Hyperspectral image sensor and method of operation thereof

By generating hyperspectral images through area scanning, multiple spectral signals are generated using a light illuminator and a photodetector, and the processor merges the sub-hyperspectral images, thus solving the problem of slow scanning speed in existing technologies and realizing high-speed hyperspectral imaging.

CN116007752BActive Publication Date: 2026-07-24SAMSUNG ELECTRONICS CO LTD +1
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Patent Information

Authority / Receiving Office
CN · China
Patent Type
Patents(China)
Current Assignee / Owner
SAMSUNG ELECTRONICS CO LTD
Filing Date
2022-08-02
Publication Date
2026-07-24

AI Technical Summary

Technical Problem

Existing hyperspectral imaging techniques, when using point scanning or line scanning methods, have low scanning speeds and are difficult to achieve the expected signal-to-noise ratio (SNR) in a short time.

Method used

The method employs a surface scanning approach, where light is simultaneously irradiated onto a portion of the object using a light illuminator. A photodetector receives the detection light and generates multiple spectral signals. The processor then generates a hyperspectral image based on these signals and merges the sub-hyperspectral images to produce a full hyperspectral image.

Benefits of technology

It improves scanning speed, increases signal-to-noise ratio (SNR), and enables high-speed scanning while maintaining scan step size and resolution.

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Abstract

A hyperspectral image sensor includes: a light irradiator configured to irradiate light to a partial region of an object; a light detector configured to receive detection light generated in the partial region in response to the irradiated light and generate spectral signals each corresponding to a respective sub-region of a plurality of sub-regions included in the partial region; and a processor configured to generate a hyperspectral image of the partial region based on the spectral signals.
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Description

[0001] Cross-references to related applications

[0002] This application is based on and claims priority to Korean Patent Application No. 10-2021-0141769, filed with the Korean Intellectual Property Office on October 22, 2021, the disclosure of which is incorporated herein by reference in its entirety. Technical Field

[0003] This disclosure relates to a hyperspectral image sensor and its operating method. Background Technology

[0004] Hyperspectral imaging is used to simultaneously measure the spectrum of each pixel in an image of an object. Compared to existing point spectroscopy, hyperspectral imaging can be used to measure the spectrum of each part of an object in a short time.

[0005] Since the corresponding pixels in an image contain spectral information, hyperspectral imaging techniques can be applied in various ways to measure the properties and characteristics of an object by capturing an image of it. For example, by using drones, satellites, aircraft, etc., to image the ground, hyperspectral imaging can be applied to agricultural condition analysis, mineral distribution, surface vegetation, pollution levels, and more. Hyperspectral imaging is also being considered for other applications in various fields such as food safety, skin / facial analysis, and biological tissue analysis.

[0006] Hyperspectral imaging techniques are used to obtain hyperspectral images by using point scanning or line scanning methods. When using point scanning or line scanning methods, the scanning speed is inevitably reduced to achieve the desired signal-to-noise ratio (SNR) because the signal is obtained only in a small area of ​​the object. Summary of the Invention

[0007] This disclosure provides a hyperspectral image sensor and its operating method. The technical problems addressed by this disclosure are not limited to those described above; other technical problems can be inferred from the following embodiments.

[0008] Additional aspects will be set forth in part in the description which follows, and will also be apparent in part from the description, or may be learned by practice of embodiments of the present disclosure.

[0009] According to one aspect of this disclosure, a hyperspectral image sensor includes: a light illuminator configured to illuminate a portion of an object; a photodetector configured to receive detection light generated in the portion of the object in response to the illumination light and to generate a plurality of spectral signals, each of the plurality of spectral signals corresponding to a corresponding sub-region among a plurality of sub-regions included in the portion of the object; and a processor configured to generate a hyperspectral image of the portion of the object based on the plurality of spectral signals.

[0010] The photodetector may include: a lens configured to receive detection light generated in a portion of the region; a spectral filter configured to receive the detection light and output a plurality of sub-spectral filter signals for each of the plurality of sub-regions, each of the plurality of sub-spectral filter signals corresponding to a different wavelength of the sub-region; and a spectral signal generator configured to generate a plurality of sub-spectral signals for each of the plurality of sub-regions based on the plurality of sub-spectral filter signals.

[0011] The processor can be further configured to generate multiple sub-hyperspectral images based on multiple sub-spectral signals, each of the multiple sub-hyperspectral images corresponding to a corresponding sub-region of multiple sub-regions, and the processor can be further configured to merge the multiple sub-hyperspectral images with each other to generate a hyperspectral image of a partial region.

[0012] For each of the multiple sub-regions, the spectral filter can output at least three sub-spectral filter signals, each of which corresponds to a different wavelength.

[0013] The spectral filter can be further configured to send multiple sub-spectral filter signals to the spectral signal generator through multiple channels.

[0014] The light illuminator can be positioned at a preset distance from the object.

