Flat panel sensor detection system and flat panel sensor detection method

Abstract

A flat panel sensor detection method includes the following steps: when the flat panel sensor is illuminated by a light source, enabling a first driving circuit of the flat panel sensor and disabling a second driving circuit of the flat panel sensor, wherein the first driving circuit and the second driving circuit are configured to provide a plurality of scanning signals to a plurality of scanning lines of a sensing panel of the flat panel sensor; obtaining a first sensing image generated by the sensing panel through a readout circuit; and comparing a plurality of first brightness values ​​of a plurality of first regions in the first sensing image to identify at least one abnormal scanning line among the scanning lines.

Description

Technical Field

[0001] The present disclosure relates to a technology for sensing light intensity to generate images, and more particularly to a system and method for detecting whether there is an abnormality in the assembly of a flat panel sensor. Background Art

[0002] A flat panel detector (FPD) utilizes photoelectric conversion technology to convert X-ray signals into electrical signals, representing the X-ray signal intensity as a digital image. Compared to traditional film, FPDs offer higher sensitivity, shortening human exposure to X-rays and reducing the radiation dose received. However, deviations in the assembly of FPDs can lead to errors in the resulting digital image, affecting the interpretation of the image. Summary of the Invention

[0003] The present disclosure relates to a flat panel sensor testing method comprising the following steps: when the flat panel sensor is illuminated by a light source, enabling a first driving circuit of the flat panel sensor and disabling a second driving circuit of the flat panel sensor, wherein the first driving circuit and the second driving circuit are configured to provide a plurality of scanning signals to a plurality of scanning lines of a sensing panel of the flat panel sensor; obtaining a first sensing image generated by the sensing panel through a readout circuit; and comparing a plurality of first brightness values ​​of a plurality of first regions in the first sensing image to identify at least one abnormal scanning line among the scanning lines.

[0004] The present disclosure also relates to a flat panel sensor detection system comprising a flat panel sensor and a processor. The flat panel sensor comprises a sensing panel, a first driving circuit, and a second driving circuit. The sensing panel has a plurality of scan lines. The first driving circuit is electrically connected to a plurality of first ends of the scan lines. The second driving circuit is electrically connected to a plurality of second ends of the scan lines. The processor is electrically connected to the flat panel sensor. When the flat panel sensor is illuminated by a light source, the processor is configured to enable the first driving circuit and disable the second driving circuit to obtain a first sensed image. The processor is further configured to compare a plurality of first brightness values ​​of a plurality of first regions in the first sensed image to identify at least one abnormal scan line among the scan lines.

[0005] The present disclosure also relates to a flat panel sensor inspection method, comprising the following steps: when a sensing panel of the flat panel sensor is illuminated by a light source, driving a first driving circuit of the flat panel sensor to scan a plurality of scanning lines on the sensing panel to obtain a first sensing image; when the flat panel sensor is illuminated by the light source, driving a second driving circuit of the flat panel sensor to scan the scanning lines on the sensing panel to obtain a second sensing image; and comparing the brightness of the first sensing image and the second sensing image to identify at least one abnormal scanning line among the scanning lines.

[0006] Therefore, by driving different driving circuits separately, obtaining a sensed image and performing brightness analysis, the abnormal position in the sensed image can be accurately identified, and hardware assembly errors on the flat panel sensor can be discovered accordingly. BRIEF DESCRIPTION OF THE DRAWINGS

[0007] Figure 1A Schematic diagram of a flat panel sensor detection system according to some embodiments of the present disclosure.

[0008] Figure 1B Schematic diagram of a flat panel sensor detection system according to some embodiments of the present disclosure.

[0009] Figure 2 1 is a flowchart of the steps of a flat panel sensor detection method according to some embodiments of the present disclosure.

[0010] Figure 3 FIG. 1 is a schematic diagram of a process for generating a sensing image by a flat panel sensor according to some embodiments of the present disclosure.

[0011] Figure 4A FIG. 1 is a schematic diagram of a first sensing image generated by a flat panel sensor according to some embodiments of the present disclosure.

[0012] Figure 4B FIG. 1 is a schematic diagram of a second sensing image generated by a flat panel sensor according to some embodiments of the present disclosure.

[0013] Figures 5A to 5C FIG. 1 is a schematic diagram of sensing images generated by a flat panel sensor according to some embodiments of the present disclosure.

