A fault detection method, device and storage medium

Abstract

The application provides a fault detection method and device and a storage medium, relates to the technical field of communication, and is used for solving the problem of low efficiency of manual fault checking in the prior art. The method comprises the following steps: acquiring a plurality of first test information sent from a plurality of source nodes to a destination node; the plurality of source nodes are nodes in a plurality of metropolitan area networks in a first region; the destination node is a node in a second region; determining the number of abnormal test information from the plurality of first test information, and determining a fault region according to the number of abnormal test information; acquiring a plurality of second test information sent from the plurality of source nodes to the destination node corresponding to the abnormal test information; and determining the node position of a fault node according to the plurality of second test information and the fault region. The application improves the efficiency of fault detection.

Description

Technical Field

[0001] This application relates to the field of communication technology, and in particular to a fault detection method, device and storage medium. Background Technology

[0002] With the development of communication technology, the ability to quickly detect network faults in communication networks can ensure the stable operation of communication services.

[0003] Existing fault handling methods typically send fault alerts to the operations and maintenance (O&M) side equipment when communication service quality deteriorates or services are interrupted, prompting O&M personnel to manually troubleshoot the fault. When the fault detection area is large, manual troubleshooting is time-consuming, labor-intensive, and inefficient. Summary of the Invention

[0004] This application provides a fault detection method, apparatus, and storage medium to solve the problems of time-consuming, labor-intensive, and inefficient manual fault diagnosis methods.

[0005] To achieve the above objectives, this application adopts the following technical solution:

[0006] In a first aspect, a fault detection method is provided, comprising: acquiring multiple first test messages sent from multiple source nodes to a destination node; the multiple source nodes being nodes in multiple metropolitan area networks within a first region; the destination node being a node in a second region; determining the number of abnormal test messages from the multiple first test messages, and determining a fault region based on the number of abnormal test messages; acquiring multiple second test messages sent from the multiple source nodes to the destination node corresponding to the abnormal test messages; and determining the node location of the fault node based on the multiple second test messages and the fault region.

[0007] Optionally, the fault area can be determined based on the number of abnormal test information, including: when the number of abnormal test information is greater than a preset number, the fault area is determined to be the backbone network area or the second area; when the number of abnormal test information is equal to the preset number, the fault area is determined to be the metropolitan area network area to which the source node corresponding to the abnormal test information belongs.

[0008] Optionally, the location of the faulty node is determined based on multiple second test information and the faulty area, including: for each second test information in the multiple second test information, obtaining the multi-hop test information corresponding to the second test information; the multi-hop test information is the test information between each hop node from the source node to the destination node corresponding to the second test information; from the multi-hop test information, determining the first-hop abnormal test information other than the test information corresponding to the preset node; determining the faulty node based on the first-hop abnormal test information, and obtaining the node Internet Protocol IP address of the faulty node; and determining the location of the faulty node based on the node IP address and the faulty area.

[0009] Optionally, when there are multiple first-hop anomaly test messages, the fault node is determined based on the first-hop anomaly test messages, including: determining the number of identical nodes among the multiple nodes corresponding to multiple first-hop anomaly test messages; when the number of identical nodes is greater than a preset number, the identical nodes are determined as fault nodes.

[0010] Optionally, the location of the faulty node is determined based on the node's IP address and the faulty area, including: when the faulty area is a backbone network area or a second area, and the node's IP address is an IP address within a preset network segment, the faulty node is determined to be a node in the first backbone network; when the faulty area is a backbone network area or a second area, and the node's IP address is an IP address before the preset network segment, the faulty node is determined to be a node in the second backbone network; when the faulty area is a backbone network area or a second area, and the node's IP address is an IP address after the preset network segment, the faulty node is determined to be a node in the second area.

[0011] Optionally, the fault detection method further includes: obtaining the node log information of the faulty node, and outputting fault prompt information based on the log information.

[0012] In a second aspect, a fault detection device is provided, comprising: an acquisition unit and a determination unit; the acquisition unit is configured to acquire multiple first test information sent from multiple source nodes to a destination node; the multiple source nodes are nodes in multiple metropolitan area networks within a first region; the destination node is a node in a second region; the determination unit is configured to determine the number of abnormal test information from the multiple first test information, and determine a fault region based on the number of abnormal test information; the acquisition unit is further configured to acquire multiple second test information sent from multiple source nodes to the destination node corresponding to the abnormal test information; the determination unit is further configured to determine the node location of the fault node based on the multiple second test information and the fault region.

