Calibration Device, System, Method, Equipment and Medium for Analog Input Channel
By designing a calibration device including a voltage reference chip, an operational amplifier, an MCU, multiple resistors and multiple switches, automatic calibration of the analog input channel is realized, solving the problems of complex and low efficiency of the calibration process in the prior art, reducing costs and improving accuracy.
Patent Information
- Application Number
- CN202210967442.8
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- Filing Date
- 2022-08-12
- Publication Date
- 2025-05-30
- Estimated Expiration
- 2042-08-12
AI Technical Summary
In the prior art, the calibration process of the analog input channel is complex, with many steps, high error rate, and requires manual manual adjustment, which is inexpensive and low time cost and efficiency.
A calibration device including a voltage reference chip, an operational amplifier, an MCU, multiple resistors and multiple switches is designed. The MCU receives target calibration instructions, controls the switch and resistors, generates currents of multiple gears, and realizes automatic calibration of the analog input channel.
Automatic calibration of analog input channels is realized, reducing labor costs and time costs, and improving calibration efficiency and accuracy.
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Figure CN115308662B_ABST
Abstract
Description
Technical Field
[0001] The present invention relates to the technical field of device calibration, and particularly to a calibration device, system, method, equipment and medium for an analog input channel. Background Art
[0002] Distributed control systems (DCS) are widely used in domestic industrial fields such as chemical industry, petrochemical industry, and power industry. Among them, the analog input module is a module dedicated to collecting analog signals in the system. In order to meet the high-precision requirements of the analog input module, before actual application, it is necessary to calibrate the channel circuit of the analog input module to reduce errors.
[0003] Traditional calibration of analog input modules needs to be carried out step by step. The calibration process is complex, with many steps, a high error rate, and difficult calibration verification. Moreover, both the calibration method process and the calibration circuit are very complex, and it is necessary to manually adjust the calibrator to assist in calibration. Such a calibration method has a high time cost and requires human intervention, resulting in low efficiency. Summary of the Invention
[0004] The technical problem to be solved by the present invention is to overcome the defect that it is difficult to calibrate the analog input channel in the prior art, and to provide a calibration device, system, method, equipment and medium for an analog input channel.
[0005] The present invention solves the above technical problem through the following technical solutions:
[0006] The present invention provides a calibration device for an analog input channel, and the calibration device includes: a voltage reference chip, an operational amplifier, an MCU, a plurality of resistors, and a plurality of switches;
[0007] The power supply terminal of the voltage reference chip is electrically connected to an external power supply, the output terminal is electrically connected to one end of each of the plurality of switches respectively, and the ground terminal is electrically connected to the output terminal of the operational amplifier;
[0008] After the non-inverting input terminal of the operational amplifier is electrically connected to one end of each of the plurality of resistors respectively, it is electrically connected to one channel in an external analog input channel card and grounded through the channel;
[0009] The output terminal of the operational amplifier is electrically connected to the inverting input terminal of the operational amplifier;
[0010] The other end of each switch is correspondingly electrically connected to the other end of a resistor;
[0011] The MCU is electrically connected to the plurality of switches;
[0012] The MCU is configured to receive a target calibration instruction and generate a control instruction according to the target calibration instruction, to control the target switch among the multiple switches to close and the other switches to open;
[0013] The operational amplifier is used as a voltage follower to make the voltage at the ground terminal of the voltage reference chip equal to 0;
[0014] The voltage reference chip is used to provide a calibration voltage and generate a target power supply current at the connection with the channel.
[0015] The present invention also provides a calibration system for an analog input channel. The calibration system includes: a plurality of the foregoing calibration devices, a host computer, and an analog input channel card. Among them, the analog input channel card includes a plurality of channels;
[0016] The host computer is electrically connected to the analog input channel card;
[0017] The analog input channel card is electrically connected to the plurality of calibration devices through the plurality of channels, where each channel is correspondingly electrically connected to a calibration device;
[0018] The host computer is electrically connected to the MCU in the plurality of calibration devices;
[0019] The host computer is configured to send a target calibration instruction to the MCU in the plurality of calibration devices, where the target calibration instruction includes an expected calibration current value and a channel to be measured;
[0020] The analog input channel card is configured to receive a target power supply current from a target calibration device through the channel to be measured, and the target calibration device is electrically connected to the channel to be measured;
[0021] The host computer is further configured to measure the target power supply current to obtain a target power supply current value, and calculate a target calibration current value according to the compensation calibration coefficient of the channel to be measured and the target power supply current value.
