effects of the present invention from the contents disclosed in this specification. Obviously, the described embodiments are only part of the embodiments of the present invention, rather than all of the embodiments. The present invention can also be implemented or applied through other different specific embodiments, and the details in this specification can also be modified or changed in various ways based on different viewpoints and applications without departing from the spirit of the present invention. It should be noted that the following embodiments and features in the embodiments can be combined with each other without conflict. Based on the embodiments in the present invention, all other embodiments obtained by ordinary technicians in this field without making creative work belong to the scope of protection of the present invention.

[0017] It should be noted that various aspects of the embodiments within the scope of the appended claims are described below. It should be apparent that the aspects described herein can be embodied in a wide variety of forms, and any specific structure and / or function described herein is merely illustrative. Based on the present invention, it should be understood by those skilled in the art that an aspect described herein can be implemented independently of any other aspect, and two or more of these aspects can be combined in various ways. For example, any number of aspects described herein can be used to implement the device and / or practice the method. In addition, other structures and / or functionalities other than one or more of the aspects described herein can be used to implement this device and / or practice this method.

[0018] It should also be noted that the illustrations provided in the following embodiments are only schematic illustrations of the basic concept of the present invention. The drawings only show components related to the present invention rather than being drawn according to the number, shape and size of components in actual implementation. In actual implementation, the type, quantity and proportion of each component may be changed arbitrarily, and the component layout may also be more complicated.

[0019] In addition, in the following description, specific details are provided to facilitate a thorough understanding of the examples. However, those skilled in the art will understand that aspects can be practiced without these specific details. In order to enable those skilled in the art to better understand the present invention, the present invention is further described in detail below in conjunction with the accompanying drawings and specific embodiments. The terms "first" and "second" are used for descriptive purposes only and are not to be understood as indicating or implying relative importance or implicitly indicating the number of technical features indicated. Thus, the features defined as "first" and "second" may explicitly or implicitly include one or more of the features. In the description of the present invention, unless otherwise specified, "multiple" means two or more.

[0020] The airborne optoelectronic product to be tested is placed in a temperature control box 6 and cycled three times between -55°C and 70°C at a speed of 3°C / min to release assembly stress.

[0021] like Figure 1The test method for qualified detection of photoelectric detection equipment shown is applicable to qualified detection of photoelectric detection equipment. The photoelectric detection equipment can receive infrared light and can emit and receive laser, and includes a first visible light collimator 1, a universal adjustment platform 3 and a temperature control box 6 arranged at intervals from left to right. A second reflector 2, an optical axis adjustment device 4 and a second visible light collimator 11 are adjacently installed on the universal adjustment platform 3, and the second reflector 2 is located on the left side of the optical axis adjustment device 4, and the optical axis adjustment device 4 and the second visible light collimator 11 are arranged in parallel and at intervals. The photoelectric detection equipment is placed in the temperature control box 6, and a light window 5 is arranged on a side wall adjacent to the universal adjustment platform 3, and the light window 5 is made of zinc sulfide. A first reflector 8 is installed on the photoelectric detection device 7, and the first reflector 8 and the receiving light port window arranged on the photoelectric detection device 7 are staggered or arranged adjacent to each other. The photoelectric detection device 7 is electrically connected to an infrared detection display 9 and an oscilloscope 10 in the prior art, respectively, wherein,

[0022] S101: The second visible light collimator 11 emits visible light to the photoelectric detection device to complete the calibration of the angle deviation;

[0023] S102: The temperature regulating box 6 lowers or raises the internal temperature according to the preset temperature, measures the first deviation, and determines whether the photoelectric detection device is qualified according to the first deviation;

[0024] S201: At room temperature, the photoelectric detection device receives the infrared light emitted by the optical axis adjustment device 4 and adjusts the value of the angle deviation;

[0025] S202: Thermostat 6 lowers or raises the internal temperature according to the preset temperature, the laser receiving photoelectric detection device and the infrared receiving product are offset, and the deviation between the receiving infrared optical axis and the receiving laser optical axis of the product is determined to be qualified;

[0026] S301: The optical axis adjustment device 4 emits infrared light to calibrate the photoelectric detection device receiving the infrared light;

[0027] S302: The photoelectric detection device emits laser, and the optical axis adjustment device 4 determines whether the photoelectric detection device is qualified based on the received laser.

[0028] The photoelectric detection device 7 can only be used as a qualified product if all three conditions are met at the same time.

[0029] Specific:

[0030] 1) Test the offset of the infrared optical axis of the photoelectric detection device 7 relative to the first reflector 8, that is, the offset of the reference surface of the photoelectric detection device 7. In a high-altitude environment, the photoelectric detection device 7 on board changes with temperature. Due to its own characteristics, the infrared receiving optical path is offset from the airborne mounting surface. Therefore, in this case, the test is completed by installing the first reflector 8.

