A load distribution method and apparatus

Abstract

The application discloses a load distribution method and device. The load distribution of a functional device is adjusted by taking the working temperature of the functional device as a feedback source. Since the working temperature is greatly related to the actual load, the reasonable load scheduling can be more accurately and comprehensively realized by combining the actual working temperature of the functional device. The problem that the actual load capacity of the equipment is inaccurately evaluated due to equipment aging is effectively avoided, and the functional device can work at a suitable temperature as much as possible, so that the loss of the functional device is reduced. In this way, the idle state is reduced, the scheduling is reasonably distributed, and the overall processing capacity and processing efficiency of the equipment are improved.

Description

TECHNICAL FIELD

[0001] The present application relates to the technical field of load distribution, in particular to a load distribution method and device. BACKGROUND

[0002] When the server is running normally, a large number of operation tasks need to be processed, and each module in the server bears a large number of operation tasks. Some modules contain multiple functional devices, and each functional device needs to share the operation tasks in the module, and a single functional device may process multiple tasks at the same time. In each functional module in the server, the smallest unit of equipment that can process tasks independently is called a functional device, such as a CPU and a storage device. For example, the storage module in the server includes multiple disks, and these disks receive data writing tasks or data reading tasks. Setting a reasonable load distribution strategy can improve the task processing efficiency in the module.

[0003] Currently, the modules in the server mainly compare and schedule through the actual throughput rate and load capacity indicators of the functional devices in the module. When the equipment ages, the actual load capacity of the functional device is different from the original design load capacity indicator, and the actual load capacity will decrease. At this time, if the load distribution is still based on the design load capacity indicator, it will inevitably cause the device to be overloaded in the task-intensive situation, thereby accelerating the aging and even damaging the device.

[0004] It can be seen that the existing load distribution strategy ignores the decline of the device load capacity, which easily accelerates the aging and damage of the device and affects the efficient processing of operation tasks. SUMMARY

[0005] Based on the above problems, the present application provides a load distribution method and device, which reasonably distributes the load of multiple functional devices, avoids the problem of reduced device life and reduced task processing efficiency caused by overload of individual functional devices due to unreasonable distribution.

[0006] The embodiments of the present application disclose the following technical solutions:

[0007] The first aspect of the present application provides a load distribution method for distributing the load of multiple functional devices, the method comprising:

[0008] obtaining the actual throughput rate and the actual working temperature of a target functional device; the target functional device is one of the multiple functional devices;

[0009] obtaining a first indicator of the target functional device according to the actual throughput rate and the actual working temperature of the target functional device;

[0010] comparing the first index of the target functional device with a second index of the target functional device to obtain an index comparison result of the target functional device, wherein the second index of the target functional device is determined according to an ideal working temperature and a load capacity index of the target functional device;

[0011] performing load distribution on the plurality of functional devices according to the index comparison results of the plurality of functional devices.

[0012] Optionally, the first index of the target functional device is obtained according to the actual throughput rate and the actual working temperature of the target functional device, including:

[0013] obtaining a first product of the actual throughput rate and a first weight coefficient;

[0014] obtaining a second product of the actual working temperature and a second weight coefficient;

[0015] obtaining the first index of the target functional device according to the first product and the second product.

[0016] Optionally, the second index of the target functional device is determined according to the ideal working temperature and the load capacity index of the target functional device, including:

[0017] obtaining a third product of the load capacity index and the first weight coefficient;

[0018] obtaining a fourth product of the ideal working temperature and the second weight coefficient;

[0019] obtaining the second index of the target functional device according to the third product and the fourth product.

[0020] Optionally, the load distribution on the plurality of functional devices according to the index comparison results of the plurality of functional devices includes:

[0021] for the target functional device, if the index comparison result of the target functional device is that the first index is greater than the second index, it is determined that the target functional device is overloaded; if the index comparison result of the target functional device is that the first index is less than or equal to the second index, it is determined that the target functional device is not overloaded;

[0022] for the functional devices that are overloaded in the plurality of functional devices, the throughput rate is lowered.

[0023] Optionally, the load distribution method further includes:

[0024] obtaining an index ratio of the functional devices that are not overloaded in the plurality of functional devices, the index ratio being a ratio of the first index to the second index of the functional devices;

[0025] Adjust a task receiving priority of the non-overloaded functional device according to an index ratio of the non-overloaded functional device in the plurality of functional devices.

[0026] Optionally, the adjusting the task receiving priority of the non-overloaded functional device according to the index ratio of the non-overloaded functional device in the plurality of functional devices comprises:

[0027] sequencing the index ratios of different non-overloaded functional devices in ascending order;

[0028] configuring the task receiving priorities for the different non-overloaded functional devices according to the sequencing results of the index ratios, so that the task receiving priority of a functional device sequenced in front is higher than that of a functional device sequenced in back.

