Measuring device comprising a sighting unit and a scanning module

Abstract

The invention relates to a measuring device comprising a sighting unit and a scanning module. The invention relates to a measuring device (20) comprising a sighting unit (30) and a scanning module (10). The scanning module (10) has a field of view in which a center line (32) is located. The measuring device (20) has a pivot axis (22) about which an upper part of the measuring device (20) can be pivoted or rotated. The center line (32) is deviated from orthogonality with respect to the pivot axis (22) by at most 45 degrees.

Description

Technical Field

[0001] This invention relates to a multifunctional measuring device including an aiming unit and a scanning module. Background Technology

[0002] To acquire an object or surface, a progressive scanning method is typically used, capturing, in the process, the topography of a structure such as a building. In this case, such topography constitutes a continuous sequence of points describing the object's surface, or a corresponding model or description of the surface. A traditional method involves scanning using a laser scanner, which in each case acquires the spatial location of surface points by measuring the distance to the target surface points using a laser, and combining this measurement with information about the angle of laser emission. Based on this distance and angle information, the spatial location of the acquired points can be determined, and the surface can be continuously measured. In many cases, in parallel with this purely geometric acquisition of the surface, image capture is also performed using a camera, which provides additional information beyond the overall visual view, such as information about the surface texture.

[0003] In this regard, for example, WO 97 / 40342 describes a method for capturing topography using a scanner system mounted in a fixed manner. A fixed mounting point is selected for these systems, and this fixed mounting point serves as the basis for the scanning process performed by the motor. The three-dimensional position information of the corresponding surface points can be obtained via the distance to the measured point, the angular position at the time of measurement, and the known position of the scanning equipment. In this case, the scanner system is specifically designed for topography acquisition tasks and scans the surface by moving the scanner system or by changing the beam path.

[0004] Furthermore, scanning functionality can be integrated as an add-on into various other devices. For example, WO 2004 / 036145 discloses a geodetic apparatus that emits a laser beam for distance measurement. Such measuring devices can also be modified to acquire surfaces by scanning, or operated without modification. One example is a motorized theodolite, tachymeter, or total station. Geodetic instruments modified by scanning devices within the telescope suffer from drawbacks such as a small field of view or slow scanning speed. In particular, the rotation speed of the telescope in a tachymeter or total station typically cannot exceed 1 Hz, even when rotating around a faster elevation axis.

[0005] Some laser scanners based on existing technology enable users to fully acquire large surfaces and objects in a relatively short time (depending on the required point-to-point resolution), and, if appropriate, with additional object information. However, in this case, the accuracy of the point coordinates that can be obtained does not meet, for example, the high geodetic accuracy standards established for modern surveying devices (especially total stations, stadia, or theodolites).

[0006] Modern total stations typically feature a compact and integrated design, where coaxial distance measuring elements, along with computing, control, and storage units, are usually housed within the device. Depending on the stage of development of the total station, additional integration may be made of motorized targeting or sighting devices, as well as automatic target finding and tracking mechanisms (in cases where a retroreflector (e.g., an omnidirectional prism) is used as the target object). As a human-machine interface, the total station may have an electronic display control unit (typically a microprocessor computing unit with electronic data storage) with display and input devices (e.g., a keyboard). Measurement data acquired in a sensor-based manner is fed to the display control unit, enabling it to determine, optically display, and store the location of the target point. Total stations known from the prior art may also have a radio data interface to establish a radio link to external peripheral components, such as handheld data acquisition devices that can be designed as data loggers or field computers. Therefore, total stations known from the prior art may be equipped with a set of wireless modules that enable them to communicate with different types of external units, thereby allowing the total station to interact beneficially with cloud services.

[0007] To aim or target a point to be measured, typical geodetic apparatuses have a telescopic aiming body as the aiming and aligning device, such as an optical telescope. The telescope aiming body is typically rotatable relative to the base of the surveying apparatus about a vertical axis and a horizontal tilt axis, allowing the alignment axis of the optical telescope to be aligned with the point to be measured by pivoting and tilting. For example, the telescope aiming body of a stadia or total station is also equipped with an electronic rangefinder, and the distance to the target is measured by a laser beam. The polar coordinates of the target point are determined, along with the angles from azimuth and elevation sensors. In addition to the optical observation channel, modern apparatuses may also have a camera for aiming and aligning with arcsecond accuracy, integrated into the telescope aiming body and aligned with the alignment axis, for example, coaxially or parallel. In this case, the acquired images or image sequences (especially real-time images) can be displayed on the display of the display control unit and / or on the display of a peripheral device for remote control (e.g., a data logger). In this case, the optical system of the aiming device can have manual focusing (e.g., an adjustment wheel for changing the position of the focusing optics) or automatic focusing (wherein, for example, the focusing position is changed by a servo motor). As an example, such aiming and targeting devices for geodetic apparatuses are described in EP 2219011. Automatic focusing devices for telescope aiming devices used in geodetic apparatuses are known, for example, from DE 19710722, DE 19926706, or DE 19949580.

