A server whole machine stress testing method, system, device and storage medium

Abstract

The present invention proposes a method, system, device, and storage medium for stress testing a server as a whole. The method includes: setting up a test environment; identifying the current server model; using a preset stress test tool to fully stress test the main functional equipment of the current server model, and dynamically allocating resources to stress other functional equipment; adjusting the resource allocation of functional equipment according to actual needs and performing stress testing; collecting stress test data, and determining the stress test results of the whole machine based on the test data. The present invention can prioritize the allocation of stress resources and dynamically and reasonably allocate the remaining resources according to the different application scenarios of different models to ensure that the final stress test results of the whole machine are reasonable and effective.

Description

Technical Field

[0001] The present invention relates to the field of computer technology, and more particularly to a server whole machine stress testing method, system, device and storage medium. Background Art

[0002] With the advent of the era of big data and artificial intelligence, the stable operation of servers plays a vital role in data storage and computing. Server crashes are common in all walks of life, which not only affects the overall operation of the company but also requires professional maintenance. Even worse, direct server replacement can cause huge losses if some very important data is being processed in real time. If the server can ensure sufficient stability, the above situation can be avoided.

[0003] The lifecycle of a server can be roughly divided into two stages: development and maintenance. General-purpose servers are mainly divided into two types: storage and computing. During the development stage, server stability testing is a very important step, mainly including power on and off and overall stress testing. The modules of overall stress testing mainly include CPU, memory, hard disk, and PCIE devices.

[0004] Currently, the commonly used whole-machine stress testing method simultaneously stresses all servers' CPUs, memory, hard drives, and PCIe devices. As long as the server doesn't crash, the stress test is considered passed. This approach doesn't consider the proper allocation of resources or the actual application scenarios of each server model. However, because existing technical solutions fail to properly and effectively stress servers based on server type and actual application, all full-machine stress testing is standardized. This results in final test data that doesn't match the server model and actual application scenarios, making it useless as a reference. Summary of the Invention

[0005] In response to the above problems, the purpose of the present invention is to provide a server whole-machine stress testing method, system, device and storage medium, which can prioritize the allocation of stress resources and dynamically and reasonably allocate the remaining resources according to the different application scenarios of different models, so as to ensure that the final results of the whole-machine stress test are reasonable and effective.

[0006] To achieve the above-mentioned purpose, the present invention is implemented through the following technical solutions: A server whole machine stress testing method, comprising:

[0007] Set up a test environment;

[0008] Identify the model of the current server;

[0009] Use the preset stress test tool to fully stress test the main functional equipment of the current server model, and dynamically allocate resources to stress other functional equipment;

[0010] Adjust resource allocation of functional equipment according to actual needs and conduct stress testing;

[0011] Collect pressure test data and determine the pressure test results of the entire machine based on the test data.

[0012] Furthermore, the building of the test environment includes:

[0013] Install the operating system, and install the preset stress test tool and corresponding drivers.

[0014] Furthermore, the preset pressure test tool includes:

[0015] fio tool, ptu tool and memtseter tool.

[0016] Furthermore, the models of the current server include storage models and computer models.

[0017] Furthermore, the method of using a preset stress test tool to perform full stress testing on the main functional equipment of the current server model and dynamically allocating resources to stress other functional equipment includes:

[0018] If the current server is a storage device, use the fio tool to fully pressurize the storage device;

[0019] The remaining resources are dynamically allocated to the CPU, memory, and PCIE devices, and stepless speed increase is performed based on the simulation of actual application scenarios.

[0020] Furthermore, the method of using a preset stress test tool to perform full stress testing on the main functional equipment of the current server model and dynamically allocating resources to stress other functional equipment includes:

[0021] If the current server is a computer type, use the ptu tool and memtester tool to fully pressure the CPU and memory;

[0022] Dynamically allocate the remaining resources to storage devices and PCIE devices, and perform stress testing.

[0023] Furthermore, adjusting resource allocation of functional devices according to actual needs and performing stress testing include:

[0024] If the current server is a storage model and is a customized model, after the storage device is fully pressurized, the remaining resources will be allocated to the PCIE device;

[0025] If the current server is a computer type and is customized for the customer, after the CPU and memory are slowly pressured, the remaining resources will be allocated to the storage device.

