A photovoltaic power generation operating voltage self-test system

Abstract

The present invention discloses an operating voltage self-checking system for photovoltaic power generation, which relates to the technical field of voltage self-checking. The real-time operating voltage is obtained through a voltage acquisition unit, and then a follow-up analysis unit is used to perform a follow-up analysis. When the real-time operating voltage exceeds a certified range, an abnormal signal is generated, and 10 groups of real-time operating voltage values ​​before and after the abnormal signal is generated are automatically obtained to obtain an operating voltage group Di. A data multiplexing unit is then used to perform an abnormality analysis in combination with a forward database, and the data of the operating voltage group Di and the standard voltage group B1i are compared, and all the differences between the two are compared to make a judgment, and the data attributes of the operating voltage group Di and the standard voltage group B1i are obtained to be closer, and a first-choice reason, a potential reason or a no-reason verification signal is generated accordingly. The present invention is simple, effective, and easy to use.

Description

Technical Field

[0001] The invention belongs to the technical field of operating voltage self-detection, and in particular is an operating voltage self-detection system for photovoltaic power generation. Background Art

[0002] The patent with publication number CN108764645A discloses a method and system for evaluating the low voltage ride-through performance of a photovoltaic power station, including: simulating low voltage ride-through conditions, and correcting the pre-built photovoltaic power station model based on the response performance of the type test inverter; simulating low voltage faults in the power grid based on the corrected photovoltaic power station model, obtaining voltage and current data, and calculating the response characteristics of the photovoltaic power station model grid connection point; and evaluating the grid connection performance of the photovoltaic power station based on the response characteristics of the photovoltaic power station model grid connection point. The performance of the photovoltaic power station and the inverter unit are consistent, the modeling is simple, and the integrity and accuracy are high. The grid connection performance of the photovoltaic power station can be evaluated more comprehensively, which improves the scientific nature of the evaluation and saves costs.

[0003] However, for the operating voltage of photovoltaic power generation, how to detect its operating voltage and make timely judgments on abnormal operating voltage is a difficult problem. Based on this, a solution is now provided. Summary of the invention

[0004] The present invention aims to solve at least one of the technical problems existing in the prior art; to this end, the present invention proposes an operating voltage self-test system for photovoltaic power generation.

[0005] In order to achieve the above purpose, a photovoltaic power generation operation voltage self-test system is proposed, comprising:

[0006] A voltage acquisition unit is used to monitor the operating voltage of photovoltaic power generation in real time and mark it as the real-time operating voltage. The voltage acquisition unit is used to transmit the real-time operating voltage to the follow-up analysis unit. The follow-up analysis unit receives the real-time operating voltage transmitted by the voltage acquisition unit and performs follow-up analysis. When the real-time operating voltage exceeds the approved range, an abnormal signal is generated, and the values ​​of 10 groups of real-time operating voltages before and after the generation of the abnormal signal are automatically obtained to obtain the operating voltage group Di, i=1,...,20;

[0007] The follow-up analysis unit is used to transmit the difference signal and the operating voltage group D i to the processor. When the processor receives the difference signal, it will transmit the operating voltage group D i to the data reclassification unit. The data reclassification unit is used to perform heterogeneous source analysis in combination with the forward database. The forward database stores several operating voltage groups obtained when the operating voltage of the photovoltaic power station shows a difference signal in the past year, which are marked as reference parameter voltage groups B j i, j = 1...n, i = 1...20. B j i represents the real-time operating voltage obtained at the i-th time point in the j-th operating voltage group, and the reason for the difference in the reference parameter voltage group is stored correspondingly. The reason for the difference is the reason for the corresponding abnormality;

[0008] The heterogeneous source analysis is to judge by comparing the data of the operating voltage group D i and the reference parameter voltage group B1 i, and comparing all the differences between the two to obtain that the data attributes of the operating voltage group D i and the reference parameter voltage group B1 i are more similar, corresponding to generating the first recommended reason, potential reason or no-reason verification signal;

[0009] The data reclassification unit is used to transmit the first recommended reason, potential reason or no-reason verification signal to the intelligent notification unit, and the intelligent notification unit is used to transmit the first recommended reason, potential reason or no-reason verification signal to the administrator side;

