Ultrasonic creeping wave combined probe and temperature performance test method

Abstract

The present invention discloses an ultrasonic creeping wave combined probe and a temperature performance testing method, which includes a housing, a sound insulation board, a first receiving wafer, a first transmitting wafer, a second receiving wafer, a second transmitting wafer, a first wedge, a second wedge and an acoustic absorption material. The first receiving wafer and the first transmitting wafer are symmetrically installed on both sides of the sound insulation board. One end of the first wedge is installed with the first receiving wafer and the first transmitting wafer, and the other end of the first wedge forms an arc-shaped detection surface. The second receiving wafer and the second transmitting wafer are symmetrically installed on both sides of the sound insulation board, and the other end of the second wedge forms a flat detection surface. The first receiving wafer and the second receiving wafer are connected and installed on a receiving interface, and the first transmitting wafer and the second transmitting wafer are connected and installed on a transmitting interface. The ultrasonic creeping wave combined probe and the temperature performance testing method provided by the present invention reduce the number of probes carried, simplify the operation, and can improve the detection effect and service performance of the creeping wave probe.

Description

Technical Field

[0001] The present invention relates to the technical field of railway flaw detection, and more specifically, to an ultrasonic creeping wave combined probe and a temperature performance testing method. Background Art

[0002] The rapid and sustainable development of my country's railways is inseparable from the seamless line technology. During the operation of the railway, the damage to the welded joints caused by the fatigue load of the wheels is mainly fatigue cracks, which will affect the service life of the welded joints and even cause the breakage and failure of the rail welded joints, endangering driving safety.

[0003] The existing non-destructive testing of rail welded joints in China mainly uses conventional ultrasonic testing technology, which is carried out by combining manual single-probe method and double-probe method scanning with special scanning device. The ultrasonic testing process of existing rail welded joints in China is complicated. According to TB / T 1632.1-2014, the main probes (including scanning devices) used for on-site flaw detection are: 1 shear wave K2.5 probe for single-probe scanning, 1 shear wave K1 probe for single-probe scanning, 1 longitudinal wave 0° probe for single-probe scanning, 2 shear wave K1 probes for K-type scanning, and 2 shear wave K0.8 probes for tandem scanning (scanning devices). According to the actual situation, the railway bureau will also use some spare or special shear wave probes. A large number of probes are selected, and all of the above probes must be used to meet the basic needs of full-section flaw detection. The newly added creeping wave detection process for surface damage of rail welded joints has reduced the difficulty of surface damage detection of welded joints, but it also increases the detection workload. For example, when conducting conventional ultrasonic testing of rail welded joints, the flaw detector needs to carry an ultrasonic flaw detector, 4 to 10 ultrasonic probes, a set of scanning devices and various corresponding connecting lines to complete the detection. The operation is complicated, and in the existing technology, in the relevant technical standards at home and abroad, there is no specific test method for the temperature performance of the creeping wave probe, and the performance of the creeping wave probe needs to be further improved. Summary of the invention

[0004] In view of this, the purpose of the present invention is to propose an ultrasonic creeping wave combination probe and a temperature performance testing method to reduce the number of probes carried, simplify the operation, and improve the detection effect and performance of the creeping wave probe.

[0005] Based on the above purpose, the present invention provides an ultrasonic creeping wave combination probe, comprising a shell, a sound insulation board, a first receiving chip, a first transmitting chip, a second receiving chip, a second transmitting chip, a first wedge, a second wedge and a sound absorbing material, wherein: the sound insulation board is installed in the shell, and the sound insulation board is embedded and installed on the first wedge and the second wedge, the shell comprises a first end and a second end which are arranged oppositely; the first receiving chip and the first transmitting chip are symmetrically installed on both sides of the sound insulation board, one end of the first wedge is installed with the first receiving chip and the first transmitting chip, and the other end of the first wedge extends toward the first end and forms an arc-shaped detection surface; the second receiving chip and the second transmitting chip are symmetrically installed on the sound insulation board. On both sides of the plate, one end of the second wedge block is installed with the second receiving chip and the second transmitting chip, and the other end of the second wedge block extends toward the second end and forms a planar detection surface; the first receiving chip and the first transmitting chip are both located between the sound absorbing material and the first wedge block, and the second receiving chip and the second transmitting chip are both located between the sound absorbing material and the second wedge block; a receiving interface and a transmitting interface are provided on the end surface of the shell away from the first receiving chip, the first transmitting chip, the second receiving chip and the second transmitting chip, the first receiving chip and the second receiving chip are connected and installed on the receiving interface, and the first transmitting chip and the second transmitting chip are connected and installed on the transmitting interface.

