An infrared temperature measurement method and device, electronic equipment and storage medium

By iteratively adjusting the target attribute parameters and output response in infrared temperature measurement technology, the problem of attribute parameters affecting the accuracy of temperature measurement has been solved, and higher temperature measurement accuracy has been achieved.

CN115717940BActive Publication Date: 2026-02-06HANGZHOU MICROIMAGE SOFTWARE CO LTD
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Patent Information

Application Number
CN202211357487.X
Authority / Receiving Office
CN · China
Patent Type
Patents(China)
Current Assignee / Owner
Filing Date
2022-11-01
Publication Date
2026-02-06
Estimated Expiration
2042-11-01

AI Technical Summary

Technical Problem

In existing infrared temperature measurement technologies, the attribute parameters of the target being measured affect the temperature detection results, resulting in low accuracy. Over-reliance on experience also leads to insufficient accuracy.

Method used

The initial temperature value is determined by using a first preset relationship based on preset target attribute parameters and output response. Then, the temperature value is iteratively adjusted based on the redefined target attribute parameters and output response until the difference is within a preset range, and the final temperature value is determined.

Benefits of technology

The accuracy of infrared thermometry has been improved. By iteratively adjusting the target attribute parameters, the temperature measurement gradually approaches the actual temperature value of the target, thus enhancing the precision of the measurement.

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Abstract

The application discloses an infrared temperature measurement method and device, an electronic device and a storage medium, relates to the technical field of infrared temperature measurement, and can be used for improving the accuracy of infrared temperature measurement. The method comprises the following steps: determining an initial temperature value of a target to be measured based on a preset target attribute parameter, an output response obtained through infrared detection on the target to be measured, and a first preset relationship, wherein the first preset relationship is used for representing the relationship among the output response, the target attribute parameter and the temperature value of the target to be measured; obtaining a first temperature value determined again based on the target attribute parameter corresponding to the initial temperature value, the output response and the first preset relationship; and obtaining a second temperature value determined again based on the target attribute parameter corresponding to the first temperature value determined again, the output response and the first preset relationship.
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Description

TECHNICAL FIELD

[0001] The present application relates to the technical field of infrared temperature measurement, and in particular to an infrared temperature measurement method and device, an electronic device, and a storage medium. BACKGROUND

[0002] An object with a temperature higher than absolute zero will generate infrared thermal radiation, and the higher the temperature, the greater the thermal radiation energy. Based on this, an infrared temperature measurement device is usually used to measure the thermal radiation energy of a target object, and then the temperature of the target object is obtained.

[0003] In related technologies, when using an infrared temperature measurement device to detect temperature, the attribute parameters (such as emissivity or emissivity slope) of the target object will affect the result of temperature detection. Therefore, the target attribute parameters of the target object need to be reasonably preset according to experience when measuring temperature, and temperature measurement is performed in combination with the preset target attribute parameters to improve the accuracy of infrared temperature measurement. However, this method relies too much on experience, and therefore the accuracy of temperature measurement is low. SUMMARY

[0004] The embodiments of the present application provide an infrared temperature measurement method, device, electronic device, and storage medium, which can improve the accuracy of infrared temperature measurement.

[0005] In a first aspect, the embodiments of the present application provide an infrared temperature measurement method, which includes: determining an initial temperature value of a target object based on a preset target attribute parameter, an output response obtained by performing infrared detection on the target object, and a first preset relationship, wherein the first preset relationship is used to represent the relationship between the output response, the target attribute parameter, and the temperature value of the target object; obtaining a first re-determined temperature value based on the target attribute parameter corresponding to the initial temperature value, the output response, and the first preset relationship; and obtaining a second re-determined temperature value based on the target attribute parameter corresponding to the first re-determined temperature value, the output response, and the first preset relationship.

[0006] The technical solution provided by the embodiments of the present application can bring the following beneficial effects: based on a relatively accurate temperature value (such as an initial temperature value), a target attribute parameter (such as a target attribute parameter corresponding to an initial temperature value, or a target attribute parameter corresponding to a re-determined temperature value) more accurate than a preset target attribute parameter is obtained, and then a more accurate temperature value (such as a second temperature value) can be re-determined based on the more accurate target attribute parameter. As can be seen, the embodiments of the present application take into account the problem that the accuracy of the preset target attribute parameter is low, and by improving the accuracy of the target attribute parameter, the accuracy of infrared temperature measurement is improved.

[0007] In some embodiments, the target attribute parameter is used to represent an attribute feature of the target to be measured, and the target attribute parameter includes an emissivity of the target to be measured and / or an emissivity slope of the target to be measured.

[0008] In some embodiments, the target attribute parameter corresponding to the initial temperature value and / or the target attribute parameter corresponding to the re-determined temperature value is determined based on a second preset relationship, wherein the second preset relationship is used to represent a corresponding relationship between the temperature value of the target to be measured and the target attribute parameter.

[0009] Based on this, the target attribute parameter corresponding to the initial temperature value and / or the target attribute parameter corresponding to the re-determined temperature value can be determined.

[0010] In some embodiments, the method further includes: determining the second temperature value as the target temperature value when a difference between the second temperature value and the re-determined temperature value is within a preset range.

[0011] It should be understood that if the difference between the temperature values after two consecutive temperature compensations (for example, the difference between the second temperature value and the re-determined temperature value) is within a preset range, it means that the temperature values after the two temperature compensations are already relatively close to the temperature value of the target to be measured. In addition, since the second temperature value is a value obtained on the basis of the re-determined temperature value, the second temperature value is generally more accurate, and the second temperature value is used as the target temperature value of the target to be measured.

[0012] In some embodiments, the re-determined temperature value includes the first temperature value, and the target attribute parameter corresponding to the re-determined temperature value includes the target attribute parameter corresponding to the first temperature value.

[0013] It should be understood that the first temperature value is closer to the temperature value of the target to be measured than the initial temperature value, and thus the target attribute parameter corresponding to the first temperature value is closer to the actual situation of the target attribute parameter. Therefore, when the temperature value of the target to be measured is determined based on the target attribute parameter corresponding to the first temperature value, a second temperature value that is closer to the actual situation can be obtained. Based on this, the accuracy of infrared temperature measurement is improved.

[0014] In some embodiments, the re-determined temperature value includes the last re-determined second temperature value, and the target attribute parameter corresponding to the re-determined temperature value includes the target attribute parameter corresponding to the last re-determined second temperature value.

[0015] Based on this, iterative determination of the temperature value of the target to be measured can be achieved, and thus the accuracy of infrared temperature measurement is improved.

