System and method for measuring fuse resistance and computer readable storage medium

Abstract

A method for measuring fuse resistance includes the following steps. A predetermined voltage value of a forced voltage is preloaded to a common ground bus electrically connected to at least one fuse element, a first current value of a measurement current passing through the common ground bus under a first condition, and a second current value of another measurement current passing through the common ground bus under a second condition. The first current value is subtracted from the second current value to obtain a subtracted current value, thereby removing the value of a leakage current passing through the common ground bus. The predetermined voltage value is divided by the subtracted current value to obtain a fuse resistance value of the at least one fuse element. By the technical solution of the present application, the method can prevent fuse resistance mismatch and can be implemented in a test line.

Description

Technical Field

[0001] This invention relates to a system and method, and more particularly to a system and method for measuring the resistance of a fuse. Background Technology

[0002] Currently, the traditional method of applying a forced voltage and measuring a single current is the only way to determine the approximate resistance of a fuse. However, the fuse resistance measured using this method is inaccurate.

[0003] To address the issue of incorrectly measured fuse resistance values, various fields have racked their brains to find solutions, but a suitable method has yet to be developed. Therefore, finding a more efficient solution is a crucial research topic and a pressing objective for improvement in related fields. Summary of the Invention

[0004] This invention provides a system and method for measuring fuse resistance, as well as a computer-readable storage medium, which improves upon the problems of prior art.

[0005] In one embodiment of the present invention, the system for measuring fuse resistance proposed in this invention includes a storage device and a processor, the processor being electrically connected to the storage device. The storage device is used to store a predetermined voltage value of a forced voltage on a common ground bus electrically connected to at least one fuse element, a first current value of a measured current passing through the common ground bus under a first condition, a second current value of another measured current passing through the common ground bus under a second condition, and at least one instruction. The processor is used to access and execute at least one instruction to: subtract the second current value from the first current value to obtain the subtracted current value, thereby removing the leakage current value passing through the common ground bus; and divide the predetermined voltage value by the subtracted current value to obtain the fuse resistance value of at least one fuse element.

[0006] In one embodiment of the present invention, at least one fuse element comprises a plurality of fuse elements electrically connected to a common ground bus, and the plurality of fuse elements are respectively electrically connected to a plurality of transistor units, each of the plurality of transistor units comprising one or more transistors connected in series.

[0007] In one embodiment of the invention, the system further includes a measuring device. The measuring device is electrically connected to a fuse circuit, which includes a common ground bus, a plurality of fuse elements, and a plurality of transistor units. When a selected transistor unit among the plurality of transistor units is turned on and the remaining transistor units among the plurality of transistor units are turned off, the measuring device progressively applies a plurality of different voltages to the common ground bus to measure a plurality of different current values ​​from the fuse circuit for a plurality of different measurement currents related to the plurality of different voltages, wherein the selected transistor unit is electrically connected to a selected fuse element among the plurality of fuse elements.

[0008] In one embodiment of the present invention, the storage device stores a plurality of different current values ​​related to a plurality of different voltages, and the processor accesses and executes at least one instruction to: set a first condition indicating that when a first voltage from a plurality of different voltages is applied to a common ground bus, a selected transistor unit operates in the linear region and the remaining transistor units are turned off; set a second condition indicating that when a second voltage from a plurality of different voltages is applied to the common ground bus, a selected transistor unit operates in the linear region and the remaining transistor units are turned off, and the first voltage minus the second voltage equals a predetermined voltage value; before the first current value is subtracted from the second current value, select a first current value and a second current value from the plurality of different current values ​​related to a plurality of different voltages according to the first condition and the second condition.

[0009] In one embodiment of the invention, the processor accesses and executes at least one instruction to: divide a predetermined voltage value by the subtracted current value to obtain the fuse resistance value of the selected fuse element.

[0010] In one embodiment of the present invention, the processor accesses and executes at least one instruction to: set a first condition to indicate that when a forced voltage is applied to the common ground bus, a selected transistor unit among a plurality of transistor units operates in the linear region, and the remaining transistor units among the plurality of transistor units are turned off; and set a second condition to indicate that when a forced voltage is applied to the common ground bus, the selected transistor unit and the remaining transistor units are both turned off.

[0011] In one embodiment of the invention, the system further includes a measuring device. The measuring device is electrically connected to a fuse circuit, which includes a common ground bus, a plurality of fuse elements, and a plurality of transistor units. When a selected transistor unit is turned on and the remaining transistor units are turned off, the measuring device applies a forced voltage to the common ground bus to measure a first current value of a measuring current from the fuse circuit. When the selected transistor unit and the remaining transistor units are all turned off, the measuring device applies a forced voltage to the common ground bus to measure a second current value of another measuring current from the fuse circuit. The selected transistor unit is electrically connected to a selected fuse element among the plurality of fuse elements.

[0012] In one embodiment of the invention, the processor accesses and executes at least one instruction to: divide a predetermined voltage value by the subtracted current value to obtain the fuse resistance value of the selected fuse element.

