A fully automatic testing system and method based on the test environment as an arch method

Abstract

A fully automatic test system based on an arch method test environment comprises a microwave darkroom, an arch frame, a transmitting antenna, a receiving antenna, an amplifier switch control box, a vector network analyzer and a test turntable; further comprises a test database, wherein the test database comprises a plurality of different test information, wherein the test information comprises information to be tested and frequency band information, wherein the information to be tested reflects the tested piece placed on a calibration plate, and the frequency band information reflects the frequency band value switched by the amplifier switch control box; further comprises an acquisition module for obtaining an initial radio frequency value, an end radio frequency value and a test radio frequency value, a verification module for calculating a loss value, an analysis module for indexing and transmitting actual frequency band information, a test module for calculating an absorption value, and a comparison module for obtaining a reflectivity. The invention has the advantage of effectively improving the efficiency of testing and processing and analyzing test data.

Description

Technical Field

[0001] The present invention relates to the field of wireless communication, and more particularly to a full-automatic testing system based on an arch method in a testing environment. Background Art

[0002] With the continuous advancement of measurement equipment and computer technology, the electrical performance indicators of antennas can be measured more conveniently and accurately through near-field in a microwave darkroom. However, the spherical near-field has a very small truncation error, and the implementation of probe compensation can also be used for measurement, which can obtain comprehensive antenna measurement radiation characteristic parameters. In addition, the spherical near-field measurement technology can be applied to a variety of antennas such as omnidirectional antennas. With the help of the system, the influence of external factors such as the environment can be reduced, and it has been widely used in the field of mobile communication antenna testing.

[0003] The current test system can only meet the dual-stack test, but not the single-stack test. In addition, if there are problems with the test environment or hardware facilities, they cannot be located and checked through software, and manual troubleshooting is required for each hardware separately. Summary of the invention

[0004] In view of the deficiencies in the prior art, the object of the present invention is to provide a fully automatic testing system based on an arch method in the testing environment, which effectively improves the efficiency of testing and processing and analyzing test data.

[0005] To achieve the above object, the present invention provides the following technical solutions:

[0006] A fully automatic test system based on an arch method test environment, comprising a microwave darkroom, an arch frame, a transmitting antenna, a receiving antenna, an amplifier switch control box, a vector network analyzer and a test turntable; the arch frame and the test turntable are located in the microwave darkroom, the transmitting antenna and the receiving antenna are slidably connected to the arch frame, and the test turntable is equipped with a calibration plate that can move up and down;

[0007] The output end of the vector network analyzer is connected to the transmitting antenna, and the connecting end is connected to the external main control computer, and a pulse radio frequency signal of a specified parameter is generated or a reflected pulse radio frequency signal is received under the control of the main control computer;

[0008] The amplifier switch control box is located outside the microwave darkroom and is used to switch different amplifier frequency bands;

[0009] It also includes a test database, wherein the test database includes a number of different test information, wherein the test information includes information to be tested and frequency band information, wherein the information to be tested reflects the test piece placed on the calibration board, and the frequency band information reflects the frequency band value switched by the amplifier switch control box;

[0010] It also includes an acquisition module, a verification module, an analysis module, a test module and a comparison module;

[0011] The acquisition module obtains the value of the RF signal transmitted by the transmitting antenna as the initial RF value, obtains the value of the RF signal reflected by the calibration board received by the receiving antenna as the final RF value, and obtains the value of the RF signal reflected by the device under test received by the receiving antenna as the test RF value;

[0012] The verification module obtains the initial radio frequency value and the terminal radio frequency value in the acquisition module, and performs subtraction calculation on the initial radio frequency value and the terminal radio frequency value to obtain the loss value;

[0013] The analysis module obtains the name of the device under test input by the user, obtains the corresponding frequency band value as the actual frequency band information by indexing in the test database according to the name of the device under test, and sends the actual radio frequency value to the amplifier switch control box;

[0014] The test module obtains the test radio frequency value in the acquisition module in the analysis module, obtains the actual radio frequency value in the analysis module, and performs subtraction calculation on the actual radio frequency value and the test radio frequency value to obtain the absorption value;

[0015] The comparison module obtains the loss value in the verification module and the absorption value in the test module, and compares the loss value and the absorption value to obtain the reflectivity of the test piece.