[0008] Based on optical telescopes, targets are aimed at visually (e.g., geodetic poles or plumb bobs with target markings, such as omnidirectional prisms). More advanced geodetic total stations are typically equipped with automatic aiming sensors. Such measuring devices have automatic target tracking (ATR: Automatic Target Recognition) capabilities for prisms or reflective strips used as target reflectors. For this purpose, a separate ATR source (e.g., multimode fiber output) emitting light radiation in the 750 nm to 850 nm range and a specific ATR detector sensitive to said wavelength (e.g., CCD or CMOS area sensor) are typically additionally integrated into the telescope. As an example, EP 2141450 describes a measuring device with automatic aiming at a reflected target and automatic target tracking capabilities.

[0009] Total stations are optimized for various geodetic functions, such as referencing the instrument to an external coordinate system by accurately recording reference markers in the environment. Once such an external coordinate system is established, all coordinated operations are referenced to this external or global coordinate system. Another key function is the lofting workflow, which brings coordinates into the scene (e.g., transferring points from a building plan to a construction site). A third important function is the self-calibration of the telescope's aiming body: the telescope's aiming body can transit by 180°, a core element for achieving arcsecond accuracy.

[0010] Using this modern surveying apparatus, the coordinates of appropriate target points can be determined with very high geodetic accuracy. However, a disadvantage in this case is that measuring large-area objects or recording the surface of a building and all its elements (e.g., using a total station) means a disproportionately high time consumption compared to the measurement process of a laser scanner on an object. Summary of the Invention

[0011] Therefore, the object of the present invention is to provide an improved measuring instrument that, in addition to the inherent high-precision target point determination capability of the instrument, can also achieve the function of quickly acquiring multiple target points with a shorter time consumption compared to determining multiple precise target points.

[0012] This objective is achieved by implementing the features of the invention. The invention also describes further development of the features of the invention in alternative or advantageous manners.

[0013] This invention relates to a measuring device, particularly a total station, a stadia, a theodolite, or a laser tracker. The measuring device includes: 1) a base; 2) a construction arranged on the base and pivotable or rotatable about a pivot axis (also called a vertical axis or azimuth axis), the construction having a main frame with at least one column; 3) an aiming unit attached to the main frame, wherein the aiming unit is pivotable or rotatable about an aiming unit rotation axis (also called a tilt axis), wherein the aiming unit has at least one emitting unit for emitting a first laser beam, the emitting unit defining an optical target axis (also called an alignment axis); 4) a first angle measurement function for acquiring at least one pivot angle defined by the relative pivot position of the construction relative to the base; 5) a scanning module including: a) a beam deflection element for deflecting the scanning laser beam, the beam deflection element being rotatable about a rotation axis in a motorized manner, wherein... The scanning module has a defined angle between the rotation axis and the pivot axis in the receiving state, and b) a second angle measurement function for determining the rotation angle based on the angular position of the beam deflection element, wherein the scanning module has a field of view defined at least by the rotation axis and the orientation of the beam deflection element relative to the rotation axis, the field of view being within the scanning surface, wherein the scanning surface is specifically implemented as a scanning plane, and wherein the deflected scanning laser beam is in the field of view when the scanning module is rotating within the angular field of view about the rotation axis, wherein the angular field of view rotation range includes a central rotation angle, and wherein at the central rotation angle, the beam deflection element is configured to deflect the scanning laser beam in the direction of the centerline, and 6) a control and processing unit for data processing and controlling the measuring device, particularly for controlling the aiming unit and the scanning module. The scanning module is arranged on the main frame and / or the aiming unit in such a way that the centerline direction is deviated from the orthogonality relative to the pivot axis by a maximum of 45 degrees. When the scanning surface is implemented as a scanning plane, the centerline direction is specifically located in the angular mean orientation in the field of view.

[0014] The aiming unit may include a first distance measurement function for measuring the distance to an object. Since the configuration can rotate about a pivot axis, the pivot axis can also be considered a rotation axis, particularly a vertical rotation axis.

[0015] The scanning module is configured to acquire scanning data of the surrounding environment of the measuring device, particularly 3D point cloud data of the surrounding environment.

[0016] The scanning module's field of view covers situations where the structure, or particularly the main frame of the structure, does not rotate or pivot about a pivot axis. When the structure, or particularly the main frame, is static, the scanning module emits a scanning laser beam within a scanning surface that changes as the structure, or particularly the main frame, moves.

[0017] The field of view is defined by the axis of rotation of the beam deflecting element and the orientation of the beam deflecting element relative to the axis of rotation. The field of view can also depend on the incident direction of the scanning laser beam striking the beam deflecting element. When the scanning laser beam arrives at the beam deflecting element at a 45-degree angle relative to the normal to the beam deflecting element, and when the beam deflecting element rotates about an axis of rotation that is 45 degrees relative to the normal to the beam deflecting element and 0 degrees (or parallel to) the incident direction of the scanning laser beam (and this axis of rotation passes through the point of incident of the scanning laser beam striking the beam deflecting element), the field of view of the scanning module will lie within the scanning plane. In the case of a changed incident direction and / or a changed axis of rotation other than 45 degrees, the field of view of the scanning module may not lie on the scanning plane, but may lie, for example, on at least a portion of a conical surface.