[0010] The specific method of abnormal analysis is as follows:

[0011] S1: Obtain the operating voltage group D i, i = 1,..., 20;

[0012] S2: Then let j = 1 and obtain the corresponding reference parameter voltage group B1 i;

[0013] S3: Use the formula to calculate the difference value C i, and the specific calculation formula is C i = B1 i - D i;

[0014] S4: Then obtain all the differences, and define the doubling value F i according to the difference:

[0015] When C i < X1, the doubling value F i is 1;

[0016] When X1 ≤ C i ≤ X2, the doubling value F i is 1.3;

[0017] When C i > X2, the doubling value F i is 1.7; X1 and X2 are both preset values;

[0018] S5: Then use the formula to calculate the difference shadow value Y i, Y i = C i × F i, and then automatically calculate the average value of Y i, which is marked as the core difference value H1 of the reference parameter voltage group B1 i corresponding to j = 1;

[0019] S6: Then, let the value of j increase by 1, repeat steps S3-S6, and complete the processing of all standard parameter voltage groups Bj i, and then obtain the core difference value Hj of all standard parameter voltage groups Bj i;

[0020] S7: Then, the cause of the difference of the corresponding reference voltage group whose Hj is less than X3 is marked as a potential cause, and the potential cause corresponding to the smallest Hj is marked as the first recommended cause. If there is no Hj less than X3, a no-reason verification signal is generated;

[0021] S8: Get the first reason, potential reason or no reason verification signal;

[0022] The specific methods of heterogeneous analysis are different:

[0023] S1: Obtain an operating voltage group D i, where i=1, ..., 20;

[0024] S2: Then set j=1 and obtain the corresponding standard voltage group B1 i;

[0025] S3: Calculate the numerical difference Ci using a formula, the specific calculation formula is Ci=B1 iD i;

[0026] S4: automatically calculate the mean of the difference values ​​Ci and mark it as P;

[0027] S5: Then, the deviation W1 of the difference Ci is calculated using a formula. The specific calculation formula is:

[0028]

[0029] S6: Then, let the value of j increase by 1, repeat steps S3-S6, and complete the processing of all standard parameter voltage groups Bj i, and then obtain the deviation Wj of all standard parameter voltage groups Bj i;

[0030] S7: Mark the deviation cause of the corresponding reference voltage group whose deviation Wj is less than X3 as a potential cause, and mark the potential cause corresponding to the smallest deviation Wj as the first recommended cause. If there is no deviation Wj less than X3, a no-reason verification signal is generated;

[0031] S8: Get the first reason, potential reason or no reason verification signal.

[0032] Furthermore, the specific method of follow-up analysis is as follows:

[0033] The approved range of operating voltage is stored in the follow-up analysis unit;

[0034] Then, the real-time operating voltage is obtained and compared with the approved range. When the real-time operating voltage exceeds the approved range, an abnormal signal is generated.

[0035] When an abnormal signal is generated, the specified time is traced back to continuously obtain 10 sets of real-time operating voltages before the abnormal signal is generated;

[0036] Then, when the abnormal signal is generated, the real-time operating voltage at that time point is obtained;

[0037] Then, 10 groups of real-time operating voltages are obtained after the abnormal signal is generated, and 21 values ​​of the real-time operating voltages are obtained, which are marked as operating voltage groups Di, i=1, . . . , 20.

[0038] Furthermore, the approved range is pre-entered by an administrator.

[0039] Furthermore, the specified time satisfies that the real-time operating voltage is acquired once every T1 time interval starting from the initial time of the backtracking, and 10 groups of real-time operating voltages before the time when the abnormal signal is generated can be continuously acquired.

[0040] Furthermore, a management unit is communicatively connected to the processor for inputting all preset values.