[0014] Figure 6 FIG. 4 is a diagram showing the relationship between X-ray dose and image reading value of a flat panel sensor according to some embodiments of the present disclosure. DETAILED DESCRIPTION

[0015] The following diagrams illustrate various embodiments of the present invention. For clarity, many practical details are included in the following description. However, it should be understood that these practical details are not intended to limit the present invention. In other words, in some embodiments of the present invention, these practical details are not essential. Furthermore, to simplify the drawings, some commonly used structures and components are depicted in a simplified schematic manner.

[0016] In this document, when an element is referred to as being "connected" or "coupled," it may refer to being "electrically connected" or "electrically coupled." "Connected" or "coupled" may also refer to the coordinated operation or interaction between two or more elements. Furthermore, while terms such as "first," "second," and so on are used herein to describe different elements, these terms are used solely to distinguish between elements or operations described using the same technical terms. Unless the context clearly indicates otherwise, these terms are not intended to specifically designate or imply a sequence or order, nor are they intended to limit the present invention.

[0017] Figure 1A and 1B Figure 2 is a schematic diagram of a flat panel sensor inspection system according to some embodiments of the present disclosure. The flat panel sensor inspection system includes a light source device L, a flat panel sensor 100, and a processor 200. The light source device L generates test light (e.g., X-rays), which passes through an object or a human body before irradiating the flat panel sensor 100.

[0018] The flat panel sensor 100 includes a first driving circuit 110, a second driving circuit 120, a sensor panel 130, a readout circuit 140, and a control circuit 150. The sensor panel 130 is provided with a plurality of rows of scan lines SL and a plurality of columns of data lines DL for driving a plurality of pixel units (not shown) on the sensor panel 130. In one embodiment, the sensor panel 130 may be a thin film transistor image sensor panel, wherein the thin film transistors may include amorphous silicon, low-temperature polycrystalline silicon (LTPS), indium gallium zinc oxide (IGZO), or other materials, but the present disclosure is not limited thereto.

[0019] like Figure 1A As shown, in some embodiments, the flat panel sensor 100 further includes a scintillator 131. The scintillator 131 is disposed above the sensor panel 130 to receive X-rays generated by the light source device L and convert the X-rays into visible light signals. Each pixel unit in the sensor panel 130 can convert the visible light signal into an electrical signal using a photoelectric element (e.g., a photodiode), which then outputs a sensing signal through a transistor. The sensing signal reflects the intensity of the light source projected onto the corresponding pixel unit.

[0020] The first driving circuit 110 and the second driving circuit 120 are respectively arranged on both sides of the sensing panel 130 and are electrically connected to the two ends of the scanning line SL. In other words, the first driving circuit 110 is electrically connected to the first end of the scanning line SL, and the second driving circuit 120 is electrically connected to the second end of the scanning line SL. The first driving circuit 110 and the second driving circuit 120 can transmit scanning signals to drive each scanning line SL in sequence, so that the pixel units on the sensing panel 130 output corresponding sensing signals according to the voltage on the data line DL and the electrical signal converted from the visible light signal. The "scanning signal" can be a gate signal with a gate-on voltage level, such as a gate pulse signal. This architecture is a "dual driving architecture", and the first driving circuit 110 and the second driving circuit 120 will provide the same gate pulse signal to the two ends of the same scanning line SL.

[0021] The readout circuit 140 is electrically connected to the data line DL of the sensing panel 130 to provide a voltage to the data line or receive a sensing signal generated by a pixel unit of the sensing panel 130 .

[0022] The control circuit 150 is electrically connected to the first driver circuit 110, the second driver circuit 120, the sensor panel 130, and the readout circuit 140 to drive the first driver circuit 110 and the second driver circuit 120 and receive sensing signals from the readout circuit 140. The control circuit 150 digitizes all sensing signals to generate image data corresponding to the intensity of light projected onto the sensor panel 130. Since those skilled in the art are familiar with the principle of converting X-rays to generate images through the scintillator 131, further details are omitted here.

[0023] The processor 300 is electrically connected to the control circuit 150 and is configured to receive image data and analyze the image data to determine whether there are any anomalies in the assembly of the various components of the flat panel sensor 100. For example, if the bonding between the first driver circuit 110 / the second driver circuit 120 and the sensor panel 130 is not ideal, the image data generated by the flat panel sensor 100 may contain noise or erroneous images.

