Particle size distribution measuring apparatus and particle size distribution measuring method

Abstract

The present application provides a kind of particle size distribution measuring device, can make the state of sample change while measuring particle size distribution, the particle size distribution measuring device (100) has: light source (LS), the sample in the cell (C) being housed in the cell (C) being provided with a pair of light transmission plate (C1) separated by a specified distance is shot out measuring light;One or more detectors (D1, D2), detect the measuring light scattered in sample;Particle size distribution calculator (P2), according to the output signal of the detector (D1, D2), calculate the particle size distribution of the particle group contained in the sample (S), further provided with force applying mechanism (1) by moving at least one of the pair of the light transmission plate to apply pressure or shear force to the sample in the cell, the particle size distribution calculator (P2) is configured to calculate the particle size distribution of the time point when the pressure or shear force applied to sample (S) changes from first state to second state.

Description

TECHNICAL FIELD

[0001] The present application relates to a particle size distribution measuring apparatus that irradiates a sample with light and measures a particle size distribution of a particle group contained in the sample based on light scattered by the particle group. BACKGROUND

[0002] For a particle size distribution measuring apparatus, as shown in Patent Literature 1, in the case of measuring a high-concentration and low-viscosity test liquid such as an original liquid of ink, an optical measuring cell constituted by sandwiching a spacer between a pair of light-transmitting plates is used. In the measurement of the particle size distribution in the related art, the measurement is performed after the state of the sample in the cell is made constant, for example.

[0003] However, the environment in which the particle size distribution is measured differs, and in the environment in which the sample is actually used, there is a case where the state of the sample changes. Therefore, in the measurement method of the particle size distribution in the related art, there is a possibility that it does not become an appropriate evaluation criterion in the actual environment in which the state of the sample changes.

[0004] PRIOR ART DOCUMENTS

[0005] PATENT LITERATURE

[0006] Patent Literature 1: Japanese Patent Publication Patent No. 2910596 SUMMARY

[0007] The present application is made in view of the above-described problems, and an object of the present application is to provide a particle size distribution measuring apparatus capable of measuring a particle size distribution while changing the state of a sample.

[0008] That is, the particle size distribution measuring apparatus of the present application is characterized by comprising: a light source that irradiates a sample housed in a cell with measuring light, the cell including a pair of light-transmitting plates separated from each other by a prescribed distance; one or more detectors that detect the measuring light scattered in the sample; and a particle size distribution calculator that calculates a particle size distribution of a particle group contained in the sample based on an output signal of the detector, the particle size distribution measuring apparatus further comprising a force application mechanism that applies a pressure or a shear force to the sample in the cell by moving at least one of the pair of light-transmitting plates, the particle size distribution calculator being configured to calculate a particle size distribution at a time point at which the pressure or the shear force applied to the sample changes from a first state to a second state.

[0009] Further, the particle size distribution measurement method of the present application is characterized in that the particle size distribution measurement method uses a particle size distribution measurement apparatus that includes: a light source that emits measurement light toward a sample housed in a cell that includes a pair of light-transmissive plates separated from each other by a prescribed distance; one or more detectors that detect measurement light scattered in the sample; and a particle size distribution calculator that calculates a particle size distribution of a population of particles contained in the sample based on output signals of the detectors, the particle size distribution calculator calculating a particle size distribution at a time point at which a pressure or a shear force applied to the sample in the cell is changed from a first state to a second state by moving at least one of the pair of light-transmissive plates.

[0010] In this way, it is possible to measure a change in the particle size distribution with respect to a change in the pressure or the shear force. Therefore, it is possible to evaluate the state of the particles in the sample in a state close to an actual environment, and it is possible to obtain insights into the sample that have not been possible in the past.

[0011] As a specific configuration example of the force application mechanism, it is possible to cite a case in which the force application mechanism is configured to apply a pressure to the sample in the cell by bringing the pair of light-transmissive plates closer to each other or to apply a shear force to the sample in the cell by rotating one of the pair of light-transmissive plates with respect to the other.