[0029] Optionally, the first weight coefficient and the second weight coefficient are determined by adjusting in the following manner:

[0030] judging whether the actual working temperature of the target functional device is greater than the ideal working temperature of the target functional device;

[0031] if the actual working temperature of the target functional device is greater than the ideal working temperature of the target functional device, further judging whether the initial value of the first weight coefficient in the current round is within a preset numerical interval, and if so, adjusting the initial value of the first weight coefficient in the current round and the initial value of the second weight coefficient in the current round; if not, not adjusting the initial value of the first weight coefficient in the current round and the initial value of the second weight coefficient in the current round;

[0032] if the actual working temperature of the target functional device is less than or equal to the ideal working temperature of the target functional device, not adjusting the initial value of the first weight coefficient in the current round and the initial value of the second weight coefficient in the current round, and the initial value of the first weight coefficient in the current round and the initial value of the second weight coefficient in the current round are used as the first weight coefficient and the second weight coefficient respectively for calculating the first index and the second index of the target functional device.

[0033] Optionally, the adjusting the initial value of the first weight coefficient in the current round and the initial value of the second weight coefficient in the current round specifically comprises:

[0034] adjusting the initial value of the first weight coefficient in the current round downward to obtain an initial value of the first weight coefficient in the next round, and adjusting the initial value of the second weight coefficient in the current round upward to obtain an initial value of the second weight coefficient in the next round.

[0035] Optionally, the initial value of the first weight coefficient in the first round is greater than the initial value of the second weight coefficient in the first round.

[0036] The preset numerical interval is N to the first round initial value of the first weight coefficient; wherein N is greater than the first round initial value of the second weight coefficient and less than the first round initial value of the first weight coefficient.

[0037] The second aspect of the present application provides a load distribution device for load distribution of a plurality of functional devices, the device comprising:

[0038] An actual data acquisition module is configured to acquire an actual throughput rate and an actual working temperature of a target functional device; the target functional device is one of the plurality of functional devices;

[0039] An index acquisition module is configured to obtain a first index of the target functional device according to the actual throughput rate and the actual working temperature of the target functional device;

[0040] An index comparison module is configured to compare the first index of the target functional device and a second index of the target functional device to obtain an index comparison result of the target functional device; wherein the second index of the target functional device is an index determined according to an ideal working temperature and a load capacity index of the target functional device;

[0041] A load distribution module is configured to distribute loads of the plurality of functional devices according to the index comparison results of the plurality of functional devices.

[0042] Compared with the prior art, the present application has the following beneficial effects:

[0043] In the technical solution of the present application, the working temperature of the functional device is taken as a feedback source on the basis of considering the actual throughput rate and the load capacity index of the functional device, and the load distribution of the functional device is adjusted. Since the working temperature is greatly related to the actual load, the actual working temperature of the functional device is combined to more accurately and comprehensively realize reasonable load scheduling. The problem of inaccurate evaluation of the actual load capacity of the device due to device aging is effectively avoided, and the functional device can work at a suitable temperature as much as possible to reduce its loss. In this way, idle is reduced, reasonable distribution and scheduling are realized, and the overall processing capacity and processing efficiency of the device are improved. BRIEF DESCRIPTION OF DRAWINGS

[0044] In order to more clearly illustrate the technical solutions in the embodiments of the present application or the prior art, the drawings needed in the embodiments or the prior art description will be briefly introduced. Obviously, the drawings in the following description are only some embodiments of the present application, and other drawings can be obtained by those skilled in the art without creative labor.

[0045] Figure 1An example flowchart for adjusting the first weight coefficient and the second weight coefficient is provided for the embodiments of the present application.

[0046] Figure 2 A load distribution method flowchart is provided for the embodiments of the present application.

[0047] Figure 3 Another load distribution method flowchart is provided for the embodiments of the present application.

[0048] Figure 4 A load distribution flowchart for multiple disks is provided for the embodiments of the present application.

[0049] Figure 5 A load distribution device structure diagram is provided for the embodiments of the present application.

[0050] Figure 6 Another load distribution device structure diagram is provided for the embodiments of the present application.

[0051] Figure 7 Still another load distribution device structure diagram is provided for the embodiments of the present application. DETAILED DESCRIPTION

[0052] Currently, for each module existing in the server, the actual load capacity is ignored when the internal load distribution is performed, which leads to inaccurate evaluation of the actual load capacity and poor load scheduling effect. On the one hand, it is easy to aggravate the aging of the device and affect the function implementation, and on the other hand, the poor scheduling effect also easily causes the processing capacity and processing efficiency of the device to be at a low level.