[0015] The light illuminator may include an array of light sources comprising multiple light sources, and the array of light sources may be configured to emit multiple inspection lights toward a portion of the area.

[0016] The light source array can be further configured to simultaneously emit multiple inspection lights to a portion of the area.

[0017] The light illuminator may include a transmission window configured to receive detection light generated in a portion of the region.

[0018] A transmission window can be formed in the opening of the light illuminator.

[0019] The light illuminator can be further configured to emit light into a second region of the object, different from the first region, after emitting light into the first region.

[0020] The processor can be further configured to generate a full hyperspectral image of the object based on a hyperspectral image generated in a partial region and a second hyperspectral image generated in a second partial region.

[0021] The light illuminator can be further configured to emit light toward a second portion of the object, the second portion of which at least partially overlaps with the first portion of the object.

[0022] The processor can be further configured to generate a full hyperspectral image of the object by removing overlapping hyperspectral images of overlapping regions that at least partially overlap with the second partial region.

[0023] According to one aspect of this disclosure, a method of operating a hyperspectral image sensor includes: illuminating a portion of an object with light; receiving detection light generated in the portion of the object in response to the illumination light; generating a plurality of spectral signals, each of the plurality of spectral signals corresponding to a corresponding sub-region among a plurality of sub-regions included in the portion of the object; and generating a hyperspectral image of the portion of the object based on the plurality of spectral signals.

[0024] When irradiating with light, multiple inspection lights can be simultaneously irradiated onto a portion of the area.

[0025] Generating multiple spectral signals may include: outputting multiple sub-spectral filter signals for each sub-region in multiple sub-regions, each sub-spectral filter signal corresponding to a different wavelength of the sub-region; and generating multiple sub-spectral signals for each sub-region in multiple sub-regions based on the multiple sub-spectral filter signals.

[0026] Generating a hyperspectral image may include: generating multiple sub-hyperspectral images based on multiple sub-spectral signals, each of the multiple sub-hyperspectral images corresponding to a corresponding sub-region of multiple sub-regions; and merging the multiple sub-hyperspectral images with each other to generate a hyperspectral image of a portion of the region.

[0027] The operation may also include: illuminating a second portion of the object that is different from the first portion; and generating a full hyperspectral image of the object based on the hyperspectral image generated in the first portion and the second hyperspectral image generated in the second portion.

[0028] The method may further include: illuminating a second portion of the object with light, the second portion of the object at least partially overlapping the portion of the object; and generating a full hyperspectral image of the object by removing the overlapping hyperspectral image of the overlapping portion of the second portion of the object at least partially overlapping the portion of the object. Attached Figure Description

[0029] The above and other aspects, features, and advantages of some embodiments of this disclosure will become clearer from the following description taken in conjunction with the accompanying drawings, in which:

[0030] Figure 1 This is a block diagram of a hyperspectral image sensor according to an embodiment;

[0031] Figure 2 This is a conceptual diagram of a hyperspectral image sensor according to an embodiment;

[0032] Figure 3This is a conceptual diagram of a light illuminator according to an embodiment;

[0033] Figure 4 This is a conceptual diagram of a light illuminator according to an embodiment;

[0034] Figure 5 This is a conceptual diagram of a photodetector according to an embodiment;

[0035] Figure 6 This is a conceptual diagram of a photodetector according to an embodiment;

[0036] Figure 7 and Figure 8 This is a reference diagram illustrating a method for generating a hyperspectral image according to an embodiment;

[0037] Figure 9 yes Figures 7 to 8 Reference image;

[0038] Figure 10 This is a flowchart illustrating a method for generating a hyperspectral image according to an embodiment;

[0039] Figure 11 and Figure 12 This is a reference diagram illustrating a method for generating a hyperspectral image according to an embodiment;

[0040] Figure 13 This is a flowchart illustrating a method for generating a hyperspectral image according to an embodiment;

[0041] Figure 14 This is a flowchart illustrating a method for generating a full hyperspectral image according to an embodiment;

[0042] Figures 15 to 16 This is a reference image of a hyperspectral image sensor used in a clothing management device.

[0043] Figure 17 and Figure 18 This is a reference diagram showing the hyperspectral image sensor in the outdoor unit. Detailed Implementation

[0044] Referring now to the embodiments, examples of which are illustrated in the accompanying drawings, wherein similar reference numerals throughout the drawings denote similar elements. In this respect, embodiments may take different forms and should not be construed as limited to the description set forth herein. Therefore, the embodiments are described below only with reference to the accompanying drawings to explain various aspects. As used herein, the term “and / or” includes any and all combinations of one or more of the related listed items. Expressions such as “at least one of…” modify the entire list of elements when following it, rather than individual elements in the list.