[0024] The present disclosure adjusts the detection method so that the flat panel sensor detection system can accurately identify whether there is a hardware assembly error in the flat panel sensor 100 . Figure 2 FIG. 1 is a flow chart of a flat panel sensor detection method according to some embodiments of the present disclosure, which is described below with reference to FIG. 1 and FIG. 2 .

[0025] In step S201, the light source device L generates test light (e.g., X-rays) to illuminate the sensor panel 130. In step S202, the control circuit 150 enables / drives the first driver circuit 110 but disables (or maintains in a standby state) the second driver circuit 120, causing the first driver circuit 110 to sequentially provide a scan signal to each scan line SL. At this point, the second driver circuit 120 is not driven, but the second driver circuit 120 still maintains the scan line SL at a fixed voltage based on its internal bias voltage. In other words, the first driver circuit 110 provides an enable voltage (i.e., a scan signal) to the first end of the scan line SL, while the second driver circuit 120 fixes the second end of the scan line SL at a fixed voltage.

[0026] In step S203 , the scan line SL outputs a sensing signal to the reading circuit 140 . The control circuit 150 receives the sensing signal corresponding to each pixel unit through the reading circuit 140 and generates a first sensing image accordingly.

[0027] Specifically, see Figure 3 Figure 1 shows a schematic diagram of the stages of driving the flat panel sensor 130 to generate an image. Before providing a scan signal, the control circuit 125 first controls the first driver circuit 121 to output a high voltage, then a low voltage, to the scan lines SL to perform a clean process (P301). Next, the sensor panel 123 is illuminated by a light source in an exposure process (P302), while the first driver circuit 121 sequentially scans the scan lines SL. After a front delay process (P303), the readout circuit 124 receives the sensing signal to perform an acquire process (P304). Finally, the control circuit 125 acquires the sensing signal in a data transfer process (P305) and generates a first sensed image.

[0028] In step S204, after obtaining the first sensing image, the control circuit 150 transmits the first sensing image to the processor 200 for analysis. The processor 200 compares the first brightness values ​​of the first regions in the first sensing image to identify regions with abnormal brightness (e.g., where the difference between the brightness and the overall average value is greater than a set value). Figure 4A Schematic diagram of the first sensing image F1 according to some embodiments of the present disclosure. In one embodiment, the processor 200 divides the first sensing image F1 into a plurality of first regions. For example, from a side of the sensing panel 130 corresponding to the first scanning circuit 110 ( Figure 4A The left side of the image processing apparatus 100 sets the length and width to capture a plurality of first regions 401-404.

[0029] Next, the processor 200 compares the difference of each first brightness according to the first brightness of each first area 401-404 to find the first abnormal area in the first area. Figure 4A As shown, most areas of the first sensor image F1, like first areas 401 and 402, lack any patterns or lines. However, first areas 403 and 404, respectively, have black and white lines. This causes the brightness of first areas 403 and 404 to be significantly different from that of other first areas (e.g., first areas 401 and 402). Therefore, the processor 200 designates first areas 403 and 404 as first abnormal areas. Based on the coordinates or positions of first areas 403 and 404 in the first sensor image F1, the processor 200 can further determine that the corresponding scan line SL on the sensor panel 130 (e.g., scan line 80) has an assembly error.

[0030] The aforementioned steps S201 to S204 only drive the first driving circuit 110 to detect abnormal scan lines. In other embodiments, in order to identify abnormal scan lines at different angles, the second driving circuit 120 may be driven to perform detection through steps S205 to S207.

[0031] In step S205, while the light source device L continues to illuminate the sensor panel 130, the control circuit 150 enables the second driver circuit 120 but disables the first driver circuit 110, causing the second driver circuit 120 to sequentially provide a scan signal to each scan line SL. At this point, the first driver circuit 110 is not driven, but it still maintains the scan line SL at a constant voltage based on its internal bias voltage.

[0032] In step S206 , the scan line SL outputs a sensing signal to the readout circuit 140 . The control circuit 150 receives the sensing signal corresponding to each pixel unit through the readout circuit 140 and generates a second sensing image accordingly.