[0022] Preferably, the host computer is electrically connected to the MCU in the plurality of calibration devices through an RS485 serial bus.
[0023] The present invention also provides a calibration method for an analog input channel. The calibration method is applied to the foregoing calibration system, and the calibration method includes:
[0024] Sending a target calibration instruction from the host computer to the MCU in the plurality of calibration devices, where the target calibration instruction includes an expected calibration current value and the channel to be measured;
[0025] The MCU in the target calibration device generates a control instruction according to the target calibration instruction, controls the target switch among the multiple switches to close, and the other switches to open;
[0026] The voltage reference chip provides a calibration voltage and generates a target power supply current at the connection with the channel to be measured;
[0027] The target power supply current is sent to the analog input channel card through the channel to be measured;
[0028] The host computer measures the target power supply current to obtain the target power supply current value;
[0029] The host computer calculates the target calibration current value according to the compensation calibration coefficient of the channel to be measured and the target power supply current value.
[0030] Preferably, the target calibration current is obtained through the following formula:
[0031] z = k * x + b
[0032] where z is the target calibration current value; x is the target power supply current value; k and b are the compensation calibration coefficients of the channel to be measured.
[0033] Preferably, before the step of the host computer sending a target calibration instruction to the MCU in the multiple calibration devices, the following steps are included:
[0034] The host computer sends a first calibration instruction to the MCU in the multiple calibration devices, where the first calibration instruction includes the maximum expected calibration current value and the channel to be measured;
[0035] The MCU in the target calibration device generates a first control instruction according to the maximum expected calibration current value, controls all switches to close, and generates a maximum power supply current at the connection between the voltage reference chip and the channel to be measured;
[0036] The maximum power supply current is sent to the analog input channel card through the channel to be measured;
[0037] The host computer measures the maximum power supply current to obtain the maximum power supply current value; the host computer sends a second calibration instruction to the MCU in the multiple calibration devices, where the second calibration instruction includes the minimum expected calibration current value and the channel to be measured;
[0038] The MCU in the target calibration device generates a second control instruction according to the minimum expected calibration current value, controls any one of the multiple switches to close, and generates a minimum power supply current at the connection between the voltage reference chip and the channel to be measured;
[0039] The minimum power supply current is sent to the analog input channel card through the channel to be measured;
[0040] The minimum power supply current is measured by the host computer to obtain the minimum power supply current value;
[0041] The host computer calculates the compensation calibration coefficient of the channel to be measured according to the maximum expected calibration current value, the maximum power supply current value, the minimum expected calibration current value, and the minimum power supply current value.
[0042] Preferably, the compensation calibration coefficient of the channel to be measured is obtained by the following formula:
[0043]
[0044] b = y min -k * x min
[0045] where y max is the maximum expected calibration current value; y min is the minimum expected calibration current value; x max is the maximum power supply current value; x min is the minimum power supply current value.
[0046] Preferably, the calibration method further includes:
[0047] The host computer transmits the compensation calibration coefficient of the channel to be measured from the host computer to the analog input channel card for storage.
[0048] The present invention also provides an electronic device, including a memory, a processor, and a computer program stored on the memory and executable on the processor. When the processor executes the computer program, the calibration method of the analog input channel described above is implemented.
[0049] The present invention also provides a computer-readable storage medium, on which a computer program is stored. When the computer program is executed by a processor, the calibration method of the analog input channel described above is implemented.
[0050] The positive and progressive effects of the present invention are as follows: The calibration device for the analog input channel provided by the present invention receives the target calibration instruction sent by the host computer through the MCU, and issues a control instruction according to the target calibration instruction to control the closing of the switch, changing the resistance in the access circuit, thereby providing currents of multiple gears, and further realizing the automatic calibration of the analog input channel. There is no need for manual application of calibration current, reducing the labor cost and time cost of calibration, and improving the efficiency and accuracy of calibration. BRIEF DESCRIPTION OF THE DRAWINGS
[0051] Figure 1 FIG. 1 is a schematic structural diagram of the calibration device for the analog input channel provided in Embodiment 1 of the present invention.