[0018] When the beam deflection element rotates about the axis of rotation, for certain angular orientations of the beam deflection element about the axis of rotation, the deflected scanning laser beam typically only reaches the object being measured; for other angular orientations, the deflected scanning laser beam is usually partially blocked by the measuring device and therefore does not reach the object. The angle of the beam deflection element about the axis of rotation that allows the deflected scanning laser beam to reach the object being measured lies within the angular field of view rotation range. The angular field of view rotation range can correspond to a compact set of rotation angles from low to high rotation angles.

[0019] At the center rotation angle within the angular field of view rotation range (which corresponds, for example, to the geometric mean angle within the angular field of view rotation range, i.e., equal to (low rotation angle + high rotation angle) / 2, or, for example, to the average angle within the angular field of view rotation range weighted by the rotational speed of the beam deflection element about the rotation axis of potential variation), the beam deflection element deflects the scanning laser beam in the centerline direction, which is located in the field of view of the scanning module.

[0020] The scanning module is arranged on the main frame in such a way that the field of view of the scanning module (i.e., the spatial portion that the scanning module can illuminate or image) causes the centerline, having a centerline direction, to deviate from orthogonality relative to the pivot axis by at most 45 degrees. The centerline can be provided, for example, by the angular average value over the field of view. For example, if the field of view is located on the scanning plane and extends more than 180 degrees, the centerline can be located in the middle, with 90 degrees of field of view to its lower quarter circle and 90 degrees of field of view to its upper quarter circle.

[0021] Orthogonality refers to all lines orthogonal to the pivot axis. Deviation from orthogonality by at most 45 degrees can now be assessed by referring to these lines orthogonal to the pivot axis. A center line is said to be deviated from orthogonality by at most 45 degrees from any of these lines (if it is deviated from the first orthogonal line by at most 45 degrees, it is typically deviated from the second orthogonal line by at least 45 degrees).

[0022] The measuring device of the present invention may include the function of precisely setting and referencing external fixed points, and may allow for the layout of planning points, recording of dedicated object points, and rapid scanning of object surfaces.

[0023] The scanning module can also be arranged on the aiming unit. The scanning module can be arranged such that, regardless of the angular orientation of the aiming unit relative to its rotation axis, the direction of the center line in the scanning module's field of view deviates from its orthogonality relative to the rotation axis by at most 45 degrees. By arranging the scanning module on the aiming unit, the scanning surface, particularly the scanning surface implemented as the scanning plane, can be changed by altering the angular orientation of the aiming unit about its rotation axis.

[0024] In an embodiment of the measuring device according to the invention, the scanning module is arranged on the main frame in a non-removable manner.

[0025] The scanning module can be rigidly and fixedly arranged on the main frame. Given a rigid and fixed arrangement, and without the scanning module itself pivoting or rotating, the relative orientation between the scanning plane and the pivot axis does not depend on the overall orientation of the structure relative to the pivot axis.

[0026] Arranging the scanning module on the main frame in a non-removable manner can also improve the internal angular stability and mechanical angular stiffness between the telescope aiming body (i.e., the aiming unit) and the scanning module.

[0027] In another embodiment of the measuring device according to the invention, the scanning module is arranged on a first column of at least one column of the main frame, and / or the scanning module is arranged below the aiming unit and / or laterally shifted relative to the aiming unit.

[0028] The term lateral displacement can be understood as spatial displacement perpendicular to the pivot axis.

[0029] The correspondingly arranged scanning module allows for measurements of the zenith and / or nadir of the measuring device. When the scanning module is placed above the aiming unit, the aiming unit will prevent the scanning module from acquiring scanning data around the nadir, and other components typically placed above the aiming unit (such as a GPS antenna) will also prevent the scanning module from acquiring scanning data around the zenith. Arranging the scanning module on the first post, with its field of view facing away from the measuring device, allows for the acquisition of scanning data around both the zenith and nadir of the measuring device. In this case, components such as the GPS antenna or the aiming unit itself may not affect the scanning module's field of view. The scanning module can be essentially limited only to the first post and the base.

[0030] When the scanning module is laterally shifted relative to the aiming unit (whether above, below, or at the same height as the aiming unit), the scanning module may not obstruct the aiming unit from aiming at a point on an object located in the zenith direction of the measuring device. In this case, the aiming unit can be positioned to point in the zenith direction of the measuring device, and the scanning module will not prevent it from doing so.

[0031] In another embodiment of the measuring device according to the invention, the main frame includes at least two columns, and another scanning module having a further axis of rotation and a further beam deflection element is arranged on the second column, and / or at least one camera is arranged on the second column.

[0032] Similar to the scanning module, another scanning module may have another field of view, which is within another scanning surface, particularly in another scanning plane.

[0033] With a camera positioned on the second column at the same height as the scanning module on the first column, and with the camera being an RGB camera, the image obtained by the RGB camera can be used to colorize the measurement data acquired by the scanning module in a substantially parallax-free manner.

