A simulation test device and method for vibration and impact resistance of electronic detonators

By setting simulated gun holes and detonators on the test body that simulates the blasting environment, and simulating the impact energy of the test detonator during explosion, the problem of lack of electronic detonators' vibration and impact testing methods in the existing technology is solved, and efficient and accurate performance testing and product improvements are achieved.

CN114838633BActive Publication Date: 2025-05-06CHINA GEZHOUBA GRP EXPLOSIVE CO LTD +1
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Patent Information

Application Number
CN202210537253.7
Authority / Receiving Office
CN · China
Patent Type
Patents(China)
Current Assignee / Owner
Filing Date
2022-05-18
Publication Date
2025-05-06
Estimated Expiration
2042-05-18

AI Technical Summary

Technical Problem

The lack of anti-vibration and impact testing methods for electronic detonators simulated blasting environments in the prior art, resulting in a high explosion-rejection rate of electronic detonators in complex blasting environments, affecting application.

Method used

A simulation and testing device for vibration and impact resistance of electronic detonators is designed. By setting up single or multiple rows of simulated gun holes on the test body that simulates the rock properties on the site, setting up test detonators and detonators to be tested, and testing the vibration and impact resistance of the detonators to be tested by testing the impact energy during detonators explosion.

Benefits of technology

It improves the convenience and accuracy of the vibration and impact resistance performance test of electronic detonators, replaces on-site blasting testing, shortens the testing time, clarifies performance indicators, and provides direction for product improvement.

✦ Generated by Eureka AI based on patent content.

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Abstract

The present invention discloses a simulation test device and method for the vibration and impact resistance of electronic detonators. The test device includes a test body made of rock; a plurality of detonator setting holes consisting of test holes and tested holes are arranged on the same surface of the test body, the test holes have the same aperture as the tested holes, the tested holes are deeper than the test holes by a set value, and the hole spacing between adjacent holes is greater than the sympathetic detonation distance of the tested detonator; the test holes and the tested holes are arranged alternately in the same row; or, the test holes and the tested holes are arranged in two adjacent rows respectively. The test method is implemented based on the aforementioned test device. The beneficial effect of the present invention is that the device simulates the on-site blasting environment, improves the convenience of testing the vibration and impact resistance of electronic detonators, and after changing the hole spacing parameters, rich test data can be obtained, the performance indicators can be clarified, and the improvement direction can be indicated for product improvement. The test method is implemented based on the aforementioned device, which can replace on-site testing, and the test results are accurate.
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Description

Technical Field

[0001] The invention relates to a vibration and impact resistance performance testing technology for electronic detonators, in particular to a vibration and impact resistance performance simulation testing device and a testing method for electronic detonators. Background Art

[0002] With the continuous development and maturity of electronic detonator technology, its superiority is increasingly recognized. With the rapid promotion and application of electronic detonators, the blasting environment has become more and more complex. The applicability and reliability of electronic detonator products have become the core competitive weapons in the market. At present, the design and production of electronic detonators are basically based on industry standards. From the actual application situation, the products produced according to this standard can better meet the application of general open-pit blasting in China. However, in small-section blasting such as tunnels, hard rocks, and underground mining, under the action of strong vibration and impact, electronic detonators have a high explosion rejection rate, which seriously affects the application of electronic detonators in the aforementioned environment. Therefore, the vibration and impact resistance of electronic detonators are important indicators for application in the aforementioned environment. However, due to the lack of vibration and impact test methods for electronic detonators to simulate blasting environments in the prior art, relevant tests can usually only be carried out at the blasting construction site, which consumes a lot of time and has the potential to affect the progress of the project. To this end, it is urgently necessary to develop a set of electronic detonator vibration resistance simulation test equipment that meets the needs of electronic detonator manufacturers and blasting construction companies to improve the convenience of testing, and by accurately simulating the blasting environment, implement vibration and impact resistance testing of electronic detonator products, obtain reliable performance test data, clarify performance indicators, and point out the direction of improvement for product improvement. Summary of the invention

[0003] The first purpose of the present invention is to provide a vibration and impact resistance simulation test device for electronic detonators in view of the inconvenience of the vibration resistance test of electronic detonators in the prior art. The device sets a single row or multiple rows of simulated blast holes on a test body simulating the rock properties on site, sets test detonators or tested detonators in the simulated blast holes, and obtains the test data of the tested detonators according to the difference in the hole spacing between the two when the test detonators explode, thereby improving the convenience of the vibration and impact resistance test of electronic detonators. The second purpose of the present invention is to provide a vibration and impact resistance simulation test method for electronic detonators, which is implemented based on the aforementioned simulation test device to improve the convenience of the test, shorten the test time, and eliminate the test influencing factors of the project progress.

