Instrument calibration systems, methods, apparatus, equipment and storage media

Abstract

This invention discloses an instrument calibration system, method, apparatus, device, and storage medium. The system includes a calibration device, a position information acquisition device, and a processor. The calibration device includes a fixed connection structure and a target plate. When calibrating an instrument, the calibration device is fixedly connected to the instrument through the fixed connection structure. The position information acquisition device is used to acquire feature point position information. The processor is used to convert the feature point calibration position information of the target plate to the coordinate system of the instrument to be calibrated based on the feature point position information, obtaining the target plate instrument coordinate system position information. Based on the target plate instrument coordinate system position information, the processor determines the connection point position between the calibration device and the instrument to be calibrated, completing the calibration of the instrument. This achieves accurate calibration of the instrument tip simultaneously with a single position information acquisition, without the need for a high-precision target plate.

Description

Technical Field

[0001] The embodiments of the present invention relate to the field of instrument calibration, and more particularly to an instrument calibration system, method, apparatus, device and storage medium. Background Technology

[0002] In surgical navigation systems, accurate instrument positioning requires calibration of the instrument tip position before each procedure. Current mainstream tip calibration methods include high-precision target calibration and fixed tip calibration. High-precision target calibration requires a high-precision target with a marker point on its surface bearing known three-dimensional coordinates. The instrument tip is located by aligning it with this marker point. Fixed tip calibration, on the other hand, requires a fixed point in space. The instrument tip is embedded in this fixed point, and then rotated around it. By using spherical fitting to determine the center coordinates, the instrument tip's location is thus established.

[0003] However, while high-precision target calibration methods are simple to operate, they require precise target machining and accurate positioning of the three-dimensional positions of the marker points. In practical use, changes in temperature and humidity can cause target deformation, leading to inaccurate three-dimensional coordinates of the marker points and thus reducing the accuracy of tip point calibration. While fixing the tip point provides high precision, it requires a fixed point in space and the surgical instrument to be rotated around the tip point. During actual rotation, the position of the fixed point in space can easily shift, reducing the accuracy of tip point calibration or even causing it to fail. Summary of the Invention

[0004] This invention provides an instrument calibration system, method, apparatus, device, and storage medium that enables accurate calibration of instrument tips without the need for a high-precision target plate.

[0005] In a first aspect, embodiments of the present invention provide a medical device calibration system, including a calibration device, a position information acquisition device, and a processor, wherein:

[0006] The calibration device includes a fixed connection structure and a target plate. When calibrating the instrument to be calibrated, the calibration device is fixedly connected to the instrument to be calibrated through the fixed connection structure.

[0007] The location information acquisition device is used to acquire feature point location information, wherein the feature point location information includes target plate feature point calibration location information and instrument feature point location information. The target plate feature point calibration location information includes the location information of at least three target plate feature points of the target plate, and the instrument feature point location information includes the location information of at least three instrument feature points of the instrument to be calibrated.

[0008] The processor is configured to convert the target plate feature point calibration position information to the coordinate system of the instrument to be calibrated based on the feature point position information, thereby obtaining the target plate instrument coordinate system position information, and determine the connection point position between the calibration device and the instrument to be calibrated based on the target plate instrument coordinate system position information, thereby completing the calibration of the instrument to be calibrated. The target plate instrument coordinate system position information refers to the position information of the target plate feature points in the instrument coordinate system, and the connection point is the set point at the fixed connection between the fixed connection structure and the instrument to be calibrated.

[0009] Secondly, embodiments of the present invention also provide a device calibration method, executed by a processor in the device calibration system provided in any embodiment of the present invention, the method comprising:

[0010] Acquire feature point location information, wherein the feature point location information includes target plate feature point calibration location information and instrument feature point location information, the target plate feature point calibration location information includes the location information of at least three target plate feature points of the target plate, and the instrument feature point location information includes the location information of at least three instrument feature points of the instrument to be calibrated;

[0011] Based on the feature point location information, the target plate feature point calibration location information is transformed to the coordinate system of the instrument to be calibrated to obtain the target plate instrument coordinate system location information, wherein the target plate instrument coordinate system location information is the location information of the target plate feature points in the instrument coordinate system;

[0012] Based on the coordinate system position information of the target plate, the connection point position between the target plate and the instrument to be calibrated is determined, and the calibration of the instrument to be calibrated is completed. The connection point is the set point at the fixed connection point between the fixed connection structure and the instrument to be calibrated.

[0013] Thirdly, embodiments of the present invention also provide a device calibration apparatus, configured in the processor of the device calibration system provided in any embodiment of the present invention, comprising:

[0014] The information acquisition module is used to acquire feature point location information, wherein the feature point location information includes target plate feature point calibration location information and instrument feature point location information. The target plate feature point calibration location information includes the location information of at least three target plate feature points of the target plate, and the instrument feature point location information includes the location information of at least three instrument feature points of the instrument to be calibrated.

[0015] The coordinate transformation module is used to transform the calibration position information of the target plate feature points to the coordinate system of the instrument to be calibrated based on the feature point position information, so as to obtain the target plate instrument coordinate system position information, wherein the target plate instrument coordinate system position information is the position information of the target plate feature points in the instrument coordinate system;

[0016] The instrument calibration module is used to determine the connection point position between the target plate and the instrument to be calibrated based on the position information of the target plate instrument coordinate system, and to complete the calibration of the instrument to be calibrated. The connection point is the set point at the fixed connection between the fixed connection structure and the instrument to be calibrated.

[0017] Fourthly, embodiments of the present invention also provide a computer device, the device comprising:

[0018] One or more processors;

[0019] Storage device for storing one or more programs;

[0020] When one or more programs are executed by one or more processors, the one or more processors implement the instrument calibration method as provided in any embodiment of the present invention.

[0021] Fifthly, embodiments of the present invention also provide a computer-readable storage medium having a computer program stored thereon, which, when executed by a processor, implements the instrument calibration method as provided in any embodiment of the present invention.

[0022] The instrument calibration system provided in this embodiment of the invention includes a calibration device, a position information acquisition device, and a processor. The calibration device includes a fixed connection structure and a target plate. When calibrating the instrument to be calibrated, the calibration device is fixedly connected to the instrument through the fixed connection structure. The position information acquisition device is used to acquire feature point position information, wherein the feature point position information includes target plate feature point calibration position information and instrument feature point position information. The target plate feature point calibration position information includes the position information of at least three target plate feature points, and the instrument feature point position information includes… The processor is configured to: ... Attached Figure Description

[0023] Figure 1a This is a schematic diagram of the structure of a calibration device in an instrument calibration system provided in Embodiment 1 of the present invention;

[0024] Figure 1b This is a schematic diagram of the structure of a calibration instrument provided in Embodiment 1 of the present invention;

[0025] Figure 2 This is a flowchart of a device calibration method provided in Embodiment 2 of the present invention;

[0026] Figure 3 This is a schematic diagram of the structure of an instrument calibration device provided in Embodiment 3 of the present invention;

[0027] Figure 4 This is a flowchart of a device calibration method provided in Embodiment 4 of the present invention;

[0028] Figure 5 This is a schematic diagram of the structure of a computer device provided in Embodiment 5 of the present invention. Detailed Implementation

[0029] The present invention will now be described in further detail with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative of the invention and not intended to limit it. Furthermore, it should be noted that, for ease of description, the accompanying drawings show only the parts relevant to the present invention, and not all of the structures.