[0053] In the technical scheme of the present application, the correlation between the actual working temperature of the device and the load capacity of the device is considered, and the working temperature is proposed as a feedback source when the load distribution is performed on multiple functional devices, which participates in the regulation and control of the load distribution together with the throughput rate. Further, more reasonable load distribution is realized, the processing efficiency of the operation task is improved, and the aging and failure of the device are delayed.

[0054] In order for the personnel in the technical field to better understand the present application, the technical solutions in the embodiments of the present application will be described clearly and completely in conjunction with the drawings in the embodiments of the present application. Obviously, the described embodiments are only a part of the embodiments of the present application, not all the embodiments. Based on the embodiments in the present application, all other embodiments obtained by the person skilled in the art without creative labor are within the scope of protection of the present application.

[0055] In the present application, load distribution involves calculating two indexes. Load distribution is directed to multiple functional devices, and can be applied to a module having multiple functional devices. For example, a storage module of a server includes multiple disks, which are functional devices in the storage module and need to be reasonably distributed. Each functional device needs to calculate a first index and a second index. The first index is related to the actual state of the functional device, and the second index is related to the ideal state of the functional device.

[0056] To calculate the first index of the functional device, its actual throughput rate and actual working temperature need to be obtained. The actual throughput rate and the actual working temperature can be collected during the operation of the functional device, or obtained by feedback from the functional device.

[0057] To calculate the second index of the functional device, its load capacity index and ideal working temperature need to be obtained. The load capacity index can be a pre-calibrated index before leaving the factory, and the ideal working temperature can be a pre-calibrated temperature through multiple tests. It can be understood that the functional device can achieve good or high task processing capacity at the ideal working temperature, and the ideal working temperature can be evaluated and determined in combination with the processing capacity and performance of the functional device.

[0058] To facilitate the description, the acquisition method of the first index and the second index is introduced by taking a target functional device as an example. The target functional device is one of the multiple functional devices that need load distribution, and only serves as an example without specific reference meaning.

[0059] Before obtaining the first index and the second index of the target functional device, the first weight coefficient and the second weight coefficient are determined in advance. For the first index: first, obtain the first product of the actual throughput rate and the first weight coefficient, and obtain the second product of the actual working temperature and the second weight coefficient, and then obtain the first index of the target functional device according to the first product and the second product. The specific method can be: adding the first product and the second product to obtain the first index. That is, the actual throughput rate and the actual working temperature of the target functional device are weighted and calculated by the first weight coefficient and the second weight coefficient, and the result of the weighted calculation is taken as the first index.

[0060] Similarly, for the second index: first, obtain the product of the load capacity index of the target functional device and the first weight coefficient, which is called the third product to avoid confusion; and obtain the fourth product of the ideal working temperature of the target functional device and the second weight coefficient. Then, the second index of the target functional device is obtained according to the third product and the fourth product. The specific method can be: adding the third product and the fourth product to obtain the second index. That is, the load capacity index and the ideal working temperature of the target functional device are weighted and calculated by the first weight coefficient and the second weight coefficient, and the result of the weighted calculation is taken as the second index.

[0061] The following formulas show an example of the first index and the second index:

[0062] First index = A * actual throughput rate + B * actual working temperature Formula (1)

[0063] Second index = A * load capacity index + B * ideal working temperature Formula (2)

[0064] In the above formulas (1) and (2), A represents a first weight coefficient, and B represents a second weight coefficient. The first weight coefficient and the second weight coefficient can be continuously adjusted according to the actual working temperature of the target functional device, so as to be determined and substituted into the above formulas (1) and (2) to complete the calculation of the first index and the second index.

[0065] The adjustment and determination of the first weight coefficient and the second weight coefficient will be introduced below. Before the first weight coefficient and the second weight coefficient used to calculate the first index and the second index are determined, the first round initial value of the first weight coefficient and the first round initial value of the second weight coefficient of the target functional device are first set. Figure 1 An example flowchart for adjusting the first weight coefficient and the second weight coefficient is provided for the embodiments of the present application. As shown in Figure 1 The first round initial values of the two weight coefficients A and B enter the first round judgment link. Specifically, it is first judged whether the actual working temperature of the target functional device is greater than the ideal working temperature of the target functional device. If yes, the next judgment box is entered, that is, it is further judged whether the first round initial value of the first weight coefficient is within a preset value interval N to P. Wherein, P represents the first round initial value of the first weight coefficient, and N is greater than the first round initial value of the second weight coefficient and less than the first round initial value of the first weight coefficient. N can be the lower limit of the first weight coefficient set according to the characteristics of the specific functional device, and can be set based on load distribution experience, which is not limited in value in the present embodiment.

