A parallel test system, method, electronic device, and storage medium

Abstract

Embodiments of the present application disclose a parallel test system, method, electronic device and storage medium. The system comprises a test host and N devices under test, N being an integer greater than 1; the test host is configured to set at least N host IP addresses belonging to different network segments; each of the N devices under test is configured to set at least N virtual IP addresses belonging to different network segments; the test host is configured to communicate with the N devices under test through the N host IP addresses respectively to perform a test task; wherein when the test host communicates with the devices under test, a virtual IP address adopted by an i-th device under test belongs to a network segment same as an i-th host IP address. The parallel test scheme provided by the embodiments of the present application can simply and efficiently perform parallel test on the devices under test, without complex test configuration, and greatly improves the test efficiency of network devices.

Description

TECHNICAL FIELD

[0001] The present application relates to, but is not limited to, the field of device testing, and in particular to a parallel testing system, method, electronic device and storage medium. BACKGROUND

[0002] With the rapid development of various network devices, and the increasing pressure of product manufacturing cost, customers have higher and higher requirements for product quality and testing efficiency. How to improve the production testing efficiency without reducing the testing coverage rate has become an important proposition for production manufacturing. SUMMARY

[0003] The parallel testing system, method, electronic device and storage medium provided by the embodiments of the present application can simply and efficiently perform parallel testing on related devices under test, without complex testing configuration, greatly improving the testing efficiency of network devices, and effectively guaranteeing the delivery quality of network devices.

[0004] In one aspect, the parallel testing system provided by the embodiments of the present application comprises:

[0005] a test host and N devices under test, N being an integer greater than 1;

[0006] the test host is configured to set at least N host IP addresses belonging to different network segments;

[0007] each of the N devices under test is configured to set at least N virtual IP addresses belonging to different network segments;

[0008] the test host is configured to communicate with the N devices under test through the N host IP addresses respectively to perform a testing task;

[0009] wherein, when the test host communicates with the devices under test, the network segment to which the virtual IP address sampled by the i-th device under test belongs is the same as the network segment to which the i-th host IP address belongs, i = 1, 2, …, N.

[0010] In another aspect, the parallel testing method provided by the embodiments of the present application comprises:

[0011] a test host acquires at least N host IP addresses set by itself, the N host IP addresses belonging to different network segments, N being an integer greater than 1;

[0012] the test host performs the following operations respectively for each host IP address:

[0013] according to the network segment to which the host IP address belongs, a device under test corresponding to a device IP address belonging to the same network segment is connected, and then a testing task for the device under test is performed;

[0014] The device IP address of the device under test is one of at least N virtual IP addresses set by the device under test itself.

[0015] In another aspect, the embodiments of the present disclosure also provide a parallel testing method applied to a device under test, comprising:

[0016] After the device under test is started, in the case that the running mode is a factory mode, at least N preset virtual IP addresses are loaded;

[0017] According to a host IP address in a connection request from a test host, one virtual IP address with the same network segment as the host IP address is selected from the at least N virtual IP addresses as a device IP address of the device under test;

[0018] The device IP address is used to communicate with the test host, complete a test task issued by the test host, and return a test result.

[0019] In another aspect, the embodiments of the present disclosure also provide an electronic device, comprising:

[0020] One or more processors;

[0021] A storage device configured to store one or more programs,

[0022] When the one or more programs are executed by the one or more processors, the one or more processors implement the parallel testing method described in any of the embodiments of the present disclosure.

[0023] In another aspect, the embodiments of the present disclosure also provide a computer readable storage medium having a computer program stored thereon, which, when executed by a processor, implements the parallel testing method described in any of the embodiments of the present disclosure.

[0024] The scheme provided by the embodiments of the present disclosure realizes parallel testing of multiple devices under test by using the corresponding configuration of multiple IP addresses of the test host and the devices under test, simplifies the complexity of test configuration, and improves the test efficiency.