[0034] In another embodiment of the measuring device according to the invention, the center point of the scanning module and the aiming unit and / or another center point of another scanning module and the aiming unit are arranged at substantially the same height relative to the configuration.

[0035] In this way, the measurements performed by the aiming unit and the measurements performed by the scanner are referenced to a reference point that can be laterally shifted relative to each other.

[0036] In another embodiment of the measuring device according to the invention, the center point and / or another center point are laterally shifted relative to the aiming unit.

[0037] In another embodiment of the measuring device according to the invention, the field of view is in the scanning plane and is greater than or equal to 180 degrees, and / or another field of view of another scanning module is greater than or equal to 180 degrees, the other field of view being at least defined by another rotation axis and in another scanning plane, wherein the scanning module and / or the other scanning module are arranged in a manner such that the field of view and / or the other field of view includes the zenith of the measuring device on the construction and / or aiming unit.

[0038] When the field of view and another field of view are located in the scanning plane or another scanning plane, respectively, the field of view and the other field of view can each be described by two peripheral directions, extending between these two peripheral directions. The field of view can extend between a first direction and a second direction in the scanning plane, and the other field of view can extend between another first direction and another second direction in the other scanning plane. The first direction and / or the other first direction can be substantially parallel to the pivot axis.

[0039] In another embodiment of the measuring device according to the invention, the pivot axis is located in the scanning plane, and / or the pivot axis is located in another scanning plane.

[0040] In another embodiment of the measuring device according to the invention, the pivot axis is parallel to the scanning plane and laterally displaced relative to the scanning plane, and / or the pivot axis is parallel to another scanning plane and laterally displaced relative to another scanning plane.

[0041] In another embodiment of the measuring device according to the invention, the scanning plane is inclined relative to the pivot axis, and the pivot axis intersects the scanning plane at one intersection point, and / or another scanning plane is inclined relative to the pivot axis, and the pivot axis intersects another scanning plane at another intersection point.

[0042] In another embodiment of the measuring device according to the invention, the control and processing unit is configured to synchronize the operation of the scanning module with the pivoting or rotation of the structure about the pivot axis.

[0043] The control and processing unit can be configured to synchronize the rotation of the beam deflection element about a rotation axis with the rotation of the structure about a pivot axis. Synchronization can be achieved using hardware devices, for example, by synchronously controlling the actuators that rotate the structure about the pivot axis and the beam deflection element about the rotation axis, or by measuring the angular orientation of the structure about the pivot axis and the angular orientation of the beam deflection element about the rotation axis, for example, by readings from a passive synchronization sensor. This passive synchronization can be provided, for example, by a combined clock.

[0044] The synchronization of the scanning module and the rotation of the structure about the pivot axis can be at least partially accomplished using a computer program executed on the control and processing unit. The computer program can also control the operation of an optional camera on the second column of the main frame and provide calibration functionality for the measuring device of the invention. The computer program can also combine data acquired by the scanning module, the aiming unit, and optionally another scanning module or camera. This data combination can utilize the relationship between a known coordinate system and the known coordinate system of the measuring device of the invention, particularly by incorporating the data into the local coordinate system of the measuring device. In another embodiment of the measuring device according to the invention, the beam deflection element is implemented as a deflection mirror configured to be fully rotatable about the rotation axis, and / or the deflection mirror is mechanically attached to the scanning module only on one side, and / or the deflection mirror is mechanically and completely shielded by the housing of the scanning module, a portion of which is implemented as an opaque cover configured to allow light with the frequency of the scanning laser beam to pass through.

[0045] Therefore, an opaque cover can be transparent to light with the frequency of a scanning laser beam, while blocking light of other frequencies.

[0046] In another embodiment of the measuring device according to the invention, the beam deflection element is implemented as a rotating polygon, wherein the beam deflection element is configured to be fully rotatable about a rotation axis, wherein the angular span of the field of view of the emitted and received beams is at least 120 degrees, preferably 160 degrees.

[0047] In another embodiment of the measuring device according to the invention, the aiming unit is configured to rotate about the aiming unit axis at a rotation frequency of up to 30 Hz and, in particular, up to 10 Hz.

[0048] Therefore, a conventional aiming unit can be used. Thus, the measuring device can correspond to, for example, a conventional total station with an attached laser scanner.

[0049] In another embodiment of the measuring device according to the invention, the control and processing unit is configured to cause the structure to rotate completely about the pivot axis.