[0066] If it is within the preset value interval, the first round initial value of the first weight coefficient and the first round initial value of the second weight coefficient are adjusted. If it is not within the preset value interval, the first round initial value of the first weight coefficient and the first round initial value of the second weight coefficient are not adjusted. If the actual working temperature of the target functional device is less than or equal to the ideal working temperature of the target functional device, it indicates that the target functional device does not have a too high temperature at this time, and the first weight coefficient and the second weight coefficient can not be adjusted, and the initial value of this round can be maintained as the initial value of the next round.

[0067] For the adjusted round, the two weight coefficients after adjustment are taken as the initial values of the first weight coefficient and the second weight coefficient in the next round, respectively, and are involved in the judgment of the next round. For the other rounds after the first round, the judgment manner and processing manner are similar to the first round as introduced above, and will not be described here again, and can be referred to Figure 1 It is understood that whether adjusted or not, it is still necessary to enter the judgment of the next round. That is, the determination of the first weight coefficient and the second weight coefficient can be continuously performed. In addition, whether adjusted or not, the two coefficients determined in the current round can be used to calculate the first index and the second index.

[0068] It is mentioned above that in the case that the judgment results of both judgment blocks are yes, the adjustment of the weight coefficients is needed. A kind of adjustment manner is introduced below, the first round initial value of the first weight coefficient is greater than the first round initial value of the second weight coefficient. In the adjustment of each round, the next round initial value of the first weight coefficient is obtained by adjusting downward on the basis of the current round initial value of the first weight coefficient, and the next round initial value of the second weight coefficient is obtained by adjusting upward on the basis of the current round initial value of the second weight coefficient. As an example, the first round initial value of the first weight coefficient is 100, and the first round initial value of the second weight coefficient is 0, in the adjustment, the first weight coefficient is adjusted downward by one unit in each round, and the second weight coefficient is adjusted upward by one unit, and the adjustment unit can be artificially set. For example, the adjustment unit is 1 or 5, etc., which is not limited here. The value of the adjustment unit does not exceed the first round initial value of the first weight coefficient. In addition, in other implementation manners, the first weight coefficient and the second weight coefficient can also be normalized weight coefficients, which can be determined according to the value unit of temperature, throughput rate, load capacity index involved in formula (1) and formula (2). Based on this, the adjustment unit when adjusting the two coefficients is not limited.

[0069] It should be noted that in actual application, the actual working temperature of the target functional device may change when judging and adjusting in each round. For example, the actual working temperature is T1 in the third round, and the actual working temperature is T2 in the eighth round, T1≠T2. Therefore, in the adjustment of each round, the actual working temperature of the target functional device is not fixed, but is the real-time changing temperature. Figure 1 It is shown in the flow that the actual working temperature is not fixed, but is the real-time changing temperature. And after determining the first weight coefficient and the second weight coefficient as the first index and the second index of the target functional device, the latest actual working temperature can also be substituted into formula (1) and formula (2) to continuously determine the first index and the second index. Figure 1In the flow, it is determined whether the two weight coefficients need to be further adjusted to recalculate the first index and the second index. That is, the adjustment of the two weight coefficients and the calculation of the first index and the second index can be continuous, and not once determined and then no longer adjusted and updated. In this way, it is ensured that the entire load distribution scheme fits the real-time situation, avoiding the problem that the result of single load distribution becomes unsuitable over time, resulting in low task processing efficiency and promoting the aging of functional devices.

[0070] In addition, the adjustment and determination scheme of the first weight coefficient and the second weight coefficient introduced above is only an example for the target functional device. For other functional devices, the temperature and load conditions may be different from those of the target functional device, so the first weight coefficient and the second weight coefficient are independently adjusted and determined for the functional devices. The first weight coefficient and the second weight coefficient of different functional devices may be different. That is, in the present scheme, the weight coefficients of a single functional device are not universal, and in order to improve the load distribution effect, the adjustment and determination of the first weight coefficient and the second weight coefficient can be performed for each functional device to which a load is distributed based on the logic shown in the above formula. Figure 1

[0071] In the embodiments of the present application, on the basis of obtaining the first index and the second index of the target functional device, the index comparison result of the target functional device is obtained by comparing the two indexes. The index comparison result reflects whether the target functional device is overloaded. The index comparison result has two specific performances: the first index is greater than the second index, which indicates that the target functional device is overloaded, and it is necessary to reduce the throughput rate to restore it to an unoverloaded state; the first index is less than or equal to the second index, which indicates that the target functional device is not overloaded.