[0013] Optionally, the determining unit is specifically used to: determine the fault area as the backbone network area or the second area when the number of abnormal test information is greater than the preset number; and determine the fault area as the metropolitan area network area to which the source node corresponding to the abnormal test information belongs when the number of abnormal test information is equal to the preset number.

[0014] Optionally, the determining unit is specifically used for: for each of the multiple second test information, obtaining the multi-hop test information corresponding to the second test information; the multi-hop test information is the test information between each hop node from the source node to the destination node corresponding to the second test information; from the multi-hop test information, determining the first-hop abnormal test information other than the test information corresponding to the preset node; based on the first-hop abnormal test information, determining the faulty node and obtaining the node Internet Protocol IP address of the faulty node; and based on the node IP address and the faulty area, determining the node location of the faulty node.

[0015] Optionally, when there are multiple first-hop abnormal test information, the determining unit is specifically used to: determine the number of identical nodes among the multiple nodes corresponding to the multiple first-hop abnormal test information; when the number of identical nodes is greater than the preset number, the identical nodes are determined as faulty nodes.

[0016] Optionally, the determining unit is specifically used for: determining the faulty node as a node in the first backbone network when the faulty area is a backbone network area or a second area, and the node IP address is an IP address within a preset network segment; determining the faulty node as a node in the second backbone network when the faulty area is a backbone network area or a second area, and the node IP address is an IP address before the preset network segment; and determining the faulty node as a node in the second area when the faulty area is a backbone network area or a second area, and the node IP address is an IP address after the preset network segment.

[0017] Optionally, the acquisition unit is also used to acquire node log information of the faulty node and output fault prompt information based on the log information.

[0018] Thirdly, a fault detection device is provided, including a memory and a processor; the memory is used to store computer execution instructions, and the processor is connected to the memory via a bus; when the fault detection device is running, the processor executes the computer execution instructions stored in the memory, so that the fault detection device performs the fault detection method described in the first aspect.

[0019] The fault detection device can be a network device or a component of a network device, such as a chip system within the network device. This chip system supports the network device in implementing the functions involved in the first aspect and any of its possible implementations, such as acquiring, determining, and transmitting the data and / or information involved in the aforementioned fault detection method. The chip system includes a chip, but may also include other discrete devices or circuit structures.

[0020] Fourthly, a computer-readable storage medium is provided, comprising computer-executable instructions that, when executed on a computer, cause the computer to perform the fault detection method described in the first aspect.

[0021] Fifthly, a computer program product is also provided, which includes computer instructions that, when executed on a fault detection device, cause the fault detection device to perform the fault detection method as described in the first aspect above.

[0022] It should be noted that the aforementioned computer instructions may be stored, in whole or in part, on the first computer-readable storage medium. The first computer-readable storage medium may be packaged together with the processor of the fault detection device, or it may be packaged separately from the processor of the fault detection device; this application embodiment does not limit this.

[0023] The descriptions of the second, third, fourth, and fifth aspects in this application can be referenced to the detailed description of the first aspect; and the beneficial effects of the second, third, fourth, and fifth aspects can be referenced to the analysis of the beneficial effects of the first aspect, which will not be repeated here.

[0024] In the embodiments of this application, the names of the aforementioned fault detection devices do not limit the devices or functional modules themselves. In actual implementation, these devices or functional modules may appear under other names. As long as the functions of each device or functional module are similar to those of this application, they fall within the scope of the claims of this application and their equivalents.

[0025] These or other aspects of this application will become more readily apparent in the following description.

[0026] The technical solution provided in this application brings at least the following beneficial effects:

[0027] Based on any of the above aspects, embodiments of this application provide a fault detection method. After acquiring multiple first test messages sent from multiple source nodes to a destination node, the method determines the number of abnormal test messages in the first test messages and determines the fault area where the faulty node is located based on the number of abnormal test messages in the first test messages. Next, multiple second test messages sent from multiple source nodes to the destination nodes corresponding to the abnormal test messages in the first test messages can be acquired, and the node location of the faulty node can be determined based on the multiple second test messages and the fault area.