[0016] In a second aspect, an infrared temperature measuring device is provided, comprising: a first temperature determining module configured to determine an initial temperature value of a target to be measured based on a preset target attribute parameter, an output response obtained by infrared detection on the target to be measured, and a first preset relationship, wherein the first preset relationship is configured to represent a relationship among the output response, the target attribute parameter, and the temperature value of the target to be measured; a second temperature determining module configured to obtain a first temperature value determined again based on the target attribute parameter corresponding to the initial temperature value, the output response, and the first preset relationship; and a third temperature determining module configured to obtain a second temperature value determined again based on the target attribute parameter corresponding to the first temperature value determined again, the output response, and the first preset relationship.

[0017] In some embodiments, the infrared temperature measuring device further comprises a target temperature determining module configured to determine the second temperature value as a target temperature value when a difference between the second temperature value and the first temperature value determined again is within a preset range.

[0018] In some embodiments, the target attribute parameter is configured to represent an attribute feature of the target to be measured, and the target attribute parameter comprises an emissivity of the target to be measured and / or an emissivity slope of the target to be measured.

[0019] In some embodiments, the target attribute parameter corresponding to the initial temperature value and / or the target attribute parameter corresponding to the first temperature value determined again is determined based on a second preset relationship, wherein the second preset relationship is configured to represent a corresponding relationship between the temperature value of the target to be measured and the target attribute parameter.

[0020] In some embodiments, the first temperature value determined again comprises the initial temperature value, and the target attribute parameter corresponding to the first temperature value determined again comprises the target attribute parameter corresponding to the initial temperature value.

[0021] In some embodiments, the first temperature value determined again comprises a last second temperature value determined again, and the target attribute parameter corresponding to the first temperature value determined again comprises the target attribute parameter corresponding to the last second temperature value determined again.

[0022] In a third aspect, an electronic device is provided, comprising: a memory and a processor; the memory and the processor are coupled; the memory is configured to store computer program code, and the computer program code comprises computer instructions; when the processor executes the computer instructions, the electronic device performs the infrared temperature measuring method according to the first aspect and any possible design manner thereof.

[0023] In a fourth aspect, the present application provides a computer readable storage medium, which includes computer instructions, when the computer instructions are executed on a computer (for example, an electronic device or an infrared temperature measuring device), the computer is caused to execute the method provided in the first aspect and possible implementation manners.

[0024] In a fifth aspect, the present application provides a computer program product including computer instructions, when the computer instructions are executed on a computer (for example, an electronic device or an infrared temperature measuring device), the computer is caused to execute the method provided in the first aspect and possible implementation manners.

[0025] It should be noted that the above computer instructions can be stored on a computer readable storage medium in whole or in part. The computer readable storage medium can be packaged together with the processor of the computer (for example, an electronic device or an infrared temperature measuring device), or packaged separately from the processor of the computer, and the present application does not limit this.

[0026] The specific description of the second aspect to the fifth aspect and various implementation manners thereof in the present application can refer to the detailed description in the first aspect and various implementation manners thereof. The beneficial effects of the second aspect to the fifth aspect and various implementation manners thereof can refer to the beneficial effect analysis of the first aspect and various implementation manners thereof, which will not be described here. BRIEF DESCRIPTION OF DRAWINGS

[0027] Figure 1 A structural schematic diagram of an infrared temperature measuring device according to some embodiments;

[0028] Figure 2 A flowchart of an infrared temperature measuring method according to some embodiments Figure 1 ;

[0029] Figure 3 A flowchart of an infrared temperature measuring method according to some embodiments Figure 2 ;

[0030] Figure 4 A structural schematic diagram of an infrared temperature measuring device according to some embodiments;

[0031] Figure 5 A structural schematic diagram of an electronic device according to some embodiments. DETAILED DESCRIPTION

[0032] The technical solutions in the present application will be described in detail below with reference to the drawings in the present application. Obviously, the described embodiments are only some of the embodiments of the present application, not all the embodiments. Based on the embodiments in the present application, all other embodiments obtained by those of ordinary skill in the art without creative labor fall within the scope of protection of the present application.

[0033] It should be noted that, in the present application, the words "exemplary" or "for example" are used to mean serving as an example, instance, or illustration. Any embodiment or design solution described as "exemplary" or "for example" in the present application should not be construed as preferred or advantageous over other embodiments or design solutions. Rather, the use of the words "exemplary" or "for example" is intended to present concepts in a particular manner. The terms "first", "second" are used only for descriptive purposes and should not be construed as indicating or implying relative importance or an indicated number of technical features. Therefore, features defined with "first", "second" can explicitly or implicitly include one or more of the features. In the description of the present application, the meaning of "a plurality of" is two or more, unless otherwise specified.

[0034] As described in the background, objects with temperature higher than absolute zero will generate infrared thermal radiation, and the higher the temperature, the greater the thermal radiation energy. Therefore, the size of the thermal radiation energy of the target to be measured is usually measured by using an infrared temperature measuring device, and then the temperature of the target to be measured is obtained. In the related art, when using an infrared temperature measuring device to detect temperature, considering that the attribute parameters (such as emissivity or emissivity slope) of the target to be measured will affect the result of temperature detection, the target attribute parameters of the target to be measured are preset according to experience when temperature measurement is performed, and temperature measurement is performed in combination with the preset target attribute parameters, so as to improve the accuracy of infrared temperature measurement. However, this method relies too much on experience, and therefore the accuracy of temperature measurement is low.

[0035] To this end, the embodiments of the present application provide an infrared temperature measurement method, which comprises: determining an initial temperature value of a target to be measured based on a preset target attribute parameter, an output response obtained by performing infrared detection on the target to be measured, and a first preset relationship, wherein the first preset relationship is used to represent the relationship among the output response, the target attribute parameter, and the temperature value of the target to be measured; obtaining a first re-determined temperature value based on the target attribute parameter corresponding to the initial temperature value, the output response, and the first preset relationship; and obtaining a second re-determined temperature value based on the target attribute parameter corresponding to the re-determined temperature value, the output response, and the first preset relationship.

[0036] It should be understood that the core idea of the method is that: based on a relatively accurate temperature value (such as an initial temperature value), a target attribute parameter (such as a target attribute parameter corresponding to an initial temperature value, or a target attribute parameter corresponding to a re-determined temperature value) more accurate than a preset target attribute parameter is obtained, and then a more accurate temperature value (such as a second temperature value) can be re-determined based on the more accurate target attribute parameter. As can be seen, the embodiments of the present application take into account the problem that the accuracy of the preset target attribute parameter is low, and by improving the accuracy of the target attribute parameter, the accuracy of the infrared temperature measurement is improved.