[0006] Optionally, the ultrasonic creeping wave combination probe also includes a first electrical component, a second electrical component, and a first wire, a second wire, a third wire, and a fourth wire. The first receiving chip is connected and installed on the receiving interface through the first wire; the first transmitting chip is connected and installed on the transmitting interface through the first electrical component and the second wire, the second receiving chip is connected and installed on the receiving chip through the third wire, and the second transmitting chip is connected and installed on the transmitting interface through the second electrical component and the fourth wire.

[0007] Optionally, a reflective mark is installed on the shell and surrounds the outer wall of the shell, and a scale mark and a specification mark are set on the outer wall of the shell.

[0008] Optionally, the shell has a length of 20 mm to 35 mm, a width of 12 mm to 20 mm, and a height of 25 mm to 35 mm.

[0009] Optionally, the arc-shaped detection surface is an arc surface, and the arc radius of the arc surface is 8 mm to 25 mm.

[0010] Optionally, the first receiving chip, the first transmitting chip, the second receiving chip and the second transmitting chip are all 4 mm to 8 mm in length, 5 mm to 12 mm in width and 0.4 mm to 0.8 mm in thickness.

[0011] Optionally, the angles between the first receiving chip, the first transmitting chip, the second receiving chip and the second transmitting chip and the horizontal plane are all 27.6±0.5°.

[0012] Based on the same inventive concept, the present invention also provides a method for testing the temperature performance of an ultrasonic creeping wave combination probe, using the ultrasonic creeping wave combination probe described in any of the above technical solutions, comprising the following steps:

[0013] Step 1: Use an artificial grooved test block. The material of the test block is the same as that of the rail. The groove width is ≤0.2mm, the groove length is ≥8mm, the groove height is 0.5mm, and the test coupling surface matches the arc detection surface or the plane detection surface. Step 2: The temperature of the ultrasonic creeping wave combination probe and the test block is controlled at constant temperatures of -10°, 10°, 30°, and 50°, respectively. Adjust the optimal reflection wave of the groove to 80% of the height of the screen. At this time, the noise wave is less than or equal to 5% of the height of the screen, and the equipment sensitivity margin is greater than or equal to 30dB. Record the corresponding sensitivity N of the equipment. -10 、N 10 、N 30 、N 50 , and select the highest sensitivity N max With minimum sensitivity N min ; Step 3, calculate the difference Δ = |N max -N min ∣, and Δ≤6dB is required.

[0014] Optionally, the ultrasonic creeping wave combination probe that meets the test results can detect Φ1.5 flat-bottom hole equivalent defects with a depth of 0.5mm to 6mm and surface open fatigue cracks with a depth of ≥0.2mm.

[0015] Optionally, the ultrasonic creeping wave combination probe temperature performance test method is applicable to a handheld creeping wave probe.

[0016] The ultrasonic creeping wave combination probe and the temperature performance test method provided by the present invention include a shell, a sound insulation board, a first receiving chip, a first transmitting chip, a second receiving chip, a second transmitting chip, a first wedge, a second wedge and a sound absorbing material. By symmetrically installing the first receiving chip and the first transmitting chip on both sides of the sound insulation board, the arc-shaped detection surface on the first wedge is attached to the concave position of the detected rail, thereby ensuring that the probe and the detected surface are well coupled, and the concave position on the rail is scanned; by symmetrically installing the second receiving chip and the second transmitting chip on both sides of the sound insulation board, the plane detection surface on the second wedge is attached to the plane or convex position of the detected rail, thereby realizing the scanning of the plane or convex position of the rail. The above operation does not require frequent replacement of different ultrasonic creeping wave probes, reduces the number of probes to be carried, and simplifies the operation; in addition, the ultrasonic creeping wave combination probe is used to test the temperature performance of the ultrasonic creeping wave combination probe, which can improve the detection effect and use performance of the creeping wave probe. BRIEF DESCRIPTION OF THE DRAWINGS