[0052] Figure 2 FIG. 2 is a schematic structural diagram of the calibration system for the analog input channel provided in Embodiment 2 of the present invention.
[0053] Figure 3 FIG. 3 is a schematic structural diagram of the analog input channel card and the calibration device in the calibration system for the analog input channel provided in Embodiment 2 of the present invention.
[0054] Figure 4 FIG. 4 is a flowchart of the calibration method for the analog input channel provided in Embodiment 3 of the present invention.
[0055] Figure 5 FIG. 5 is a flowchart of the compensation calibration coefficient sub-method provided in Embodiment 3 of the present invention.
[0056] Figure 6 FIG. 6 is a schematic structural diagram of the electronic device provided in Embodiment 4 of the present invention. DETAILED DESCRIPTION OF THE EMBODIMENTS
[0057] The present invention will be further described below by way of embodiments, but the present invention is not limited to the scope of the described embodiments.
[0058] Embodiment 1
[0059] This embodiment provides a calibration device for an analog input channel, which includes: a voltage reference chip, an operational amplifier, an MCU, a plurality of resistors, and a plurality of switches.
[0060] The power supply terminal of the voltage reference chip is electrically connected to an external power supply, the output terminal is electrically connected to one end of a plurality of switches respectively, and the grounding terminal is electrically connected to the output terminal of the operational amplifier.
[0061] After the non-inverting input terminal of the operational amplifier is electrically connected to one end of a plurality of resistors respectively, it is electrically connected to one channel in an external analog input channel card and grounded through the channel.
[0062] The output terminal of the operational amplifier is electrically connected to the inverting input terminal of the operational amplifier.
[0063] The other end of each switch is correspondingly electrically connected to the other end of a resistor.
[0064] The MCU is electrically connected to multiple switches.
[0065] The MCU is used to receive a target calibration instruction, generate a control instruction according to the target calibration instruction, control the target switch among the multiple switches to close, and the other switches to open.
[0066] The operational amplifier is used as a voltage follower to make the voltage at the ground terminal of the voltage reference chip equal to 0.
[0067] The voltage reference chip is used to provide a calibration voltage and generate a target power supply current at the connection with the channel.
[0068] Specifically, in this embodiment, the calibration device further includes a terminal for realizing the electrical connection between the grounding point of the calibration device and the channel in the external analog input channel card.
[0069] As Figure 1 shown, specifically, in this embodiment, the voltage reference chip can be REF102, providing a calibration voltage of 10V; the operational amplifier can be OPA111; there can be 5 switches in the calibration device, namely S1, S2, S3, S4, S5; there can be 5 resistors in the calibration device, namely R1, R2, R3, R4, R5, where the resistance value of each resistor is 2500Ω.
[0070] The following are two specific cases of applying the calibration device in this embodiment.
[0071] Case 1:
[0072] When the calibration voltage provided by the voltage reference chip in the calibration device is 10V, there are 5 resistors with a resistance value of 2500Ω in the calibration device; the expected calibration current value included in the target calibration instruction sent by the host computer is 4mA, and the channel to be measured is Channel 1.
[0073] The MCU in the calibration device electrically connected to Channel 1 generates a control instruction according to the target calibration instruction, controls any one of the switches S1 - S5 to close, and the other switches to open. At this time, the target resistor connected to the circuit is 2500Ω.
[0074] Case 2:
[0075] When the calibration voltage provided by the voltage reference chip in the calibration device is 10V, there are 5 resistors with a resistance value of 2500Ω in the calibration device; the expected calibration current value included in the target calibration instruction sent by the host computer is 8mA, and the channel to be measured is Channel 1.
[0076] The MCU in the calibration device electrically connected to Channel 1 generates a control instruction according to the target calibration instruction, controls any two of the switches S1 - S5 to close, and the other switches to open. At this time, the target resistance connected to the circuit is 1250 Ω.
[0077] The calibration device provided in this embodiment receives the target calibration instruction sent by the host computer through the MCU, issues a control instruction according to the target calibration instruction to control the closing of the switch, changes the resistance in the access circuit, thereby providing currents of multiple gears, and further realizes the automatic calibration of the analog input channel. There is no need to manually apply a calibration current, which reduces the labor cost and time cost of calibration and improves the efficiency and accuracy of calibration.
