A time-of-flight mass spectrometer optical path calibration device and method, and medium

Abstract

The present invention relates to a time-of-flight mass spectrometer optical path calibration device, method and medium, the device comprises: a target plate simulation grating plate device, a laser optical path adjustment device, a target plate imaging device, and an ion optical path optical axis indicating device, the laser optical path adjustment device and the target plate imaging device are installed on the time-of-flight mass spectrometer, the ion optical path optical axis indicating device is installed on the ion lens, and the target plate simulation grating plate device is installed on the motion platform of the time-of-flight mass spectrometer. The present invention solves the problem of no calibration or inability to quantitatively evaluate calibration during the assembly process of the ion optical path, laser optical path and imaging optical path in the research and development and production process of the time-of-flight mass spectrometer, and the problem of human factors interfering and affecting the performance and status of the instrument, and can be used as a necessary quality control in the research and development and production process of the instrument.

Description

Technical Field

[0001] The present invention relates to the technical field of time-of-flight mass spectrometry, and in particular to an optical path calibration device and method and a medium for a time-of-flight mass spectrometer. Background Art

[0002] In matrix-assisted laser desorption time-of-flight mass spectrometry, after the sample and matrix are mixed to form crystals, the laser pulse ionizes the sample, the ionized sample is focused by the ion lens, and the ion signal is collected by the analyzer to measure the mass-to-charge ratio of the sample. When the ion cloud generated by the laser pulse spot does not match the ion channel of the ion lens, the resolution and signal-to-noise ratio will be greatly reduced, and even the instrument will not work properly.

[0003] At the same time, the time-of-flight mass spectrometer involves complex technical fields such as vacuum, high pressure, laser optics, and ion optics. The instrument is mainly composed of many core components such as matrix-assisted laser desorption ionization source, ion lens focusing assembly, time-of-flight mass analyzer, detector, etc., and has the technical characteristics of high vacuum and high voltage electricity, which has many restrictions in the design, assembly and adjustment process. Moreover, there are inevitably certain errors in the processing and assembly of each component, resulting in a large deviation from the theoretical optical path during the actual adjustment process, affecting the ionization efficiency and ion focusing ability of the instrument, resulting in a decrease in core indicators such as resolution and signal-to-noise ratio. Therefore, it is urgent to solve the matching between the ion optical path, laser focusing optical path and imaging optical path, and complete the rapid calibration of each optical path system.

[0004] At present, there are two main debugging methods for the optical path of time-of-flight mass spectrometers. The first method is mainly to improve the processing accuracy of instrument parts. Due to the influence of the assembly dimension chain, the improvement of assembly accuracy is limited. Under the conventional processing and assembly accuracy, the assembly accuracy between the optical paths is about the millimeter level, which is difficult to meet the performance requirements of the instrument and greatly increases the production cost. The second method is to repeatedly assemble and debug by monitoring the signal status of the instrument until the instrument performance meets the requirements. The stability and consistency of the instrument batches of this solution vary greatly, and it is overly dependent on the technical literacy and experience of professional technicians. It is difficult to exert the best performance of the instrument. In addition, the debugging cycle is long and there is a large uncertainty, which is not conducive to the research and development and mass production of the instrument. Summary of the invention

[0005] In order to achieve the above-mentioned purpose and other advantages according to the present invention, the first purpose of the present invention is to provide a time-of-flight mass spectrometer optical path calibration device, comprising: a target plate simulation graticule device 5, a laser optical path adjustment device, a target plate imaging device, and an ion optical path optical axis indicating device, wherein the laser optical path adjustment device and the target plate imaging device are installed on the time-of-flight mass spectrometer, the ion optical path optical axis indicating device is installed on the ion lens, and the target plate simulation graticule device is installed on the motion platform of the time-of-flight mass spectrometer;

[0006] The laser optical path adjustment device is used to generate a laser spot on the target plate simulation grating plate device, has the function of laser pointing, and realizes three-dimensional adjustment of pitch, yaw and adjustment along the optical axis direction;

[0007] The ion optical path optical axis indicating device is used to identify the ion optical axis;

[0008] The target plate imaging device is used to observe and monitor the laser light path adjustment device and the ion light path optical axis indication device, and the position and state of the laser spot and ion optical axis mark formed by the projection of the target plate simulation graticule device; observe and monitor the movement of the target plate simulation graticule device within the field of view of the target plate imaging device; after the calibration is completed, mark the new reference of the ion lens ion light path;

[0009] The target plate simulation graticule device is used to simulate the spatial position of the target plate of the mass spectrometer, receive and display the laser spot generated by the laser light path adjustment device and the mark projected by the ion light path optical axis indication device; the target plate simulation graticule device is used to simulate the two-dimensional translation along the x and y directions.