[0041] Compared with the prior art, the present invention has the following beneficial effects:

[0042] The present invention obtains the real-time operating voltage through the voltage acquisition unit, and then performs a follow-up analysis through the follow-up analysis unit, generates an abnormal signal when the real-time operating voltage exceeds the approved range, and automatically obtains the values ​​of 10 groups of real-time operating voltages before and after the generation of the abnormal signal, and obtains the operating voltage group Di;

[0043] The data redistribution unit is then used to perform heterogeneous cause analysis in combination with the forward database. By comparing the data of the operating voltage group Di and the standard voltage group B1 i, and comparing all the differences between the two, a judgment is made, and the data attributes of the operating voltage group Di and the standard voltage group B1 i are closer, and a first-choice cause, a potential cause, or a no-cause verification signal is generated accordingly. The present invention is simple, effective, and easy to use. BRIEF DESCRIPTION OF THE DRAWINGS

[0044] Figure 1 It is a system block diagram of the present invention. DETAILED DESCRIPTION

[0045] The technical solution of the present invention will be clearly and completely described below in conjunction with the embodiments. Obviously, the described embodiments are only part of the embodiments of the present invention, rather than all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0046] See also Figure 1The present application provides a photovoltaic power generation operation voltage self-test system.

[0047] As the first embodiment of the present invention, it specifically includes:

[0048] Voltage acquisition unit, follow-up analysis unit, processor, management unit, data redistribution unit, forwarding database, intelligent notification unit and management unit;

[0049] The voltage acquisition unit is used to monitor the operating voltage of photovoltaic power generation in real time and mark it as the real-time operating voltage. The voltage acquisition unit is used to transmit the real-time operating voltage to the follow-up analysis unit. The follow-up analysis unit receives the real-time operating voltage transmitted by the voltage acquisition unit and performs follow-up analysis. The specific method of the follow-up analysis is as follows:

[0050] The follow-up analysis unit stores the approved range of the operating voltage, which is pre-entered by the administrator;

[0051] Then, the real-time operating voltage is obtained and compared with the approved range. When the real-time operating voltage exceeds the approved range, an abnormal signal is generated.

[0052] When an abnormality signal is generated, the specified time is traced back. The specified time satisfies the start time of the traceback, and the real-time operating voltage is obtained every T1 time interval. 10 sets of real-time operating voltages before the abnormality signal is generated can be continuously obtained.

[0053] Then, when the abnormal signal is generated, the real-time operating voltage at that time point is obtained;

[0054] Then, 10 groups of real-time operating voltages are obtained after the abnormal signal is generated, and 21 values ​​of real-time operating voltages are obtained, which are marked as operating voltage groups D i, i=1, ..., 20;

[0055] The follow-up analysis unit is used to transmit the abnormal signal and the operating voltage group Di to the processor. When the processor receives the abnormal signal, it will transmit the operating voltage group Di to the data re-division unit. The data re-division unit is used to perform abnormal reason analysis in combination with the forward database. The forward database stores several operating voltage groups corresponding to the abnormal signal of the operating voltage of the photovoltaic power station in the past year. It is marked as a standard voltage group Bj i, j=1...n, i=1...20, Bj i represents the real-time operating voltage obtained at the i-th time point in the j-th operating voltage group, and the abnormal reason of the standard voltage group is stored correspondingly, and the abnormal reason is the corresponding reason for the abnormality;

[0056] The specific method of heterogeneous analysis is as follows:

[0057] S1: Obtain an operating voltage group Di, i=1, ..., 20;

[0058] S2: Then let j = 1, and obtain the corresponding standard parameter voltage group B1 i;

[0059] S3: Calculate the numerical difference Ci using the formula. The specific calculation formula is Ci = B1 i - Di;

[0060] S4: Then obtain all the differences, and define the doubling value Fi according to the differences:

[0061] When Ci < X1, the doubling value Fi is 1;

[0062] When X1 ≤ Ci ≤ X2, the doubling value Fi is 1.3;

[0063] When Ci > X2, the doubling value Fi is 1.7; Both X1 and X2 are preset values;

[0064] S5: Then calculate the difference shadow value Yi using the formula Yi = Ci × Fi. Then automatically calculate the average value of Yi, and mark it as the core difference value H1 of the corresponding standard parameter voltage group B1 i when j = 1;

[0065] S6: Then increment the value of j by one, and repeat steps S3 - S6. After processing all the standard parameter voltage groups Bj i, obtain the core difference values Hj of all the standard parameter voltage groups Bj i;

[0066] S7: Then mark the origin of the abnormality of the corresponding standard parameter voltage group with Hj less than X3 as the potential reason, and mark the potential reason corresponding to the smallest Hj as the first - recommended reason. If there is no Hj less than X3, generate a no - reason verification signal;

[0067] S8: Obtain the first - recommended reason, potential reasons, or no - reason verification signal;

[0068] The management unit is communicatively connected to the processor and is used for inputting all the preset values.