[0012] In order to make the pressure applied to the sample continuously variable even in the measurement of the particle size distribution, the particle size distribution measurement apparatus can further include a pressure feeding section that feeds the sample into the cell to change the pressure of the sample in the cell.

[0013] If the particle size distribution measurement apparatus further includes an electromagnetic field application mechanism that applies at least one of an electric field and a magnetic field to the sample, and the particle size distribution calculator calculates the particle size distribution at each time point in a state in which the electric field or the magnetic field is applied to the sample, it is possible to more accurately evaluate the characteristics of a sample used even in an environment exposed to electromagnetic waves based on a change in the particle size distribution.

[0014] In a case in which particles in the sample are aggregated, in order to be able to evaluate a process of splitting from an aggregated state thereof based on a measurement result of the particle size distribution, the particle size distribution measurement apparatus can further include an ultrasonic wave application mechanism that applies an ultrasonic wave to the sample, and the particle size distribution calculator calculates the particle size distribution at each time point in a state in which the ultrasonic wave is applied to the sample.

[0015] For example, in order to be able to evaluate the characteristics of a sample having a curing property by light reaction and the temporal change caused by the light reaction according to the change in the particle size distribution, the particle size distribution measuring device can further include an action light irradiator that irradiates the inside of the cell with action light that changes the state of the sample by light reaction, and the particle size distribution calculator calculates the particle size distribution at each point in time in a state in which the sample is irradiated with the action light.

[0016] In order to be able to make the configuration of the entire particle size distribution measuring device compact, the particle size distribution measuring device can be configured such that the emission direction of the measurement light of the light source is directed upward, the sample is disposed on the upper side of the light source, and one or more of the detectors are disposed at a position at which the measurement light scattered by the sample can be detected.

[0017] In order to be able to measure the particle size distribution even in a dispersed state without using a cell for the sample, the particle size distribution measuring device can be configured to include a measurement chamber that houses a sample stage and one or more of the detectors, the inside of which is maintained at a prescribed pressure or vacuum degree, and an introduction mechanism that introduces a gas containing a powder sample from the outside of the container into the inside of the measurement chamber using a pressure difference between the inside and the outside of the container.

[0018] In order to be able to prevent contamination of the sample at the time of measuring the particle size distribution, the particle size distribution measuring device can be configured such that the inside of the measurement chamber is a nitrogen atmosphere.

[0019] In order to be able to easily perform additional measurement such as observation of the shape of the particles after measuring the particle size distribution, the sample stage can be configured to be usable at least for observation under a microscope.

[0020] Thus, according to the particle size distribution measuring device of the present application, by changing the pressure and shear force applied to the sample, it is possible to measure the change in the particle size distribution while changing the state of the particles contained in the sample. As a result, it is possible to obtain insights that cannot be obtained in the measurement of the particle size distribution in the related art. BRIEF DESCRIPTION OF DRAWINGS

[0021] Figure 1 is a schematic view of a particle size distribution measuring device according to a first embodiment of the present application.

[0022] Figure 2 is a schematic view of a cell according to the first embodiment.

[0023] Figure 3 is a cross-sectional view of the cell according to the first embodiment.

[0024] Figure 4 is a schematic view showing the relationship between the state change of the pressure of the sample using a force application mechanism according to the first embodiment and the measurement point of the particle size distribution.

[0025] Figure 5 is a schematic view showing a first modification of the first embodiment.

[0026] Figure 6 is a schematic view showing a second modification of the first embodiment.

[0027] Figure 7 is a schematic view showing a third modification of the first embodiment.

[0028] Figure 8 is a schematic view showing a particle size distribution measuring apparatus of the second embodiment of the present application.