[0004] To achieve the first purpose, the present invention adopts the following technical solution.

[0005] A device for simulating the vibration and impact resistance of electronic detonators comprises a test body made of blasting environment rock or simulated blasting environment rock; a plurality of detonator setting holes are arranged on the same surface of the test body, the plurality of detonator setting holes are composed of test holes and tested holes, the test holes have the same aperture as the tested holes, and the tested holes are deeper than the test holes by a set value; the test holes and the tested holes are arranged in the same row and in a staggered manner; or the test holes and the tested holes are arranged in two adjacent rows respectively, and a row of tested holes is located in the middle of two rows of test holes.

[0006] The test device adopts the above scheme, and simulates the rock properties at the blasting site through a test body made of blasting environment rock, and sets the test hole and the tested hole in an adjacent manner on the test body, so as to set the test detonator in the test hole. After the tested detonator is set in the tested hole, the test detonator explodes, and the vibration and impact resistance of the tested detonator is tested under the condition that the tested detonator does not explode. It can replace the on-site blasting test, and improve the convenience of the vibration and impact resistance test of the electronic detonator. And by changing the hole spacing, rich performance test data can be obtained, the performance indicators can be clarified, and the improvement direction can be indicated for product improvement. Among them, the aperture of the test hole and the tested hole can be designed according to single or multiple detonators to meet the test requirements of single detonator testing and simultaneous testing of multiple detonators; in addition, the depth of the tested hole is deeper than the test hole, so that the impact energy generated by the explosion of the test detonator is closer to the fragile part of the upper half of the tested detonator, which is composed of an electronic control module and an ignition structure to form an electronic ignition element, thereby improving the reliability of the test results from another aspect.

[0007] Preferably, the setting value of the depth of the measured hole relative to the test hole is the basic detonator charge length of the measured detonator. In order to implement the test on the measured detonator with the basic detonator, the test conditions are consistent with the use conditions, and the accuracy of the test results is ensured. Among them, when the corresponding basic detonator length is 25mm, the measured hole is 25mm deeper than the test hole, and when the corresponding basic detonator length is 30mm, the measured hole is 30mm deeper than the test hole.

[0008] Preferably, the diameter of the detonator setting hole is 1.2 to 1.5 times the outer diameter of the corresponding electronic detonator, which is suitable for testing a single detonator separately.

[0009] Preferably, in the structure where the test holes and the tested holes are arranged in the same row, a plurality of detonator setting holes are arranged at equal intervals, and the test holes are arranged at both ends of the same row; the distance between the detonator setting holes and the corresponding edges is greater than or equal to the hole spacing. This avoids the explosion of the tested detonator with the basic detonator in the event of an accident, resulting in relatively serious safety consequences, and ensures the safety of the test process; the distance between the detonator setting holes and the corresponding edges is greater than the hole spacing, which can avoid the edges of the test body being blown up and damaged during the test process, and ensures the reliability of the test results.

[0010] Preferably, in the structure where the test holes and the tested holes are arranged in two adjacent rows, the multiple detonator setting holes are arranged in a horizontal and vertical tic-tac-toe pattern, and the distance from the center of the detonator setting hole located at the edge to the corresponding edge is greater than or equal to the corresponding hole spacing or row spacing. This facilitates the processing of the detonator setting holes and the control management of the test data. The distance from the center of the detonator setting hole located at the edge to the corresponding edge is greater than or equal to the corresponding hole spacing or row spacing, which can prevent the edge of the test body from being exploded and damaged during the test process, and ensure the reliability of the test results.

[0011] Further preferably, the test body is in a smooth hexahedral structure, and the detonator setting hole extends along the thickness direction of the hexahedron. The smooth hexahedral structure facilitates its firm installation and fixation, thereby improving the convenience of test operation.

[0012] To achieve the second purpose, the present invention adopts the following technical solution.

[0013] A method for simulating the vibration and impact resistance of electronic detonators is provided, and an explosion refusal test is implemented based on the simulation test of the vibration and impact resistance of electronic detonators to achieve the first purpose.