[0010] Furthermore, the pitch angle and yaw angle adjustment of the laser optical path adjustment device are used for the direction of the laser, and the adjustment along the optical axis direction is used for fine-tuning the spot size after the direction is completed;

[0011] The laser optical path adjustment device is provided with a mounting interface corresponding to the main frame of the time-of-flight mass spectrometer, and is fixed on the main frame of the time-of-flight mass spectrometer after debugging is completed.

[0012] Furthermore, the ion optical path optical axis indicating device is provided with a mounting interface mounted on the ion lens;

[0013] The coaxiality between the optical axis of the ion optical path and the optical axis indicating device of the ion optical path is within 1′;

[0014] The marking line width generated by the ion optical path optical axis indicating device is less than 1 / 3 of the target size;

[0015] The ion optical path optical axis indicating device is installed during the debugging process and disassembled after the debugging is completed.

[0016] Furthermore, the ion optical path optical axis indicating device comprises an optical device with an indicating function and a mounting seat, the optical device is mounted on the mounting seat, and the mounting seat is mounted on the ion lens via a mounting interface.

[0017] Furthermore, the target plate imaging device includes a camera, supporting imaging software, and a displacement adjustment frame, wherein the camera is mounted on the displacement adjustment frame, and the displacement adjustment frame is moved two-dimensionally along the optical axis and in a plane orthogonal to the optical axis to achieve a field of view area that satisfies the monitoring function;

[0018] The target plate imaging device is provided with a mounting interface mounted on the main frame of the time-of-flight mass spectrometer.

[0019] Furthermore, the target plate simulation grating plate device comprises a grating plate with a mark and a mounting seat, the grating plate is mounted on the mounting seat, and the mounting seat is mounted on the motion platform of the time-of-flight mass spectrometer.

[0020] A second object of the present invention is to provide a method for calibrating an optical path of a time-of-flight mass spectrometer, comprising the following steps:

[0021] S1, adjusting the x and y positions of the target plate simulation reticle device and moving it into the field of view of the target plate imaging device;

[0022] S2, the ion optical path optical axis indicating device projects the mark onto the target plate simulation graticule adjusting device, and the position where it is transmitted is used as the initial reference;

[0023] S3, adjusting the target plate simulation graticule device to move its center position to coincide with the indicated position of the ion optical path optical axis indicating device;

[0024] S4. Adjust the field of view position of the target plate imaging device so that its marked position coincides with the indicated position of the ion optical path optical axis indicating device, and mark it as a reference for later instrument laser spot debugging, testing and maintenance;

[0025] S5, adjusting the laser optical path adjustment device so that the laser spot coincides with the indicated position of the ion optical path optical axis indicating device;

[0026] S6, replacing the center position of the ion optical path optical axis indicator device with the marked position of the target plate imaging device as the new reference for each optical path;

[0027] S7. During the instrument maintenance process, the initial reference is replaced by the new reference, and steps S1, S3, S4, and S5 are repeated.

[0028] Furthermore, in step S1, the center position of the target plate simulation grating device is moved to the center area of ​​the field of view of the target plate imaging device.

[0029] Furthermore, between step S6 and step S7, the method also includes disassembling the ion optical path optical axis indicating device, and the calibration of the instrument ion optical path, laser optical path, and imaging optical path is completed.

[0030] A third object of the present invention is to provide a computer-readable storage medium having program instructions stored thereon, wherein when the program instructions are executed, an optical path calibration device for a time-of-flight mass spectrometer is implemented.

[0031] Compared with the prior art, the present invention has the following beneficial effects:

[0032] The present invention provides an optical path calibration device for a time-of-flight mass spectrometer, which solves the problem of no calibration or inability to quantitatively evaluate the calibration during the assembly of the ion optical path, laser optical path, and imaging optical path during the research and development and production of the time-of-flight mass spectrometer, and the problem of human factors interfering and affecting the performance and status of the instrument. The device can be used as a necessary quality control in the research and development and production of the instrument.

