Mechanical component measurement method, device and electronic equipment

Abstract

The present application provides a mechanical component measurement method, device and electronic device, the method comprising: obtaining the analytical relationship between the light angle parameter, light characteristic parameter and mechanical parameter corresponding to the sample to be tested in the target application scenario; establishing the experimental coordinate system of the sample to be tested; obtaining the light characteristic parameter distribution image set of the test area of ​​the sample to be tested in the experimental coordinate system; determining the optimal mechanical parameter value of each test point based on the analytical relationship and the light characteristic parameter distribution image of the test area under different light angle parameter values; determining the mechanical parameter distribution image set corresponding to the test area according to the optimal mechanical parameter value of each test point. The present application can improve the accuracy of the stress or strain field analysis of the material.

Description

Technical Field

[0001] The present application relates to the technical field of material mechanical property measurement, and in particular to a mechanical component measurement method, device and electronic equipment. Background Art

[0002] With the development of optical and spectroscopic techniques, the analysis of the stress or strain state of a single point of a material has been unable to meet engineering needs, while the analysis of the stress or strain field of a material has received widespread attention. The existing methods of analyzing the stress or strain field of a material using optical and spectroscopic measurement techniques can generally include: measuring the optical or spectral information of the same position of the material under multiple different geometric configurations or polarization configurations, and using the analytical relationship between the incident light geometric angle or incident light polarization angle-light characteristic parameters (such as light intensity, frequency shift, etc.)-stress or strain of the material to measure and characterize the stress or strain state of each position of the material, thereby realizing the analysis of the stress or strain field of the material. Related methods include the photoelastic multi-step phase shift method, the Raman strain rosette method, etc., but these methods are limited by the accuracy and sensitivity of key components such as detectors and polarization angle control devices in the experimental equipment. The accuracy of analyzing the stress or strain field of the material is low under conditions such as small strain and complex stress state, and it is difficult to meet engineering needs. Summary of the invention

[0003] In view of this, the purpose of the present application is to provide a mechanical component measurement method, device and electronic equipment to improve the accuracy of material stress or strain field analysis.

[0004] In a first aspect, an embodiment of the present application provides a method for measuring a mechanical component, the method comprising: obtaining an analytical relationship among light angle parameters, light characteristic parameters and mechanical parameters corresponding to a sample to be tested in a target application scenario; wherein the analytical relationship is determined based on the inherent properties of the sample to be tested and the polarization configuration or geometric configuration of the optical measurement system corresponding to the target application scenario; the mechanical parameters include multiple mechanical components; establishing an experimental coordinate system for the sample to be tested; obtaining a set of light characteristic parameter distribution images of a test area of ​​the sample to be tested in the experimental coordinate system; wherein the test area includes multiple test points; the light characteristic parameters The quantity distribution image set includes the light characteristic parameter distribution images of the area to be measured at different light angle parameter values; all the points to be measured in the area to be measured correspond to the pixel positions of each of the light characteristic parameter distribution images one by one; based on the analytical relationship and the light characteristic parameter distribution images of the area to be measured at different light angle parameter values, the optimal mechanical parameter value of each of the points to be measured is determined; according to the optimal mechanical parameter value of each of the points to be measured, the mechanical parameter distribution image set corresponding to the area to be measured is determined; wherein, the mechanical parameter distribution image set includes the mechanical parameter distribution image corresponding to each mechanical component of the optimal mechanical parameter value.

[0005] As a possible implementation, the step of determining the optimal mechanical parameter value of each of the points to be measured based on the analytical relationship and the light characteristic parameter distribution images of the area to be measured under different light angle parameters includes: obtaining the light characteristic parameter value of each of the light characteristic parameter distribution images at the same pixel position; based on the analytical relationship and the light characteristic parameter value of each of the light characteristic parameter distribution images at the same pixel position and the light angle parameter value corresponding to each of the light characteristic parameter distribution images, respectively determining the optimal mechanical parameter value of each of the points to be measured.

[0006] As a possible implementation, the steps of determining the optimal mechanical parameter value of each of the points to be measured based on the analytical relationship and the light characteristic parameter value of each of the light characteristic parameter distribution images at the same pixel position include: for each pixel position, associating the light characteristic parameter value of each of the light characteristic parameter distribution images at the pixel position with the light angle parameter value corresponding to each of the light characteristic parameter distribution images as a data sample to obtain a data sample set corresponding to each of the points to be measured; performing multiple fitting iterations on the data sample set corresponding to each of the points to be measured based on the analytical relationship, and determining the optimal mechanical parameter value of each of the points to be measured according to the fitting iteration results; wherein the fitting iteration result is the result of one fitting iteration determined from the multiple fitting iterations according to the principle of minimum residual.

[0007] As a possible implementation, multiple fitting iterations are performed on the data sample set corresponding to each of the points to be measured based on the analytical relationship, and the step of determining the optimal mechanical parameter value of each of the points to be measured according to the fitting iteration results includes: for each of the points to be measured, using the analytical relationship as a function expression of the light characteristic parameter with respect to the angle parameter, multiple fitting iterations are performed on the data sample set corresponding to the point to be measured, until the residual between the light characteristic parameter values ​​of all data samples in the data sample set corresponding to the point to be measured and all the light characteristic parameter values ​​obtained by fitting is minimized, the iteration stops, and the optimal mechanical parameter value of the point to be measured is obtained.

[0008] As a possible implementation, the step of obtaining a set of light characteristic parameter distribution images of the test area of ​​the sample to be tested in the experimental coordinate system includes: determining the area at which the optical lens of the optical measurement system is aimed at the sample to be tested or the area at which the optical lens of the optical measurement system is scanned by the optical lens of the optical measurement system as the test area; collecting light characteristic parameter distribution images of the test area at different light angle parameter values ​​through the optical measurement system, and forming the light characteristic parameter distribution image set from all collected light characteristic parameter distribution images.

[0009] As a possible implementation, the step of collecting the light characteristic parameter distribution image of the area to be measured at different light angle parameter values ​​through the optical measurement system includes: changing the light angle parameter of the optical measurement system according to a preset step size, and collecting the light characteristic parameter distribution image of the area to be measured at the light angle parameter through the optical measurement system each time the light angle parameter is changed, so as to obtain the light characteristic parameter distribution image of the area to be measured at different light angle parameters.

[0010] As a possible implementation, the mechanical parameter is strain or stress.

[0011] As a possible implementation, the light angle parameter is the incident light polarization angle or the incident light geometric angle.