[0025] Other aspects can be apparent to those of ordinary skill in the art after reading and understanding the accompanying drawings and detailed description. BRIEF DESCRIPTION OF DRAWINGS

[0026] In order to more clearly illustrate the technical solutions in the embodiments of the present disclosure or the prior art, the following will briefly introduce the drawings needed to be used in the embodiments or the prior art description. Obviously, the drawings in the following description are only some embodiments of the present disclosure, and for those skilled in the art, other drawings can also be obtained from the structures shown in these drawings without creative labor.

[0027] Figure 1 is a structural schematic diagram of a parallel test system provided by an embodiment of the present application;

[0028] Figure 2 is a structural schematic diagram of another parallel test system provided by an embodiment of the present application;

[0029] Figure 3 is a structural schematic diagram of another parallel test system provided by an embodiment of the present application;

[0030] Figure 4 is a structural schematic diagram of another parallel test system provided by an embodiment of the present application;

[0031] Figure 5 is a structural schematic diagram of another parallel test system provided by an embodiment of the present application;

[0032] Figure 6 is a flow chart of a parallel test method provided by an embodiment of the present application;

[0033] Figure 7 is a flow chart of another parallel test method provided by an embodiment of the present application;

[0034] Figure 8 is a flow chart of another parallel test method provided by an embodiment of the present application;

[0035] Figure 9 is a flow chart of another parallel test method provided by an embodiment of the present application;

[0036] Figure 10 is a flow chart of another parallel test method provided by an embodiment of the present application.

[0037] The implementation, functional features and advantages of the present application will be further described with reference to the embodiments and the accompanying drawings. DETAILED DESCRIPTION

[0038] The technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present application. Obviously, the described embodiments are only part of the embodiments of the present application, rather than all the embodiments of the present application. Based on the embodiments in the present application, all other embodiments obtained by those skilled in the art without creative work fall within the protection scope of the present application.

[0039] It should be noted that all directionality indications (such as up, down, left, right, front, back, etc.) in the embodiments of the present application are only used to explain the relative position relationship, movement condition, etc. between components in a certain specific posture (as shown in the drawings), and if the specific posture changes, the directionality indications also change accordingly.

[0040] In addition, the descriptions such as "first", "second" and the like in the present application are only for the purpose of description and cannot be understood as indicating or implying the relative importance of the technical features indicated or implying the number of technical features indicated. Therefore, the features defined as "first", "second" can be explicitly or implicitly included at least one of the features. In the description of the present application, the meaning of "a plurality of" is at least two, for example, two, three, etc., unless otherwise explicitly specified and limited.

[0041] In the present application, unless otherwise explicitly specified and limited, the terms "connection", "fixing" and the like should be understood broadly, for example, "fixing" can be fixed connection, or detachable connection, or integral; can be mechanical connection, or electrical connection; can be directly connected, or indirectly connected through intermediate medium, can be the internal communication of two elements or the interaction relationship of two elements, unless otherwise explicitly limited. For those skilled in the art, the specific meaning of the above terms in the present application can be understood according to the specific circumstances.

[0042] In addition, the technical solutions of various embodiments of the present application can be combined with each other, but it must be based on the fact that a person skilled in the art can realize it, when the combination of technical solutions appears contradictory or unachievable, it should be considered that the combination of technical solutions does not exist, nor within the scope of protection required by the present application.

[0043] Various network devices are widely used, in order to improve the delivery quality, in addition to the basic functions and performance tests in the production stage, before being formally delivered to the customer for production application, various personalized tests combined with customer production application scenarios are also needed. It can be seen that, with the continuous increase of various network devices in the system, the testing task before delivery is increasingly heavy, how to improve the production delivery test efficiency without reducing the test coverage is a key link to improve the device delivery efficiency.

[0044] In order to meet the efficient network device testing requirements, in the testing process, the personalized settings of each tested device need to be reduced as much as possible, and each tested device participates in the test with the default network settings. In the related scheme in the art, a special network tester is introduced, which routes and forwards related data in the process of multiple tested devices participating in the test in parallel, which obviously increases the complexity of the test scheme. The parallel test scheme provided in the embodiments of the present application uses the corresponding configuration of the multiple IP addresses of the test host and the tested device to realize the parallel test of multiple tested devices, without the need for a specially introduced test data routing device, which simplifies the test configuration complexity and improves the test efficiency.