[0033] The present invention proposes an auxiliary ion optical path optical axis indicating device such as a laser cross spot indicator, solves the problem of "ion optical path" benchmark visualization, and establishes an optical benchmark for the "ion optical path".

[0034] The present invention proposes a target plate simulation graticule device, which can be used as an auxiliary device for calibration methods and devices for instrument ion optical paths, laser optical paths, and imaging optical paths. At the same time, the scale of the target plate simulation graticule can also be used as a reference for motion correction of the instrument target plate motion system.

[0035] The present invention proposes a calibration method and device implementation plan for an ion optical path, a laser optical path, and an imaging optical path, which solves the problem of no calibration or inability to quantitatively evaluate the calibration during the installation and adjustment process. The calibration accuracy can reach the order of 0.05 mm or even higher, providing a guarantee for the resolution of the instrument and effectively improving the sensitivity of the instrument.

[0036] The calibration method and device implementation plan for the ion optical path, laser optical path, and imaging optical path proposed in the present invention solve the problem of over-reliance on the technical literacy and experience of professional and technical personnel during the development, production, maintenance and debugging of the instrument, and avoids the problems of difficulty in exerting the optimal performance of the instrument due to human factors, long debugging cycles and large uncertainties.

[0037] The above description is only an overview of the technical solution of the present invention. In order to more clearly understand the technical means of the present invention and implement it according to the contents of the specification, the following is a detailed description of the preferred embodiments of the present invention in conjunction with the accompanying drawings. The specific implementation of the present invention is given in detail by the following embodiments and their accompanying drawings. BRIEF DESCRIPTION OF THE DRAWINGS

[0038] The drawings described herein are used to provide a further understanding of the present invention and constitute a part of this application. The exemplary embodiments of the present invention and their descriptions are used to explain the present invention and do not constitute an improper limitation of the present invention. In the drawings:

[0039] Figure 1 A schematic diagram of an optical path calibration device for a time-of-flight mass spectrometer according to Example 1;

[0040] Figure 2 An exploded view of an optical path calibration device for a time-of-flight mass spectrometer according to Example 1;

[0041] Figure 3 This is a schematic diagram of the ion optical path and laser optical path of Example 1 before calibration;

[0042] Figure 4 This is a schematic diagram of the ion optical path and laser optical path after calibration in Example 1;

[0043] Figure 5 This is a schematic diagram of the ion optical path, laser optical path, and imaging optical path of Example 1 before calibration;

[0044] Figure 6 This is a schematic diagram of the ion optical path, laser optical path, and imaging optical path after calibration in Example 1;

[0045] Figure 7 A flow chart of a method for calibrating an optical path of a time-of-flight mass spectrometer according to Example 2;

[0046] Figure 8 is a schematic diagram of an electronic device of Example 3;

[0047] Fig. 9 This is a schematic diagram of a computer-readable storage medium of Example 4.

[0048] In the figure: 1. Laser optical path adjustment device; 2. Ion optical path optical axis indication device; 3. Target plate imaging device; 4. Ion lens; 5. Target plate simulation graticule device; 6. Time-of-flight mass spectrometer main frame. DETAILED DESCRIPTION

[0049] The present invention is further described below in conjunction with the accompanying drawings and specific implementation methods. It should be noted that, under the premise of no conflict, the various embodiments or technical features described below can be arbitrarily combined to form a new embodiment.

[0050] Example 1

[0051] A time-of-flight mass spectrometer optical path calibration device, such as Figure 1-Figure 4As shown, it includes: a target plate simulation graticule device 5, a laser optical path adjustment device 1, a target plate imaging device 3, and an ion optical path optical axis indicating device 2. The laser optical path adjustment device 1 and the target plate imaging device 3 are installed on the time-of-flight mass spectrometer, the ion optical path optical axis indicating device 2 is installed on the ion lens 4, and the target plate simulation graticule device 5 is installed on the moving platform of the time-of-flight mass spectrometer; the laser optical path adjustment device 1, the target plate imaging device 3, and the target plate simulation graticule device 5 are part of the instrument assembly and debugging. The ion optical path optical axis indicating device 2 is an auxiliary test device and is disassembled after the instrument debugging is completed.