[0050] When the scanning module's field of view is essentially located only on one side of the measuring device, such as only in front of or only behind the measuring device, it may be necessary to construct a complete rotation about the pivot axis in order to acquire full 360-degree scan data using the measuring device's scanning module. Attached Figure Description

[0051] The system of the invention will now be described in more detail by way of example only, with reference to specific exemplary embodiments schematically illustrated in the accompanying drawings, while further advantages of the invention will be examined. The same elements are denoted by the same reference numerals in the drawings. Specifically:

[0052] Figure 1 A schematic diagram illustrating a first embodiment of the measuring device according to the present invention is shown;

[0053] Figure 2 A schematic diagram illustrating a second embodiment of the measuring device according to the present invention is shown;

[0054] Figure 3 A schematic diagram illustrating a third embodiment of the measuring device according to the present invention is shown;

[0055] Figure 4a A schematic diagram illustrating the first embodiment inside the scanning module is shown;

[0056] Figure 4b A schematic diagram illustrating the second embodiment inside the scanning module is shown;

[0057] Figure 5 A schematic diagram illustrating a fourth embodiment of the measuring device according to the present invention is shown;

[0058] Figure 6 A schematic diagram of the measuring device according to the invention, viewed from the side, is shown; and

[0059] Figure 7 A schematic diagram of the measuring device according to the invention, arranged on a tripod, is shown. Detailed Implementation

[0060] Figure 1 A schematic diagram illustrating a first embodiment of the measuring device 20 according to the present invention is shown. The measuring device 20 includes a base 20b and a structure 20a arranged on the base 20b. An aiming unit 30 (particularly a telescope) is attached to the main frame 27a, 27b of the structure 20a. The aiming unit 30 is pivotable or rotatable about an aiming unit rotation axis 21. In this case, the aiming unit 30 can be pivoted by means of another motor 25, wherein another pivot angle can be measured by an angle measuring sensor 23. The main frame 27a, 27b includes a first post 27a and a second post 27b, wherein the aiming unit 30 is attached to the two posts 27a, 27b. A scanning module 10 is arranged on the first post 27a.

[0061] The entire upper portion of the measuring device 20 (i.e., configuration 20a with the aiming unit 30 and the scanning module 10) can simultaneously pivot or rotate at a low speed relative to the base 20b of the measuring device 20 about the vertical pivot axis 22. This can be achieved by a motor 26 arranged in the measuring device 20. The scanning module 10 can emit a laser beam toward the measurement point. An angle measurement function in the scanning module 10 can be used to determine the angle of the emitted laser beam. The distance to the measurement point can thus be measured by means of the laser beam, its reflection on the surface, and the acquisition by the detector in the scanning module 10. The coordinates of the measurement point can be calculated from the measured distance, the angle of the emitted laser beam, and the horizontal angle or pivot angle determined by the angle sensor 24 arranged in the pivoting device 20.

[0062] Without the upper part of the measuring device 20 pivoting or rotating about the vertical pivot axis 22, the scanning module 10 is in the scanning plane (e.g., Figure 1 (As shown) or more generally, a laser beam is emitted within the scanning surface (e.g., implemented as a scanning cone). Since the scanning module is arranged on the first post 27a, the field of view of the scanning module 10 (i.e., the spatial region that can be scanned by the scanning module 10) is substantially located on one side of the measuring device 20. For example, in Figure 1 In this embodiment, the field of view in the scanning plane extends more than 180 degrees and is substantially limited by the first pillar 27a and the base 20b. The centerline 32 lies within the field of view and corresponds, for example, to the average angle over the field of view, i.e., the average angle. Because... Figure 1 The field of view of the scanning module 10 depicted in the figure extends more than 180 degrees in the scanning plane, so the center line 32 can be approximately orthogonal to the first column 27a. Figure 1 The centerline 32 is basically orthogonal to the pivot axis 22.

[0063] The scanning unit 10 is positioned at the same height as the aiming unit 30 and is laterally shifted relative to the aiming unit 30.

[0064] Figure 2 A schematic diagram illustrating a second embodiment of the measuring device 20 according to the present invention is shown. Figure 2 Corresponding to Figure 1 The implementation methods described herein. Besides... Figure 1 In addition, Figure 2 In this configuration, another scanning module is positioned on the second post 27b at the same height as scanning module 10 relative to the base. Scanning module 10 has a field of view with a centerline 32a, and the other scanning module has another field of view with another centerline 32b. The other centerline 32b is substantially orthogonal to the pivot axis.

[0065] Figure 3A schematic diagram illustrating a third embodiment of the measuring device 20 according to the invention is shown. A handle 28 is disposed on top of the configuration 20a. The handle allows a human operator to easily carry the measuring device 20 according to the invention. The field of view of the scanning module 10 is substantially unaffected by the handle.

[0066] Figure 4a and Figure 4b A schematic diagram illustrating different implementations of the scanning module 10 is shown.

[0067] exist Figure 4a In the scanning module, there are three skeleton-type support members 82, 83a, and 83b. The support members are formed by means of a skeleton-type structure consisting of three main parts (i.e., three support structures 82, 83a, and 83b), which are connected to each other, for example, by means of a mechanical connection based on ordinary pins.

[0068] The three-part support structure has a support axis 29 (also called the scanning module axis) and a central support structure 82. Two additional separate support structures 83a and 83b can be connected to the central support structure 82. The beam deflection element 11 is specifically arranged on the support structure 83a. Depending on the position of the scanning module on the altimeter (i.e., structure 20a) of the survey instrument 20, the support axis 29 may coincide with the rotation axis 21 of the aiming unit, or the support axis 29 may differ from the rotation axis 21 of the aiming unit, for example, when the scanning module 10 and the aiming unit 30 are arranged at different heights on the structure 20a relative to the base 20b.