[0013] In one embodiment of the present invention, the method for measuring the resistance of a fuse element proposed in the present invention includes the following steps: a predetermined voltage value of a forced voltage preloaded on a common ground busbar connected to at least one fuse element; a first current value of a measuring current passing through the common ground busbar under a first condition; and a second current value of another measuring current passing through the common ground busbar under a second condition; subtracting the second current value from the first current value to obtain a subtracted current value, thereby removing the leakage current value passing through the common ground busbar; and dividing the predetermined voltage value by the subtracted current value to obtain the fuse resistance of at least one fuse element.

[0014] In one embodiment of the invention, at least one fuse element comprises a plurality of fuse elements electrically connected to a common ground bus, the plurality of fuse elements are respectively electrically connected to a plurality of transistor units, each of the plurality of transistor units comprises one or more transistors connected in series, the fuse circuit comprises a common ground bus, a plurality of fuse elements, and a plurality of transistor units, the method further comprising: when a selected transistor unit among the plurality of transistor units is turned on and the remaining transistor units among the plurality of transistor units are turned off, applying a plurality of different voltages to the common ground bus by means of a measuring device to measure a plurality of different current values ​​of a plurality of different measuring currents related to the plurality of different voltages from the fuse circuit, wherein the selected transistor unit is electrically connected to the selected fuse element among the plurality of fuse elements.

[0015] In one embodiment of the present invention, the method further includes: setting a first condition to indicate that when a first voltage from a plurality of different voltages is applied to a common ground bus, a selected transistor unit operates in the linear region and the remaining transistor units are turned off; setting a second condition to indicate that when a second voltage from a plurality of different voltages is applied to the common ground bus, the selected transistor unit operates in the linear region and the remaining transistor units are turned off, and the first voltage minus the second voltage equals a predetermined voltage value; and before subtracting the second current value from the first current value, selecting a first current value and a second current value from a plurality of different current values ​​related to the plurality of different voltages according to the first condition and the second condition.

[0016] In one embodiment of the present invention, the step of dividing a predetermined voltage value by a subtracted current value includes: dividing the predetermined voltage value by the subtracted current value to obtain the fuse resistance value of the selected fuse element.

[0017] In one embodiment of the present invention, at least one fuse element comprises a plurality of fuse elements electrically connected to a common ground bus, the plurality of fuse elements are respectively electrically connected to a plurality of transistor units, each of the plurality of transistor units comprises one or more transistors connected in series, the fuse circuit comprises a common ground bus, a plurality of fuse elements, and a plurality of transistor units, the method further comprising: setting a first condition to indicate that when a forced voltage is applied to the common ground bus, a selected transistor unit among the plurality of transistor units operates in the linear region, and the remaining transistor units among the plurality of transistor units are turned off; setting a second condition to indicate that when a forced voltage is applied to the common ground bus, the selected transistor unit and the remaining transistor units are both turned off.

[0018] In one embodiment of the present invention, the method further includes: when the selected transistor unit is turned on and the remaining transistor units are turned off, applying a forced voltage to the common ground bus via a measuring device to measure a first current value of a measuring current from the fuse circuit; when the selected transistor unit and the remaining transistor units are both turned off, applying a forced voltage to the common ground bus via a measuring device to measure a second current value of another measuring current from the fuse circuit, wherein the selected transistor unit is electrically connected to a selected fuse element among a plurality of fuse elements.

[0019] In one embodiment of the present invention, the step of dividing a predetermined voltage value by a subtracted current value includes: dividing the predetermined voltage value by the subtracted current value to obtain the fuse resistance value of the selected fuse element.

[0020] In one embodiment of the present invention, the computer-readable storage medium provided by the present invention stores a plurality of instructions to cause a computer to execute a method for measuring the resistance value of a fuse. The method includes the following steps: preloading a predetermined voltage value of a forced voltage on a common ground bus electrically connected to at least one fuse element, a first current value of a measuring current passing through the common ground bus under a first condition, and a second current value of another measuring current passing through the common ground bus under a second condition; subtracting the second current value from the first current value to obtain a subtracted current value, thereby removing the value of leakage current passing through the common ground bus; and dividing the predetermined voltage value by the subtracted current value to obtain the fuse resistance value of at least one fuse element.

[0021] In one embodiment of the invention, at least one fuse element comprises a plurality of fuse elements electrically connected to a common ground bus, the plurality of fuse elements are respectively electrically connected to a plurality of transistor units, each of the plurality of transistor units comprises one or more transistors connected in series, the fuse circuit comprises a common ground bus, a plurality of fuse elements, and a plurality of transistor units, the method further comprising: when a selected transistor unit among the plurality of transistor units is turned on and the remaining transistor units among the plurality of transistor units are turned off, applying a plurality of different voltages to the common ground bus by means of a measuring device to measure a plurality of different current values ​​of a plurality of different measuring currents related to the plurality of different voltages from the fuse circuit, wherein the selected transistor unit is electrically connected to the selected fuse element among the plurality of fuse elements.