[0072] According to the index comparison results of the plurality of functional devices, the plurality of functional devices are load distributed, specifically: after determining whether each functional device is overloaded or not overloaded, the throughput rate of the functional devices in the plurality of functional devices that are overloaded is reduced. The downward adjustment of the throughput rate can be realized by a PID controller. The PID algorithm is an algorithm for adjusting based on the proportion (P), integral (I) and differential (D) of the deviation. In addition, the throughput rate can also be adjusted by a step-by-step adjustment method. The specific way of realizing the adjustment of the throughput rate is not limited here. By reducing the throughput rate, the load of the functional device is reduced. When the functional device is a disk in a storage module, the downward adjustment of the throughput rate can be manifested as: reducing the read-write speed of the disk.

[0073] In the embodiments of the present application, the tasks are allocated based on the current load state of the functional devices, and new tasks are no longer allocated to the functional devices with high load, but are allocated to other functional devices with low load, so as to finally achieve the goal that the load states of the functional devices are close to each other.​

[0074] Figure 2 The above is a flowchart of the load distribution method. As shown in the figure, the method comprises: Figure 2

[0075] S201, obtaining an actual throughput rate and an actual working temperature of a target functional device;

[0076] S202, obtaining a first index of the target functional device according to the actual throughput rate and the actual working temperature of the target functional device;

[0077] S203, comparing the first index of the target functional device with a second index of the target functional device to obtain an index comparison result of the target functional device; wherein the second index of the target functional device is an index determined according to an ideal working temperature and a load capacity index of the target functional device;

[0078] S204, performing load distribution on the plurality of functional devices according to the index comparison results of the plurality of functional devices.

[0079] In the technical solution of the present application, the actual throughput rate and the load capacity index of the functional device are considered, and the working temperature of the functional device is also taken as a feedback source to adjust the load distribution of the functional device. Since the working temperature is greatly related to the actual load, the actual working temperature of the functional device is combined to more accurately and comprehensively realize reasonable load scheduling. The problem of inaccurate evaluation of the actual load capacity of the device due to device aging is effectively avoided, and the functional device can work at a suitable temperature as much as possible to reduce its loss. This reduces idling, reasonably allocates and schedules, and improves the overall processing capacity and processing efficiency of the device.

[0080] In addition to adjusting the load distribution, the present application also proposes that the task receiving priority of each functional device can be adjusted based on the first index and the second index of each functional device. The specific introduction is as follows.

[0081] In the technical solution of the present application, a ratio can be obtained by performing division operation on the first index and the second index of the functional device, which is called an index ratio. The index ratio can be calculated only for the functional device that is not overloaded according to the foregoing judgment, or the index ratio can be calculated for all functional devices. Obviously, if the index ratio is greater than 1, it means that the first index is greater than the second index, i.e., the functional device is overloaded; if the index ratio is less than or equal to 1, it means that the second index is less than or equal to the second index, i.e., the functional device is not overloaded. According to the index ratio of the functional device that is not overloaded in the plurality of functional devices, the task receiving priority of the functional device that is not overloaded is adjusted.

[0082] Specifically, the way to adjust the task receiving priority can be:​

[0083] The different unoverloaded functional devices are sorted by their index ratios from smallest to largest. Based on the sorting results, task reception priorities are assigned to the different unoverloaded functional devices so that the task reception priority of the functional devices ranked first is higher than that of the functional devices ranked later.

[0084] In other words, the smaller the ratio, the more idle the functional device is in its current load state, and the less its processing capacity is being utilized. It can be assigned a higher priority to handle subsequent tasks. Conversely, the larger the ratio, the more strained and busy the functional device is in its current load state, and the closer its processing capacity is to its limit. It can be assigned a lower priority. This facilitates achieving a more balanced load state for each functional device, enabling dynamic load scheduling.

[0085] Figure 3 This is a schematic flowchart of another load distribution method provided in an embodiment of this application. Compared to Figure 2 ,exist Figure 3 The load allocation method presented includes a step to adjust the task reception priority of un-overloaded functional devices. It should be noted that this adjustment process can be implemented in real time. Furthermore, overloaded functional devices can also be included in the task reception priority adjustment process. For example, the priority of overloaded functional devices can be configured to be lower than the priority of the un-overloaded functional device with the highest performance ratio. When un-overloaded functional devices exist, new tasks are not assigned to already overloaded functional devices, thus improving the efficiency of load allocation.

[0086] Figure 4 Taking the load distribution of multiple disks in a storage module as an example, the entire process of load adjustment is demonstrated. Figure 4 This diagram illustrates a load distribution process for multiple disks, as provided in an embodiment of this application. The storage module includes disk one, disk two, disk three, and disk four. These disks feed their actual operating temperature and throughput back to the baseboard management controller (BMC), which then performs load distribution and adjustment. The BMC is a server remote manager independent of the server motherboard CPU.

