Display panel and mobile terminal

Abstract

An embodiment of the present application discloses a display panel and a mobile terminal, wherein the display panel includes a substrate, a driving circuit, multiple test terminals, multiple test traces, a control terminal group, and a protective function layer, wherein the driving circuit is arranged on the substrate and includes multiple binding terminals and multiple signal traces, a binding terminal is connected to a signal trace; a test terminal is connected to the signal trace through a test trace, and at least one control switch is connected to the test trace; the control terminal of the control terminal group is connected to the control end of the control switch; the protective function layer is arranged on the substrate, the driving circuit, and the test trace, and covers the driving circuit and the control switch.

Description

Technical Field

[0001] The present application relates to the field of display technology, and in particular to a display panel and a mobile terminal. Background Art

[0002] The display panel includes a thin film transistor array, metal traces connecting the thin film transistors, and a binding structure disposed on one side of the thin film transistor array, the binding structure including an array test circuit for performing electrical testing on the thin film transistor array;

[0003] Among them, the array test circuit is located in the test circuit area, and the metal traces in the test circuit area are often partially exposed. Traditional packaging glue cannot cover or covers it incompletely. In the high temperature and high humidity reliability test environment, it is easy to cause trace corrosion, affecting the normal use of the display panel. Summary of the Invention

[0004] The embodiments of the present application provide a display panel and a mobile terminal, which can effectively avoid the technical problem that signal lines in the test circuit area cannot be covered or are incompletely covered by traditional packaging glue, resulting in corrosion under test conditions and thus affecting the normal use of the display panel.

[0005] An embodiment of the present application provides a display panel, comprising:

[0006] substrate;

[0007] A driving circuit is provided on the substrate, comprising a plurality of binding terminals and a plurality of signal traces, wherein one binding terminal is connected to one of the signal traces;

[0008] A plurality of test terminals are provided on the substrate;

[0009] A plurality of test lines, wherein one of the test terminals is connected to the signal line via one of the test lines, and at least one control switch is connected to the test line;

[0010] a control terminal group, provided on the substrate and connected to the control terminal of each of the control switches;

[0011] A protective functional layer is provided on the substrate, the driving circuit and the test trace, and covers the driving circuit and the control switch.

[0012] Optionally, the control switch includes a thin film transistor;

[0013] In the test line and the thin film transistor, the first connection end of the thin film transistor is connected to the signal line through the test line, the second connection end of the thin film transistor is connected to the test terminal through the test line, and the control end of the thin film transistor is connected to the control terminal group.

[0014] Optionally, the control terminal group includes a control terminal, and the control end of each control switch is connected to the control terminal.

[0015] Optionally, the plurality of test lines include at least two first test lines and at least one second test line, one end of the first test line is connected to one of the signal lines, the other end of the first test line is connected to one of the test terminals, one end of the second test line is connected to one of the test terminals, and the other end of the second test line includes a first branch and a second branch connected to different signal lines;

[0016] The multiple control switches include a first control switch arranged on the first test trace, a second control switch arranged on the first branch, and a third control switch arranged on the second branch. The control terminal group includes a first control terminal, a second control terminal, and a third control terminal. The control end of each of the first control switches is connected to the first control terminal, the control end of the second control switch is connected to the second control terminal, and the control end of the third control switch is connected to the third control terminal.

[0017] Optionally, the number of the test terminals is the same as the number of the signal traces, one test terminal is connected to one signal trace via one test trace, and one control switch is provided on one test trace.

[0018] Optionally, the control switch includes one of a low-temperature polysilicon thin film transistor, a metal oxide thin film transistor, and an amorphous silicon thin film transistor.

[0019] Optionally, the test trace includes a first segment and a second segment connected to each other, the first segment and the second segment are both located between the control switch and the test terminal, and in a direction perpendicular to the substrate, the width of the first segment is smaller than the width of the second segment.

[0020] Optionally, in a direction perpendicular to the substrate, a difference between a width of the first segment and a width of the second segment ranges from 25 um to 95 um.

[0021] Optionally, in a direction perpendicular to the substrate, a width of the first segment is greater than or equal to 5 um.

[0022] The present application also provides a mobile terminal, comprising the display panel and a terminal body as described in any one of the above embodiments, wherein the terminal body and the display panel are combined into one body.