[0078] Embodiment 2
[0079] This embodiment provides a calibration system for an analog input channel. The calibration system includes: a plurality of calibration devices as described in Embodiment 1, a host computer, and an analog input channel card. Among them, the analog input channel card includes a plurality of channels.
[0080] The host computer is electrically connected to the analog input channel card.
[0081] The analog input channel card is electrically connected to a plurality of calibration devices through a plurality of channels. Among them, each channel is correspondingly electrically connected to a calibration device.
[0082] The host computer is electrically connected to the MCU in the plurality of calibration devices.
[0083] The host computer is used to send a target calibration instruction to the MCU in the plurality of calibration devices. Among them, the target calibration instruction includes an expected calibration current value and a channel to be measured.
[0084] The analog input channel card is used to receive the target power supply current from the target calibration device through the channel to be measured, and the target calibration device is electrically connected to the channel to be measured.
[0085] The host computer is also used to measure the target power supply current to obtain a target power supply current value, and calculate a target calibration current value according to the compensation calibration coefficient of the channel to be measured and the target power supply current value.
[0086] Specifically, in this embodiment, the host computer is electrically connected to the MCU in the plurality of calibration devices through an RS485 serial bus.
[0087] Specifically, in this embodiment, the analog input channel card further includes a plurality of terminals for realizing the electrical connection between the plurality of channels and the plurality of calibration devices.
[0088] Such as Figure 2As shown, specifically, in this embodiment, there can be channels 1 - 8, a total of 8 channels, in the analog input channel card.
[0089] As Figure 3 shown, specifically, in this embodiment, the analog input channel card can be electrically connected to 8 calibration devices.
[0090] The calibration system provided in this embodiment sends a target calibration instruction to multiple calibration devices through the host computer, receives the target power supply currents of multiple gears sent by the target calibration device through the analog input channel card, then measures the target power supply current through the host computer to obtain the target power supply current value, and calculates the target calibration current value according to the compensation calibration coefficient of the channel to be measured and the target power supply current value, thereby realizing the automatic calibration of the analog input channel, without the need for manual application of calibration current, reducing the labor cost and time cost of calibration, and improving the efficiency and accuracy of calibration.
[0091] Embodiment 3
[0092] This embodiment provides a calibration method for an analog input channel. This calibration method is applied to the calibration system as described in Embodiment 2. As Figure 4 shown, this calibration method includes the following steps:
[0093] S301. Send a target calibration instruction to the MCU in multiple calibration devices through the host computer, where the target calibration instruction includes the expected calibration current value and the channel to be measured.
[0094] S302. Generate a control instruction according to the target calibration instruction through the MCU in the target calibration device, and control the target switch among multiple switches to close and other switches to open.
[0095] S303. Provide a calibration voltage through the voltage reference chip and generate a target power supply current at the connection with the channel to be measured.
[0096] S304. Send the target power supply current to the analog input channel card through the channel to be measured.
[0097] S305. Measure the target power supply current through the host computer to obtain the target power supply current value.
[0098] S306. Calculate the target calibration current value according to the compensation calibration coefficient of the channel to be measured and the target power supply current value through the host computer.
[0099] Specifically, in this embodiment, the target calibration current is obtained through the following formula:
[0100] z = k * x + b
[0101] Among them, z is the target calibration current value; x is the target power supply current value; k and b are the compensation calibration coefficients of the channel to be measured.
[0102] Specifically, in this embodiment, the calibration method of the analog input channel includes a compensation calibration coefficient sub-method. Before step S301, as Figure 5 shown, this sub-method includes:
[0103] S0301: Send a first calibration instruction from the host computer to the MCU in multiple calibration devices. Among them, the first calibration instruction includes the maximum expected calibration current value and the channel to be measured.
[0104] S0302: The MCU in the target calibration device generates a first control instruction according to the maximum expected calibration current value, controls all switches to close, and generates the maximum power supply current at the connection with the channel to be measured.
[0105] S0303: Send the maximum power supply current to the analog input channel card through the channel to be measured.