[0052] The laser optical path adjustment device 1 is used to generate a laser spot on the target plate simulation grating plate device 5, has the function of laser pointing, and realizes three-dimensional adjustment of pitch, yaw and adjustment along the optical axis; the pitch angle and yaw angle adjustment are used for laser pointing, and the adjustment along the optical axis is used for fine-tuning the spot size after pointing is completed; the laser optical path adjustment device 1 is provided with an installation interface corresponding to the main frame of the time-of-flight mass spectrometer, and is fixed on the main frame of the time-of-flight mass spectrometer after debugging is completed.

[0053] The ion optical path optical axis indicating device 2 is used to mark the ion optical axis in the form of "cross lines", "light spots" and the like. The ion optical path optical axis indicating device 2 is provided with a mounting interface, which can be mounted on the ion lens 4. The interface can be mounted in the form of a flange or the like, and has a high mounting accuracy. The coaxiality between the ion optical path optical axis and the ion optical path optical axis indicating device 2 is generally controlled within 1′. The cross line width generated by the ion optical path optical axis indicating device 2 should be less than 1 / 3 of the target size; the ion optical axis ion optical path optical axis indicating device 2 is installed during the debugging process and disassembled after the debugging is completed. The ion optical path optical axis indicating device 2 generally includes a cross spot laser and a mounting seat, and can also be composed of other optical devices with indicating functions adapted to the mounting seat.

[0054] The target plate imaging device 3 is used to observe and monitor the laser light path adjustment device 1, the ion light path optical axis indicating device 2, and the position and state of the laser spot and ion optical axis mark such as "crosshair" projected by the target plate simulation graticule device 5; observe and monitor the movement of the target plate simulation graticule device 5 within the field of view of the target plate imaging device 3; after the calibration is completed, the new reference of the ion light path of the ion lens 4 is marked through the software interface of the target plate imaging device 3;

[0055] The target plate imaging device 3 includes a camera, supporting imaging software, and a displacement adjustment frame. The camera is installed on the displacement adjustment frame. The displacement adjustment frame is moved two-dimensionally along the optical axis and in a plane orthogonal to the optical axis to achieve a monitoring function in the field of view area. The target plate imaging device 3 is provided with an installation interface and is installed on the main frame 6 of the time-of-flight mass spectrometer.

[0056] The ion lens 4 is a core component of the time-of-flight mass spectrometer, which is installed on the mass spectrometer main frame 6 and is the adjustment reference for the laser optical path and the imaging optical path. The ion lens 4 is provided with an installation interface with the ion optical path crosshair optical axis indicator 2.

[0057] The target plate simulation graticule device 5 is used to simulate the spatial position of the target plate of the mass spectrometer, receive and display the laser spot generated by the laser optical path adjustment device 1 and the mark such as "crosshair" projected by the ion optical path optical axis indication device 2; the target plate simulation graticule device 5 can move in two dimensions along the x-direction and y-direction. The target plate simulation graticule device 5 generally includes a graticule with a mark and a mounting seat thereof, which can be installed on the motion platform of the mass spectrometer.

[0058] The main frame 6 of the time-of-flight mass spectrometer is the installation frame of the mass spectrometer, and is provided with installation interfaces of a laser optical path adjustment device 1, an ion optical path optical axis indication device 2, a target plate imaging device 3, an ion lens 4, and a target plate simulation graticule device 5.

[0059] Example 2

[0060] A method for calibrating the optical path of a time-of-flight mass spectrometer, such as Figure 5-Figure 7 As shown, the following steps are included:

[0061] Before step S1, the ion lens 4 is installed on the main frame 6 of the time-of-flight mass spectrometer, or the two are used as an independent component; the ion optical path optical axis indicating device 2 is installed on the ion lens 4; the target plate imaging device 3 is installed on the main frame 6 of the time-of-flight mass spectrometer; the laser optical path adjustment device 1 is installed on the main frame 6 of the time-of-flight mass spectrometer; and the target plate simulation graticule device 5 is installed on the mass spectrometer device.

