Material analysis device with rapid fixing device

Abstract

The present invention relates to a material analysis device for analyzing a material sample. The material analysis device is equipped with a sample chamber which is normally temperature-controlled, a sample holder which is carried by at least one fixed column into the sample chamber, and a load contact which is subjected to a force applied by an exciter at one end and which carries a connection link at the other end, through which the force is transmitted to the sample in a predetermined manner and a load is thereby applied to the sample.

Description

Technical Field

[0001] This invention relates to a material analysis apparatus according to the preamble of claim 1. It has a sensing contact. And / or a quick-fixing device for the sample holder. Background Technology

[0002] The apparatus according to the invention is not only used for dynamic mechanical analysis, but is preferably used for it. Dynamic mechanical analysis (DMA) is an indispensable method for determining the viscoelasticity of primary polymer materials. The apparatus employed here is a modularly designed material analysis device. In particular, this modular design should also allow for the use of various different sample holders and different sensing contacts. This makes it possible to simulate almost all possible load conditions with a single device. Until now, such sample holders and associated sensing contacts have been mounted in material analysis devices by bolt connections. Bolted connections are secure and robust, reliably transmit the necessary forces, and allow for quick assembly and disassembly.

[0003] Purpose of the invention

[0004] Although the known material analysis devices to date can operate well and reliably and can be reassembled relatively easily, there is still a desire to further reduce the assembly time of such material analysis devices. Summary of the Invention

[0005] The solution to the above objective is achieved by all the features of claim 1.

[0006] Therefore, a material analysis apparatus for analyzing material samples is proposed, preferably equipped with a sample chamber that can be loaded from the top and, in this case, sealed with a cover plate, and which is typically temperature-adjustable. It has a sample holder held in place by one, two, or more fixing posts, preferably suspended from the cover plate by the fixing posts. For positioning the sample holder, two or more fixing posts are typically used to support it. In the preferred case of top loading, the fixing posts allow the sample holder to extend from the cover plate into the sample chamber.

[0007] Furthermore, this material analysis device has a load contact (Belastungsstempel). At one end of the load contact is a force applied by an exciter (Erreger). At the other end, the load contact carries a sensing contact, which those skilled in the art typically refer to as an "insert adapted to the specimen geometry"; for the sake of uniformity of terminology, the patent term "sensing contact" will continue to be used below. Force is transmitted to the specimen through this sensing contact in a predetermined manner. In this way, a load is applied to the specimen.

[0008] According to the invention, the material analysis apparatus is characterized in that a load contact forms a sleeve (muffe) at its end facing the sample chamber. In the ready-to-operate state, this sleeve accommodates the insertion section (Einsteckabschnitt) of the sensing contact. In this case, the sleeve has at least one lateral window. A wedge (preferably a flat wedge with a flat wedge surface) can be pushed through this lateral window into a groove located behind the window at the insertion section. The pushing of the wedge is generally achieved in a purely radial direction relative to the longitudinal axis of the sensing contact.

[0009] In this way, the sensing contact can be anchored to the load contact in a form-fit, gapless manner. A key advantage of this wedge connection is its quick assembly and disassembly, typically without tools. With appropriate forced prestress, it always self-installs correctly. This not only reduces assembly time but also improves operational reliability because the problem of accidentally loose bolts is eliminated. Compared to bolted connections, wedge connections have little or no risk of accidental loosening.

[0010] Optional design schemes of the present invention

[0011] Ideally, the sleeve of the load contact is preferably formed as a first centering cone in the form of a Zentrierkegelsitze. Interacting with a second centering cone (preferably convex) formed on the insertion section of the sensing contact, the first centering cone allows the sensing contact to be centered relative to the load contact. For this purpose, the wedge is preferably shaped, positioned, and prestressed so that it can pull the two centering cones attached below it (preferably viewed from the direction of the sample chamber) together. In this way, the quick-fixing device according to the invention ensures optimal centering performance.

[0012] A particularly advantageous feature is that a bending spring is fixed to the outside of the load contact. This bending spring applies a prestress to the wedge block in the radial direction toward the load contact. The bending spring is preferably designed as a leaf spring fixed only at one end.

[0013] Here, the wedge is preferably connected to a leaf spring at its outward end, so that the leaf spring can also transmit tension to the wedge. Thus, the leaf spring becomes a universal control element for the wedge in both directions. Because the leaf spring is not a trivial size, it can easily release the wedge again. In particular, the leaf spring can be easily controlled by a motor, and in most cases, no additional motor is required.

[0014] Particularly advantageous for this last objective is that the leaf spring has an extended, preferably radially outwardly curved free end that extends beyond the wedge in the direction of the longitudinal axis of the load contact. This extended end itself also has a wedge-like effect, which allows it to abut against a stop as the load contact further enters the test chamber. The stop is shaped and positioned such that the load spring abuts against the stop and extends outward as the load contact continues to enter.

[0015] The spring then pulls the wedge out of the groove, allowing the sensing contact to be removed from the load contact.