[0029] Explanation of Reference Numerals

[0030] 100 · · particle size distribution measuring apparatus

[0031] LS · · light source

[0032] D1, D2 · · detector

[0033] P2 · · particle size distribution calculator

[0034] 1 · · force applying mechanism

[0035] 12 · · fastening portion

[0036] T · · pressure feeding portion

[0037] 2 · · action light irradiator

[0038] 3 · · ultrasonic wave applying mechanism

[0039] 4 · · electromagnetic field applying mechanism

[0040] 5 · · sample stage

[0041] 6 · · closed case DETAILED DESCRIPTION

[0042] While referring to Figures 1 to 3 A particle size distribution measuring apparatus 100 of the first embodiment of the present application will be described while referring to the drawings. The particle size distribution measuring apparatus 100 of the first embodiment is configured as a vertical apparatus, and is configured to be able to measure a particle size distribution while changing a state of a sample S housed in a cell C. Here, the state of the sample S is changed according to a pressure, a shear force, an electric field, a magnetic field, a vibration, and a light reaction applied to the sample S.

[0043] As Figure 1As shown, the particle size distribution measuring apparatus 100 houses, within the housing R, a light source LS that emits measurement light toward the upper side, a cell C that is disposed on the upper side of the light source LS and houses the sample S inside, and a plurality of detectors D1, D2 that detect the measurement light scattered by the sample S inside the cell C. The light source LS emits laser light as measurement light toward the vertical upper side. The plurality of detectors D1, D2 includes a front detector D1 that is disposed on the optical axis of the light source LS and measures the measurement light that has passed through the cell C, and four side detectors D2 that detect the measurement light scattered by the sample S. For the front detector D1, in order to prevent the incident measurement light from being reflected to generate reflected light, it is disposed at a prescribed angle oblique to the optical axis of the light source LS.

[0044] Further, the particle size distribution measuring apparatus 100 is provided with a CPU, a memory, an A / D, a D / A converter, each input / output device, and a computer COM connected to each device. The computer COM is configured to function at least as a controller P1 that controls the operation of each device and a particle size distribution calculator P2 that calculates the particle size distribution of the particle group contained in the sample S from the outputs of each detector D1, D2, by executing a particle size distribution measuring apparatus program stored in the memory.

[0045] In addition, the particle size distribution measuring apparatus 100 is provided with a force application mechanism 1 that applies pressure or shear force to the sample S, a pressure feeding section T that pressure-feeds the sample S into the cell C, an action light irradiator 2 that irradiates the sample S inside the cell C with action light that causes a photo reaction, in addition to the light source LS that emits measurement light, an ultrasonic wave vibration application mechanism 3 that applies ultrasonic wave vibration to the cell C, and an electromagnetic field application mechanism 4 that applies an electromagnetic field to the cell C.

[0046] The housing R is divided into two chambers. Specifically, a light source housing chamber R1 that houses the light source LS and the action light irradiator 2 inside is formed in the lower portion of the housing R. In addition, a measurement chamber R2 that houses at least the cell C and each detector D1, D2 is formed in the upper portion of the housing R.

[0047] As Figure 2 and Figure 3As shown, the cell C has a pair of light-transmissive plates C1 separated from each other by a prescribed distance and a spacer C2 provided between the light-transmissive plates C1. The light-transmissive plates C1 are formed in a substantially thin circular plate shape, and a circular ring-shaped evaporation film is formed on the inner side surface of one of the light-transmissive plates C1 at the outer peripheral portion thereof, serving as the aforementioned spacer C2. On one of the light-transmissive plates C1, two through-holes penetrating in the thickness direction are provided at portions where the measurement light does not pass, one of which is used as an introduction hole C3 for introducing the sample S between the light-transmissive plates C1, and the other of which is used as an outlet hole C4 for leading the sample S from the inside of the light-transmissive plate C1 to the outside. During measurement, the introduction hole C3 is connected to the pressure-feeding portion T that pressure-feeds the sample S by a pipe, and the outlet hole C4 is covered with a sealing member C5.

[0048] The cell C is provided with a force application mechanism 1 for applying pressure and shear force to the sample S housed inside. The force application mechanism 1 of the first embodiment has a fastening portion 12 that fastens the pair of light-transmissive plates C1 of the cell C with respect to the thickness direction.