[0026] Accordingly, the present invention also discloses a server whole machine stress testing system, comprising:

[0027] Prepare modules for setting up the test environment;

[0028] Identification module, used to identify the model of the current server;

[0029] The stress test module is used to perform full stress testing on the main functional equipment of the current server using the preset stress test tool according to the current server model, and dynamically allocate resources to stress other functional equipment;

[0030] The adjustment module is used to adjust the resource allocation of functional equipment according to actual needs and perform pressure testing; the test result generation module is used to collect pressure test data and determine the pressure test results of the entire machine based on the test data.

[0031] Accordingly, the present invention discloses a server whole machine stress testing device, comprising:

[0032] Memory, used for storing server whole machine stress test program;

[0033] A processor is used to implement the steps of the server whole machine stress testing method as described in any one of the above items when executing the server whole machine stress testing program.

[0034] Accordingly, the present invention discloses a readable storage medium, on which a server whole machine stress testing program is stored. When the server whole machine stress testing program is executed by a processor, the steps of the server whole machine stress testing method as described in any one of the above items are implemented.

[0035] Compared with the existing technology, the beneficial effect of the present invention is that: the present invention discloses a server whole machine stress testing method, system, device and storage medium, which realizes that when performing whole machine stress testing on different types of servers, each functional device is reasonably dynamically pressurized according to the actual application scenario, and resources are reasonably allocated, so that the final test pressure data has actual reference value, thereby ensuring the stable operation of the machine.

[0036] It can be seen that compared with the prior art, the present invention has outstanding substantial features and significant progress, and the beneficial effects of its implementation are also obvious. BRIEF DESCRIPTION OF THE DRAWINGS

[0037] In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the following briefly introduces the drawings required for use in the embodiments or the description of the prior art. Obviously, the drawings described below are merely embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on the provided drawings without paying any creative work.

[0038] Figure 1 It is a method flow chart of a specific embodiment of the present invention.

[0039] Figure 2 It is a system structure diagram of a specific implementation method of the present invention.

[0040] In the figure, 1. Preparation module; 2. Identification module; 3. Pressure test module; 4. Adjustment module; 5. Test result generation module. DETAILED DESCRIPTION

[0041] The core of this invention is to provide a method for stress testing a server as a whole. Existing methods stress-test all servers simultaneously, applying pressure to the CPU, memory, hard drive, and PCIE devices. As long as the server does not crash, the stress test is considered passed. This approach fails to consider the proper allocation of resources or the actual application scenarios of each server model. However, because existing technical solutions fail to rationally and effectively stress servers based on server type and actual application, all server stress tests are standardized. This results in the final test data being mismatched with the server model and actual application scenarios, making it of no reference value.

[0042] The server whole-machine stress testing method provided by the present invention first sets up the test environment, including installing the system and related tools and drivers. It then performs a full stress test on the main functional devices according to the machine model. The remaining resources are dynamically allocated and pressurized according to actual needs. Finally, the stability is determined based on the test results. This shows that the present invention can prioritize the allocation of stress resources and dynamically and reasonably allocate the remaining resources according to the different application scenarios of different machine models, ensuring that the final whole-machine stress test results are reasonable and effective.

[0043] In order to enable those skilled in the art to better understand the present invention, the present invention is further described in detail below with reference to the accompanying drawings and specific embodiments. Obviously, the embodiments described are only some embodiments of the present invention, not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative work are within the scope of protection of the present invention.

[0044] Example 1:

[0045] like Figure 1 As shown, this embodiment provides a server whole machine stress testing method, including the following steps:

[0046] S1: Set up the test environment.

[0047] Specifically, install the operating system, and install the preset stress test tool and corresponding driver.

[0048] Among them, the preset pressure testing tools include but are not limited to the fio tool, the ptu tool and the memtseter tool.

[0049] S2: Identify the model of the current server.

[0050] It should be noted that the current server models include storage models, computer models and other special models.

[0051] S3: Use the preset stress test tool to fully stress test the main functional equipment of the current server model, and dynamically allocate resources to stress other functional devices.

[0052] Specifically:

[0053] If the current server model is a storage device, the actual application should primarily focus on data storage. First, use the fio tool to fully pressurize the storage device to ensure maximum storage resource utilization. Then, dynamically allocate the remaining resources to the CPU, memory, and PCIe devices. Dynamic allocation here means that the pressure is not fixed, but rather continuously variable based on the actual application scenario, resulting in a wave-like resource allocation to simulate the actual application scenario.