[0012] In a second aspect, an embodiment of the present application further provides a stress component measurement device, the device comprising: an analytical relationship acquisition module, used to obtain the analytical relationship between the light angle parameters, light characteristic parameters and mechanical parameters corresponding to the sample to be tested in the target application scenario; wherein the analytical relationship is determined based on the inherent properties of the sample to be tested and the polarization configuration or geometric configuration of the optical measurement system corresponding to the target application scenario; the mechanical parameters include multiple mechanical components; a coordinate system establishment module, used to establish an experimental coordinate system for the sample to be tested; an image acquisition module, used to obtain a set of light characteristic parameter distribution images of the test area of ​​the sample to be tested in the experimental coordinate system; wherein the test area includes multiple test points; The optical characteristic parameter distribution image set includes the optical characteristic parameter distribution images of the area to be measured at different optical angle parameter values; all the points to be measured in the area to be measured correspond to the pixel positions of each of the optical characteristic parameter distribution images one by one; a first processing module is used to determine the optimal mechanical parameter value of each of the points to be measured based on the analytical relationship and the optical characteristic parameter distribution images of the area to be measured at different optical angle parameter values; a second processing module is used to determine the mechanical parameter distribution image set corresponding to the area to be measured according to the optimal mechanical parameter value of each of the points to be measured; wherein the mechanical parameter distribution image set includes a stress parameter distribution image corresponding to each mechanical component of the optimal mechanical parameter value.

[0013] In a third aspect, an embodiment of the present application further provides an electronic device, comprising a processor and a memory, wherein the memory stores computer executable instructions that can be executed by the processor, and the processor executes the computer executable instructions to implement the above-mentioned mechanical component measurement method.

[0014] The embodiments of the present application provide a mechanical component measurement method, device and electronic device. After obtaining the analytical relationship among the light angle parameters, light characteristic parameters and mechanical parameters corresponding to the sample to be tested in the target application scenario, an experimental coordinate system of the sample to be tested is established and a set of light characteristic parameter distribution images of the test area (including multiple test points) of the sample to be tested in the experimental coordinate system is obtained (including the light characteristic parameter distribution images of the test area at different light angle parameter values), wherein all the test points in the test area correspond one-to-one to the pixel positions of each light characteristic parameter distribution image; then, based on the analytical relationship and the light characteristic parameter distribution images of the test area at different light angle parameter values, the optimal mechanical parameter value of each test point is determined, and according to the optimal mechanical parameter value of each test point, a set of mechanical parameter distribution images corresponding to the test area (including the mechanical parameter distribution image corresponding to each mechanical component of the optimal mechanical parameter value) is determined. By using the above technology, the analytical relationship between light angle parameter-light characteristic parameter-mechanical parameter can be used to perform pixel-by-pixel analysis on the light characteristic parameter distribution image corresponding to different light angle parameter values, and then determine the mechanical state of each point to be measured in the measured area, thereby analyzing the full-field mechanical state distribution of the measured area. This operation method can improve the accuracy of material stress or strain field analysis, and can meet the engineering needs of material stress or strain field analysis under conditions such as small and complex mechanical states.

[0015] Other features and advantages of the present application will be described in the following description, and partly become apparent from the description, or understood by practicing the present application. The purpose and other advantages of the present application are realized and obtained by the structures specifically pointed out in the description, claims and drawings.

[0016] In order to make the above-mentioned objects, features and advantages of the present application more obvious and easy to understand, preferred embodiments are specifically cited below and described in detail with reference to the attached drawings. BRIEF DESCRIPTION OF THE DRAWINGS

[0017] In order to more clearly illustrate the specific implementation methods of the present application or the technical solutions in the prior art, the drawings required for use in the specific implementation methods or the description of the prior art will be briefly introduced below. Obviously, the drawings described below are some implementation methods of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying any creative work.

[0018] Figure 1 A schematic diagram of a flow chart of a mechanical component measurement method provided in an embodiment of the present application;

[0019] Figure 2 A schematic flow chart of another mechanical component measurement method provided in an embodiment of the present application;

[0020] Figure 3 Partial example diagram of another mechanical component measurement method provided in an embodiment of the present application;

[0021] Figure 4 Partial example diagram of another mechanical component measurement method provided in an embodiment of the present application;

[0022] Figure 5 A schematic diagram of the structure of a mechanical component measurement device provided in an embodiment of the present application;

[0023] Figure 6 A schematic diagram of the structure of an electronic device provided in an embodiment of the present application. DETAILED DESCRIPTION

[0024] In order to make the purpose, technical solution and advantages of the embodiments of the present application clearer, the technical solution of the present application will be clearly and completely described in combination with the embodiments below. Obviously, the described embodiments are part of the embodiments of the present application, not all of the embodiments. Based on the embodiments in the present application, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present application.

[0025] At present, the existing methods of using optical and spectroscopic measurement technology to analyze material stress or strain fields can generally include: measuring the optical or spectral information of the same position of the material under multiple different geometric configurations or polarization configurations, and using the analytical relationship between the incident light geometric angle or incident light polarization angle of the material-light characteristic parameters (such as light intensity, frequency shift, etc.)-stress or strain to measure and characterize the stress or strain state of each position of the material, thereby analyzing the material stress or strain field. Related methods include photoelastic multi-step phase shift method, Raman strain rosette method, etc., but these methods are limited by the accuracy and sensitivity of key components such as detectors and polarization angle control devices in experimental equipment. The accuracy of material stress or strain field analysis under conditions such as small strain and complex stress state is low, and it is difficult to meet engineering needs. Based on this, the present application implements a mechanical component measurement method, device and electronic equipment, which can improve the accuracy of material stress or strain field analysis.

[0026] To facilitate understanding of this embodiment, a mechanical component measurement method disclosed in the embodiment of the present application is first described in detail, see Figure 1 A schematic flow chart of a mechanical component measurement method is shown, the method comprising the following steps:

[0027] Step S102, obtaining the analytical relationship between the light angle parameters, light characteristic parameters and mechanical parameters corresponding to the sample to be tested in the target application scenario; wherein the analytical relationship is determined based on the inherent properties of the sample to be tested and the polarization configuration or geometric configuration of the optical measurement system corresponding to the target application scenario; the mechanical parameters include multiple mechanical components.

[0028] The above-mentioned target application scenarios can be characterizing the full-field stress state of materials, characterizing the full-field strain state of materials, measuring the full-field stress state of materials, measuring the full-field strain state of materials, etc., which can be determined according to actual conditions and are not limited to this. The "materials" mentioned in this application can be selected according to the target application scenarios and the optical measurement systems corresponding to the target application scenarios. Different optical measurement methods correspond to different applicable materials and are not limited to this; for example, for Raman measurement technology, the samples to be tested can be semiconductor materials such as silicon, zinc oxide, gallium nitride, graphene, etc. with various crystal orientations of lattice structures, because the Raman peaks of these materials are more sensitive to stress changes; for second harmonic measurement technology, the samples to be tested can be two-dimensional transition metal sulfides such as molybdenum sulfide and tungsten sulfide, as well as semiconductor materials such as silicon and zinc oxide with crystal orientation downward when the lattice structure is non-centrosymmetric.