[0031] The method for completing the calibration of the angle deviation in S101 includes:

[0032] The second visible light collimator 11 emits visible light to the product, and after being emitted by the first reflector 8, it receives the reflected light from the first reflector 8, so that the angle deviation between the second visible light collimator 11 and the first reflector 8 is the standard value;

[0033] The photoelectric detection device 7 receives the infrared light emitted by the optical axis adjustment device 4, and through the infrared detection display, adjusts the infrared detection display to receive the infrared light emitted by the optical axis adjustment device 4 in the central area to complete the calibration of the angle deviation.

[0034] Furthermore, the method of measuring the first deviation and judging whether the photoelectric detection device is qualified in S102 includes:

[0035] Obtain the standard infrared optical axis deviation of the photoelectric detection equipment;

[0036] The temperature regulating box 6 lowers or raises the internal temperature according to the preset temperature, the receiving optical axis of the photoelectric detection device 7 and the reflection angle of the first reflector 8 are offset, and the universal adjustment platform 3 is readjusted so that the infrared light emitted by the optical axis adjustment device 4 is displayed in the center of the infrared detection display;

[0037] The deviation between the emitted light of the second visible light collimator and the reflected light of the first reflector 8 is obtained as the first deviation, that is, the offset of the infrared optical axis of the product relative to the first reflector 8 .

[0038] It is determined whether the first deviation is the same as the standard infrared optical axis deviation or is within the standard infrared optical axis deviation range. If so, the photoelectric detection device 7 is a qualified product.

[0039] 2) Photoelectric detection device 7 Detection of the offset of the laser receiving optical axis relative to the infrared receiving optical axis

[0040] Build a test platform for the consistency of laser receiving and infrared optical axes. Under normal temperature, ensure that the visible light collimator 1 and the reflector 2 are self-aligned, that is, the azimuth and pitch readings of the visible light collimator display are both 0, and the laser receiving optical axis and the infrared optical axis are aligned (that is, the azimuth and pitch readings of the two-dimensional adjustment stage 3 are both 0).

[0041] The method for adjusting the standard value of the angle deviation in S201 includes:

[0042] At room temperature, the infrared light emitted by the optical axis adjustment device 4 is received by the photoelectric detection device 7, and the peak value displayed by the oscilloscope is used to adjust the standard value of the angle deviation, that is, to adjust the displayed number to 0 scale.

[0043] Further, the method for determining whether the deviation between the infrared optical axis received by the product and the laser optical axis received by the product in S202 is qualified includes:

[0044] S2021: The temperature control box 6 lowers or raises the internal temperature according to the preset temperature, for example, the high and low temperature box is set to 70°C and kept warm for 4 hours. The laser receiving and infrared receiving of the photoelectric detection device 7 are offset, and the universal adjustment platform is adjusted to ensure that the infrared light emitted by the optical axis adjustment device 4 and the receiving of the photoelectric detection device 7 are kept at the same value;

[0045] S2022: The first visible light collimator 1 emits visible light, and the visible light is emitted through the second reflector 2 and received by the first visible light collimator 1, and the alignment value between the first visible light collimator 1 and the optical axis adjustment device 4 is adjusted;

[0046] S2023: The universal adjustment platform 3 swings in a first direction, for example, swings to the left as shown in the figure. During the swinging process, the peak value displayed by the oscilloscope 10 decreases until the oscilloscope 10 stops swinging when it displays half of the initial peak value, and the display angle deviation of the first visible light collimator 1 (angle deviation at room temperature) is obtained. The display angle deviation includes deviations in the X-axis and Y-axis directions. The universal adjustment platform 3 is adjusted to make the Y-axis deviation of the first visible light collimator 1 an initial state, that is, 0 scale, and observe whether the display of the oscilloscope 10 is half peak value. If not, the universal adjustment platform 3 continues to swing along the first direction. During the swinging process, the peak value displayed by the oscilloscope 10 decreases until the oscilloscope 10 stops swinging when it displays half of the initial peak value. The display angle deviation of the first visible light collimator 1 (angle deviation at room temperature) is obtained. The read deviation is the deviation of the X and Y axes. The universal adjustment platform 3 is adjusted until the Y-axis direction of the first visible light collimator 1 is an initial state. When the oscilloscope 10 displays half peak value, the X-axis value X2 of the first visible light collimator 1 is obtained. If so, the X-axis value x1 of the first visible light collimator 1 is obtained.

