A method and system for machine commissioning
By marking and filtering historical data of product batches in semiconductor manufacturing lines, and using the EAP system to prioritize the selection of suitable batches for trial operation, the problem of misjudgment caused by abnormal historical data was solved, and the accuracy of trial operation and product yield were improved.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- CHANGXIN MEMORY TECH INC
- Filing Date
- 2022-07-18
- Publication Date
- 2026-06-05
AI Technical Summary
On semiconductor manufacturing lines, using product batches with abnormal historical data for trial runs can easily lead to misjudgments, resulting in the official release of process equipment or formulas that actually deviate from the expected specifications. This can lead to a decrease in product Cpk, or even a decrease in product yield or scrapping.
By examining historical data of product batches and marking them according to preset conditions, suitable batches are selected for trial operation of process equipment or formulas. The Equipment Automation Management System (EAP) is used to identify and prioritize batches that meet the conditions for trial operation.
It improved the accuracy of machine or formula trial runs, enhanced the product's process capability index and yield, and avoided misjudgments caused by abnormal historical data.
Smart Images

Figure CN115220409B_ABST