[0014] The test method of the aforementioned scheme is implemented by using a simulation test device for the vibration and impact resistance of electronic detonators to achieve the first purpose, and by setting a test electronic detonator in the test hole and setting the tested electronic detonator in the tested hole, the explosion rejection test results of the set hole spacing and the corresponding electronic inner tube are obtained, so that the vibration and impact resistance of the electronic detonator can be reflected through the explosion rejection rate. It can replace the on-site blasting test and improve the convenience of the vibration and impact resistance test of the electronic detonator. And by setting the test hole and the tested hole at different spacings, reliable performance test data can be obtained, the performance indicators can be clarified, and the direction of improvement can be indicated for product improvement.

[0015] Preferably, the testing process comprises the following steps:

[0016] S1. Test preparation: Select a test body with a determined structure and a determined hole spacing R, as well as a test electronic detonator and a tested electronic detonator that have passed the inspection; wherein the hole spacing is greater than the detonator sympathetic detonation distance;

[0017] S2, setting of detonation delay parameters: after the qualified test electronic detonator and the tested electronic detonator are placed in the test hole and the tested hole respectively, a delay operation table is created based on the electronic detonator initiator, and the delay parameter T is registered by scanning;

[0018] S3, parallel networking: the testing electronic detonator and the tested electronic detonator are connected in parallel to form a network;

[0019] S4, detonator initiation: Under safety alert conditions, the detonator network is connected to the initiator at the initiation point, and then network detection, charging and initiation are carried out;

[0020] S5. Obtaining test results: After the detonation is completed, the detonation results and status of the tested electronic detonator are recorded in detail;

[0021] S6, judgment of explosion rejection: if explosion rejection does not occur, relevant test conditions are recorded, and after the vibration resistance level of the electronic detonator under test is evaluated as qualified, the test is terminated or step S11 is executed, and in the test body selection process of step S11, a test body with a smaller hole spacing R is selected; if explosion rejection occurs, the next step is executed;

[0022] S7. Statistical analysis of explosion-resistant detonators: Under safe protection conditions, check the appearance of explosion-resistant detonators, test electrical parameters, and then dissect, observe and record the welding conditions of the foot line and the head, as well as the status of the head and chip module;

[0023] S8. Evaluate the vibration resistance level: Construct the relationship between the failure factors of the electronic detonator under the condition of a certain hole spacing R, and evaluate the vibration resistance level of the electronic detonator;

[0024] S9, judging the evaluation result: judging the evaluation result of the vibration resistance level of the electronic detonator, if the evaluation result is qualified, the test is terminated; if the evaluation result is unqualified, the next step is executed;

[0025] S10, evaluation times judgment: judge the test times, when the test times are less than the set value N, execute the next step; when the test times are equal to the set value N, end the test;

[0026] S11, repeat the test: select a test body with different hole spacing R, and / or select an improved electronic detonator, and return to step S1 to obtain a new evaluation result of the vibration resistance level of the electronic detonator. In order to form a complete test process and ensure the accuracy of the test results. Among them, the vibration resistance level of the electronic detonator can also be evaluated through the relationship between the failure factors of the electronic detonator, so as to propose corresponding improvement measures to meet the reliability requirements of the product. It is also possible to propose product optimization measures under the condition of qualified test to avoid the situation where excess quality leads to excessive product costs.

[0027] Further preferably, when the test holes and the holes to be tested are arranged in the same row on the selected test body and arranged in a staggered manner, the hole spacing between the test holes and the holes to be tested is Ri; in the process of creating the delay operation table, two rows of delay operation tables are created, and the test holes are defined as the first row, and the delay is set to T1; the holes to be tested are defined as the second row, and the delay is set to T2, and T2>Ri / V; wherein V is the propagation velocity of the explosion shock of the test detonator. It is suitable for the case where the test body is a plate brick structure, which can effectively reduce the volume and weight of the test body and improve the convenience of testing.

[0028] Further preferably, when the test holes and the holes to be tested are arranged in two adjacent rows on the selected test body, and when arranged in three rows, the space distance and row spacing between the test holes and the holes to be tested are equal, and are both Rj. In the process of creating the delay operation table, a three-row delay operation table is created, and the test holes are defined as the first and third rows, and the delay is set to T1, and the holes to be tested are defined as the second row, and the delay is set to T2, and T2>Ri / V; wherein V is the propagation velocity of the explosion shock of the test detonator. It is suitable for the case where the test body is a plate-like structure. Through the test method in which the hole to be tested is located between the two test holes, the test results are more consistent with the on-site blasting operation, and the test results are more reliable.