[0028] As can be seen from the above, the fault detection method provided in this application embodiment can first automatically determine the fault area where the fault node is located based on the number of abnormal test information in multiple first test information. Then, based on multiple second test information and the fault area, it can quickly and accurately determine the node location of the fault node automatically, without the need for manual fault investigation, thus improving the efficiency of fault detection. Attached Figure Description

[0029] Figure 1 This is a schematic diagram of the structure of the fault detection system provided in the embodiments of this application;

[0030] Figure 2 A schematic diagram of a hardware structure of the fault detection device provided in the embodiments of this application;

[0031] Figure 3Another hardware structure diagram of the fault detection device provided in the embodiments of this application;

[0032] Figure 4 A flowchart illustrating a fault detection method provided in an embodiment of this application;

[0033] Figure 5 A flowchart illustrating another fault detection method provided in an embodiment of this application;

[0034] Figure 6 A flowchart illustrating another fault detection method provided in an embodiment of this application;

[0035] Figure 7 A flowchart illustrating another fault detection method provided in an embodiment of this application;

[0036] Figure 8 A flowchart illustrating another fault detection method provided in an embodiment of this application;

[0037] Figure 9 A flowchart illustrating another fault detection method provided in an embodiment of this application;

[0038] Figure 10 A flowchart illustrating another fault detection method provided in an embodiment of this application;

[0039] Figure 11 This is a schematic diagram of the structure of a fault detection device provided in an embodiment of this application. Detailed Implementation

[0040] The technical solutions of the embodiments of this application will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of the present invention, and not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those of ordinary skill in the art without creative effort are within the scope of protection of the present invention.

[0041] It should be noted that in the embodiments of this application, the words "exemplary" or "for example" are used to indicate examples, illustrations, or explanations. Any embodiment or design scheme described as "exemplary" or "for example" in the embodiments of this application should not be construed as being more preferred or advantageous than other embodiments or design schemes. Specifically, the use of the words "exemplary" or "for example" is intended to present the relevant concepts in a specific manner.

[0042] To facilitate a clear description of the technical solutions of the embodiments of this application, the terms "first" and "second" are used in the embodiments of this application to distinguish the same or similar items with essentially the same function and effect. Those skilled in the art can understand that the terms "first" and "second" are not intended to limit the quantity or execution order.

[0043] As described in the background section, with the development of communication technology, the rapid detection of network faults in communication networks can ensure the stable operation of communication services. Existing fault handling methods typically send fault alerts to the maintenance equipment when the service quality deteriorates or service is interrupted, prompting maintenance personnel to manually troubleshoot the fault. When the fault detection area is large, manual troubleshooting is time-consuming, labor-intensive, and inefficient.

[0044] To address the aforementioned issues, this application provides a fault detection method. After acquiring multiple first test messages sent from multiple source nodes to a destination node, the method determines the number of abnormal test messages within the first test messages and then determines the faulty region where the faulty node is located based on the number of abnormal test messages. Next, it acquires multiple second test messages sent from multiple source nodes to the destination nodes corresponding to the abnormal test messages in the first test messages, and determines the node location of the faulty node based on the multiple second test messages and the faulty region.

[0045] As can be seen from the above, the fault detection method provided in this application embodiment can first automatically determine the fault area where the fault node is located based on the number of abnormal test information in multiple first test information. Then, based on multiple second test information and the fault area, it can quickly and accurately determine the node location of the fault node automatically, without the need for manual fault investigation, thus improving the efficiency of fault detection.

[0046] This fault detection method is applicable to fault detection systems. Figure 1 One structure of the fault detection system is shown. For example... Figure 1 As shown, the fault detection system includes: electronic device 101 and various node devices within the area to be detected.

[0047] The electronic device 101 can acquire test information between various node devices (i.e., the first test information and the second test information in this embodiment of the application), and thereby determine the node position of the faulty node in the area to be tested based on the acquired test information.

[0048] Optionally, the area to be tested can be divided into city-level areas (also known as metropolitan area network areas), provincial-level areas, and backbone network areas. In this case, such as Figure 1 As shown, the city-level regions in Province A can include: City A, City B, and City C.

