A sensor performance test method, device, equipment and storage medium

Abstract

The application provides a sensor performance test method, device, equipment and storage medium, and the specific implementation scheme is as follows: event data stream collected by an image sensor for a region of interest on a test chart in a preset collection period is acquired, wherein the image sensor is configured with EVS pixels, the region of interest has a light-transmitting region and a non-light-transmitting region, a test light source in a light-emitting state and the image sensor are located on opposite sides of the test chart in the collection period, and the test chart is within a field of view angle of the image sensor; the total number of event pixels corresponding to a target event frame is determined based on the event data stream; and a performance evaluation index of the image sensor is calculated according to the total number of event pixels and the total number of pixels corresponding to the light-transmitting region. Through the implementation of the application scheme, the EVS pixels perform photosensing on the test light source through the light-transmitting region of the test chart, and the photosensing performance is evaluated based on the number of event pixels generating events, so that the performance evaluation of the EVS sensor can be effectively realized.

Description

Technical Field

[0001] The present application relates to the field of testing technology, and in particular to a sensor performance testing method, apparatus, device, and storage medium. Background Art

[0002] EVS (Event-based Vision Sensor) is a new type of image sensor that simulates the human retina and responds to pixel pulses caused by brightness changes due to motion. Therefore, it can capture brightness changes (i.e., changes in light intensity) of a scene at an extremely high frame rate, record events at specific time points and specific locations in the image, and form an event stream rather than a frame stream, thus solving problems such as information redundancy, large data storage volume, and large real-time processing capacity of traditional cameras.

[0003] In practical applications, to ensure sensor imaging quality, sensors are typically tested before shipment. However, there are currently no mature, mass-produced EVS sensors on the market, and accordingly, no mature testing solutions for EVS sensor performance testing.

[0004] It is important to note that the techniques described in this section are not necessarily those that have been previously conceived or employed. Unless otherwise indicated, it should not be assumed that any technique described in this section is prior art simply because it is included in this section. Similarly, unless otherwise indicated, the issues mentioned in this section should not be considered to have been recognized as prior art. Summary of the Invention

[0005] The main purpose of this application is to provide a sensor performance testing method, device, equipment and storage medium.

[0006] In a first aspect, the present application provides a sensor performance testing method, comprising: obtaining an event data stream collected by the image sensor for an area of ​​interest on a test chart within a preset acquisition period; wherein the image sensor is configured with EVS pixels, the area of ​​interest has a light-transmitting area and a non-light-transmitting area, a test light source in a light-emitting state during the acquisition period and the image sensor are located on opposite sides of the test chart, and the test chart is within the field of view of the image sensor; determining the total number of event pixels corresponding to a target event frame based on the event data stream; and calculating a performance evaluation index of the image sensor based on the total number of event pixels and the total number of pixels corresponding to the light-transmitting area.

[0007] A second aspect of the present application provides a sensor performance testing device, comprising: an acquisition module, configured to acquire an event data stream acquired by the image sensor for an area of ​​interest on a test chart within a preset acquisition period; wherein the image sensor is configured with EVS pixels, the area of ​​interest has a light-transmitting area and a non-light-transmitting area, a test light source in a light-emitting state during the acquisition period and the image sensor are located on opposite sides of the test chart, and the test chart is within the field of view of the image sensor; a determination module, configured to determine the total number of event pixels corresponding to a target event frame based on the event data stream; and a calculation module, configured to calculate a performance evaluation index of the image sensor based on the total number of event pixels and the total number of pixels corresponding to the light-transmitting area.

[0008] The third aspect of the present application provides an electronic device, comprising: a memory and a processor, wherein the processor is used to execute a computer program stored in the memory. When the processor executes the computer program, it implements the steps of the sensor performance testing method provided in the first aspect of the embodiment of the present application.

[0009] The fourth aspect of the present application provides a computer-readable storage medium having a computer program stored thereon. When the computer program is executed by a processor, the steps of the sensor performance testing method provided in the first aspect of the embodiment of the present application are implemented.