[0016] Furthermore, antenna fixtures are provided between the transmitting antenna and the arch frame, and between the receiving antenna and the arch frame. The transmitting antenna and the receiving antenna are always facing the center of the arch frame, and the test turntable is located at the center of the arch frame.

[0017] Furthermore, the arch frame is vertically arranged in the shielding darkroom, and servo motors are provided at both ends of the arch frame. The arch frame includes a plurality of arc frames spliced ​​together, each arc frame is provided with a slide rail, and the slide rails on each arc frame are spliced ​​together to form an arch slide, the antenna fixture is slidably connected to the arch slide, and the servo motor drives the antenna fixture to move on the arch slide to change the angle between the antenna and the test turntable.

[0018] Furthermore, the distance between the highest point in the center of the arch frame and the bottom surface of the shielding darkroom is 3670.5mm, the distance between the two ends of the arch frame is 5950mm, the distance between the test turntable and the inner side of the arch frame is 2575mm, the distance between the test turntable and the outer side of the arch frame is 2775mm, and the width of the test turntable is 600mm.

[0019] Furthermore, the test turntable includes a base, a screw, a guide rod and a driving source. The calibration plate is located on the base through the screw and the guide rod, and the calibration plate is threadedly connected to the screw. The driving source drives the screw to rotate so that the calibration plate rises and falls along the length direction of the guide rod.

[0020] Furthermore, it also includes an encoder, the acquisition module obtains the angle value between the transmitting antenna and the test turntable detected by the encoder as the first actual angle information, the acquisition module obtains the angle value between the receiving antenna and the test turntable detected by the encoder as the second actual angle information, the comparison module obtains the preset angle information input from the outside, and obtains the first actual angle information and the second actual angle information in the acquisition module and compares them with the preset angle information respectively. If they match, a normal command is issued; if they do not match, a pending adjustment command is issued.

[0021] A fully automatic testing method based on an arch method in a testing environment, comprising:

[0022] Step S1: Perform mechanical calibration to detect the RF loss value in a shielded darkroom without a DUT;

[0023] Step S2: Analyze the DUT placed on the calibration board, and match the corresponding radio frequency value to be transmitted according to the corresponding DUT;

[0024] Step S3: Perform a power radio frequency test to detect the radio frequency value reflected by the device under test and received by the receiving antenna, and calculate the reflectivity of the device under test.

[0025] Furthermore, the step S1 also includes

[0026] Step S101: placing the transmitting antenna and the receiving antenna, that is, the distance between the transmitting antenna and the receiving antenna is D, the distance from the transmitting antenna to the shield is D1, the distance from the receiving antenna to the shield is D2, and the thickness of the shield itself is D3, D=D1+D2+D3;

[0027] Step S102: Connect the transmitting antenna to the signal source, connect the receiving antenna to the test receiver, operate the signal source to send out a radio frequency signal, ensure that its dynamic range is greater than the attenuation value of 6dB required by the measured frequency point, and record the instrument status and the through value V1 measured by the receiver at this time;

[0028] Step S103: The transmitting antenna and the receiving antenna remain in the same position, the value measured by the receiver at this time is recorded as V2, the distance D is kept unchanged, the transmitting antenna and the receiving antenna are moved to the test positions of other points, and the corresponding measurement values ​​are recorded until the test of this frequency point is completed;

[0029] Step S104: Calculate the shielding effectiveness of the frequency as V1-V2;

[0030] Step S105: Change the frequency point and repeat the above steps S101 to S104 until all positions and frequencies are tested;

[0031] Step S106: After each frequency test is completed, the value of the signal source and the gain position of the power amplifier should be kept unchanged, and the reference level V value should be measured according to "Step S102". If the current measured value V changes by more than 3dB from the previous V1 value, V2 should be remeasured.