[0023] The beneficial effects of the present invention include at least: by setting a control switch and a test line, the test line is used to lead out the signal line, and at least one control switch is connected to the test line, the control terminal group is connected to the control end of the control switch, the control switch isolates the normal signal line from the test terminal, the protection function layer covers the driving circuit, the control switch and part of the test line, and the control signal is input through the control terminal group to change the state of the control switch to perform factory inspection on the driving circuit of the display panel, effectively avoiding the existing signal line directly passing through the area where the test terminal is located, the signal line cannot be covered or is incompletely covered by the packaging glue, the signal line is exposed, and the signal line is prone to corrosion in a high temperature and high humidity reliability test environment, causing the normal signal line to be disconnected, thereby improving the factory yield of the display panel. BRIEF DESCRIPTION OF THE DRAWINGS

[0024] In order to more clearly illustrate the technical solutions in the embodiments of the present application, the following briefly introduces the drawings required for use in the description of the embodiments. Obviously, the drawings described below are only some embodiments of the present application. For those skilled in the art, other drawings can be obtained based on these drawings without creative work.

[0025] Figure 1 This is a schematic diagram of the structure of the drive circuit connected to the test terminal in the prior art;

[0026] Figure 2 This is a schematic diagram of the wiring structure of a driving circuit close to the binding end provided in an embodiment of the present application;

[0027] Figure 3 This is a schematic diagram of the wiring structure of another driving circuit close to the binding end provided in an embodiment of the present application;

[0028] Figure 4 This is a schematic diagram of the wiring structure of another driving circuit close to the binding end provided in an embodiment of the present application;

[0029] Figure 5 is a structural diagram of a display panel provided in an embodiment of the present application;

[0030] Figure 6 This is a structural diagram of a test line between a control switch and test terminals provided in an embodiment of the present application. DETAILED DESCRIPTION

[0031] The following will be combined with the drawings in the embodiments of this application to clearly and completely describe the technical solutions in the embodiments of this application. Obviously, the embodiments described are only part of the embodiments of this application, not all of the embodiments. Based on the embodiments in this application, all other embodiments obtained by those skilled in the art without making creative efforts are within the scope of protection of this application.

[0032] The embodiments of the present application provide a display panel and a mobile terminal. The following are detailed descriptions of each. It should be noted that the order of description of the following embodiments does not limit the preferred order of the embodiments. In addition, in the description of the present application, the term "including" means "including but not limited to". The terms first, second, third, etc. are used only as labels and do not impose numerical requirements or establish an order. Various embodiments of the present invention may exist in the form of a range; it should be understood that the description in the form of a range is only for convenience and brevity and should not be understood as a hard limitation on the scope of the present invention; therefore, it should be considered that the range description has specifically disclosed all possible sub-ranges and single numbers within the range. For example, it should be considered that the range description from 1 to 6 has specifically disclosed sub-ranges, such as from 1 to 3, from 1 to 4, from 1 to 5, from 2 to 4, from 2 to 6, from 3 to 6, etc., as well as single numbers within the numbered range, such as 1, 2, 3, 4, 5 and 6, which applies regardless of the range. In addition, whenever a numerical range is indicated in this document, it is meant to include any quoted number (fractional or integer) within the indicated range.

[0033] like Figure 1 As shown, currently, in the conventional array substrate 50 setting structure, the signal line 101 passes through the test circuit area and then connects to the binding terminal 40. The signal line 101 in the test circuit area is often partially exposed, and the traditional packaging glue cannot cover it or covers it incompletely. In the high temperature and high humidity reliability test environment, it is easy to cause corrosion of the signal line 101 and disconnection of the signal line 101, affecting the normal use of the driving circuit 10.

[0034] In order to solve the above technical problems, this application provides the following technical solutions. Please refer to the following embodiments for details.

[0035] This embodiment provides a display panel. Figure 2-Figure 6 As shown, including:

[0036] substrate 50;

[0037] The driving circuit 10 is provided on the substrate 50 and includes a plurality of binding terminals 40 and a plurality of signal traces 101 , wherein one of the binding terminals 40 is connected to one of the signal traces 101 ;

[0038] A plurality of test terminals 30 are provided on the substrate 50;

[0039] Multiple test lines 201, one of the test terminals 30 is connected to the signal line 101 via one of the test lines 201, and at least one control switch 202 is connected to the test line 201;

[0040] A control terminal group 301 is provided on the substrate 50 and connected to the control terminal T3 of each control switch 202;

[0041] The protection function layer M1 is disposed on the substrate 50 , the driving circuit 10 and the test trace 201 , and covers the driving circuit 10 and the control switch 202 .

