Irradiation module and apparatus for processing a substrate having the same
By designing the support unit, liquid supply unit, and purge gas system of the substrate processing equipment, the problems of inaccurate pattern correction and decreased irradiator durability during photolithography were solved, achieving precise etching and improved equipment durability.
Patent Information
- Application Number
- CN202211447131.5
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- Priority Date
- 2021-11-18
- Filing Date
- 2022-11-18
- Publication Date
- 2026-07-03
- Estimated Expiration
- 2042-11-18
AI Technical Summary
In the existing technology, the pattern correction on the mask during the photolithography process is inaccurate, the anchor pattern etching is inaccurate, and the irradiator is susceptible to the influence of particles and droplets, resulting in a decrease in durability.
A substrate processing device has been designed, comprising a support unit, a liquid supply unit, a laser unit, and a cover component, combined with a purge gas supply, for precise etching and reduction of the effects of particles and droplets, thereby improving the durability of the device.
It achieves precise etching of substrates and high equipment durability, reduces the impact of particles and droplets on the etching process, and improves the accuracy of pattern correction.