[0049] The equipment in City A of Province A may include: source node device (also called source node) 102-1, source node device 102-2, city-level aggregation switch 103-1, city-level aggregation switch 103-2, city-level core switch 103-3, and city-level core switch 103-4.

[0050] The equipment in City B of Province A may include: source node device 102-3, source node device 102-4, city-level aggregation switch 103-6, city-level aggregation switch 103-6, city-level core switch 103-7, and city-level core switch 103-8.

[0051] The equipment in City C of Province A may include: source node device 102-5, source node device 102-6, city-level aggregation switch 103-9, city-level aggregation switch 103-10, city-level core switch 103-11, and city-level core switch 103-12.

[0052] The equipment in the provincial backbone network area of ​​Province A may include: Provincial Core Switch 104-1 and Provincial Core Switch 104-2.

[0053] The equipment in the group-level backbone network area may include: the group core switch 105.

[0054] The provincial-level regions include: Province B, Province C, Province D, and Province E.

[0055] The equipment in the provincial region of Province B includes: out-of-province provincial core switch 106-1, out-of-province provincial core switch 106-2, destination node equipment 107-1, and destination node equipment 107-2.

[0056] The equipment in the provincial region of Province C includes: out-of-province provincial core switch 106-3, out-of-province provincial core switch 106-4, destination node equipment 107-3, and destination node equipment 107-4.

[0057] The equipment in the provincial region of D province includes: provincial core switch 106-5, provincial core switch 106-6, destination node equipment 107-5, and destination node equipment 107-6.

[0058] The equipment in the provincial region of Province E includes: out-of-province provincial core switch 106-7, out-of-province provincial core switch 106-8, destination node equipment 107-7, and destination node equipment 107-8.

[0059] Specifically, electronic device 101 is communicatively connected to source node devices 102-1, 102-2, 102-3, 102-4, 102-5, and 102-6, respectively. Source node device 102-1 is communicatively connected to the municipal-level aggregation switch 103-1, source node device 102-2 is communicatively connected to the municipal-level aggregation switch 103-2, source node device 102-3 is communicatively connected to the municipal-level aggregation switch 103-3, source node device 102-4 is communicatively connected to the municipal-level aggregation switch 103-4, source node device 102-5 is communicatively connected to the municipal-level aggregation switch 103-5, and source node device 102-6 is communicatively connected to the municipal-level aggregation switch 103-6.

[0060] Source node device 102-1 is connected to the municipal-level core switches 103-3 and 103-4 for communication purposes. Source node device 102-2 is connected to the municipal-level core switches 103-3 and 103-4 for communication purposes. Source node device 102-5 is connected to the municipal-level core switches 103-7 and 103-8 for communication purposes. Source node device 102-6 is connected to the municipal-level core switches 103-7 and 103-8 for communication purposes. Source node device 102-9 is connected to the municipal-level core switches 103-11 and 103-12 for communication purposes. Device 102-10 is connected to the municipal-level core switches 103-11 and 103-12 for communication purposes.

[0061] The municipal-level core switch 103-3 is connected to the provincial-level core switches 104-1 and 104-2 respectively. The municipal-level core switch 103-4 is connected to the provincial-level core switches 104-1 and 104-2 respectively. The municipal-level core switch 103-7 is connected to the provincial-level core switches 104-1 and 104-2 respectively. The municipal-level core switch 103-8 is connected to the provincial-level core switches 104-1 and 104-2 respectively. The municipal-level core switch 103-11 is connected to the provincial-level core switches 104-1 and 104-2 respectively. The municipal-level core switch 103-12 is connected to the provincial-level core switches 104-1 and 104-2 respectively.

[0062] The group core switch 105 is connected to the provincial core switches 104-1 and 104-2 respectively, and is also connected to the provincial core switches 106-1, 106-2, 106-3, 106-4, 106-5, and 106-6 respectively.

[0063] The following communication connections exist between the out-of-province provincial core switch 106-1 and the destination node device 107-1: 106-2, 106-3, 106-4, 106-5, 106-6, 106-7, and 107-8.

[0064] Optionally, the area to be detected can also be divided according to other administrative division methods, such as street-level areas, district-level areas, and city-level areas. This application embodiment does not limit this.