[0037] It should be noted that the temperature compensation method provided in this application can be applied to any infrared temperature measurement scenario, such as human body temperature measurement in public places like airports and train stations, and can also be applied to industrial temperature measurement scenarios. This application does not limit the specific application scenario of the infrared temperature measurement method. Furthermore, the executing entity of the infrared temperature measurement method provided in this application is not limited. For example, the method can be executed by the infrared temperature measurement device itself, such as a thermal imager, or by the control module embedded in the infrared temperature measurement device or an external processing device, or by any other device with processing and command control functions, such as a server or computer. This application does not impose any restrictions in this regard.

[0038] To facilitate the subsequent explanation, the infrared temperature measurement devices involved in some embodiments will be introduced in general below.

[0039] Please refer to Figure 1 , Figure 1 This is a schematic diagram of the structure of an infrared temperature measuring device according to some embodiments. The infrared temperature measuring device 100 includes an optical system 101, a photoelectric detection device 102, a processing device 103, and a control device 104.

[0040] The optical system 101 is connected to the photoelectric detection device 102 and is used to focus the infrared radiation energy of the target within its field of view. The size of the field of view is determined by the optical components and their positions of the infrared temperature measuring device 100. Optionally, the optical system 101 can also focus light on the target so that the target can be clearly captured.

[0041] The photoelectric detection device 102 is connected to the processing device 103 and is used to receive the effective infrared radiation energy of the target being measured gathered by the optical system 101, convert the received infrared radiation energy into a corresponding electrical signal, and transmit the converted electrical signal to the processing device 103.

[0042] The processing device 103 is connected to the control device 104 and is used to process the electrical signal converted by the photoelectric detection device 102. Optionally, the processing device 103 can amplify, filter, or quantize the electrical signal. Optionally, the processing device 103 can also quantize and encode the electrical signal into a grayscale value; further, it can perform image encoding on the grayscale value to obtain a corresponding infrared image. Optionally, the processing device 103 can also identify the captured image and determine the position of the target in the image. Optionally, the processing device 103 is also used to receive instructions from the control device 104 and perform infrared thermometry on the temperature value of the target according to the instructions from the control device 104.

[0043] The control device 104 is configured to control the operation of each component in the infrared temperature measurement device 100. In some embodiments, the control device 104 is configured to assist in performing the infrared temperature measurement method provided in the present application. The control device 104 can be a central processing unit (CPU), a graphics processing unit (GPU), a general-purpose processor network processor (NP), a digital signal processing (DSP), a microprocessor, a microcontroller, a programmable logic device (PLD), or any combination thereof. The control device 104 can also be other devices with processing functions, such as a circuit, a device, or a software module, and the present application does not limit the control device 104 in this regard.

[0044] In addition, the optical system 101, the photoelectric detection device 102, the processing device 103, and the control device 104 can be independently deployed, or one or more of the optical system 101, the photoelectric detection device 102, the processing device 103, and the control device 104 can be combined and deployed, for example, the processing device 103 and the control device 104 can be combined and deployed, and the present application does not limit the combination of the optical system 101, the photoelectric detection device 102, the processing device 103, and the control device 104 in this regard.

[0045] In some embodiments, the infrared temperature measurement device 100 further comprises a binocular distance measuring device, a monocular distance measuring device, or a radar distance measuring device (not shown in the figure) for obtaining the temperature measurement distance between the target to be measured and the infrared temperature measurement device 100.

[0046] In some embodiments, the infrared temperature measurement device 100 further comprises a display device (not shown in the figure) for displaying the temperature value of the target to be measured, or the control device 104 is integrated into a control panel so that the user can interact with the infrared temperature measurement device 100 through the control panel.

[0047] In some embodiments, the infrared temperature measurement device 100 further comprises an alarm device (not shown in the figure) for alarming when the temperature value of the target to be measured exceeds the warning temperature.

[0048] Although Figure 1 Although not shown, the above-mentioned infrared temperature measurement device can further comprise a power supply device (such as a battery and a power management chip) for supplying power to each component. The battery can be logically connected to the control device 104 through the power management chip, so as to realize the power consumption management function of the infrared temperature measurement device through the control device 104.

[0049] For ease of understanding, the infrared temperature measurement method provided in the present application is described in detail below with reference to the accompanying drawings.

[0050] Figure 2 This application presents an infrared temperature measurement method, which is applied in the field of infrared temperature measurement technology. The following example uses an infrared temperature measurement device as the executing entity. Figure 2 The method shown will be explained in detail. For example... Figure 2 As shown, the infrared temperature measurement method includes the following steps S101 to S103:

[0051] S101. Based on the preset target attribute parameters, the output response obtained by infrared detection of the target under test, and the first preset relationship, determine the initial temperature value of the target under test.

[0052] The following is a detailed introduction to the relevant concepts involved in step S101:

[0053] (1) Target to be measured

[0054] The target to be measured is the object on which the user expects the temperature to be measured.

[0055] In some embodiments, the target to be measured can be set based on the application scenario or user needs. For example, when measuring temperature in public places such as airports and train stations, the target to be measured can be the forehead or wrist of a person. In livestock farming, the target to be measured can be the neck of the livestock. In industrial temperature measurement, the target to be measured can be industrial water. This application does not impose specific limitations on the content of the target to be measured.

[0056] In some embodiments, when the infrared temperature measuring device is a device such as a temperature gun that does not have infrared imaging function, the infrared temperature measuring device is pointed at the target to be measured so as to measure the temperature of the target.

[0057] In other embodiments, when the infrared temperature measuring device is an infrared thermal imager or other device with infrared imaging capabilities, the target to be measured can be manually delineated from the infrared image generated by the infrared temperature measuring device, and then the temperature of the target to be measured can be measured based on the infrared image; or, the target to be measured can be automatically identified from the infrared image generated by the infrared temperature measuring device. For example, when measuring forehead temperature, the forehead area in the infrared image can be automatically identified as the target to be measured through a convolutional neural network, and then the temperature of the target to be measured can be measured based on the infrared image.

[0058] (2) Target attribute parameters

[0059] Target attribute parameters are used to characterize the attribute features of the target to be measured.

[0060] In some embodiments, the target attribute parameter includes an emissivity of the target to be measured, and / or an emissivity slope of the target to be measured. The emissivity of the target to be measured, also referred to as the specific radiation or emission coefficient, is used to represent the ratio of the radiation flux emitted by the target to be measured to the radiation flux of a black body at the same temperature. The emissivity slope of the target to be measured is the ratio of the emissivity of the target to be measured at two different wavelengths. For example, when colorimetric temperature measurement is performed by a two-color temperature meter, if the emissivity of the target to be measured at a first wavelength is ε1 and the emissivity of the target to be measured at a second wavelength is ε2, then the emissivity slope of the target to be measured is ε1 / ε2.