[0016] According to another embodiment of the invention

[0017] This invention also claims protection for a material analysis apparatus in which the sample chamber wall or cover has a retaining opening for each of the plurality of fixing columns of the sample holder. It may include features of several claims previously described, but may also independently include features solely based on the preamble of claim 1. The free ends of each retaining post can be pushed into the retaining opening. The free ends of the respective retaining posts have grooves. A wedge movably placed in the cover plate—preferably in a purely radial direction relative to the longitudinal axis of the retaining post—can be pushed into the grooves.

[0018] In this way, the corresponding fixing post can be anchored to the sample chamber wall or cover plate in a form-fitting, gapless manner, usually without tools. Since this anchoring structure is essentially the same type as the anchoring structure used for sensing contacts, it also has the advantages mentioned above.

[0019] Other optional design schemes of the present invention

[0020] Particularly advantageous is the use of a sackloch, where the opening is fully or partially oriented towards the sample chamber—or typically towards the bottom. This sackloch is usually implemented such that a wedge placed in the cover plate is clamped between the free end of a fixed post assigned to the sackloch and the bottom of the sackloch. Unlike sensing contacts, centering is generally not required here. Therefore, the connection method here is simpler than that described for sensing contacts.

[0021] Ideally, the synchronization control components will be used. It is integrated into the sample chamber wall or cover. The synchronization control assembly is used to synchronously control all the wedges of the different fixing columns of a specific sample holder, that is, to push in or pull out of the grooves of the fixing columns simultaneously. Compared with the previous method (where multiple bolts had to be loosened one by one to install and remove the corresponding sample holder), this synchronization control assembly saves a lot of time during assembly.

[0022] The synchronization control mechanism preferably has a drehexzenter. Through corresponding rotation, pressure is applied to at least one first wedge, forcing it into a groove in the fixed post. Simultaneously, tension is applied to the sliding frame. When the drehexzenter is pulled to another position, it applies pressure to at least one second wedge. This pressure forces the at least one second wedge into a groove in another fixed post. When rotated in the opposite direction, the drehexzenter releases the wedge, allowing it to move back. Optionally, the drehexzenter is fixedly coupled to the wedge, thus enabling it to actively pull the wedge back.

[0023] For this purpose, it is particularly advantageous that the wedge is not directly connected to the eccentric wheel and the sliding frame, but rather connected via a spring element. A particularly advantageous spring element here is a bibspade spring. This is because, in the sense of true forced control, such a bibspade spring can apply not only pressure but also tension very effectively to the wedge. This allows for the wedge to be released without any problems. Attached Figure Description

[0024] Figure 1 A material analysis apparatus according to the invention in a ready state is shown and an overview view is provided.

[0025] Figure 2 The material analysis apparatus according to the invention is shown in a ready state from the side, the side being... Figure 1 Compared to a perspective that has been rotated 90°.

[0026] Figure 3 A detailed cross-section of an exemplary embodiment is shown, which clearly illustrates how the sensing contact is connected to the load contact according to the present invention.

[0027] Figure 4 A brief illustration shows how to release the sensing contact.

[0028] Figure 4a The reduced-size image shows the sensing contacts that have been released and separated from the material analysis device.

[0029] Figure 5 The control mechanism in the sensing contact in the ready position is shown.

[0030] Figure 6 The control mechanism of the sensing contact is shown when the sensing contact is released.

[0031] Figure 7 The fixing device according to the invention is shown, in which the fixing post of the sample holder is located at the cover plate of the sample chamber.

[0032] Figure 8 It shows from Figure 7 A detailed screenshot.

[0033] Figure 9 It shows the released state, according to Figure 7 Fixing device.

[0034] Figure 10 It shows from Figure 9 A detailed screenshot.

[0035] Figure 11 An exemplary embodiment of the synchronization control assembly according to the invention for the fixing column of the sample holder is shown.

[0036] Figure 12 An exemplary embodiment of the synchronous control assembly according to the invention for the fixing column of the sample holder is shown, but it is partially cut open to better show the wedge and its control method. Detailed Implementation

[0037] Figure 1 A general view of the material analysis apparatus 1 according to the present invention is shown well.

[0038] The material analysis apparatus 1 includes a vibration excitation device 2. This vibration excitation device 2 applies vibration to a load contact 3. The load contact 3 then transmits these vibrations to a specimen 4, which is shown in the figure only in a general schematic manner.

[0039] The material analysis apparatus 1 also includes a sample chamber 5, which is used only in... Figure 1 The diagram is shown in a simplified manner. During operation, the sample chamber 5 is substantially closed by the cover plate 6. The desired test temperature can be generated within the sample chamber. Optionally, radiation, such as ultraviolet radiation, can be applied to the test object. Optionally, atomization or steam treatment can be performed using, for example, corrosive liquids or liquids that otherwise erode or affect the plastic material. A similar process can also be optionally carried out by immersion in a corresponding impregnation tank.