[0033] In step S207, after obtaining the second sensing image, the control circuit 150 transmits the second sensing image to the processor 200 for analysis. The processor 200 compares the second brightness values ​​of the second regions 405-408 in the second sensing image to identify regions with abnormal brightness. Figure 4B As shown, second region 407 has a white line and second region 408 has a black line. Their brightness is clearly different from other second regions (e.g., second regions 405 and 406). Therefore, processor 200 can classify second regions 407 and 408 as abnormal regions. Similarly, processor 200 can determine abnormal scan lines based on the coordinates of the abnormal regions.

[0034] In step S208, the processor 200 compares the brightness of the first and / or second sensor images to determine abnormal regions in the first and / or second sensor images, thereby identifying abnormal scan lines. In other words, based on the first abnormal region found in the first sensor image F1 and the second abnormal region found in the second sensor image F2, the processor 200 can determine the abnormal scan line based on the coordinates of the "intersection" or "union" of the first and second abnormal regions.

[0035] For example, if Figure 4A and 4B As shown, after identifying the first abnormal region and the second abnormal region in the first sensing image F1 and the second sensing image F2, the processor 200 can determine whether the coordinates of the first abnormal region are the same as the coordinates of the second abnormal region. If the coordinates of the first abnormal region are the same as the coordinates of the second abnormal region (for example, the first region 403 corresponds to the second region 407, and the first region 404 corresponds to the second region 408), the processor 200 then calculates the abnormal scan line based on the coordinates of the first abnormal region / the second abnormal region.

[0036] By driving the first driving circuit 110 and the second driving circuit 120 separately to generate different sensing images, clear images of different sides of the sensing panel 300 can be seen respectively, so as to accurately identify possible assembly errors. Figures 5A to 5C : These are actual detection images according to some embodiments of the present disclosure. It can be clearly seen from the figure that there are multiple areas ER with abnormal brightness on each of the first sensing image F1 and the second sensing image F2. The white lines in the first sensing image F1 represent errors in the lamination process on the side of the sensing panel 130 corresponding to the first scanning circuit 110 (i.e., the left side). On the other hand, the black lines in the first sensing image F1 represent errors in the lamination process on the side of the sensing panel 130 corresponding to the second scanning circuit 120 (i.e., the right side). This is because the second scanning circuit 120 does not provide a scanning signal at this time and only fixes the scanning line SL at a fixed voltage, resulting in black lines.

[0037] Furthermore, in some embodiments, after identifying an abnormal scan line, the control circuit 150 may also simultaneously enable the first driver circuit 110 and the second driver circuit 120 to obtain a third sensing image via the readout circuit. Since the method for generating the third sensing image F3 is similar to the method for generating the first and second sensing images, a detailed description thereof will not be repeated here.

[0038] As above, Figure 5C As shown, the processor 200 can compare the third brightness of multiple third areas on the third sensing image F3 to find out the abnormal area with abnormal brightness (e.g.: Figure 5C, the region ER with vertical white lines), thereby identifying abnormal data lines with lamination problems on the sensor panel 130.

[0039] Specifically, when comparing the brightness of multiple regions within the first sensor image F1, the second sensor image F2, and the third sensor image F3 to identify regions with abnormal brightness, the processor 200 may calculate the average brightness of all regions as a "determination threshold." If the difference between the brightness of any region and the threshold exceeds a set value, the region is identified as an abnormal region. In other embodiments, the processor 200 may also set a fixed threshold as the determination threshold and use it in conjunction with the brightness value of each region. Alternatively, the processor 200 may use the median of the brightness values ​​of all regions as the determination threshold to identify regions with abnormal brightness.

[0040] In the aforementioned embodiment, the flat panel sensor detection system uses processor 200 to identify abnormal areas and analyze abnormal scan lines. However, in other embodiments, processor 200 may be integrated into flat panel sensor 100. Alternatively, the aforementioned operations may be performed by control circuit 150 of flat panel sensor 100 without outputting to processor 200.

[0041] Furthermore, the flat panel sensor inspection method described in the aforementioned embodiment is performed during the factory inspection phase of the flat panel sensor 100. In other embodiments, the flat panel sensor inspection method of the present disclosure can also be performed during the pixel inspection phase. In other words, when performing the flat panel sensor inspection method, a scintillator may not be required on the flat panel sensor 100, and the light source device L can directly project visible light onto the sensor panel 130. As a result, the sensor panel 130 can still generate a corresponding sensing image through its internal photoelectric elements. In other words, after performing the flat panel sensor inspection method and confirming that there are no lamination or other hardware assembly issues with the flat panel sensor 100, the scintillator can be installed on the sensor panel 130.