[0061] In some embodiments, the preset target attribute parameter can be a fixed value.

[0062] In other embodiments, the preset target attribute parameter can be set based on the material of the target to be measured and artificial experience. For example, the target parameter of the target to be measured can be preset based on experience based on the material of the target to be measured. For example, if the target to be measured is ceramic, the emissivity of the target to be measured can be preset to 0.92; if the target to be measured is surface-oxidized steel, the emissivity slope of the target to be measured can be preset to 1.0. It should be understood that the above-mentioned emissivity of ceramic and surface-oxidized steel is only an example, and the present application does not make specific limitations thereto.

[0063] (3) Output response

[0064] The output response is used to represent the effective infrared radiation information of the target to be measured detected when infrared detection is performed. It should be understood that the main principle of temperature measurement by the infrared temperature measurement device is to receive the effective infrared radiation of the target to be measured, convert the effective infrared radiation into an output response, and convert the temperature value of the target to be measured according to a certain relationship according to the output response.

[0065] Optionally, the output response can be a response voltage. For example, the output response can be a response voltage generated by the photodetector of the infrared temperature measurement device after receiving the effective infrared radiation of the target to be measured.

[0066] Optionally, the output response can be a gray value. For example, if the infrared temperature measurement device is an infrared thermal imager or other device with infrared imaging function, the output response can also be a gray value obtained by quantizing the response voltage. The present application does not make specific limitations on the accuracy of the quantization.

[0067] Further, the output response can also be an infrared image obtained by image encoding based on the obtained gray value.

[0068] For ease of understanding, some ways of determining the temperature value of the target to be measured based on the output response are exemplarily given below.

[0069] Exemplarily, when the output response is a gray value obtained after quantization processing, the infrared temperature measuring device has a preset relationship table between the gray value and the initial temperature value, as shown in Table 1.

[0070] Table 1

[0071] Gray value Temperature value Gray value 1 Temperature value 1 Gray value 2 Temperature value 2 Gray value 3 Temperature value 3 … … Gray value n Temperature value n

[0072] Referring to Table 1, the gray value after quantization processing corresponds to the temperature value one by one, so that the infrared temperature measuring device can determine the temperature value of the target to be measured according to the preset relationship table between the gray value and the temperature value. It should be noted that the above-mentioned preset relationship table between the gray value and the temperature value is only an example, and other temperature value determination methods (for example, inputting the gray value into a pre-trained temperature prediction model to obtain the temperature value output by the temperature prediction model) can also exist, and the present application does not make specific limitations thereto.

[0073] Further, when the output response is an infrared image, the infrared image is obtained by image encoding based on the above-mentioned quantized gray value.

[0074] Similarly, when the output response is a response voltage, the infrared temperature measuring device has a preset relationship table between the response voltage and the temperature value, so that the infrared temperature measuring device can determine the temperature value of the target to be measured according to the preset relationship table between the response voltage and the temperature value. It should be understood that when the output response is a response voltage, the specific determination method of the temperature value can refer to the description of the output response being a gray value, which will not be described here.

[0075] It should be noted that since when the infrared temperature measuring device is used to measure the temperature to be measured, some environmental factors (such as ambient temperature, etc.) and / or the attribute characteristics (such as emissivity, etc.) of the target to be measured will interfere with the effective infrared radiation amount of the target to be measured received by the infrared temperature measuring device, the output response can be corrected based on the environmental parameters and / or target attribute parameters, and then the temperature value of the target to be measured is determined. The following first preset relationship determines the temperature value of the target to be measured at least considering the target attribute parameters and the output response.

[0076] (4) First preset relationship

[0077] The first preset relationship is used to represent the relationship between the output response, the target attribute parameter and the temperature value of the target to be measured.

[0078] In the case of only considering the influence of the target attribute parameter on the output response, the first preset relationship can include: the value condition of at least one target attribute parameter and the output response, and the temperature value corresponding to each target attribute parameter and the output response in the value condition of at least one target attribute parameter and the output response.

[0079] Exemplarily, the step S101 can be specifically implemented as: establishing a first mathematical relationship model among an output response, a target attribute parameter of the to-be-measured target, and a temperature value of the to-be-measured target; inputting the output response obtained by performing infrared detection on the to-be-measured target and the preset target attribute parameter of the to-be-measured target into the first mathematical relationship model to obtain an initial temperature value of the to-be-measured target.

[0080] For example, if the target attribute parameter includes an emissivity of the to-be-measured target, the initial temperature value can satisfy the following relationship:

[0081] T0=f(V out ,ε)

[0082] wherein T0 is the initial temperature value of the to-be-measured target, V out is the output response of the infrared temperature measuring device, and ε is the preset emissivity of the to-be-measured target.

[0083] For another example, if the target attribute parameter includes an emissivity slope of the to-be-measured target, the initial temperature value can satisfy the following relationship:

[0084] T0=f(V out ,R)

[0085] wherein T0 is the initial temperature value of the to-be-measured target, V out is the output response of the infrared temperature measuring device, and R is the preset emissivity slope of the to-be-measured target.

[0086] In addition, the step S101 can also be specifically implemented as: training a first temperature determination model by deep learning or convolutional neural network; inputting the output response obtained by performing infrared detection on the to-be-measured target and the preset target attribute parameter of the to-be-measured target into the first temperature determination model to obtain the initial temperature value of the to-be-measured target.

[0087] Optionally, the first temperature determination model can be trained in the following manner: obtaining a sample set, the sample set including a plurality of samples, each sample corresponding to a true value of an output response, a true value of a target attribute parameter, and a real temperature value of a to-be-measured target when the to-be-measured target is detected by infrared detection once; for each sample, inputting the true value of the output response and the true value of the target attribute parameter in the sample into the first temperature determination model to be trained to obtain a temperature prediction value of the sample; obtaining an error of the sample according to the temperature prediction value of the sample and the real temperature value of the to-be-measured target in the sample; and further performing error back propagation based on the error of each sample in the sample set, and continuously training the first temperature determination model until a preset training termination condition is met to obtain the trained first temperature determination model.

[0088] It should be understood that the emissivity slope and emissivity of the target to be measured described above are merely examples, and the specific content of the target attribute parameters in this application embodiment is not limited. In practical applications, other target attribute parameters may also exist, and those skilled in the art can easily conceive of substituting other possible target attribute parameters into the method provided in this application embodiment to improve the accuracy of infrared thermometry.