[0029] The above-mentioned light angle parameters can be the incident light geometric angle (used to characterize the incident direction of the incident light in the above-mentioned optical measurement system), the incident light polarization angle (used to characterize the polarization direction of the incident light in the above-mentioned optical measurement system), etc., which can be determined according to actual conditions and are not limited to this.

[0030] The above-mentioned light characteristic parameters may be light intensity, frequency shift, etc., which may be determined according to actual conditions and are not limited thereto.

[0031] The above-mentioned mechanical parameters may be parameters related to the stress or strain state of the material, such as strain, stress, etc., which can be determined according to the actual situation and are not limited to this. Taking the above-mentioned mechanical parameter as stress as an example, the multiple mechanical components included in the above-mentioned mechanical parameter are multiple stress components; taking the above-mentioned stress parameter as strain as an example, the multiple mechanical components included in the above-mentioned mechanical parameter are multiple strain components. In addition, since there are two ways to express strain, namely, the normal strain expression and the principal strain expression, the above-mentioned mechanical parameter may be a normal strain or a principal strain; if the above-mentioned mechanical parameter is a normal strain, the multiple mechanical components included in the above-mentioned mechanical parameter are two mutually orthogonal normal strain components and a shear strain component; if the above-mentioned mechanical parameter is a principal strain, the multiple mechanical components included in the above-mentioned mechanical parameter are the first principal strain, the second principal strain and the principal strain azimuth component. Since the expression of stress is similar to that of strain, the above-mentioned mechanical parameters can also be normal stress or principal stress. Accordingly, the multiple mechanical components included in the above-mentioned mechanical parameters can be two mutually orthogonal normal stress components and one shear stress component, or can be the first principal stress, the second principal stress and the principal stress azimuth component.

[0032] The optical measurement system corresponding to the above target application scenarios may be a second harmonic measurement system, an angle-resolved Raman measurement system, an infrared photoelastic system, a Renishaw Raman spectrometer, etc. The specific system can be determined according to actual conditions and is not limited to this.

[0033] The above-mentioned polarization configuration is usually determined according to the relationship between the polarization direction of the incident light in the optical measurement system and the polarization direction of the analyzer, and common polarization configurations include parallel polarization configuration, perpendicular polarization configuration, etc. The above-mentioned geometric configuration is usually determined according to the incident direction of the incident light in the optical measurement system, and common polarization configurations include parallel geometric configuration, perpendicular geometric configuration, etc.

[0034] The above analytical relationship is determined according to the inherent properties of the sample to be measured and the polarization configuration or geometric configuration of the optical measurement system corresponding to the target application scenario. Therefore, for different samples to be measured, different optical measurement systems, and different polarization configurations or geometric configurations, the expression corresponding to the above analytical relationship is different. For example, if the above optical measurement system is a second harmonic measurement system, and the polarization configuration of the second harmonic measurement system is a parallel polarization configuration, then the expression corresponding to the analytical relationship between the incident light polarization angle, light intensity, and normal strain can be:

[0035]

[0036] Among them, χ0 is a non-zero parameter related to the sample material itself and the incident light used, p1 and p2 are non-zero parameters related to the inherent properties of the sample material to be tested. φ is the polarization angle of the incident light, and I is the second harmonic light intensity under any strain state. εx for and ε y are the normal strain components in two different directions that are orthogonal to each other, and γ is the shear strain component.

[0037] Step S104, establishing an experimental coordinate system for the sample to be tested.

[0038] The above-mentioned experimental coordinate system mainly refers to a plane coordinate system for indicating the orientation of the sample to be tested. In the above-mentioned optical measurement system, the optical image corresponding to the sample to be tested is usually displayed on the computer screen through CCD (Charge-coupled Device, charge coupled device, also known as CCD image sensor). As a possible implementation, the optical image displayed on the computer screen can be set as the X-axis and Y-axis of the experimental coordinate system along the left-right direction and the up-down direction of the computer screen. As other possible implementations, since the above-mentioned optical measurement system is usually equipped with a displacement stage for placing samples and controlling the movement of samples, the left-right direction and the front-back direction of the displacement stage table are usually consistent with the left-right direction and the up-down direction of the optical image corresponding to the sample to be tested displayed on the computer screen. For example, the sample to be tested moves along the left-right direction of the displacement stage table, and the optical image corresponding to the sample to be tested displayed on the computer screen is also moved left-right, that is, it moves along the X-axis of the set experimental coordinate system; the left-right direction and the front-back direction of the displacement stage table can be set as the X-axis and Y-axis of the experimental coordinate system.

[0039] Step S106, obtaining a set of light characteristic parameter distribution images of the test area of ​​the test sample in the experimental coordinate system; wherein the test area includes multiple test points; the light characteristic parameter distribution image set includes light characteristic parameter distribution images of the test area under different light angle parameter values; all test points in the test area correspond one-to-one to the pixel positions of each light characteristic parameter distribution image.

[0040] The above-mentioned “one-to-one correspondence” may include not only a one-to-one correspondence between the point to be measured and the inherent pixel position of the light feature distribution image, but also directly using the inherent pixel position of the light feature distribution image as the point to be measured.

[0041] As a possible implementation, the above step S106 can specifically adopt the following operation mode: (1) the area where the optical lens of the optical measurement system is aimed at the sample to be measured or the area where the optical lens of the optical measurement system is scanned by the sample to be measured is determined as the area to be measured; (2) the optical measurement system is used to collect light characteristic parameter distribution images of the area to be measured at different light angle parameter values, and all the collected light characteristic parameter distribution images are combined into the above light characteristic parameter distribution image set.

[0042] Specifically, taking the light angle parameter as the polarization angle of the incident light as an example, the initial polarization direction of the incident light is generally made parallel to the X-axis of the experimental coordinate system, and the polarization angle of the incident light at this time is defined as 0 degrees, and the polarizer at this time is also marked as 0 degrees. The polarization angle of the incident light corresponding to the position of the polarizer is the angle that the polarization direction of the incident light turns from 0 degrees during the experiment, that is, the angle between the polarization direction of the incident light and the experimental coordinate axis X. The adjustment of the polarization angle of the incident light can be achieved by rotating the half-wave plate of the above optical measurement system. Since the sample to be measured is usually placed on the displacement stage of the above optical measurement system, the relative position between the sample to be measured and the optical lens of the optical measurement system can be adjusted by the displacement stage, and then the area where the sample to be measured is aligned with the optical lens when it is relatively stationary with the optical lens or the area where the sample to be measured is scanned by the optical lens when it is in relative motion with the optical lens is determined as the area to be measured. After the area to be tested is determined, the half-wave plate can be rotated in a manner that the incident light polarization angle changes from 0 degrees to 360 degrees at equal or unequal angle intervals. Each time the half-wave plate is rotated (i.e., each time the incident light polarization angle changes, i.e., each time an incident light polarization angle value is generated), the optical measurement system is used to measure and obtain the light characteristic parameter distribution image of the entire area to be tested at the incident light polarization angle value; and for each light characteristic parameter distribution image, the light characteristic parameter value of each point to be tested in the area to be tested corresponds to the pixel value of each pixel position of the light characteristic parameter distribution image. Through this operation mode, the light characteristic parameter distribution image of the sample to be tested at different incident light polarization angle values ​​can be obtained, and the light characteristic parameter distribution images of the area to be tested at all incident light polarization angle values ​​are combined into a group of image sequences (the group of image sequences can also be regarded as an image set composed of multiple light characteristic parameter distribution images), and the group of image sequences is the light characteristic parameter distribution image set of the area to be tested in the experimental coordinate system.