[0087] The first index of each disk is calculated by the actual throughput rate and the actual working temperature of each disk by the BMC. The first index and the second index of the corresponding disk are compared in value size based on the second index of each disk. The read-write rate of the overload disk with the first index greater than the second index is adjusted downward. The task receiving priority is adjusted based on the index ratio (i.e., the ratio of the first index to the second index) of each disk. Then, the load of each disk in the storage module is adjusted based on the adjusted read-write rate and the task receiving priority of the disk. The first weight coefficient and the second weight coefficient used to calculate the first index and the second index can be determined in the manner described above with reference to the embodiment of the application, which will not be described here again. Figure 1

[0088] The load distribution method in the embodiments of the application introduced above adds the temperature feedback of the disk as another input of the dynamic scheduling algorithm and sets the ideal working temperature of the disk to perform more comprehensive load scheduling. The first index and the second index are respectively weighted calculated based on the actual throughput rate and the actual working temperature fed back by each disk and the ideal working temperature and the disk load capacity index of each disk set. The load is scheduled according to the above two indexes until the index ratio of each disk tends to be the same. In actual application, the stop condition of the load adjustment can be set, for example, the index ratio variance of each disk is set to be within a preset range, that is, the difference is not large, and the load adjustment can not be performed for multiple disks.

[0089] The higher the load degree of the disk is, the higher the corresponding working temperature is. Therefore, the temperature reference value is added to judge whether the disk is overloaded in combination with the throughput rate, and the read-write rate of the disk is adjusted by using the PID controller or the step-by-step adjustment mode to reduce the load of the disk. Whether the actual load of the device is lower than the original load is judged based on whether the actual working temperature is higher than the ideal working temperature, and the weight coefficient needs to be adjusted. This scheme can effectively avoid the problem that the actual load capacity of the disk is not accurately evaluated due to the aging of the disk.

[0090] In this scheme, more comprehensive and accurate load scheduling is performed based on the strong correlation between the working temperature of the device and the actual load of the device. The utilization rate of the server component is optimized, the resource idling is reduced, and the work efficiency is improved. The device is ensured to work at the ideal temperature as much as possible, and the part of the low-performance component working at high temperature and high load can be reduced, which can reduce the component wear and prolong the component life.

[0091] Based on the load distribution method introduced in the foregoing embodiments, the application also introduces a load distribution device. Figure 5 The structure of the load distribution device is shown in FIG. 1. Figure 5 The load distribution device includes:

[0092] ​The actual data acquisition module 501 is configured to acquire an actual throughput rate and an actual working temperature of a target functional device, the target functional device being one of the plurality of functional devices;

[0093] The index acquisition module 502 is configured to obtain a first index of the target functional device according to the actual throughput rate and the actual working temperature of the target functional device.

[0094] The index comparison module 503 is configured to compare the first index of the target functional device with a second index of the target functional device to obtain an index comparison result of the target functional device, wherein the second index of the target functional device is determined according to an ideal working temperature and a load capacity index of the target functional device.

[0095] The load distribution module 504 is configured to distribute loads to the plurality of functional devices according to the index comparison results of the plurality of functional devices.

[0096] In the technical solution of the present application, the working temperature of the functional device is taken as a feedback source to adjust the load distribution to the functional device on the basis of considering the actual throughput rate and the load capacity index of the functional device. Since the working temperature is greatly related to the actual load, the reasonable load scheduling can be more accurately and comprehensively realized by combining the actual working temperature of the functional device. The problem of inaccurate evaluation of the actual load capacity of the device due to device aging is effectively avoided, and the functional device can work at a suitable temperature as much as possible, reducing its loss. In this way, the idle state is reduced, the scheduling is reasonably distributed, and the overall processing capacity and processing efficiency of the device are improved.

[0097] Optionally, the index acquisition module 502 is specifically configured to:

[0098] acquire a first product of the actual throughput rate and a first weight coefficient;

[0099] acquire a second product of the actual working temperature and a second weight coefficient;

[0100] obtain the first index of the target functional device according to the first product and the second product.

[0101] Optionally, the index acquisition module 502 is further configured to:

[0102] acquire a third product of the load capacity index and the first weight coefficient;

[0103] acquire a fourth product of the ideal working temperature and the second weight coefficient;

[0104] obtain the second index of the target functional device according to the third product and the fourth product.

[0105] Optionally, the load distribution module 504 is specifically configured to:

[0106] For the target functional device, if the index comparison result of the target functional device is that the first index is greater than the second index, it is determined that the target functional device is overloaded; if the index comparison result of the target functional device is that the first index is less than or equal to the second index, it is determined that the target functional device is not overloaded.