[0089] Taking into account the influence of target attribute parameters and environmental parameters on the output response, the first preset relationship may include: the values ​​of at least one target attribute parameter, environmental parameter and output response, and the temperature values ​​corresponding to the values ​​of various target attribute parameters, environmental parameters and output response among the values ​​of at least one target attribute parameter, environmental parameter and output response.

[0090] Optionally, environmental parameters may include one or more of the following: ambient temperature, relative humidity, atmospheric visibility, altitude, or measurement distance. When the environmental parameter includes measurement distance, the measurement distance can be input by the user or measured automatically by the infrared temperature measuring device or its external devices. For example, the measurement distance between the target and the infrared temperature measuring device can be measured using ranging methods such as monocular ranging analysis, binocular ranging analysis, and lidar ranging analysis. Methods for obtaining the measurement distance can be found in relevant technical descriptions and will not be elaborated upon here.

[0091] For example, step S101 can be specifically implemented as follows: establishing a second mathematical relationship model between the output response, environmental parameters, target attribute parameters of the target to be measured, and the temperature value of the target to be measured; inputting the output response obtained by infrared detection of the target to be measured, the environmental parameters when infrared detection of the target to be measured, and the preset target attribute parameters of the target to be measured into the second mathematical relationship model to obtain the initial temperature value of the target to be measured.

[0092] For example, if the environmental parameters include ambient temperature, relative humidity, atmospheric visibility, altitude, and temperature measurement distance, and the target attribute parameters include the emissivity of the target to be measured, the above initial temperature values ​​can satisfy the following relationship:

[0093] T0=f(V out ,T env ,RH,V,H,D,ε)

[0094] Where T0 is the initial temperature value of the target to be measured, and V out For the output response of the infrared temperature measurement device, T env ε is the ambient temperature, RH is the relative humidity, V is the atmospheric visibility, H is the altitude, D is the temperature measurement distance, and ε is the preset emissivity of the target.

[0095] For example, if the environmental parameters include environmental temperature, relative humidity, atmospheric visibility, altitude, and temperature measurement distance, and the target attribute parameter includes the emissivity slope of the target to be measured, the initial temperature value can satisfy the following relationship:

[0096] T0=f(V out ,T env ,RH,V,H,D,R)

[0097] Wherein, T0 is the initial temperature value of the target to be measured, V out is the output response of the infrared temperature measurement device, T env is the environmental temperature, RH is the relative humidity, V is the atmospheric visibility, H is the altitude, D is the temperature measurement distance, and R is the preset emissivity slope of the target to be measured.

[0098] In addition, step S103 can also be specifically implemented as: obtaining a second temperature determination model by deep learning or convolutional neural network; inputting the output response obtained by infrared detection on the target to be measured, the environmental parameters when the target to be measured is detected by infrared, and the preset target attribute parameters of the target to be measured into the second temperature determination model to obtain the initial temperature value of the target to be measured.

[0099] Optionally, the second temperature determination model can be trained in the following manner: obtaining a sample set, the sample set including a plurality of samples, each sample corresponding to the true value of the output response, the true value of the environmental parameters, the true value of the target attribute parameters, and the real temperature value of the target to be measured when the target to be measured is detected by infrared once; for each sample, inputting the true value of the output response, the true value of the environmental parameters, and the true value of the target attribute parameters in the sample into the second temperature determination model to be trained to obtain the temperature prediction value of the sample; obtaining the error of the sample according to the temperature prediction value of the sample and the real temperature value of the target to be measured in the sample; and further performing error backpropagation based on the error of each sample in the sample set, and continuing to train the second temperature determination model until a preset training termination condition is met to obtain the trained second temperature determination model. It should be understood that the above-mentioned second temperature determination model can also be trained in other ways, which are not limited in the present application.

[0100] It should be noted that the above only shows that the first preset relationship is implemented in the form of a mathematical relationship model or a network model trained based on deep learning or convolutional neural network, and the first preset relationship can also be implemented in other forms (such as a preset relationship table or a preset relationship curve related to the target attribute parameters, the output response, and the temperature value of the target to be measured), which are not limited in the present application.

[0101] S102, based on the target attribute parameters corresponding to the initial temperature value, the output response, and the first preset relationship, a first temperature value is obtained.

[0102] In some embodiments, the target attribute parameter corresponding to the initial temperature value is determined based on a second preset relationship. The second preset relationship is used to represent the corresponding relationship between the temperature value of the target to be measured and the target attribute parameter. Optionally, the target attribute parameter corresponding to the initial temperature value can include one or more target attribute parameters corresponding to the initial temperature value, and the embodiments of the present application do not make specific limitations thereto. For ease of understanding, possible ways of obtaining the target attribute parameter corresponding to the initial temperature value are given as follows:

[0103] In some examples, the second preset relationship can be implemented as a preset corresponding relationship table.

[0104] Exemplarily, in the case where the target attribute parameter is emissivity, a corresponding relationship table of the temperature value of the target to be measured and the emissivity is shown in Table 2.

[0105] Table 2

[0106] Temperature value Emissivity Temperature value 1 Emissivity 1 Temperature value 2 Emissivity 2 Temperature value 3 Emissivity 3 … … Temperature value n Emissivity n

[0107] Referring to Table 2, it can be seen that the corresponding relationship table in Table 2 includes at least one temperature value, and the emissivity corresponding to each of the at least one temperature value. Optionally, the temperature value shown in Table 2 does not include the initial temperature value, and then a first interpolation temperature smaller than the initial temperature value and a second interpolation temperature greater than the initial temperature value can be determined from Table 2; the emissivity corresponding to the initial temperature value is determined based on the weighted sum of the emissivity corresponding to the first interpolation temperature and the emissivity corresponding to the second interpolation temperature. It can be understood that the emissivity in Table 2 can be replaced by other target attribute parameters, or extended to multiple target attribute parameters, and the present application does not make specific limitations thereto. Based on this, the target attribute parameter corresponding to the initial temperature value can be determined according to the initial temperature value.

[0108] In other examples, the second preset relationship can be implemented in the form of a mathematical relationship model.

[0109] Exemplarily, the target attribute parameter corresponding to the initial temperature value can be determined in the following manner: establishing a third mathematical relationship model of the target attribute parameter of the target to be measured and the real temperature value of the target to be measured, and the third mathematical relationship model is the second preset relationship described above; inputting the initial temperature value into the third mathematical model to obtain the target attribute parameter corresponding to the initial temperature value.

[0110] In yet other examples, the second preset relationship can be implemented as a network model trained based on deep learning or convolutional neural network, etc.