[0069] The beam deflection element 11 is rotatable about a rotation axis 12, which is orthogonal to the support axis 29. The current orientation of the beam deflection element 11 can be recorded by an angle measurement function. The current orientation can also be obtained based on a control signal used to actuate a motor that rotates the beam deflection element 11. The laser beam incident on the rotating beam deflection element 11, for example, sweeps across a scanning plane through the rotating beam deflection element 11. The scanning plane is defined by the rotation axis 12, the orientation of the beam deflection element 11 relative to the rotation axis 12, and the incident angle of the laser beam striking the beam deflection element 11. Figure 4a and Figure 4b The field of view of the scanning module shown (i.e., the field of view in the scanning plane) is limited by the central support structure 82. The beam deflection element 11 is fully rotatable, that is, it can rotate 360 ​​degrees about the rotation axis 12.

[0070] The laser beam emitting and detector unit 100 is arranged on the support structure 83b. The emitted and incident beams are focused by the lens 101.

[0071] Figure 4a and Figure 4b The implementation method inside the scanning module 10 shown can be used for Figure 1 , Figure 2 and Figure 3 The scanning module 10 is shown. Figure 4a and Figure 4b Embedded in Figure 1 , Figure 2 or Figure 3 In one of the following cases, Figure 4a and Figure 4b This corresponds to the view viewed from above (i.e., the view viewed from above the measuring device 20 along the pivot axis 22 toward the measuring device 20).

[0072] exist Figure 4b In the scanning module, a base 50 is also included. A central support structure 82 is coaxially mounted on the base 50 with support axis 29. Support structures 83a and 83b are not connected to the base 50.

[0073] The central support structure 82 is mounted on the base 50 in a manner that allows the support member to rotate about the support axis 29, and in particular to rotate completely. Thus, the scanning plane can be changed by rotating the scanning module 10 about the support axis 29.

[0074] Figure 4a and Figure 4b The implementation method inside the scanning module 10 shown can be used for Figure 1 , Figure 2 and Figure 3 The scanning module 10 shown. Figure 4a or Figure 4b Embedded in Figure 1 , Figure 2 or Figure 3 In one of the following cases, Figure 4a or Figure 4b This corresponds to the view viewed from above (i.e., the view viewed from above the measuring device 20 along the pivot axis 22 toward the measuring device 20).

[0075] The scanning module 10 has a center point that can be defined as the intersection of the scanning rotation axis 12 and the beam deflection element 11 (e.g., a mirror). From this point, the emitted laser beam is reflected into space relative to the surface of the object to be scanned.

[0076] In a particular embodiment, the center point of the scanning module 10 can be spatially aligned with the support axis 29, such that the center point corresponds to the intersection of the support axis 29 and the rotation axis 12, as shown below. Figure 4a and Figure 4b As shown.

[0077] Figure 5A schematic diagram illustrating a fourth embodiment of the measuring device 20 according to the present invention is shown. Figure 5 The measuring device includes three scanning modules 10a, 10b, and 10c. Scanning module 10a is arranged on the first post 27a, scanning module 10b is arranged on the second post 27b, and scanning module 10c is arranged below the aiming unit 30 and laterally shifted relative to the aiming unit 30. Each of the three scanning modules 10a, 10b, and 10c has a different field of view. The scanning module 10a arranged on the first post 27a faces the opposite direction compared to the scanning module 10b arranged on the second post 27b. The third scanning module 10c has a larger field of view compared to the scanning modules 10a and 10b arranged on the posts 27a and 27b because the posts 27a and 27b do not restrict the field of view of the scanning module 10c. The field of view of the scanning module 10c is essentially limited only by the aiming unit 30 and the base 20b. Figure 5 In this embodiment, the centerline of the scanning module 10c (located at the angular mean of the field of view of the scanning module 10c) is therefore not orthogonal to the pivot axis 22. Instead, since the field of view of the scanning module 10c is more restricted by the aiming unit 30 than by the base 20b, the centerline points downward.

[0078] Each scanning module 10a, 10b, and 10c includes a beam emission area (in... Figure 5 (Seen in shaded area), the emitted scanning laser beam passes through this beam emission area and exits the scanning module. The shaded surface can be implemented as an opaque surface covering the interior of the scanning module, for example, as... Figure 4a and Figure 4b As shown, a beam deflection element is arranged internally. The opaque surface can be provided by a material that is transparent to the wavelength of the scanning laser beam but opaque to other wavelengths.

[0079] Figure 6 A schematic diagram of the measuring device 20 according to the invention, viewed from the side, is shown. The scanning module 10 is arranged on the first post 27a of the measuring device 20. The scanning beam emission area of ​​the scanning module 10 is... Figure 6 It is shown graphically at the center of the scanning module.

