A testing device and method for a server MCIO interface
By employing modular test fixture modules and low-cost NVME M.2 devices in server MCIO interface testing, the problems of low testing efficiency and high cost in existing technologies are solved, achieving efficient and low-cost MCIO interface testing.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- INSPUR SUZHOU INTELLIGENT TECH CO LTD
- Filing Date
- 2022-06-17
- Publication Date
- 2026-06-19
AI Technical Summary
In existing technologies, the test design of server MCIO interfaces is complex, resulting in low test efficiency and high cost. Furthermore, it cannot achieve modular design, which increases the difficulty of testing and hardware costs.
Multiple test fixture modules are used, each connected to a corresponding MCIO interface on the server motherboard. These modules include multiple M.2 slots and power modules, which are connected to the motherboard's MCIO interface via high-speed cables. Modular testing is performed using low-cost NVME M.2 devices to achieve full coverage of the MCIO interface.
It reduced testing costs, improved testing efficiency, achieved modular design, simplified fixture layout, improved the availability and maintainability of the testing equipment, and ensured the stability of the signal link.
Smart Images
Figure CN115061862B_ABST
Abstract
Description
Technical Field
[0001] This invention relates to the field of server testing, and in particular to a testing apparatus and method for a server MCIO interface. Background Technology
[0002] With the rapid development of computing power, the demand for servers is increasing dramatically. Therefore, the research, development, and iterative updates of servers are particularly important, and every board within a server must undergo power-on verification before leaving the factory.
[0003] To improve motherboard versatility and increase design flexibility, the new generation of platforms will replace more high-speed PCIe (peripheral component interconnect express, a high-speed serial computer expansion bus standard) signals with MCIO (mini cool edge input / output) connectors. MCIO connectors can be used individually or in combination.
[0004] In existing technologies, a single motherboard has more than a dozen MCIO connectors. During factory production and testing, different cables are used to test the board and hard drive separately according to different product requirements. However, testing different MCIO interfaces separately increases the difficulty of test design, increases the cost of hard drives or PCIe devices, complicates the solution design, and makes the structure of automated fixtures extremely cumbersome, making it impossible to achieve modular design, increasing test costs and reducing test efficiency. Summary of the Invention
[0005] To address the problems existing in the prior art, this invention innovatively proposes a testing device and method for server MCIO interfaces, effectively solving the problems of low testing efficiency and high cost of motherboard MCIO interfaces caused by existing technologies, thereby effectively reducing testing costs and improving testing efficiency.
[0006] The first aspect of the present invention provides a testing device for a server MCIO interface, comprising: multiple test fixture modules, each test fixture module being connected to a corresponding MCIO interface of a server motherboard; each test fixture module including multiple M.2 slots, each MCIO slot being connected to a corresponding M.2 device; a first type of signal port of the server motherboard MCIO interface being sequentially connected to each M.2 slot in the corresponding test fixture module; and a second type of signal port of the server motherboard MCIO interface being connected to each M.2 slot in the corresponding test fixture module; wherein the first type of signal is a communication data signal, and the second type of signal is a signal other than communication data.
[0007] Optionally, each test fixture module also includes a power supply module that supplies power to multiple M.2 devices within the test fixture module.
[0008] Optionally, the first type of signal is the PCIe signal, and the second type of signal includes clock signal, enable signal, and handshake signal.
[0009] Optionally, a portion of the first type signal ports of the server motherboard MCIO interface are connected to the first type signal ports of one of the M.2 slots in the corresponding test fixture module, and the remaining portion of the first type signal ports of the server motherboard MCIO interface are connected to the first type signal ports of the remaining M.2 slots in the corresponding test fixture module.
[0010] Furthermore, the number of ports for the first type of signal in the MCIO interface of the server motherboard is less than or equal to the number of ports for the first type of signal in the M.2 slot in the corresponding test fixture module.
[0011] Optionally, each test fixture module is connected to an MCIO interface on the server motherboard via a high-speed cable.
[0012] Optionally, it also includes multiple test fixture plates, wherein the test fixture module and the test fixture plate are detachably connected in a one-to-one correspondence.