[0022] In one embodiment of the present invention, the method further includes: setting a first condition to indicate that when a first voltage from a plurality of different voltages is applied to a common ground bus, a selected transistor unit operates in the linear region, and the remaining transistor units are turned off; setting a second condition to indicate that when a second voltage from a plurality of different voltages is applied to the common ground bus, a selected transistor unit operates in the linear region, the remaining transistor units are turned off, and the first voltage minus the second voltage equals a predetermined voltage value; before subtracting the second current value from the first current value, selecting a first current value and a second current value from a plurality of different current values ​​related to the plurality of different voltages according to the first condition and the second condition, wherein the step of dividing the predetermined voltage value by the subtracted current value includes: dividing the predetermined voltage value by the subtracted current value to obtain the fuse resistance value of the selected fuse element.

[0023] In one embodiment of the present invention, at least one fuse element comprises a plurality of fuse elements electrically connected to a common ground bus, the plurality of fuse elements are respectively electrically connected to a plurality of transistor units, each of the plurality of transistor units comprises one or more transistors connected in series, the fuse circuit comprises a common ground bus, a plurality of fuse elements, and a plurality of transistor units, the method further comprising: setting a first condition to indicate that when a forced voltage is applied to the common ground bus, a selected transistor unit among the plurality of transistor units operates in the linear region, and the remaining transistor units among the plurality of transistor units are turned off; setting a second condition to indicate that when a forced voltage is applied to the common ground bus, the selected transistor unit and the remaining transistor units are both turned off.

[0024] In one embodiment of the present invention, the method further includes: when the selected transistor unit is turned on and the remaining transistor units are turned off, applying a forced voltage to the common ground bus via a measuring device to measure a first current value of the measuring current from the fuse circuit; when the selected transistor unit and the remaining transistor units are both turned off, applying a forced voltage to the common ground bus via a measuring device to measure a second current value of another measuring current from the fuse circuit, wherein the selected transistor unit is electrically connected to a selected fuse element among a plurality of fuse elements, wherein the step of dividing the predetermined voltage value by the subtracted current value includes: dividing the predetermined voltage value by the subtracted current value to obtain the fuse resistance value of the selected fuse element.

[0025] In summary, the technical solution of the present invention has significant advantages and beneficial effects compared with the prior art. Through the technical solution of the present invention, the system and method can prevent fuse resistance mismatch and can be implemented in test leads.

[0026] The above description will be given in detail below with reference to the embodiments, and a further explanation of the technical solution of the present invention will be provided. Attached Figure Description

[0027] To make the above and other objects, features, advantages and embodiments of the present invention more apparent and understandable, the accompanying drawings are described below:

[0028] Figure 1 This is a block diagram of a system for measuring fuse resistance according to an embodiment of the present invention;

[0029] Figure 2A This is a schematic diagram of a state of a fuse circuit according to an embodiment of the present invention;

[0030] Figure 2B This is a schematic diagram of another state of a fuse circuit according to an embodiment of the present invention; and

[0031] Figure 3 This is a flowchart of a method for measuring fuse resistance according to an embodiment of the present invention. Detailed Implementation

[0032] To provide a more detailed and complete description of the invention, reference can be made to the accompanying drawings and the various embodiments described below, in which the same numbers represent the same or similar elements. Furthermore, well-known elements and steps are not described in the embodiments to avoid unnecessarily limiting the invention.

[0033] Please refer to Figure 1 The present invention relates to a system 100 for measuring fuse resistance, which can be applied in test lines or widely used in related technical processes. The following will be accompanied by... Figure 1 ,2A The specific implementation of system 100 is described in terms of 2B.

[0034] It should be understood that the system 100 has multiple implementation methods. Figure 1 The following description provides a comprehensive account of one or more embodiments for ease of explanation. However, the art can be practiced without these specific details. In other examples, known structures and apparatuses are shown in block diagram form for the effective description of these embodiments. The term "by way of example" is used herein to mean "as an example, instance, or illustration." Any embodiment described herein as "by way of example" is not to be construed as preferred or superior to other embodiments.

[0035] Figure 1 This is a block diagram of a system 100 for measuring fuse resistance according to an embodiment of the present invention. Figure 1 As shown, system 100 may include computer 101 and measuring device 102. Architecturally, computer 101 may be electrically connected to measuring device 102. It should be understood that, in the embodiments and claims, the description involving "electrical connection" can refer to a component being indirectly electrically coupled to another component through other components, or a component being directly electrically connected to another component without needing to go through other components. For example, measuring device 102 may be a built-in measuring device directly connected to computer 101, or measuring device 102 may be an external measuring device, with computer 101 indirectly obtaining data from measuring device 102.

[0036] In practice, for example, computer 101 can be a computer host or server. Regarding servers, many technologies have been developed or are under development to manage the operation of computer servers, generally providing accessibility, consistency, and efficiency. Remote management allows for the removal of input / output interfaces for servers, and the need for network administrators to access each server. For example, large data centers with many computer servers typically use various remote management tools to manage, configure, monitor, and troubleshoot server hardware and software. In practice, for example, measuring device 102 can be a measuring circuit, measuring equipment, testing apparatus, or similar device.