[0080] The scanning module 10 is tilted 31 relative to the pivot axis 22, that is, the scanning plane of the scanning module 10 is tilted relative to the pivot axis. The pivot axis intersects the scanning plane at a point. The scanning module 10 can be tilted 31 by, for example, 45 degrees relative to the pivot axis 22. When scanning the scene at different tilt or skew angles, the shadowed surface can become visible in one of several scanning configurations without repositioning the total station.

[0081] Figure 7A schematic diagram of a measuring device 20 arranged on a tripod according to the present invention is shown. The measuring device includes an aiming unit 30 that emits a laser beam 40 and a scanning module 10. The laser beam 40 is emitted by the aiming unit 30 toward a target point 41 on the object 70 in a target direction 42 to measure the distance from the aiming unit 30 to the target point 41. For high-resolution scanning, as is known in prior art devices, the aiming unit 30 can typically scan up and down at a rate of less than 1 Hz while the pivot axis rotates continuously in the azimuth direction. However, such a scanning speed is slow, covers a small field of view that is typically 20 degrees × 20 degrees, and takes several minutes.

[0082] The scanning module 10 emits a scanning laser beam 60, for example, at a high deflection speed typically 100 Hz. The scanning module 10 also has a field of view, in which a centerline 32 lies, substantially orthogonal to the aiming unit rotation axis 21 of the aiming unit 30. The total scanning range of the scanning module (i.e., including the combined motion of rotation about the pivot axis) can cover the entire dome horizontally 360 degrees and vertically from the nadir to the zenith. The measurement rate of the scanning module 10 is very high, for example, from 100k points per second to several megapoints per second. Therefore, the measurement rate is at least 100 times faster than that of known total stations (for known scanning functions). The greatest advantage is that a large field of view (FOV) scan can be performed in a very short time. Depending on the scan settings, even a full dome scan can be performed in under a minute. Such high-speed scanning is not feasible when using the aiming unit 30 to record point clouds.

[0083] Figure 7 The measuring device 20 of the present invention also provides two functions: firstly, the functions of a conventional total station, and secondly, the functions of a high-speed scanner, which can distribute laser measurement points with sufficient spacing between adjacent measurement points. The rapid scanning unit is key to achieving point distribution over a large field of view in a short time. It must be considered that the scanning angle must change more than the spot size within a fraction of a microsecond, which is impossible with the aiming unit of a total station.

[0084] According to embodiments of the present invention, the scanning module of the measuring device may include a lidar having a light source that emits measurement pulses and a receiver unit including a photodetector circuit for detecting the returned signal. The receiver circuit may, for example, include an aluminum-indium-arsenite-antimonybide (AlInAsSb) avalanche photodiode (APD) for detecting the light pulses and a pulse detection circuit including a transimpedance amplifier, a voltage amplifier, an analog-to-digital converter (ADC), and a processing unit. Compared to other long-wavelength APDs (such as InGaAs / InP), APDs made of AlInAsSb digital alloys have several advantages, such as high sensitivity or high gain and low excess noise over a wide wavelength range of 800 nm to 1600 nm. Antimony (Sb)-based III / V materials (bulk and superlattice) can meet the bandgap requirements for manufacturing APDs in the SWIR spectral range. Sb-based APDs possess many characteristics of high quantum efficiency and single-carrier multiplication to provide a high signal-to-noise ratio. In addition, other material systems also show great promise for low-noise short-wavelength infrared avalanche photodetectors, such as AlInAsSb on InP, or AlGaAsSb on GaSb, or AlAsSb on InP or InAlAs on an InP substrate.

[0085] The aforementioned receiver circuit, including AlInAsSb APD (or similar special material APD), can be used and applied not only in the measuring device according to the invention, but also in any other type of laser scanner (such as a terrestrial laser scanner) / reality capture scanner (e.g., see the following products from Leica Geosystems AG: “Leica RTC360”, “Leica BLK2GO”, or “Leica BLK360”) or airborne laser scanner and used or applied therein.

[0086] Although the invention has been illustrated above with reference in part to some preferred embodiments, it must be understood that various modifications and combinations of different features of the embodiments are possible. All such modifications are within the scope of the appended claims.

Claims

1. A measuring device (20), the measuring device (20) comprising: Base (20b). Construction (20a), which is arranged on the base (20b) and is pivotable or rotatable about a pivot axis (22), the construction (20a) having a main frame with at least one column (27a), A targeting unit (30) is attached to the main frame, wherein the targeting unit (30) is pivotable or rotatable about a targeting unit rotation axis (21), wherein the targeting unit (30) has at least a emitting unit for emitting a first laser beam, the emitting unit defining an optical target axis. A first angle measurement function (24) is used to obtain at least one pivot angle defined by the relative pivot position of the structure (20a) relative to the base (20b). Scanning module (10), the scanning module (10) includes: A beam deflection element (11) is used to deflect the scanning laser beam (60). The beam deflection element is rotatable about a rotation axis (12) in a motorized manner, wherein the rotation axis (12) in the receiving state is at a defined angle relative to the pivot axis (22). The second angle measurement function is used to determine the rotation angle based on the angular position of the beam deflection element (11). The scanning module (10) has a field of view defined at least by the orientation of the rotation axis (12) and the beam deflection element (11) relative to the rotation axis (12), the field of view being within the scanning surface, wherein, when the scanning module (10) rotates within the angular field of view about the rotation axis (12), the deflected scanning laser beam (60) is within the field of view, wherein the angular field of view rotation range includes a central rotation angle, and wherein, at the central rotation angle, the beam deflection element (11) is configured to deflect the scanning laser beam (60) in the centerline direction (32) corresponding to the geometrically average angle within the angular field of view rotation range. • A control and processing unit, which is used for data processing and controlling the measuring device (20). Its features are, The scanning module (10) is arranged on the main frame and / or the aiming unit (30) in such a way that the centerline direction (32) is deviated from the orthogonality of the pivot axis (22) by a maximum of 45 degrees.