[0045] In the embodiments of the present application, the test host is a host device for issuing test tasks, controlling the test process and collecting and recording test results, and the tested device is various network devices to be tested, such as network cameras, etc.

[0046] Embodiments of the present disclosure provide a parallel test system, as shown in Figure 1 comprising:

[0047] a test host 101 and N DUTs 102, N being an integer greater than 1;

[0048] the test host 101 is configured to set at least N host IP addresses belonging to different network segments;

[0049] each of the N DUTs 102 is configured to set at least N virtual IP addresses belonging to different network segments;

[0050] the test host 101 is configured to communicate with the N DUTs 102 respectively through the N host IP addresses to perform test tasks;

[0051] wherein, when the test host communicates with the DUTs, the virtual IP address adopted by the ith DUT belongs to the same network segment as the ith host IP address, i = 1, 2, …, N.

[0052] In some exemplary embodiments, as shown in Figure 2 further comprising:

[0053] a network switch 103;

[0054] the test host 101 comprises at least one network interface 1011;

[0055] the network interface 1011 is configured to set N IP addresses as the N host IP addresses;

[0056] each of the DUTs 102 is configured to set at least N virtual IP addresses;

[0057] the test host 101 is configured to connect the N DUTs 102 through the network switch 103, and to communicate with each DUT 102 through one of the N host IP addresses respectively to perform test tasks;

[0058] wherein, the virtual IP address adopted by the DUT 102 to communicate with the test host 101 is one selected from the at least N virtual IP addresses set by the DUT 102 itself; the N DUTs 102 select different virtual IP addresses.

[0059] In some exemplary embodiments, the network switch 103 is a layer 2 switch.

[0060] In some exemplary embodiments, the network switch 103 comprises at least N+1 network interfaces.

[0061] Taking four testing devices as an example, such as Figure 3 As shown, the test host includes one network port 1, which is configured with four host IP addresses belonging to different network segments, as shown in Table 1:

[0062] Table 1 - Test Host IP Address Settings 1

[0063]

[0064]

[0065] The four devices under test are cameras, denoted as UUT1 (Unit Under Test), UUT2, UUT3, and UUT4. Each of the four devices under test has four virtual IP addresses: 192.168.1.12, 192.168.2.12, 192.168.3.12, and 192.168.4.12. That is, each of the four devices under test has four virtual IP addresses. The network segments to which the four virtual IP addresses belong correspond one-to-one with the network segments to which the four host IP addresses belong on the test host. The test host connects via... Figure 3 The Layer 2 network switch shown connects four devices under test (DUTs). Four host IP addresses communicate with each of the four devices via their respective virtual IP addresses to execute test tasks. Specifically, host IP address 192.168.1.1 communicates with UUT1's virtual IP address 192.168.1.12 (both belonging to the same network segment); host IP address 192.168.2.1 communicates with UUT2's virtual IP address 192.168.2.12 (both belonging to the same network segment); host IP address 192.168.3.1 communicates with UUT3's virtual IP address 192.168.3.12 (both belonging to the same network segment); and host IP address 192.168.4.1 communicates with UUT4's virtual IP address 192.168.4.12 (both belonging to the same network segment).

[0066] It should be noted that N represents the number of devices for which parallel testing is simultaneously performed. M represents the maximum number of devices for which parallel testing is simultaneously supported by the parallel testing system, and M >= N. To perform parallel testing of N devices under test, the test host is configured with at least N host IP addresses within the range of M; each of the N devices under test is configured with at least N device IP addresses within the range of M. In some example embodiments, in the case of parallel testing of N devices under test, the test host is configured with L host IP addresses (M >= L > N), and each of the N devices under test is configured with P device IP addresses (M >= P > N), which is equivalent to the case where the test host is configured with N host IP addresses and each of the N devices under test is configured with N device IP addresses in terms of actual technical effects for parallel testing of N devices under test. Therefore, embodiments in which a redundant number of host IP addresses are preconfigured in the test host and / or a redundant number of device IP addresses are preconfigured in the devices under test, compared to the number N of devices under test that are actually tested in parallel each time, are equivalent to the embodiments of the present application, and are included in the patent protection scope of the present application.