[0010] As can be seen from the above, according to the sensor performance testing method, device, equipment and storage medium provided by the present application, the event data stream collected by the image sensor for the area of ​​interest on the test chart during a preset acquisition cycle is obtained, wherein the image sensor is configured with EVS pixels, the area of ​​interest has a light-transmitting area and a non-light-transmitting area, the test light source in the light-emitting state during the acquisition cycle and the image sensor are on opposite sides of the test chart, and the test chart is within the field of view of the image sensor; based on the event data stream, the total number of event pixels corresponding to the target event frame is determined; based on the total number of event pixels and the total number of pixels corresponding to the light-transmitting area, the performance evaluation index of the image sensor is calculated. Through the implementation of the present application, the EVS pixels are sensitive to the test light source through the light-transmitting area of ​​the test chart, and the photosensitivity is evaluated based on the number of event pixels that generate events, which can effectively realize the performance evaluation of the EVS sensor.

[0011] It should be understood that the content described in this section is not intended to identify the key or important features of this application, nor is it intended to limit the scope of this application. Other features of this application will become easily understood through the following description. BRIEF DESCRIPTION OF THE DRAWINGS

[0012] The accompanying drawings, which are included to provide a further understanding of the application and are incorporated in and constitute a part of this specification, illustrate embodiments of the application and together with the description serve to explain the exemplary embodiments thereof. The drawings provided herein illustrate the exemplary embodiments and are not limiting of the scope of the application. In the drawings, like reference numerals refer to like parts throughout the various drawings. Unless specifically noted, the drawings provided herein are not to scale and are shown as is for purposes of illustration only. Where appropriate, the same reference numbers have been used in different drawings to represent similar components.

[0013] Figure 1 A basic flowchart of a sensor performance test method provided by an embodiment of the application;

[0014] Figure 2 A schematic diagram of a sensor performance test system provided by an embodiment of the application;

[0015] Figure 3 A schematic diagram of a test chart provided by an embodiment of the application;

[0016] Figure 4 A schematic diagram of a region of interest mask provided by an embodiment of the application;

[0017] Figure 5 A schematic diagram of an EVS image acquisition principle provided by an embodiment of the application;

[0018] Figure 6 A detailed flowchart of a sensor performance test method provided by an embodiment of the application;

[0019] Figure 7 A functional module schematic diagram of a sensor performance test device provided by an embodiment of the application;

[0020] Figure 8 A structural schematic diagram of an electronic device provided by an embodiment of the application. DETAILED DESCRIPTION

[0021] In order to make the objectives, features, and advantages of the application more apparent and easy to understand, the technical solutions in the embodiments of the application will be described clearly and completely below with reference to the drawings in the embodiments of the application. Obviously, the described embodiments are only some of the embodiments of the application, but not all the embodiments of the application. Based on the embodiments in the application, all other embodiments obtained by those skilled in the art without creative work fall within the scope of protection of the application.

[0022] In the description of the embodiments of the application, the terms "first", "second", and the like are used only for the purpose of description, and cannot be understood as indicating or implying relative importance or implicitly indicating the number of the technical features indicated. Therefore, the features defined as "first", "second" can explicitly or implicitly include one or more of the features. In the description of the embodiments of the application, the meaning of "multiple" is two or more, unless otherwise specifically limited.

[0023] Currently, there is no mature EVS sensor in the market, and there is also no mature test scheme for testing the performance of the EVS sensor. Based on this, an embodiment of the present application provides a sensor performance test method, such as Figure 1 A basic flowchart of the sensor performance test method provided by the embodiment is shown in the figure, and the sensor performance test method includes the following steps:

[0024] Step 101, acquiring event data stream collected by the image sensor in a preset acquisition period for a region of interest on a test chart.

[0025] It is worth mentioning that the image sensor of the embodiment is configured with EVS pixels, and the EVS pixels generate event data in response to brightness changes. When the brightness change exceeds a certain threshold, an event data including pixel coordinates (x, y), a timestamp (t) and an event polarity (p, taking values +1 and -1, representing the increase and decrease of brightness, respectively) is output. Each event data is represented in the form of e=(t,x,y,p).

[0026] In the embodiment, in order to test the imaging performance of the chart sensor, a sensor performance test system is configured, such as Figure 2 The figure shows a schematic diagram of a sensor performance test system provided by the embodiment, which includes an image sensor 201, a test chart 202 and a test light source 203. The test light source 203 is located on the opposite side of the image sensor 201 with respect to the test chart 202, and the test chart 202 is located within the field of view angle of the image sensor 201. More specifically, the test chart 202 is arranged on the light-emitting side of the test light source 203 and within the beam angle of the test light source 203, and the image sensor 201 is arranged on the light-transmitting side of the test chart 202. In a preferred implementation, the center point of the image sensor 201 and the center point of the test chart 202 are located on the same horizontal line.