[0042] It should be noted that if Figure 5 As shown, the display panel includes a display area AA and a non-display area VA surrounding the display area AA. The non-display area VA includes a binding area A2 and a test area A1. A plurality of binding terminals 40 are located in the binding area A2, and a plurality of test terminals 30 are located in the test area A1.

[0043] A gate driving circuit 10 is provided in the non-display area VA on one side of the display area AA; an array of pixel units PX is provided in the display area AA, and each pixel unit PX is electrically connected to a corresponding sub-driving circuit 10;

[0044] The gate drive circuit 10 and each sub-drive circuit 10 constitute the above-mentioned drive circuit 10. The gate drive circuit 10 will connect the sub-drive circuit 10 of each pixel unit PX through multiple signal lines 101 in the row direction. Each sub-drive circuit 10 will also be connected to multiple signal lines 101 in the column direction. By inputting corresponding signals to each signal line 101 in the drive circuit 10, the pixel unit PX can be driven to emit light.

[0045] Specifically, if Figure 2 and Figure 5 As shown, multiple signal lines 101 of the driving circuit 10 extend from the display area AA toward the binding area A2, and the ends of the signal lines 101 are connected to the corresponding binding terminals 40. Multiple test lines 201 are connected to the multiple signal lines 101 to be tested, and the signal lines 101 are led out and connected to the corresponding test terminals 30 in the test area A1. At least one control switch 202 ( Figure 5 not shown).

[0046] Specifically, the settings can be made according to the different signals transmitted on the signal lines 101. For example, when the same signal is transmitted on multiple signal lines 101, the multiple signal lines 101 are connected to a test terminal 30 through a test line 201; multiple signal lines 101 that transmit different signals are each connected to a corresponding test terminal 30.

[0047] Specifically, the test terminal 30 is used to connect an external detection circuit or detection equipment to input a corresponding test signal to the display panel during the test phase, light up the display panel for testing, and when the test is completed and the test result meets the binding standard, the driver chip is bound to the above-mentioned binding terminal 40, thereby inputting a display signal from the driver chip to the display panel for image display.

[0048] Specifically, the control switch 202 includes: a control terminal T3, an input terminal and an output terminal; the control terminal T3 controls the signal of the input terminal to be transmitted to the output terminal; the input terminal is connected to the test terminal 30, and the output terminal is connected to the signal line 101.

[0049] The control terminal 3011 of the control terminal group is connected to the control terminal T3 of the control switch 202 through the control line 203. The control switch 202 can only be turned on when the voltage difference between the signal input to the control terminal T3 and the signal input to the input terminal is greater than the threshold voltage. Therefore, the potential of the test signal input to the test terminal 30 connected to the input end of the control switch 202 is different from the potential of the power supply signal input to the control terminal 3011 connected to the control terminal T3 of the control switch 202.

[0050] Specifically, the control terminal group 301 includes at least one control terminal 3011 . The control terminal 3011 can be externally connected to a power source to provide power signals with different potentials.

[0051] Specifically, a protective functional layer M1 is provided on the substrate 50 and the driving circuit 10. The protective functional layer M1 may be a packaging glue layer, and the material of the packaging glue layer may be UV glue. By providing the protective functional layer M1 to encapsulate the driving circuit 10, it is possible to prevent water molecules or oxygen from corroding the exposed signal traces 101 during the test process.

[0052] Specifically, the protective functional layer M1 may cover the driving circuit 10 , the signal trace 101 , the control switch 202 and a portion of the test trace 201 , while the test terminal 30 and the control terminal group 301 are exposed without being packaged.

[0053] Specifically, in an embodiment of the present invention, a plurality of test lines 201 can be set on the substrate 50 in the non-display area VA. By rationally arranging the test lines 201, the signal lines 101 are led out and connected to the test terminals 30 in the test circuit area, and the test circuit area is not provided with a protective functional layer M1.

[0054] Specifically, the test trace 201 is connected to a control switch 202 . The number of the control switches 202 may be the same as the number of the signal traces 101 . The control switch 202 is used to separate the signal trace 101 from the test terminal 30 .

[0055] It should be noted that the control switch 202 is used to respond to the signal input to the signal line by the test terminal 30 (i.e., the test signal generated by the external test circuit or test equipment) during the test phase, and transmit the test signal input by the test terminal 30 to the signal line 101; and cut off the signal on the test line 201 (i.e., the test signal generated by the external test circuit or test equipment) from being transmitted to the test circuit signal input terminal during the display phase.