[0037] like Figure 1 As shown, computer 101 includes a storage device 110, a processor 120, an input / output (I / O) interface 130, and a display device 170. In practice, for example, the storage device 110 may be storage hardware, such as a hard disk drive (HDD) or a solid-state drive (SSD). The processor 120 may be a central processing unit (CPU), the input / output interface 130 may include connectors, communication equipment, transmission equipment, input devices, etc., and the display device 170 may be a liquid crystal display (LCD) or a similar device.

[0038] In terms of architecture, processor 120 is electrically connected to storage device 110, input / output interface 130, and display device 170. Input / output interface 130 can be connected to measuring device 102, and measuring device 102 is electrically connected to fuse circuit 190.

[0039] To further elaborate on the specifications of the fuse circuit 190 described above, please refer to... Figure 2A , 2B , Figure 2A This is a schematic diagram of a state of a fuse circuit 190 according to an embodiment of the present invention. Figure 2B This is a schematic diagram of another state of a fuse circuit 190 according to an embodiment of the present invention.

[0040] like Figure 2A , 2B As shown, the fuse circuit 190 includes a common ground (CGND) bus 210, a plurality of fuse elements F01, F02, ..., F16, and a plurality of transistor units 201, 202, ..., 216. Architecturally, the common ground bus 210 is electrically connected to the plurality of fuse elements F01, F02, ..., F16, and the plurality of fuse elements F01, F02, ..., F16 are respectively electrically connected to the plurality of transistor units 201, 202, ..., 216.

[0041] In one embodiment of the present invention, each of the plurality of transistor units 201, 202, ..., 216 comprises one or more transistors connected in series. Figure 2A , 2B As shown, transistor unit 201 includes multiple transistors S011, S012, and S013 connected in series, transistor unit 202 includes multiple transistors S021, S022, and S023 connected in series, and transistor unit 216 includes multiple transistors S161, S162, and S163 connected in series.

[0042] In practice, for example, each of the plurality of fuse elements F01, F02, ..., F16 can be an antifuse or a fuse. An antifuse is an electronic component that performs the opposite function to a fuse. A fuse is initially low in resistance and is designed to permanently disconnect a conductive path (typically when the current through the path exceeds a specified limit), while an antifuse is initially high in resistance and is programmed to convert it into a permanently conductive path (typically when the voltage across the antifuse exceeds a certain level).

[0043] In the idle state, the common ground bus 210 is usually at 0V or grounded, and no current flows through the fuse elements F01, F02, ..., F16.

[0044] In practice, for example, due to unforeseen process variations or design flaws, some leakage current paths may exist on the common ground bus 210. Once leakage current exists on the common ground bus 210, it is difficult to obtain the correct fuse resistance value in control experiments using a simple method of forcing a voltage onto the common ground bus 210 and measuring the current from the common ground bus 210.

[0045] Please refer to Figure 1 , 2A 2B, System 100 is capable of accurately measuring fuse resistance. In use, storage device 110 stores a predetermined voltage value (e.g., approximately 5V) of a forced voltage on a common ground bus 210 electrically connected to at least one fuse element, a first current value of a measured current passing through the common ground bus 210 under a first condition, a second current value of another measured current passing through the common ground bus 210 under a second condition, and at least one instruction. Processor 120 accesses and executes at least one instruction to: subtract the second current value from the first current value to obtain a subtracted current value, thereby removing the leakage current value through the common ground bus 210. Next, processor 120 accesses and executes at least one instruction to: divide the predetermined voltage value by the subtracted current value to obtain the fuse resistance value of at least one fuse element. Display device 170 can display the fuse resistance value of at least one fuse element.

[0046] In one embodiment of the present invention, at least one fuse element may include any one of fuse elements F01, F02, ..., F16. In practice, for example, when fuse element F01 is selected as the selected fuse element F01 for measurement, transistor unit 201 is selected as the selected transistor unit 201, and the selected transistor unit 201 is electrically connected to the selected fuse element F01.

[0047] Regarding the fuse resistance value of the selected fuse element F01, in the first embodiment of the present invention, when the selected transistor unit 201 is turned on and the remaining transistor units 202, ..., 216 are turned off (e.g., ... Figure 2A As shown, the measuring device 102 gradually applies a plurality of different voltages to the common ground bus 210 to measure a plurality of different current values ​​from the fuse circuit 190 for a plurality of different measuring currents related to the plurality of different voltages.

[0048] In a first embodiment of the present invention, storage device 110 stores a plurality of different current values ​​related to a plurality of different voltages, and processor 120 accesses and executes at least one instruction to: set a first condition indicating that when a first voltage (e.g., about 5.5V) is applied to the common ground bus 210, selected transistor unit 201 operates in the linear region, and the remaining transistor units 202, ..., 216 are turned off; set a second condition indicating that when a second voltage (e.g., about 0.5V) is applied to the common ground bus 210, selected transistor unit 201 operates in the linear region, and the remaining transistor units 202, ..., 216 are turned off, and the first voltage (e.g., about 5.5V) minus the second voltage (e.g., about 0.5V) equals a predetermined voltage value (e.g., about 5V).