[0049] The fastening portion 12 sandwiches the pair of light-transmissive plates C1 of the cell C from the outside in the thickness direction. The fastening portion 12 of the first embodiment has a first clamping member 12A having a housing portion 12C that houses the pair of light-transmissive plates C1, and a second clamping member 12B that sandwiches the pair of light-transmissive plates C1 between the first clamping member 12A and the second clamping member 12B. Furthermore, the pair of light-transmissive plates C1 are clamped by screwing the second clamping member 12B to the first clamping member 12A. By changing the fastening torque between the clamping members, the pressure applied to the sample S housed inside can be changed. In addition, when the second clamping member 12B is screwed to the first clamping member 12A, a torque is generated in the light-transmissive plate C1 in contact with the second clamping member 12B, and thus the shear force applied to the sample S housed inside can also be changed. That is, by rotating the second clamping member 12B with respect to the first clamping member 12A, the light-transmissive plate C1 placed on the first clamping member 12A can be brought to a fixed state, and by rotating the light-transmissive plate C1 in contact with the second clamping member 12B, a shear force can be generated to the sample S inside. In addition, the change in the state of the pressure or shear force applied to the sample S by the fastening portion 12 can be adjusted by hand using a torque wrench or the like, or the separation distance of the pair of light-transmissive plates C1 can be accurately controlled using a motor or the like, and thus the pressure applied to the sample S can be accurately controlled.

[0050] The pressure-feeding portion T is, for example, a pump that pressure-feeds the sample S into the cell C, and is configured to change the pressure of the sample S pressure-fed into the cell C by controlling the discharge amount thereof by a controller P1.

[0051] For example, if the sample S is a sample having photocurability, the action light irradiator 2 irradiates ultraviolet rays or the like as the action light. The irradiation timing and irradiation time of the action light irradiator 2 are controlled by the controller Pl.

[0052] The ultrasonic wave vibration applying mechanism 3 is, for example, an ultrasonic wave vibrator mounted with respect to the cell C or the fastening portion 12. The oscillation timing and oscillation time of the ultrasonic wave vibrator are controlled by the controller Pl. The amplitude and frequency of the ultrasonic wave vibration can be fixed or can vary with time.

[0053] The electromagnetic field applying mechanism 4 is a coil and an electrode which are penetrated in the thickness direction of one of the light-transmissive plate Cl of the cell C and are disposed to be in partial contact with the sample S in the cell C. Thus, since the electromagnetic field applying mechanism 4 is in contact with the sample S, the particle diameter and other properties of the sample S are sufficiently influenced by the electromagnetic field. The current flowing through the coil and the voltage applied to the parallel plate electrode are controlled by the controller Pl. The electric field or magnetic field applied to the cell C can be fixed or can vary with time.

[0054] The particle diameter distribution calculator P2 calculates the particle diameter distribution of the particle group in the sample S on the basis of the outputs of the detectors Dl, D2. Specifically, the particle diameter distribution corresponding to the scattering pattern is calculated on the basis of the scattering pattern composed of the scattering angle and the intensity of the scattered light of the scattering angle indicated by the outputs of the detectors Dl, D2 and a prescribed theoretical calculation formula derived from the Mie scattering theory. Here, the particle diameter distribution calculator P2 is configured to calculate the particle diameter distribution at each timing as time elapses in a state in which the state of the particles in the sample S is changing. Specifically, the particle diameter distribution is calculated in a state in which at least one of pressure, shear force, ultrasonic wave vibration, electric field, and magnetic field is applied to the cell C, or in a state in which the action light is irradiated to the cell C.