[0043] In actual application, for the convenience of operation, the above-mentioned step of collecting the light characteristic parameter distribution image of the area to be measured at different light angle parameter values ​​through the optical measurement system can specifically adopt the following operation method: change the incident light polarization angle of the optical measurement system according to a preset step size, and each time the incident light polarization angle is changed, collect the light characteristic parameter distribution image of the area to be measured at the incident light polarization angle through the optical measurement system to obtain the light characteristic parameter distribution image of the area to be measured at different incident light polarization angles.

[0044] Step S108, determining the optimal mechanical parameter value of each point to be measured based on the analytical relationship and the light characteristic parameter distribution image of the area to be measured at different light angle parameter values.

[0045] For a certain point to be measured in the area to be measured, as long as the light angle parameter value and the light characteristic parameter value of the point to be measured are known, the mechanical parameter value of the point to be measured can be solved according to the analytical relationship between the light angle parameter, the light characteristic parameter and the mechanical parameter. As for the above-mentioned light characteristic parameter distribution image set, each of the light characteristic parameter distribution images corresponds to a light angle parameter value (i.e., a known light angle parameter value), and the light characteristic parameter value corresponding to each pixel position of each light characteristic parameter distribution image is known. The above-mentioned analytical relationship can be used to perform fitting iterations on the light angle parameter value corresponding to each pixel position of all light characteristic parameter distribution images in the above-mentioned light characteristic parameter distribution image set and the light characteristic parameter values ​​of all light characteristic parameter distribution images in the above-mentioned light characteristic parameter distribution image set. For the same point to be measured, each iteration corresponds to a set of mechanical parameter values. When the residual value between all measured light characteristic parameter values ​​and all fitted light characteristic parameter values ​​reaches the minimum during the iteration process, the iteration process stops, and the mechanical parameter value corresponding to the point to be measured at this time in the obtained set of mechanical parameter values ​​can be determined as the optimal mechanical parameter value of the point to be measured. For each point to be measured in the area to be measured, the optimal mechanical parameter value can be used to characterize the full-field mechanical properties of the point to be measured.

[0046] Step S110, determining a set of mechanical parameter distribution images corresponding to the measured area according to the optimal mechanical parameter value of each measured point; wherein the set of mechanical parameter distribution images includes a mechanical parameter distribution image corresponding to each mechanical component of the optimal mechanical parameter value.

[0047] Since the first mechanical parameter includes multiple mechanical components, after determining the optimal mechanical parameter value of each test point in the test area, the value of each mechanical component of the optimal mechanical parameter value of each test point can be determined, and then a mechanical parameter distribution image corresponding to each mechanical component of the optimal mechanical parameter value of the test area is generated. These mechanical parameter distribution images constitute a set of mechanical parameter distribution images corresponding to the test area.

[0048] A mechanical component measurement method provided in an embodiment of the present application, after obtaining the analytical relationship among the light angle parameters, light characteristic parameters and mechanical parameters corresponding to the sample to be tested in the target application scenario, establishes an experimental coordinate system of the sample to be tested and obtains a set of light characteristic parameter distribution images of the test area (including multiple test points) of the sample to be tested in the experimental coordinate system (including the light characteristic parameter distribution images of the test area under different light angle parameter values), wherein all the test points in the test area correspond one-to-one to the pixel positions of each light characteristic parameter distribution image; then, based on the analytical relationship and the light characteristic parameter distribution images of the test area under different light angle parameter values, the optimal mechanical parameter value of each test point in the test area is determined, and according to the optimal mechanical parameter value of each test point, a set of mechanical parameter distribution images corresponding to the test area (including the mechanical parameter distribution image corresponding to each mechanical component of the optimal mechanical parameter value) is determined. By using the above technology, the analytical relationship between light angle parameter-light characteristic parameter-mechanical parameter can be used to perform pixel-by-pixel analysis on the light characteristic parameter distribution image corresponding to different light angle parameter values, and then determine the mechanical state of each point to be measured in the measured area, thereby analyzing the full-field mechanical state distribution of the measured area. This operation method can improve the accuracy of material stress or strain field analysis, and can meet the engineering needs of material stress or strain field analysis under conditions such as small and complex mechanical states.

[0049] On the basis of the above stress component measurement method, in order to further ensure the reliability of the above first stress parameter value, as a possible implementation method, the above step S108 can specifically adopt the following operation method: (1) obtaining the light characteristic parameter value of each light characteristic parameter distribution image at the same pixel position; (2) based on the analytical relationship and the light characteristic parameter value of each light characteristic parameter distribution image at the same pixel position and the light angle parameter value corresponding to each of the light characteristic parameter distribution images, respectively determine the optimal mechanical parameter value of each point to be measured.

[0050] Specifically, for each pixel position, the light characteristic parameter value of each light characteristic parameter distribution image at the pixel position and the light angle parameter value corresponding to each light characteristic parameter distribution image can be associated as a data sample to obtain a data sample set corresponding to each point to be measured; then, based on the analytical relationship, multiple fitting iterations are performed on the data sample set corresponding to each point to be measured, and the optimal mechanical parameter value of each point to be measured is determined according to the fitting iteration result; wherein the fitting iteration result can be the result of a fitting iteration determined from the above-mentioned multiple fitting iterations according to the principle of minimum residual.

[0051] The above-mentioned operation method of determining the optimal mechanical parameter value can ensure that the optimal mechanical parameter value of each measured point is closer to the actual situation, thereby improving the reliability of characterizing the full-field mechanical properties (such as stress state, strain state, etc.) of the measured area.

[0052] In actual application, for the convenience of operation, the above-mentioned steps of performing multiple fitting iterations on the data sample set corresponding to each test point based on the analytical relationship, and determining the optimal mechanical parameter value of each test point according to the fitting iteration results, can be specifically performed in the following manner: for each test point, the analytical relationship is used as the function expression of the light characteristic parameter with respect to the angle parameter, and the data sample set corresponding to the test point is fitted and iterated multiple times until the residual between the light characteristic parameter values ​​of all data samples in the data sample set corresponding to the test point and all the fitted light characteristic parameter values ​​reaches the minimum, the iteration stops, and the optimal mechanical parameter value of the test point is obtained.