[0067] It can be seen that Figure 2 the parallel testing system shown in FIG. 3 can effectively expand the number of devices under test for parallel testing by using a network switch. The number of host\device IP addresses configured in the test host and the devices under test corresponds to the expansion of the number of network ports of the network switch, that is, the number of devices under test for parallel testing can be flexibly expanded. Batch testing of devices under test can be efficiently carried out according to actual conditions.

[0068] In some example embodiments, as shown in FIG. 4, Figure 4 the test host includes N network ports 1011;

[0069] each of the N network ports 1011 is configured with one of the at least N host IP addresses;

[0070] each of the test devices is configured with at least N virtual IP addresses;

[0071] The test host 101 is configured to connect the N devices under test 102 through the N network ports 1011 respectively, and to communicate with each of the devices under test 102 using a host IP address corresponding to each network port and a virtual IP address of the device under test to perform a test task;

[0072] The virtual IP address used by the device under test 102 to communicate with the test host 101 is selected by the device under test from the at least N virtual IP addresses configured by the device under test; the virtual IP addresses selected by the N test devices are all different.

[0073] For example, in the case of four test devices, Figure 5As shown, the test host includes 4 network interfaces, and 4 network interfaces are respectively provided with 4 host IP addresses, and belong to different network segments, as shown in Table 2:

[0074] Table 2-Test host IP address setting 2

[0075] Network port IP address Subnet mask Network port 1 192.168.1.1 255.255.255.0 Network port 2 192.168.2.1 255.255.255.0 Network port 3 192.168.3.1 255.255.255.0 Network port 4 192.168.4.1 255.255.255.0

[0076] The 4 devices under test are cameras, denoted as UUT1 (Unit Under Test), UUT2, UUT3 and UUT4, and the 4 devices under test are respectively provided with 4 virtual IP addresses: 192.168.1.12, 192.168.2.12, 192.168.3.12 and 192.168.4.12. That is, each of the 4 devices under test is provided with 4 virtual IP addresses. The network segments to which the 4 virtual IP addresses belong are respectively the same as the network segments to which the 4 host IP addresses of the test host belong. The test host is connected to the 4 devices under test by using the 4 network interfaces, and the 4 host IP addresses are respectively used to communicate with the respective virtual IP addresses of the 4 devices under test to perform the test task. That is, the network interface 1 uses the host IP address 192.168.1.1 to communicate with the virtual IP address 192.168.1.12 of UUT1; the network interface 2 uses the host IP address 192.168.2.1 to communicate with the virtual IP address 192.168.2.12 of UUT2; the network interface 3 uses the host IP address 192.168.3.1 to communicate with the virtual IP address 192.168.3.12 of UUT3; and the network interface 4 uses the host IP address 192.168.4.1 to communicate with the virtual IP address 192.168.4.12 of UUT4.

[0077] It should be noted that N represents the number of devices under test that are simultaneously tested in parallel. M represents the maximum number of devices under test that are simultaneously tested in parallel supported by the parallel test system, and M >= N. To perform parallel test on N devices under test, the test host includes at least N network interfaces within the range of M; and the N devices under test are respectively provided with at least N device IP addresses within the range of M. Compared with the number N of devices under test that are actually tested in parallel each time, the test host can include a redundant number of network interfaces, and a redundant number of host IP addresses are correspondingly set, and / or the devices under test are provided with a redundant number of device IP addresses in advance, which are equivalent to the embodiments of the present application, and are included in the patent protection range of the present application.

[0078] It can be seen that, Figure 4In the parallel test system shown in FIG. 5, the use of network switches is replaced by extending the number of network interfaces of the test host, so that the networking of the test system is simpler. Meanwhile, since the DUTs are directly connected to different network interfaces of the test host, the networks are isolated from each other, each test object does not affect each other, and the DUTs and the network interfaces of the test host in different network segments are one-to-one corresponding, so that the tested device can be located more conveniently and clearly.

