Wavelength measurement chip and wavelength measurement system
By integrating a wavelength measurement chip and using a beam splitter and interferometer to optimize electromagnetic wave signal propagation, the problems of large size and poor reliability of traditional wavelength meters are solved, achieving miniaturized and highly accurate wavelength measurement.
CN114689188BActive Publication Date: 2026-06-12HUAWEI TECH CO LTD
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- HUAWEI TECH CO LTD
- Filing Date
- 2020-12-30
- Publication Date
- 2026-06-12
AI Technical Summary
⚠Technical Problem
Traditional wavelength meters are large in size, have low integration and poor reliability due to the multiple discrete components.
⚗Method used
Design an integrated wavelength measurement chip, including a beam splitter, a first interferometer, and a second interferometer, to acquire wavelength information of electromagnetic wave signals through photoelectric conversion, simplify the optical system structure, and optimize the propagation path of electromagnetic wave signals using high-order mode filters and couplers.
🎯Benefits of technology
This technology enables miniaturization of wavelength measurement chips, reduces space requirements, and improves reliability, while also enhancing the accuracy and reliability of wavelength measurements.
✦ Generated by Eureka AI based on patent content.
Smart Images
Figure CN114689188B_ABST
Abstract
The application provides a wavelength measurement chip, comprising: a beam splitter configured to receive a first electromagnetic wave signal and split the first electromagnetic wave signal into two electromagnetic wave signal outputs; a first interferometer and a second interferometer, the beam splitter, the first interferometer and the second interferometer being coupled in sequence, the first interferometer and the second interferometer being configured to receive one of the two electromagnetic wave signals and make twice interference to output a plurality of second electromagnetic wave signals; the other of the two electromagnetic wave signals being output as a third electromagnetic wave signal, the second electromagnetic wave signal and the third electromagnetic wave signal being used to obtain wavelength information of the first electromagnetic wave signal after photoelectric conversion. The application also provides a wavelength measurement system.
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