[0107] For the overloaded functional device in the plurality of functional devices, the throughput rate is down-regulated.

[0108] Figure 6 Another structural schematic diagram of a load distribution device provided by an embodiment of the present application is shown in FIG. 7. Compared with the structure shown in FIG. 6, the load distribution device further comprises: Figure 6 Figure 5

[0109] An index ratio obtaining module 601 is configured to obtain an index ratio of the functional device that is not overloaded in the plurality of functional devices, the index ratio being a ratio of the first index to the second index of the functional device.

[0110] A priority adjusting module 602 is configured to adjust the task receiving priority of the functional device that is not overloaded according to the index ratio of the functional device that is not overloaded in the plurality of functional devices.

[0111] Optionally, the priority adjusting module 602 is specifically configured to:

[0112] sort the index ratios of different functional devices that are not overloaded in ascending order;

[0113] configure the task receiving priorities for different functional devices that are not overloaded according to the sorting result of the index ratios, so that the task receiving priority of a functional device that is sorted earlier is higher than the task receiving priority of a functional device that is sorted later.

[0114] Figure 7 Another structural schematic diagram of a load distribution device provided by an embodiment of the present application is shown in FIG. 7. Compared with the structure shown in FIG. 6, the load distribution device further comprises: Figure 6

[0115] A weight coefficient adjusting module 701 is configured to adjust the first weight coefficient and the second weight coefficient. The weight coefficient adjusting module 701 is specifically configured to:

[0116] determine whether the actual working temperature of the target functional device is greater than the ideal working temperature of the target functional device;

[0117] ​​​If the actual working temperature of the target functional device is greater than the ideal working temperature of the target functional device, it is further judged whether the initial value of the first weight coefficient in the current round is in a preset numerical interval, and if so, the initial value of the first weight coefficient in the current round and the initial value of the second weight coefficient in the current round are adjusted; if not, the initial value of the first weight coefficient in the current round and the initial value of the second weight coefficient in the current round are not adjusted.

[0118] If the actual working temperature of the target functional device is less than or equal to the ideal working temperature of the target functional device, the initial value of the first weight coefficient in the current round and the initial value of the second weight coefficient in the current round are not adjusted, and the initial value of the first weight coefficient in the current round and the initial value of the second weight coefficient in the current round are used as the first weight coefficient and the second weight coefficient respectively for calculating the first index and the second index of the target functional device.

[0119] The weight coefficient adjustment module 701 is specifically configured to:

[0120] adjust the initial value of the first weight coefficient in the current round downward to obtain the initial value of the first weight coefficient in the next round, and adjust the initial value of the second weight coefficient in the current round upward to obtain the initial value of the second weight coefficient in the next round.

[0121] Optionally, the initial value of the first weight coefficient in the first round is greater than the initial value of the second weight coefficient in the first round.

[0122] The preset numerical interval is N to the initial value of the first weight coefficient in the first round; wherein N is greater than the initial value of the second weight coefficient in the first round and less than the initial value of the first weight coefficient in the first round.

[0123] It should be noted that each of the embodiments in the present specification is described in a progressive manner, and the same and similar parts between each embodiment can be referred to each other, and each embodiment focuses on the difference from other embodiments. Especially, for the device embodiment, since it is basically similar to the method embodiment, it is described more simply, and the related parts can be referred to the part of the method embodiment. The device embodiment described above is only schematic, and the units described as separate components can or can not be physically separated, and the components indicated as units can or can not be physical units, that is, they can be located in one place, or distributed on multiple network units. According to the actual needs, part or all of the modules can be selected to achieve the purpose of the present embodiment scheme. Those skilled in the art can understand and implement without creative labor.

[0124] The above merely provides one specific embodiment of the present application, but the protection scope of the present application is not limited thereto, any changes or replacements within the technical scope disclosed by the present application, which can be easily thought by any person skilled in the art, should be covered within the protection scope of the present application. Therefore, the protection scope of the present application should be subject to the protection scope of the claims.

Claims

1. A load distribution method, characterized in that, The method for load distribution among multiple functional devices in a server includes: Obtain the index comparison results of each of the multiple functional devices; The method for obtaining the comparison results of the target functional devices includes, wherein the target functional device is any one of the plurality of functional devices: Obtain the actual throughput and actual operating temperature of the target functional device; based on the actual throughput and actual operating temperature of the target functional device, obtain the first index of the target functional device; The first indicator and the second indicator of the target functional device are compared to obtain the indicator comparison result of the target functional device; wherein, the second indicator of the target functional device is an indicator determined based on the ideal operating temperature and load capacity of the target functional device. The load is allocated to the multiple functional devices based on the comparison results of their performance indicators.