[0045] Some embodiments of this disclosure can be represented by functional block configurations and various processing operations. Some or all functional block configurations can be implemented by various hardware and / or software for performing certain functions. For example, the functional blocks of this disclosure can be implemented by one or more microprocessors, or by circuit configurations for specific functions. Furthermore, for example, the functional blocks of this disclosure can be implemented by various programming or scripting languages. Functional blocks can be implemented using algorithms executed by one or more processors. Furthermore, this disclosure can employ existing technologies for electronic configurations, signal processing, data processing, etc. The terms "mechanism," "component," "device," "configuration," etc., are used broadly and are not limited to mechanical and physical configurations.

[0046] Furthermore, the connecting lines or connecting components shown in the figure are examples illustrating functional connections and / or physical or electrical connections. In actual devices, connections between components can be represented by various functional connections, physical connections, or electrical connections, which can be replaced or added.

[0047] Figure 1 This is a block diagram of a hyperspectral image sensor according to an embodiment.

[0048] Reference Figure 1 The hyperspectral image sensor 10 may include a light illuminator 100, a light detector 200, and a processor 300.

[0049] The light illuminator 100 can illuminate with light. Figure 2 The object OBJ is shown. The light illuminator 100 can illuminate a portion of the object OBJ (i.e., the inspection area). The light illuminator 100 can illuminate the object OBJ while changing the inspection area.

[0050] The illuminator 100 can be adjacent to the object OBJ. The illuminator 100 can be positioned at a predetermined distance from the object (OBJ). For example, the distance between the illuminator 100 and the object OBJ can be set to 10 cm or less, but is not limited thereto. As described below, the processor 300 generates a hyperspectral image of the object OBJ using an area scanning method instead of a line scanning or point scanning method; therefore, the illuminator 100 can be adjacent to the object OBJ.

[0051] The wavelength of the light emitted by the light illuminator 100 can be set differently depending on the type of the object OBJ. For example, when the object OBJ is meat, the light illuminator 100 can emit light with a wavelength of approximately 335 nm to approximately 370 nm. For this purpose, the light illuminator 100 may include a light-emitting diode (LED).

[0052] The photodetector 200 can receive detection light emitted from the object OBJ. In an embodiment, the detection light can indicate light emitted by the light illuminator 100, reflected by the object OBJ, and then received by the photodetector 200. In an embodiment, the detection light can indicate light emitted by the light illuminator 100, scattered by the object OBJ, and then received by the photodetector 200. In an embodiment, the detection light can also indicate fluorescence emitted from the object OBJ when light emitted by the light illuminator 100 is absorbed by the object OBJ. In an embodiment, the detection light can also indicate a Raman spectrum. However, the detection light of this disclosure is not limited to these and can indicate all light generated due to light illumination detected by the photodetector 200.

[0053] The photodetector 200 can generate a spectral signal based on the detection light. The photodetector 200 can generate a spectral signal by separating the detection light.

[0054] The photodetector 200 can receive detection light generated in the inspection area and generate spectral signals of multiple sub-inspection areas (e.g., sub-regions) included in the inspection area.

[0055] Processor 300 can receive spectral signals from photodetector 200. Processor 300 can generate a hyperspectral image of object OBJ based on the spectral signals. The hyperspectral image can indicate a combination of spectral distributions at each location of object OBJ.

[0056] Figure 2 This is a conceptual diagram of a hyperspectral image sensor according to an embodiment. Figure 3 This is a conceptual diagram of a light illuminator according to an embodiment. Figure 4 This is a conceptual diagram of a light illuminator according to an embodiment. Figure 5 This is a conceptual diagram of a photodetector according to an embodiment, and Figure 6 This is a conceptual diagram of a photodetector according to an embodiment.

[0057] Reference Figure 2 The object OBJ can be located on the support SP. The object OBJ can represent any object that may require hyperspectral imaging, such as clothing, heat exchangers, and meat.

[0058] Light illuminator 100 can be oriented towards object OBJ. Light illuminator 100 can illuminate object OBJ with light. In this case, the light emitted from light illuminator 100 can be referred to as inspection light ILa and ILb (when there is no need to distinguish between ILa and ILb in the following text, ILa and ILb are referred to as IL).

[0059] Reference Figure 3 and Figure 4The light illuminator 100 may include light source arrays 110a and 110b (hereinafter, when there is no need to distinguish between 110a and 110b, 110a and 110b are referred to as 110). The light source array 110 can emit light toward the inspection area, which is a partial area of ​​the object OBJ.

[0060] The light source array 110 may include a first light source array 110a, a second light source array 110b, and a transmission window 120. The first light source array 110a and the second light source array 110b may be separated from each other, with the transmission window 120 located between them. Both the first light source array 110a and the second light source array 110b may include multiple light sources arranged in one direction. For example, the light sources may include LEDs.

[0061] Multiple light sources can be arranged along the transmission window 120. Figure 3 The first light source array 110a and the second light source array 110b are shown to each include two rows, but are not limited thereto.