[0053] Based on the above-mentioned mechanical component measurement method, taking the specific application scenario of using second harmonic to characterize the full-field strain state of the material as an example, the above-mentioned optical measurement system is a second harmonic measurement system, the above-mentioned light angle parameter is the polarization angle of the incident light, the above-mentioned light characteristic parameter is the second harmonic light intensity, the above-mentioned light characteristic parameter distribution image set is a second harmonic light intensity distribution image set of the measured area in the experimental coordinate system (that is, a set of second harmonic light intensity distribution image sequences, which can also be called "second harmonic spectrum images"), and the above-mentioned mechanical parameter is strain; based on this, the embodiment of the present application also provides another mechanical component measurement method, see Figure 2 As shown, the method comprises the following steps:

[0054] Step S202, obtaining an analytical relationship expression among the incident light polarization angle, the second harmonic light intensity and the strain; wherein the analytical relationship expression is determined according to the inherent properties of the sample to be measured and the polarization configuration of the second harmonic measurement system; the strain includes multiple strain components.

[0055] Step S204, establishing an experimental coordinate system for the sample to be tested.

[0056] Specifically, Figure 3 As an example, the left and right directions and the front and back directions of the translation stage used to place and move the sample to be measured in the second harmonic measurement system are set as the X' axis and Y' axis of the experimental coordinate system respectively; when the sample to be measured is under any strain, if the strain is represented by the positive strain, the positive strain includes the positive strain component ε along the X' axis direction of the experimental coordinate system x , the positive strain component ε along the Y' axis of the experimental coordinate system yIf the strain is represented by principal strain, the principal strain includes the first principal strain ε1, the second principal strain ε2 and the principal strain azimuth component (i.e. the angle between the direction of the first principal strain ε1 and the X' axis of the experimental coordinate system) θ.

[0057] The principal strain and the normal strain are two different ways of expressing the same strain. The two are just coordinate conversions, which will not have a substantial impact on the strain. Therefore, the specific way to express the strain can be determined according to actual needs. The conversion process between the principal strain and the normal strain is described as follows:

[0058] First, define any strain tensor u in the plane expressed as normal strain <ar>< / ar> and the corresponding strain tensor u expressed in terms of principal strains <pr>< / pr> And the coordinate transformation matrix F used to realize the conversion between the two strain expressions, where

[0059] The following formula can then be used to convert the two strain expressions:

[0060]

[0061] Step S206, setting the polarization configuration of the second harmonic measurement system and setting the polarization angle of the incident light under the polarization configuration.

[0062] For the same polarization configuration, when the polarization direction of the incident light is changed, the polarization direction of the analyzer will also change synchronously. In the second harmonic measurement system, the half-wave plate is used to change the polarization direction of the incident light, and the polarizer is used to analyze the polarization. Therefore, after setting the initial angle between the half-wave plate and the polarizer, as long as the rotation angles of the half-wave plate and the polarizer are consistent, the polarization configuration will not change. Taking the parallel polarization configuration as an example, the process of generating the second harmonic signal from the incident laser is the process of two photons merging into one photon. The direction of the two photons of the incident laser can be expressed as j 、e k (e j 、e k The same direction) is used to represent the polarization direction of the incident laser in the second harmonic measurement system (that is, the polarization direction of the incident light), and the direction of a photon of the second harmonic signal is e i To represent the polarization direction of the second harmonic signal (that is, the polarization direction of the analyzer), the polarization direction of the incident light corresponds to the polarization direction of the analyzer. When the polarization direction of the incident light changes, the polarization direction of the analyzer also changes by the same angle, thereby maintaining the parallel polarization configuration.

[0063] After the polarization configuration is set, the angle between the polarization direction of the incident light and the X' axis of the experimental coordinate system is the incident light polarization angle (i.e. the azimuth of the polarization configuration in the experimental coordinate system), which is represented by φ and can be adjusted by rotating the half-wave plate.

[0064] Step S208, setting the test area of ​​the sample to be tested, and obtaining a set of second harmonic light intensity distribution images of the test area in the experimental coordinate system; wherein the test area includes multiple test points; the set of second harmonic light intensity distribution images includes second harmonic light intensity distribution images of the test area under different incident light polarization angles; all test points of the test area correspond one-to-one to the pixel positions of each second harmonic light intensity distribution image.

[0065] Specifically, the area scanned by the optical lens when the sample to be tested maintains relative motion with the optical lens of the second harmonic measurement system is determined as the area to be tested; the half-wave plate is rotated in a manner that the polarization angle of the incident light changes from 0 degree to 360 degrees in steps of n degrees, and m = [360 / n] ([] indicates rounding) incident light polarization angles can be obtained. For the convenience of description, φ i represents the i-th incident light polarization angle; where i is an integer greater than 0 and less than or equal to m, and the value of n can be adjusted according to the actual step size. Each time the half-wave plate is rotated (i.e., each time the incident light polarization angle is changed, i.e., each time an incident light polarization angle is generated), the second harmonic light intensity distribution image of the entire test area under the incident light polarization angle is obtained through the second harmonic measurement system. For ease of description, Figure 3 and Figure 4 For example, the polarization configuration is parallel polarization configuration, Figure 3 In the i Indicates the polarization angle φ of the incident light in the i-th area to be measured i Second harmonic light intensity distribution image under λ i The position coordinates of a certain pixel in the experimental coordinate system are (a, b), and I i / / (a, b) represents the second harmonic light intensity corresponding to the pixel position; Figure 4 In the above figure, the second harmonic light intensity distribution image set includes m incident light polarization angles (denoted by φ1 to φ m m second harmonic light intensity distribution images with one-to-one correspondence (represented by λ1 to λ m In each second harmonic light intensity distribution image, the second harmonic light intensity corresponding to the pixel position with the position coordinate (1,1) in the experimental coordinate system is represented by I 1 / / (1,1) to I m / / It is represented by (1,1).

[0066] Step S210 , analyzing the second harmonic light intensity distribution image set of the test area in the experimental coordinate system pixel by pixel, and determining a unique strain value corresponding to each test point.

[0067] Firstly, the second harmonic intensity values ​​at the same pixel position of all the second harmonic intensity distribution images in the above second harmonic intensity distribution image set are obtained. These second harmonic intensity values ​​constitute the incident light polarization angle-second harmonic intensity spectrum corresponding to the pixel position, and are used as a two-dimensional data point set to solve the unknown strain; the second harmonic intensity at the same pixel position of all the second harmonic intensity distribution images obtained under different incident light polarization angles is analyzed by using the analytical relationship expression among the polarization angle, the second harmonic intensity and the strain (the expression also includes non-zero parameters related to the sample to be tested itself), and the strain component of the strain in the expression is obtained. The strain represented by the normal strain includes the normal strain component along the X' axis direction of the experimental coordinate system, the normal strain component along the Y' axis direction of the experimental coordinate system and the shear strain component, and the strain represented by the principal strain includes the first principal strain, the second principal strain and the principal strain azimuth component.