[0040] from Figure 1It is also clear that, in this embodiment, the area outside the sample chamber between the sample chamber and the measurement system is automatically cooled by a heat pipe-based cooling system. For this purpose, a support plate 7 is installed above the insulation 8 and thus between the sample chamber and the measurement system; this support plate 7 is preferably designed as a cooling plate. As shown, the support plate 7 can be one layer of the multi-layer cover plate 6, but it can also be completely independent of the cover plate 6, which is not shown in the figure.

[0041] The cooling plate 7 eliminates or reduces the load on the measuring system located above the sample chamber caused by heat from the sample chamber. Preferably, the coolant flows through the cooling plate 7 and is recooled by the cooling device 34. However, the cooling plate 7 may also function as a "heat pipe"—as is used in laptop computer structures.

[0042] A particularly advantageous aspect is that cooling is achieved by providing predominantly radial holes in the cooling plate 7. Tubular heat pipes are inserted into these holes, and thermal paste is primarily used to achieve optimized heat transfer. The heat pipes used are longer than the holes in the cooling plate that house them. Therefore, the heat pipes extend outwards from the side of the cooling plate 7. For example, from... Figure 1 As can be clearly seen, the portion extending from the side of the cooling plate 7 extends into the cooling device 34. This portion is accommodated there by recesses or holes in a radiator, which typically has fins and functions as a heat-absorbing device and is usually purged by a blower with cooling air.

[0043] This type of "heat pipe," or the type of heat pipe used here, is typically sealed and cannot be opened non-destructively.

[0044] Heat pipes are typically designed to operate solely by temperature difference, and where possible, are supported by capillary action, in which a liquid circulates, absorbing heat at one end of the heat pipe, transferring that heat to the other end, and subsequently releasing the heat to the outside.

[0045] If the heat pipe used according to the present invention is described in more detail, the preferred heat pipe can be described as follows:

[0046] The cooling plate 7 inevitably guides a certain amount of heat flow, which is the heat loss that can pass through the insulation 8. The heat input in the cooling plate area raises the temperature of the container forming the heat pipe (usually copper pipe) and the working medium within it until it reaches the boiling point of the working medium. At this point, the working medium begins to evaporate. The temperature no longer rises, and all further introduced energy is converted into heat of vaporization.

[0047] As a result, the pressure in the heat pipe increases locally above the liquid level, leading to a very small pressure drop within the heat pipe. The generated vapor begins to diffuse throughout the entire accessible volume, flowing towards areas of lower pressure; where the temperature is below the boiling point of the working medium, the vapor condenses. For this, the vapor must release energy into the container, and the container must also release energy into the surrounding environment. This situation is most pronounced at the location of the condenser, where active cooling can be achieved (i.e., in the region of cooling device 34).

[0048] Until all latent heat is included That is, the condensation heat has been released into the surrounding environment before the temperature stops dropping.

[0049] The liquid portion of the working medium returns to the evaporator via capillary force generated by a metal mesh installed in the tube, which is typically used as a heat pipe here. Alternatively, the interior of the tube used as a heat pipe may be uneven, but rather provided with baffles extending along the longitudinal axis of the tube, which enclose the free spaces between them, which can be considered as capillary grooves.

[0050] Preferably, the heat insulation body 8 is a high-temperature resistant plate made of inorganic material, typically based on dispersed amorphous silica. This plate usually also has a special infrared-shielding material, preventing infrared radiation emitted in the sample chamber 5 from easily penetrating the heat insulation body. On one side of the heat insulation body 8, within the sample chamber, a so-called heating cover 9 is typically provided for regulating the temperature of the sample chamber.

[0051] The specimen is held in place within the specimen chamber 5 using a specimen holder 10. The specimen holder 10 typically consists of a specimen stage or specimen beam 11, which is held in place by means of fixing posts 12. For this purpose, a fixing post anchoring structure is provided on the outer side of the cover plate. 13. The anchoring structure preferably includes a synchronization control assembly, which will be described in more detail later. The anchor extends into the region of the anchoring structure 13 through a corresponding through-hole in the cover plate.

[0052] Furthermore, it is easy to see that the load contact 3 does not directly apply the vibration transmitted to it by the vibration excitation device 2 to the sample, but rather applies it through the sensing contact 14 coupled to it. The coupling structure that couples the load contact and the sensing contact 14 together is indicated by reference numeral 15. The coupling structure 15 can only be used in… Figure 1 and Figure 2 As can be roughly seen here, and will be explained in more detail later, the sensing contact 14 extends through a through-hole in the corresponding cover plate and enters the area of ​​the sample chamber 5 through this through-hole.

[0053] It is worth noting that the area where the sensing contact 14 extends into the sample chamber 5 is preferably hollowed out. Typically, it also has multiple radial windows. In this way, the cross-section available for heat conduction at the sensing contact 14 is small, through which heat can flow from the sample chamber to the area outside the sample chamber along the sensing contact.