[0049] Next, in the first embodiment of the present invention, the processor 120 is configured to access and execute at least one instruction to: select the first current value and the second current value from a plurality of different current values ​​related to a plurality of different voltages, according to a first condition and a second condition, before subtracting the second current value from the first current value.

[0050] Next, in the first embodiment of the present invention, the processor 120 is configured to access and execute at least one instruction to: subtract the second current value from the first current value to obtain the subtracted current value, thereby removing the value of the leakage current through the common ground bus 210.

[0051] Next, in the first embodiment of the present invention, the processor 120 is configured to access and execute at least one instruction to: divide a predetermined voltage value by the subtracted current value to obtain the fuse resistance value of the selected fuse element F01. The display device 170 can display the fuse resistance value of the selected fuse element F01.

[0052] Alternatively, regarding the fuse resistance value of the selected fuse element F01, in the second embodiment of the present invention, the processor 120 is configured to access and execute at least one instruction to: set a first condition to indicate that when a forced voltage (e.g., about 5V) is applied to the common ground bus 210, the selected transistor unit 201 operates in the linear region, and the remaining transistor units 202, ..., 216 are turned off; set a second condition to indicate that when a forced voltage (e.g., about 5V) is applied to the common ground bus 210, the selected transistor unit 201 and the remaining transistor units 202, ..., 216 are all turned off.

[0053] In the second embodiment of the present invention, when the selected transistor unit 201 is turned on (e.g., operating in the linear region) and the remaining transistor units 202, ..., 216 are turned off (e.g.) Figure 2AAs shown), the measuring device 102 applies a forced voltage (e.g., approximately 5V) to the common ground bus 210, thereby measuring a first current value from the fuse circuit 190. When the selected transistor unit 201 and the remaining transistor units 202, ..., 216 are all turned off (e.g.... Figure 2B As shown, the measuring device 102 applies a forced voltage (e.g., about 5V) to the common ground bus 210 to measure a second current value from the fuse circuit 190 for another measuring current.

[0054] After the first current value and the second current value are measured by the measuring device 102, in the second embodiment of the present invention, the processor 120 is used to access and execute at least one instruction to: subtract the second current value from the first current value to obtain the subtracted current value, thereby removing the value of the leakage current through the common ground bus 210.

[0055] Next, in a second embodiment of the invention, the processor 120 is configured to access and execute at least one instruction to: divide a predetermined voltage value (e.g., about 5V) by the subtracted current value to obtain the fuse resistance value of the selected fuse element F01. The display device 170 can display the fuse resistance value of the selected fuse element F01.

[0056] To further explain the operating method of the aforementioned system 100, please also refer to... Figures 1-3 , Figure 3 This is a flowchart of a method 200 for measuring fuse resistance according to an embodiment of the present invention. Figure 3 As shown, method 300 includes steps S301, S303, and S305 (it should be understood that, unless otherwise specified, the order of the steps mentioned in this embodiment can be adjusted according to actual needs, and they can even be executed simultaneously or partially simultaneously).

[0057] Method 300 may take the form of a computer program product on a computer-readable storage medium having a plurality of computer-readable instructions contained therein. Suitable storage media may include any of the following: non-volatile memory, such as read-only memory (ROM), programmable read-only memory (PROM), erasable programmable read-only memory (EPROM), electrically erasable programmable read-only memory (EEPROM); volatile memory, such as static random access memory (SRAM), dynamic random access memory (DRAM), double data rate random access memory (DDR-RAM); optical storage devices, such as read-only optical disc (CD-ROM), read-only digital versatile optical disc (DVD-ROM); magnetic storage devices, such as hard disk drives, floppy disk drives.

[0058] In one embodiment of the present invention, in step S301, a predetermined voltage value (e.g., about 5V) of a forced voltage is preloaded onto the common ground bus 210 electrically connected to at least one fuse element; a first current value of a measured current passing through the common ground bus 210 under a first condition; and a second current value of another measured current passing through the common ground bus 210 under a second condition. In step S303, the first current value is subtracted from the second current value to obtain a subtracted current value, thereby removing the leakage current value passing through the common ground bus 210. In step S305, the predetermined voltage value is divided by the subtracted current value to obtain the fuse resistance value of at least one fuse element.

[0059] In method 300, the aforementioned at least one fuse element may include any one of fuse elements F01, F02, ..., F16. In practice, for example, when fuse element F01 is selected as the selected fuse element F01 for measurement, transistor unit 201 is selected as the selected transistor unit 201, and the selected transistor unit 201 is electrically connected to the selected fuse element F01.