[0032] Furthermore, the step S3 also includes

[0033] Step S301: configuring the starting position of each axis of the turntable on the main control computer;

[0034] Step S302: configuring the frequency, scanning points, power value and bandwidth value of the vector network analyzer and saving them;

[0035] Step S303: the main control computer controls the turntable to move to the corresponding configured starting position, reads and saves the test data collected by the vector network analyzer, generates a calibration file, and collects calibration data at different angles according to different angles of the antenna;

[0036] Step S304: Start the test, the main control computer controls the turntable to move to the corresponding configured starting position, imports the calibration file, reads and saves the test data collected by the vector network analyzer, and the main control computer parses the read log, and draws a chart curve of the data read by the vector network analyzer. After the test data collection is completed, the ratio of the reflected power of the measured absorbing material to the reflected power of the standard plate is calculated to obtain the reflectivity of the absorbing material and generate a test data file.

[0037] The beneficial effects of the present invention are as follows: with the host computer as the control and test core of the test system, the user operates the host computer software of the test system to issue control protocol instructions to control corresponding instruments and equipment to test the reflection coefficient of the material to be tested, and can save calibration data at different angles. In subsequent test processes, there is no need to repeat the calibration test process, and it can run stably and quickly collect data and perform data analysis to verify the performance of various materials to be tested. There is no need to manually set parameters on the equipment or instrument, which is convenient for testing and improves test efficiency. BRIEF DESCRIPTION OF THE DRAWINGS

[0038] Figure 1 This is a structural diagram of the arch method test environment in the present invention;

[0039] Figure 2 It is a test system diagram of the present invention;

[0040] Figure 3 It is a front view of the arch frame and the test turntable in the present invention;

[0041] Figure 4 is a calibration flow chart of the arch method in the present invention;

[0042] Figure 5 It is a flow chart of the arch method test in the present invention.

[0043] Attached markings: 1. Arch; 2. Transmitting antenna; 3. Receiving antenna; 4. Test turntable; 5. Calibration plate; 6. Antenna fixture; 7. Servo motor; 8. Slide rail; 101. Acquisition module; 102. Verification module; 103. Analysis module; 104. Test module; 105. Comparison module. DETAILED DESCRIPTION

[0044] The following will be combined with the drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0045] It should be noted that when a component is referred to as being "fixed to" another component, it may be directly on the other component or there may also be a component centered. When a component is considered to be "connected to" another component, it may be directly connected to the other component or there may also be a component centered. When a component is considered to be "set on" another component, it may be directly set on the other component or there may also be a component centered. The terms "vertical", "horizontal", "left", "right" and similar expressions used herein are for illustrative purposes only.

[0046] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as those commonly understood by those skilled in the art of the present invention. The terms used herein in the specification of the present invention are only for the purpose of describing specific embodiments and are not intended to limit the present invention. The term "and / or" used herein includes any and all combinations of one or more related listed items.

[0047] Since the current test system can only meet the dual-stack test, but not the single-stack test, and the test environment and hardware facilities have problems, it is impossible to locate and troubleshoot them through software, and it is necessary to manually troubleshoot each hardware separately. Therefore, the present invention designs this kind of fully automatic test system based on the test environment as an arch method, and the specific structure is as follows Figure 1-2As shown, it includes a microwave darkroom, an arch frame 1, a transmitting antenna 2, a receiving antenna 3, an amplifier switch control box, a vector network analyzer and a test turntable 4; the arch frame 1 and the test turntable 4 are located in the microwave darkroom, the transmitting antenna 2 and the receiving antenna 3 are slidably connected to the arch frame 1, and the test turntable 4 is equipped with a calibration plate 5 that can move up and down;

[0048] Vector network analyzer is a signal transceiver device, which is mainly used to measure the characteristic information such as amplitude frequency, phase frequency and group delay of the two-way S parameters of the measured network scattering parameters. It is widely used in the development, production, maintenance and measurement of a new generation of military electronic equipment represented by phased array radar. It can also be used in precision guidance, stealth and anti-stealth, aerospace, satellite communication, radar detection and monitoring, teaching experiments, antenna and RCS testing, component testing, material testing and many other fields. The role played in this test environment is to connect to the main control computer, generate a pulsed RF signal of specified parameters under the control of the main control computer, and transmit it through the reference antenna, which is received by the receiving antenna 3 and transmitted to the receiving port of the vector network analyzer to collect the pulsed RF signal emitted by the transmitting antenna 2;

[0049] The amplifier switch control box is located outside the microwave darkroom. It is used to switch different amplifier frequency bands according to the different frequency bands of the material to be tested to ensure the quality of the transmitted and received signals.