[0054] Similarly, given its reduced thermal conductivity, the fixed column 12 is preferably designed to include a sample stage or sample beam 11. The reasons for this are the same as those described regarding the sensing contact.

[0055] Figure 3 The coupling structure 15 is shown, and how the sensing contact 14 is coupled to the load contact 3 is illustrated in detail.

[0056] It can be clearly seen that the load contact 3 is internally hollow at least at its end facing the sensing contact. This hollow end forms a sleeve 16. In this case, the sensing contact 14 has an outwardly protruding coupling member 17 at one end. This design is particularly advantageous because the wedge does not need to be fully pulled out from the corresponding window when decoupling.

[0057] The coupling element 17 can be easily screwed onto the sensing contact 14. Unlike the sensing contact 14, the coupling element 17 is typically solid. The coupling element 17 is pushed into the sleeve 16 of the load contact 3 for coupling. It can be seen that the coupling element 17 has a groove 18 that can be inserted radially from the side. In the fully coupled state, the groove 18 is located behind the window 19 in the sleeve 16. The first wedge 20 is inserted through this window.

[0058] The first wedge 20 may be designed as a circular wedge (Rundkeil), or obviously preferably as a flat wedge (Flachkeil).

[0059] Here, a flat wedge is illustrated in the image. The flat wedge has a planar, fully radially aligned lower sliding surface 21. Opposite to this lower sliding surface 21, the flat wedge has a mostly planar, inclined wedge surface 22. This wedge surface 22 interacts with an anti-wedge surface 23 at the coupling member 17.

[0060] The first wedge 20 is prestressed radially toward the coupling member 17 by a spring element, preferably formed of a leaf spring 24. This means that the leaf spring 24 forces the first wedge 20 into the groove 18. On the one hand, due to the sliding of the wedge surface 22 of the first wedge 20 and the anti-wedge surface 23 of the coupling member, and on the other hand, with its lower sliding surface 21 supported on the edge of the window 19, the coupling member 17 tends to be pulled deeper into the sleeve 16 of the load contact. This allows for automatic centering. This is because the outer cone 25 of the coupling member 17 is fully pulled into the cone seat 26 at the end of the sleeve 16 of the load contact 3. In this way, the necessary (even if small) clearance of the cylindrical shaft 27 of the coupling member 17 relative to the inner surface of the sleeve 16 does not cause harm. It is also easy to see that this type of coupling allows the load contact 3 to transmit vibrations to the sensing contact 14 without damage in the direction along its longitudinal axis L and in the opposite direction.

[0061] It is also readily apparent that the first wedge 20 is fixed to the leaf spring 24 in a form-fit manner in the region of its radially outward end. For this purpose, the leaf spring 24 may have a window through which the wedge protrudes. It can be seen that the leaf spring 24 is characterized here by only one end being clamped. Preferably, a tube clamp 28 is used to clamp the end of the leaf spring. The tube clamp 28 clamps around a portion of the load contact 3 and fixes the described end of the leaf spring 24 stationary on one side. The other end of the leaf spring 24 preferably forms a bent portion 29, which always extends obliquely relative to the longitudinal axis L of the load contact. Its function will be explained in more detail later.

[0062] and Figure 1 compared to, Figure 4 and Figure 4a This clearly demonstrates how the load contacts are remotely released via the motor. As mentioned above, Figure 1 The material analysis apparatus is shown in a ready state. The vibration excitation device 2 can move up and down on a vertical guide rail (not shown) (by a motor, typically remotely controlled). This mobility is actually used to precisely position the end of the sensing contact for accurate coupling to the sample 4. However, here, this mobility is now "repurposed" or given a second purpose. From Figure 4 and 4aIt is not difficult to understand that the vibration excitation device 2 moves downward to release the coupling structure 15. During this process, the bent portion 29 of the leaf spring encounters the stop 30 at some point. As the vibration excitation device moves further downward, the bent portion 29 bends outward due to its wedge-shaped inclination. This means that the leaf spring (in the clockwise direction here) is deflected. At this point, the leaf spring can pull the first wedge 20 out of the groove 18. In this way, the sensing contact 14 is unlocked. It can now be pulled out from the load contact 3, as... Figure 4a As shown.

[0063] More accurate details Figure 5 and 6 As shown in the diagram. The leaf spring 24 can be seen very clearly here, its upper end preferably clamped by the tube clamp 28. Here, the stop 30 is advantageously formed by the fixed bracket 31 that is fixedly mounted on the material analysis device and carries the roller 32.

[0064] Figure 5 The overall situation of being in a ready state is shown. Figure 6 The overall situation is shown after the vibration excitation device 2 has moved downwards a sufficient distance. It can be seen that the bent portion 29 of the leaf spring 24 now rolls on the roller 32 of the stop. As a result, the leaf spring 24 can move outwards more smoothly.