[0056] The signal input to the control terminal T3 of the control switch 202 is controlled by the signal input to the test terminal 30, and the test terminal 30 will only have a signal input when it is connected to an external detection circuit or detection equipment to perform a lighting test on the display panel. Therefore, only when the control switch 202 is in the turned-on state during the test phase, the test signal can be transmitted from the test terminal 30 to the corresponding signal line 101 through the control switch 202.

[0057] When the test phase ends, no signal is input to the test terminal 30. At this time, the control end T3 of the control switch 202 is in a suspended state (the control switch 202 is closed). At this time, even if there is a signal transmitted on the test trace 201 (between the signal trace 101 and the control switch 202), it cannot be transmitted to the test terminal 30 through the control switch 202. In this way, it can be ensured that the test terminal 30 is not charged, and no electrochemical reaction will occur, thereby avoiding the situation where the test terminal 30 is charged and corroded.

[0058] It can be understood that by setting the control switch 202 and the test line 201, the test line 201 is used to lead the signal line 101, and the test line 201 is connected to the control switch 202, and at least one control switch 202 is connected to the test line 201, and the control terminal group 301 is connected to the control end T3 of the control switch 202. The control switch 202 isolates the normal signal line 101 from the test terminal 30, and the protection function layer M1 covers the drive circuit 10, the control switch 202 and part of the test circuit. The test line 201 inputs a control signal through the control terminal group 301 to change the state of the control switch 202 to perform factory inspection on the driving circuit 10 of the display panel, effectively avoiding the existing signal line 101 directly passing through the area where the test terminal 30 is located. The signal line 101 cannot be covered or is not completely covered by the packaging glue, and the signal line 101 is exposed. In a high temperature and high humidity reliability test environment, the signal line 101 is prone to corrosion, causing the normal signal line 101 to be broken, thereby improving the factory yield of the display panel.

[0059] In one embodiment, the control switch 202 includes a thin film transistor; in the test line 201 and the thin film transistor, the first connection terminal T1 of the thin film transistor is connected to the signal line 101 through the test line 201, the second connection terminal T2 of the thin film transistor is connected to the test terminal 30 through the test line 201, and the control terminal T3 of the thin film transistor is connected to the control terminal group 301.

[0060] Specifically, the thin film transistor is one of a low-temperature polysilicon thin film transistor, a metal oxide thin film transistor, and an amorphous silicon thin film transistor, and can be selected according to actual production needs.

[0061] Specifically, the control terminal T3 of the thin film transistor is connected to the control terminal 3011 of the control terminal group 301 . The control terminals T3 of multiple thin film transistors can be connected to one control terminal 3011 , or to different control terminals 3011 .

[0062] For example, when the display panel is an OLED display panel, the power signal input by the control terminal 3011 of the control terminal group 301 can be a VGH signal or a VSS signal. In addition, the above-mentioned control terminal 3011 can also be used to transmit other power signals. When the display panel is a liquid crystal display panel or other types of display panels, the control terminal 3011 of the control terminal group 301 can also be used to transmit the power signal required in the corresponding panel.

[0063] Specifically, the thin film transistor can be a thin film transistor that is turned on at a high potential and turned off at a low potential; or a thin film transistor that is turned on at a low potential and turned off at a high potential, which can be adjusted according to actual test requirements.

[0064] In one embodiment, if Figure 2 As shown, the control terminal group 301 includes a control terminal 3011 , and the control terminal T3 of each control switch 202 is connected to the control terminal 3011 .

[0065] Specifically, in this embodiment, the plurality of signal lines 101 may include integrated gate drive lines, data signal lines, scan lines, and the like.

[0066] It is understandable that by providing multiple control switches 202 with control terminals T3 connected to a control terminal 3011 via control traces 203 , the test circuit can be turned on or off synchronously, which can simplify the circuit structure and improve the space utilization of the display panel.

[0067] In one embodiment, if Figure 3As shown, the multiple test lines 201 include at least two first test lines 2020 and at least one second test line 2030, one end of the first test line 2020 is connected to the signal line 101, the other end of the first test line 2020 is connected to the test terminal 30, one end of the second test line 2030 is connected to the test terminal 30, and the other end of the second test line 2030 includes a first branch 2031 and a second branch 2032 connected to different signal lines 101;

[0068] like Figure 3 As shown, the multiple control switches 202 include a first control switch 202F1 set on the first test trace 2020, a second control switch 202F2 set on the first branch 2031, and a third control switch 202F3 set on the second branch 2032. The control terminal group 301 includes a first control terminal, a second control terminal and a third control terminal. The control end of each first control switch 202F1 is connected to the first control terminal, the control end of the second control switch 202F2 is connected to the second control terminal, and the control end of the third control switch 202F3 is connected to the third control terminal.