[0079] The parallel test method provided by the embodiments of the present disclosure is shown in FIG. 6, and includes the following steps. Figure 6

[0080] In step 601, the test host obtains at least N host IP addresses set by itself, wherein N is an integer greater than 1.

[0081] In step 602, the test host performs the following operations for each host IP address:

[0082] After establishing a connection with the DUT corresponding to the device IP address in the same network segment as the network segment to which the host IP address belongs, the test host performs a test task on the DUT.

[0083] The device IP address of the DUT is one of at least N virtual IP addresses set by the DUT itself.

[0084] In some exemplary embodiments, the test host includes at least one network interface, and the network interface of the test host is set with N IP addresses belonging to different network segments. In this case, step 601 includes that the test host obtains the N IP addresses set on one network interface of the test host as the N host IP addresses.

[0085] In some exemplary embodiments, step 602 includes that the test host selects one device virtual IP address from a preset device virtual IP address list, wherein the device virtual IP address is in the same network segment as the network segment to which the host IP address belongs.

[0086] After establishing a connection with the DUT corresponding to the selected device virtual IP address, the test host performs a test task on the DUT.

[0087] In some exemplary embodiments, after establishing a connection with the DUT corresponding to the selected device virtual IP address, step 602 of the method further includes recording the correspondence between the selected device virtual IP address and the DUT.

[0088] In some exemplary embodiments, the test host includes at least one network interface, and the network interface of the test host is set with N IP addresses belonging to different network segments. In this case, step 601 includes that the test host obtains the N IP addresses set on one network interface of the test host as the N host IP addresses. Figure 3 ​The parallel test system shown is taken as an example, and the four IP addresses set on the test host network port 1 are acquired as host IP addresses in step 601: 192.168.1.1, 192.168.2.1, 192.168.3.1, and 192.168.4.1.

[0089] Alternatively, the four IP addresses set on the test host network ports 1-4 are acquired as host IP addresses in step 601: 192.168.1.1, 192.168.2.1, 192.168.3.1, and 192.168.4.1. Figure 5 The parallel test system shown is taken as an example, and the four IP addresses set on the test host network port 1 are acquired as host IP addresses in step 601: 192.168.1.1, 192.168.2.1, 192.168.3.1, and 192.168.4.1.

[0090] For the four host IP addresses, the following steps are executed:

[0091] For the host IP address 192.168.1.1, one device IP address 192.168.1.12 belonging to the same network segment is selected from the preset device virtual IP address list, a connection is established with the UUT1 corresponding to the device IP address, the corresponding relationship 192.168.1.12-UUT1 is recorded, and a test task is executed.

[0092] For the host IP address 192.168.2.1, one device IP address 192.168.2.12 belonging to the same network segment is selected from the preset device virtual IP address list, a connection is established with the UUT2 corresponding to the device IP address, the corresponding relationship 192.168.2.12-UUT2 is recorded, and a test task is executed.

[0093] For the host IP address 192.168.3.1, one device IP address 192.168.3.12 belonging to the same network segment is selected from the preset device virtual IP address list, a connection is established with the UUT3 corresponding to the device IP address, the corresponding relationship 192.168.3.12-UUT3 is recorded, and a test task is executed.

[0094] For the host IP address 192.168.4.1, one device IP address 192.168.4.12 belonging to the same network segment is selected from the preset device virtual IP address list, a connection is established with the UUT4 corresponding to the device IP address, the corresponding relationship 192.168.4.12-UUT4 is recorded, and a test task is executed.

[0095] Each of the devices to be tested is preset with at least four virtual IP addresses. The device virtual IP address list (also referred to as the virtual IP address list of the device to be tested) is also preset in the test host, and includes the at least four virtual IP addresses.

[0096] It can be seen that according to the parallel test scheme provided by the embodiment of the present disclosure, the same virtual IP address can be preset in each device under test, and a corresponding device virtual IP address list is preset in the test host. N devices under test are tested in each round, and after the test result is obtained, the next batch of N devices under test is replaced for the next round of testing. For the next round of N devices under test, the test host does not need to update the related configuration, and still executes steps 601-602.