[0029] The beneficial effects of the present invention are that the simulation test device simulates the on-site environment, improves the convenience of testing the vibration and impact resistance of electronic detonators, and after changing the hole spacing, rich test data can be obtained, the performance indicators can be clarified, and the direction of improvement can be indicated for product improvement. The test method is implemented based on the above device, which can replace on-site testing, and the test results are accurate. BRIEF DESCRIPTION OF THE DRAWINGS

[0030] Figure 1 It is a schematic structural front view of embodiment 1 of the present invention.

[0031] Figure 2 It is a schematic cross-sectional view of the structure of embodiment 1 of the present invention.

[0032] Figure 3 It is a schematic structural front view of embodiment 2 of the present invention.

[0033] Figure 4 It is a schematic cross-sectional view of the structure of embodiment 2 of the present invention.

[0034] The aforementioned figures are also used to illustrate the testing method of the present invention. DETAILED DESCRIPTION

[0035] The present invention will be further described below in conjunction with the accompanying drawings, but the present invention is not limited to the scope of the described embodiments.

[0036] Example 1, see Figure 1 , Figure 2 A device for simulating the vibration and impact resistance of electronic detonators comprises a test body made of blasting environment rock or simulated blasting environment rock; a plurality of detonator setting holes are arranged on the same surface of the test body, and the plurality of detonator setting holes are composed of a test hole 1 and a tested hole 2; the test hole 1 and the tested hole 2 are arranged in the same row and in a staggered manner; the test hole 1 and the tested hole 2 have the same aperture, the tested hole 2 is deeper than the test hole 1 by the basic detonator charge length of the tested detonator, and the distance between adjacent test holes 1 and tested holes 2 is greater than the sympathetic detonation distance of the tested detonator.

[0037] Among them, a plurality of detonator setting holes are arranged at equal intervals, and the test holes 1 are arranged at both ends of the same row. The test body is a smooth hexahedral structure, specifically a cuboid, the detonator setting holes are distributed along the length direction and extend along the thickness direction, the distance X1 from the center of the detonator setting hole to the two side surfaces in the width direction is greater than or equal to the hole spacing B, and the distance from the center of the test hole 1 at both ends in the length direction to the corresponding end surface B1 is greater than or equal to the corresponding hole spacing B.

[0038] Example 2, see Figure 3 and Figure 4 , the test holes 1 and the tested holes 2 are arranged in two adjacent rows respectively, and the multiple detonator setting holes are arranged in a horizontal and vertical tic-tac-toe pattern, and the distance from the center of the detonator setting hole at the edge to the corresponding edge is greater than the corresponding hole spacing or row spacing; specifically, three rows of detonator setting holes are arranged in the width direction of the rectangular test body, wherein the middle row is the tested holes 2, and the two rows on both sides are test holes 1, that is, there is a tested hole 2 corresponding to the middle of every two test holes 1, and three detonator setting holes constitute a row. The X2 distance between the center and the width edge of the two test holes 1 in the same row is greater than or equal to the row spacing X between the test hole 1 and the tested hole 2; the distance B2 between the center and the corresponding end edge of the three detonator setting holes in the same row at both ends of the length direction of the test body is greater than or equal to the hole spacing B between adjacent holes in the same row of detonator setting holes.

[0039] In the above-mentioned embodiments 1 and 2, the apertures of the test hole 1 and the tested hole 2 can be designed according to single-shot or multiple-shot detonators. When designed according to single-shot detonators, the apertures of the test hole 1 and the tested hole 2 are 1.2 to 1.5 times the outer diameter of the tested detonator.

[0040] The rest of the structure of this embodiment is the same as that of Embodiment 1 and will not be described again.

[0041] In the above-mentioned Embodiment 1 and Embodiment 2, the charge length of the basic detonator is generally 25 mm or 30 mm.

[0042] Embodiment 3, a method for simulating the vibration and impact resistance of electronic detonators, implements an explosion resistance test based on the simulation test of the vibration and impact resistance of electronic detonators in Embodiment 1 or 2.