[0068] by Figure 3 For example, in the parallel polarization configuration, the normal strain component and shear strain component of the strain expressed by the normal strain are unknown parameters, and the polarization angle of the i-th incident light φ i And the corresponding second harmonic light intensity distribution image λ i The relationship between the second harmonic light intensity at the pixel (a, b) position can be expressed by the following formula (1):

[0069]

[0070] Among them, χ0 is a non-zero parameter related to the sample material itself and the incident light used, p1 and p2 are non-zero parameters related to the inherent properties of the sample material to be tested, and φ i is the polarization angle of the i-th incident light, I i∥ (a, b) is the second harmonic intensity corresponding to the pixel (a, b) in the second harmonic intensity distribution image corresponding to the polarization angle of the i-th incident light in the parallel polarization configuration under any strain state, ε x is the normal strain component along the X' axis of the experimental coordinate system, ε y is the normal strain component along the Y' axis of the experimental coordinate system, and γ is the shear strain component.

[0071] The strain can also be converted from the normal strain expression to the principal strain expression. In this case, the principal strain components (i.e., the first principal strain and the second principal strain) and the principal strain azimuth components of the strain expressed by the principal strain are unknown parameters. The polarization angle φ of the i-th incident light is iAnd the corresponding second harmonic light intensity distribution image λ i The relationship between the second harmonic light intensity at the pixel (a, b) position can be expressed by the following formula (2):

[0072]

[0073] Among them, ε1 is the first principal strain, ε2 is the second principal strain, and θ is the azimuthal component of the principal strain.

[0074] Specifically, according to formula (1) or (2), since the multiple incident light polarization angles generated are discontinuous values, the incident light polarization angle-harmonic light intensity spectrum composed of the second harmonic light intensity corresponding to the same pixel position of the second harmonic light intensity distribution image is a spectrum composed of discrete data. The analytical relationship expression between the incident light polarization angle, the second harmonic light intensity and the strain state can be used as a fitting function of the second harmonic light intensity with respect to the incident light polarization angle, and the incident light polarization angle-harmonic light intensity spectrum can be fitted (the value of the incident light polarization angle and the value of the second harmonic light intensity can be measured by the second harmonic measurement system, so they are known quantities), and then the strain value corresponding to the same pixel position is solved. Since the same pixel position corresponds to the same test point of the sample to be tested, if the force state of the sample to be tested is constant, that is, the force applied to the sample to be tested during the measurement process is constant, then there is only one strain value at one test point. Therefore, by fitting the incident light polarization angle-second harmonic light intensity spectrum, the strain component at the test point can be directly obtained. As a feasible operation method, the incident light polarization angle obtained at the same pixel position and the second harmonic light intensity corresponding to the incident light polarization angle are associated as a two-dimensional data point to obtain a group of discrete data points corresponding to the same point to be measured; then, using the above analytical relationship expression, with the incident light polarization angle as the independent variable and the second harmonic light intensity as the dependent variable, the least squares method is used to iteratively fit this group of discrete data points (the initial value of the strain is 0). When the residual between all measured second harmonic light intensity values ​​and all fitted second harmonic light intensity values ​​reaches the minimum, the iterative process stops and the unique strain value corresponding to the same point to be measured is obtained.

[0075] Step S212, determining a strain distribution image set corresponding to the area to be measured according to the unique strain value corresponding to each point to be measured; wherein the strain distribution image set includes a strain distribution image corresponding to each strain component of the unique strain value.

[0076] Specifically, the value of the same strain component of the unique strain value corresponding to each measured point can be used to generate a strain distribution image corresponding to each strain component of the unique strain value of the measured area, and these strain distribution images constitute a strain distribution image set corresponding to the measured area.

[0077] By adopting the above-mentioned mechanical component measurement method, the analytical relationship expression among the incident light polarization angle, the second harmonic light intensity and the strain can be used to perform pixel-by-pixel analysis on the second harmonic light intensity distribution image obtained at different incident light polarization angles, and then determine the unique strain value of each point to be measured in the measured area, so as to more accurately analyze the full-field strain distribution of the measured area, thereby meeting the engineering needs for material strain field analysis under small and complex mechanical states and other conditions.

[0078] Based on the above method embodiment, the present application embodiment also provides a mechanical component measurement device, see Figure 5 As shown, the device comprises:

[0079] The analytical relationship acquisition module 51 is used to obtain the analytical relationship between the light angle parameters, light characteristic parameters and mechanical parameters corresponding to the sample to be tested in the target application scenario; wherein the analytical relationship is determined based on the inherent properties of the sample to be tested and the polarization configuration or geometric configuration of the optical measurement system corresponding to the target application scenario; the mechanical parameters include multiple mechanical components.

[0080] The coordinate system establishing module 52 is used to establish the experimental coordinate system of the sample to be tested.

[0081] The image acquisition module 53 is used to obtain a set of light characteristic parameter distribution images of the test area of ​​the test sample in the experimental coordinate system; wherein the test area includes multiple test points; the light characteristic parameter distribution image set includes light characteristic parameter distribution images of the test area at different light angle parameter values; all test points of the test area correspond one-to-one to the pixel positions of each of the light characteristic parameter distribution images.

[0082] The first processing module 54 is used to determine the optimal mechanical parameter value of each of the points to be measured based on the analytical relationship and the light characteristic parameter distribution image of the area to be measured at different light angle parameter values.

[0083] The second processing module 55 is used to determine a set of mechanical parameter distribution images corresponding to the measured area according to the optimal mechanical parameter value of each of the measured points; wherein the set of mechanical parameter distribution images includes a mechanical parameter distribution image corresponding to each mechanical component of the optimal mechanical parameter value.

[0084] The above-mentioned first processing module 54 is also used to: obtain the light characteristic parameter value of each of the light characteristic parameter distribution images at the same pixel position; based on the analytical relationship and the light characteristic parameter value of each of the light characteristic parameter distribution images at the same pixel position and the light angle parameter value corresponding to each of the light characteristic parameter distribution images, respectively determine the optimal mechanical parameter value of each of the points to be measured.

[0085] The above-mentioned first processing module 54 is also used for: for each pixel position, associating the light characteristic parameter value of each of the light characteristic parameter distribution images at the pixel position with the light angle parameter value corresponding to each of the light characteristic parameter distribution images as a data sample, so as to obtain a data sample set corresponding to each of the points to be measured; performing multiple fitting iterations on the data sample set corresponding to each of the points to be measured based on the analytical relationship, and determining the optimal mechanical parameter value of each of the points to be measured according to the fitting iteration results; wherein the fitting iteration result is the result of one fitting iteration determined from the multiple fitting iterations according to the principle of minimum residual.