[0050] It also includes a test database, which includes a number of different test information, including information to be tested and frequency band information, the information to be tested reflects the test piece placed on the calibration board 5, and the frequency band information reflects the frequency band value switched by the amplifier switch control box;

[0051] It also includes a collection module 101, a verification module 102, an analysis module 103, a test module 104 and a comparison module 105;

[0052] The acquisition module 101 obtains the value of the RF signal transmitted by the transmitting antenna 2 as the initial RF value, obtains the value of the RF signal reflected by the calibration board 5 received by the receiving antenna 3 as the final RF value, and obtains the value of the RF signal reflected by the device under test received by the receiving antenna 3 as the test RF value;

[0053] The verification module 102 obtains the initial radio frequency value and the terminal radio frequency value in the acquisition module 101, and performs subtraction calculation on the initial radio frequency value and the terminal radio frequency value to obtain a loss value;

[0054] The analysis module 103 obtains the name of the device under test input by the user, obtains the corresponding frequency band value as the actual frequency band information by indexing in the test database according to the name of the device under test, and sends the actual radio frequency value to the amplifier switch control box;

[0055] The testing module 104 obtains the test radio frequency value in the acquisition module 101 in the analysis module 103, obtains the actual radio frequency value in the analysis module 103, and performs subtraction calculation on the actual radio frequency value and the test radio frequency value to obtain an absorption value;

[0056] The comparison module 105 obtains the loss value in the verification module 102 and the absorption value in the test module 104, and compares the loss value and the absorption value to obtain the reflectivity of the test piece.

[0057] The software controls the transmitting antenna 2 and the receiving antenna 3 to move independently on the arch track and point to the center of the circle. The test platform is adjusted to move up and down, and the test angle is adjusted according to the different user-defined test absorbing materials. During the test, the software sends commands to the vector network analyzer to configure the test parameters so that the transmitting antenna 2 excites the absorbing material and the receiving antenna 3 picks up the reflected signal. The software compares the two measured reflected signals to quickly obtain the reflection coefficient of the absorbing material, which improves the test efficiency.

[0058] The present invention uses a host computer as the control and test core of the test system. The user operates the host computer software of the test system to issue control protocol instructions to control corresponding instruments and equipment to test the reflection coefficient of the material to be tested, and can save calibration data at different angles. In subsequent test processes, there is no need to repeat the calibration test process, and the system can stably run and quickly collect data and perform data analysis to verify the performance of various materials to be tested. There is no need to manually set parameters on the equipment or instrument, which is convenient for testing and improves test efficiency.

[0059] like Figure 3 As shown, antenna fixtures 6 are provided between the transmitting antenna 2 and the arch frame 1 and between the receiving antenna 3 and the arch frame 1 . The transmitting antenna 2 and the receiving antenna 3 are always facing the center of the arch frame 1 , and the test turntable 4 is located at the center of the arch frame 1 .

[0060] The arch frame 1 is vertically arranged in the shielded darkroom, and servo motors 7 are provided at both ends of the arch frame 1. The arch frame 1 includes several arc frames spliced ​​together (the whole is made of non-metallic material), each arc frame is provided with a slide rail 8, and the slide rails 8 on each arc frame are spliced ​​together to form an arch slide, the antenna fixture 6 is slidably connected to the arch slide, and the servo motor 7 drives the antenna fixture 6 to move on the arch slide to change the angle between the antenna and the test turntable 4 (a precision reducer is provided at the servo motor 7, and a copper wire core synchronous belt connected to the servo motor 7 is provided on the arch frame 1).