[0062] The transmission window 120 can receive the detection light OL generated by the object OBJ through light irradiation.

[0063] like Figure 3 As shown, the transmission window 120 can be formed of a transparent material. For example, the transmission window 120 can be formed of transparent plastic or glass. The transmission window 120 can also be formed of a material with high durability at low temperatures. The detection light OL can be provided to the photodetector 200 through the transmission window 120.

[0064] According to an embodiment, the transmission window 120 can be formed as follows: Figure 4 The opening shown. Detection light OL can be supplied to photodetector 200 through the opening.

[0065] Reference Figure 2 The detection light OL can be provided to the photodetector 200 through the optical path adjustment element 20. According to one embodiment, the photodetector 200 may include a hyperspectral camera.

[0066] Reference Figures 5 to 6 The photodetector 200 may include a lens 220, a spectral filter 230, and a spectral signal generator 250. According to one embodiment, the photodetector 200 may also include a slit element 210 and a condenser lens 240.

[0067] The slit element 210 can be used to extract the portion required for testing from the detection light OL. The detection light OL can be radiated from the slit element 210.

[0068] Lens 220 can receive the detection light OL passing through slit element 210. Lens 220 can adjust the detection light OL to be parallel or converged. For example, lens 220 may include a collimating lens. The collimating lens may include a convex lens.

[0069] The spectral filter 230 can separate the detection light OL provided from the lens 220. The spectral filter 230 can, as... Figure 5 The mechanical formation shown, or can be as follows Figure 6 The electrical formation is shown. For example, refer to... Figure 5 The spectral filter 230 may include a prism.

[0070] Light of different wavelengths can pass through the spectral filter 230. The spectral filter 230 can filter the detection light OL provided from the lens 220 to have spatially different wavelengths. In other words, the detection light OL passing through different regions of the spectral filter 230 can have different wavelengths. The detection light OL separated by the spectral filter 230 can be provided to the spectral signal generator 250 through the condenser lens 240. For example, the condenser lens 240 may include a convex lens.

[0071] The spectral signal generator 250 can generate a spectral signal from the detection light OL. The spectral signal generator 250 can provide the spectral signal to the processor 300.

[0072] Processor 300 can generate a hyperspectral image of object OBJ based on the spectral signal. The hyperspectral image of object OBJ can be generated by merging the spectral distribution information of each location of object OBJ. In other words, the hyperspectral image of object OBJ can be a set of spectral distributions for each location of object OBJ. For example, processor 300 can generate a hyperspectral image of object OBJ by removing offsets from multiple sub-hyperspectral images and adding the offset-removed sub-hyperspectral images together. However, the method for generating a hyperspectral image disclosed herein is not limited to this, and known methods for generating hyperspectral images can also be used.

[0073] Figure 7 and Figure 8 This is a reference diagram illustrating a method for generating hyperspectral images according to an embodiment.

[0074] Reference Figure 7 and Figure 8 The light illuminator 100 can illuminate the inspection area R1, which is a partial area of ​​the object OBJ, with light ILa and ILb. This is to distinguish... Figure 7 and Figure 8 The inspection area R1 and Figure 11 and 12 The inspection area R2 can Figure 7 and Figure 8The inspection area R1 is called the first inspection area, and can be... Figure 11 and Figure 12 The inspection area R2 is called the second inspection area R2. Alternatively, it can also be... Figure 7 and Figure 8 The inspection area R1 is called the previous inspection area R1. Figure 11 and Figure 12 The inspection area R2 is called the current inspection area R2.

[0075] The inspection area R1 may include multiple sub-inspection areas R1a, R1b and R1c (in the following text, when it is not necessary to distinguish between R1a, R1b and R1c, R1a, R1b and R1c are collectively referred to as R1a).

[0076] Reference Figure 7 The light irradiator 100 may include multiple light sources, and multiple inspection lights ILa and ILb may simultaneously illuminate the inspection area R1. Therefore, light can reach multiple sub-inspection areas R1a at the same time.

[0077] Reference Figure 8 The photodetector 200 can receive the detection light OL generated by the object OBJ in response to illumination light. For example, the detection light OL can indicate reflected light, scattered light, fluorescence, Raman spectrum, etc. However, the detection light OL of this disclosure is not limited to this, and can indicate part or all of the light generated by illumination by light detected by the photodetector 200.

[0078] The detection light OL can pass through the transmission window 120 and be provided again to the hyperspectral image sensor 10. The optical path adjustment element 20 can adjust the path of the detection light OL and provide the detection light OL to the photodetector 200.