[0027] It should be noted that the test light source of the embodiment can be a light-emitting diode (LED), an edge-emitting laser (EEL), a vertical-cavity surface-emitting laser (VCSEL) or the like. In actual application, the size of the test light source is equal to or slightly smaller than the size of the test chart, and supports rectangular light output.

[0028] The figure shows a schematic diagram of a test chart provided by the embodiment. The pattern region of the test chart is the region of interest, which has a light-transmitting region and a non-light-transmitting region, i.e. Figure 3 The white elements in the region of interest in the figure are the light-transmitting region, and the non-light-transmitting region is Figure 3 Figure 3 ​Regarding the black elements in the region of interest, it should be understood that the transmittance of the translucent areas of this embodiment can be close to 100%, while the transmittance of the non-translucent areas is close to 0%. In practical applications, the test chart can be made of a translucent material such as glass or acrylic, with all areas other than the translucent areas covered with an opaque layer, which can be achieved using inkjet printing. In a typical implementation, the test chart can be a transmissive chart image.

[0029] During the sensor performance test, the moment the test light source is turned on is the start of the acquisition cycle, and the duration of the test light source's continuous light output after being turned on is the duration of the acquisition cycle. During the acquisition cycle, the sensor generates an event data stream in response to changes in light intensity in the light-transmitting area of ​​the region of interest. It should be understood that the event data stream includes at least one frame of event data.

[0030] In an optional implementation of this embodiment, the image sensor is further configured with APS pixels. Accordingly, before the step of acquiring the event data stream captured by the image sensor for the region of interest on the test chart within a preset acquisition period, the method further includes: controlling the APS pixels of the image sensor to capture the test chart under the illumination of a test light source to obtain an APS image; extracting an APS image region corresponding to the region of interest from the APS image; binarizing the APS image region to generate a corresponding region of interest mask; and acquiring the total number of pixels corresponding to the light-transmitting region based on the region of interest mask.

[0031] Specifically, the image sensor of this embodiment can be a fusion image sensor. In one implementation, the image sensor is integrated with an APS pixel array (Active Pixel Sensor) and an EVS pixel array, and the two are distributed in different array areas of the image sensor; in another implementation, the image sensor is configured with a switchable pixel array, and the working mode of the switchable pixel array can be switched between EVS data mode and APS data mode. In response to a mode switching instruction, the pixels in the switchable pixel array can be switched to EVS pixels or APS pixels.

[0032] like Figure 4 The figure shows a schematic diagram of a region of interest mask provided by this embodiment. This embodiment is based on the APS pixel pair Figure 3 After shooting the test chart to obtain the corresponding APS image, the region of interest is binarized to obtain Figure 4 The ROI mask is shown. Next, the total number of pixels corresponding to the light-transmitting area of ​​the test chart can be determined based on the mask.

[0033] In addition, it should be noted that this embodiment can also adjust the position of the image sensor based on the APS and adjust the focus to make the image clear.

[0034] Step 102: Determine the total number of event pixels corresponding to the target event frame based on the event data stream.

[0035] Specifically, in this embodiment, if the event data stream includes multiple event frames, a specific event frame or frames can be selected as the target event frame. If only one event frame is included, that event frame is directly selected as the target event frame. For the target event frame, the total number of event polarities of +1 and -1, i.e., the total number of event pixels, is counted.

[0036] In an optional implementation of this embodiment, before the above-mentioned step of determining the total number of event pixels corresponding to the target event frame based on the event data stream, the step further includes: determining, from the event data stream, a transition event frame whose timestamp matches the start time based on the start time of the acquisition period; determining, from the event data stream based on the transition event frame, a second event frame and a stable event frame; wherein the stable event frame is an event frame acquired by the image sensor when the lighting environment of the test light source is in a stable state; and determining any one of the transition event frame, the second event frame and the stable event frame as the target event frame.

[0037] like Figure 5 The figure shows a schematic diagram of the principle of EVS acquisition provided by this embodiment. In the initial environment, the ambient light intensity is 100 Lux. At the start of the acquisition cycle, the test light source is triggered to turn on. The light intensity in the lighting environment changes to 200 Lux. When the light intensity jumps from 100 Lux to 200 Lux, the EVS pixel senses the light intensity change. At this time, the event frame acquired is the jump event frame (that is, Figure 5 The test light source is continuously turned on during the acquisition cycle, and the EVS pixel continuously acquires event data. The event frame after the jump event frame is the second event frame in the event data stream (i.e. Figure 5 After the test light source is turned on and a specific period of time has passed, when the lighting environment enters a stable state, the EVS pixel collects a stable event frame, such as the fourth frame in the event data stream.