[0030] Example 1

[0031] Figure 1a This is a schematic diagram of the calibration device in an instrument calibration system provided in Embodiment 1 of the present invention. This embodiment is applicable to situations where instrument tips are calibrated.

[0032] In this embodiment, the instrument calibration system includes a calibration device, a position information acquisition device, and a processor, wherein:

[0033] The calibration device includes a fixed connection structure and a target plate. When calibrating the instrument to be calibrated, the calibration device is fixedly connected to the instrument to be calibrated through the fixed connection structure.

[0034] The location information acquisition device is used to acquire feature point location information, wherein the feature point location information includes target plate feature point calibration location information and instrument feature point location information. The target plate feature point calibration location information includes the location information of at least three target plate feature points of the target plate, and the instrument feature point location information includes the location information of at least three instrument feature points of the instrument to be calibrated.

[0035] The processor is configured to convert the target plate feature point calibration position information to the coordinate system of the instrument to be calibrated based on the feature point position information, thereby obtaining the target plate instrument coordinate system position information, and determine the connection point position between the calibration device and the instrument to be calibrated based on the target plate instrument coordinate system position information, thereby completing the calibration of the instrument to be calibrated. The target plate instrument coordinate system position information refers to the position information of the target plate feature points in the instrument coordinate system, and the connection point is the set point at the fixed connection between the fixed connection structure and the instrument to be calibrated.

[0036] The instrument calibration system provided in this embodiment of the invention does not require a high-precision target plate or fixation of the instrument tip, enabling calibration of the instrument tip after a single position information acquisition. In other words, compared to high-precision target calibration methods, this instrument calibration system does not require high-precision target plate accuracy, and therefore the calibration accuracy is not affected by target deformation. Compared to fixed-tip calibration methods, in this embodiment, the target plate can be fixed through a fixed connection structure, eliminating the need to move or rotate the calibration device during the calibration process. Therefore, the influence of instrument tip positional offset on calibration is not considered, solving the defects of high-precision target calibration and fixed-point tip calibration in the prior art. Optionally, the fixed connection structure can be a drill bit structure, which is not limited here.

[0037] Overall, the embodiments of the present invention require a target plate with observable features on its surface, and the target plate has a structure that can be connected by a fixed connection structure. By connecting the tip of the surgical instrument with the observable features of the navigator to the target plate through the fixed connection structure, the tip of the surgical instrument can be accurately calibrated by using spatial coordinate transformation relationship and circle center fitting.

[0038] Figure 1b This is a schematic diagram of the structure of a calibration device provided in Embodiment 1 of the present invention. The target plate of the calibration device in the calibration system provided in this embodiment of the invention has no precision requirements, but its surface must have features that can be observed by a position information acquisition device (such as a navigator). (For example, for an infrared navigator, this could be a reflective ball or infrared LED; for a visible light navigator, this could be a feature code or typical image features such as circles or corners). The number of features must be at least three, and all features must be non-collinear, allowing for unique identification based on feature type or positional relationship. The surface of the device to be calibrated must also have features that can be observed by a navigator. The number of features must be at least three, and all features must be non-collinear, allowing for unique identification based on feature type or positional relationship. During the calibration process, a drill bit system ensures a fixed connection between the device tip and the target plate, allowing the calibration device to rotate slowly along the axis of the drill bit mounting groove. The position information acquisition device repeatedly acquires the position information of the device feature points and the target plate feature points during the device rotation. The processor calculates the position of the device tip based on the acquired position information, thereby achieving the calibration of the device tip.

[0039] It should be noted that during calibration, the calibration device and the instrument to be calibrated must be fixedly connected and placed within the navigator's field of view. Both the surface features of the target plate and the surface features of the instrument to be calibrated must be observable by the position information acquisition device. The position information acquisition device should then begin data acquisition and processing. The calibration device should slowly rotate along the axis of the drill bit mounting groove while continuously acquiring and processing data (at least four sets of data need to be acquired). After rotating to the set angle, the data acquisition process is complete. The set angle can be determined according to actual needs, such as based on the positional relationship of the target plate's feature points.

[0040] In one embodiment of the present invention, the step of transforming the target plate feature point calibration position information to the coordinate system of the instrument to be calibrated based on the feature point position information to obtain the target plate instrument coordinate system position information includes: for each target plate feature point in each group of feature point position information, determining the position transformation parameter corresponding to the target plate feature point according to the target plate feature point calibration position information and the reference feature point position information; and transforming the target plate feature point calibration position information to the coordinate system of the instrument to be calibrated according to the position transformation parameter to obtain the target plate instrument coordinate system position information. It is understood that the feature point position information acquired by the position information acquisition device in a single transaction includes instrument feature point position information and target plate feature point position information. Considering the irregular distribution of surgical instrument surface feature points in different acquisitions under the world coordinate system or navigation coordinate system; and given that the tip of the surgical instrument is always connected to the target plate via a fixed connection structure, the distribution of surgical instrument surface feature points under different acquisitions follows a certain pattern in the target plate coordinate system. Therefore, to calibrate the instrument to be calibrated, it is necessary to transform the calibration position information of the target plate feature points to the instrument coordinate system. This can be achieved through coordinate registration, transforming the position coordinates of the instrument feature points to the target plate coordinate system; therefore, the corresponding position transformation parameters need to be obtained.

[0041] Assuming continuous image acquisition was performed during the calibration process, the initial three-dimensional coordinates of the instrument feature points {P} are used. b1 As a baseline group, the three-dimensional coordinates of the instrument feature points (target plate feature point calibration position information) of all groups can be calculated separately. b1},{P b2},{P b3 The coordinate transformation relationship between the reference group and the standard group is established. Since the three-dimensional point coordinates are arranged in an ordered manner, the matching points can be directly determined from the three-dimensional coordinates of the instrument feature points between each group. The coordinate transformation relationship R can then be calculated through least squares optimization. 11 ,t 11 ,R 12 ,t 12 ,R 13 ,t 13 ,…, where R 1i ,t1i The rotation matrix and translation vector from the i-th group to the reference group are respectively represented by the position transformation parameters.

[0042] For example, based on the coordinate transformation parameters mentioned above, the location information of the target plate feature points in the corresponding group {P} can be directly determined. t1},{P t2},{P t3},… Transform to the instrument coordinate system to obtain the set of three-dimensional coordinates of the target plate feature points in the instrument coordinate system {P t1_b},{P t2_b},{P t3_b},…。 Using the i-th group of target plate feature point data {P ti For example, the transformed coordinate set is {P} ti_b}, then the i-th coordinate transformation relationship R can be used. 1i ,t 1i Transform to the instrument coordinate system, the relationship is as follows, p ti and p ti_b They are respectively {P ti} and {P ti_b The corresponding 3D point coordinates in} are: p ti_b =R 1i ·p ti +t 1i .