[0017] The preferred embodiments of the present invention will be described in detail below with reference to the accompanying drawings, which will help to understand the objects and advantages of the present invention, wherein:

[0018] Figure 1 It is a structural schematic diagram of an ultrasonic creeping wave combination probe according to an embodiment of the present invention;

[0019] Figure 2 A first view of an ultrasonic creeping wave combination probe according to an embodiment of the present invention;

[0020] Figure 3 A second view of the ultrasonic creeping wave combination probe according to an embodiment of the present invention;

[0021] Figure 4 A third view of an ultrasonic creeping wave combination probe according to an embodiment of the present invention;

[0022] Figure 5 A fourth view of an ultrasonic creeping wave combination probe according to an embodiment of the present invention;

[0023] Figure 6 The present invention is a flowchart of a method for testing the temperature performance of an ultrasonic creeping wave combination probe according to an embodiment of the present invention.

[0024] Description of reference numerals:

[0025] 1: Shell; 2: Sound insulation board; 3: Reflective mark; 4: First receiving chip; 5: First transmitting chip; 6: Second receiving chip; 7: Second transmitting chip; 8: First wedge block; 9: Second wedge block; 10: First end; 11: Second end; 12: Arc-shaped detection surface; 13: Plane detection surface; 14: Receiving interface; 15: Transmitting interface; 16: First electrical component; 17: Second electrical component; 18: First wire; 19: Second wire; 20: Third wire; 21: Fourth wire. DETAILED DESCRIPTION

[0026] The present invention is described in detail below in conjunction with the embodiments. The same components are denoted by the same reference numerals. It should be noted that the words "front", "rear", "left", "right", "upper" and "lower" used in the following description refer to directions in the drawings, and the words "inner" and "outer" refer to directions toward or away from the geometric center of a specific component, respectively.

[0027] like Figures 1 to 5 As shown, the ultrasonic creeping wave combined probe provided by the present invention comprises a shell 1, a sound insulation board 2, a first receiving chip 4, a first transmitting chip 5, a second receiving chip 6, a second transmitting chip 7, a first wedge 8, a second wedge 9 and a sound absorbing material, wherein: the sound insulation board 2 is installed in the shell 1, and the sound insulation board 2 is embedded and installed on the first wedge 8 and the second wedge 9, and the shell 1 comprises a first end 10 and a second end 11 which are arranged oppositely; the first receiving chip 4 and the first transmitting chip 5 are symmetrically installed on both sides of the sound insulation board 2, one end of the first wedge 8 is installed with the first receiving chip 4 and the first transmitting chip 5, and the other end of the first wedge 8 extends toward the first end 10 and forms an arc-shaped detection surface 12; the second receiving chip 6 and the second transmitting chip 7 are symmetrically arranged Installed on both sides of the sound insulation board 2, one end of the second wedge block 9 is installed with the second receiving chip 6 and the second transmitting chip 7, the other end of the second wedge block 9 extends toward the second end 11 and forms a plane detection surface 13; the first receiving chip 4 and the first transmitting chip 5 are both located between the sound absorbing material and the first wedge block 8, and the second receiving chip 6 and the second transmitting chip 7 are both located between the sound absorbing material and the second wedge block 9; the end surface of the housing 1 away from the first receiving chip 4, the first transmitting chip 5, the second receiving chip 6 and the second transmitting chip 7 is provided with a receiving interface 14 and a transmitting interface 15, the first receiving chip 4 and the second receiving chip 6 are connected and installed on the receiving interface 14, and the first transmitting chip 5 and the second transmitting chip 7 are connected and installed on the transmitting interface 15.

[0028] It should be noted that the arc-shaped detection surface 12 is located outside the end surface of the first end 10 of the housing 1 .