[0038] Step 103: Calculate a performance evaluation index of the image sensor according to the total number of event pixels and the total number of pixels corresponding to the light-transmitting area.

[0039] Specifically, the performance evaluation indicators in this embodiment may include a resolution evaluation indicator, a sensitivity evaluation indicator, a smear evaluation indicator, a signal-to-noise ratio evaluation indicator, etc. In practical applications, image sensors may be evaluated for performance in one or more aspects. The evaluation of various aspects of performance may be based solely on a single target event frame or on a combination of multiple target event frames, and this embodiment does not impose any limitation thereto.

[0040] In an optional implementation of this embodiment, the above-mentioned step of calculating the performance evaluation index of the image sensor based on the total number of event pixels and the total number of pixels corresponding to the light-transmitting area includes: calculating the ratio of the total number of event pixels to the total number of pixels corresponding to the light-transmitting area, and calculating the performance evaluation index of the image sensor; wherein, when the target event frame is a jump event frame, the performance evaluation index is a sensitivity evaluation index; when the target event frame is the second event frame, the performance evaluation index is a smear evaluation index; when the target event frame is a stable event frame, the performance evaluation index is a signal-to-noise ratio evaluation index.

[0041] In actual applications, when the ambient light intensity jumps, the EVS pixels generate events accordingly. Then, this embodiment can obtain the ratio of the number of events generated in the jump event frame to the total number of pixels in the APS image corresponding to the light-transmitting area of ​​the test chart, so as to measure the sensitivity of the image sensor. The larger the ratio, the higher the sensitivity of the image sensor. In addition, under normal circumstances, EVS pixels only generate events in the jump frame, but in actual applications, some events are usually generated with a delay, that is, there will be a smear, resulting in events being generated in the next frame after the jump frame. Then, this embodiment can determine the smear evaluation index based on the above ratio of the second event frame. The larger the ratio, the more severe the smear effect. Of course, in actual applications, even if the light intensity is stable, the EVS pixels may continue to generate events due to environmental noise. Based on this, this embodiment can also determine the signal-to-noise ratio evaluation index based on the above ratio of the stable frame. The larger the ratio, the smaller the signal-to-noise ratio.

[0042] In another optional implementation of this embodiment, the step of acquiring the event data stream collected by the image sensor for the area of ​​interest on the test chart within a preset acquisition period includes: sequentially acquiring the event data streams collected by the image sensor for the areas of interest on different test charts within the preset acquisition period; wherein the light-transmitting area includes a plurality of light-transmitting area units, and the areas of the light-transmitting area units of different test charts decrease successively.

[0043] Accordingly, the above-mentioned step of calculating the performance evaluation index of the image sensor based on the total number of event pixels and the total number of pixels corresponding to the light-transmitting area includes: calculating the ratio of the total number of different event pixels to the total number of pixels corresponding to the light-transmitting area respectively; determining the minimum ratio from all ratios greater than a preset ratio threshold; and calculating the resolution evaluation index of the image sensor based on the area of ​​the light-transmitting area corresponding to the minimum ratio.

[0044] Specifically, this embodiment can be configured with multiple test charts of different forms. The translucent area of ​​each test chart is composed of multiple translucent area units of the same size, while the sizes of the translucent area units of different test charts vary. This embodiment performs event data collection, total number of event pixels statistics, and calculation of the ratio of the total number of event pixels to the total number of translucent area pixels on different test charts respectively. Then, referring to a preset ratio threshold, the test chart with the smallest transparent area unit among the test charts that can be effectively imaged is determined. Then, based on the translucent area of ​​the test chart, the resolution of the image sensor is evaluated. The resolution is used to characterize the minimum translucent area that can be resolved by the image sensor.

[0045] In an optional implementation of this embodiment, the sensor performance testing method also includes: controlling the test light source to enter the corresponding light emitting state in different acquisition cycles according to different light source control parameters; and calculating the performance evaluation index of the image sensor according to the total number of event pixels and the total number of pixels corresponding to the light-transmitting area, including: calculating the corresponding performance evaluation index of the image sensor according to the total number of event pixels corresponding to different light emitting states and the total number of pixels corresponding to the light-transmitting area.