[0111] Exemplarily, the target attribute parameter corresponding to the initial temperature value can be determined in the following manner: based on the true value of the emissivity of the target to be measured and historical data of the true temperature value of the target to be measured, a target parameter determination model is trained by deep learning or a convolutional neural network, etc. The initial temperature value is input into the target parameter determination model to obtain the target attribute parameter corresponding to the initial temperature value. It should be understood that the training manner of the target parameter determination model is not specifically limited in the present application.

[0112] It can be seen that only the second preset relationship is shown in the form of a preset corresponding relationship table, a mathematical relationship model, or a network model trained based on deep learning or a convolutional neural network, etc. The second preset relationship can also be implemented in other forms (for example, a corresponding relationship curve of the temperature value of the target to be measured and the target attribute parameter), etc. The present application does not specifically limit this.

[0113] It should be noted that the manner of obtaining the redetermined first temperature value based on the target attribute parameter corresponding to the initial temperature value, the output response, and the first preset relationship in step S102 can refer to the manner of determining the initial temperature value of the target to be measured based on the preset target attribute parameter, the output response, and the first preset relationship in step S101. The preset target attribute parameter in step S101 is replaced by the target attribute parameter corresponding to the initial temperature value to obtain the redetermined first temperature value. Here, no further description is given.

[0114] It should be understood that since the output response can reflect the temperature characteristics of the target to be measured, and the initial temperature value is a temperature value determined according to the output response and the preset target attribute parameter, the initial temperature value is already relatively close to the actual situation of the temperature value of the target to be measured. Therefore, the target attribute parameter corresponding to the initial temperature value is more accurate than the preset target attribute parameter. Further, the temperature value of the target to be measured can be redetermined based on the output response and the target attribute parameter corresponding to the initial temperature value to obtain a more accurate first temperature value. Based on this, the accuracy of infrared temperature measurement can be improved.

[0115] S103, obtaining a redetermined second temperature value based on the target attribute parameter corresponding to the redetermined temperature value, the output response, and the first preset relationship.

[0116] The manner of obtaining the target attribute parameter corresponding to the redetermined temperature value can refer to the description of the possible manner of obtaining the target attribute parameter corresponding to the initial temperature value in step S102, which is not described here.

[0117] Further, the manner of obtaining the re-determined second temperature value based on the re-determined target property parameter corresponding to the temperature value, the output response, and the first preset relationship in step S103 can refer to the manner of determining the initial temperature value of the target to be measured based on the preset target property parameter, the output response, and the first preset relationship in step S101, and the preset target property parameter in step S101 is replaced by the re-determined target property parameter corresponding to the temperature value, so as to obtain the re-determined second temperature value. Details are not repeated here.

[0118] In some embodiments, the re-determined temperature value includes the first temperature value, and the re-determined target property parameter corresponding to the temperature value includes the target property parameter corresponding to the first temperature value.

[0119] It should be understood that the first temperature value is closer to the temperature value of the target to be measured than the initial temperature value, and thus the target property parameter corresponding to the first temperature value is closer to the actual situation of the target property parameter. Therefore, when the temperature value of the target to be measured is determined based on the target property parameter corresponding to the first temperature value, the second temperature value closer to the actual situation can be obtained. In this way, the accuracy of infrared temperature measurement is improved.

[0120] In other embodiments, the re-determined temperature value includes the last re-determined second temperature value, and the re-determined target property parameter corresponding to the temperature value includes the target property parameter corresponding to the last re-determined second temperature value. In this way, iterative determination of the temperature value of the target to be measured can be realized, and thus the accuracy of infrared temperature measurement is improved. To facilitate understanding of the iteration process, the possible implementation manner of step S103 is described in detail as follows:

[0121] Optionally, the infrared temperature measurement device can measure the temperature of the target to be measured based on a preset re-determination number. For example, when the preset re-determination number is three, since the initial temperature value is the first determined temperature value and the first temperature value is the first re-determined temperature value, step S103 can be specifically implemented as follows: obtaining the second re-determined second temperature value based on the target property parameter corresponding to the first temperature value (i.e., the first re-determined temperature value), the output response, and the first preset relationship; obtaining the third re-determined second temperature value based on the target property parameter corresponding to the second re-determined second temperature value, the output response, and the first preset relationship.

[0122] It can be seen that, for the second temperature value re-determined for the third time, the corresponding last re-determined second temperature value is the second temperature value re-determined for the second time. Similarly, if the preset re-determination number is greater than or equal to four, for the second temperature value re-determined for the fourth time, the corresponding last re-determined second temperature value is the second temperature value re-determined for the third time; if the preset re-determination number is greater than or equal to five, for the second temperature value re-determined for the fifth time, the corresponding last re-determined second temperature value is the second temperature value re-determined for the fourth time. Similarly, it is not repeated here.

[0123] Optionally, the infrared temperature measuring device can measure the temperature of the target based on the difference between the temperature values re-determined for two consecutive times.

[0124] Exemplarily, the step S103 can be specifically implemented as the following steps one to three:

[0125] Step one, preset i is equal to 3; based on the target attribute parameter corresponding to the first temperature value (i.e. the temperature value re-determined for the first time), the output response, and the first preset relationship, the second temperature value re-determined for the second time is obtained.

[0126] Step two, based on the target attribute parameter corresponding to the second temperature value re-determined for the i-1th time, the output response, and the first preset relationship, the second temperature value re-determined for the i th time is obtained.

[0127] Step three, when the difference between the second temperature value re-determined for the i th time and the second temperature value re-determined for the i-1th time is out of the preset range, i is added by 1, and steps two to three are repeated; or, when the difference between the second temperature value re-determined for the i th time and the second temperature value re-determined for the i-1th time is within the preset range, the loop is exited.

[0128] It can be seen that, for the second temperature value re-determined for the Nth time, the corresponding last re-determined second temperature value is the second temperature value re-determined for the N-1th time, and N is an integer greater than 2.

[0129] Based on this, the iterative determination of the temperature value of the target can be realized, and the accuracy of the infrared temperature measurement is improved. It should be understood that the above-mentioned way of measuring the temperature of the target by infrared based on the preset re-determination number or the difference between the temperature values re-determined for two consecutive times is only an example, and other implementation manners (such as a way of measuring the temperature of the target by infrared based on a preset temperature measurement time length) can also exist, and the embodiments of the present application do not make specific limitations on this.

[0130] It should be understood that, Figure 2The technical solutions shown at least have the following beneficial effects: based on a relatively accurate temperature value (for example, an initial temperature value), a target attribute parameter (for example, a target attribute parameter corresponding to the initial temperature value, or for example, a target attribute parameter corresponding to the re-determined temperature value) more accurate than a preset target attribute parameter is obtained, and then a more accurate temperature value (for example, a second temperature value) can be re-determined based on the more accurate target attribute parameter. It can be seen that the embodiments of the present application take into account the problem that the preset target attribute parameter has low accuracy, and by improving the accuracy of the target attribute parameter, the accuracy of infrared temperature measurement is improved.