[0043] After unifying the coordinates to the same coordinate system, the instrument tip can be calibrated based on the position information in the same coordinate system. Optionally, determining the connection point position of the calibration device and the instrument to be calibrated based on the target plate instrument coordinate system position information includes: determining the intersection point instrument coordinate system position information of the calibration device in the coordinate system of the instrument to be calibrated based on the intersection point position information of the target plate instrument coordinate system and the calibration device, wherein the intersection point of the calibration device is the intersection point of the fixed connection structure in the calibration device and the target plate; and determining the connection point position based on the intersection point instrument coordinate system position information, the axial unit vector of the calibration device, and the length parameter of the fixed connection structure.

[0044] In this embodiment, the connection point location information between the calibration device and the instrument to be calibrated is determined by the position information of the target plate in the instrument coordinate system. It is understood that the target plate in the calibration device is connected to the instrument to be calibrated via a fixed connection structure. Therefore, the position of the intersection of the target plate and the fixed connection structure in the instrument coordinate system, as well as the attribute parameters of the fixed connection structure, are needed to determine the connection point location information between the calibration device and the instrument to be calibrated. Assuming the calibration device is as follows... Figure 1aIn this structure, the fixed connection structure is long and thin, with one end connected to the target plate and the other end connected to the instrument to be calibrated. In this case, if the position of the intersection of the target plate and the fixed connection structure is determined, the connection point between the fixed connection structure and the instrument to be calibrated can be obtained by combining the attribute parameters of the fixed connection structure, that is, the connection point between the calibration device and the instrument to be calibrated.

[0045] In other words, given the location of a point (the intersection of the target plate and the fixed connection structure), determining the location of another point connected to that point via the fixed connection (the connection point between the calibration device and the instrument to be calibrated) requires knowing the length and angle of the fixed connection structure, i.e., the length parameter of the fixed connection structure and the axial unit vector of the calibration device. The connection point between the calibration device and the instrument to be calibrated is obtained through geometric calculation using the intersection of the target plate and the fixed connection structure, the length parameter of the fixed connection structure, and the axial unit vector of the calibration device. The length parameter of the fixed connection structure can be measured and obtained beforehand, and the axial unit vector of the calibration device can be determined through calibration of the calibration device.

[0046] The connection point between the calibration device and the instrument to be calibrated can be any point on the connecting surface of the calibration device and the instrument to be calibrated. Generally, the calibration of the instrument to be calibrated usually involves calibrating its tip, which is typically the center. Therefore, to make the calibration more accurate, the center of the connecting surface between the calibration device and the instrument to be calibrated can be used as the connection point. The same principle applies to the intersection of the target plate and the fixed connection structure; the center of the connecting surface between the target plate and the fixed connection structure is used as the intersection point.

[0047] Based on the above scheme, the position information acquisition device is further configured to: acquire multiple sets of target plate feature point calibration position information when the calibration device rotates along a fixed axis; the processor is further configured to convert the target plate feature point calibration position information to a calibration coordinate system to obtain target plate calibration coordinate position information, and determine the calibration device parameter information of the calibration device based on the target plate calibration coordinate position information, wherein the calibration device parameter information includes intersection point position information and axial unit vector.

[0048] Optionally, the calibration device can be calibrated before calibrating the instrument to be calibrated to obtain calibration device parameter information for use when calibrating the instrument to be calibrated.

[0049] When calibrating the calibration device, it is necessary to fix the calibration device on the calibration platform, control the calibration device to rotate along its axis, collect multiple sets of target plate feature point calibration position information through the position information acquisition device, and then process the multiple sets of target plate feature point calibration position information through the processor to obtain the calibration device parameter information.

[0050] In one embodiment of the present invention, determining the calibration device parameter information of the calibration device based on the target plate calibration coordinate position information includes: for each target plate feature point, performing plane fitting based on the target plate calibration coordinate position information of the target plate feature point in each set of target plate calibration coordinate position information to obtain a fitting plane, and using the plane normal vector of the fitting plane as the axial unit vector; performing circle center fitting based on the fitting plane to determine the target circle center position, and using the position information of the target circle center position as the intersection point position information of the fixed connection structure and the target surface.

[0051] It is understandable that the target plate feature points are located on the target plate surface at a certain distance from the instrument tip. Each target plate feature point, when the calibration device rotates around an axis, forms a circular region with the corresponding axis position as its center and the distance between the target plate feature point and the center as its radius. When the target plate feature points rotate axially to form a circular region, the center of this circular region is the position of the corresponding axis. Based on this, the circular region can be projected onto a plane parallel to the plane containing the circular region and passing through the intersection point. The target center position is then determined based on the projected circular region as the intersection point position.

[0052] The projection plane is parallel to the plane containing the circular region; that is, the projection is performed along the normal vector of the plane containing the circular region. Based on the above scheme, the step of fitting the center of the circle based on the fitting plane to determine the target center position includes: projecting the calibration coordinate position information of the target plate onto the set plane based on the plane normal vector to obtain the projection point; constructing the center fitting equation based on the projection point; and fitting the target center position according to the center fitting equation corresponding to each feature point of the target plate.

[0053] For each target feature point, a circle center fitting equation is constructed based on the projection point. Combining the circle fitting equation for each target feature point, the target circle center position can be obtained. Optionally, the circle center position corresponding to each target feature point can be obtained as a single circle center position based on the circle center fitting equation for each target feature point, and then the target circle center position can be calculated based on all the single circle center positions, such as using the center position of all circle center positions as the target circle center position, or calculating the feature value of each single circle center position as the target circle center position. Optionally, the circle center fitting equations for each target feature point can also be combined to obtain a system of equations, and the single circle center position can be directly calculated based on the system of equations. Based on this, fitting the target circle center position according to the circle center fitting equation includes: combining the circle center fitting equations and obtaining the target circle center position using the least squares method.

[0054] When performing circle center fitting, first determine the plane normal direction as the direction from the fitting plane to the tail of the fixed connection structure, and normalize it to obtain the unit vector (n). x ,n y ,n z Based on the plane equation of the target surface feature points, the corresponding feature points are projected onto the {x,y} plane where z is 0. Each observable target surface feature point can be used to obtain the corresponding feature point set {P}. bi_p Since the feature points rotate around the axis to form a circle, assume the coordinates of the projected feature points are (x, y) and the coordinates of the circle center are (x, y). o ,y o If the radius of rotation is r, then the following relationship exists:

[0055]

[0056] When the same feature point is observed more than three times in all the collected data, the coordinates of the center of the circle can be calculated by solving the simultaneous equations (x... o ,y o ,z o The radius of rotation is r; and for each feature point on the surface of the surgical instrument, the above equation can be established for each observation. The coordinates of the center of the circle can be obtained by solving the equations simultaneously and calculating by least squares, and then the intersection point of the fixed connection structure and the target surface can be determined.