[0046] Specifically, in this embodiment, the test light source can be controlled to trigger different lighting environments according to different light source control parameters, and the EVS pixels can be controlled to collect events in different lighting environments respectively. Then, different performance evaluation indicators are obtained by adaptively calculating the event generation behaviors in different lighting environments. This can realize the performance evaluation of the image sensor under different light intensities.

[0047] It should be noted that, unlike the above-mentioned method of triggering different lighting environments by controlling the light emission states of the test light source through different light source control parameters, in other implementation methods of this embodiment, the test chart can also be controlled to rotate, and then the same light source control parameters are maintained to control the test light source to emit light in different acquisition cycles. Accordingly, different lighting environments can also be triggered in different acquisition cycles.

[0048] In another alternative implementation of the embodiment, the sensor performance test method further comprises: controlling the test light source to enter the corresponding light emission state in different acquisition periods in time according to the same light source control parameter; and calculating the performance evaluation index of the image sensor according to the total number of event pixels and the total number of pixels corresponding to the light transmission region, comprises: calculating a plurality of first performance evaluation indexes according to the total number of event pixels and the total number of pixels corresponding to the light transmission region in different acquisition periods, respectively; and calculating a second performance evaluation index of the image sensor based on the plurality of first performance evaluation indexes corresponding to different acquisition periods.

[0049] Specifically, in actual application, there may be accidental errors in the event generation behavior in a single acquisition period. The embodiment can control the test light source to emit light in time and control the EVS pixels to collect events in different acquisition periods. A performance evaluation index can be calculated for each acquisition period. Finally, the final performance evaluation index is calculated by combining a plurality of performance evaluation indexes, so as to improve the accuracy of performance evaluation. It should be understood that the second performance evaluation index can be calculated based on the plurality of first performance evaluation indexes, for example, by using a weighted average method.

[0050] Figure 6 The method in the embodiment provides a refined sensor performance test method, and specifically comprises the following processes:

[0051] Step 601: controlling the APS pixels of the image sensor to capture a test chart in a light environment of a test light source to obtain an APS image;

[0052] Step 602: extracting an APS image region corresponding to a region of interest from the APS image, and performing a binaryzation process on the APS image region to generate a corresponding region-of-interest mask;

[0053] Step 603: obtaining the total number of pixels corresponding to a light transmission region based on the region-of-interest mask;

[0054] Step 604: obtaining an event data stream collected by the image sensor for the region of interest on the test chart in a preset acquisition period;

[0055] Step 605: determining the total number of event pixels of a jump event frame, a second event frame and a stable event frame based on the event data stream, respectively;

[0056] Step 606: determining a sensitivity evaluation index of the image sensor based on the ratio of the total number of event pixels of the jump event frame to the total number of pixels corresponding to the light transmission region;

[0057] Step 607: Determine a smear evaluation index of the image sensor based on a ratio of the total number of event pixels in the second event frame to the total number of pixels corresponding to the light-transmitting area;

[0058] Step 608 : Determine a signal-to-noise ratio evaluation index of the image sensor based on a ratio of the total number of event pixels in the stable event frame to the total number of pixels corresponding to the light-transmitting area.

[0059] It should be understood that the size of the serial numbers of the steps in this embodiment does not mean the order in which the steps are executed. The order in which the steps are executed should be determined by their functions and internal logic, and should not constitute a sole limitation on the implementation process of the embodiments of this application.

[0060] Figure 7 A sensor performance testing device provided in one embodiment of the present application can be used to implement the sensor performance testing method in the aforementioned embodiment, and mainly includes:

[0061] Acquisition module 701 is configured to acquire an event data stream captured by the image sensor within a preset acquisition period for an area of ​​interest on a test chart; wherein the image sensor is configured with EVS pixels, the area of ​​interest has a light-transmitting area and a non-light-transmitting area, and a test light source in a light-emitting state during the acquisition period is located on opposite sides of the test chart and the image sensor, and the test chart is within the field of view of the image sensor;

[0062] A determination module 702 is configured to determine the total number of event pixels corresponding to the target event frame based on the event data stream;

[0063] The calculation module 703 is configured to calculate a performance evaluation index of the image sensor according to the total number of event pixels and the total number of pixels corresponding to the light-transmitting area.

[0064] In an optional implementation of this embodiment, the sensor performance testing device also includes: a control module and a generation module, wherein the control module is used to control the APS pixels of the image sensor to shoot the test chart under the lighting environment of the test light source to obtain an APS image; the generation module is used to extract the APS image area corresponding to the region of interest from the APS image; binarize the APS image area to generate a corresponding region of interest mask; accordingly, the above-mentioned acquisition module is also used to obtain the total number of pixels corresponding to the light-transmitting area based on the region of interest mask.