[0065] In practical applications, electronic device 101 can connect to any number of source node devices, source node devices can connect to any number of city-level aggregation switches, city-level aggregation switches can connect to any number of city-level core switches, city-level core switches can connect to any number of provincial core switches, provincial core switches can connect to any number of group core switches, group core switches can connect to any number of out-of-province provincial core switches, and out-of-province provincial core switches can connect to any number of destination node devices. In this embodiment, no limitation is made on the above quantities.

[0066] Optionally, the physical device of electronic device 101 can be a terminal, a server, or other types of electronic devices.

[0067] Optionally, when the physical device of electronic device 101 is a terminal, the terminal can be a device that provides voice and / or data connectivity to a user, a handheld device with wireless connectivity, or other processing devices connected to a wireless modem. The terminal can communicate with one or more core networks via a radio access network (RAN). The terminal can be a mobile terminal, such as a mobile phone (or "cellular" phone) and a computer with a mobile terminal, or a portable, pocket-sized, handheld, computer-embedded, or vehicle-mounted mobile device that exchanges voice and / or data with the radio access network, such as a mobile phone, tablet computer, laptop computer, netbook, or personal digital assistant (PDA).

[0068] Optionally, when the physical device of electronic device 101 is a server, the server can be one of the servers in a server cluster (composed of multiple servers), a chip in the server, a system-on-a-chip in the server, or a virtual machine (VM) deployed on a physical machine. This application embodiment does not limit this.

[0069] The basic hardware structure of electronic devices 101 in the fault detection system is similar, both including Figure 2 or Figure 3 The components included in the communication device shown. The following are examples... Figure 2 and Figure 3 Taking the communication device shown as an example, the hardware structure of electronic device 101 will be introduced.

[0070] like Figure 2 The diagram shown is a hardware structure schematic of a communication device provided in an embodiment of this application. The communication device includes a processor 21, a memory 22, a communication interface 23, and a bus 24. The processor 21, the memory 22, and the communication interface 23 are connected via the bus 24.

[0071] Processor 21 is the control center of the communication device. It can be a single processor or a collective term for multiple processing elements. For example, processor 21 can be a general-purpose central processing unit (CPU) or other general-purpose processors. Among them, the general-purpose processor can be a microprocessor or any conventional processor.

[0072] As one embodiment, processor 21 may include one or more CPUs, for example Figure 2 CPU 0 and CPU 1 are shown in the diagram.

[0073] The memory 22 may be a read-only memory (ROM) or other type of static storage device capable of storing static information and instructions, random access memory (RAM) or other type of dynamic storage device capable of storing information and instructions, or electrically erasable programmable read-only memory (EEPROM), disk storage media or other magnetic storage devices, or any other medium capable of carrying or storing desired program code in the form of instructions or data structures and accessible by a computer, but is not limited thereto.

[0074] In one possible implementation, the memory 22 can exist independently of the processor 21. The memory 22 can be connected to the processor 21 via a bus 24 and is used to store instructions or program code. When the processor 21 calls and executes the instructions or program code stored in the memory 22, it can implement the fault detection method provided in the following embodiments of the present invention.

[0075] In this embodiment, the software programs stored in the memory 22 of the electronic device 101 are different, so the functions implemented by the electronic device 101 are different. The functions performed by each device will be described with reference to the following flowchart.

[0076] In another possible implementation, the memory 22 can also be integrated with the processor 21.

[0077] Communication interface 23 is used for connecting the communication device to other devices via a communication network, such as Ethernet, wireless access network, wireless local area network (WLAN), etc. Communication interface 23 may include a receiving unit for receiving data and a transmitting unit for sending data.

[0078] Bus 24 can be an industry standard architecture (ISA) bus, a peripheral component interconnect (PCI) bus, or an extended industry standard architecture (EISA) bus, etc. This bus can be divided into address bus, data bus, control bus, etc. For ease of representation, Figure 2 The bus is represented by a single thick line, but this does not mean that there is only one bus or one type of bus.

[0079] Figure 3 Another hardware structure of the communication device in an embodiment of the present invention is shown. For example... Figure 3 As shown, the communication device may include a processor 31 and a communication interface 32. The processor 31 is coupled to the communication interface 32.