[0013] The second aspect of this invention provides a testing method for a server MCIO interface, implemented based on the testing apparatus for a server MCIO interface described in the first aspect of this invention, comprising:
[0014] The first type of signal port of the MCIO interface under test of the server is sequentially connected to the corresponding multiple M.2 slots in the corresponding test fixture module, and the second type of signal port of the MCIO interface under test of the server is connected to the corresponding multiple M.2 slots in the corresponding test fixture module.
[0015] Obtain the presence identification information of the M.2 device in the test fixture module corresponding to each MCIO interface of the server. If the M.2 device in the test fixture module corresponding to the MCIO interface is present and successfully identified, perform read and write tests on the M.2 device in the test fixture module corresponding to the MCIO interface.
[0016] Optionally, the read / write test of the M.2 device in the test fixture module corresponding to the MCIO interface specifically involves:
[0017] The motherboard obtains the bandwidth rate information of the M.2 device in the corresponding test fixture module through the MCIO interface. If the obtained bandwidth rate information meets the preset bandwidth rate requirements, the read and write test passes; if the obtained bandwidth rate information does not meet the preset bandwidth rate requirements, the read and write test fails.
[0018] Furthermore, it also includes:
[0019] Perform stress testing on the M.2 device in the test fixture module corresponding to the MCIO interface.
[0020] The technical solution adopted in this invention has the following technical effects:
[0021] 1. This invention replaces expensive server equipment with a general-purpose NVME (Non-Volatile Memory Host Controller Interface Specification) M.2 (host interface) device. The low-cost M.2 device provides high-speed test signals, fully covers each MCIO interface of the motherboard, realizes modular design, and effectively solves the problems of low testing efficiency and high cost of motherboard MCIO interface caused by existing technology, effectively reducing testing costs and improving testing efficiency.
[0022] 2. In the technical solution of the present invention, each test fixture module also includes a power supply module. The power supply module supplies power to multiple M.2 devices in the test fixture module. The independent power supply improves the availability of the test device.
[0023] 3. In the technical solution of the present invention, the first type of signal ports of the MCIO interface of the server motherboard are connected to each M.2 slot in the corresponding test fixture module in sequence, and the second type of signal ports of the MCIO interface of the server motherboard are connected to each M.2 slot in the corresponding test fixture module, so as to realize the full coverage of the signal of a single MCIO interface of the motherboard and improve the availability of the server motherboard MCIO interface testing device.
[0024] 4. Each test fixture module in the technical solution of the present invention also includes a test fixture plate. The test fixture module and the test fixture plate are detachably connected. The M.2 device and the M.2 slot are also detachably connected, which makes it easy to replace and maintain, and reduces maintenance costs.
[0025] 5. In addition to reading and writing tests to ensure the normal operation of the device power supply, reset and high-speed signal link, the MCIO interface in the technical solution of this invention can also be stress tested to ensure that the device link is normal and stable and that there are no abnormalities such as poor soldering or short circuits in the motherboard MCIO connector (MCIO interface).
[0026] It should be understood that the above general description and the following detailed description are exemplary and explanatory only, and are not intended to limit the invention. Attached Figure Description
[0027] To more clearly illustrate the technical solutions in the embodiments of the present invention or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, for those skilled in the art, other drawings can be obtained based on these drawings without creative effort.
[0028] Figure 1 This is a schematic diagram of the structure of the testing device for multiple MCIO interfaces in Embodiment 1 of the present invention;
[0029] Figure 2 This is a schematic diagram of the structure of a test device for a single MCIO interface in Embodiment 1 of the present invention;
[0030] Figure 3 This is a schematic diagram of the communication structure of a test device for a single MCIO interface in Embodiment 1 of the present invention;
[0031] Figure 4 This is a modular packaging dimension design diagram of a single test fixture module in the apparatus of Embodiment 1 of the present invention;
[0032] Figure 5 This is a flowchart illustrating the method of Embodiment 2 in the present invention;
[0033] Figure 6 This is another flowchart illustrating the method of Embodiment 2 in the present invention. Detailed Implementation
[0034] To clearly illustrate the technical features of this solution, the invention will be described in detail below through specific embodiments and in conjunction with the accompanying drawings. The following disclosure provides many different embodiments or examples for implementing different structures of the invention. To simplify the disclosure of the invention, components and arrangements of specific examples are described below. Furthermore, reference numerals and / or letters may be repeated in different examples. This repetition is for simplification and clarity and does not in itself indicate a relationship between the various embodiments and / or arrangements discussed. It should be noted that the components illustrated in the drawings are not necessarily drawn to scale. Descriptions of well-known components, processing techniques, and processes are omitted in this invention to avoid unnecessarily limiting the invention.