[0042] Figure 6 FIG. 1 is a diagram showing the relationship between image reading values ​​when the flat panel sensor 100 receives different doses of X-rays. Figure 6 When the curve approaches saturation (reading value of approximately 60,000), it can be regarded as the highest dose (100%) of X-ray sensing. As shown in the figure, in the dose corresponding to the linear operating region LR, the X-ray dose intensity and the image reading value are linearly related. Although the higher the X-ray dose, the clearer the image will be, it will also shorten the service life of the components in the flat panel sensor 100. In some embodiments, the flat panel sensor detection system of the present disclosure can control the X-ray dose projected by the light-emitting device L (for example, controlling the X-ray dose to below 50%) and still clearly identify abnormal scan lines, thereby achieving a balance between detection accuracy and component life.

[0043] The various elements, method steps or technical features in the aforementioned embodiments may be combined with each other and are not limited to the order of textual description or diagram presentation in this disclosure.

[0044] Although the present disclosure has been disclosed above in the form of implementation methods, it is not intended to limit the present disclosure. Anyone skilled in the art may make various changes and modifications without departing from the spirit and scope of the present disclosure. Therefore, the scope of protection of the present disclosure shall be determined by the scope of the attached patent application.

[0045]

Explanation of symbols

[0046] L: Light source device

[0047] 100: Flat panel sensor

[0048] 110: First driving circuit

[0049] 120: Second driving circuit

[0050] 130: sensor panel

[0051] 131: Scintillator

[0052] 140: Reading circuit

[0053] 150: Control circuit

[0054] 200: Processor

[0055] 401-404: First Area

[0056] 405-408: Second Area

[0057] S201-S208: Steps

[0058] F1: First sensor image

[0059] F2: Second sensor image

[0060] F3: Third sensor image

[0061] ER:Region

[0062] DL: data line

[0063] SL: Scan Line

[0064] LR: Linear operating region

[0065] P301: Reset program

[0066] P302: Exposure Procedure

[0067] P303: Standstill Delay Procedure

[0068] P304: Reading Program

[0069] P305:Transfer procedure.

Claims

1. A flat panel sensor detection method, comprising: When a flat panel sensor is illuminated by a light source, enabling a first driving circuit of the flat panel sensor and disabling a second driving circuit of the flat panel sensor, wherein the first driving circuit and the second driving circuit are used to provide a plurality of scanning signals to a plurality of scanning lines of a sensing panel of the flat panel sensor; Obtaining a first sensing image generated by the sensing panel through a reading circuit; comparing a plurality of first brightness values ​​of a plurality of first regions in the first sensing image to identify at least one abnormal scan line among the scan lines; and The light source is projected through a light source device, wherein the light source includes an X-ray, and the dose of the X-ray is less than or equal to 50%.

2. The flat panel sensor detection method according to claim 1 , wherein the method of enabling the first driving circuit of the flat panel sensor and disabling the second driving circuit of the flat panel sensor comprises: transmitting at least one enabling voltage to a first end of at least one of the scan lines through the enabled first driving circuit; and A second end of the at least one of the scan lines is fixed at a fixed voltage through the disabled second driving circuit.

3. The flat panel sensor detection method according to claim 1 , further comprising: enabling the second driving circuit and disabling the first driving circuit to obtain a second sensing image through the reading circuit; and The second brightness values ​​of the second regions in the second sensing image are compared to identify the at least one abnormal scan line among the scan lines.

4. The flat panel sensor detection method according to claim 1 , further comprising: An X-ray from the light source is converted into visible light through a scintillator in the sensing panel.

5. The flat panel sensor detection method according to claim 1 , wherein a method of comparing the first brightness values ​​of the first areas in the first sensing image comprises: comparing differences between the first brightness values ​​to find at least one first abnormal area in the first areas; A coordinate of the at least one first abnormal region in the first sensing image is obtained to identify the at least one abnormal scanning line.