[0060] Regarding the fuse resistance value of the selected fuse element F01, in the first embodiment of the present invention, method 300 includes: when the selected transistor unit 201 is turned on and the remaining transistor units 202, ..., 216 are turned off (e.g., ... Figure 2A As shown, the measuring device 102 gradually applies a plurality of different voltages to the common ground bus 210 to measure a plurality of different current values ​​from the fuse circuit 190 for a plurality of different measuring currents related to the plurality of different voltages.

[0061] In a first embodiment of the present invention, the storage device 110 stores a plurality of different current values ​​related to a plurality of different voltages, and the method 300 includes: setting a first condition to indicate that when a first voltage (e.g., about 5.5V) among the plurality of different voltages is applied to the common ground bus 210, the selected transistor unit 201 operates in the linear region, and the remaining transistor units 202, ..., 216 are turned off; setting a second condition to indicate that when a second voltage (e.g., about 0.5V) among the plurality of different voltages is applied to the common ground bus 210, the selected transistor unit 201 operates in the linear region, and the remaining transistor units 202, ..., 216 are turned off, and the first voltage (e.g., about 5.5V) minus the second voltage (e.g., about 0.5V) equals a predetermined voltage value (e.g., about 5V).

[0062] Next, in the first embodiment of the present invention, method 300 includes: before step S303, selecting a first current value and a second current value from a plurality of different current values ​​related to a plurality of different voltages according to a first condition and a second condition.

[0063] In a first embodiment of the present invention, step S305 includes: dividing a predetermined voltage value by the subtracted current value to obtain the fuse resistance value of the selected fuse element F01.

[0064] Alternatively, regarding the fuse resistance value of the selected fuse element F01, in the second embodiment of the invention, method 300 includes: setting a first condition to indicate that when a forced voltage (e.g., about 5V) is applied to the common ground bus 210, the selected transistor unit 201 operates in the linear region, and the remaining transistor units 202, ..., 216 are turned off; setting a second condition to indicate that when a forced voltage (e.g., about 5V) is applied to the common ground bus 210, the selected transistor unit 201 and the remaining transistor units 202, ..., 216 are all turned off.

[0065] In a second embodiment of the present invention, method 300 includes: when the selected transistor unit 201 is turned on (e.g., operating in the linear region) and the remaining transistor units 202, ..., 216 are turned off (e.g., ... Figure 2A As shown), a forced voltage (e.g., approximately 5V) is applied to the common ground bus 210 via the measuring device 102, thereby measuring a first current value of a measuring current from the fuse circuit 190. When the selected transistor unit 201 and the remaining transistor units 202, ..., 216 are all turned off (e.g., ... Figure 2B As shown, a forced voltage (e.g., about 5V) is applied to the common ground bus 210 by the measuring device 102, thereby measuring a second current value of another measuring current from the fuse circuit 190.

[0066] In a second embodiment of the invention, step S305 includes: dividing a predetermined voltage value (e.g., about 5V) by the subtracted current value to obtain the fuse resistance value of the selected fuse element F01. The display device 170 can display the fuse resistance value of the selected fuse element F01.

[0067] In summary, the technical solution of the present invention has significant advantages and beneficial effects compared with the prior art. Through the technical solution of the present invention, system 100 and method 300 can prevent fuse resistance mismatch and can be implemented in test lines.

[0068] Although the present invention has been disclosed above by way of embodiments, it is not intended to limit the present invention. Any person skilled in the art can make various modifications and refinements without departing from the spirit and scope of the present invention. Therefore, the scope of protection of the present invention shall be determined by the claims.

[0069] [Symbol Explanation]

[0070] To make the above and other objects, features, advantages and embodiments of the present invention more apparent and understandable, the appended symbols are explained as follows:

[0071] 100: System

[0072] 101: Computer

[0073] 102: Measuring device

[0074] 110: Storage device

[0075] 120: Processor

[0076] 130: Input / Output Interface

[0077] 170: Display device

[0078] 190: Fuse Circuit

[0079] 210: Common grounding busbar

[0080] 201, 202, 216: Transistor units

[0081] 300: Method

[0082] F01, F02, F16: Fuse elements

[0083] S011, S012, S013: Transistors

[0084] S021, S022, S023: Transistors

[0085] S161, S162, S163: Transistors

[0086] S301, S303, S305: Steps.