[0065] In an optional implementation of this embodiment, the above-mentioned determination module is further used to: determine, based on the starting moment of the acquisition period, a transition event frame whose timestamp matches the starting moment from the event data stream; determine, based on the transition event frame, a second event frame and a stable event frame from the event data stream; wherein, the stable event frame is an event frame acquired by the image sensor when the lighting environment of the test light source is in a stable state; and determine any one of the transition event frame, the second event frame and the stable event frame as the target event frame.

[0066] In an optional implementation of this embodiment, the above-mentioned calculation module is also used to: calculate the ratio of the total number of event pixels to the total number of pixels corresponding to the light-transmitting area, and calculate the performance evaluation index of the image sensor; wherein, when the target event frame is a jump event frame, the performance evaluation index is a sensitivity evaluation index; when the target event frame is the second event frame, the performance evaluation index is a smear evaluation index; when the target event frame is a stable event frame, the performance evaluation index is a signal-to-noise ratio evaluation index.

[0067] In an optional implementation of this embodiment, the above-mentioned control module is also used to: control the test light source to enter the corresponding light-emitting state in different acquisition cycles according to different light source control parameters; accordingly, the above-mentioned calculation module is specifically used to: calculate the performance evaluation index of the corresponding image sensor based on the total number of event pixels corresponding to different light-emitting states and the total number of pixels corresponding to the light-transmitting area.

[0068] In an optional implementation of this embodiment, the above-mentioned control module is also used to: control the test light source to enter the corresponding light-emitting state in different acquisition cycles according to the same light source control parameters; accordingly, the above-mentioned calculation module is specifically used to: calculate multiple first performance evaluation indicators according to the total number of event pixels in different acquisition cycles and the total number of pixels corresponding to the light-transmitting area; calculate the second performance evaluation indicator of the image sensor based on the multiple first performance evaluation indicators corresponding to different acquisition cycles.

[0069] In an optional implementation of this embodiment, the acquisition module is specifically configured to sequentially acquire event data streams captured by the image sensor for regions of interest on different test charts within a preset acquisition cycle; wherein the light-transmitting region includes multiple light-transmitting region units, and the areas of the light-transmitting region units of different test charts decrease sequentially. Accordingly, the calculation module is specifically configured to respectively calculate the ratio of the total number of pixels in different events to the total number of pixels corresponding to the light-transmitting region; determine the minimum ratio among all ratios greater than a preset ratio threshold; and calculate the image sensor's resolution evaluation index based on the area of ​​the light-transmitting region corresponding to the minimum ratio.

[0070] It should be noted that the sensor performance testing methods in the aforementioned embodiments can all be implemented based on the sensor performance testing device provided in this embodiment. Ordinary technicians in the relevant field can clearly understand that for the convenience and conciseness of description, the specific working process of the sensor performance testing device described in this embodiment can be implemented by referring to the corresponding working process in the aforementioned method embodiment, and will not be repeated here.

[0071] Based on the technical solution of the embodiment of the present application described above, an event data stream collected by the image sensor for the area of ​​interest on the test chart during a preset acquisition cycle is obtained, wherein the image sensor is configured with EVS pixels, the area of ​​interest has a light-transmitting area and a non-light-transmitting area, the test light source in the light-emitting state during the acquisition cycle and the image sensor are on opposite sides of the test chart, and the test chart is within the field of view of the image sensor; based on the event data stream, the total number of event pixels corresponding to the target event frame is determined; based on the total number of event pixels and the total number of pixels corresponding to the light-transmitting area, the performance evaluation index of the image sensor is calculated. Through the implementation of the solution of the present application, the EVS pixels are sensitive to the test light source through the light-transmitting area of ​​the test chart, and the photosensitivity performance is evaluated based on the number of event pixels that generate events, which can effectively realize the performance evaluation of the EVS sensor.

[0072] Figure 8 An electronic device provided in one embodiment of the present application can be used to implement the sensor performance testing method described in the aforementioned embodiment. The electronic device primarily includes: a memory 801 and a processor 802. The memory 801 stores a computer program 803 executable on the processor 802. The memory 801 and the processor 802 are in communication with each other. When the processor 802 executes the computer program 803, the sensor performance testing method described in the aforementioned embodiment is implemented. The number of processors 802 can be one or more.