[0055] The particle diameter distribution measuring apparatus 100 of the first embodiment thus configured is capable of, for example, changing the pressure applied to the sample S in the cell C from a first state at a certain reference timing to a second state by the force applying mechanism 1 and calculating the particle diameter distribution at the timing at which the change to the second state is made. More specifically, as shown in (a) of FIG. 10, the change in the particle diameter distribution at each timing can be measured while the pressure is continuously changed by the force applying mechanism 1. In addition, as shown in (b) of FIG. 10, the pressure can be changed stepwise by the force applying mechanism 1 and the particle diameter distribution in each step in which the pressure is different can be measured. Thus, the relationship of the change in the particle diameter distribution with respect to the change in the pressure can be obtained. For example, it can be known that there is a deviation in the particle diameter in the case where a prescribed pressure is applied, or if a certain pressure or more is applied, the aggregated particles are separated and the desired particle diameter distribution can be obtained. Figure 4 Figure 4

[0056] ​​Also, it is possible to know the dependency of the particle size distribution on the electric field or the magnetic field.

[0057] If the change in the particle size distribution is measured while the ultrasonic wave is applied to the sample S, it is possible to know the time until the aggregated particles are separated, the time when the particles are further finely divided from the current particle size to deviate from the various particle size distributions, and the like.

[0058] If the change in the particle size distribution is measured while the acting light is irradiated, for example, if the sample S is a sample in which a photoreaction such as photocuring occurs, it is possible to know what kind of change in the structure of the particles and the like occurs before and after the change from the change in the particle size distribution.

[0059] Referring to Figures 5 to 7 A modification of the first embodiment will be described.

[0060] As Figure 5 illustrated, the electromagnetic field application mechanism 4 can also be provided in a manner of blocking the introduction hole C3 and the discharge hole C4 of the cell C and can be in contact with the sample inside.

[0061] In addition, as Figure 6 illustrated, the electromagnetic field application mechanism 4 can be a transparent electrode provided in a manner of facing the inner side surface of the pair of light-transmissive plates C1.

[0062] As Figure 7 illustrated, the particle size distribution measuring apparatus 100 is not limited to the measurement of the particle size distribution in a state in which the sample S is housed in the cell C. For example, the sample S in a powder form can be dispersed on a glass plate using a sample dispersing apparatus or the like and placed on a transparent sample stage 5 provided at a position of the cell C of the first embodiment to be measured. In addition, a permeable closed box 6 formed of an acrylic material or a glass material can be provided in the measurement chamber R2 to house the glass plate on which the sample S is dispersed and the sample stage 5, the inside of the closed box 6 can be made into a nitrogen atmosphere, and the particle size distribution can be measured. Further, by controlling the pressure of the gas enclosed in the closed box 6 with a pump 7, it is also possible to measure the particle size distribution while changing the pressure applied to the sample S.

[0063] With the force application mechanism 1, it is possible to apply only pressure or only shear force to the sample S in the cell C. In order to be able to apply only pressure to the sample S in the cell C, the force application mechanism 1 can be configured to be able to change only the separation distance of the pair of light-transmissive plates C1 without rotating the pair of light-transmissive plates C1. In addition, in order to be able to apply only shear force to the sample S in the cell C, the force application mechanism 1 can be configured to rotate at least one of the pair of light-transmissive plates C1 while maintaining the separation distance of the pair of light-transmissive plates C1. Further, in the first embodiment, the force application mechanism 1 is configured to move only the other light-transmissive plate C1 while maintaining the one light-transmissive plate C1 fixed, but the force application mechanism 1 can move both light-transmissive plates C1. In addition, the force application mechanism 1 can be configured to move the one light-transmissive plate C1 in a manner that the separation distance can be changed and to rotate the other light-transmissive plate C1 in place.

[0064] Next, the particle diameter distribution measuring apparatus 100 of the second embodiment will be described with reference to the drawings. Figure 8 Next, the particle diameter distribution measuring apparatus 100 of the second embodiment will be described with reference to the drawings.

[0065] In the second embodiment, instead of using the cell C to measure the particle diameter distribution, the sample S is dispersed in the measurement chamber R2 and attached to the sample stage 5 formed of a transparent member in the measurement chamber R2.