Claims

1. A system for measuring the resistance of a fuse, characterized in that, The system includes: A storage device for storing a predetermined voltage value of a forced voltage on a common ground bus electrically connected to at least one fuse element, a first current value of a measuring current passing through the common ground bus under a first condition, a second current value of another measuring current passing through the common ground bus under a second condition, and at least one instruction. as well as A processor, electrically connected to the storage device, is used to access and execute the at least one instruction to: Subtract the second current value from the first current value to obtain the subtracted current value, thereby removing the leakage current value through the common grounding bus. The predetermined voltage value is divided by the subtracted current value to obtain the fuse resistance value of the at least one fuse element. The at least one fuse element comprises a plurality of fuse elements electrically connected to the common ground bus. The plurality of fuse elements are respectively electrically connected to a plurality of transistor units, each of which comprises one or more transistors connected in series. A measuring device is electrically connected to a fuse circuit, which includes a common ground bus, a plurality of fuse elements, and a plurality of transistor units. When a selected transistor unit is turned on and the remaining transistor units are turned off, the measuring device progressively applies a plurality of different voltages to the common ground bus to measure a plurality of different current values ​​related to a plurality of different measurement currents for the plurality of different voltages from the fuse circuit. The selected transistor unit is electrically connected to a selected fuse element among the plurality of fuse elements. The storage device stores the plurality of different current values ​​related to the plurality of different voltages, and the processor accesses and executes the at least one instruction to: set the first condition to indicate that when the first voltage among the plurality of different voltages is applied to the common ground bus, the selected transistor unit operates in the linear region and the remaining transistor units are turned off; The second condition is set to indicate that when the second voltage from the plurality of different voltages is applied to the common ground bus, the selected transistor unit operates in the linear region, the remaining transistor units are turned off, and the first voltage minus the second voltage equals the predetermined voltage value; and before the first current value is subtracted from the second current value, the first current value and the second current value are selected from the plurality of different current values ​​related to the plurality of different voltages according to the first condition and the second condition.

2. The system according to claim 1, characterized in that, The processor accesses and executes the at least one instruction to: Divide the predetermined voltage value by the subtracted current value to obtain the fuse resistance value of the selected fuse element.

3. A system for measuring the resistance of a fuse, characterized in that, The system includes: A storage device for storing a predetermined voltage value of a forced voltage on a common ground bus electrically connected to at least one fuse element, a first current value of a measuring current passing through the common ground bus under a first condition, a second current value of another measuring current passing through the common ground bus under a second condition, and at least one instruction. A processor, electrically connected to the storage device, is used to access and execute the at least one instruction to: Subtract the second current value from the first current value to obtain the subtracted current value, thereby removing the leakage current value through the common grounding bus. The predetermined voltage value is divided by the subtracted current value to obtain the fuse resistance value of the at least one fuse element. The at least one fuse element includes a plurality of fuse elements electrically connected to the common ground bus. The plurality of fuse elements are respectively electrically connected to a plurality of transistor units. Each of the plurality of transistor units includes one or more transistors connected in series. The first condition is set to indicate that when the forced voltage is applied to the common ground bus, a selected transistor unit among the plurality of transistor units operates in the linear region, and the remaining transistor units among the plurality of transistor units are turned off; as well as The second condition is set to indicate that when the forced voltage is applied to the common ground bus, the selected transistor cell and the remaining transistor cells are all turned off.

4. The system according to claim 3, characterized in that, Also includes: A measuring device is electrically connected to a fuse circuit, the fuse circuit including a common ground bus, a plurality of fuse elements, and a plurality of transistor units. When a selected transistor unit is turned on and the remaining transistor units are turned off, the measuring device applies a forced voltage to the common ground bus to measure a first current value of the measuring current from the fuse circuit. When the selected transistor unit and the remaining transistor units are all turned off, the measuring device applies the forced voltage to the common ground bus to measure a second current value of another measuring current from the fuse circuit. The selected transistor unit is electrically connected to a selected fuse element among the plurality of fuse elements.

5. The system according to claim 4, characterized in that, The processor accesses and executes the at least one instruction to: Divide the predetermined voltage value by the subtracted current value to obtain the fuse resistance value of the selected fuse element.

6. A method for measuring the resistance of a fuse, characterized in that, The method includes the following steps: A predetermined voltage value of the forced voltage on the common grounding busbar preloaded with electrical connection to at least one fuse element, a first current value of a measuring current passing through the common grounding busbar under a first condition, and a second current value of another measuring current passing through the common grounding busbar under a second condition; Subtracting the second current value from the first current value yields the subtracted current value, thereby removing the leakage current value through the common grounding busbar; and The predetermined voltage value is divided by the subtracted current value to obtain the fuse resistance value of the at least one fuse element. The method further comprises: when a selected transistor unit is turned on and the remaining transistor units are turned off, applying a plurality of different voltages to the common ground bus via a measuring device to measure a plurality of different current values ​​related to the plurality of different voltages, wherein the selected transistor unit is electrically connected to the selected fuse element; and setting the first condition to indicate that when a first voltage of the plurality of different voltages is applied to the common ground bus, the selected transistor unit operates in the linear region and the remaining transistor units are turned off. The second condition is set to indicate that when the second voltage from the plurality of different voltages is applied to the common ground bus, the selected transistor unit operates in the linear region, the remaining transistor units are turned off, and the first voltage minus the second voltage equals the predetermined voltage value; and before the first current value is subtracted from the second current value, the first current value and the second current value are selected from the plurality of different current values ​​related to the plurality of different voltages according to the first condition and the second condition.

7. The method according to claim 6, characterized in that, The step of dividing the predetermined voltage value by the subtracted current value includes: Divide the predetermined voltage value by the subtracted current value to obtain the fuse resistance value of the selected fuse element.