[0047] S2024: The universal adjustment platform 3 swings in the second direction. Taking the figure as an example, it swings to the right and repeats the above process. During the swinging process, the peak value displayed by the oscilloscope 10 decreases until the oscilloscope 10 displays half of the initial peak value, then the swinging stops, and the display angle deviation (angle deviation from the normal temperature) of the first visible light collimator 1 is obtained. The display angle deviation includes the deviation in the X-axis and Y-axis directions; the universal adjustment platform 3 is adjusted so that the Y-axis deviation of the first visible light collimator 1 is in the initial state, that is, 0 scale, and observe whether the display of the oscilloscope 10 is half peak value, if not , the universal adjustment platform 3 continues to swing along the second direction, and the peak value displayed by the oscilloscope 10 decreases during the swinging process. When the oscilloscope 10 displays half of the initial peak value, the swinging stops, and the display angle deviation of the first visible light collimator 1 is obtained (the angle deviation at room temperature). The read deviation is the deviation of the X and Y axes). The universal adjustment platform 3 is adjusted until the Y-axis direction of the first visible light collimator 1 is in the initial state. When the oscilloscope 10 displays half the peak value, the X-axis value X3 of the first visible light collimator 1 is obtained. If so, the X-axis value X4 of the first visible light collimator 1 is obtained.

[0048] S2025: half of the absolute value of the difference between X4 and X1 or X3 and X2 is used as the second deviation between the receiving infrared optical axis and the receiving laser optical axis of the photoelectric detection device;

[0049] The second deviation is compared with the standard value to determine whether the photoelectric detection equipment is qualified. For products with strict requirements, the second deviation must be consistent with the standard value.

[0050] The purpose of calculating the average of two readings (the above-mentioned X4 and X1 or X3 and X2) is to measure the center of the receiving optical axis and eliminate the two-dimensional platform error. The parallel light tube monitoring can monitor the platform deviation in real time and make adjustments. That is, the existing technical platform does not take this deviation into account, thereby reducing the accuracy of the test. The existing product optical axis adjustment device 4, although it meets the design requirements at the time of production, is far from enough for the optical detection of optoelectronic equipment. This case cleverly uses the principle of optical coupling, using the optical coupling of the first visible light parallel tube 1 and the second reflector 2 to adjust the ferry of the optical axis adjustment device 4, thereby overcoming the defect that the optical axis adjustment device 4 is not completely flat.

[0051] 3) Detection of deviation of product laser emission relative to the product infrared receiving optical axis;

[0052] The method of the optical axis adjustment device 4 in S302 for judging whether the photoelectric detection device is qualified according to the received laser includes:

[0053] The optical axis adjustment device 4 includes a target plate, and the infrared light emitted by the optical axis adjustment device 4 is received by the photoelectric detection device 7 and displayed on the infrared detection display 9;

[0054] The photoelectric detection device 7 emits laser light to irradiate the target plate, converts the received laser light into thermal radiation, and the thermal radiation is received by the photoelectric detection device and displayed on the infrared detection display 9;

[0055] It is determined whether the infrared light and thermal radiation displayed by the infrared detection display 9 coincide with each other. If so, the photoelectric detection device 7 is qualified.

[0056] The above is a detailed introduction to the product provided by the present invention. Specific examples are used in this article to illustrate the principle and implementation method of the present invention. The description of the above embodiments is only used to help understand the core idea of ​​the present invention. It should be pointed out that for ordinary technicians in this technical field, without departing from the principle of invention, several improvements and modifications can be made to the invention, and these improvements and modifications also fall within the scope of protection of the invention claims.