[0029] The ultrasonic creeping wave combined probe provided by the present invention comprises a housing 1, a sound insulation board 2, a first receiving chip 4, a first transmitting chip 5, a second receiving chip 6, a second transmitting chip 7, a first wedge block 8, a second wedge block 9 and a sound absorbing material. By symmetrically mounting the first receiving chip 4 and the first transmitting chip 5 on both sides of the sound insulation board 2, the arc-shaped detection surface 12 on the first wedge block 8 is attached to the concave position of the detected rail, thereby ensuring that the probe and the detected surface are well coupled, and scanning of the concave position on the rail is achieved; by symmetrically mounting the second receiving chip 6 and the second transmitting chip 7 on both sides of the sound insulation board 2, the plane detection surface 13 on the second wedge block 9 is attached to the plane or convex position of the detected rail, thereby scanning of the plane or convex position of the rail is achieved. The above operation does not require frequent replacement of different ultrasonic creeping wave probes, thereby reducing the number of probes to be carried and simplifying the operation.

[0030] like Figure 2 and Figure 3 As shown, the ultrasonic creeping wave combination probe further includes a first electrical component 16, a second electrical component 17, a first wire 18, a second wire 19, a third wire 20, and a fourth wire 21. The first receiving chip 4 is connected and installed on the receiving interface 14 through the first wire 18; the first transmitting chip 5 is connected and installed on the transmitting interface 15 through the first electrical component 16 and the second wire 19, the second receiving chip 6 is connected and installed on the receiving chip through the third wire 20, and the second transmitting chip 7 is connected and installed on the transmitting interface 15 through the second electrical component 17 and the fourth wire 21. It should be noted that the first electrical component 16 and the second electrical component 17 can both be coils or inductors. In this embodiment, the first receiving chip 4 is connected to the receiving interface 14 through the first wire 18, the first transmitting chip 5 is connected to the transmitting interface 15 through the first electrical component 16 and the second wire 19, the second receiving chip 6 is connected to the receiving interface 14 through the third wire 20, and the second transmitting chip 7 is connected to the transmitting interface 15 through the fourth wire 21 and the second electrical component 17, thereby improving the convenience of installation and operation of the ultrasonic creeping wave combination probe.

[0031] like Figure 1 and Figure 5 As shown, a reflective mark 3 is installed on the housing 1 around the outer wall of the housing 1, and a scale mark and a specification mark are set on the outer wall of the housing 1. In this embodiment, the reflective mark 3 is convenient for identifying the ultrasonic creeping wave combination probe when the light is insufficient, the scale mark is conducive to measuring the size of the detected surface, and the specification mark is convenient for the operator to select the size of the ultrasonic creeping wave combination probe, thereby improving the convenience of using the ultrasonic creeping wave combination probe.

[0032] In one embodiment of the present invention, the length of the shell 1 is 20 mm to 35 mm, the width is 12 mm to 20 mm, and the height is 25 mm to 35 mm. The shell 1 occupies a small volume, which improves the convenience of carrying and using the ultrasonic creeping wave combination probe.

[0033] like Figure 1 and Figure 2 As shown, the arc detection surface 12 is an arc surface, and the arc radius of the arc surface is 8mm to 25mm. In this embodiment, the arc surface with the above arc radius range can better couple the arc detection surface 12 with the concave position on the rail, thereby improving the detection accuracy of the ultrasonic creeping wave combined probe.

[0034] In one embodiment of the present invention, the lengths of the first receiving chip 4, the first transmitting chip 5, the second receiving chip 6 and the second transmitting chip 7 are all 4mm to 8mm, the widths are all 5mm to 12mm, and the thicknesses are all 0.4mm to 0.8mm. It should be noted that the first receiving chip 4 is used in pairs with the first transmitting chip 5, and the second receiving chip 6 and the second transmitting chip 7 are used in pairs. The chips of the above-mentioned range of sizes can ensure the best creeping wave acoustic energy effect on the basis of portability. By adopting a mode of one transmitting and one receiving of two corresponding paired chips, the surface blind area of ​​creeping wave detection is reduced, the damage detection sensitivity in the detection area is improved, the noise outside the sound intensity concentration area is reduced, the signal-to-noise ratio is improved, and the detection accuracy of the ultrasonic creeping wave combination probe is improved.

[0035] In one embodiment of the present invention, the angles between the first receiving chip 4, the first transmitting chip 5, the second receiving chip 6 and the second transmitting chip 7 and the horizontal plane are all 27.6±0.5°. The installation angles of the above chips can generate creeping waves for detection on the upper surface of the workpiece, thereby ensuring the sound field angle and improving the detection depth range of the ultrasonic creeping wave combination probe.