[0069] Specifically, if Figure 3 As shown, the two signal lines 101 can be connected to a test terminal 30 through the second test line 2030. The second test line 2030 includes a first branch 2031 and a second branch 2032. A second control switch 202F2 is set on the first branch 2031, and a third control switch 202F3 is set on the second branch 2032. The second control switch 202F2 and the third control switch 202F3 can be turned on at the same time or not. The power supply signal potential connected to the second control terminal and the third control terminal can be the same or different, and can be adjusted according to the actual test situation. In the OLED display panel, the second control terminal 3011 can be connected to the STV signal, and the third control terminal can be connected to the RST signal. The STV signal and the RST signal are both high voltage and low voltage time-sharing switching signals. The high voltage of the STV signal is in the first frame, and the high voltage of the RST signal is in the last frame, so that the second control switch and the third control switch are turned on in different time periods, realizing corresponding circuit detection and simplifying the circuit structure.

[0070] Specifically, if Figure 4As shown, three signal lines 101 can also be connected to a test terminal 30 through a test line 201. The test line 201 has three branches, which are respectively connected to the three signal lines 101. Each of the three branches is connected to a control switch 202. In a specific OLED display panel, the control terminals T3 of the three control switches 202 are respectively connected to the VGH signal, the STV signal and the RST signal.

[0071] It can be understood that this configuration can simplify the circuit structure of the test area A1 and improve the space utilization of the display panel.

[0072] In one embodiment, if Figure 2 As shown, the number of the test terminals 30 is the same as the number of the signal traces 101 . One test terminal 30 is connected to one signal trace 101 via one test trace 201 . One control switch 202 is provided on one test trace 201 .

[0073] It is understandable that the number of the test terminals 30 being the same as the number of the signal traces 101 can make the test circuit of each signal trace 101 relatively independent, thereby reducing the difficulty of troubleshooting the cause of the fault after the drive circuit 10 fails.

[0074] In one embodiment, if Figure 6 As shown, the test trace 201 includes a first segment D1 and a second segment D2 connected to each other, wherein the first segment D1 and the second segment D2 are both located between the control switch 202 and the test terminal 30, and in a direction perpendicular to the substrate 50, the width of the first segment D1 is smaller than the width of the second segment D2.

[0075] Specifically, the width of the test trace 201 can be the same as the width of the second section D2, and there is a width difference between the first section D1 and the second section D2. The test line with the first section D1 and the second section D2 is used to connect the control switch 202 and the test terminal 30. The difference between the width of the first section D1 and the width of the second section D2 is in the range of 25um to 95um, including endpoint values, and can be any one of 25um, 32um, 38um, 40um, 55um, 72um, and 95um, and can be adjusted according to actual production conditions.

[0076] Specifically, the width of the second segment D2 ranges from 30 μm to 100 μm, including the end points.

[0077] Specifically, the control switch 202 and the test terminal 30 are configured as a structure with a step difference, so that the test trace 201 between the test terminal 30 and the control switch 202 is more easily disconnected directly at the position of the first section D1 after corrosion, thereby reducing the impact of corrosion of the test trace 201 connected to the test terminal 30 on the control switch 202.

[0078] It is understandable that after the display panel test is completed, the product can be bound to the driver chip and then shipped if it is qualified. Therefore, whether the test terminal 30 is connected to the control switch 202 after the test does not affect the normal use of the display panel. Therefore, the test trace 201 between the control switch 202 and the test terminal 30 is provided to include a first section D1 and a second section D2. The test trace 201 is easily corroded and broken in the first section D1, which reduces the impact of subsequent corrosion of the test trace 201 on the control switch 202, thereby preventing the normal signal trace 101 from being corroded.

[0079] In one embodiment, in a direction perpendicular to the substrate 50 , a difference between the width of the first segment D1 and the width of the second segment D2 ranges from 25 um to 95 um.

[0080] Specifically, the width of the first segment D1 and the width of the second segment D2 may be any one of 25um, 32um, 38um, 40um, 55um, 72um, and 95um.

[0081] In one embodiment, in a direction perpendicular to the substrate 50 , the width of the first segment D1 is greater than or equal to 5 um.