[0073] The memory 801 can be a high-speed random access memory (RAM) memory or a non-volatile memory such as a disk memory. The memory 801 is used to store executable program codes. The processor 802 is coupled to the memory 801 .

[0074] Furthermore, the embodiment of the present application also provides a computer-readable storage medium, which can be provided in the electronic device in the above embodiments. The computer-readable storage medium can be the above Figure 8 Memory in the illustrated embodiment.

[0075] The computer-readable storage medium stores a computer program that, when executed by a processor, implements the sensor performance testing method described in the aforementioned embodiment. Furthermore, the computer-readable storage medium may be a USB flash drive, a mobile hard drive, a read-only memory (ROM), RAM, a magnetic disk, or an optical disk, among other media capable of storing program code.

[0076] It should be understood that the devices and methods disclosed in the embodiments provided in this application can also be implemented in any other equivalent manner. For example, the device embodiments described above are merely illustrative. For example, the division of modules is merely a logical function division. In actual implementation, there may be other division methods, such as multiple modules or components can be combined or integrated into another system, or some features can be ignored or not executed. Another point is that the mutual coupling or direct coupling or communication connection shown or discussed can be through some interfaces, indirect coupling or communication connection of devices or modules, which can be electrical, mechanical or other forms.

[0077] Modules described as separate components may or may not be physically separate, and components shown as modules may or may not be physical modules, that is, they may be located in one place or distributed across multiple network modules. Some or all of these modules may be selected to achieve the purpose of this embodiment based on actual needs.

[0078] In addition, the functional modules in the various embodiments of the present application may be integrated into a processing module, or each module may exist physically separately, or two or more modules may be integrated into a single module. The above-mentioned integrated modules may be implemented in the form of hardware or software functional modules.

[0079] If the integrated module is implemented in the form of a software functional module and sold or used as an independent product, it can be stored in a computer-readable storage medium. Based on this understanding, the technical solution of the present application, or the part that contributes to the prior art, or all or part of the technical solution can be embodied in the form of a software product, which is stored in a readable storage medium and includes several instructions for enabling a computer device (which can be a personal computer, server, or network device, etc.) to execute all or part of the steps of the various embodiments of the present application. The aforementioned readable storage medium includes various media that can store program codes, such as a USB flash drive, a mobile hard disk, a ROM, a RAM, a magnetic disk, or an optical disk.

[0080] It should be noted that for the aforementioned method embodiments, for ease of description, they are all expressed as a series of action combinations, but those skilled in the art should be aware that this application is not limited by the order of the actions described, because according to this application, certain steps can be performed in other orders or simultaneously. Secondly, those skilled in the art should also be aware that the embodiments described in this specification are all preferred embodiments, and the actions and modules involved are not necessarily required by this application.

[0081] In the above embodiments, the description of each embodiment has its own focus. For parts that are not described in detail in a certain embodiment, reference can be made to the relevant descriptions of other embodiments.

[0082] The above is a description of the sensor performance testing method, device, equipment and storage medium provided in this application. For those skilled in the art, based on the ideas of the embodiments of this application, there may be changes in the specific implementation methods and application scopes. In summary, the content of this specification should not be understood as limiting this application.

Claims

1. A sensor performance testing method, characterized in that: include: Acquiring an event data stream captured by an image sensor within a preset acquisition period for an area of ​​interest on a test chart; wherein the image sensor is configured with EVS pixels, the area of ​​interest has a light-transmitting area and a non-light-transmitting area, a test light source in a light-emitting state during the acquisition period and the image sensor are located on opposite sides of the test chart, and the test chart is within the field of view of the image sensor; Based on the start time of the acquisition period, determining, from the event data stream, a transition event frame whose timestamp matches the start time; Determining a second event frame and a stable event frame from the event data stream based on the jump event frame; wherein the stable event frame is an event frame captured by the image sensor when the lighting environment of the test light source is in a stable state; determining any one of the transition event frame, the second event frame, and the stable event frame as a target event frame; Determining a total number of event pixels corresponding to a target event frame based on the event data stream; Calculating a performance evaluation index of the image sensor according to the total number of event pixels and the total number of pixels corresponding to the light-transmitting area; The step of calculating the performance evaluation index of the image sensor according to the total number of event pixels and the total number of pixels corresponding to the light-transmitting area includes: Calculating a ratio of the total number of event pixels to the total number of pixels corresponding to the light-transmitting area, and calculating a performance evaluation index of the image sensor; Among them, when the target event frame is the jump event frame, the performance evaluation index is the sensitivity evaluation index; when the target event frame is the second event frame, the performance evaluation index is the drag evaluation index; when the target event frame is the stable event frame, the performance evaluation index is the signal-to-noise ratio evaluation index.