[0043] The following steps are involved:

[0044] S1. Test preparation: Select a test body with a determined structure and a determined hole spacing R, as well as a test electronic detonator and a tested electronic detonator that have passed the inspection; wherein the hole spacing is greater than the detonator sympathetic detonation distance;

[0045] S2, setting of detonation delay parameters: after the qualified test electronic detonator and the tested electronic detonator are placed in the test hole 1 and the tested hole 2 respectively, a delay operation table is created based on the electronic detonator initiator, and the delay parameter T is registered by scanning;

[0046] S3, parallel networking: the testing electronic detonator and the tested electronic detonator are connected in parallel to form a network;

[0047] S4, detonator initiation: Under safety alert conditions, the detonator network is connected to the initiator at the initiation point, and then network detection, charging and initiation are carried out;

[0048] S5. Obtaining test results: After the detonation is completed, the detonation results and status of the tested electronic detonator are recorded in detail;

[0049] S6, judgment of explosion rejection: if explosion rejection does not occur, relevant test conditions are recorded, and after the vibration resistance level of the electronic detonator under test is evaluated as qualified, the test is terminated or step S11 is executed, and in the test body selection process of step S11, a test body with a smaller hole spacing R is selected; if explosion rejection occurs, the next step is executed;

[0050] S7. Statistical analysis of explosion-resistant detonators: Under safe protection conditions, check the appearance of explosion-resistant detonators, test electrical parameters, and then dissect, observe and record the welding conditions of the foot line and the head, as well as the status of the head and chip module;

[0051] S8. Evaluate the vibration resistance level: Construct the relationship between the failure factors of the electronic detonator under the condition of a certain hole spacing R, and evaluate the vibration resistance level of the electronic detonator;

[0052] S9, judging the evaluation result: judging the evaluation result of the vibration resistance level of the electronic detonator, if the evaluation result is qualified, the test is terminated; if the evaluation result is unqualified, the next step is executed;

[0053] S10, evaluation times judgment: judge the test times, when the test times are less than the set value N, execute the next step; when the test times are equal to the set value N, end the test;

[0054] S11. Repeat the test: select a test body with a different hole spacing R, and / or select an improved electronic detonator, and return to step S1 to obtain a new electronic detonator vibration resistance level assessment result.

[0055] Among them, see Figure 1 and Figure 2 When the vibration and shock resistance simulation test of the electronic detonator of Example 1 is implemented, the test hole 1 and the tested hole 2 on the test body are arranged in the same row and arranged in a staggered manner, and the hole spacing between the test hole 1 and the tested hole 2 is Ri; in the process of creating the delay operation table, two rows of delay operation tables are created, and the test hole 1 is defined as the first row, and the delay is set to T1; the tested hole 2 is defined as the second row, the delay is set to T2, and T2>Ri / V; wherein V is the propagation speed of the test detonator explosion shock.

[0056] In this embodiment, see Figure 3 and Figure 4 When the vibration and shock resistance simulation test of the electronic detonator of Example 2 is implemented, when the test hole 1 and the tested hole 2 on the test body are arranged in two adjacent rows respectively, and when arranged in three rows, the spatial distance and row spacing of the test hole 1 and the tested hole 2 are equal, and are both Rj. In the process of creating the delay operation table, a three-row delay operation table is created, and the test hole 1 is defined as the first row and the third row, and the delay is set to T1, and the tested hole 2 is defined as the second row, and the delay is set to T2, and T2>Ri / V; wherein V is the propagation speed of the test detonator explosion shock.

[0057] The preferred specific embodiments of the present invention are described in detail above. It should be understood that a person skilled in the art can make many modifications and changes based on the concept of the present invention without creative work. Therefore, any technical solution that can be obtained by a person skilled in the art through logical analysis, reasoning or limited experiments based on the concept of the present invention on the basis of the prior art should be within the scope of protection determined by the claims.