[0080] The functions of processor 31 can be referred to in the description of processor 21 above. In addition, processor 31 also has a storage function, and can perform the functions of memory 22 mentioned above.

[0081] The communication interface 32 is used to provide data to the processor 31. The communication interface 32 can be an internal interface of the communication device or an external interface of the communication device (equivalent to communication interface 23).

[0082] It should be pointed out that, Figure 2 (or Figure 3 The structure shown in the diagram does not constitute a limitation on the communication device, except... Figure 2 (or Figure 3 In addition to the components shown in the diagram, the communication device may include more or fewer components than shown, or combine certain components, or have different component arrangements.

[0083] The fault detection method provided in the embodiments of this application will be described in detail below with reference to the accompanying drawings.

[0084] like Figure 4 As shown, the fault detection method provided in this application embodiment is applied to electronic equipment, and the fault detection method includes: S401-S404.

[0085] S401. The electronic device acquires multiple first test messages sent from multiple source nodes to the destination node.

[0086] Optionally, one implementation of the electronic device acquiring multiple first test information is as follows: The electronic device can send a request to acquire the first test information to each source node (also called a source node device). After receiving the request, each source node can initiate a first test to the destination node (also called a destination node device) to obtain a first test result. Then, each source node can send first test information to the electronic device to represent the first test result.

[0087] Optionally, a probe for network testing is pre-deployed on the source node. In this case, the specific testing method for the source node to initiate the first test to the destination node is as follows: the probe in the source node can periodically (e.g., every T1 seconds) initiate an Internet Packet Grover (PING) test (i.e., the first test) to the destination node, and each PING test includes one data packet. The probe in the source node can send the PING test data packet to the destination node through an intermediate node between the source node and the destination node. After receiving the above data packet, the destination node can reply with a data packet. This data packet returns to the source node along the original path.

[0088] Next, the source node can periodically (e.g., every T2 seconds) determine the packet loss rate based on the number of packets sent and the number of packets received to obtain a first test result, and send first test information to the electronic device to represent the first test result.

[0089] In this way, the electronic device can acquire multiple first test messages sent from multiple source nodes to the destination node.

[0090] The multiple source nodes are nodes in multiple metropolitan area networks within the first region. The destination nodes are nodes in the second region.

[0091] Optionally, the first and second regions can be areas covered by communication networks in different administrative regions.

[0092] For example, in combination Figure 1 The first region can be the region of province A, and the second region can be at least one of the regions of province B, province C, province D, and province E.

[0093] Optionally, the number of destination nodes can be one or more; this embodiment of the application does not limit this. For example, in conjunction with... Figure 1 Multiple source nodes (e.g.) Figure 1 The probes in source node devices 102-1, 102-2, and 102-3 can send signals to the destination node (e.g., [the target node]) every second. Figure 1Destination node device 107-1 initiates a PING test, each PING test consisting of one data packet. Probes in source node devices 102-1, 102-2, and 102-3 can send the PING test data packets to destination node device 107-1 through intermediate nodes between source node devices 102-1, 102-2, and 102-3 and destination node device 107-1. Upon receiving the aforementioned data packets, destination node device 107-1 can reply with a data packet, which returns along the original path to source node devices 102-1, 102-2, and 102-3.

[0094] In this scenario, source node devices 102-1, 102-2, and 102-3 can determine the packet loss rate between themselves and the destination node device 107-1 every 60 seconds, based on the number of data packets sent and received. For example, source node device 102-1 sends 60 data packets and receives 57 data packets in response from destination node device 107-1; source node device 102-2 sends 60 data packets and receives 59 data packets in response from destination node device 107-1; and source node device 102-3 sends 60 data packets and receives 60 data packets in response from destination node device 107-1.

[0095] As shown above, the packet loss rate from source node device 102-1 to destination node device 107-1 is 5%, the packet loss rate from source node device 102-2 to destination node device 107-1 is 1.7%, and the packet loss rate from source node device 102-3 to destination node device 107-1 is 0%. Next, source node device 102-1 can determine the above packet loss rates as the first test result and send first test information representing the first test result to electronic device 101.

[0096] S402, The electronic device determines the number of abnormal test information from multiple first test information and determines the fault area based on the number of abnormal test information.