[0086] The above-mentioned first processing module 54 is also used for: for each of the points to be measured, using the analytical relationship as the function expression of the light characteristic parameter with respect to the angle parameter, performing multiple fitting iterations on the data sample set corresponding to the point to be measured, until the residual between the light characteristic parameter values ​​of all data samples in the data sample set corresponding to the point to be measured and all the light characteristic parameter values ​​obtained by fitting reaches the minimum, the iteration stops, and the optimal mechanical parameter value of the point to be measured is obtained.

[0087] The above-mentioned image acquisition module 53 is also used to: determine the area where the sample to be tested is aimed at by the optical lens of the optical measurement system or the area where the sample to be tested is scanned by the optical lens of the optical measurement system as the area to be tested; collect light characteristic parameter distribution images of the area to be tested under different light angle parameter values ​​through the optical measurement system, and form all the collected light characteristic parameter distribution images into the light characteristic parameter distribution image set.

[0088] The above-mentioned image acquisition module 53 is also used to: change the light angle parameter of the optical measurement system according to a preset step size, and each time the light angle parameter is changed, the optical measurement system collects the light characteristic parameter distribution image of the area to be measured under the light angle parameter, so as to obtain the light characteristic parameter distribution image of the area to be measured under different light angle parameters.

[0089] The above mechanical parameters may be strain or stress.

[0090] The above-mentioned light angle parameter may be the incident light polarization angle or the incident light geometric angle.

[0091] A mechanical component measurement device provided in an embodiment of the present application can utilize the analytical relationship between light angle parameter-light characteristic parameter-mechanical parameter to perform pixel-by-pixel analysis on the light characteristic parameter distribution image corresponding to different light angle parameter values, and then determine the mechanical state of each point to be measured in the area to be measured, thereby analyzing the full-field mechanical state distribution of the area to be measured. This operation method can improve the accuracy of material stress or strain field analysis, and can meet the engineering needs for material stress or strain field analysis under conditions such as small and complex mechanical states.

[0092] The implementation principle and technical effects of the device provided in the embodiments of the present application are the same as those of the aforementioned method embodiments. For the sake of brief description, for matters not mentioned in the device embodiment, reference may be made to the corresponding contents in the aforementioned method embodiments.

[0093] The present application also provides an electronic device, see Figure 6 As shown, the electronic device 100 includes: a processor 60, a memory 61, a bus 62 and a communication interface 63, wherein the processor 60, the communication interface 63 and the memory 61 are connected via the bus 62; the processor 60 is used to execute executable modules stored in the memory 61, such as computer programs.

[0094] The memory 61 may include a high-speed random access memory (RAM), and may also include a non-volatile memory, such as at least one disk memory. The communication connection between the system network element and at least one other network element is realized through at least one communication interface 63 (which may be wired or wireless), and the Internet, wide area network, local area network, metropolitan area network, etc. may be used.

[0095] The bus 62 may be an ISA bus, a PCI bus, or an EISA bus, etc. The bus may be divided into an address bus, a data bus, a control bus, etc. For ease of representation, Figure 6 Only one bidirectional arrow is used in the diagram, but this does not mean that there is only one bus or only one type of bus.

[0096] Among them, the memory 61 is used to store programs, and the processor 60 executes the program after receiving the execution instruction. A mechanical component measurement method performed by the device defined by the flow process disclosed in any embodiment of the above-mentioned embodiment of the present application can be applied to the processor 60, or implemented by the processor 60.

[0097] The processor 60 may be an integrated circuit chip with signal processing capabilities. In the implementation process, each step of the above-mentioned mechanical component measurement method can be completed by the hardware integrated logic circuit or software instructions in the processor 60. The above-mentioned processor 60 can be a general-purpose processor, including a central processing unit (CPU), a network processor (NP), etc.; it can also be a digital signal processor (DSP), an application-specific integrated circuit (ASIC), a field-programmable gate array (FPGA) or other programmable logic devices, discrete gates or transistor logic devices, discrete hardware components. The methods, steps and logic block diagrams disclosed in the embodiments of the present application can be implemented or executed. The general-purpose processor can be a microprocessor or the processor can also be any conventional processor. The steps of the mechanical component measurement method disclosed in the embodiments of the present application can be directly embodied as a hardware decoding processor for execution, or a combination of hardware and software modules in the decoding processor for execution. The software module can be located in a storage medium mature in the art, such as a random access memory, a flash memory, a read-only memory, a programmable read-only memory, or an electrically erasable programmable memory, a register, etc. The storage medium is located in the memory 61, and the processor 60 reads the information in the memory 61 and completes the steps of the above-mentioned mechanical component measurement method in combination with its hardware.

[0098] The computer program product of the readable storage medium provided in the embodiment of the present application includes a computer-readable storage medium storing program code. The instructions included in the program code can be used to execute the mechanical component measurement method described in the previous method embodiment. The specific implementation can be found in the previous method embodiment and will not be repeated here.

[0099] If the function is implemented in the form of a software functional unit and sold or used as an independent product, it can be stored in a computer-readable storage medium. Based on this understanding, the technical solution of the present application can be essentially or partly embodied in the form of a software product that contributes to the prior art. The computer software product is stored in a storage medium, including several instructions for a computer device (which can be a personal computer, a server, or a network device, etc.) to perform all or part of the steps of the mechanical component measurement method described in each embodiment of the present application. The aforementioned storage medium includes: U disk, mobile hard disk, read-only memory (ROM, Read-Only Memory), random access memory (RAM, Random Access Memory), disk or optical disk and other media that can store program codes.

[0100] Finally, it should be noted that the above-described embodiments are only specific implementation methods of the present application, which are used to illustrate the technical solutions of the present application, rather than to limit them. The protection scope of the present application is not limited thereto. Although the present application is described in detail with reference to the above-described embodiments, ordinary technicians in the field should understand that any technician familiar with the technical field can still modify the technical solutions recorded in the above-described embodiments within the technical scope disclosed in the present application, or can easily think of changes, or make equivalent replacements for some of the technical features therein; and these modifications, changes or replacements do not make the essence of the corresponding technical solutions deviate from the spirit and scope of the technical solutions of the embodiments of the present application, and should be included in the protection scope of the present application. Therefore, the protection scope of the present application shall be subject to the protection scope of the claims.