[0035] Example 1
[0036] like Figures 1-2As shown, the present invention provides a testing device for a server MCIO interface, comprising: multiple test fixture modules 1, each test fixture module 1 being connected to an MCIO interface 21 of a server motherboard 2; each test fixture module 1 including multiple M.2 slots 11, each M.2 slot 11 being connected to an M.2 device 12; the first type of signal ports of the MCIO interface 21 in the server motherboard 2 being sequentially connected to each M.2 slot 11 in the corresponding test fixture module 1; and the second type of signal ports of the MCIO interface 21 in the server motherboard 2 being connected to each M.2 slot 11 in the corresponding test fixture module 1; wherein the first type of signal is a communication data signal, and the second type of signal is a signal other than communication data.
[0037] Each test fixture module 1 also includes a power module 13, which supplies power to multiple M.2 devices within the test fixture module. The first type of signal is the PCIe signal, and the second type of signal includes the clock signal (100MHz CLK), the enable signal (RST), and the handshake signal (REQ).
[0038] like Figure 3 As shown, some ports (PCIE lanes 0-3) of the first type of signal (PCIE x4) of the MCIO interface 21 in the server motherboard 2 are connected to the first type of signal ports of one of the M.2 slots 11 (M.2 Slot 1) in the corresponding test fixture module 1. The remaining ports (PCIE lanes 4-7) of the first type of signal of the MCIO interface 21 in the server motherboard 2 are connected to the first type of signal ports of the remaining M.2 slots 11 (M.2 Slot 2) in the corresponding test fixture module 1, until all the ports (PCIE lanes) of the first type of signal (PCIE x4) of the MCIO interface 21 in the server motherboard 2 are sequentially connected to multiple M.2 slots.
[0039] Furthermore, the number of ports of the first type of signal in the MCIO interface 21 of the server motherboard 2 is less than or equal to the number of ports of the first type of signal in the M.2 slot 11 of the corresponding test fixture module 1.
[0040] Specifically, each test fixture module 1 is connected to an MCIO interface 21 of the server motherboard 2 via a high-speed cable 3. This invention's technical solution directly connects to the motherboard's MCIO interface via a high-speed cable, employs low-power, low-cost NVME M.2 devices, is easy to replace and design in terms of fixture layout, does not require reference to the original server design, reduces programming difficulty, eliminates the server's original PCIe network card and hard drive, reduces testing costs and fixture design complexity, and improves fixture modularity.
[0041] Furthermore, the testing device also includes multiple test fixture boards 4, with each test fixture module 1 detachably connected to one of the test fixture boards 4. Specifically, each test fixture board 4 and each test fixture module 1 is provided with multiple connection holes, which can be circular or other shapes, and the technical solution of this invention is not limited thereto. The test fixture modules 1 and test fixture boards 4 are detachably connected one-to-one by screws. Alternatively, the test fixture modules 1, test fixture boards 4, and other components to be fixed can be fixed together to achieve the testing of multiple MCIO interfaces on the motherboard.
[0042] like Figure 4 As shown in the embodiment of the present invention, each test fixture module 1 is encapsulated as a module with a length of 90 mm, a width of 50 mm, and a height of 5 mm. All specifications and parameters are the same, and modular design is adopted to facilitate unified testing of multiple MCIO interfaces in the server motherboard 2 and improve testing efficiency.
[0043] This invention replaces expensive server equipment with a general-purpose NVME (Non-Volatile Memory Host Controller Interface Specification) M.2 (host interface) device. The low-cost M.2 device provides high-speed test signals, fully covers each MCIO interface of the motherboard, realizes modular design, and effectively solves the problems of low testing efficiency and high cost of motherboard MCIO interface due to existing technology. It effectively reduces testing costs and improves testing efficiency.