[0036] like Figures 1 to 6 As shown, based on the same inventive concept, an embodiment of the present invention further provides a method for testing the temperature performance of an ultrasonic creeping wave combination probe, using the ultrasonic creeping wave combination probe of any of the aforementioned embodiments, comprising the following steps: Step 1, using an artificial grooved test block, the material of the test block is the same as the material of the rail, the groove width is ≤0.2mm, the groove length is ≥8mm, the groove height is 0.5mm, and the test coupling surface is consistent with the arc detection surface 12 or the plane detection surface 13; Step 2, the temperature of the ultrasonic creeping wave combination probe and the test block is controlled at constant temperatures of -10°, 10°, 30°, and 50°, respectively, and the best reflection wave of the groove is adjusted to 80% of the height of the screen. At this time, the noise wave is less than or equal to 5% of the height of the screen, the equipment sensitivity margin is greater than or equal to 30dB, and the corresponding sensitivity N of the recording equipment is recorded. -10 、N 10 、N 30、N 50 , and select the highest sensitivity N max With minimum sensitivity N min ; Step 3, calculate the difference Δ = |N max -N min ∣, and Δ≤6dB is required.

[0037] It should be noted that the use of the ultrasonic creeping wave combination probe to test the temperature performance of the ultrasonic creeping wave combination probe improves the detection effect and use performance of the creeping wave probe.

[0038] In one embodiment of the present invention, the ultrasonic creeping wave combination probe that meets the test results can detect Φ1.5 flat-bottom hole equivalent defects with a depth of 0.5mm to 6mm and surface open fatigue cracks with a depth of ≥0.2mm, further improving the detection effect and performance of the creeping wave probe.

[0039] In one embodiment of the present invention, the temperature performance test method of the ultrasonic creeping wave combination probe is applicable to a handheld creeping wave probe, thereby improving the applicability of the temperature performance test method of the ultrasonic creeping wave combination probe.

[0040] The ultrasonic creeping wave combination probe and the temperature performance test method provided by the present invention include a shell 1, a sound insulation board 2, a first receiving chip 4, a first transmitting chip 5, a second receiving chip 6, a second transmitting chip 7, a first wedge 8, a second wedge 9 and a sound absorbing material. By symmetrically installing the first receiving chip 4 and the first transmitting chip 5 on both sides of the sound insulation board 2, the arc-shaped detection surface 12 on the first wedge 8 is attached to the concave position of the detected rail, thereby ensuring that the probe and the detected surface are well coupled, and the concave position on the rail is scanned; by symmetrically installing the second receiving chip 6 and the second transmitting chip 7 on both sides of the sound insulation board 2, the plane detection surface 13 on the second wedge 9 is attached to the plane or convex position of the detected rail, and the plane or convex position of the rail is scanned. The above operation does not require frequent replacement of different ultrasonic creeping wave probes, reduces the number of probes carried, and simplifies the operation; in addition, the ultrasonic creeping wave combination probe is used to test the temperature performance of the ultrasonic creeping wave combination probe, which can improve the detection effect and use performance of the creeping wave probe.

[0041] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present invention, rather than to limit it. Although the present invention has been described in detail with reference to the aforementioned embodiments, those skilled in the art should understand that they can still modify the technical solutions described in the aforementioned embodiments, or make equivalent replacements for some of the technical features therein. However, these modifications or replacements do not cause the essence of the corresponding technical solutions to deviate from the scope of the technical solutions of the embodiments of the present invention.