[0097] In some example embodiments, a network switch with a large number of network ports is selected, and a corresponding preset device virtual IP address list is configured and downloaded to the device under test and the test host, which can simply and flexibly expand the number of devices under test in parallel, and greatly improve the test efficiency.

[0098] The embodiment of the present disclosure also provides a parallel test method applied to a device under test, as shown in Figure 7 The method comprises the following steps:

[0099] In step 701, after the device under test is started, at least N virtual IP addresses are loaded in a factory mode.

[0100] In step 702, according to the host IP address in the connection request from the test host, one virtual IP address with the same network segment as the host IP address is selected from the at least N virtual IP addresses as the device IP address of the device under test.

[0101] In step 703, the device IP address is used to communicate with the test host, complete the test task issued by the test host, and return the test result.

[0102] In some example embodiments, step 702 further comprises: setting other virtual IP addresses in the at least N device IP addresses except the selected virtual IP address to an invalid state.

[0103] It can be seen that for the device under test, after establishing a connection with the test host, selecting a device IP address from the preset multiple virtual IP addresses for communication with the current test host, and shielding other virtual IP addresses, connection conflicts can be better avoided.

[0104] In some example embodiments, the method further comprises:

[0105] In step 704, after the device under test is started, a preset factory IP address is loaded as the device IP address in a non-factory mode.

[0106] The initial running mode of the device under test is the factory mode.

[0107] In some example embodiments, as shown inFigure 8 As shown, the method further comprises:

[0108] Step 705, in case of successful test, modifying the operation mode to non-factory mode;

[0109] Wherein, the initial operation mode of the device under test is factory mode.

[0110] In some exemplary embodiments, the method further comprises:

[0111] Step 706, in case of failed test, keeping the operation mode as factory mode.

[0112] It can be seen that the initial operation mode of the device under test is factory mode, in which the device under test loads virtual IP addresses, and uses one of the virtual IP addresses to communicate with the test host. If the test is successful, indicating that the requirement of ending the test is met, then the factory mode is closed, and the operation mode of the device under test is modified to non-factory mode. After the operation mode of the device under test is modified to non-factory mode, the device is started again, and the preset multiple virtual IP addresses are all invalid, and the device under test will use the preset factory IP address. If the test fails, indicating that the requirement of ending the test is not met, and retest or repair and then test are needed, then the factory mode is kept, so that the preset virtual IP addresses are still valid for retest, and the test is re-executed according to the above parallel test method.

[0113] Wherein, whether the test is successful is determined according to different devices under test or test requirements, and is not limited to specific judgment standards. Specific aspects do not belong to the protection and limitation range of the present application.

[0114] The present disclosure further provides a parallel test method applied to the parallel test system in any of the above embodiments, wherein the initial operation mode of the device under test UUT1-UUT4 is factory mode; taking the device under test UUT1 as an example, as shown in Figure 9 The method comprises:

[0115] 1. Power on the device under test UUT1, and load 4 preset virtual IP addresses in the initial factory mode;

[0116] 2. The test host selects the device IP address 192.168.1.12 belonging to the same network segment from the preset device virtual IP address list using the IP address 192.168.1.1 of the network port 1;

[0117] 3. The test host executes the network command Ping 192.168.1.12;

[0118] 4, judge whether the Ping command is executed successfully; if yes, determine that the measured device UUT1 corresponding to 192.168.1.12 is connectable, and continue the following test steps; if no, determine that the measured device corresponding to 192.168.1.12 is empty or the test fails, and record the test result.

[0119] 5, the measured device UUT1 receives the Ping command from the test host, determines the valid device IP address: 192.168.1.12, and sets other preset virtual IP addresses invalid;

[0120] 6, after the UUT1 corresponding to 192.168.1.12 establishes a connection with the test host, each test item is executed, and the execution result of each test item is recorded.

[0121] 7, the test host or the measured device UUT1 determines whether the current test is successful according to the execution result of all test items; if yes, step 8 is executed; if no, step 9 is executed.

[0122] 8, the test is successful, the UUT1 closes the factory mode, sets the running mode to the non-factory mode, the virtual IP address of the UUT1 is invalid, and only the factory IP address is used subsequently;

[0123] 9, the test fails, the UUT1 ends the current test, releases the test resource, and the test host records the test result.