8. A method for measuring the resistance of a fuse, characterized in that, The method includes the following steps: A predetermined voltage value of the forced voltage on the common grounding busbar preloaded with electrical connection to at least one fuse element, a first current value of a measuring current passing through the common grounding busbar under a first condition, and a second current value of another measuring current passing through the common grounding busbar under a second condition; Subtracting the second current value from the first current value yields the subtracted current value, thereby removing the leakage current value through the common grounding busbar; and The predetermined voltage value is divided by the subtracted current value to obtain the fuse resistance value of the at least one fuse element. The at least one fuse element comprises a plurality of fuse elements electrically connected to the common ground bus, the plurality of fuse elements being electrically connected to a plurality of transistor units, each of the plurality of transistor units comprising one or more transistors connected in series, the fuse circuit comprising the common ground bus, the plurality of fuse elements, and the plurality of transistor units, the method further comprising: The first condition is set to indicate that when the forced voltage is applied to the common ground bus, a selected transistor unit among the plurality of transistor units operates in the linear region, and the remaining transistor units among the plurality of transistor units are turned off; as well as The second condition is set to indicate that when the forced voltage is applied to the common ground bus, the selected transistor cell and the remaining transistor cells are all turned off.

9. The method according to claim 8, characterized in that, Also includes: When the selected transistor unit is turned on and the remaining transistor units are turned off, the forced voltage is applied to the common ground bus by the measuring device, so as to measure the first current value of the measuring current from the fuse circuit. as well as When the selected transistor unit and the remaining transistor units are all turned off, the forced voltage is applied to the common ground bus by the measuring device to measure the second current value of the other measuring current from the fuse circuit, wherein the selected transistor unit is electrically connected to the selected fuse element among the plurality of fuse elements.

10. The method according to claim 9, characterized in that, The step of dividing the predetermined voltage value by the subtracted current value includes: Divide the predetermined voltage value by the subtracted current value to obtain the fuse resistance value of the selected fuse element.

11. A computer-readable storage medium storing a plurality of instructions to instruct a computer to perform a method for measuring the resistance of a fuse, characterized in that, The method includes the following steps: A predetermined voltage value of the forced voltage on the common grounding busbar preloaded with electrical connection to at least one fuse element, a first current value of a measuring current passing through the common grounding busbar under a first condition, and a second current value of another measuring current passing through the common grounding busbar under a second condition; Subtracting the second current value from the first current value yields the subtracted current value, thereby removing the leakage current value through the common grounding busbar; and The predetermined voltage value is divided by the subtracted current value to obtain the fuse resistance value of the at least one fuse element. The method further comprises: when a selected transistor unit is turned on and the remaining transistor units are turned off, applying a plurality of different voltages to the common ground bus via a measuring device to measure a plurality of different current values ​​related to the plurality of different voltages, wherein the selected transistor unit is electrically connected to the selected fuse element; and setting the first condition to indicate that when a first voltage of the plurality of different voltages is applied to the common ground bus, the selected transistor unit operates in the linear region and the remaining transistor units are turned off. The second condition is set to indicate that when the second voltage from the plurality of different voltages is applied to the common ground bus, the selected transistor unit operates in the linear region, the remaining transistor units are turned off, and the first voltage minus the second voltage equals the predetermined voltage value; and before the first current value is subtracted from the second current value, the first current value and the second current value are selected from the plurality of different current values ​​related to the plurality of different voltages according to the first condition and the second condition, wherein the step of dividing the predetermined voltage value by the subtracted current value includes: dividing the predetermined voltage value by the subtracted current value to obtain the fuse resistance value of the selected fuse element.

12. The computer-readable storage medium according to claim 11, characterized in that, The at least one fuse element includes a plurality of fuse elements electrically connected to the common ground bus, the plurality of fuse elements being electrically connected to a plurality of transistor units, each of the plurality of transistor units including one or more transistors connected in series, the fuse circuit including the common ground bus, the plurality of fuse elements, and the plurality of transistor units, the method further comprising: The first condition is set to indicate that when the forced voltage is applied to the common ground bus, a selected transistor unit among the plurality of transistor units operates in the linear region, and the remaining transistor units among the plurality of transistor units are turned off; as well as The second condition is set to indicate that when the forced voltage is applied to the common ground bus, the selected transistor cell and the remaining transistor cells are all turned off.

13. The computer-readable storage medium according to claim 12, characterized in that, The method also includes: When the selected transistor unit is turned on and the remaining transistor units are turned off, the forced voltage is applied to the common ground bus by the measuring device, so as to measure the first current value of the measuring current from the fuse circuit. as well as When the selected transistor unit and the remaining transistor units are all turned off, the forced voltage is applied to the common ground bus via the measuring device to measure the second current value of the other measuring current from the fuse circuit, wherein the selected transistor unit is electrically connected to a selected fuse element among the plurality of fuse elements. The step of dividing the predetermined voltage value by the subtracted current value includes: dividing the predetermined voltage value by the subtracted current value to obtain the fuse resistance value of the selected fuse element.

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