[0062] S1, adjusting the x and y positions of the target plate simulation grating plate device 5, and moving it to the field of view 3_V of the target plate imaging device 3; the center position of the target plate simulation grating plate device 5 is moved to the central area of ​​the field of view 3_V of the target plate imaging device 3, that is, the center position 5_O of the target plate simulation grating plate device 5 is as close to the central area of ​​the field of view as possible;

[0063] S2, the ion optical path optical axis indicating device 2 starts to work, and projects a mark such as a "crosshair" onto the target plate simulation graticule adjusting device 5, whose position is 2_0, as the initial reference for the subsequent steps;

[0064] S3, adjusting the target plate simulation graticule device 5, moving its center position 5_O to coincide with the indicated position 2_O of the ion optical path optical axis indicating device 2;

[0065] S4, adjust the field of view 3_V position of the target plate imaging device 3 so that its marking position 3_O coincides with the indicating position 2_O of the ion optical path optical axis indicating device 2, and mark it as a "crosshair". It should be understood that the mark is not limited to the crosshair, but can also be other forms of marks such as circular spot, as a benchmark for later instrument laser spot debugging, testing and maintenance;

[0066] S5, adjusting the laser optical path adjusting device 1 so that its laser spot 1_O coincides with the indicated position 2_O of the ion optical path optical axis indicating device 2;

[0067] S6. At this time, the center position 5_O of the target plate simulation grating device 5, the mark position 3_O of the target plate imaging device 3, and the light spot 1_O of the laser optical path adjustment device 1 all coincide with the center position 2_O of the ion optical path optical axis indicating device 2; the mark position 3_O of the target plate imaging device 3 replaces the center position 2_O of the ion optical path optical axis indicating device 2 as the new reference for each optical path;

[0068] S7, disassembling the ion optical path optical axis indicator device 2, and completing the calibration of the instrument ion optical path, laser optical path, and imaging optical path;

[0069] S8. During the instrument maintenance process, the target plate imaging device 3 marks the position 3_O as a new reference to replace the initial reference, and repeat steps S1, S3, S4, and S5.

[0070] Example 3

[0071] An electronic device 200, such as Figure 8 As shown, it includes but is not limited to: a memory 201 on which program codes are stored; a processor 202, which is connected to the memory, and when the program codes are executed by the processor, a time-of-flight mass spectrometer optical path calibration device is implemented. For a detailed description of the method, reference can be made to the corresponding description in the above method embodiment, which will not be repeated here.

[0072] Example 4

[0073] A computer readable storage medium such as Fig. 9 As shown, program instructions are stored thereon, and a time-of-flight mass spectrometer optical path calibration device is implemented when the program instructions are executed. For a detailed description of the method, reference may be made to the corresponding description in the above method embodiment, and no further description is given here.

[0074] Example 5

[0075] A computer program product includes a computer program / instruction, which implements a time-of-flight mass spectrometer optical path calibration device when executed by a processor. For a detailed description of the method, reference may be made to the corresponding description in the above method embodiment, which will not be repeated here.

[0076] It should also be noted that the terms "include", "comprises" or any other variations thereof are intended to cover non-exclusive inclusion, so that a process, method, commodity or device including a series of elements includes not only those elements, but also other elements not explicitly listed, or also includes elements inherent to such process, method, commodity or device. In the absence of more restrictions, the elements defined by the sentence "comprises a ..." do not exclude the existence of other identical elements in the process, method, commodity or device including the elements.

[0077] The various embodiments in this specification are described in a progressive manner, and the same or similar parts between the various embodiments can be referenced to each other, and each embodiment focuses on the differences from other embodiments.

[0078] The above are only embodiments of this specification and are not intended to limit one or more embodiments of this specification. For those skilled in the art, one or more embodiments of this specification may have various changes and transformations. Any modification, equivalent replacement, improvement, etc. made within the spirit and principle of one or more embodiments of this specification shall be included in the scope of the claims of one or more embodiments of this specification. One or more embodiments of this specification One or more embodiments of this specification One or more embodiments of this specification One or more embodiments of this specification.

Claims

1. A time-of-flight mass spectrometer optical path calibration device, characterized in that: include: A target plate simulating graticule device, a laser optical path adjustment device, a target plate imaging device, and an ion optical path optical axis indicating device, wherein the laser optical path adjustment device and the target plate imaging device are installed on a time-of-flight mass spectrometer, the ion optical path optical axis indicating device is installed on an ion lens, and the target plate simulating graticule device is installed on a motion platform of the time-of-flight mass spectrometer; The laser optical path adjustment device is used to generate a laser spot on the target plate simulation grating plate device, has the function of laser pointing, and realizes three-dimensional adjustment of pitch, yaw and adjustment along the optical axis direction; The ion optical path optical axis indicating device is used to identify the ion optical axis; The target plate imaging device is used to observe and monitor the laser light path adjustment device and the ion light path optical axis indication device, and the position and state of the laser spot and ion optical axis mark formed by the target plate simulation graticule device; observe and monitor the movement of the target plate simulation graticule device within the field of view of the target plate imaging device; after the calibration is completed, mark the new reference of the ion lens ion light path; The target plate simulation graticule device is used to simulate the spatial position of the target plate of the mass spectrometer, receive and display the laser spot generated by the laser light path adjustment device and the mark projected by the ion light path optical axis indication device; the target plate simulation graticule device is used to simulate the two-dimensional translation along the x and y directions.