[0079] The photodetector 200 may include a spectral filter 230 and a spectral signal generator 250, for example Figure 5 and Figure 6 As shown in the diagram, the spectral filter 230 can receive the detection light OL. The photodetector 200 can output a sub-spectral signal for each wavelength of a plurality of sub-inspection regions R1a. The spectral filter 230 can output sub-spectral filter signals of at least three different wavelengths. For example, the spectral filter 230 can output red, green, and blue sub-spectral filter signals. In other words, the plurality of sub-spectral filter signals can correspond to a single sub-inspection region R1a, and each of the plurality of sub-spectral filter signals corresponding to a single sub-inspection region R1a can have wavelengths that are different from each other among the plurality of sub-spectral filter signals corresponding to a single sub-inspection region R1a.

[0080] The spectral filter 230 can send sub-spectral filter signals to the spectral signal generator 250 through multiple channels. For example, when the spectral filter 230 separates the red, green, and blue wavelengths, the spectral filter 230 can send sub-spectral filter signals to the spectral signal generator 250 through three channels.

[0081] The spectral signal generator 250 can generate a sub-spectral signal for each of the multiple sub-inspection regions R1a based on the sub-spectral filter signal.

[0082] The spectral signal generator 250 may include a set of multiple pixels. In an embodiment, the set of multiple pixels may correspond to multiple different sub-inspection regions R1a within the inspection region R1. Each set of multiple pixels may include a set of multiple sub-pixels corresponding to multiple wavelength bands, respectively. For example, a first set of sub-pixels may measure light in a first wavelength band, a second set of sub-pixels may measure light in a second wavelength band different from the first wavelength band, and a third set of sub-pixels may measure light in a third wavelength band different from the first and second wavelength bands. Therefore, the spectral signal generator 250 can generate a sub-spectral signal for each sub-inspection region R1a.

[0083] The spectral signal generator 250 can provide subspectral signals to the processor 300.

[0084] The processor 300 can generate a sub-hyperspectral image for each of the multiple sub-inspection regions R1a based on the sub-spectral signal. The sub-hyperspectral image can include spectral distribution information of the detection light OL.

[0085] Processor 300 can merge sub-hyperspectral images to generate a hyperspectral image of the examined region R1.

[0086] Figure 9 It is used for explanation Figure 7 and Figure 8 Reference image.

[0087] Reference Figure 9 The inspection area R1 may include a first sub-inspection area R1a, a second sub-inspection area R1b, and a third sub-inspection area R1c.

[0088] The photodetector 200 may include a lens 220, a spectral filter 230, and a spectral signal generator 250. The photodetector 200 can simultaneously receive the detection light OL generated in the inspection area R1 of the object OBJ.

[0089] The photodetector 200 can separate the detection light OL based on the number of preset wavelengths. Figure 9 The detection light (OL) is shown to be divided into three bands, but the number of bands can be increased or decreased according to the embodiment.

[0090] The photodetector 200 can split the detection light generated in each of the multiple sub-inspection regions R1a, R1b, and R1c into three bands. The photodetector 200 can split the detection light generated in the first sub-inspection region R1a into three bands and output a first sub-spectral signal. The photodetector 200 can split the detection light generated in the second sub-inspection region R1b into three bands and output a second sub-spectral signal. The photodetector 200 can split the detection light generated in the third sub-inspection region R1c into three bands and output a third sub-spectral signal.

[0091] The photodetector 200 can generate sub-spectral signals for multiple sub-inspection regions R1a, R1b, and R1c based on sub-spectral filter signals. The photodetector 200 can generate a first sub-spectral signal based on a first sub-spectral filter signal. The photodetector 200 can generate a second sub-spectral signal based on a second sub-spectral filter signal. The photodetector 200 can generate a third sub-spectral signal based on a third sub-spectral filter signal. The photodetector 200 can provide the first to third sub-spectral signals to the processor 300.

[0092] The processor 300 can generate a sub-hyperspectral image for each of the multiple sub-inspection regions based on the sub-spectral signal. The processor 300 can generate a first sub-hyperspectral image I1a for a first sub-inspection region R1a based on a first sub-spectral signal. The processor 300 can generate a second sub-hyperspectral image I1b for a second sub-inspection region R1b based on a second sub-spectral signal. The processor 300 can generate a third sub-hyperspectral image I1c for a third sub-inspection region R1c based on a third sub-spectral signal.

[0093] The processor 300 can merge the first hyperspectral image I1a to the third hyperspectral image I1c to generate a hyperspectral image on the inspection region R1.

[0094] The hyperspectral image sensor 10 of this disclosure, when merging hyperspectral images, performs n measurements on the same location of the object OBJ because light of the same wavelength passes through a large number of channels, thus increasing the signal S by a factor of n. Furthermore, since there is no correlation between the N hyperspectral images, the noise N is summed according to the root mean square equation and is related to (n). 1 / 2 It is directly proportional. Therefore, under the same merging time and the same scan step size, the signal-to-noise ratio (SNR) increases to (n). 1 / 2 .

[0095] Figure 10 This is a flowchart illustrating a method for generating hyperspectral images according to an embodiment.

[0096] Reference Figure 10In operation S1010, the light illuminator 100 can illuminate the inspection area R1, which is a partial area of ​​the object OBJ.