[0069] The data re - division unit is used to transmit the first - recommended reason, potential reasons, or no - reason verification signal to the intelligent notification unit, and the intelligent notification unit is used to transmit the first - recommended reason, potential reasons, or no - reason verification signal to the administrator terminal; facilitating the administrator to repair or troubleshoot the reasons.

[0070] As the second embodiment of the present invention, on the basis of the first embodiment, the difference from the first embodiment is that:

[0071] The specific manner of abnormality analysis is different:

[0072] S1: Obtain the operating voltage group Di, where i = 1,..., 20;

[0073] S2: Then set j=1 and obtain the corresponding standard voltage group B1 i;

[0074] S3: Calculate the numerical difference Ci using a formula, the specific calculation formula is Ci=B1 i-Di;

[0075] S4: automatically calculate the mean of the difference values ​​Ci and mark it as P;

[0076] S5: Then, the deviation W1 of the difference Ci is calculated using the formula. The specific calculation formula is:

[0077]

[0078] S6: Then, let the value of j increase by 1, repeat steps S3-S6, and complete the processing of all standard parameter voltage groups Bj i, and then obtain the deviation Wj of all standard parameter voltage groups Bj i;

[0079] S7: Mark the deviation cause of the corresponding reference voltage group whose deviation Wj is less than X3 as a potential cause, and mark the potential cause corresponding to the smallest deviation Wj as the first recommended cause. If there is no deviation Wj less than X3, a no-reason verification signal is generated;

[0080] S8: Get the first reason, potential reason or no reason verification signal.

[0081] Some of the data in the above formula are calculated by removing the dimensions and taking their numerical values. The formula is a formula that is closest to the actual situation obtained by software simulation of a large amount of collected data; the preset parameters and preset thresholds in the formula are set by technical personnel in this field according to actual conditions or obtained through simulation of a large amount of data.

[0082] The above embodiments are only used to illustrate the technical method of the present invention rather than to limit it. Although the present invention has been described in detail with reference to the preferred embodiments, those skilled in the art should understand that the technical method of the present invention may be modified or replaced by equivalents without departing from the spirit and scope of the technical method of the present invention.