[0131] In some embodiments, to obtain the temperature measurement distance, the infrared temperature measurement device can be configured to: Figure 3 As shown, the method further includes the following step S104:

[0132] S104, when the difference between the second temperature value and the re-determined temperature value is within the preset range, determining the second temperature value as the target temperature value.

[0133] It should be understood that if the difference between the two temperature compensation values (for example, the difference between the second temperature value and the re-determined temperature value) is within the preset range, it means that the temperature values after the two temperature compensations are already close to the temperature value of the target to be measured. In addition, since the second temperature value is a value obtained on the basis of the re-determined temperature value, the second temperature value is generally more accurate, and the second temperature value is used as the target temperature value of the target to be measured.

[0134] Further, after the above step S104, the method can further include outputting, storing or displaying the target temperature value. For example, the target temperature value is played by voice; for example, the target temperature value is stored in a storage device; for example, the target temperature value is displayed in the form of text on an external display device or a display device of the infrared detection device itself; for example, data of the target temperature value is sent to other devices for further processing. It should be understood that the present application does not limit the specific implementation of outputting the target temperature value. Based on this, the user can know the target temperature value or process the target temperature value as needed.

[0135] In some embodiments, the infrared temperature measurement device can also receive an instruction for setting the preset range by the user, adjust the above-mentioned preset range, and then adjust the accuracy or efficiency of the infrared temperature measurement method provided by the embodiments of the present application. It is not difficult to understand that the smaller the above-mentioned preset range, the higher the accuracy of the infrared temperature measurement; the larger the above-mentioned preset range, the faster the speed of the infrared temperature measurement, and the smaller the calculation amount. Based on this, different needs of the user can be met.

[0136] It can be seen that the above mainly introduces the scheme provided by the embodiments of the present application from the method aspect. In order to realize the above functions, the embodiments of the present application provide the corresponding hardware structure and / or software module for executing each function. Those skilled in the art should easily realize that, in combination with the modules and algorithm steps of the examples described in the embodiments disclosed in the present application, the embodiments of the present application can be realized in the form of hardware or the combination of hardware and computer software. Whether a certain function is realized in the form of hardware or computer software driving hardware depends on the specific application and design constraints of the technical solution. The skilled person can use different methods to realize the described functions for each specific application, but such implementation should not be considered beyond the scope of the present application.

[0137] As shown in Figure 4 , the embodiments of the present application provide an infrared temperature measurement device for executing the infrared temperature measurement method shown in Figure 2 . The infrared temperature measurement device 200 includes a first temperature determination module 201, a second temperature determination module 202, and a third temperature determination module 203. In some embodiments, the above-mentioned infrared temperature measurement device 200 further includes a target temperature determination module 204.

[0138] The first temperature determination module 201 is configured to determine an initial temperature value of the target to be measured based on a preset target attribute parameter, an output response obtained by infrared detection on the target to be measured, and a first preset relationship. The first preset relationship is used to represent the relationship between the output response, the target attribute parameter, and the temperature value of the target to be measured.

[0139] The second temperature determination module 202 is configured to obtain a first temperature value determined again based on the target attribute parameter corresponding to the initial temperature value, the output response, and the first preset relationship.

[0140] The third temperature determination module 203 is configured to obtain a second temperature value determined again based on the target attribute parameter corresponding to the temperature value determined again, the output response, and the first preset relationship.

[0141] The target temperature determination module 204 is configured to determine the second temperature value as a target temperature value when the difference between the second temperature value and the temperature value determined again is within a preset range.

[0142] In some embodiments, the above-mentioned target attribute parameter is used to represent the attribute feature of the target to be measured; the target attribute parameter includes the emissivity of the target to be measured and / or the emissivity slope of the target to be measured.

[0143] In some embodiments, the target attribute parameter corresponding to the initial temperature value and / or the target attribute parameter corresponding to the re-determined temperature value is determined based on a second preset relationship, wherein the second preset relationship is used to represent a corresponding relationship between the temperature value of the to-be-measured target and the target attribute parameter.

[0144] In some embodiments, the re-determined temperature value includes a re-determined first temperature value, and the target attribute parameter corresponding to the re-determined temperature value includes the target attribute parameter corresponding to the first temperature value.

[0145] In some embodiments, the re-determined temperature value includes a last re-determined second temperature value, and the target attribute parameter corresponding to the re-determined temperature value includes the target attribute parameter corresponding to the last re-determined second temperature value.

[0146] It should be noted that, Figure 4 The division of the modules in the above description is illustrative, and is only a logical function division. In actual implementation, another division manner can be used. For example, two or more functions can be integrated in one processing module. The integrated module can be realized in the form of hardware or in the form of a software function module.

[0147] In the case of realizing the functions of the integrated module in the form of hardware, the embodiment of the present application provides an electronic device involved in the above-described embodiments. As shown in the Figure 5 The electronic device 300 includes a processor 302 and a bus 304. Optionally, the electronic device can further include a memory 301, and optionally, the electronic device can further include a communication interface 303.

[0148] The processor 302 can be various exemplary logical blocks, modules and circuits described in combination with the disclosure of the present application. The processor 302 can be a central processing unit, a general purpose processor, a digital signal processor, an application specific integrated circuit, a field programmable gate array or other programmable logic device, a transistor logic device, a hardware component or any combination thereof. It can realize or execute various exemplary logical blocks, modules and circuits described in combination with the disclosure of the present application. The processor 302 can also be a combination of computing functions, such as one or more microprocessor combinations, combinations of DSP and microprocessor, etc.

[0149] The communication interface 303 is used to connect with other devices through a communication network. The communication network can be an Ethernet, a wireless access network, a wireless local area network (WLAN) and the like.

[0150] The memory 301 can be a read-only memory (ROM) or other type of static storage device that can store static information and instructions, a random access memory (RAM) or other type of dynamic storage device that can store information and instructions, an electrically erasable programmable read-only memory (EEPROM), a magnetic disk storage medium or other magnetic storage device, or any other medium that can be used to carry or store desired program code in the form of instructions or data structures and that can be accessed by a computer, but is not limited thereto.

[0151] As a possible implementation manner, the memory 301 can exist independently of the processor 302, and the memory 301 can be connected to the processor 302 through the bus 304, for storing instructions or program codes. When the processor 302 invokes and executes the instructions or program codes stored in the memory 301, the infrared temperature measurement method provided in the embodiments of the present application can be implemented.