[0097] The light irradiator 100 may include a light source array having multiple light sources, and the light source array may simultaneously emit multiple inspection lights onto the inspection area R1.

[0098] In operation S1020, the photodetector 200 can receive the detection light OL generated in the inspection area R1 by the illumination of light.

[0099] The photodetector 200 can simultaneously receive the detection light OL generated in the inspection area R1 of the object OBJ.

[0100] In operation S1030, the photodetector 200 can generate the spectral signal of each of the multiple sub-inspection regions R1a included in the inspection region R1.

[0101] The photodetector 200 can output a sub-spectral signal for each wavelength of multiple sub-inspection regions R1a. For example, three bands can be set, and the photodetector 200 can output sub-spectral signals corresponding to the red, green, and blue bands in each sub-inspection region R1a. The photodetector 200 can generate a sub-spectral signal for each sub-inspection region in the multiple sub-inspection regions R1a based on the sub-spectral filter signal.

[0102] In operation S1040, the processor 300 can generate a hyperspectral image of the inspection area R1 based on the spectral signal.

[0103] The processor 300 can generate a sub-hyperspectral image for each of the multiple sub-inspection regions R1a based on the sub-spectral signal. The processor 300 can merge the sub-hyperspectral images to generate a hyperspectral image for the inspection region R1.

[0104] The hyperspectral image sensor 10 of this disclosure can generate a hyperspectral image of a region of the object OBJ, thus enabling high-speed scanning compared to line scanning or point scanning methods. Furthermore, according to the hyperspectral image sensor 10 of this disclosure, the pixel area of ​​the spectral signal generator 250 is increased, and the hyperspectral image merging time is reduced, thus enabling high-speed scanning of the object OBJ while maintaining scanning step size and resolution. Additionally, according to the hyperspectral image sensor 10 of this disclosure, the scanning steps and resolution are reduced, thus enabling high-speed scanning of the object OBJ.

[0105] Figure 11 and Figure 12 This is a reference diagram illustrating a method for generating hyperspectral images according to an embodiment.

[0106] Reference Figure 11 and Figure 12 The light irradiator 100 can move from a position facing the first inspection area R1 to a position facing the second inspection area R2. The first inspection area R1 can be referred to as the previous inspection area, and the second inspection area R2 can be referred to as the current inspection area. The second inspection area R2 may be different from the first inspection area R1. According to an embodiment, at least a portion of the second inspection area R2 may overlap with the first inspection area R1.

[0107] also, Figure 11 and Figure 12 The hyperspectral image sensor 10 is shown to be fully movable, and the hyperspectral image sensor 10 may also include an adjustment mechanism for adjusting at least one of the position and angle of the light illuminator 100, and the light illuminator 100 may be moved according to the control of the adjustment mechanism.

[0108] The second inspection area R2 (e.g., the second part of the object OBJ) may include multiple sub-inspection areas R2a, R2b and R2c (in the following text, when it is not necessary to distinguish between R2a, R2b and R2c, R2a, R2b and R2c are collectively referred to as R2a).

[0109] Reference Figure 11 The light illuminator 100 can illuminate the object OBJ with inspection lights ILa and ILb at a position facing the second inspection area R2. The light illuminator 100 may include multiple light sources and simultaneously illuminate the second inspection area R2 with multiple inspection lights ILa and ILb. Therefore, light can reach multiple sub-inspection areas R2a simultaneously.

[0110] Reference Figure 8 The photodetector 200 can receive the detection light OL generated by the object OBJ in response to the illumination light. The photodetector 200 can output a sub-spectral signal for each wavelength of each of the multiple sub-inspection regions R1a based on the detection light OL. The photodetector 200 can generate a sub-spectral signal for each of the multiple sub-inspection regions R2a based on the sub-spectral filter signal. Figure 12 The method of generating the spectral signal in the middle can be compared with Figure 7 and Figure 8 The methods for generating sub-spectral signals are basically the same.

[0111] The processor 300 can generate a sub-hyperspectral image for each of the multiple sub-inspection regions R2a based on the sub-spectral signal. The processor 300 can merge the sub-hyperspectral images to generate a hyperspectral image for a second inspection region R2. The hyperspectral image generated in the first inspection region R1 can be referred to as the first hyperspectral image, and the hyperspectral image generated in the second inspection region R2 can be referred to as the second hyperspectral image.

[0112] Processor 300 can merge a first hyperspectral image and a second hyperspectral image to generate a full hyperspectral image of object OBJ.

[0113] Figure 13 This is a flowchart illustrating a method for generating a full hyperspectral image according to an embodiment.

[0114] Reference Figure 13 In operation S1310, the light illuminator 100 can illuminate the current inspection area R2, which is different from the previous inspection area R1. The previous inspection area R1 may not overlap with the current inspection area R2.