[0065] It is also worth noting that the connection between the first wedge 20 and the leaf spring 24 can be clearly seen in these figures. As can be seen here, the leaf spring 24 has a window 33. One end of the first wedge 20 is shaped to and fixed to the window, or preferably fixed between the two window sides (Laibungs-Seiten) of the window. Ideally, to achieve this, the wedge has an end that can have grooves on two opposite sides, such as... Figure 5 and Figure 6 As shown.

[0066] The cross-section of the wedge (at its end) is preferably rectangular rather than square. Window 33 has the same rectangular cross-section, but rotated 90°. In this way, during assembly, the wedge can be pushed into window 33 until its two grooved sides are at the same height as the edge (Leitung) of opening 33. The first wedge 20 is then rotated 90° to its final position. In this way, the two opposing window sides of window 33 now engage with the two grooves at the ends of the wedge in a form-fitting manner. In this way, the wedge can be forced back and forth by the leaf spring perpendicular to the longitudinal axis L of the load contact. Of course, other types of fixing are also possible, such as screwing the wedge to the leaf spring.

[0067] Figures 7 to 12The diagram clearly shows how to connect the fixing post of the sample holder to the cover plate, so that the sample holder is suspended from the cover plate of the sample chamber and extends into the sample chamber.

[0068] Figure 11 A general view of the fixed column anchoring structure 13 is given, which (as shown) Figure 11 (As shown) illustrates the outermost portion of the cover plate 6, away from the sample chamber. The fixing post to be fixed extends through a gap in the cover plate into the area outside where the fixing post anchoring structure is installed. An overall advantage is that the fixing post anchoring structure is essentially kept at a low temperature of approximately room temperature.

[0069] In this type of anchoring structure, which is mostly plate-shaped, blind holes are provided, either completely or partially. These blind holes respectively accommodate the coupling members 35 of the corresponding anchoring posts 12. It can be seen that the term blind hole should be understood here as a hole that forms a stop on the upper end face of the coupling member 35. The coupling member 35 has a lateral groove 36. The groove 36 has at least one groove cheek (Nutwange) that faces the stop of the blind hole and forms a wedge surface 37.

[0070] The coupling element 35 is secured by inserting a movable second wedge 38. This second wedge 38 can be a circular wedge, but a flat wedge is more practical, as shown in the figure. The coupling element 35 is clamped between the second wedge 38 and the stop of the blind hole by means of its wedge face, preferably located on the upper side, which interacts with the wedge face 37 at the cheek of the groove. In this way, the corresponding fixing post 12 is immovable in the direction along its longitudinal axis LS and in the opposite direction. The inner wall of the blind hole prevents the fixing post 12 from moving laterally or obliquely to the longitudinal axis LS. The second wedge 38 slides on the flat surface of the fixing post anchoring structure 13 on its sample chamber-facing side. This wedge typically also has a flat side that allows for lateral guidance.

[0071] Each fixed post 12 is individually equipped with such a wedge coupling device.

[0072] An optional feature is that four or more wedges are controlled synchronously. For this, a synchronization control component is required. This synchronization control component is used to retract the wedges, such as... Figure 9 and 10 As shown. Then, the top of the wedge completely disengages from the engagement with the groove 36.

[0073] Then the sample stage 11, together with the fixing column 12, can be removed downwards.

[0074] Figure 11 and Figure 12 The structure of the synchronization control component is clearly shown, which is also part of the fixed column anchoring structure.

[0075] For ease of understanding, readers should first look at Figure 12 .

[0076] exist Figure 12 Removed from Figure 11 Various components, still visible, obstruct the view of key objects. It can be seen that the second wedge 38 can move back and forth within a groove or limited recess in the base plate 46. Here, the base plate 46 is part of the anchoring structure 13. For this purpose, it can be clearly seen that a lateral guide rail 39 is preferably provided next to each wedge. Every two second wedges 38 are equipped with a common control slider. 40.

[0077] Upon close inspection, it can be seen that each wedge is connected to the control slider 40 via an elongated cylindrical member. One end of this elongated cylindrical member is connected to one of the long, flat sides of the wedge. The elongated cylindrical member is a spring member, preferably in the form of a bent rod spring.

[0078] Furthermore, the double eccentric wheel 41 is pivotally mounted in the base plate 46. The double eccentric wheel 41 can rotate about the eccentric shaft 43 by means of its rotating handle 42. When the rotating handle 42 is turned clockwise to control the double eccentric wheel 41, one of the eccentric wheels—the one facing the observer—pushes the drive slider 40. The control slider 40 is thus pushed to the left. Consequently, each of the second wedges 38, connected to the drive slider 40 via a bent rod spring 44, is pushed from its open position to its closed position.