[0057] For example, the center-fitting method can be: based on the three-dimensional coordinates {P} of all target plate feature points transformed to the instrument coordinate system. b1_t},{P b2_t},{P b3_t In the instrument coordinate system, since the target plate feature points rotate around the axis of the surgical instrument mounting slot to form a plane, assuming the feature point coordinates are (x, y, z) and the plane normal is (N... x N y N zIf ), then the following relationship exists:

[0058]

[0059] When the same feature point is observed more than four times in all the collected data, the plane normal can be calculated by solving the simultaneous equations (N). x N y N z D is the constant term of the plane equation; and for each feature point of the target plate and each observation, the above equation can be established. By solving the simultaneous equations and performing least squares calculations, the plane normal and the constant term D of the plane equation corresponding to the i-th feature point of the target plate can be obtained. i .

[0060] In another embodiment of the present invention, the center of the circle can be fitted onto the fitting plane to determine the position of the center of the circle on the fitting plane. Then, the position of the center of the circle on the fitting plane is projected along the axial unit vector onto a plane parallel to the fitting plane and passing through the intersection point to obtain the target center position. The fitting and projection of the center of the circle can be referred to the above embodiments, and will not be repeated here.

[0061] The calibration device in the instrument calibration system provided in this invention has a simple structure, consisting only of a fixed connection structure and a target plate with observable features. The drill bit axis can be obtained through calibration, which reduces the precision requirements for instrument processing and enables rapid calibration of the drill bit tip and axis. The calibration device integrates the drill bit and target plate into a single structure, effectively avoiding the problem of deformation or wobbling of the instrument tip caused by applying excessive force to ensure a tight fit between the surgical instrument tip and the bottom of the calibration groove.

[0062] Example 2

[0063] Figure 2 This is a flowchart of a device calibration method provided in Embodiment 2 of the present invention. This method can be executed by the processor provided in the above embodiments. The processor can be implemented in software and / or hardware; for example, the processor can be configured in a computer device. Figure 2 As shown, the method includes:

[0064] S210. Obtain feature point location information, wherein the feature point location information includes target plate feature point calibration location information and instrument feature point location information, the target plate feature point calibration location information includes the location information of at least three target plate feature points of the target plate, and the instrument feature point location information includes the location information of at least three instrument feature points of the instrument to be calibrated.

[0065] S220. Based on the feature point location information, the target plate feature point calibration location information is transformed to the coordinate system of the instrument to be calibrated to obtain the target plate instrument coordinate system location information, wherein the target plate instrument coordinate system location information is the location information of the target plate feature points in the instrument coordinate system.

[0066] S230. Based on the coordinate system position information of the target plate, determine the connection point position between the target plate and the instrument to be calibrated, and complete the calibration of the instrument to be calibrated. The connection point is the set point at the fixed connection between the fixed connection structure and the instrument to be calibrated.

[0067] In one embodiment, the step of converting the target plate feature point calibration position information to the coordinate system of the instrument to be calibrated based on the feature point position information to obtain the target plate instrument coordinate system position information includes:

[0068] For each target plate feature point in the feature point location information, the position transformation parameters corresponding to the target plate feature point are determined based on the target plate feature point calibration location information and the reference feature point location information.

[0069] The target plate feature point calibration position information is converted to the coordinate system of the instrument to be calibrated according to the position transformation parameters, so as to obtain the target plate instrument coordinate system position information.

[0070] In one embodiment, determining the connection point position between the calibration device and the instrument to be calibrated based on the target plate instrument coordinate system position information includes:

[0071] The intersection point of the calibration device in the coordinate system of the instrument to be calibrated is determined based on the position information of the target plate in the instrument coordinate system and the position information of the intersection point of the calibration device. The intersection point of the calibration device is the intersection point of the fixed connection structure and the target plate in the calibration device.

[0072] The position of the connection point is determined based on the coordinate system position information of the intersection instrument, the axial unit vector of the calibration device, and the length parameter of the fixed connection structure.

[0073] In one embodiment, it further includes:

[0074] When the calibration device rotates along a fixed axis, the position information acquisition device acquires multiple sets of target plate feature point calibration position information;

[0075] The target plate feature point calibration position information is converted to the calibration coordinate system to obtain the target plate calibration coordinate position information. Based on the target plate calibration coordinate position information, the calibration device parameter information of the calibration device is determined. The calibration device parameter information includes intersection point position information and axial unit vector.

[0076] In one embodiment, determining the calibration device parameter information of the calibration device based on the target plate calibration coordinate position information includes:

[0077] For each target plate feature point, a plane fitting is performed based on the target plate calibration coordinate position information of the target plate feature point in each group of target plate calibration coordinate position information to obtain a fitting plane, and the plane normal vector of the fitting plane is used as the axial unit vector.

[0078] Based on the fitted plane, a circle center is fitted to determine the target circle center position, and the position information of the target circle center position is used as the intersection point position information of the fixed connection structure and the target surface.

[0079] In one embodiment, determining the target circle center position based on the fitting plane by performing circle center fitting includes:

[0080] Based on the plane normal vector, the target plate calibration coordinate position information is projected onto a set plane to obtain the projection point;

[0081] The center-fitting equation is constructed based on the projection points, and the target center position is fitted according to the center-fitting equation corresponding to the feature points of each target plate.

[0082] For a more specific method of determining the target center position based on the target plate coordinate system position information, please refer to the above embodiment, which will not be repeated here.

[0083] This invention achieves accurate calibration of the instrument tip without the need for a high-precision target plate by acquiring feature point location information; transforming the target plate feature point calibration location information to the coordinate system of the instrument to be calibrated based on the feature point location information; and determining the connection point position between the target plate and the instrument to be calibrated based on the target plate instrument coordinate system position information, thereby completing the calibration of the instrument to be calibrated.

[0084] Example 3

[0085] Figure 3 This is a schematic diagram of the structure of an instrument calibration device provided in Embodiment 3 of the present invention. As shown in Figure 3, the device includes an information acquisition module 310, a coordinate transformation module 320, and an instrument calibration module 330, wherein:

[0086] The information acquisition module 310 is used to acquire feature point location information, wherein the feature point location information includes target plate feature point calibration location information and instrument feature point location information. The target plate feature point calibration location information includes the location information of at least three target plate feature points of the target plate, and the instrument feature point location information includes the location information of at least three instrument feature points of the instrument to be calibrated.

[0087] The coordinate transformation module 320 is used to transform the calibration position information of the target plate feature points to the coordinate system of the instrument to be calibrated based on the feature point position information, so as to obtain the target plate instrument coordinate system position information, wherein the target plate instrument coordinate system position information is the position information of the target plate feature points in the instrument coordinate system;

[0088] The instrument calibration module 330 is used to determine the connection point position between the target plate and the instrument to be calibrated based on the position information of the target plate instrument coordinate system, and to complete the calibration of the instrument to be calibrated. The connection point is the set point at the fixed connection between the fixed connection structure and the instrument to be calibrated.