[0082] It can be understood that by setting the width of the first section D1 to be greater than or equal to 5um, the test line 201 can transmit signals normally while also being able to break in time when the test line 201 is corroded after the display panel test, thereby reducing the impact of subsequent corrosion of the test line 201 on the control switch 202, thereby preventing the normal signal line 101 from being corroded.

[0083] The present application also provides a mobile terminal, comprising the display panel and a terminal body as described in any one of the above embodiments, wherein the terminal body and the display panel are combined into one body.

[0084] In summary, the present application sets a control switch 202 and a test line 201, uses the test line 201 to lead out the signal line 101, and at least one control switch 202 is connected to the test line 201, and the control terminal group 301 is connected to the control end T3 of the control switch 202. The control switch 202 isolates the normal signal line 101 from the test terminal 30, and the protective function layer M1 covers the driving circuit 10, the control switch 202 and part of the test line 201. The control signal is input through the control terminal group 301 to change the state of the control switch 202 to perform factory inspection on the driving circuit 10 of the display panel, effectively avoiding the existing signal line 101 directly passing through the area where the test terminal 30 is located. The signal line 101 cannot be covered or is incompletely covered by the packaging glue, and the signal line 101 is exposed. In the high temperature and high humidity reliability test environment, the signal line 101 is prone to corrosion, causing the normal signal line 101 to be broken, thereby improving the factory yield of the display panel.

[0085] The above is a detailed introduction to a display panel and a mobile terminal provided in the embodiments of the present application. Specific examples are used herein to illustrate the principles and implementation methods of the present application. The description of the above embodiments is only used to help understand the method of the present application and its core idea. At the same time, for those skilled in the art, based on the ideas of the present application, there will be changes in the specific implementation methods and application scope. In summary, the content of this specification should not be understood as a limitation on the present application.

Claims

1. A display panel, characterized in that: include: substrate; A driving circuit is provided on the substrate, comprising a plurality of binding terminals and a plurality of signal traces, wherein one binding terminal is connected to one of the signal traces; A plurality of test terminals are provided on the substrate; A plurality of test lines, wherein one of the test terminals is connected to the signal line via one of the test lines, and at least one control switch is connected to the test line; a control terminal group, provided on the substrate and connected to the control terminal of each of the control switches; a protective functional layer, disposed on the substrate, the driving circuit, and the test trace, and covering the driving circuit and the control switch; The test trace includes a first section and a second section connected to each other, wherein the first section and the second section are both located between the control switch and the test terminal, and in a direction perpendicular to the substrate, the width of the first section is smaller than the width of the second section.

2. The display panel according to claim 1, wherein The control switch includes a thin film transistor; In the test line and the thin film transistor, the first connection end of the thin film transistor is connected to the signal line through the test line, the second connection end of the thin film transistor is connected to the test terminal through the test line, and the control end of the thin film transistor is connected to the control terminal group.

3. The display panel according to claim 1, wherein The control terminal group includes a control terminal, and the control end of each control switch is connected to the control terminal.

4. The display panel according to claim 1, wherein: The plurality of test lines include at least two first test lines and at least one second test line, wherein one end of the first test line is connected to one of the signal lines, and the other end of the first test line is connected to one of the test terminals, and one end of the second test line is connected to one of the test terminals, and the other end of the second test line includes a first branch and a second branch connected to different signal lines; The multiple control switches include a first control switch arranged on the first test trace, a second control switch arranged on the first branch, and a third control switch arranged on the second branch. The control terminal group includes a first control terminal, a second control terminal, and a third control terminal. The control end of each of the first control switches is connected to the first control terminal, the control end of the second control switch is connected to the second control terminal, and the control end of the third control switch is connected to the third control terminal.

5. The display panel according to claim 1, wherein: The number of the test terminals is the same as the number of the signal traces. One test terminal is connected to one signal trace via one test trace. One control switch is provided on one test trace.

6. The display panel according to claim 1, wherein: The control switch includes one of a low-temperature polysilicon thin film transistor, a metal oxide thin film transistor, and an amorphous silicon thin film transistor.

7. The display panel according to claim 1, wherein: In a direction perpendicular to the substrate, a difference between a width of the first segment and a width of the second segment ranges from 25 um to 95 um.

8. The display panel according to claim 7, wherein: In a direction perpendicular to the substrate, a width of the first segment is greater than or equal to 5 μm.

9. A mobile terminal, characterized in that: The device comprises the display panel and a terminal body according to any one of claims 1 to 8, wherein the terminal body and the display panel are integrated into one body.

Images