[0061] The distance between the highest point of the center of the arch frame 1 and the bottom surface of the shielding darkroom is 3670.5mm, the distance between the two ends of the arch frame 1 is 5950mm, the distance between the test turntable 4 and the inner side of the arch frame 1 is 2575mm, the distance between the test turntable 4 and the outer side of the arch frame 1 is 2775mm, and the width of the test turntable 4 is 600mm;

[0062] The principle of the arch test method is that the transmitting antenna 2 and the receiving antenna 3 move independently on the arch frame 1 to point to the center of the circle. The ratio of the reflection level of the absorbing material to be tested received by the receiving antenna 3 to the reflection level of the receiving metal plate is the reflectivity of the absorbing material. When designing the arch frame 1, the distance between the transmitting and receiving antennas through the reflection path of the sample absorbing material should be considered first. This distance should make the receiving antenna in the far field area of ​​the transmitting antenna 2. The far field distance of the antenna is determined by the following formula:

[0063] Where: R-the distance from the phase center point of the transmitting antenna 2 through the sample absorbing material and reflected to the phase center of the receiving antenna 3; D-the aperture of the test antenna; λ-the wavelength corresponding to the test antenna at the highest frequency;

[0064] The test frequency range of the arch 1 test system is 1-40G. Since the far-field conditions of different test frequencies in the system are different, there are strict requirements on the antenna aperture. It is necessary to make the antenna meet the far-field conditions in each frequency band. Then the antenna must be implemented in segments, and antennas with different apertures are used to meet the far-field conditions of different frequency bands. According to the specific frequency band, we divide 1-40G into 5 horn antennas. The aperture size of the first horn antenna is 56*41cm, and the frequency band is 1-2G. According to the far-field calculation formula, this antenna size can meet the far-field conditions. The aperture size of the second horn antenna is 18*25cm, the frequency band is 3-5G, and the aperture size of the third horn antenna is 30*20cm, and the frequency band is 6-9G. The aperture size of the fourth horn antenna is 20*15cm, and the frequency band is 9-14G. The aperture size of the fifth horn antenna is 15*13cm, and the frequency band is 14-18G. The sixth horn antenna has an aperture size of 2.1*1.5cm and a frequency band of 19-29G. The seventh horn antenna has an aperture size of 2.1*1.5cm and a frequency band of 28-40G, as shown in Figure 1:

[0065]

[0066]

[0067] Table 1 is the record data of the verification test. The beam width of each horn antenna is designed according to the values ​​in the table to ensure the accuracy of the entire system test. As shown in the figure below, the distance from the antenna mouth to the absorbing material surface is greater than 2.5m. This calculation can ensure that the distance from the transmitting antenna 2 to the receiving antenna after being reflected by the absorbing material is at least greater than 5m. According to the data in the above table, the far-field distance of the 1-2G horn antenna is 4.17m, which is less than 5 meters to meet the requirements.

[0068] The test turntable 4 includes a base, a screw, a guide rod and a driving source. The calibration plate 5 is located on the base through the screw and the guide rod, and the calibration plate 5 is threadedly connected to the screw. The driving source drives the screw to rotate so that the calibration plate 5 rises and falls along the length direction of the guide rod.

[0069] The factors affecting the angular position accuracy mainly include rotation error, measuring element system error and control error. The rotation error is mainly guaranteed by assembly accuracy, and the control error is mainly affected by the errors of the controller and the feedback element. Since the controller adopts a 32-bit digital control method, the general error can be ignored, so the measurement accuracy of the feedback element needs to be considered. The measurement accuracy is related to the system accuracy and installation error of the feedback element. It also includes an encoder (angular position encoder). The acquisition module 101 obtains the angle value between the transmitting antenna 2 and the test turntable 4 obtained by the encoder detection as the first actual angle information. The acquisition module 101 obtains the angle value between the receiving antenna 3 and the test turntable 4 obtained by the encoder detection as the second actual angle information. The comparison module 105 obtains the preset angle information input from the outside, obtains the first actual angle information and the second actual angle information in the acquisition module 101, and compares them with the preset angle information respectively. If they match, a normal command is issued. If they do not match, a pending adjustment command is issued. The debugging is mainly to make the transmitting antenna 2 and the receiving antenna 3 more accurate when moving.