[0054] If the current server model is a computer type, the actual application should be mainly data processing. First, use the ptu tool and memtester tool to fully pressurize the CPU and memory to ensure the highest utilization of storage device resources, and then dynamically allocate the remaining resources to the storage device and PCIE device.

[0055] S4: Adjust resource allocation of functional equipment according to actual needs and perform stress testing.

[0056] Specifically, if the current server is a storage-based model and is customized for the customer, and the customer's actual needs require a large number of PCIE devices, after fully stressing the storage, the remaining resources will be allocated as much as possible to the PCIE devices. If the current server is a computer-based model and is customized for the customer, and the customer's actual needs require a large number of storage devices, after slowly stressing the CPU and memory, the remaining resources will be allocated as much as possible to the storage devices. These adjustments ensure that the entire server is properly stressed and can simulate actual application scenarios, making the test results more valuable.

[0057] S5: Collect pressure test data and determine the pressure test result of the whole machine based on the test data.

[0058] It should be noted that the whole machine stress test result can be determined by comparing the test data with the corresponding test data threshold.

[0059] This embodiment provides a server whole-machine stress testing method, which realizes that when performing whole-machine stress testing on different types of servers, each functional device is reasonably dynamically pressurized according to the actual application scenario, and resources are reasonably allocated, so that the final test pressure data has actual reference value, thereby ensuring the stable operation of the machine.

[0060] Example 2:

[0061] Based on Example 1, Figure 2 As shown, the present invention also discloses a server whole machine pressure testing system, including: a preparation module 1, an identification module 2, a pressure testing module 3, an adjustment module 4 and a test result generation module 5.

[0062] Prepare module 1 to build a test environment.

[0063] The preparation module 1 is specifically used to: install the operating system, and install the preset stress test tool and corresponding driver.

[0064] Identification module 2 is used to identify the model of the current server.

[0065] The pressure test module 3 is used to perform full pressure testing on the main functional equipment of the current server using a preset pressure tool according to the current server model, and dynamically allocate resources to pressure other functional devices.

[0066] The stress test module 3 is specifically used to: If the current server is a storage model, fully stress the storage device using the fio tool; dynamically allocate the remaining resources to the CPU, memory, and PCIE devices, and perform stepless stress testing based on simulated actual application scenarios. If the current server is a computer model, fully stress the CPU and memory using the ptu tool and memtester tool; dynamically allocate the remaining resources to the storage device and PCIE devices, and perform stress testing.

[0067] Adjustment Module 4 is used to adjust resource allocation for functional devices based on actual needs and perform stress testing. Specifically, if the current server is a storage-based and customized model, after fully stressing the storage device, adjust the remaining resources to the PCIE device. If the current server is a computer-based and customized model, adjust the remaining resources to the storage device after slowly stressing the CPU and memory.

[0068] The test result generating module 5 is used to collect the pressure test data and determine the whole machine pressure test result according to the test data.

[0069] This embodiment provides a server whole-machine stress testing system that can, when defining different types of servers for whole-machine stress testing, reasonably and dynamically pressurize each functional device according to the actual application scenario and reasonably allocate resources, so as to achieve the purpose of ensuring that the final test pressure data has actual reference value, thereby ensuring the stable operation of the server in the later stage.

[0070] Example 3:

[0071] This embodiment discloses a server whole machine stress testing device, comprising a processor and a memory; wherein the processor implements the following steps when executing a server whole machine stress testing program stored in the memory:

[0072] 1. Build a test environment.

[0073] 2. Identify the model of the current server.

[0074] 3. Use the preset stress test tool to perform full stress test on the main functional equipment according to the current server model, and dynamically allocate resources to stress other functional equipment.

[0075] 4. Adjust resource allocation of functional equipment according to actual needs and conduct stress testing.

[0076] 5. Collect stress test data and determine the whole machine stress test result based on the test data. Furthermore, the server whole machine stress test device in this embodiment may also include:

[0077] The input interface is used to obtain a server whole machine stress test program imported from the outside and save the obtained server whole machine stress test program to the memory. It can also be used to obtain various instructions and parameters transmitted by an external terminal device and transmit them to the processor so that the processor can use the above various instructions and parameters to carry out corresponding processing. In this embodiment, the input interface can specifically include but is not limited to a USB interface, a serial interface, a voice input interface, a fingerprint input interface, a hard disk read interface, etc.