[0089] This invention achieves accurate calibration of the instrument tip without the need for a high-precision target plate by acquiring feature point location information; transforming the target plate feature point calibration location information to the coordinate system of the instrument to be calibrated based on the feature point location information; and determining the connection point position between the target plate and the instrument to be calibrated based on the target plate instrument coordinate system position information, thereby completing the calibration of the instrument to be calibrated.

[0090] Based on the above scheme, optionally, the coordinate transformation module 320 is specifically used for:

[0091] For each target plate feature point in the feature point location information, the position transformation parameters corresponding to the target plate feature point are determined based on the target plate feature point calibration location information and the reference feature point location information.

[0092] The target plate feature point calibration position information is converted to the coordinate system of the instrument to be calibrated according to the position transformation parameters, so as to obtain the target plate instrument coordinate system position information.

[0093] Based on the above scheme, optionally, the instrument calibration module 330 is specifically used for:

[0094] The intersection point of the calibration device in the coordinate system of the instrument to be calibrated is determined based on the position information of the target plate in the instrument coordinate system and the position information of the intersection point of the calibration device. The intersection point of the calibration device is the intersection point of the fixed connection structure and the target plate in the calibration device.

[0095] The position of the connection point is determined based on the coordinate system position information of the intersection instrument, the axial unit vector of the calibration device, and the length parameter of the fixed connection structure.

[0096] Based on the above scheme, optionally, the device also includes a calibration module for:

[0097] When the calibration device rotates along a fixed axis, the position information acquisition device acquires multiple sets of target plate feature point calibration position information;

[0098] The target plate feature point calibration position information is converted to the calibration coordinate system to obtain the target plate calibration coordinate position information. Based on the target plate calibration coordinate position information, the calibration device parameter information of the calibration device is determined. The calibration device parameter information includes intersection point position information and axial unit vector.

[0099] Based on the above scheme, optionally, the calibration module of the calibration device is specifically used for:

[0100] For each target plate feature point, a plane fitting is performed based on the target plate calibration coordinate position information of the target plate feature point in each group of target plate calibration coordinate position information to obtain a fitting plane, and the plane normal vector of the fitting plane is used as the axial unit vector.

[0101] Based on the fitted plane, a circle center is fitted to determine the target circle center position, and the position information of the target circle center position is used as the intersection point position information of the fixed connection structure and the target surface.

[0102] Based on the above scheme, optionally, the calibration module of the calibration device is specifically used for:

[0103] Based on the plane normal vector, the target plate calibration coordinate position information is projected onto a set plane to obtain the projection point;

[0104] The center-fitting equation is constructed based on the projection points, and the target center position is fitted according to the center-fitting equation corresponding to the feature points of each target plate.

[0105] The instrument calibration device provided in the embodiments of the present invention can execute the instrument calibration method provided in any embodiment of the present invention, and has the corresponding functional modules and beneficial effects of the method execution.

[0106] Example 4

[0107] Figure 4 This is a schematic flowchart of an instrument calibration method provided in Embodiment 4 of the present invention. Based on the above embodiments, this embodiment provides a preferred embodiment.

[0108] The calibration device required in the calibration method provided in this embodiment includes a fixed connection structure and a target plate. The surface of the target plate includes a target surface carrying features that can be observed by the navigator (e.g., for infrared navigators, a reflective ball or infrared LED; for visible light navigators, a feature code or typical image features such as circles or corners). The number of features must be at least three, and unique identification can be achieved based on the feature type or the positional relationship between features. Similarly, the surface of the surgical instrument must also have features that can be observed by the navigator, with at least three features required, and unique identification can be achieved based on the feature type or the positional relationship between features.

[0109] During calibration, the calibration device is installed in the surgical instrument drill bit mounting slot and placed within the navigator's field of view for observation. The calibration of the surgical instrument is completed quickly based on the relationship between the drill bit axis and the distance from the drill bit tip to the target surface.

[0110] like Figure 4 As shown, the instrument calibration method provided in this embodiment includes:

[0111] S410. Install the calibration device into the drill bit mounting slot of the surgical instrument to be calibrated.

[0112] Throughout the calibration process, the fixed connection structure of the calibration device must be kept in close contact with the bottom of the drill bit mounting slot of the surgical instrument to be calibrated without any shaking. This process can be achieved with the help of a slot clamping device or other clamping structure.

[0113] S420. Place the surgical instrument to be calibrated, equipped with a calibration device, within the navigator's field of view, ensuring that the surface features of the calibration device and the surgical instrument to be calibrated can be observed, and activate the image acquisition mode of the navigator.

[0114] S430. Based on the collected data, transform the three-dimensional coordinates of all target plate surface feature points to the coordinate system of the surgical instrument to be calibrated.

[0115] A simple method for converting all target plate feature point data to the surgical instrument coordinate system is as follows: For the acquired surgical instrument feature point data, a reference group is set. Based on the pairing relationship of the instrument feature points, the pose transformation relationship between the feature points of the remaining groups and the feature points of the reference group is calculated. The coordinates of the corresponding target plate feature points are then transformed according to the pose transformation relationship, thus unifying them to the surgical instrument coordinate system. Optionally, the following steps may be included:

[0116] 3.1) Based on the data obtained in S420, a single measurement can obtain the ordered three-dimensional coordinate set of all feature points z on the target plate and surgical instrument surface in the navigation coordinate system, denoted as {P}. b} and {P t For continuously acquired images, multiple ordered sets of three-dimensional coordinates of target plate and surgical instrument feature points can be obtained, denoted as {P}.b1},{P b2},{P b3},…and {P t1},{P t2},{P t3},…

[0117] 3.2) Based on the data grouping in step 3.1), use the three-dimensional coordinates of the surgical instrument feature points in the initial group {P}. t1 As a baseline group, the three-dimensional coordinates of the surgical instrument feature points {P} can be calculated for each group. t1},{P t2},{P t3 Coordinate transformation relationship between the target group, ... and the baseline group: Since the three-dimensional point coordinates are arranged in an ordered manner, the matching points can be directly determined by the three-dimensional coordinates of the target plates in each group. The coordinate transformation relationship R can be calculated by least squares optimization. 11 ,t 11 ,R 12 ,t 12 ,R 13 ,t 13 ,…, where R 1i ,t 1i These represent the rotation matrix and translation vector from the i-th group to the reference group, respectively.