[0070] In addition to the reflected signals of the absorbing material and the metal plate, the receiving antenna 3 also includes the direct coupling between the transmitting and receiving antennas 3, the reflection of the arch frame 1 and the surrounding environment, the scattering of the edge of the sample and other influencing factors, which are collectively referred to as spurious interference below; the spurious interference signal and the useful signal are superimposed on each other to cancel or construct each other, which is a factor causing the uncertainty in the measurement of the absorbing performance of the absorbing material. Therefore, the present invention designs this fully automatic test method based on the test environment as the arch method, including

[0071] Step S1: Perform mechanical calibration to detect the RF loss value in a shielded darkroom without a DUT;

[0072] Step S2: Analyze the DUT placed on the calibration board 5, and match the corresponding radio frequency value to be transmitted according to the corresponding DUT;

[0073] Step S3: Perform a power radio frequency test to detect the radio frequency value reflected by the device under test and received by the receiving antenna 3, and calculate the reflectivity of the device under test.

[0074] Specifically, Figure 4 As shown, step S1 also includes

[0075] Step S101: Confirm that the equipment can work normally. Before testing, turn on the instrument and warm it up for 15 minutes. Confirm that the noise floor can meet the test requirements, place the transmitting and receiving antennas 3, that is, the distance between the transmitting antenna 2 and the receiving antenna 3 is D, the distance between the transmitting antenna 2 and the shield is D1, the distance between the receiving antenna 3 and the shield is D2, and the thickness of the shield itself is D3, D = D1 + D2 + D3;

[0076] Step S102: Connect the transmitting antenna 2 to the signal source, connect the receiving antenna 3 to the test receiver, operate the signal source to send out a radio frequency signal, and ensure that its dynamic range is greater than the attenuation value of 6dB required by the measured frequency point. If it cannot be satisfied, connect the power amplifier to the signal source, adjust the power amplifier gain until the dynamic range meets the requirement, and record the instrument status and the through value V1 measured by the receiver at this time;

[0077] Step S103: The transmitting antenna 2 and the receiving antenna 3 remain in the same position, the shielding door is closed, the value measured by the receiver at this time is recorded as V2, the distance D is kept unchanged, the transmitting antenna 2 and the receiving antenna 3 are moved to the test positions of other points, and the corresponding measurement values ​​are recorded until the test of this frequency point is completed;

[0078] Step S104: Calculate the shielding effectiveness of the frequency as V1-V2 (the unit of V1 and V2 is dBμV);

[0079] Step S105: Change the frequency point and repeat the above steps S101 to S104 until all positions and frequencies are tested;

[0080] Step S106: After each frequency test is completed, the value of the signal source and the gain position of the power amplifier should be kept unchanged, and the reference level V value should be measured according to "Step S102". If the current measured value V changes by more than 3dB from the previous V1 value, V2 should be remeasured.

[0081] Step S3 (the vector network analyzer and the main control computer perform a test based on the power radiation, the test flow chart is as follows: Figure 5 As shown, the detailed process of the technical solution adopted by the power radiation is as follows) and also includes step S301: configuring the starting position of each axis of the turntable on the main control computer;

[0082] Step S302: configuring the frequency, scanning points, power value and bandwidth value of the vector network analyzer and saving them;

[0083] Step S303: The main control computer controls the turntable to move to the corresponding configured starting position, reads and saves the test data collected by the vector network analyzer, and the main control computer processes the read log output through the corresponding algorithm and displays it in the form of a chart curve, while updating the test progress of the test task progress bar in real time until the calibration is completed and a calibration file is generated. The calibration file can be collected multiple times, and calibration data at different angles can be collected according to different angles of the antenna. The significance of this calibration data is that in the test of the absorbing performance of the absorbing material, the collected data can be used as a reference data, and the reflected signals of the software with and without the absorbing material installed can be compared to calculate the absorbing performance of the absorbing material;

[0084] Step S304: Start the test, the main control computer controls the turntable to move to the corresponding configured starting position, imports the calibration file, reads and saves the test data collected by the vector network analyzer, and the main control computer parses the read log, draws a chart curve of the data read by the vector network analyzer, and after the test data collection is completed, calculates the ratio of the reflected power of the tested absorbing material to the reflected power of the standard plate, and obtains the reflectivity of the absorbing material. At the same time, the test progress of the test task progress bar is updated in real time until the test is completed and the test data file is generated. When performing tests at different angles, the previously collected calibration file of the same angle can be imported into it, and there is no need to repeat the calibration test process.