[0152] In another possible implementation manner, the memory 301 can also be integrated with the processor 302.

[0153] The bus 304 can be an extended industry standard architecture (EISA) bus or the like. The bus 304 can be divided into an address bus, a data bus, a control bus, and the like. For the convenience of representation, Figure 5 Only one thick line is used to represent the bus in the figure, but it does not mean that there is only one bus or only one type of bus.

[0154] Through the description of the above embodiments, those skilled in the art can clearly understand that, for the convenience and brevity of description, only the above division of functional modules is taken as an example for illustration, and in actual application, the above functions can be completed by different functional modules according to needs, that is, the internal structure of the electronic device is divided into different functional modules to complete all or part of the functions described above.

[0155] Some embodiments of the present application provide a computer readable storage medium (for example, a non-transitory computer readable storage medium) having computer program instructions stored therein, and the computer program instructions, when executed on a computer (for example, an electronic device or an infrared temperature measurement device), cause the computer to execute the infrared temperature measurement method described in any one of the above embodiments.

[0156] Exemplary computer-readable storage media can include, but are not limited to, magnetic storage devices (e.g., hard disk, floppy disk, or magnetic tape), optical storage devices (e.g., compact disc (CD), digital versatile disc (DVD), etc.), smart cards, and flash memory devices (e.g., EPROM, card, stick, or key drive). The various computer-readable storage media described herein can represent one or more devices and / or other machine-readable storage media for storing information. The term "machine-readable storage medium" shall accordingly include, without being limited to, wireless channels and various other media suitable for storing, containing, and / or carrying program instructions and / or data.

[0157] The embodiments of the present application also provide a computer program product, which contains a computer program, and when the computer program product is run on a computer (e.g., an electronic device or an infrared temperature measuring device), the computer is caused to execute any one of the infrared temperature measuring methods provided in the above embodiments.

[0158] Although the present application is described herein in relation to various embodiments, it will be appreciated that those skilled in the art, on inspection of the drawings, specification, and claims, will be able to devise other embodiments of the application that lie within the spirit and scope of the application. In the claims, the word "comprising" does not exclude other elements or steps, and the indefinite articles "a" or "an" do not exclude a plurality. A single processor or other unit can fulfil the functions of several items recited in the claims. The mere fact that certain measures are recited in mutually different dependent claims does not indicate that a combination of these measures cannot be used to an advantage. The mere fact that certain aspects of the application are described in separate dependent claims does not mean that a combination of these aspects cannot be used to an advantage.

[0159] Although the present application is described in relation to particular features and embodiments thereof, it is to be understood that various other modifications and / or changes can be made by those skilled in the art without departing from the spirit and scope of the present application. Accordingly, the description and drawings are to be regarded as illustrative in nature and are to be construed as only covering the embodiments of the present application that come within the scope of the claims and their equivalents. It will be apparent to those skilled in the art that various modifications and variations can be made to the present application without departing from the spirit or scope of the application. Thus, it is intended that the present application cover the modifications and variations of this application provided they come within the scope of the appended claims and their equivalents. It is therefore intended that the present application extend to all such modifications and variations.

[0160] The above merely provides the specific implementation of the present application, but the protection scope of the present application is not limited to this. Any change or replacement within the technical scope disclosed by the present application should be covered in the protection scope of the present application. Therefore, the protection scope of the present application should be subject to the protection scope of the claims.

Claims

1. An infrared temperature measurement method, characterized by, The method comprises: determining an initial temperature value of the target to be measured based on a preset target attribute parameter, an output response obtained by infrared detection on the target to be measured, and a first preset relationship, wherein the first preset relationship is used to represent a relationship among the output response, the target attribute parameter, and the temperature value of the target to be measured; obtaining a first temperature value determined again based on the target attribute parameter corresponding to the initial temperature value, the output response, and the first preset relationship; obtaining a second temperature value determined again based on the target attribute parameter corresponding to the temperature value determined again, the output response, and the first preset relationship.

2. The method of claim 1, wherein, The target attribute parameter is used to represent an attribute feature of the target to be measured. The target attribute parameter comprises an emissivity of the target to be measured and / or an emissivity slope of the target to be measured.

3. The method of claim 1, wherein, The target attribute parameter corresponding to the initial temperature value and / or the target attribute parameter corresponding to the temperature value determined again is determined based on a second preset relationship; The second preset relationship is used to represent a corresponding relationship between the temperature value of the target to be measured and the target attribute parameter.

4. The method of claim 1, wherein, The method further comprises: determining a target temperature value as the second temperature value when a difference between the second temperature value and the temperature value determined again is within a preset range.

5. The method of claim 1, wherein, The temperature value determined again comprises the first temperature value, and the target attribute parameter corresponding to the temperature value determined again comprises the target attribute parameter corresponding to the first temperature value.

6. The method of claim 1, wherein, The temperature value determined again comprises the second temperature value determined last time, and the target attribute parameter corresponding to the temperature value determined again comprises the target attribute parameter corresponding to the second temperature value determined last time.

7. An infrared temperature measuring device, characterized by The infrared temperature measuring device further comprises a target temperature determination module, The target temperature determination module is configured to determine a target temperature value as the second temperature value when a difference between the second temperature value and the temperature value determined again is within a preset range. The target attribute parameter is used to represent an attribute feature of the target to be measured. The target attribute parameter comprises an emissivity of the target to be measured and / or an emissivity slope of the target to be measured.

8. The infrared temperature measurement device of claim 7, wherein, ​ ​ ​ ​ The target attribute parameter corresponding to the initial temperature value and / or the target attribute parameter corresponding to the re-determined temperature value is determined based on a second preset relationship, wherein the second preset relationship is used to represent a corresponding relationship between a temperature value of the to-be-measured target and a target attribute parameter; The re-determined temperature value includes the first temperature value, and the target attribute parameter corresponding to the re-determined temperature value includes the target attribute parameter corresponding to the first temperature value; and / or the re-determined temperature value includes the last re-determined second temperature value, and the target attribute parameter corresponding to the re-determined temperature value includes the target attribute parameter corresponding to the last re-determined second temperature value.

9. An electronic device, comprising: Comprise: A memory and a processor; the memory and the processor are coupled; the memory is used to store computer program code, the computer program code includes computer instructions; Wherein, when the processor executes the computer instructions, the electronic device executes the infrared temperature measurement method as claimed in any one of claims 1 to 6.

10. A computer-readable storage medium, characterized in that, The computer readable storage medium includes computer instructions; Wherein, when the computer instructions run on the computer, the computer executes the infrared temperature measurement method as claimed in any one of claims 1 to 6.

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