[0124] It can be seen that the UUT1 closes the factory mode only after the test is successful, and the measured device UUT1 can be delivered to the next link. If the test fails, the UUT1 remains in the factory mode, and is retested in the factory mode or retested after being repaired, remains in the factory mode, and the measured device UUT1 still supports the virtual IP.

[0125] The embodiment of the present disclosure further provides a parallel test method, which is applied to the parallel test system as shown in Figure 2 or 3, wherein the measured devices UUT1-UUT4 are connected to one network port of the test host through a two-layer network switch, and the initial running mode is the factory mode; as shown in Figure 10 , the method comprises the following steps.

[0126] 1, power on the measured device;

[0127] 2, start the factory mode, and load four virtual IP addresses;

[0128] 3, determine one valid device IP address; establish a connection with the test host, and each determines one valid device IP address from the four virtual IP addresses, and shields other virtual IP addresses;

[0129] 4, execute the test;

[0130] 5. judging whether the test result is successful; if yes, executing step 6; if no, ending the test;

[0131] 6. closing the factory mode and setting the operation mode of the device under test to be non-factory mode.

[0132] The embodiments of the present disclosure further provide an electronic device, comprising:

[0133] one or more processors;

[0134] a storage device configured to store one or more programs,

[0135] When the one or more programs are executed by the one or more processors, the one or more processors implement the method for parallel testing according to any one of the above embodiments.

[0136] In some exemplary embodiments, the plurality of processors are a plurality of distributed processors.

[0137] The embodiments of the present disclosure further provide a computer readable storage medium having a computer program stored thereon, the program being implemented by a processor to implement the method for parallel testing according to any one of the above embodiments.

[0138] In some exemplary embodiments, the computer readable storage medium is a distributed storage medium.

[0139] It can be seen that the parallel testing method provided by the embodiments of the present disclosure supports virtual IP through the device (software) under test, the test host uses the same virtual IP of the network port to perform connection testing according to the multi-IP self-adaption, and the multi-device parallel testing can be realized without IP allocation through routing forwarding and DHCP (Dynamic Host Configuration Protocol); only the relevant network port IP address needs to be set, and the router or other test instruments with routing forwarding function do not need to be configured with routing, thereby simplifying the preparation work before testing; in terms of test system construction, the routing device or other special test instruments with routing forwarding function do not need to be introduced, and only the two-layer switching device connection or the network cable direct connection is used to build the test network, thereby significantly simplifying the preparation work before testing, improving the device batch testing efficiency as a whole, and reducing the testing complexity.

[0140] Those of ordinary skill in the art will realize and understand that all or some of the steps in the methods disclosed above and the functional modules / units in the systems and devices can be implemented as software, firmware, hardware, and appropriate combinations thereof. In hardware implementation, the division between the functional modules / units mentioned in the above description does not necessarily correspond to the division of physical components; for example, one physical component can have multiple functions, or one function or step can be performed by several physical components in cooperation. Some or all of the components can be implemented as software executed by a processor, such as a digital signal processor or a microprocessor, or as hardware, or as an integrated circuit, such as an application-specific integrated circuit. Such software can be distributed on a computer-readable medium, which can include computer storage media (or non-transitory media) and communication media (or transitory media). As is well known to those of ordinary skill in the art, the term computer storage media includes volatile and non-volatile, removable and non-removable media implemented in any method or technology for storage of information such as computer readable instructions, data structures, program modules or other data. Computer storage media includes, but is not limited to, RAM, ROM, EEPROM, flash memory or other memory technology, CD-ROM, digital versatile disks (DVD) or other optical disk storage, magnetic cassettes, magnetic tapes, magnetic disk storage or other magnetic storage devices, or any other medium that can be used to store the desired information and that can be accessed by a computer. Furthermore, it is well known to those of ordinary skill in the art that communication media typically embodies computer readable instructions, data structures, program modules or other data in a modulated data signal such as a carrier wave or other transport mechanism and includes any information delivery media.