[0118] 3.3) Based on the coordinate transformation relationship in step 3.2), the coordinates of the corresponding target plate feature points {P} can be directly converted. b1},{P b2},{P b3},… Transform to the surgical instrument coordinate system (reference group) to obtain the three-dimensional coordinate set of the target plate feature points {P} in the surgical instrument coordinate system. b1_t},{P b2_t},{P b3_t},…。 Using the i-th group of target plate feature point data {P ti For example, the transformed coordinate set is {P} bi_t}, then the i-th coordinate transformation relationship R can be used. 1i ,t 1i Transforming to the surgical instrument coordinate system, the relationship is as follows, p bi and p bi_t They are respectively {P bi} and {P bi_t The corresponding 3D point coordinates in}

[0119] p bi_t =R 1i ·p bi +t 1i

[0120] S440. Based on the three-dimensional coordinates of all target plate surface feature points transformed to the coordinate system of the surgical instrument to be calibrated, combined with the parameter information of the calibration device, calculate the bottom coordinates and axial direction of the drill bit mounting groove of the surgical instrument to be calibrated, and complete the instrument calibration.

[0121] Specifically, based on S430, the position of the target plate relative to the surgical instruments is determined, and the calibration device parameter information includes the intersection point (x) of the fixed connection structure and the target surface. b_o ,y b_o ,z b_o ), drill bit axial unit vector (n x ,n y ,n z The direction is from the target surface to the drill bit tip, and the distance d from the target surface to the drill bit tip is used to calculate the coordinates of the bottom of the mounting groove and the axial information to complete the instrument calibration, as follows:

[0122] (x clb ,y clb ,z clb )=(x b_o ,y b_o ,z b_o )+(n x ,n y ,n z )*b

[0123] (v x ,v y ,v z )=-(n x ,n y ,n z )

[0124] (x clb ,y clb ,z clb The coordinates of the bottom of the drill bit mounting slot of the calibrated instrument are given. The coordinates of the bottom of the drill bit mounting slot can be calculated by averaging the coordinates of all target plates converted to the instrument coordinate system. x ,v y ,v z ) is the axis vector corresponding to the drill bit mounting groove of the calibrated instrument, with the direction from the bottom of the groove to the top of the groove.

[0125] Before calibrating the instrument to be calibrated, the calibration device is calibrated using a calibration platform. During calibration, the calibration device is installed in the drill bit mounting slot of the calibration platform, which carries observable features of the navigator. The relative position of the drill bit mounting slot and the observable features of the navigator remains unchanged. First, the distance between the tip of the drill bit and the target surface is obtained. Then, the calibration device is installed in the drill bit mounting slot of the calibration platform and placed within the navigator's field of view for observation. The calibration device is slowly rotated along the axis of the drill bit mounting slot to fit the drill bit structure relative to the target plate axis and calculate the intersection point of the drill bit and the target surface, thus completing the calibration of the calibration device. Specifically, the calibration includes the following steps:

[0126] 1) The distance between the tip of the drill bit and the target surface of the calibration device can be measured using vernier calipers;

[0127] 2) Install the calibration device into the drill bit mounting slot of the calibration platform. Throughout the calibration process, the drill bit structure of the calibration device must be kept in close contact with the bottom of the drill bit mounting slot of the calibration platform without any shaking.

[0128] 3) Place the surgical instrument to be calibrated, equipped with the calibration device described in step 2), into the field of view that the navigator can recognize, ensuring that the surface features of the calibration device and the calibration platform can be observed. Turn on the image acquisition mode of the navigator and slowly rotate the calibration device along the axis of the drill bit mounting groove.

[0129] 4) Based on the data obtained in step 3), transform the three-dimensional coordinates of all target plate surface feature points to the calibration platform coordinate system;

[0130] 5) Based on the three-dimensional coordinates of all target plate surface feature points transformed to the calibration platform coordinate system in step 4), the drill bit axis can be fitted and the intersection point of the drill bit and the target surface can be calculated.

[0131] 6) Based on steps 1) and 5), the coordinates and axial direction of the drill bit tail of the calibration device can be calculated to complete the calibration of the calibration device.

[0132] Optionally, planar fitting is performed first, based on the three-dimensional coordinates {P} of all surgical instrument surface feature points transformed to the target plate coordinate system. b1_t},{P b2_t},{P b3_t In the surgical instrument coordinate system, since the target plate feature points rotate around the axis of the surgical instrument mounting slot to form a plane, assuming the feature point coordinates are (x, y, z) and the plane normal is (N... x N y N z If ), then the following relationship exists:

[0133]

[0134] When the same feature point is observed more than four times in all the collected data, the plane normal can be calculated by solving the simultaneous equations (N). x N y N z D is the constant term of the plane equation; and for each feature point of the target plate and each observation, the above equation can be established. By solving the simultaneous equations and performing least squares calculations, the plane normal and the constant term D of the plane equation corresponding to the i-th feature point of the target plate can be obtained. i .

[0135] Based on the plane fitting results, perform circle center fitting: First, determine the plane normal direction as the direction from the fitting plane to the tail of the fixed connection structure, and normalize it to obtain the unit vector (n). x ,n y ,n z Based on the plane equation of the target surface feature points, the corresponding feature points are projected onto the {x,y} plane where z is 0. Each observable target surface feature point can be used to obtain the corresponding feature point set {P}. bi_p Since the feature points rotate around the axis to form a circle, assume the coordinates of the projected feature points are (x, y) and the coordinates of the circle center are (x, y). o ,y o If the radius of rotation is r, then the following relationship exists:

[0136]

[0137] When the same feature point is observed more than three times in all the collected data, the coordinates of the center of the circle can be calculated by solving the simultaneous equations (x... o ,y o ,z o The radius of rotation is r; and for each feature point on the surface of the surgical instrument, the above equation can be established for each observation. The coordinates of the center of the circle can be obtained by solving the equations simultaneously and calculating by least squares, and then the intersection point of the fixed connection structure and the target surface can be determined.

[0138] This invention provides a simple calibration device that effectively reduces machining costs. By simplifying the structure of the calibration device, it effectively avoids the problem of deformation or wobbling of the instrument tip caused by applying excessive force to ensure a tight fit between the surgical instrument tip and the bottom of the calibration groove. Furthermore, by inserting the calibration device into the corresponding drill bit mounting slot to calculate the axial direction of the drill bit relative to the target plate, the instrument machining accuracy requirements are reduced, resulting in lower costs and more stable calibration. It enables rapid calibration of the drill bit tip and axial direction, simplifies the calibration process, makes the entire calibration process simple and convenient, and reduces the risk of calibration failure.

[0139] Example 5

[0140] Figure 5 This is a schematic diagram of the structure of a computer device provided in Embodiment 5 of the present invention. Figure 5 A block diagram of an exemplary computer device 512 suitable for implementing embodiments of the present invention is shown. Figure 5 The computer device 512 shown is merely an example and should not impose any limitation on the functionality and scope of use of the embodiments of the present invention.

[0141] like Figure 5 As shown, the computer device 512 is represented in the form of a general-purpose computing device. The components of the computer device 512 may include, but are not limited to: one or more processors 516, system memory 528, and bus 518 connecting different system components (including system memory 528 and processor 516).