[0115] In operation S1320, the light illuminator 100 can generate a full hyperspectral image of the object OBJ based on a previous hyperspectral image generated in the previous inspection area R1 and a current hyperspectral image generated in the current inspection area R2.

[0116] When the previously inspected region R1 does not overlap with the current inspected region R2, the object OBJ can be scanned at high speed, and hyperspectral images can be merged at high speed.

[0117] Figure 14 This is a flowchart illustrating a method for generating a full hyperspectral image according to an embodiment.

[0118] Reference Figure 14 In operation S1410, the light illuminator 100 can illuminate the current inspection area R2, which at least partially overlaps with the previously inspected area R1.

[0119] In operation S1420, processor 300 can generate a full hyperspectral image of object OBJ by removing overlapping regions from a previous hyperspectral image generated in the previous inspection region R1 and a current hyperspectral image generated in the current inspection region R2.

[0120] In this embodiment, when merging a previous hyperspectral image with a current hyperspectral image, the processor 300 can remove the hyperspectral image of overlapping regions from either the previous or current hyperspectral image. Therefore, it is possible to prevent the hyperspectral image of overlapping regions from being reflected in the full hyperspectral image.

[0121] Figure 15 and Figure 16 This is a reference diagram showing a hyperspectral image sensor in a clothing management device.

[0122] Reference Figure 15 and Figure 16 The hyperspectral image sensor 10 can be located on the clothing management device 1500.

[0123] The garment management device 1500 can be implemented by an electronic device for removing odors, dust, or wrinkles from the garments contained inside the device by means of jetting air or steam.

[0124] The clothing management device 1500 may include a clothing management compartment 1520. An opening is formed on the front surface of the main body, and a door 1510 is rotatably connected to the main body for opening and closing. The door 1510 can be installed to open and close the clothing management compartment 1520. The door 1510 can be coupled to the main body via a connecting member such as a hinge.

[0125] The clothing management room 1520 can form a space for storing clothing. The clothing management room 1520 may include support elements to support the clothing stored therein.

[0126] The hyperspectral image sensor 10 may be located on at least one of the inner surfaces of the door 1510 and the inner surface of the garment management chamber 1520. When the door 1510 is closed, the hyperspectral image sensor 10 may be adjacent to the garments. When the garments are housed in the garment management chamber 1520, the hyperspectral image sensor 10 may be adjacent to the garments, regardless of the opening or closing of the door 1510.

[0127] The hyperspectral image sensor 10 disclosed herein can accurately sense clothing in locations not fully covered by the field of view (FOV).

[0128] When the door 1510 is closed and user input is received, the hyperspectral image sensor 10 can scan the clothing.

[0129] The garment management device 1500 can analyze the material of garments under preset conditions. For example, preset conditions may include scan length. The garment management device 1500 can select an operating mode according to the garment material. The steam intensity, heat, dehumidification, and hanger output can be changed according to the operating mode.

[0130] Figure 17 and Figure 18 This is a reference diagram showing the hyperspectral image sensor in the outdoor unit.

[0131] Reference Figure 17 and Figure 18 The hyperspectral image sensor 10 can be located on the outdoor unit 1700.

[0132] The outdoor unit 1700 may include a heat exchanger 1710 for exchanging heat with outside air. Since the outdoor unit 1700 is placed outdoors, contaminants may easily adhere to the heat exchanger 1710 due to moisture. For example, a contaminant may refer to fungi, but is not limited to this. A hyperspectral image sensor 10 may be placed adjacent to the heat exchanger 1710 to sense contaminants. The hyperspectral image sensor 10 of this disclosure can accurately sense contaminants in locations not fully covered by the field of view (FOV).

[0133] When user input is received and the preset scanning cycle is reached, the outdoor unit 1700 can scan for pollution sources attached to the heat exchanger 1710.

[0134] The outdoor unit 1700 can scan for pollution sources attached to the heat exchanger 1710 under preset conditions. For example, the preset conditions may include the scan length. When a pollution source is determined to be present, the outdoor unit 1700 can display the presence of the pollution source on the display of the indoor unit.

[0135] The outdoor unit 1700 can determine its cleaning time based on the amount of pollution source, and can remove the pollution source based on the cleaning time. For example, the outdoor unit 1700 can remove the pollution source by driving a fan.

[0136] Furthermore, the above embodiments can be implemented by a program executable by a computer, and can be implemented by a general-purpose digital computer that executes the program using a computer-readable recording medium. In addition, the data used in the above embodiments can be recorded on a computer-readable recording medium using various devices. Computer-readable recording media can include magnetic storage media (e.g., read-only memory (ROM), floppy disk, hard disk, etc.) or optical reading media (e.g., optical disc (CD)-ROM, digital video disc (DVD), etc.).