[0066] In this embodiment, the inside of the measurement chamber R2 is maintained at a predetermined vacuum degree by the suction source 9. In addition, a lead-in mechanism 8 is provided to the outer wall portion of the measurement chamber R2, and the lead-in mechanism 8 leads in a gas containing the powder sample S from the outside of the container into the measurement chamber R2. The lead-in mechanism 8 has a partition film 81 that separates the inside and the outside of the measurement chamber R2 and on which the powder sample S is placed on the atmospheric side, a dome-shaped elastic cover 82 that is provided so as to cover the atmospheric side of the partition film 81, a needle member 83 for breaking the partition film 81 provided in the elastic cover 82, and a multi-stage nozzle 84 provided on the measurement chamber R2 side. By pressing the elastic cover 82, the partition film 81 is broken by the needle member 83, and the powder sample S is sucked into the measurement chamber R2 by atmospheric pressure. At this time, the powder sample S is repeatedly compressed and expanded by the multi-stage nozzle 84, the gathered portion is broken, and thus becomes a state in which the particle size is small, and is led into the measurement chamber R2. Thereafter, the powder sample S is sprayed onto the sample stage 5.

[0067] In this way, if the particle diameter distribution measuring apparatus 100 of the second embodiment, it is possible to make the powder sample S into a state suitable for measurement of the particle diameter distribution and to accumulate without using the cell C. In addition, since the particle diameter distribution measuring apparatus 100 is a vertical type, it is possible to perform lead-in of the sample S on the premise of gravity, and it is possible to achieve uniform dispersion suitable for measurement of the particle diameter distribution on the sample stage 5.

[0068] A modification of the second embodiment will be described.

[0069] In order to prepare for the attachment of the powdered sample into the measurement chamber R2, a mechanism for removing the sample and dirt can be provided in each of the detectors D1, D2.

[0070] The sample stage 5 is configured to enable not only the measurement of the particle size distribution but also the use of other measurement devices. For example, in order to enable immediate observation of the shape of the particles even in a microscope, a mark for sharing coordinates can be formed on the sample stage. In addition, the use is not limited to a microscope, and the sample stage can be used for various purposes such as optical analysis, Raman spectroscopic analysis, X-ray analysis, electron beam analysis, and the like.

[0071] The other embodiments will be described.

[0072] The principle of measuring the particle size distribution is not limited to the static light scattering method, and can be the dynamic light scattering method.

[0073] In the embodiments, a vertical particle size distribution measuring device is exemplified as an example, but even in a particle size distribution measuring device in which each device is arranged in a horizontal plane, a pressure, a shear force, an electric field, a magnetic field, ultrasonic vibration, an applied light, or the like can be applied to the sample, and the change in the particle size distribution can be measured while the state of the sample is changed.

[0074] In order to change the pressure or the shear force applied to the sample, for example, the posture of the cell can be used. For example, the state of the sample can be changed by changing the direction of the force applied to the sample by tilting the cell from the horizontal state.

[0075] A temperature adjusting mechanism can be provided around the cell, and the particle size distribution can be measured while the temperature of the sample is changed.

[0076] Furthermore, various modifications of the embodiments and combinations of parts of the embodiments can be made without departing from the spirit of the present application.

[0077] Industrial Applicability

[0078] According to the present application, a particle size distribution measuring device that enables the measurement of the change in the particle size distribution while the state of the particles contained in the sample is changed by changing the pressure or the shear force applied to the sample can be provided.

Claims

1. A particle size distribution measuring device, characterized in that, The particle size distribution measuring device includes: a light source that emits measuring light onto a sample housed in a cell, the cell having a pair of light-transmitting plates spaced apart by a predetermined distance; and one or more detectors that detect the measuring light scattered in the sample. And a particle size distribution calculator, which calculates the particle size distribution of the particle group contained in the sample based on the output signal of the detector. The particle size distribution measuring device also includes a force application mechanism that applies pressure or shear force to the sample in the cell by moving at least one of the pair of light-transmitting plates. The force application mechanism includes a fastening part for fastening the pair of light-transmitting plates. By fastening the pair of light-transmitting plates with the fastening part, pressure is applied to the sample, or pressure and shear force are applied. The particle size distribution calculator is configured to calculate the particle size distribution at points when the pressure or shear force applied to the sample changes from a first state to a second state, based on a scattering pattern composed of the scattering angle and the intensity of the scattered light at that scattering angle. The fastening part includes: The first clamping member has a receiving portion for accommodating a pair of the light-transmitting plates; and The second clamping member clamps a pair of light-transmitting plates between itself and the first clamping member. The light-transmitting plates are configured to be clamped by threading the second clamping member to the first clamping member.