Claims

1. A test method for qualified detection of photoelectric detection equipment, the photoelectric detection equipment can receive infrared light and can emit and receive laser, characterized in that: The invention comprises a first visible light collimator, a universal adjustment platform and a temperature control box which are arranged at intervals from left to right, a second reflector, an optical axis adjustment device and a second visible light collimator are adjacently installed on the universal adjustment platform, and the second reflector is located on the left side of the optical axis adjustment device, a photoelectric detection device is placed in the temperature control box, and a light window is arranged on a side wall adjacent to the universal adjustment platform, a first reflector is installed on the photoelectric detection device, and an infrared detection display and an oscilloscope are electrically connected, wherein: S101: The second visible light collimator emits visible light to the photoelectric detection device to complete the calibration of the angle deviation; S102: the temperature control box lowers or raises the internal temperature according to the preset temperature, measures the first deviation, and judges whether the photoelectric detection device is qualified according to the first deviation, including obtaining the standard infrared optical axis deviation of the photoelectric detection device; the temperature control box lowers or raises the internal temperature according to the preset temperature, the receiving optical axis of the photoelectric detection device and the reflection angle of the first reflector are offset, and the universal adjustment platform is readjusted so that the infrared light emitted by the optical axis adjustment device is displayed in the center of the infrared detection display; the deviation between the emitted light of the second visible light collimator and the reflected light of the first reflector is obtained as the first deviation; it is judged whether the first deviation is the same as the standard infrared optical axis deviation or within the standard infrared optical axis deviation range, and if so, the photoelectric detection device is a qualified product; S201: At room temperature, the photoelectric detection device receives the infrared light emitted by the optical axis adjustment device and adjusts the value of the angle deviation; S202: The temperature control box lowers or raises the internal temperature according to the preset temperature, the laser reception of the photoelectric detection device and the infrared reception of the product are offset, and the deviation between the infrared optical axis received by the product and the laser optical axis received by the product is determined to be qualified, including: S2021: the temperature control box lowers or raises the internal temperature according to the preset temperature, the laser receiving and infrared receiving of the photoelectric detection device are offset, and the universal adjustment platform is adjusted to ensure that the infrared light emitted by the optical axis adjustment device and the infrared light received by the photoelectric detection device are kept at the same value; S2022: The first visible light collimator emits visible light, and the visible light is emitted through the second reflector and received by the first visible light collimator, and the alignment between the first visible light collimator and the optical axis adjustment device is adjusted; S2023: the Vientiane adjustment platform is swung in a first direction, and the peak value displayed by the oscilloscope decreases during the swinging process, and the swinging is stopped when the oscilloscope displays half of the initial peak value, and the display angle deviation of the first visible light collimator is obtained, and the display angle deviation includes deviations in the X-axis and Y-axis directions; the Vientiane adjustment platform is adjusted to make the Y-axis deviation of the first visible light collimator an initial state, and observe whether the display of the oscilloscope is half the peak value, if not, the Vientiane adjustment platform continues to swing in the first direction, and the peak value displayed by the oscilloscope decreases during the swinging process, and the swinging is stopped when the oscilloscope displays half of the initial peak value, and the display angle deviation of the first visible light collimator is obtained, which includes deviations in the X-axis and Y-axis directions; the Vientiane adjustment platform is adjusted until the Y-axis direction of the first visible light collimator is an initial state, and when the oscilloscope displays half the peak value, the X-axis value X2 of the first visible light collimator is obtained, and if so, the X-axis value x1 of the first visible light collimator is obtained; S2024: the Vientiane adjustment platform swings in the second direction, and the peak value displayed by the oscilloscope decreases during the swinging process, and the swinging stops when the oscilloscope displays half of the initial peak value, and the display angle deviation of the first visible light collimator is obtained. The display angle deviation includes deviations in the X-axis and Y-axis directions; the Vientiane adjustment platform is adjusted to make the Y-axis deviation of the first visible light collimator an initial state, and observe whether the display of the oscilloscope is half the peak value. If not, the Vientiane adjustment platform continues to swing in the second direction, and the peak value displayed by the oscilloscope decreases during the swinging process, and the swinging stops when the oscilloscope displays half of the initial peak value. The display angle deviation of the first visible light collimator is obtained, including deviations in the X-axis and Y-axis directions. The Vientiane adjustment platform is adjusted until the Y-axis direction of the first visible light collimator is an initial state. When the oscilloscope displays half the peak value, the X-axis value X3 of the first visible light collimator is obtained. If yes, the X-axis value X4 of the first visible light collimator is obtained. S2025: half of the absolute value of the difference between X4 and X1 or X3 and X2 is used as the second deviation between the infrared light axis received by the photoelectric detection device and the laser light axis received; the second deviation is compared with the standard value to determine whether the photoelectric detection device is qualified; S301: The optical axis adjustment device emits infrared light to calibrate the photoelectric detection device receiving the infrared light; S302: The photoelectric detection device emits a laser, and the optical axis adjustment device determines whether the photoelectric detection device is qualified based on the received laser, including that the optical axis adjustment device includes a target plate, and the optical axis adjustment device emits infrared light which is received by the photoelectric detection device and displayed on the infrared detection display; the photoelectric detection device emits a laser to irradiate the target plate, converts the received laser into thermal radiation, and the thermal radiation is received by the photoelectric detection device and displayed on the infrared detection display; it is determined whether the infrared light and thermal radiation displayed on the infrared detection display coincide with each other, and if so, the photoelectric detection device is qualified.

2. The testing method according to claim 1, characterized in that: The method for completing the calibration of the angle deviation in S101 includes: The second visible light collimator emits visible light to the product, and after being emitted by the first reflector, it receives reflected light from the first reflector, so that the angle deviation between the second visible light collimator and the first reflector is the standard value; The photoelectric detection device receives the infrared light emitted by the optical axis adjustment device, and through the infrared detection display, adjusts the infrared detection display to receive the infrared light emitted by the optical axis adjustment device in the central area to complete the accuracy correction of the angle deviation.

3. The testing method according to claim 1, characterized in that: The method for adjusting the standard value of the angle deviation in S201 includes: At normal temperature, the infrared light emitted by the optical axis adjustment device is received by the photoelectric detection device, and the peak value displayed by the oscilloscope is used to adjust the accuracy of the angle deviation.

4. The testing method according to claim 1, characterized in that: The light window is a zinc sulfide light window.

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