[0106] S0304: Measure the maximum power supply current through the host computer to obtain the maximum power supply current value.
[0107] S0305: Send a second calibration instruction from the host computer to the MCU in multiple calibration devices. Among them, the second calibration instruction includes the minimum expected calibration current value and the channel to be measured.
[0108] S0306: The MCU in the target calibration device generates a second control instruction according to the minimum expected calibration current value, controls any one of the multiple switches to close, and generates the minimum power supply current at the connection with the channel to be measured.
[0109] S0307: Send the minimum power supply current to the analog input channel card through the channel to be measured.
[0110] S0308: Measure the minimum power supply current through the host computer to obtain the minimum power supply current value.
[0111] S0309: The host computer calculates the compensation calibration coefficient of the channel to be measured according to the maximum expected calibration current value, the maximum power supply current value, the minimum expected calibration current value, and the minimum power supply current value.
[0112] Specifically, in this embodiment, the compensation calibration coefficient of the channel to be measured is obtained through the following formula:
[0113]
[0114] b = y min -k * x min
[0115] wherein, y max is the maximum expected calibration current value; y min is the minimum expected calibration current value; x max is the maximum power supply current value; x min is the minimum power supply current value.
[0116] Specifically, in this embodiment, after step S0309, it further includes:
[0117] Transmit the compensation calibration coefficient of the channel to be measured from the host computer to the analog input channel card through the host computer for storage.
[0118] Specifically, in this embodiment, before step S301, it further includes:
[0119] Send a calibration request to the host computer through the MCU in the target calibration device.
[0120] The following are two specific cases of applying the embodiment of this method.
[0121] Case 1:
[0122] When the calibration voltage provided by the voltage reference chip in the calibration device is 10V, there are 5 resistors with a resistance value of 2500Ω in the calibration device; the expected calibration current value included in the target calibration instruction sent by the host computer is 4mA, and the channel to be measured is channel 1.
[0123] The MCU in the calibration device electrically connected to channel 1 generates a control instruction according to the target calibration instruction, controls any one of the switches S1 - S5 to close, and the other switches to open. At this time, the target resistor connected to the circuit is 2500Ω.
[0124] Case 2:
[0125] When the calibration voltage provided by the voltage reference chip in the calibration device is 10V, there are 5 resistors with a resistance value of 2500Ω in the calibration device; the expected calibration current value included in the target calibration instruction sent by the host computer is 8mA, and the channel to be measured is channel 1.
[0126] The MCU in the calibration device electrically connected to channel 1 generates a control instruction according to the target calibration instruction, controls any two of the switches S1 - S5 to close, and the other switches to open. At this time, the target resistor connected to the circuit is 1250Ω.
[0127] The calibration method provided in this embodiment sends a target calibration instruction from the host computer to multiple calibration devices. The MCU in the target calibration device receives the target calibration instruction sent by the host computer, and issues a control instruction according to the target calibration instruction to control the closing of the switch, changing the resistance in the access circuit, so as to provide target power supply currents of multiple gears. The analog input channel card receives the target power supply currents of multiple gears sent by the target calibration device, and then the host computer measures the target power supply current to obtain the target power supply current value, and calculates the target calibration current value according to the compensation calibration coefficient of the channel to be measured and the target power supply current value, thereby realizing the automatic calibration of the analog input channel, without manually applying a calibration current, reducing the labor cost and time cost of calibration, and improving the efficiency and accuracy of calibration.
[0128] Embodiment 4
[0129] Figure 6 It is a schematic structural diagram of an electronic device provided in Embodiment 4 of the present invention. It includes a memory, a processor, and a computer program stored on the memory and executable on the processor. When the processor executes the computer program, it implements the calibration method of the analog input channel in the foregoing Embodiment 3. Figure 6 The displayed electronic device 40 is only an example and should not bring any limitation to the functions and usage scope of the embodiments of the present invention.
[0130] The electronic device 40 may be presented in the form of a general-purpose computing device. For example, it may be a server device. The components of the electronic device 40 may include, but are not limited to: at least one of the foregoing processors 41, at least one of the foregoing memories 42, and a bus 43 connecting different system components (including the memory 42 and the processor 41).
[0131] The bus 43 includes a data bus, an address bus, and a control bus.