[0044] In the technical solution of the present invention, each test fixture module also includes a power supply module, which supplies power to multiple M.2 devices in the test fixture module. The independent power supply improves the availability of the test device.
[0045] In the technical solution of this invention, the first type of signal ports of the MCIO interface of the server motherboard are sequentially connected to each M.2 slot in the corresponding test fixture module, and the second type of signal ports of the MCIO interface of the server motherboard are all connected to each M.2 slot in the corresponding test fixture module, thereby achieving full coverage of the signals of a single MCIO interface of the motherboard and improving the availability of the server motherboard MCIO interface testing device.
[0046] In the technical solution of this invention, each test fixture module also includes a test fixture plate. The test fixture module and the test fixture plate are detachably connected. The M.2 device and the M.2 slot are also detachably connected, which makes it easy to replace and maintain, and reduces maintenance costs.
[0047] Example 2
[0048] like Figure 5As shown, the present invention also provides a testing method for a server MCIO interface, which is based on a testing device for a server MCIO interface in Embodiment 1, and includes:
[0049] S1, connect the first type of signal port of the MCIO interface under test of the server to the corresponding multiple M.2 slots in the corresponding test fixture module in sequence, and connect the second type of signal port of the MCIO interface under test of the server to the corresponding multiple M.2 slots in the corresponding test fixture module in sequence.
[0050] S2, obtain the in-situ identification information of the M.2 device in the test fixture module corresponding to each MCIO interface of the server;
[0051] S3. Determine whether the M.2 device in the test fixture module corresponding to the MCIO interface is in place and successfully identified. If the determination result is yes, proceed to step S4; if the determination result is no, proceed to step S5.
[0052] S4, Perform read / write tests on the M.2 device in the test fixture module corresponding to the MCIO interface;
[0053] S5 returns a prompt message to the server.
[0054] In step S1, the first type of signal port (PCIE Lane 0-3) of the MCIO interface under test of the server is connected to one of the M.2 slots (M.2 Slot 1) in the corresponding test fixture module. The first type of signal port (PCIE Lane 4-7) of the MCIO interface under test of the server is connected to the remaining M.2 slot (M.2 Slot 2) in the corresponding test fixture module. The second type of signal port (clock signal CLK_100M, enable signal RST, handshake signal REQ) of the MCIO interface under test of the server is connected to multiple M.2 slots (M.2 Slot 1, M.2 Slot 2) in the corresponding test fixture module.
[0055] In steps S2-S3, the presence identification information of the M.2 device in the test fixture module corresponding to each MCIO interface of the server is obtained, that is, whether the M.2 device in the corresponding test fixture module is present and can be identified normally. If the M.2 device in the corresponding test fixture module is present and can be identified normally, the M.2 device in the corresponding test fixture module will return a presence signal and a recognition success signal to the OS system (operating system) in the server. Otherwise, it is determined that the M.2 device in the corresponding test fixture module is not present or cannot be identified normally.
[0056] Furthermore, step S4 specifically involves:
[0057] The motherboard obtains the bandwidth rate information of the M.2 device in the corresponding test fixture module through the MCIO interface. If the obtained bandwidth rate information meets the preset bandwidth rate requirements, the read / write test passes; otherwise, it fails. The preset bandwidth rate can be flexibly adjusted according to actual conditions, and this invention does not impose any limitations on it. Executing the `lspci` command under the server's OS to view the bandwidth rate information of the M.2 device in the corresponding test fixture module ensures the normal operation of the high-speed link of the MCIO interface.
[0058] Furthermore, such as Figure 6 As shown, the present invention also provides a method for testing a server MCIO interface, which further includes:
[0059] S6 performs a stress test on the M.2 device in the test fixture module corresponding to the MCIO interface.