[0085] The above are only preferred embodiments of the present invention. The protection scope of the present invention is not limited to the above embodiments. All technical solutions under the concept of the present invention belong to the protection scope of the present invention. It should be pointed out that for ordinary technicians in this technical field, some improvements and modifications without departing from the principle of the present invention should also be regarded as the protection scope of the present invention.

Claims

1. A fully automatic test system based on the test environment being an arch method, characterized in that: The invention comprises a microwave darkroom, an arch frame (1), a transmitting antenna (2), a receiving antenna (3), an amplifier switch control box, a vector network analyzer and a test turntable (4); the arch frame (1) and the test turntable (4) are located in the microwave darkroom, the transmitting antenna (2) and the receiving antenna (3) are slidably connected to the arch frame (1), and the test turntable (4) is equipped with a calibration plate (5) that can move up and down; The output end of the vector network analyzer is connected to the transmitting antenna (2), and the connecting end is connected to an external main control computer, and a pulse radio frequency signal with specified parameters is generated or a reflected pulse radio frequency signal is received under the control of the main control computer; The amplifier switch control box is located outside the microwave darkroom and is used to switch different amplifier frequency bands; It also includes a test database, wherein the test database includes a plurality of different test information, wherein the test information includes information to be tested and frequency band information, wherein the information to be tested reflects the test piece placed on the calibration board (5), and the frequency band information reflects the frequency band value switched by the amplifier switch control box; It also includes a collection module (101), a verification module (102), an analysis module (103), a test module (104) and a comparison module (105); The acquisition module (101) obtains the value of the radio frequency signal transmitted by the transmitting antenna (2) as an initial radio frequency value, obtains the value of the radio frequency signal reflected by the calibration board (5) received by the receiving antenna (3) as an end radio frequency value, and obtains the value of the radio frequency signal reflected by the device to be tested received by the receiving antenna (3) as a test radio frequency value; The verification module (102) obtains the initial radio frequency value and the terminal radio frequency value in the acquisition module (101), and performs subtraction calculation on the initial radio frequency value and the terminal radio frequency value to obtain a loss value; The analysis module (103) obtains the name of the device under test input by the user, obtains the corresponding frequency band value as actual frequency band information by indexing the name of the device under test in the test database, and sends the actual radio frequency value to the amplifier switch control box; The testing module (104) obtains the test radio frequency value in the acquisition module (101) in the analysis module (103), obtains the actual radio frequency value in the analysis module (103), and performs subtraction calculation between the actual radio frequency value and the test radio frequency value to obtain an absorption value; The comparison module (105) obtains the loss value in the verification module (102) and the absorption value in the test module (104), and compares the loss value and the absorption value to obtain the reflectivity of the test piece.

2. A fully automatic test system based on the arch method in the test environment according to claim 1, characterized in that: An antenna fixture (6) is provided between the transmitting antenna (2) and the arch frame (1), and between the receiving antenna (3) and the arch frame (1); the transmitting antenna (2) and the receiving antenna (3) are always oriented toward the center of the arch frame (1), and the test turntable (4) is located at the center of the arch frame (1).

3. A fully automatic test system based on the arch method in the test environment according to claim 2, characterized in that: The arch frame (1) is vertically arranged in a shielded darkroom, and servo motors (7) are provided at both ends of the arch frame (1). The arch frame (1) comprises a plurality of arc frames spliced ​​together, each arc frame is provided with a slide rail (8), and the slide rails (8) on each arc frame are spliced ​​together to form an arch slideway, the antenna fixture (6) is slidably connected to the arch slideway, and the servo motor (7) drives the antenna fixture (6) to move on the arch slideway to change the angle between the antenna and the test turntable (4).

4. A fully automatic test system based on the arch method in the test environment according to claim 3, characterized in that: The distance between the highest point of the center of the arch frame (1) and the bottom surface of the shielding darkroom is 3670.5 mm, the distance between the two ends of the arch frame (1) is 5950 mm, the distance between the test turntable (4) and the inner side surface of the arch frame (1) is 2575 mm, the distance between the test turntable (4) and the outer side surface of the arch frame (1) is 2775 mm, and the width of the test turntable (4) is 600 mm.