Claims

1. A method for measuring mechanical components, characterized in that: The method comprises: Obtaining an analytical relationship among light angle parameters, light characteristic parameters and mechanical parameters corresponding to the sample to be tested in the target application scenario; wherein the analytical relationship is determined based on the inherent properties of the sample to be tested and the polarization configuration or geometric configuration of the optical measurement system corresponding to the target application scenario; the mechanical parameters include multiple mechanical components; Establishing an experimental coordinate system of the sample to be tested; Obtaining a set of light characteristic parameter distribution images of the test area of ​​the test sample in the experimental coordinate system; wherein the test area includes a plurality of test points; the light characteristic parameter distribution image set includes light characteristic parameter distribution images of the test area at different light angle parameter values; all test points of the test area correspond one-to-one to the pixel position of each light characteristic parameter distribution image; Determine the optimal mechanical parameter value of each of the points to be measured based on the analytical relationship and the light characteristic parameter distribution image of the area to be measured at different light angle parameter values; According to the optimal mechanical parameter value of each of the points to be measured, a set of mechanical parameter distribution images corresponding to the area to be measured is determined; wherein the set of mechanical parameter distribution images includes a mechanical parameter distribution image corresponding to each mechanical component of the optimal mechanical parameter value; The optical measurement system is a second harmonic measurement system, and the polarization configuration of the second harmonic measurement system is a parallel polarization configuration. Then, the expression corresponding to the analytical relationship between the incident light polarization angle, light intensity and normal strain is: in, is a non-zero parameter related to the sample material to be tested and the incident light used, and is a non-zero parameter related to the intrinsic properties of the sample material to be tested; is the incident light polarization angle, is the second harmonic intensity under any strain state; and are the normal strain components in two different directions orthogonal to each other, is the shear strain component; The step of determining the optimal mechanical parameter value of each of the points to be measured based on the analytical relationship and the light characteristic parameter distribution image of the area to be measured under different light angle parameters comprises: Obtaining the light characteristic parameter value at the same pixel position of each of the light characteristic parameter distribution images; Based on the analytical relationship and the light characteristic parameter value of each light characteristic parameter distribution image at the same pixel position and the light angle parameter value corresponding to each light characteristic parameter distribution image, the optimal mechanical parameter value of each of the points to be measured is determined respectively.

2. The method according to claim 1, characterized in that The step of determining the optimal mechanical parameter value of each of the points to be measured based on the analytical relationship and the light characteristic parameter value of each of the light characteristic parameter distribution images at the same pixel position and the light angle parameter value corresponding to each of the light characteristic parameter distribution images comprises: For each pixel position, the light characteristic parameter value of each light characteristic parameter distribution image at the pixel position is associated with the light angle parameter value corresponding to each light characteristic parameter distribution image as a data sample, so as to obtain a data sample set corresponding to each of the points to be measured; Based on the analytical relationship, multiple fitting iterations are performed on the data sample set corresponding to each of the points to be measured, and the optimal mechanical parameter value of each of the points to be measured is determined according to the fitting iteration results; wherein the fitting iteration result is the result of one fitting iteration determined from the multiple fitting iterations according to the principle of minimum residual.

3. The method according to claim 2, characterized in that The step of performing multiple fitting iterations on the data sample set corresponding to each of the points to be measured based on the analytical relationship, and determining the optimal mechanical parameter value of each of the points to be measured according to the fitting iteration results includes: For each of the points to be measured, the analytical relationship is used as the function expression of the light characteristic parameter with respect to the angle parameter, and the data sample set corresponding to the point to be measured is subjected to multiple fitting iterations until the residual between the light characteristic parameter values ​​of all data samples in the data sample set corresponding to the point to be measured and all the light characteristic parameter values ​​obtained by fitting is minimized, and the iteration is stopped to obtain the optimal mechanical parameter value of the point to be measured.

4. The method according to claim 1, characterized in that: The step of obtaining a set of light characteristic parameter distribution images of the test area of ​​the test sample in the experimental coordinate system comprises: Determine an area where the sample to be measured is aligned with the optical lens of the optical measurement system or an area where the sample to be measured is scanned by the optical lens of the optical measurement system as the area to be measured; The optical measurement system is used to collect light characteristic parameter distribution images of the area to be measured at different light angle parameter values, and all collected light characteristic parameter distribution images are combined into the light characteristic parameter distribution image set.

5. The method according to claim 4, characterized in that The step of collecting the light characteristic parameter distribution image of the area to be measured at different light angle parameter values ​​by the optical measurement system comprises: The light angle parameter of the optical measurement system is changed according to a preset step size. Each time the light angle parameter is changed, the optical measurement system collects the light characteristic parameter distribution image of the area to be measured under the light angle parameter to obtain the light characteristic parameter distribution image of the area to be measured under different light angle parameters.

6. The method according to any one of claims 1 to 5, characterized in that: The mechanical parameter is strain or stress.

7. The method according to any one of claims 1 to 5, characterized in that: The light angle parameter is the incident light polarization angle or the incident light geometric angle.

8. A mechanical component measuring device, characterized in that: The device comprises: An analytical relationship acquisition module is used to obtain an analytical relationship among light angle parameters, light characteristic parameters and mechanical parameters corresponding to the sample to be tested in the target application scenario; wherein the analytical relationship is determined according to the inherent properties of the sample to be tested and the polarization configuration or geometric configuration of the optical measurement system corresponding to the target application scenario; the mechanical parameters include multiple mechanical components; A coordinate system establishment module, used to establish an experimental coordinate system of the sample to be tested; An image acquisition module, used for acquiring a set of light characteristic parameter distribution images of a test area of ​​the test sample in the experimental coordinate system; wherein the test area includes a plurality of test points; the light characteristic parameter distribution image set includes light characteristic parameter distribution images of the test area at different light angle parameter values; all test points of the test area correspond one-to-one to the pixel position of each light characteristic parameter distribution image; A first processing module, for determining the optimal mechanical parameter value of each of the points to be measured based on the analytical relationship and the light characteristic parameter distribution image of the area to be measured at different light angle parameter values; A second processing module is used to determine a set of mechanical parameter distribution images corresponding to the measured area according to the optimal mechanical parameter value of each of the measured points; wherein the set of mechanical parameter distribution images includes a mechanical parameter distribution image corresponding to each mechanical component of the optimal mechanical parameter value; The optical measurement system is a second harmonic measurement system, and the polarization configuration of the second harmonic measurement system is a parallel polarization configuration. Then, the expression corresponding to the analytical relationship between the incident light polarization angle, light intensity and normal strain is: in, is a non-zero parameter related to the sample material to be tested and the incident light used, and is a non-zero parameter related to the intrinsic properties of the sample material to be tested; is the incident light polarization angle, is the second harmonic intensity under any strain state; and are the normal strain components in two different directions orthogonal to each other, is the shear strain component; The first processing module is also used to: obtain the light characteristic parameter value of each of the light characteristic parameter distribution images at the same pixel position; based on the analytical relationship and the light characteristic parameter value of each of the light characteristic parameter distribution images at the same pixel position and the light angle parameter value corresponding to each of the light characteristic parameter distribution images, respectively determine the optimal mechanical parameter value of each of the points to be measured.

9. An electronic device, characterized in that: The invention comprises a processor and a memory, wherein the memory stores computer executable instructions that can be executed by the processor, and the processor executes the computer executable instructions to implement the mechanical component measurement method according to any one of claims 1 to 7.

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