[0078] The output interface is used to output various data generated by the processor to the terminal device connected to it, so that other terminal devices connected to the output interface can obtain various data generated by the processor. In this embodiment, the output interface can specifically include but is not limited to a USB interface, a serial interface, etc.

[0079] The communication unit is used to establish a remote communication connection between the server whole machine stress testing device and the external server so that the server whole machine stress testing device can mount the image file to the external server. In this embodiment, the communication unit may specifically include but is not limited to a remote communication unit based on wireless communication technology or wired communication technology.

[0080] The keyboard is used to obtain various parameter data or instructions input by the user by tapping the keycaps in real time.

[0081] The display is used to display relevant information of the server power supply line short circuit locating process in real time.

[0082] The mouse can be used to assist users in inputting data and simplify user operations.

[0083] Example 4:

[0084] This embodiment also discloses a readable storage medium, which includes random access memory (RAM), internal memory, read-only memory (ROM), electrically programmable ROM, electrically erasable programmable ROM, registers, hard disks, removable hard disks, CD-ROMs, or any other form of storage medium known in the art. The readable storage medium stores a server whole-machine stress test program, which, when executed by a processor, implements the following steps:

[0085] 1. Build a test environment.

[0086] 2. Identify the model of the current server.

[0087] 3. Use the preset stress test tool to perform full stress test on the main functional equipment according to the current server model, and dynamically allocate resources to stress other functional equipment.

[0088] 4. Adjust resource allocation of functional equipment according to actual needs and conduct stress testing.

[0089] 5. Collect pressure test data and determine the pressure test results of the whole machine based on the test data.

[0090] In summary, the present invention can prioritize the allocation of pressure resources and dynamically and reasonably allocate the remaining resources according to different application scenarios of different models, so as to ensure that the final result of the whole machine pressure test is reasonable and effective.

[0091] The various embodiments in this specification are described in a progressive manner, with each embodiment focusing on its differences from the other embodiments. References to the same or similar parts between the various embodiments are sufficient. The methods disclosed in the embodiments are described briefly because they correspond to the systems disclosed in the embodiments. For relevant details, refer to the method description.

[0092] Professionals may further appreciate that the units and algorithm steps of each example described in conjunction with the embodiments disclosed herein can be implemented in electronic hardware, computer software, or a combination of the two. In order to clearly illustrate the interchangeability of hardware and software, the above description has generally described the components and steps of each example according to their functions. Whether these functions are performed in hardware or software depends on the specific application and design constraints of the technical solution. Professionals and technicians may use different methods to implement the described functions for each specific application, but such implementation should not be considered beyond the scope of the present invention.

[0093] In the several embodiments provided by the present invention, it should be understood that the disclosed systems, systems and methods can be implemented in other ways. For example, the system embodiments described above are merely illustrative. For example, the division of the units is merely a logical function division. In actual implementation, there may be other division methods, such as multiple units or components can be combined or integrated into another system, or some features can be ignored or not executed. In addition, the mutual coupling or direct coupling or communication connection shown or discussed can be through some interfaces, indirect coupling or communication connection of systems or units, which can be electrical, mechanical or other forms.

[0094] The units described as separate components may or may not be physically separate, and the components shown as units may or may not be physical units, that is, they may be located in one place or distributed across multiple network units. Some or all of these units may be selected to achieve the purpose of this embodiment according to actual needs.

[0095] In addition, the functional modules in the various embodiments of the present invention may be integrated into one processing unit, or each module may exist physically separately, or two or more modules may be integrated into one unit.

[0096] Similarly, each processing unit in each embodiment of the present invention may be integrated into one functional module, or each processing unit may exist physically, or two or more processing units may be integrated into one functional module.

[0097] The steps of the methods or algorithms described in conjunction with the embodiments disclosed herein may be implemented directly using hardware, a software module executed by a processor, or a combination of the two. The software module may be placed in a random access memory (RAM), internal memory, read-only memory (ROM), electrically programmable ROM, electrically erasable programmable ROM, registers, a hard disk, a removable disk, a CD-ROM, or any other form of storage medium known in the art.