[0060] In step S6, a stress test is performed on the M.2 device in the test fixture module corresponding to the MCIO interface, and the stress test result of the M.2 device in the test fixture module corresponding to the MCIO interface is obtained. If the stress test result of the M.2 device in the test fixture module corresponding to the MCIO interface meets the preset stress test result requirements, the stress test is passed, that is, the high-speed signal link of the MCIO interface is normal and stable, and there are no abnormalities such as poor soldering or short circuits in the motherboard MCIO connector (MCIO interface).
[0061] In addition to reading and writing tests to ensure the normal operation of the device power supply, reset and high-speed signal links, the MCIO interface in this invention can also be subjected to stress tests to ensure that the device links are normal and stable, and that there are no abnormalities such as poor soldering or short circuits in the motherboard MCIO connector (MCIO interface).
[0062] While the specific embodiments of the present invention have been described above in conjunction with the accompanying drawings, this is not intended to limit the scope of protection of the present invention. Those skilled in the art should understand that various modifications or variations that can be made by those skilled in the art without creative effort based on the technical solutions of the present invention are still within the scope of protection of the present invention.
Claims
1. A testing device for a server MCIO interface, characterized in that, include: Multiple test fixture modules are provided, each connected to one MCIO interface of the server motherboard. Each test fixture module includes multiple M.2 slots, each connected to one M.2 device. The first type of signal ports of the server motherboard MCIO interface are sequentially connected to each M.2 slot in the corresponding test fixture module, and the second type of signal ports of the server motherboard MCIO interface are also sequentially connected to each M.2 slot in the corresponding test fixture module. The first type of signal is a communication data signal, and the second type of signal is a signal other than communication data. Some ports of the first type of signal of the server motherboard MCIO interface are connected to one of the first type of signal ports of the corresponding M.2 slot in the test fixture module, and the remaining ports of the first type of signal of the server motherboard MCIO interface are connected to the remaining first type of signal ports of the corresponding M.2 slots in the test fixture module, until all the first type of signal ports of the MCIO interface on the server motherboard are sequentially connected to multiple M.2 slots.
2. The testing device for a server MCIO interface according to claim 1, characterized in that, Each test fixture module also includes a power supply module that supplies power to multiple M.2 devices within the test fixture module.
3. The testing device for a server MCIO interface according to claim 1, characterized in that, The first type of signal is the PCIe signal, and the second type of signal includes clock signal, enable signal, and handshake signal.
4. The testing device for a server MCIO interface according to claim 1, characterized in that, The number of ports for the first type of signal in the MCIO interface of the server motherboard is less than or equal to the number of ports for the first type of signal in the M.2 slot in the corresponding test fixture module.
5. A test apparatus for a server MCIO interface according to any one of claims 1-4, characterized in that, Each test fixture module is connected to one of the MCIO interfaces on the server motherboard via a high-speed cable.
6. A test apparatus for a server MCIO interface according to any one of claims 1-4, characterized in that, It also includes multiple test fixture plates, and the test fixture modules are detachably connected to the test fixture plates in a one-to-one correspondence.
7. A testing method for a server MCIO interface, characterized in that, Based on the server MCIO interface testing device according to any one of claims 1-6, it includes: The first type of signal port of the MCIO interface under test of the server is sequentially connected to the corresponding multiple M.2 slots in the corresponding test fixture module, and the second type of signal port of the MCIO interface under test of the server is connected to the corresponding multiple M.2 slots in the corresponding test fixture module. Obtain the presence identification information of the M.2 device in the test fixture module corresponding to each MCIO interface of the server. If the M.2 device in the test fixture module corresponding to the MCIO interface is present and successfully identified, perform read and write tests on the M.2 device in the test fixture module corresponding to the MCIO interface.
8. The test method for a server MCIO interface according to claim 7, characterized in that, The specific steps for reading and writing the M.2 device in the test fixture module corresponding to the MCIO interface are as follows: The motherboard obtains the bandwidth rate information of the M.2 device in the corresponding test fixture module through the MCIO interface. If the obtained bandwidth rate information meets the preset bandwidth rate requirements, the read and write test passes; if the obtained bandwidth rate information does not meet the preset bandwidth rate requirements, the read and write test fails.
9. The test method for a server MCIO interface according to claim 8, characterized in that, it further includes... include: Perform stress testing on the M.2 device in the test fixture module corresponding to the MCIO interface.