[0141] The above description is merely preferred embodiments of the present application, and is not intended to limit the patent scope of the present application. Any equivalent structural variations made under the concept of the present application, or direct / indirect application in other related technical fields, are included in the patent protection scope of the present application.

Claims

1. A parallel testing system, characterized in that, include: The test host and N devices under test, where N is an integer greater than 1; The test host is configured with at least N host IP addresses belonging to different network segments; Each of the N devices under test is configured with at least N virtual IP addresses belonging to different network segments in factory mode; The test host is configured to communicate with the N devices under test through N host IP addresses respectively to execute test tasks; In the process of the test host communicating with the device under test in factory mode, the network segment to which the virtual IP address of the i-th device under test belongs is the same as the network segment to which the IP address of the i-th host belongs, i=1, 2, ..., N.

2. The system as described in claim 1, characterized in that, The system also includes: a network switch; The test host includes at least one network port; the network switch includes at least N+1 network ports; The network port of the test host is configured with N IP addresses as N host IP addresses; The test host is configured to connect to the N devices under test through the network switch, and to communicate with a virtual IP address of each of the N host IP addresses to execute test tasks. The virtual IP address used by the device under test (DUT) to communicate with the test host is one selected by the DUT from at least N virtual IP addresses set by the DUT itself; the virtual IP addresses selected by the N test devices are all different.

3. The system as described in claim 1, characterized in that, The test host includes N network ports; The IP addresses of the N network ports are each set to one of at least N host IP addresses; The test host is configured to connect to the N devices under test through the N network ports respectively, and to communicate with a virtual IP address of each device under test using the host IP address corresponding to each network port in order to execute test tasks. The virtual IP address used by the device under test (DUT) to communicate with the test host is one selected by the DUT from at least N virtual IP addresses set by the DUT itself; the virtual IP addresses selected by the N test devices are all different.

4. A parallel testing method, characterized in that, include: The test host obtains at least N host IP addresses belonging to different network segments, where N is an integer greater than 1. The test host performs the following operations for each host IP address: Based on the network segment to which the host IP address belongs, after establishing a connection with the device under test (DUT) in factory mode corresponding to the device IP address belonging to the same network segment, the test task for the DUT is executed. The device IP address of the device under test is one of at least N virtual IP addresses that the device under test sets itself in factory mode.

5. The method as described in claim 4, characterized in that, The test host obtains at least N host IP addresses belonging to different network segments, which it has configured, including: The test host obtains N IP addresses belonging to different network segments set on one of its network ports as N host IP addresses; or, The test host obtains the IP addresses belonging to different network segments set on its N network ports as N host IP addresses.

6. The method as described in claim 4 or 5, characterized in that, The test host performs the following operations for each host IP address, including: The test host selects a virtual IP address from a preset list of virtual IP addresses for a device that belongs to the same network segment as the host's IP address. After establishing a connection with the corresponding device under test based on the selected device virtual IP address, the test task for the device under test is executed.

7. A parallel testing method applied to the device under test, characterized in that, include: After the device under test is started, in the factory mode, it loads at least N preset virtual IP addresses. Based on the host IP address in the connection request from the test host, select one virtual IP address from the at least N virtual IP addresses that belongs to the same network segment as the host IP address, and use it as the device IP address of the device under test; The device communicates with the test host using the device's IP address, completes the test tasks issued by the test host, and returns the test results.

8. The method as described in claim 7, characterized in that, The method further includes: after the device under test is started, when the operating mode is non-factory mode, loading a preset factory IP address as the device IP address; wherein, the initial operating mode of the device under test is factory mode; or, The method further includes: if the test is successful, changing the operating mode to non-factory mode; wherein the initial operating mode of the device under test is factory mode.

9. An electronic device, characterized in that, include: One or more processors; Storage device for storing one or more programs. When the one or more programs are executed by the one or more processors, the one or more processors implement the parallel testing method as described in any one of claims 4-6; or implement the parallel testing method as described in any one of claims 7-8.

10. A computer-readable storage medium having a computer program stored thereon, characterized in that, When the program is executed by the processor, it implements the parallel testing method as described in any one of claims 4-6; or, it implements the parallel testing method as described in any one of claims 7-8.

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