5. The fully automatic test system based on the arch method in the test environment according to claim 1, characterized in that: The test turntable (4) comprises a base, a screw, a guide rod and a driving source, the calibration plate (5) is located on the base via the screw and the guide rod, and the calibration plate (5) is threadedly connected to the screw, and the driving source drives the screw to rotate so that the calibration plate (5) is lifted and lowered along the length direction of the guide rod.

6. The fully automatic test system based on the arch method in the test environment according to claim 1, characterized in that: The invention also comprises an encoder, wherein the acquisition module (101) acquires the angle value between the transmitting antenna (2) and the test turntable (4) detected by the encoder as first actual angle information, and the acquisition module (101) acquires the angle value between the receiving antenna (3) and the test turntable (4) detected by the encoder as second actual angle information, and the comparison module (105) acquires preset angle information input from the outside, and respectively compares the first actual angle information and the second actual angle information in the acquisition module (101) with the preset angle information, and if they match, a normal command is issued, and if they do not match, a pending adjustment command is issued.

7. A fully automatic test method based on a test environment being an arch method, providing a fully automatic test system based on a test environment being an arch method as claimed in claim 1, characterized in that: include Step S1: Perform mechanical calibration to detect the RF loss value in a shielded darkroom without a DUT; Step S2: Analyze the DUT placed on the calibration board (5), and match the corresponding radio frequency value to be transmitted according to the corresponding DUT; Step S3: Perform a power radio frequency test to detect the radio frequency value reflected by the device under test and received by the receiving antenna (3), and calculate the reflectivity of the device under test.

8. A fully automatic testing method based on the arch method in the testing environment according to claim 7, characterized in that: The step S1 also includes Step S101: Place the transmitting and receiving antennas (3), i.e., the distance between the transmitting antenna (2) and the receiving antenna (3) is D, the distance between the transmitting antenna (2) and the shield is D1, the distance between the receiving antenna (3) and the shield is D2, the thickness of the shield itself is D3, D=D1+D2+D3; Step S102: Connect the transmitting antenna (2) to the signal source, connect the receiving antenna (3) to the test receiver, operate the signal source to send out a radio frequency signal, ensure that its dynamic range is greater than the attenuation value of 6dB required by the measured frequency point, and record the instrument status and the through value V1 measured by the receiver at this time; Step S103: The transmitting antenna (2) and the receiving antenna (3) remain in the same position, the value measured by the receiver at this time is recorded as V2, the distance D is kept unchanged, the transmitting antenna (2) and the receiving antenna (3) are moved to the test positions of other points, and the corresponding measurement values ​​are recorded until the test of this frequency point is completed; Step S104: Calculate the shielding effectiveness of the frequency as V1-V2; Step S105: Change the frequency point and repeat the above steps S101 to S104 until all positions and frequencies are tested; Step S106: After each frequency test is completed, the value of the signal source and the gain position of the power amplifier should be kept unchanged, and the reference level V value should be measured according to "Step S102". If the current measured value V changes by more than 3dB from the previous V1 value, V2 should be remeasured.

9. A fully automatic testing method based on the arch method in the testing environment according to claim 7, characterized in that: The step S3 also includes Step S301: configuring the starting position of each axis of the turntable on the main control computer; Step S302: configuring the frequency, scanning points, power value and bandwidth value of the vector network analyzer and saving them; Step S303: the main control computer controls the turntable to move to the corresponding configured starting position, reads and saves the test data collected by the vector network analyzer, generates a calibration file, and collects calibration data at different angles according to different angles of the antenna; Step S304: Start the test, the main control computer controls the turntable to move to the corresponding configured starting position, imports the calibration file, reads and saves the test data collected by the vector network analyzer, and the main control computer parses the read log, and draws a chart curve of the data read by the vector network analyzer. After the test data collection is completed, the ratio of the reflected power of the measured absorbing material to the reflected power of the standard plate is calculated to obtain the reflectivity of the absorbing material and generate a test data file.

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