[0098] Finally, it should be noted that, in this document, relational terms such as first and second, etc., are used only to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply any actual relationship or order between these entities or operations. Moreover, the terms "comprises," "comprising," or any other variations thereof are intended to cover non-exclusive inclusion, such that a process, method, article, or device comprising a series of elements includes not only those elements, but also other elements not explicitly listed, or elements inherent to such process, method, article, or device. In the absence of further limitations, an element defined by the phrase "comprising a ..." does not exclude the presence of additional identical elements in the process, method, article, or device comprising the element.

[0099] The above is a detailed introduction to the server whole machine stress testing method, system, device and readable storage medium provided by the present invention. This article uses specific examples to illustrate the principles and implementation methods of the present invention. The description of the above embodiments is only used to help understand the method of the present invention and its core idea. It should be pointed out that for ordinary technicians in this technical field, without departing from the principles of the present invention, the present invention can also be improved and modified. These improvements and modifications also fall within the scope of protection of the claims of the present invention.

Claims

1. A server whole machine stress testing method, characterized in that: include: Set up a test environment; Identify the model of the current server; Use the preset stress test tool to fully stress test the main functional equipment of the current server model, and dynamically allocate resources to stress other functional equipment; Adjust resource allocation of functional equipment according to actual needs and conduct stress testing; Collect pressure test data and determine the whole machine pressure test results based on the test data; The models of the current server include storage models and computer models; The method of using a preset stress test tool to fully stress test the main functional equipment of the current server model and dynamically allocate resources to stress other functional equipment includes: If the current server is a storage model, use the fio tool to fully pressurize the storage device; dynamically allocate the remaining resources to the CPU, memory, and PCIE devices, and perform stepless speed pressurization based on the simulation of actual application scenarios; If the current server is a computer type, use the ptu tool and memtester tool to fully pressure the CPU and memory; dynamically allocate the remaining resources to storage devices and PCIE devices, and perform pressure testing; Adjusting resource allocation of functional equipment according to actual needs and conducting stress testing include: If the current server is a storage model and is a customized model, after the storage device is fully pressurized, the remaining resources will be allocated to the PCIE device; If the current server is a computer type and is customized for the customer, after the CPU and memory are slowly pressured, the remaining resources will be allocated to the storage device.

2. The server whole machine stress testing method according to claim 1, characterized in that: The test environment construction includes: Install the operating system, and install the preset stress test tool and corresponding drivers.

3. The server whole machine stress testing method according to claim 2, characterized in that: The preset pressure testing tool includes: fio tool, ptu tool and memtseter tool.

4. A server whole machine stress testing system, characterized in that: include: Prepare modules for setting up the test environment; Identification module, used to identify the model of the current server; The stress test module is used to perform full stress testing on the main functional equipment of the current server using the preset stress test tool according to the current server model, and dynamically allocate resources to stress other functional equipment; The adjustment module is used to adjust the resource allocation of functional equipment according to actual needs and perform stress testing; The test result generation module is used to collect pressure test data and determine the pressure test result of the whole machine based on the test data; The models of the current server include storage models and computer models; The pressure test module is specifically used to: If the current server is a storage model, use the fio tool to fully pressurize the storage device; dynamically allocate the remaining resources to the CPU, memory, and PCIE devices, and perform stepless speed pressurization based on the simulation of actual application scenarios; If the current server is a computer type, use the ptu tool and memtester tool to fully pressure the CPU and memory; dynamically allocate the remaining resources to storage devices and PCIE devices, and perform pressure testing; The adjustment module is specifically used to: If the current server is a storage model and is a customized model, after the storage device is fully pressurized, the remaining resources will be allocated to the PCIE device; If the current server is a computer type and is customized for the customer, after the CPU and memory are slowly pressured, the remaining resources will be allocated to the storage device.

5. A server whole machine stress testing device, characterized in that: include: Memory, used for storing server whole machine stress test program; A processor is configured to implement the steps of the server whole machine stress testing method according to any one of claims 1 to 3 when executing the server whole machine stress testing program.

6. A readable storage medium, characterized in that: The readable storage medium stores a server whole machine stress testing program, and when the server whole machine stress testing program is executed by the processor, the steps of the server whole machine stress testing method according to any one of claims 1 to 3 are implemented.

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