2. The method according to claim 1, characterized in that, The process of obtaining the first index of the target functional device based on its actual throughput and actual operating temperature includes: Obtain the first product of the actual throughput and the first weighting coefficient; Obtain the second product of the actual operating temperature and the second weighting coefficient; The first index of the target functional device is obtained based on the first product and the second product.

3. The method according to claim 2, characterized in that, Based on the ideal operating temperature and load capacity of the target functional device, a second specification of the target functional device is determined, including: Obtain the third product of the load capacity index and the first weighting coefficient; Obtain the fourth product of the ideal operating temperature and the second weighting coefficient; The second index of the target functional device is obtained based on the third product and the fourth product.

4. The method according to claim 1, characterized in that, The step of distributing the load among the multiple functional devices based on the comparison results of their performance indicators includes: For the target functional device, if the comparison result of the target functional device's indicators is that the first indicator is greater than the second indicator, then the target functional device is determined to be overloaded; if the comparison result of the target functional device's indicators is that the first indicator is less than or equal to the second indicator, then the target functional device is determined to be not overloaded. For overloaded functional devices among the multiple functional devices, reduce the throughput.

5. The method according to claim 4, characterized in that, Also includes: Obtain the ratio of the indicators of the functional devices that are not overloaded among the plurality of functional devices, wherein the ratio is the ratio of the first indicator to the second indicator of the functional device; Based on the ratio of the performance indicators of the non-overloaded functional devices among the multiple functional devices, the task reception priority of the non-overloaded functional devices is adjusted.

6. The method according to claim 5, characterized in that, The step of adjusting the task receiving priority of the un-overloaded functional devices based on the ratio of their performance indicators among the plurality of functional devices includes: The different non-overloaded functional devices are ranked according to their index ratios from smallest to largest. Based on the ranking results of the index ratio, different non-overloaded functional devices are assigned task reception priorities so that the task reception priority of the functional devices ranked first is higher than that of the functional devices ranked later.

7. The method according to claim 2 or 3, characterized in that, The first weighting coefficient and the second weighting coefficient are determined by adjusting them in the following way: Determine whether the actual operating temperature of the target functional device is greater than the ideal operating temperature of the target functional device; If the actual operating temperature of the target functional device is greater than the ideal operating temperature of the target functional device, then it is further determined whether the initial value of the first weighting coefficient in this round is within a preset value range. If it is within the preset value range, the initial values ​​of the first weighting coefficient and the second weighting coefficient in this round are adjusted. If the values ​​are not within the preset range, the initial values ​​of the first weight coefficient and the second weight coefficient for this round will not be adjusted. If the actual operating temperature of the target functional device is less than or equal to the ideal operating temperature of the target functional device, then the initial values ​​of the first weighting coefficient and the second weighting coefficient in this round are not adjusted. The initial values ​​of the first weighting coefficient and the second weighting coefficient in this round are used as the first weighting coefficient and the second weighting coefficient, respectively, to calculate the first index and the second index of the target functional device.

8. The method according to claim 7, characterized in that, The adjustment of the initial values ​​of the first weight coefficient and the second weight coefficient for this round specifically includes: The initial value of the first weight coefficient is adjusted downwards based on the initial value of the first weight coefficient in this round to obtain the initial value of the first weight coefficient in the next round; and the initial value of the second weight coefficient is adjusted upwards based on the initial value of the second weight coefficient in this round to obtain the initial value of the second weight coefficient in the next round.

9. The method according to claim 7, characterized in that, The initial value of the first weighting coefficient in the first round is greater than the initial value of the second weighting coefficient in the first round. The preset numerical range is from N to the first round initial value of the first weight coefficient; wherein N is greater than the first round initial value of the second weight coefficient and less than the first round initial value of the first weight coefficient.

10. A load distribution device, characterized in that, The device is used for load distribution among multiple functional components in a server, and includes: The index comparison module is used to obtain the index comparison results of each functional device among the plurality of functional devices; The actual data acquisition module is used to acquire the actual throughput and actual operating temperature of the target functional device; the target functional device is any one of the plurality of functional devices. The indicator acquisition module is used to obtain the first indicator of the target functional device based on the actual throughput and actual operating temperature of the target functional device. The index comparison module is used to compare the first index and the second index of the target functional device to obtain the index comparison result of the target functional device; wherein, the second index of the target functional device is an index determined based on the ideal operating temperature and load capacity index of the target functional device. The load distribution module is used to distribute the load to the multiple functional devices based on the comparison results of the indicators of the multiple functional devices.

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