[0079] If viewed side by side Figure 11 and 12 This allows us to understand how the synchronization control assembly works. The synchronization control assembly includes a synchronization control frame 45. A second eccentric wheel of a double eccentric wheel 41 rests against the right end of the synchronization control frame from the inside. The same movement of the double eccentric wheels—which in this case moves the control slider 40 towards the left—causes the synchronization control frame 45 to be pulled by the second eccentric wheel, to the right in the case shown in the attached figure. This pulling motion is continuously transmitted throughout the fixed post anchoring structure 13 until it reaches the area of ​​the control slider 40 on its left. The left-side control slider 40 is then pulled from left to right by the synchronization control frame. This left-side control slider 40 will also push the second wedge 38, connected to it via a bent rod spring, from the open position to the closed position.

[0080] In this way, the sample stage or sample beam 11 can be easily and conveniently replaced. After removing the partition that marks the boundary of the sample chamber 5, hold the sample stage or sample beam 11 with one hand and rotate the rotating handle 42 90° with the other hand. The sample stage or sample beam 11 can then be removed downwards with one hand.

[0081] Figure Labels

[0082] 1 Material Analysis Apparatus

[0083] 2 Vibration excitation device

[0084] 3 load contacts

[0085] 4 samples

[0086] 5 Sample Chamber

[0087] 6 cover plates

[0088] 7 cooling plates

[0089] 8 Insulation Body

[0090] 9 Heating cover plate

[0091] 10 Sample Holders

[0092] 11. Specimen platform / spectrum

[0093] 12. Maintain the fixing column of the sample holder

[0094] 13 Fixed column anchoring structure

[0095] 14 Sensing Contacts

[0096] 15. Coupling structure between sensing contact and load contact

[0097] 16. Sleeves for coupling sleeves or load contacts

[0098] 17 Couplers

[0099] 18 Grooves

[0100] 19 windows

[0101] 20 First wedge

[0102] 21 Sliding Surface

[0103] 22. Wedge face of the wedge block

[0104] 23. Anti-wedge surface of coupling element 17

[0105] 24 leaf springs

[0106] 25 outer cone

[0107] 26 sleeve 16 cone seat

[0108] 27. Cylindrical shaft of coupling element 17

[0109] 28 pipe clamps

[0110] 29. Inclined extension of the leaf spring

[0111] 30 Stopping parts

[0112] 31 Fixed bracket

[0113] 32 rolls

[0114] 33 windows

[0115] 34 Cooling device

[0116] 35 Coupler

[0117] 36 grooves

[0118] 37. Wedge surface

[0119] 38 Second wedge

[0120] 39 Lateral guide rails

[0121] 40 Control slider

[0122] 41 Rotating eccentric wheel or double eccentric wheel

[0123] 42 Rotary handle

[0124] 43 Eccentric Shaft

[0125] 44 Bending rod spring

[0126] 45 Synchronization Control Framework

[0127] 46 base plate

[0128] Longitudinal axis of L contact

[0129] Longitudinal axis of LS fixed column 12

Claims

1. A material analysis device (1) for analyzing a material sample, said material analysis device (1) having a sample chamber (5) which is normally capable of temperature control, a sample holder (10) which is carried by at least one holding column (12) into the sample chamber (5), and a load contact (3) which is subjected to a force applied by an exciter at one end and carries a connection link at the other end, by means of which the force is transmitted to a sample (4) and a load is thereby applied to the sample (4) in a predetermined manner, characterized in that The load contact (3) is formed at the end facing the sample chamber (5) with a sleeve (16) which in the ready-to-operate state accommodates an insertion section of the sensing contact (14) therein, wherein the sleeve (16) has at least one lateral window (19) through which a flat first wedge (20) can be inserted into a recess (18) on the insertion section behind the lateral window (19), by means of which the connecting link can be fixed without play on the load contact (3).

2. The material analysis device (1) according to claim 1, characterized in that The first wedge (20) has a flat wedge surface (22).

3. A material analysis device (1) for analyzing a material sample, the material analysis device (1) having a sample chamber (5), a sample holder (10) fixed to a cover plate (6) with at least two fixing posts (12) and then carried by the cover plate (6) into the sample chamber (5), and a load contact (3) having one end subjected to a force applied by an exciter and having a sensing contact (14) carried at the other end, through which the force is transmitted to a sample (4) in a predetermined manner and thereby a load is applied to the sample (4), characterized in that, The load contact (3) is formed at the end facing the sample chamber (5) with a sleeve (16) which in the ready-to-operate state accommodates an insertion section of the sensing contact (14) therein, wherein the sleeve (16) has at least one lateral window (19) through which a flat first wedge (20) can be inserted into a recess (18) on the insertion section behind the lateral window (19), by means of which the sensing contact (14) can be fixed without play on the load contact (3).

4. The material analysis device (1) according to claim 3, characterized in that The first wedge (20) has a flat wedge surface (22).

5. The material analysis device (1) according to claim 3, characterized in that The sample chamber (5) can be loaded from the top, can be closed by means of the cover plate (6) and can generally be temperature-controlled.

6. The material analysis device (1) according to claim 3, characterized in that The sample holder (10) is fixed to the cover plate (6) with four fixing posts (12).