2. The optical path calibration device for a time-of-flight mass spectrometer according to claim 1, characterized in that: The pitch angle and yaw angle adjustment of the laser optical path adjustment device are used for the direction of the laser, and the adjustment along the optical axis direction is used for fine-tuning the spot size after the direction is completed; The laser optical path adjustment device is provided with a mounting interface corresponding to the main frame of the time-of-flight mass spectrometer, and is fixed on the main frame of the time-of-flight mass spectrometer after debugging is completed.

3. The optical path calibration device for a time-of-flight mass spectrometer according to claim 1, characterized in that: The ion optical path optical axis indicating device is provided with a mounting interface mounted on the ion lens; The coaxiality between the optical axis of the ion optical path and the optical axis indicating device of the ion optical path is within 1′; The marking line width generated by the ion optical path optical axis indicating device is less than 1 / 3 of the target size; The ion optical path optical axis indicating device is installed during the debugging process and disassembled after the debugging is completed.

4. The optical path calibration device for a time-of-flight mass spectrometer according to claim 3, characterized in that: The ion optical path optical axis indicating device comprises an optical device with indicating function and a mounting seat, the optical device is mounted on the mounting seat, and the mounting seat is mounted on the ion lens through a mounting interface.

5. The optical path calibration device for a time-of-flight mass spectrometer according to claim 1, characterized in that: The target plate imaging device includes a camera, supporting imaging software, and a displacement adjustment frame. The camera is installed on the displacement adjustment frame, and the displacement adjustment frame is moved two-dimensionally along the optical axis and in a plane orthogonal to the optical axis to achieve a field of view that meets the monitoring function. The target plate imaging device is provided with a mounting interface mounted on the main frame of the time-of-flight mass spectrometer.

6. The optical path calibration device for a time-of-flight mass spectrometer according to claim 1, characterized in that: The target plate simulation grating plate device comprises a grating plate with a mark and a mounting seat, the grating plate is mounted on the mounting seat, and the mounting seat is mounted on the motion platform of the time-of-flight mass spectrometer.

7. A method for calibrating the optical path of a time-of-flight mass spectrometer, characterized in that: The following steps are involved: S1, adjusting the x and y positions of the target plate simulation reticle device and moving it into the field of view of the target plate imaging device; S2, the ion optical path optical axis indicating device projects the mark onto the target plate simulation graticule adjusting device, and the position where it is transmitted is used as the initial reference; S3, adjusting the target plate simulation graticule device to move its center position to coincide with the indicated position of the ion optical path optical axis indicating device; S4. Adjust the field of view position of the target plate imaging device so that its marked position coincides with the indicated position of the ion optical path optical axis indicating device, and mark it as a reference for later instrument laser spot debugging, testing and maintenance; S5, adjusting the laser optical path adjustment device so that the laser spot coincides with the indicated position of the ion optical path optical axis indicating device; S6, replacing the center position of the ion optical path optical axis indicator device with the marked position of the target plate imaging device as the new reference for each optical path; S7. During the instrument maintenance process, the initial reference is replaced by the new reference, and steps S1, S3, S4, and S5 are repeated.

8. The method for calibrating the optical path of a time-of-flight mass spectrometer according to claim 7, characterized in that: In step S1, the center position of the target plate simulation grating device is moved to the center area of ​​the field of view of the target plate imaging device.

9. The method for calibrating the optical path of a time-of-flight mass spectrometer according to claim 7, characterized in that: Between step S6 and step S7, the process also includes disassembling the ion optical path optical axis indicating device, and the calibration of the instrument's ion optical path, laser optical path, and imaging optical path is completed.

10. A computer-readable storage medium, characterized in that: Program instructions are stored thereon, and when the program instructions are executed, the method according to any one of claims 7 to 9 is implemented.

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