[0132] The memory 42 may include volatile memory, such as a random access memory (RAM) 421 and / or a cache memory 422, and may further include a read-only memory (ROM) 423.
[0133] The memory 42 may further include a program / utilities 425 having a set (at least one) of program modules 424. Such program modules 424 include, but are not limited to: an operating system, one or more application programs, other program modules, and program data. Each or some combination of these examples may include the implementation of a network environment.
[0134] The processor 41 executes various functional applications and data processing by running the computer program stored in the memory 42, such as the calibration method of the analog input channel in Embodiment 3 of the present invention.
[0135] The electronic device 40 can also communicate with one or more external devices 44 (such as a keyboard, a pointing device, etc.). Such communication can be carried out through the input / output (I / O) interface 45. Moreover, the model generation device 40 can also communicate with one or more networks (such as a local area network (LAN), a wide area network (WAN) and / or a public network, such as the Internet) through the network adapter 46. As shown in the figure, the network adapter 46 communicates with other modules of the model generation device 40 through the bus 43. It should be understood that although not shown in the figure, other hardware and / or software modules can be used in combination with the model generation device 40, including but not limited to: microcode, device drivers, redundant processors, external disk drive arrays, RAID (redundant array of independent disks) systems, tape drives, and data backup storage systems, etc.
[0136] It should be noted that although several units / modules or sub-units / modules of the electronic device are mentioned in the above detailed description, this division is merely exemplary and not mandatory. In fact, according to the embodiments of the present invention, the features and functions of the two or more units / modules described above can be embodied in one unit / module. Conversely, the features and functions of one unit / module described above can be further divided and embodied by multiple units / modules.
[0137] Embodiment 5
[0138] The present invention also provides a computer-readable storage medium, on which a computer program is stored. When the computer program is executed by a processor, the calibration method of the analog input channel in the foregoing Embodiment 3 is implemented.
[0139] Among them, the more specific computer-readable storage medium that can be adopted can include but not limited to: a portable disk, a hard disk, a random access memory, a read-only memory, an erasable programmable read-only memory, an optical storage device, a magnetic storage device, or any suitable combination of the above.
[0140] In a possible implementation manner, the present invention can also be implemented in the form of a program product, which includes program code. When the program product runs on a terminal device, the program code is used to make the terminal device execute the calibration method of the analog input channel in Embodiment 3.
[0141] Among them, the program code for executing the present invention can be written in any combination of one or more programming languages. The program code can be executed entirely on the user device, partially on the user device, executed as an independent software package, partially on the user device and partially on a remote device, or entirely on a remote device.
[0142] Although the specific embodiments of the present invention have been described above, those skilled in the art should understand that this is only an example, and the protection scope of the present invention is defined by the appended claims. Without departing from the principle and essence of the present invention, those skilled in the art can make various changes or modifications to these embodiments, but these changes and modifications all fall within the protection scope of the present invention.
Claims
1. A calibration device for an analog input channel, characterized in that, the calibration device includes: a voltage reference chip, an operational amplifier, an MCU, a plurality of resistors, and a plurality of switches; the power supply terminal of the voltage reference chip is electrically connected to an external power supply, the output terminal is respectively electrically connected to one end of the plurality of switches, and the ground terminal is electrically connected to the output terminal of the operational amplifier; after the non-inverting input terminal of the operational amplifier is respectively electrically connected to one end of the plurality of resistors, it is electrically connected to one channel in an external analog input channel card and grounded through the channel; the output terminal of the operational amplifier is electrically connected to the inverting input terminal of the operational amplifier; the other end of each switch is correspondingly electrically connected to the other end of a resistor; the MCU is electrically connected to the plurality of switches; the MCU is configured to receive a target calibration instruction, generate a control instruction according to the target calibration instruction, control the target switch among the plurality of switches to close, and other switches to open; the operational amplifier is used as a voltage follower to make the voltage at the ground terminal of the voltage reference chip equal to 0; the voltage reference chip is used to provide a calibration voltage and generate a target power supply current at the connection with the channel; the calibration device further includes terminals for realizing the electrical connection between the grounding point of the calibration device and the channels in the external analog input channel card.