[0137] It should be understood that the embodiments described herein should be considered in a descriptive sense and not for limiting purposes only. The description of features or aspects in each embodiment should generally be considered as other similar features or aspects that may be used in other embodiments. Although one or more embodiments have been described with reference to the accompanying drawings, those skilled in the art will understand that various changes in form and detail may be made without departing from the spirit and scope defined by the appended claims and their equivalents.

Claims

1. A hyperspectral image sensor, comprising: A light illuminator is configured to illuminate a portion of an object. A photodetector is configured to receive detection light generated in the partial region in response to illumination light, and to generate a plurality of spectral signals, each of the plurality of spectral signals corresponding to a corresponding sub-region among a plurality of different sub-regions included in the partial region; as well as The processor is configured to generate a hyperspectral image of the partial region based on the plurality of spectral signals. The photodetector includes: A lens is configured to receive the detection light generated in the plurality of different sub-regions included in the partial region; A spectral filter is configured to output multiple sub-spectral filter signals for each of the plurality of different sub-regions based on the detection light, the multiple sub-spectral filter signals corresponding to multiple different wavelength bands in each of the plurality of different sub-regions; and A spectral signal generator is configured to generate multiple sub-spectral signals for each of the multiple different sub-regions based on the signals from the multiple sub-spectral filters. The processor is further configured to generate a sub-hyperspectral image corresponding to each sub-region based on the plurality of sub-spectral signals of each sub-region, and The processor is further configured to merge multiple different sub-hyperspectral images corresponding to the multiple different sub-regions to generate the hyperspectral image of the partial region.

2. The hyperspectral image sensor according to claim 1, wherein for each of the plurality of different sub-regions, the spectral filter outputs at least three sub-spectral filter signals.

3. The hyperspectral image sensor according to claim 1, wherein, The spectral filter is further configured to send the signals of the plurality of sub-spectral filters to the spectral signal generator through multiple channels.

4. The hyperspectral image sensor according to claim 1, wherein, The light irradiator is positioned at a predetermined distance from the object.

5. The hyperspectral image sensor according to claim 1, wherein, The light irradiator includes a light source array, which comprises multiple light sources, and The light source array is configured to emit multiple inspection lights toward the partial area.

6. The hyperspectral image sensor according to claim 5, wherein, The light source array is further configured to simultaneously emit the plurality of inspection lights toward the partial area.

7. The hyperspectral image sensor according to claim 1, wherein, The light illuminator includes a transmission window configured to receive the detection light generated in the partial region.

8. The hyperspectral image sensor according to claim 7, wherein, The transmission window is formed in the opening of the light irradiator.

9. The hyperspectral image sensor according to claim 1, wherein, The light illuminator is further configured to emit light into a second portion of the object, different from the first portion, after emitting light into the first portion.

10. The hyperspectral image sensor according to claim 9, wherein, The processor is further configured to generate a full hyperspectral image of the object based on the hyperspectral image generated in the second partial region and a second hyperspectral image generated in the second partial region.

11. The hyperspectral image sensor according to claim 1, wherein, The light illuminator is further configured to emit light toward a second portion of the object, the second portion of which at least partially overlaps with the first portion of the object.

12. The hyperspectral image sensor according to claim 11, wherein, The processor is further configured to generate a full hyperspectral image of the object by removing overlapping hyperspectral images of overlapping regions that at least partially overlap with the second partial region.

13. A method for operating a hyperspectral image sensor, the method comprising: To illuminate a portion of an object; Receive detection light generated in the specified region in response to illumination light; Multiple spectral signals are generated, each of which corresponds to a corresponding sub-region among multiple different sub-regions included in the partial region; as well as A hyperspectral image of the specified region is generated based on the multiple spectral signals. Generating the plurality of spectral signals includes: Based on the detection light, multiple sub-spectral filter signals are output for each of the multiple different sub-regions, and the multiple sub-spectral filter signals correspond to multiple different wavelength bands in each of the multiple different sub-regions; and Based on the signals from the multiple sub-spectral filters, multiple sub-spectral signals are generated for each of the multiple different sub-regions, and Generating the hyperspectral image includes: A sub-hyperspectral image corresponding to each sub-region is generated based on the plurality of sub-spectral signals of each sub-region; and Multiple different sub-hyperspectral images corresponding to the multiple different sub-regions are merged with each other to generate the hyperspectral image of the partial region.

14. The operating method according to claim 13, wherein, When the light is applied, multiple inspection lights are simultaneously applied to the partial area.

15. The operating method according to claim 13, further comprising: Light is shone onto a second portion of the object that is different from the first portion of the object; as well as A full hyperspectral image of the object is generated based on the hyperspectral image generated in the first part region and the second hyperspectral image generated in the second part region.

16. The operating method according to claim 13, further comprising: Light is shone onto a second portion of the object, the second portion of which at least partially overlaps with the first portion of the object; as well as A full hyperspectral image of the object is generated by removing overlapping hyperspectral images of overlapping regions that at least partially overlap with the second partial region.