Foreign object inspection device
By combining X-ray and infrared detection, the foreign object inspection device solves the problem of separating the inspection of hard and soft materials in the existing technology, and realizes compact, efficient and accurate foreign object detection.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- HAMAMATSU PHOTONICS KK
- Filing Date
- 2021-04-30
- Publication Date
- 2026-06-12
AI Technical Summary
Existing X-ray inspection devices are ineffective at detecting soft foreign objects such as plastic, insects, hair, and mold. Infrared inspection devices, on the other hand, use different technologies than X-ray inspection devices, resulting in the need to equip two separate devices for comprehensive foreign object inspection, which lacks compactness and efficiency.
A foreign object inspection device was designed, which combines X-ray and infrared detection. By synchronously controlling the irradiation and detection of X-rays and infrared rays, an overlapping image is generated, enabling compact inspection of hard and soft materials, and protecting the device from radiation effects through protective components.
It enables compact inspection of both hard and soft materials, improves inspection accuracy, reduces item deviation between devices, and prevents radiation damage to infrared detection components, thus enabling high-precision foreign object detection.
Smart Images

Figure CN115885170B_ABST