2. A calibration system for an analog input channel, characterized in that, the calibration system includes: a plurality of calibration devices as described in claim 1, a host computer, an analog input channel card, wherein the analog input channel card includes a plurality of channels; the host computer is electrically connected to the analog input channel card; the analog input channel card is electrically connected to the plurality of calibration devices through the plurality of channels, wherein each channel is correspondingly electrically connected to one calibration device; the host computer is electrically connected to the MCU in the plurality of calibration devices; the host computer is configured to send a target calibration instruction to the MCU in the plurality of calibration devices, wherein the target calibration instruction includes an expected calibration current value and a channel to be measured; the analog input channel card is configured to receive the target power supply current from the target calibration device through the channel to be measured, and the target calibration device is electrically connected to the channel to be measured; the host computer is further configured to measure the target power supply current to obtain a target power supply current value, and calculate a target calibration current value according to the compensation calibration coefficient of the channel to be measured and the target power supply current value.
3. The calibration system for an analog input channel as described in claim 2, characterized in that, the host computer is electrically connected to the MCU in the plurality of calibration devices through an RS485 serial bus.
4. A calibration method for an analog input channel, characterized in that, the calibration method is applied to the calibration system as described in any one of claims 2-3, and the calibration method includes: sending a target calibration instruction from the host computer to the MCU in the plurality of calibration devices, wherein the target calibration instruction includes an expected calibration current value and the channel to be measured; The MCU in the target calibration device generates a control instruction according to the target calibration instruction, controls the target switch among the multiple switches to close, and the other switches to open; The voltage reference chip provides a calibration voltage and generates a target power supply current at the connection with the channel to be measured; The target power supply current is sent to the analog input channel card through the channel to be measured; The host computer measures the target power supply current to obtain the target power supply current value; The host computer calculates the target calibration current value according to the compensation calibration coefficient of the channel to be measured and the target power supply current value.
5. The calibration method for the analog input channel according to claim 4, wherein, the target calibration current is obtained through the following formula: z = k * x + b where z is the target calibration current value; x is the target power supply current value; k and b are the compensation calibration coefficients of the channel to be measured.
6. The calibration method for the analog input channel according to claim 4, wherein, before the step of the host computer sending a target calibration instruction to the MCU in the multiple calibration devices, it includes: The host computer sends a first calibration instruction to the MCU in the multiple calibration devices, wherein the first calibration instruction includes the maximum expected calibration current value and the channel to be measured; The MCU in the target calibration device generates a first control instruction according to the maximum expected calibration current value, controls all switches to close, and generates a maximum power supply current at the connection between the voltage reference chip and the channel to be measured; The maximum power supply current is sent to the analog input channel card through the channel to be measured; The host computer measures the maximum power supply current to obtain the maximum power supply current value; the host computer sends a second calibration instruction to the MCU in the multiple calibration devices, wherein the second calibration instruction includes the minimum expected calibration current value and the channel to be measured; The MCU in the target calibration device generates a second control instruction according to the minimum expected calibration current value, controls any one of the multiple switches to close, and generates a minimum power supply current at the connection between the voltage reference chip and the channel to be measured; The minimum power supply current is sent to the analog input channel card through the channel to be measured; The host computer measures the minimum power supply current to obtain the minimum power supply current value; The host computer calculates the compensation calibration coefficient of the channel to be measured according to the maximum expected calibration current value, the maximum power supply current value, the minimum expected calibration current value, and the minimum power supply current value.
7. The calibration method for the analog input channel according to claim 6, wherein, the compensation calibration coefficient of the channel to be measured is obtained through the following formula: b = y min -k * x min where y max is the maximum expected calibration current value; y min is the minimum expected calibration current value; x max is the maximum power supply current value; x min is the minimum power supply current value.
8. The calibration method for the analog input channel according to claim 7, wherein, the calibration method further includes: The host computer transmits the compensation calibration coefficient of the channel to be measured from the host computer to the analog input channel card for storage.
9. An electronic device, comprising a memory, a processor, and a computer program stored on the memory and executable on the processor, wherein, when the processor executes the computer program, the calibration method of the analog input channel according to any one of claims 4 to 8 is implemented.
10. A computer-readable storage medium, having stored thereon a computer program, wherein, when the computer program is executed by a processor, the calibration method of the analog input channel according to any one of claims 4 to 8 is implemented.
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