Claims

1. An ultrasonic creeping wave combined probe, characterized in that, it includes a housing, a sound insulation board, a first receiving wafer, a first transmitting wafer, a second receiving wafer, a second transmitting wafer, a first wedge block, a second wedge block and an acoustic absorption material, wherein: The sound insulation board is installed in the housing, and the sound insulation board is embedded and installed on the first wedge block and the second wedge block. The housing includes a first end and a second end arranged opposite to each other; The first receiving wafer and the first transmitting wafer are symmetrically installed on both sides of the sound insulation board. One end of the first wedge block is installed with the first receiving wafer and the first transmitting wafer, and the other end of the first wedge block extends towards the first end and forms an arc-shaped detection surface; The second receiving wafer and the second transmitting wafer are symmetrically installed on both sides of the sound insulation board. One end of the second wedge block is installed with the second receiving wafer and the second transmitting wafer, and the other end of the second wedge block extends towards the second end and forms a flat detection surface; Both the first receiving wafer and the first transmitting wafer are located between the acoustic absorption material and the first wedge block, and both the second receiving wafer and the second transmitting wafer are located between the acoustic absorption material and the second wedge block; On the end face of the housing away from the first receiving wafer, the first transmitting wafer, the second receiving wafer and the second transmitting wafer, a receiving interface and a transmitting interface are provided. The first receiving wafer and the second receiving wafer are connected and installed on the receiving interface, and the first transmitting wafer and the second transmitting wafer are connected and installed on the transmitting interface; The lengths of the first receiving wafer, the first transmitting wafer, the second receiving wafer and the second transmitting wafer are all 4 mm to 8 mm, the widths are all 5 mm to 12 mm, and the thicknesses are all 0.4 mm to 0.8 mm; The angles between the first receiving wafer, the first transmitting wafer, the second receiving wafer and the second transmitting wafer and the horizontal plane are all 27.6 ± 0.5°.

2. The ultrasonic creeping wave combined probe according to claim 1, characterized in that, The ultrasonic creeping wave combined probe further includes a first electrical component, a second electrical component, and a first wire, a second wire, a third wire, and a fourth wire. The first receiving wafer is connected and installed on the receiving interface through the first wire; The first transmitting wafer is connected and installed on the transmitting interface through the first electrical component and the second wire. The second receiving wafer is connected and installed on the receiving wafer through the third wire. The second transmitting wafer is connected and installed on the transmitting interface through the second electrical component and the fourth wire.

3. The ultrasonic creeping wave combined probe according to claim 2, characterized in that, A reflective mark is installed on the outer wall of the housing around the outer wall of the housing, and a scale mark and a specification mark are provided on the outer wall of the housing.

4. The ultrasonic creeping wave combined probe according to claim 3, characterized in that, The length of the housing is 20 mm to 35 mm, the width is 12 mm to 20 mm, and the height is 25 mm to 35 mm.

5. The ultrasonic creeping wave combined probe according to claim 4, characterized in that, the arc-shaped detection surface is a circular arc surface, and the radius of the circular arc of the circular arc surface is 8 mm to 25 mm.

6. A method for testing the temperature performance of an ultrasonic creeping wave combined probe, using the ultrasonic creeping wave combined probe according to any one of claims 1-5, characterized in that, it includes the following steps: Step 1: Use an artificial grooved test block. The material of the test block is the same as that of the rail. The groove width is ≤ 0.2 mm, the groove length is ≥ 8 mm, and the groove height is 0.5 mm. The test coupling surface is matched with the arc-shaped detection surface or the flat detection surface; Step 2: Control the temperatures of the ultrasonic creeping wave combined probe and the test block under constant temperature conditions of -10°, 10°, 30°, and 50° respectively. Adjust the best reflected wave of the groove to 80% of the screen height. At this time, the noise wave is less than or equal to 5% of the screen height, and the equipment sensitivity margin is greater than or equal to 30 dB. Record the sensitivity N corresponding to the equipment -10 , N 10 , N 30 , N 50 , and select the highest sensitivity N max and the lowest sensitivity N min ; Step 3. Calculate the difference Δ = ∣N max - N min ∣, and it is required that Δ ≤ 6 dB.

7. The method for testing the temperature performance of an ultrasonic creeping wave combined probe according to claim 6, characterized in that, the ultrasonic creeping wave combined probe that meets the test results can detect Φ1.5 flat-bottomed hole equivalent defects with a depth of 0.5 mm to 6 mm and surface-opening fatigue cracks with a depth of ≥ 0.2 mm.

8. The method for testing the temperature performance of an ultrasonic creeping wave combined probe according to claim 7, characterized in that, the method for testing the temperature performance of the ultrasonic creeping wave combined probe is applicable to a hand-held creeping wave probe.

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