Image testing system and image testing method
CN116506589BActive Publication Date: 2026-06-30KING YUAN ELECTRONICS
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- KING YUAN ELECTRONICS
- Filing Date
- 2022-01-19
- Publication Date
- 2026-06-30
AI Technical Summary
Technical Problem
Existing image testing mechanisms are inefficient when dealing with multiple objects under test, and the correction signals are prone to distortion during long-distance transmission, resulting in a large amount of testing time and low correction efficiency.
Method used
Using an image acquisition card and an image data analysis unit, the calibration command is directly transmitted to the test object through a serial communication interface, avoiding the need to adjust the test vector through a workstation, and enabling simultaneous calibration of multiple test objects.
Benefits of technology
It improves the calibration efficiency of the test object, reduces the loss of calibration commands during transmission, and saves test time.
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Smart Images
Figure CN116506589B_ABST
Abstract
This invention provides an image testing system, including at least one image acquisition card and at least one image data analysis unit. The at least one image acquisition card includes a processing unit and a serial communication interface electrically connected to the processing unit. The processing unit decodes a test signal output by at least one device under test (DUT) to obtain image data. The at least one image data analysis unit generates a correction command based on the image data. The serial communication interface receives the correction command and transmits it to the at least one DUT.
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