Claims

1. A photovoltaic power generation operating voltage self-test system, characterized in that: Including: A voltage acquisition unit, which is used to monitor the operating voltage of photovoltaic power generation in real time and mark it as the real-time operating voltage. The voltage acquisition unit is used to transmit the real-time operating voltage to the follow-up analysis unit. The follow-up analysis unit receives the real-time operating voltage transmitted by the voltage acquisition unit and conducts follow-up analysis. When the real-time operating voltage exceeds the approved range, a difference signal is generated, and the values of 10 groups of real-time operating voltages before and after the generation of the difference signal are automatically obtained to obtain the operating voltage group Di, where i = 1,..., 20; The follow-up analysis unit is used to transmit the difference signal and the operating voltage group Di to the processor. When the processor receives the difference signal, it will transmit the operating voltage group Di to the data reclassification unit. The data reclassification unit is used to conduct abnormal origin analysis in combination with the historical database. The historical database stores several operating voltage groups obtained when the operating voltage of the photovoltaic power station showed a difference signal in the past year, which are marked as the reference voltage group Bji, where j = 1...n, i = 1...20, and Bji represents the real-time operating voltage obtained at the i-th time point in the j-th operating voltage group, and the abnormal origin reason corresponding to the reference voltage group is stored, and the abnormal origin reason is the reason for the corresponding abnormality; The abnormal origin analysis is to judge by comparing the data of the operating voltage group Di and the reference voltage group B1i, and comparing all the differences between the two, and it is obtained that the data attributes of the operating voltage group Di and the reference voltage group B1i are more similar, and the first recommended reason, potential reason or no-reason verification signal is generated accordingly; The data reclassification unit is used to transmit the first recommended reason, potential reason or no-reason verification signal to the intelligent notification unit, and the intelligent notification unit is used to transmit the first recommended reason, potential reason or no-reason verification signal to the administrator terminal; The specific method of abnormal analysis is as follows: S1: Obtain the operating voltage group Di, where i = 1,..., 20; S2: Then let j = 1 and obtain the corresponding reference voltage group B1i; S3: Use the formula to calculate the difference value Ci, and the specific calculation formula is Ci = B1i - Di; S4: Then obtain all the differences, and define the doubling value Fi according to the differences: When Ci < X1, the doubling value Fi is 1; When X1 ≤ Ci ≤ X2, the doubling value Fi is 1.3; When Ci > X2, the doubling value Fi is 1.7; X1 and X2 are both preset values; S5: Then use the formula to calculate the difference shadow value Yi, Yi = Ci × Fi, and then automatically calculate the mean value of Yi, which is marked as the core difference value H1 of the reference voltage group B1i corresponding to j = 1; S6: Then increase the value of j by one, repeat steps S3 - S6, and after processing all the reference voltage groups Bji, obtain the core difference values Hj of all the reference voltage groups Bji; S7: Then mark the abnormal origin reason of the reference voltage group corresponding to Hj less than X3 as the potential reason, mark the potential reason corresponding to the smallest Hj as the first recommended reason, and if there is no Hj less than X3, generate a no-reason verification signal; S8: Obtain the first recommended reason, potential reason or no-reason verification signal; The specific method of abnormal origin analysis is different: S1: Obtain an operating voltage group Di, i=1, ..., 20; S2: Then set j=1 and obtain the corresponding standard voltage group B1 i; S3: Calculate the numerical difference Ci using a formula, the specific calculation formula is Ci=B1 i-Di; S4: automatically calculate the mean of the difference values ​​Ci and mark it as P; S5: Then, the deviation W1 of the difference Ci is calculated using the formula. The specific calculation formula is: S6: Then, let the value of j increase by 1, repeat steps S3-S6, and complete the processing of all standard parameter voltage groups Bji, and then obtain the deviation Wj of all standard parameter voltage groups Bji; S7: Mark the deviation cause of the corresponding reference voltage group whose deviation Wj is less than X3 as a potential cause, and mark the potential cause corresponding to the smallest deviation Wj as the first recommended cause. If there is no deviation Wj less than X3, a no-reason verification signal is generated; S8: Get the first reason, potential reason or no reason verification signal.

2. A photovoltaic power generation operating voltage self-test system according to claim 1, characterized in that: The specific method of follow-up analysis is as follows: The approved range of operating voltage is stored in the follow-up analysis unit; Then, the real-time operating voltage is obtained and compared with the approved range. When the real-time operating voltage exceeds the approved range, an abnormal signal is generated. When an abnormal signal is generated, the specified time is traced back to continuously obtain 10 sets of real-time operating voltages before the abnormal signal is generated; Then, when the abnormal signal is generated, the real-time operating voltage at that time point is obtained; Then, 10 groups of real-time operating voltages are obtained after the abnormal signal is generated, and 21 values ​​of the real-time operating voltages are obtained, which are marked as operating voltage groups Di, i=1, . . . , 20.

3. A photovoltaic power generation operating voltage self-test system according to claim 2, characterized in that: The approved range is pre-entered by an administrator.

4. A photovoltaic power generation operating voltage self-test system according to claim 2, characterized in that: The specified time meets the requirement of obtaining the real-time operating voltage once every T1 time interval starting from the initial time of the backtracking, and 10 sets of real-time operating voltages before the time when the abnormal signal is generated can be continuously obtained.

5. The photovoltaic power generation operation voltage self-test system according to claim 1, characterized in that: It also includes a management unit that is in communication with the processor and is used to enter all preset values.

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