2. The measuring device (20) according to claim 1, characterized in that, The measuring device (20) is a total station, stadia, theodolite, or laser tracker, wherein the scanning surface is implemented as a scanning plane. The control and processing unit is used to control the aiming unit (30) and the scanning module (10).

3. The measuring device (20) according to claim 1, characterized in that, The scanning module (10) is arranged on the main frame in a non-removable manner.

4. The measuring device (20) according to any one of claims 1 to 3, characterized in that, The scanning module (10) is arranged on the first column (27a) of the at least one column of the main frame, and / or The scanning module (10c) is arranged below the aiming unit (30) and / or laterally shifted relative to the aiming unit (30).

5. The measuring device (20) according to any one of claims 1 to 3, characterized in that, The main frame includes at least two columns (27a, 27b), and Another scanning module (10b) with another rotation axis and another beam deflection element is arranged on the second column (27b), and / or • A camera is installed on the second column (27b).

6. The measuring device (20) according to any one of claims 1 to 3, characterized in that, The center point of the scanning module (10) and the aiming unit (30) and / or another center point of the other scanning module and the aiming unit (30) are arranged at substantially the same height relative to the structure (20a).

7. The measuring device (20) according to claim 6, characterized in that, The center point and / or the other center point are laterally shifted relative to the aiming unit (30).

8. The measuring device (20) according to claim 5, characterized in that, The field of view is in the scanning plane and is greater than or equal to 180 degrees, and / or the other field of view of the other scanning module (10b) is greater than or equal to 180 degrees, the other field of view being at least defined by the other rotation axis and in the other scanning plane, wherein the scanning module (10) and / or the other scanning module (10b) are arranged on the structure (20a) and / or the aiming unit (30) in such a way that the field of view and / or the other field of view includes the zenith of the measuring device (20).

9. The measuring device (20) according to claim 8, characterized in that, The pivot axis (22) is in the scanning plane, and / or the pivot axis (22) is in another scanning plane.

10. The measuring device (20) according to claim 8, characterized in that, The pivot axis (22) is parallel to the scanning plane and laterally displaced relative to the scanning plane, and / or the pivot axis (22) is parallel to the other scanning plane and laterally displaced relative to the other scanning plane.

11. The measuring device (20) according to claim 8, characterized in that, The scanning plane is inclined (31) relative to the pivot axis (22), and the pivot axis (22) intersects the scanning plane at one intersection point, and / or the other scanning plane is inclined relative to the pivot axis (22), and the pivot axis (22) intersects the other scanning plane at another intersection point.

12. The measuring device (20) according to any one of claims 1 to 3, characterized in that, The control and processing unit is configured to synchronize the operation of the scanning module (10) with the pivoting or rotation of the structure (20a) about the pivot axis (22).

13. The measuring device (20) according to any one of claims 1 to 3, characterized in that, The beam deflection element is implemented as a deflection mirror, which is configured to be fully rotatable about the rotation axis (12), and / or the deflection mirror is mechanically attached to the scanning module (10) only on one side of the deflection mirror, and / or the deflection mirror is mechanically and completely shielded by the housing of the scanning module (10), a portion of which is implemented as an opaque cover, which is configured to allow light having the frequency of the scanning laser beam (60) to pass through.

14. The measuring device (20) according to any one of claims 1 to 3, characterized in that, The aiming unit (30) is configured to rotate about the aiming unit rotation axis (21) at a rotation frequency of up to 30 Hz.

15. The measuring device (20) according to claim 14, characterized in that, The aiming unit (30) is configured to rotate about the aiming unit rotation axis (21) at a rotation frequency of up to 10 Hz.

16. The measuring device (20) according to any one of claims 1 to 3, characterized in that, The control and processing unit is configured to cause the structure (20a) to rotate completely about the pivot axis (22).

17. The measuring device (20) according to any one of claims 1 to 3, wherein, When the aiming unit (30) rotates about the aiming unit rotation axis (21), the aiming unit rotation plane is generated by the optical target axis, and the aiming unit rotation plane is therefore perpendicular to the aiming unit rotation axis (21). Its features are, The scanning module (10) is arranged on the structure (20a) in such a way that the scanning module (10) does not intersect with the rotation plane of the aiming unit.

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