[0142] Bus 518 represents one or more of several bus architectures, including a memory bus or memory controller, a peripheral bus, a graphics acceleration port, a processor 516, or a local bus using any of the various bus architectures. For example, these architectures include, but are not limited to, the Industry Standard Architecture (ISA) bus, the Micro Channel Architecture (MAC) bus, the Enhanced ISA bus, the Video Electronics Standards Association (VESA) local bus, and the Peripheral Component Interconnect (PCI) bus.

[0143] Computer device 512 typically includes a variety of computer system readable media. These media can be any available media that can be accessed by computer device 512, including volatile and non-volatile media, removable and non-removable media.

[0144] System memory 528 may include computer system readable media in the form of volatile memory, such as random access memory (RAM) 530 and / or cache memory 532. Computer device 512 may further include other removable / non-removable, volatile / non-volatile computer system storage media. By way of example only, storage device 534 may be used to read and write non-removable, non-volatile magnetic media (…). Figure 5 Not shown; usually referred to as a "hard drive"). Although Figure 5 Not shown, a disk drive for reading and writing to a removable non-volatile disk (e.g., a "floppy disk") and an optical disk drive for reading and writing to a removable non-volatile optical disk (e.g., a CD-ROM, DVD-ROM, or other optical media) may be provided. In these cases, each drive may be connected to bus 518 via one or more data media interfaces. Memory 528 may include at least one program product having a set (e.g., at least one) of program modules configured to perform the functions of the embodiments of the present invention.

[0145] A program / utility 540 having a set (at least one) of program modules 542 may be stored, for example, in memory 528. Such program modules 542 include, but are not limited to, an operating system, one or more application programs, other program modules, and program data. Each or some combination of these examples may include an implementation of a network environment. Program modules 542 typically perform the functions and / or methods described in the embodiments of the present invention.

[0146] Computer device 512 can also communicate with one or more external devices 514 (e.g., keyboard, pointing device, display 524, etc.), and with one or more devices that enable a user to interact with the computer device 512, and / or with any device that enables the computer device 512 to communicate with one or more other computing devices (e.g., network card, modem, etc.). This communication can be performed via input / output (I / O) interface 522. Furthermore, computer device 512 can also communicate with one or more networks (e.g., local area network (LAN), wide area network (WAN), and / or public networks, such as the Internet) via network adapter 520. As shown, network adapter 520 communicates with other modules of computer device 512 via bus 518. It should be understood that, although not shown in the figures, other hardware and / or software modules can be used in conjunction with computer device 512, including but not limited to: microcode, device drivers, redundant processing units, external disk drive arrays, RAID systems, tape drives, and data backup storage systems.

[0147] The processor 516 executes various functional applications and data processing by running programs stored in the system memory 528, such as implementing the instrument calibration method provided in the embodiments of the present invention, which includes:

[0148] Multiple sets of feature point location information are acquired, wherein each set of feature point location information includes target plate feature point location information and instrument feature point location information. The target plate feature point location information includes the location information of at least three target plate feature points of the target plate, and the instrument feature point location information includes the location information of at least three instrument feature points of the instrument to be calibrated.

[0149] Based on the feature point location information, the target plate feature point location information is transformed to the coordinate system of the instrument to be calibrated to obtain the target plate instrument coordinate system location information.

[0150] Based on the coordinate system position information of the target plate, the intersection point of the target plate and the instrument to be calibrated is determined, and the calibration of the instrument to be calibrated is completed.

[0151] Of course, those skilled in the art will understand that the processor can also implement the technical solutions of the instrument calibration method provided in any embodiment of the present invention.

[0152] Example 6

[0153] Embodiment 6 of the present invention also provides a computer-readable storage medium having a computer program stored thereon. When executed by a processor, the program implements the instrument calibration method provided in the embodiments of the present invention. The method includes:

[0154] Multiple sets of feature point location information are acquired, wherein each set of feature point location information includes target plate feature point location information and instrument feature point location information. The target plate feature point location information includes the location information of at least three target plate feature points of the target plate, and the instrument feature point location information includes the location information of at least three instrument feature points of the instrument to be calibrated.

[0155] Based on the feature point location information, the target plate feature point location information is transformed to the coordinate system of the instrument to be calibrated to obtain the target plate instrument coordinate system location information.

[0156] Based on the coordinate system position information of the target plate, the intersection point of the target plate and the instrument to be calibrated is determined, and the calibration of the instrument to be calibrated is completed.

[0157] Of course, the computer program stored on the computer-readable storage medium provided in the embodiments of the present invention is not limited to the above-described method operation, but can also perform related operations of the instrument calibration method provided in any embodiment of the present invention.

[0158] The computer storage medium of this invention can be any combination of one or more computer-readable media. A computer-readable medium can be a computer-readable signal medium or a computer-readable storage medium. A computer-readable storage medium can be, for example,—but not limited to—an electrical, magnetic, optical, electromagnetic, infrared, or semiconductor system, apparatus, or device, or any combination thereof. More specific examples (a non-exhaustive list) of computer-readable storage media include: an electrical connection having one or more wires, a portable computer disk, a hard disk, random access memory (RAM), read-only memory (ROM), erasable programmable read-only memory (EPROM or flash memory), optical fiber, portable compact disk read-only memory (CD-ROM), optical storage device, magnetic storage device, or any suitable combination thereof. In this document, a computer-readable storage medium can be any tangible medium that contains or stores a program that can be used by or in conjunction with an instruction execution system, apparatus, or device.

[0159] Computer-readable signal media may include data signals propagated in baseband or as part of a carrier wave, carrying computer-readable program code. Such propagated data signals may take various forms, including but not limited to electromagnetic signals, optical signals, or any suitable combination thereof. Computer-readable signal media may also be any computer-readable medium other than computer-readable storage media, capable of sending, propagating, or transmitting programs for use by or in connection with an instruction execution system, apparatus, or device.

[0160] Program code contained on a computer-readable medium may be transmitted using any suitable medium, including—but not limited to—wireless, wire, optical fiber, RF, etc., or any suitable combination thereof.

[0161] Computer program code for performing the operations of this invention can be written in one or more programming languages ​​or a combination thereof. Programming languages ​​include object-oriented programming languages—such as Java, Smalltalk, and C++—as well as conventional procedural programming languages—such as the "C" language or similar programming languages. The program code can be executed entirely on the user's computer, partially on the user's computer, as a standalone software package, partially on the user's computer and partially on a remote computer, or entirely on a remote computer or server. In cases involving remote computers, the remote computer can be connected to the user's computer via any type of network—including a local area network (LAN) or a wide area network (WAN)—or can be connected to an external computer (e.g., via the Internet using an Internet service provider).

[0162] Note that the above description is merely a preferred embodiment of the present invention and the technical principles employed. Those skilled in the art will understand that the present invention is not limited to the specific embodiments described herein, and various obvious changes, readjustments, and substitutions can be made without departing from the scope of protection of the present invention. Therefore, although the present invention has been described in detail through the above embodiments, the present invention is not limited to the above embodiments, and may include many other equivalent embodiments without departing from the concept of the present invention, the scope of which is determined by the scope of the appended claims.