2. The particle size distribution measuring device according to claim 1, characterized in that, The force application mechanism is configured to apply pressure to the sample in the pool by bringing the pair of light-transmitting plates close to each other, or to apply shear force to the sample in the pool by rotating one of the pair of light-transmitting plates relative to the other.

3. The particle size distribution measuring device according to claim 1 or 2, characterized in that, The particle size distribution measuring device also includes a pressure feeding unit, which pressurizes the sample into the pool, causing a change in the pressure of the sample in the pool.

4. The particle size distribution measuring device according to claim 1 or 2, characterized in that, The particle size distribution measuring device also includes an electromagnetic field application mechanism, which applies at least one of an electric field and a magnetic field to the sample. When an electric or magnetic field is applied to the sample, the particle size distribution calculator calculates the particle size distribution at each time point.

5. The particle size distribution measuring device according to claim 1 or 2, characterized in that, The particle size distribution measuring device also includes an ultrasonic application mechanism, which applies ultrasonic waves to the sample. While the sample is subjected to ultrasonic waves, the particle size distribution calculator calculates the particle size distribution at each time point.

6. The particle size distribution measuring device according to claim 1 or 2, characterized in that, The particle size distribution measuring device also includes an active light irradiator, which irradiates the cell with light that causes the state of the sample to change through a photoreaction. Under conditions where the sample is irradiated with effective light, the particle size distribution calculator calculates the particle size distribution at each time point.

7. The particle size distribution measuring device according to claim 1 or 2, characterized in that, The measuring light emitted by the light source is directed upwards. The sample is positioned above the light source, and one or more of the detectors are positioned to detect the measurement light scattered by the sample.

8. The particle size distribution measuring device according to claim 7, characterized in that, The particle size distribution measuring device includes: The measuring chamber, housing the sample stage and one or more of the aforementioned detectors, is maintained internally at a specified pressure or vacuum; and The inlet mechanism uses the pressure difference between the inside and outside of the measuring chamber to introduce gas containing the powder sample from the outside of the measuring chamber into the measuring chamber.

9. The particle size distribution measuring device according to claim 8, characterized in that, The measuring chamber is filled with a nitrogen atmosphere.

10. The particle size distribution measuring device according to claim 8, characterized in that, The sample stage is configured to be at least suitable for observation under a microscope.

11. A method for measuring particle size distribution, characterized in that, The particle size distribution measurement method uses a particle size distribution measurement device, which includes: a light source that emits measuring light onto a sample housed in a cell, the cell having a pair of light-transmitting plates separated from each other by a predetermined distance; a fastening part that fastens the pair of light-transmitting plates; one or more detectors that detect the measuring light scattered in the sample; and a particle size distribution calculator that calculates the particle size distribution of the particle group contained in the sample based on the output signals of the detectors. The fastening part includes: The first clamping member has a receiving portion for accommodating a pair of the light-transmitting plates; and The second clamping member clamps a pair of light-transmitting plates between itself and the first clamping member. The pair of light-transmitting plates are clamped by threading the second clamping member to the first clamping member. By fastening the pair of light-transmitting plates, thereby moving at least one of the pair of light-transmitting plates, pressure is applied to the sample, or pressure and shear force are applied. Based on the scattering pattern consisting of the scattering angle and the intensity of the scattered light at that scattering angle, the particle size distribution at the point when the pressure or shear force applied to the sample in the pool changes from the first state to the second state is calculated.

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