2. The sensor performance testing method according to claim 1, characterized in that: The image sensor is further configured with APS pixels; before the step of acquiring the event data stream collected by the image sensor for the area of ​​interest on the test chart within a preset collection period, the method further includes: controlling the APS pixels of the image sensor to capture the test chart under the illumination environment of the test light source to obtain an APS image; extracting an APS image region corresponding to the region of interest from the APS image; Binarizing the APS image area to generate a corresponding region of interest mask; The total number of pixels corresponding to the light-transmitting area is obtained based on the region of interest mask.

3. The sensor performance testing method according to claim 1, characterized in that: Also includes: According to different light source control parameters, the test light source is controlled to enter the corresponding light emitting state in different acquisition cycles; The step of calculating the performance evaluation index of the image sensor according to the total number of event pixels and the total number of pixels corresponding to the light-transmitting area includes: The performance evaluation index of the corresponding image sensor is calculated according to the total number of event pixels corresponding to the different light-emitting states and the total number of pixels corresponding to the light-transmitting area.

4. The sensor performance testing method according to claim 1, characterized in that: Also includes: According to the same light source control parameters, the test light source is controlled to enter the corresponding light emitting state in different acquisition cycles; The step of calculating the performance evaluation index of the image sensor according to the total number of event pixels and the total number of pixels corresponding to the light-transmitting area includes: Calculating a plurality of first performance evaluation indicators according to the total number of event pixels in different acquisition cycles and the total number of pixels corresponding to the light-transmitting area; A second performance evaluation index of the image sensor is calculated based on a plurality of first performance evaluation indexes corresponding to different acquisition cycles.

5. The sensor performance testing method according to claim 1, characterized in that: The step of acquiring the event data stream collected by the image sensor for the area of ​​interest on the test chart within a preset collection period includes: Sequentially acquiring event data streams collected by the image sensor for regions of interest on different test charts within a preset collection period; wherein the light-transmitting area includes a plurality of light-transmitting area units, and the areas of the light-transmitting area units of different test charts decrease sequentially; The step of calculating the performance evaluation index of the image sensor according to the total number of event pixels and the total number of pixels corresponding to the light-transmitting area includes: respectively calculating the ratio of the total number of pixels of different events to the total number of pixels corresponding to the light-transmitting area; determining a minimum ratio value from among all ratio values ​​that are greater than a predetermined ratio threshold; A resolution evaluation index of the image sensor is calculated based on the area of ​​the light-transmitting region corresponding to the minimum ratio.

6. A sensor performance testing device, characterized in that: include: an acquisition module configured to acquire an event data stream captured by an image sensor within a preset acquisition period for an area of ​​interest on a test chart; wherein the image sensor is configured with EVS pixels, the area of ​​interest has a light-transmitting area and a non-light-transmitting area, a test light source in a light-emitting state during the acquisition period and the image sensor are located on opposite sides of the test chart, and the test chart is within a field of view of the image sensor; a determination module configured to determine, from the event data stream, a transition event frame whose timestamp matches the start time of the acquisition cycle; determine, from the event data stream, a second event frame and a stable event frame based on the transition event frame; wherein the stable event frame is an event frame acquired by the image sensor when the lighting environment of the test light source is in a stable state; and determine any one of the transition event frame, the second event frame, and the stable event frame as a target event frame; Determining a total number of event pixels corresponding to a target event frame based on the event data stream; A calculation module is used to calculate the ratio of the total number of event pixels to the total number of pixels corresponding to the light-transmitting area, and calculate a performance evaluation index of the image sensor; wherein, when the target event frame is the jump event frame, the performance evaluation index is a sensitivity evaluation index; when the target event frame is the second event frame, the performance evaluation index is a smear evaluation index; when the target event frame is the stable event frame, the performance evaluation index is a signal-to-noise ratio evaluation index.

7. An electronic device, characterized in that: Comprising a memory and a processor, wherein: The processor is configured to execute a computer program stored in the memory; When the processor executes the computer program, the steps of the sensor performance testing method according to any one of claims 1 to 5 are implemented.

8. A computer-readable storage medium having a computer program stored thereon, characterized in that: When the computer program is executed by a processor, the steps of the sensor performance testing method according to any one of claims 1 to 5 are implemented.

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