Claims

1. An instrument calibration system, characterized in that, It includes a calibration device, a location information acquisition device, and a processor, wherein: The calibration device includes a fixed connection structure and a target plate. When calibrating the instrument to be calibrated, the target plate in the calibration device is connected to the instrument to be calibrated through the fixed connection structure. The location information acquisition device is used to acquire feature point location information, wherein the feature point location information includes target plate feature point calibration location information and instrument feature point location information. The target plate feature point calibration location information includes the location information of at least three target plate feature points of the target plate, and the instrument feature point location information includes the location information of at least three instrument feature points of the instrument to be calibrated. The processor is configured to convert the target plate feature point calibration position information to the coordinate system of the instrument to be calibrated based on the feature point position information, thereby obtaining the target plate instrument coordinate system position information, and determine the connection point position between the calibration device and the instrument to be calibrated based on the target plate instrument coordinate system position information, thereby completing the calibration of the instrument to be calibrated. The target plate instrument coordinate system position information refers to the position information of the target plate feature points in the instrument coordinate system, and the connection point is a set point at the fixed connection point between the fixed connection structure and the instrument to be calibrated. The step of determining the connection point position between the calibration device and the instrument to be calibrated based on the target plate instrument coordinate system position information includes: The intersection point of the calibration device in the coordinate system of the instrument to be calibrated is determined based on the position information of the target plate in the instrument coordinate system and the position information of the intersection point of the calibration device. The intersection point of the calibration device is the intersection point of the fixed connection structure and the target plate in the calibration device. The position of the connection point is determined based on the coordinate system position information of the intersection instrument, the axial unit vector of the calibration device, and the length parameter of the fixed connection structure.

2. The system according to claim 1, characterized in that, The step of converting the target plate feature point calibration position information to the coordinate system of the instrument to be calibrated based on the feature point position information to obtain the target plate instrument coordinate system position information includes: For each target plate feature point in the feature point location information, the position transformation parameters corresponding to the target plate feature point are determined based on the target plate feature point calibration location information and the reference feature point location information. The target plate feature point calibration position information is converted to the coordinate system of the instrument to be calibrated according to the position transformation parameters, so as to obtain the target plate instrument coordinate system position information.

3. The system according to claim 1, characterized in that, The location information acquisition device is also used for: When the calibration device rotates along a fixed axis, it acquires multiple sets of target plate feature point calibration position information; The processor is further configured to convert the target plate feature point calibration position information to the calibration coordinate system to obtain the target plate calibration coordinate position information, and determine the calibration device parameter information of the calibration device based on the target plate calibration coordinate position information, wherein the calibration device parameter information includes intersection position information and axial unit vector.

4. The system according to claim 3, characterized in that, The step of determining the calibration device parameter information based on the target plate calibration coordinate position information includes: For each target plate feature point, a plane fitting is performed based on the target plate calibration coordinate position information of the target plate feature point in each group of target plate calibration coordinate position information to obtain a fitting plane, and the plane normal vector of the fitting plane is used as the axial unit vector. Based on the fitted plane, a circle center is fitted to determine the target circle center position, and the position information of the target circle center position is used as the intersection position information of the fixed connection structure and the target plate.

5. The system according to claim 4, characterized in that, The step of fitting the center of a circle based on the fitted plane to determine the position of the target circle center includes: Based on the plane normal vector, the target plate calibration coordinate position information is projected onto a set plane to obtain the projection point; Based on the projection points, a circle center fitting equation is constructed, and the target circle center position is fitted according to the circle center fitting equation corresponding to the feature points of each target plate.

6. A method for calibrating an instrument, characterized in that, The method, executed by a processor in the instrument calibration system according to any one of claims 1-5, comprises: Acquire feature point location information, wherein the feature point location information includes target plate feature point calibration location information and instrument feature point location information, the target plate feature point calibration location information includes the location information of at least three target plate feature points of the target plate, and the instrument feature point location information includes the location information of at least three instrument feature points of the instrument to be calibrated; Based on the feature point location information, the target plate feature point calibration location information is transformed to the coordinate system of the instrument to be calibrated to obtain the target plate instrument coordinate system location information, wherein the target plate instrument coordinate system location information is the location information of the target plate feature points in the instrument coordinate system; Based on the target plate instrument coordinate system position information, the connection point position between the calibration device and the instrument to be calibrated is determined, and the calibration of the instrument to be calibrated is completed. The connection point is the set point at the fixed connection point between the fixed connection structure and the instrument to be calibrated. The step of determining the connection point position between the calibration device and the instrument to be calibrated based on the target plate instrument coordinate system position information includes: The intersection point of the calibration device in the coordinate system of the instrument to be calibrated is determined based on the intersection point position information of the target plate and the calibration device in the coordinate system of the instrument to be calibrated. The intersection point of the calibration device is the intersection point of the fixed connection structure in the calibration device and the target plate. The target plate in the calibration device is connected to the instrument to be calibrated through the fixed connection structure. The position of the connection point is determined based on the coordinate system position information of the intersection instrument, the axial unit vector of the calibration device, and the length parameter of the fixed connection structure.

7. A device for calibrating an instrument, characterized in that, The processor configured in the instrument calibration system of any one of claims 1-5 includes: The information acquisition module is used to acquire feature point location information, wherein the feature point location information includes target plate feature point calibration location information and instrument feature point location information. The target plate feature point calibration location information includes the location information of at least three target plate feature points of the target plate, and the instrument feature point location information includes the location information of at least three instrument feature points of the instrument to be calibrated. The coordinate transformation module is used to transform the calibration position information of the target plate feature points to the coordinate system of the instrument to be calibrated based on the feature point position information, so as to obtain the target plate instrument coordinate system position information, wherein the target plate instrument coordinate system position information is the position information of the target plate feature points in the instrument coordinate system; The instrument calibration module is used to determine the connection point position between the calibration device and the instrument to be calibrated based on the position information of the target plate instrument coordinate system, and to complete the calibration of the instrument to be calibrated. The connection point is the set point at the fixed connection between the fixed connection structure and the instrument to be calibrated. Specifically, the instrument calibration module is used for: The intersection point of the calibration device in the coordinate system of the instrument to be calibrated is determined based on the intersection point position information of the target plate and the calibration device in the coordinate system of the instrument to be calibrated. The intersection point of the calibration device is the intersection point of the fixed connection structure in the calibration device and the target plate. The target plate in the calibration device is connected to the instrument to be calibrated through the fixed connection structure. The position of the connection point is determined based on the coordinate system position information of the intersection instrument, the axial unit vector of the calibration device, and the length parameter of the fixed connection structure.

8. A computer device, characterized in that, include: One or more processors; Storage device for storing one or more programs; When the one or more programs are executed by the one or more processors, the one or more processors implement the instrument calibration method as described in claim 6.

9. A computer-readable storage medium having a computer program stored thereon, characterized in that, When the program is executed by the processor, it implements the instrument calibration method as described in claim 6.

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