7. The material analysis device (1) according to any one of claims 1 to 6, characterized in that The sleeve (16) of the load contact (3) forms a first centering cone which interacts with a second centering cone on the insertion section of the sensing contact (14) such that the sensing contact (14) is centered relative to the load contact (3).

8. The material analysis device (1) according to claim 7, characterized in that The first centering cone takes the form of a centering cone seat.

9. The material analysis device (1) according to claim 7, characterized in that The second centering cone is outwardly convex.

10. The material analysis device (1) according to any one of claims 1 to 6, characterized in that, The first wedge (20) and the recess (18) on the insertion section of the sensing contact (14) can be formed such that the first wedge (20) during its insertion into the recess (18) pulls an outwardly convex centering cone on the insertion section of the sensing contact (14) into the centering cone seat of the sleeve (16).

11. The material analysis device (1) according to any one of claims 1 to 6, characterized in that A bending spring is fixed at the outside of the load contact (3) which exerts a prestress on the first wedge (20) in the radial direction towards the load contact (3).

12. The material analysis apparatus (1) according to claim 11, characterized in that The bending spring takes the form of a leaf spring (24) which is fixed at one end.

13. The material analysis apparatus (1) according to claim 12, characterized in that The first wedge (20) is connected at its radially outward end to the leaf spring (24) such that the leaf spring (24) can also transmit a pulling force to the first wedge (20).

14. The material analysis apparatus (1) according to claim 12 or 13, characterized in that The first wedge (20) is connected to the leaf spring (24) form-fittingly in the form of a bayonet.

15. The material analysis apparatus (1) according to claim 12 or 13, characterized in that, The plate spring (24) has an extended free end which protrudes beyond the first wedge (20) in the direction of the longitudinal axis (L) of the load contact (3) and encounters a stop when the load contact (3) is further inserted into the sample chamber (5), so that the plate spring (24) is spread radially outwards and the first wedge (20) is pulled out of the recess (18) in this way, so that the sensing contact (14) can be removed from the load contact (3).

16. The material analysis apparatus (1) according to claim 15, characterized in that The extended free end of the plate spring (24) is bent radially outwards at an angle.

17. The material analysis apparatus (1) according to any one of claims 3 to 6, characterized in that The sample chamber wall has a holding opening for each of the one or more holding posts (12) of the sample holder (10), into which a free end of the respective holding post (12) can be pushed, wherein the free end of the respective holding post (12) has a recess (18) into which a first wedge (20) which is movably arranged in the cover plate (6) can be pushed, so that the end of the holding post (12) is positively, gaplessly anchored to the cover plate (6).

18. The material analysis apparatus (1) according to claim 17, characterized in that The cover plate (6) of the sample chamber wall has a holding opening for each of the one or more holding posts (12) of the sample holder (10).

19. A material analysis device (1) for analyzing a material sample, said material analysis device (1) having a sample chamber (5) which is normally capable of temperature control, a sample holder (10) which is carried by at least one holding column (12) into the sample chamber (5), and a load contact (3) which is subjected to a force applied by an exciter at one end and carries a connection link at the other end, by means of which the force is transmitted to a sample (4) and a load is thereby applied to the sample (4) in a predetermined manner, characterized in that The sample chamber wall has a holding opening for each of the one or more holding posts (12) of the sample holder (10), into which a free end of the respective holding post (12) can be pushed, wherein the free end of the respective holding post (12) has a recess (18) into which a first wedge (20) which is movably arranged in the cover plate (6) can be pushed, so that the end of the holding post (12) is positively, gaplessly anchored to the cover plate (6).

20. The material analysis apparatus (1) according to claim 19, characterized by The cover plate (6) of the sample chamber wall has a holding opening for each of the one or more holding posts (12) of the sample holder (10).

21. A material analysis device (1) for analyzing a material sample, said material analysis device (1) having a sample chamber (5), a sample holder (10) fixed to a cover plate (6) with at least two fixing posts (12) and then carried by said cover plate (6) into said sample chamber (5), and a load contact (3) having one end subjected to a force applied by an exciter and having a sensing contact (14) carried at the other end, through which sensing contact (14) a force is transmitted to a sample (4) in a predetermined manner and thereby a load is applied to said sample (4), characterized in that The sample chamber wall has a holding opening for each of the one or more holding posts (12) of the sample holder (10), into which a free end of the respective holding post (12) can be pushed, wherein the free end of the respective holding post (12) has a recess (18) into which a first wedge (20) which is movably arranged in the cover plate (6) can be pushed, so that the end of the holding post (12) is positively, gaplessly anchored to the cover plate (6).

22. The material analysis apparatus (1) according to claim 21, characterized in that The cover plate (6) of the sample chamber wall has a holding opening for each of the one or more holding posts (12) of the sample holder (10).

23. The material analysis apparatus (1) according to claim 21, characterized in that The sample chamber (5) can be loaded from the top, can be closed by the cover plate (6) and can generally be temperature-controlled.

24. The material analysis apparatus (1) according to claim 21, characterized by The sample holder (10) is fixed to the cover plate (6) with four holding posts (12).