Claims

1. A method for simulating the vibration and impact resistance of electronic detonators, characterized in that: The explosion resistance test is carried out using the electronic detonator vibration and impact resistance simulation test device; The electronic detonator vibration and impact resistance simulation test device comprises: A test body made of blasting environment rock or blasting environment simulating rock; a plurality of detonator setting holes are arranged on the same surface of the test body, the plurality of detonator setting holes are composed of test holes (1) and test holes (2), the test holes (1) and the test holes (2) have the same hole diameter, and the test holes (2) are deeper than the test holes (1) by a set value; the test holes (1) and the test holes (2) are arranged in the same row and in a staggered manner; or the test holes (1) and the test holes (2) are arranged in two adjacent rows, respectively, and one row of the test holes (2) is located in the middle of two rows of the test holes (1); The electronic detonator anti-vibration and anti-shock performance simulation test method comprises the following steps: S1. Test preparation: Select a test body with a determined structure and a determined hole spacing R, as well as a test electronic detonator and a tested electronic detonator that have passed the inspection; wherein the hole spacing is greater than the detonator sympathetic detonation distance; S2, setting of detonation delay parameters: after the qualified test electronic detonator and the tested electronic detonator are respectively placed into the test hole (1) and the tested hole (2), a delay operation table is created based on the electronic detonator initiator, and the delay parameter T is registered by scanning; S3, parallel networking: the testing electronic detonator and the tested electronic detonator are connected in parallel to form a network; S4, detonator initiation: Under safety alert conditions, the detonator network is connected to the initiator at the initiation point, and then network detection, charging and initiation are carried out; S5. Obtaining test results: After the detonation is completed, the detonation results and status of the tested electronic detonator are recorded in detail; S6, judgment of explosion rejection: if explosion rejection does not occur, relevant test conditions are recorded, and after the vibration resistance level of the electronic detonator under test is evaluated as qualified, the test is terminated or step S11 is executed, and in the test body selection process of step S11, a test body with a smaller hole spacing R is selected; if explosion rejection occurs, the next step is executed; S7. Statistical analysis of explosion-resistant detonators: Under safe protection conditions, check the appearance of explosion-resistant detonators, test electrical parameters, and then dissect, observe and record the welding conditions of the foot line and the head, as well as the status of the head and chip module; S8. Evaluate the vibration resistance level: Construct the relationship between the failure factors of the electronic detonator under the condition of a certain hole spacing R, and evaluate the vibration resistance level of the electronic detonator; S9, judging the evaluation result: judging the evaluation result of the vibration resistance level of the electronic detonator, if the evaluation result is qualified, the test is terminated; if the evaluation result is unqualified, the next step is executed; S10, evaluation times judgment: judge the test times, when the test times are less than the set value N, execute the next step; when the test times are equal to the set value N, end the test; S11. Repeat the test: select a test body with a different hole spacing R, and / or select an improved electronic detonator, and return to step S1 to obtain a new electronic detonator vibration resistance level assessment result.

2. The method for simulating the vibration and shock resistance of electronic detonators according to claim 1, characterized in that: The setting value of the depth of the measured hole (2) relative to the test hole (1) is the basic detonator charge length of the measured detonator.

3. The method for simulating the vibration and shock resistance of electronic detonators according to claim 1, characterized in that: The aperture of the detonator setting hole is 1.2 to 1.5 times the outer diameter of the corresponding electronic detonator.

4. The method for simulating the vibration and shock resistance of electronic detonators according to claim 1, characterized in that: In a structure in which the test holes (1) and the tested holes (2) are arranged in the same row, a plurality of detonator setting holes are arranged at equal intervals, and the test holes (1) are arranged at both ends of the same row; and the distance between the detonator setting holes and the corresponding edges is greater than or equal to the hole spacing.

5. The method for simulating the vibration and shock resistance of electronic detonators according to claim 1, characterized in that: In a structure in which the test holes (1) and the test holes (2) are arranged in two adjacent rows, a plurality of detonator setting holes are arranged in a horizontal and vertical tic-tac-toe pattern, and the distance from the center of the detonator setting hole located at the edge to the corresponding edge is greater than or equal to the corresponding hole spacing or row spacing.

6. The method for simulating the vibration and shock resistance of electronic detonators according to claim 4 or 5, characterized in that: The test body is in a smooth hexahedron structure, and the detonator setting hole extends along the thickness direction of the hexahedron.

7. The method for simulating the vibration and shock resistance of electronic detonators according to claim 1, characterized in that: When the test holes (1) and the holes to be tested (2) are arranged in the same row on the selected test body and arranged in a staggered manner, the hole spacing between the test holes (1) and the holes to be tested (2) is Ri; in the process of creating the delay operation table, two rows of delay operation tables are created, and the test holes (1) are defined as the first row, and the delay is set to T1; the holes to be tested (2) are defined as the second row, and the delay is set to T2, and T2>Ri / V; wherein V is the propagation speed of the explosion shock of the test detonator.

8. The method for simulating the vibration and shock resistance of electronic detonators according to claim 1, characterized in that: When the test holes (1) and the holes to be tested (2) are arranged in two adjacent rows on the selected test body, and when they are arranged in three rows, the space distance and the row distance between the test holes (1) and the holes to be tested (2) are equal and are both Rj. In the process of creating the delay operation table, a three-row delay operation table is created, and the test holes (1) are defined as the first row and the third row, and the delay is set to T1. The holes to be tested (2) are defined as the second row, and the delay is set to T2, and T2>Ri / V; wherein V is the propagation velocity of the explosion shock of the test detonator.

Citation Information

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