6. The flat panel sensor detection method according to claim 1 , further comprising: Simultaneously enabling the first driving circuit and the second driving circuit to obtain a third sensing image through the reading circuit; and A plurality of third brightness values ​​of a plurality of third areas in the third sensing image are compared to identify at least one abnormal data line on the sensing panel.

7. A flat panel sensor detection system comprising: A flat sensor comprising: a sensing panel having a plurality of scanning lines; a first driving circuit electrically connected to the first ends of the scan lines; and a second driving circuit electrically connected to the second ends of the scan lines; and a processor electrically connected to the flat panel sensor, wherein when the flat panel sensor is illuminated by a light source, the processor is configured to enable the first driving circuit and disable the second driving circuit to obtain a first sensing image; The processor is further configured to compare a plurality of first brightness values ​​of a plurality of first regions in the first sensing image to identify at least one abnormal scanning line among the scanning lines, and The light source includes an X-ray, and the dosage of the X-ray is less than or equal to 50%. 8 . The flat panel sensor detection system as claimed in claim 7 , wherein the flat panel sensor further comprises a scintillator, the scintillator being configured to convert the X-ray into visible light. 9 . The flat panel sensor detection system as claimed in claim 7 , wherein when the processor disables the second driving circuit, the second driving circuit is configured to fix the second ends of the scan lines at a fixed voltage. 10 . The flat panel sensor detection system as claimed in claim 7 , wherein the processor is configured to compare differences between the first brightness values ​​to find at least one first abnormal area in the first areas.

11. The flat panel sensor detection system of claim 10 , wherein the processor is further configured to enable the second driving circuit and disable the first driving circuit to obtain a second sensing image; and the processor is configured to identify the at least one abnormal scanning line among the scanning lines based on the first sensing image and the second sensing image.

12. The flat panel sensor detection system of claim 11 , wherein the processor is further configured to compare a plurality of second brightness values ​​of a plurality of second regions in the second sensing image to identify at least one second abnormal region among the second regions, and when coordinates of the at least one first abnormal region are the same as coordinates of the at least one second abnormal region, the processor is configured to identify the at least one abnormal scan line based on the coordinates of the at least one first abnormal region.

13. A flat panel sensor detection method, comprising: When a sensing panel of a flat panel sensor is illuminated by a light source, driving a first driving circuit of the flat panel sensor to scan a plurality of scanning lines on the sensing panel to obtain a first sensing image; When the flat panel sensor is illuminated by the light source, driving a second driving circuit of the flat panel sensor to scan the scanning lines on the sensing panel to obtain a second sensing image; comparing the brightness of the first sensing image and the second sensing image to identify at least one abnormal scanning line among the scanning lines; and The light source is projected through a light source device, wherein the light source includes an X-ray, and the dose of the X-ray is less than or equal to 50%.

14. The flat panel sensor detection method according to claim 13, further comprising: disabling the second driving circuit when driving the first driving circuit of the flat panel sensor; and When driving the second driving circuit of the flat panel sensor, the first driving circuit is disabled.

15. The flat panel sensor detection method according to claim 13, wherein the method of comparing the brightness of the first sensing image and the second sensing image comprises: Obtaining a plurality of first brightness values ​​of a plurality of first areas in the first sensing image; comparing differences between the first brightness values ​​to find at least one first abnormal area in the first areas; and The at least one abnormal scanning line is identified according to a coordinate of the at least one first abnormal region in the first sensing image.

16. The flat panel sensor detection method according to claim 15, wherein the method of comparing the brightness of the first sensing image and the second sensing image further comprises: obtaining a plurality of second brightness values ​​of a plurality of second areas in the second sensing image; comparing differences between the second brightness values ​​to find at least one second abnormal area in the second areas; and When the coordinates of the at least one first abnormal region are the same as the coordinates of the at least one second abnormal region, the at least one abnormal scan line is identified according to the coordinates of the at least one first abnormal region.

17. The flat panel sensor detection method according to claim 13, further comprising: The X-ray of the light source is converted into visible light through a scintillator in the sensing panel.

18. The flat panel sensor detection method according to claim 13, further comprising: driving the first driving circuit and the second driving circuit simultaneously; obtaining a third sensing image generated by the sensing panel; and A plurality of third brightness values ​​of a plurality of third areas in the third sensing image are compared to identify at least one abnormal data line on the sensing panel.

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