25. The material analysis apparatus (1) according to claim 17, characterized by The holding openings are fully or partially realized as blind holes, so that a first wedge (20) which is arranged in the cover plate (6) can clamp the free end of its corresponding holding post (12) between a wedge surface (22) of the first wedge (20) and the bottom of the blind hole.

26. The material analyzing apparatus (1) according to any one of claims 18 to 24, characterized in that, The holding openings are realized completely or partially as blind holes, so that a first wedge (20) placed in the cover plate (6) can clamp the free end of its corresponding fixing post (12) between the wedge face (22) of the first wedge (20) and the bottom of the blind hole.

27. The material analysis apparatus (1) according to claim 17, characterized by In the cover plate (6) there is integrated a synchronization control assembly which synchronously controls the second wedges (38), i.e. pushes them into the grooves (36) of the fixing posts (12) or pulls them out of the grooves (36) of the fixing posts (12).

28. The material analysis apparatus (1) according to any one of claims 18 to 25, characterized in that, In the cover plate (6) there is integrated a synchronization control assembly which synchronously controls the second wedges (38), i.e. pushes them into the grooves (36) of the fixing posts (12) or pulls them out of the grooves (36) of the fixing posts (12).

29. The material analysis apparatus (1) according to claim 26, characterized in that In the cover plate (6) there is integrated a synchronization control assembly which synchronously controls the second wedges (38), i.e. pushes them into the grooves (36) of the fixing posts (12) or pulls them out of the grooves (36) of the fixing posts (12).

30. The material analysis apparatus (1) according to claim 27 or 29, characterized by The synchronization control assembly comprises a rotating eccentric wheel (41) which, with a corresponding rotation, exerts a pressure on at least one second wedge (38) and forces it into a groove (36) of a fixing post (12) and simultaneously exerts a pulling force on a synchronization control frame (45) which, when it is thus pulled to another position, exerts a pressure on at least one second wedge (38) and forces it into a groove (36) of another fixing post (12).

31. The material analysis apparatus (1) according to claim 28, characterized in that The synchronization control assembly comprises a rotating eccentric wheel (41) which, with a corresponding rotation, exerts a pressure on at least one second wedge (38) and forces it into a groove (36) of a fixing post (12) and simultaneously exerts a pulling force on a synchronization control frame (45) which, when it is thus pulled to another position, exerts a pressure on at least one second wedge (38) and forces it into a groove (36) of another fixing post (12).

32. The material analysis apparatus (1) according to claim 30, characterized in that The second wedges (38) are not directly connected to the rotating eccentric wheel (41) and to the synchronization control frame (45), but are connected via spring elements.

33. The material analysis apparatus (1) according to claim 31, characterized in that The second wedges (38) are not directly connected to the rotating eccentric wheel (41) and to the synchronization control frame (45), but are connected via spring elements.

34. The material analysis apparatus (1) according to claim 32 or 33, characterized in that The spring elements are in the form of bent bar springs (44).

35. The material analysis device (1) according to any one of claims 1 to 6, 8, 9, 12, 13, 16, 18 to 25, 27, 29, 31 to 33, having a sample chamber (5) which can be temperature-controlled, a sample holder (10) which is carried by at least one stationary column (12) into the sample chamber (5), and a load contact (3) which is subjected to a force applied by an exciter at one end and carries a connecting link at the other end, by means of which the force is transmitted to a sample (4) in a predetermined manner and thereby a load is applied to the sample (4), and a measurement system which is arranged outside the sample chamber (5), characterized in that At least one region outside the sample chamber (5) between the sample chamber (5) and the measuring system is automatically cooled by a cooling system based on heat pipe technology by providing at least one heat pipe, which is internally hollow and tightly sealed, with an automatic circulation of a cooling liquid in the heat pipe, wherein the hot end of the heat pipe is in heat-conducting connection with the wall region to be cooled, and the heat dissipation end of the heat pipe is connected with a heat sink and / or forcedly flows in cooling liquid from the outside.

36. A material analysis device (1) for analyzing a material sample, said material analysis device (1) having a sample chamber (5) capable of temperature control, a sample holder (10) carried by at least one fixed column (12) into said sample chamber (5), and a load contact (3) having one end subjected to a force applied by an exciter and having a connection link carried at the other end, by which a force is transmitted to a sample (4) in a predetermined manner and by which a load is applied to said sample (4), and a measurement system arranged outside said sample chamber (5), characterized in that At least one region outside the sample chamber (5) between the sample chamber (5) and the measuring system is automatically cooled by a cooling system based on heat pipe technology by providing at least one heat pipe, which is internally hollow and tightly sealed, with an automatic circulation of a cooling liquid in the heat pipe, wherein the hot end of the heat pipe is in heat-conducting connection with the wall region to be cooled, and the heat dissipation end of the heat pipe is connected with a heat sink and / or forcedly flows in cooling liquid from the outside.

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