[0097] Optionally, when the first test information is used to represent the packet loss rate, and the packet loss rate corresponding to the first test information is greater than or equal to a preset value, the electronic device can identify the first test information as abnormal test information. Then, the electronic device can determine the number of abnormal test information entries.

[0098] Since nodes in the backbone network area or the second area aggregate the first test information sent by multiple source nodes, when a node in the backbone network area or the second area fails, multiple abnormal test messages will inevitably appear. In this case, electronic devices can determine the faulty area (i.e., the area where the faulty node is located) based on the number of abnormal test messages.

[0099] Optionally, the backbone network region may include group-level backbone network regions and provincial-level backbone network regions.

[0100] When the number of abnormal test messages is 0, it indicates that the communication network has not experienced a failure.

[0101] When the number of abnormal test messages is 1, it indicates that the area where the faulty node is located is neither the backbone network area nor the secondary area. In this case, the electronic equipment can determine that the faulty node is located in the metropolitan area network area where the source node in the abnormal test message is located.

[0102] When the number of abnormal test messages is greater than 1, it indicates that abnormal test messages exist in the first test messages corresponding to different source nodes. In this case, the electronic equipment can determine whether the faulty node is located in the backbone network area or the second area.

[0103] S403. The electronic device acquires multiple second test messages sent from multiple source nodes to the destination node corresponding to the abnormal test message.

[0104] Specifically, after identifying the abnormal test information, in order to determine the specific location of the faulty node, the electronic device acquires multiple second test messages sent from multiple source nodes to the destination node corresponding to the abnormal test information.

[0105] Optionally, one implementation of the electronic device acquiring multiple second test messages sent from multiple source nodes to the destination node corresponding to the abnormal test information is as follows: The electronic device can send a request to acquire the second test information to each source node. After receiving the request, each source node can initiate a second test to the destination node corresponding to the abnormal test information in the first test to obtain the second test result. Then, each source node can send second test information to the electronic device to represent the second test result.

[0106] Optionally, probes for network testing are pre-deployed on the source node. In this case, the specific testing method for the source node to initiate a second test to the destination node in the abnormal test information is as follows: the probe in the source node can initiate a network connectivity (my trace route, MTR) test (i.e., the second test) to the destination node. The probe deployed on the source node can obtain the test information (i.e., packet loss rate) for each hop between the source node and the destination node through the MTR test.

[0107] In this way, the electronic device can obtain multiple second test messages sent from multiple source nodes to the destination node in the abnormal test information, that is, the packet loss rate of each hop between multiple source nodes and the destination node in the abnormal test information.

[0108] Specifically, each MTR test can contain 30 hops, with 100 packets per hop. The probe deployed on the source node can obtain the feedback number of 100 packets between each hop from the source node to the destination node through the MTR test, thereby determining the packet loss rate of each hop between the source node and the destination node in the abnormal test information.

[0109] S404. The electronic device determines the location of the faulty node based on multiple second test information and the fault area.

[0110] After acquiring multiple sets of second test information, for each set of second test information, since the second test information is used to represent the test information of each hop between the source node and the destination node in the abnormal test information, the electronic device can determine the Internet Protocol (IP) address of the faulty node based on the first hop abnormal test information.

[0111] However, since nodes in different areas may share the same IP address, determining the location of a faulty node solely based on its IP address can lead to low accuracy. In such cases, electronic devices can combine the faulty area and the faulty node's IP address to accurately determine its location.

[0112] In one embodiment, combined with Figure 4 ,like Figure 5 As shown, in S402 above, the method for determining the fault area of ​​the electronic device based on the number of abnormal test information specifically includes: S501-S502.

[0113] S501. When the number of abnormal test information exceeds the preset number, the electronic device determines the fault area to be the backbone network area or the second area.

[0114] Optionally, the preset quantity can be 1.

[0115] Specifically, since nodes in the backbone network area or the second area aggregate the first test information sent by multiple source nodes, multiple abnormal test messages will inevitably appear when a node in the backbone network area or the second area fails. In this case, electronic devices can determine the faulty area (i.e., the area where the faulty node is located) based on the number of abnormal test messages.

[0116] When the number of abnormal test messages is greater than 1, it indicates that abnormal test messages exist in the first test messages corresponding to different source nodes. In this case, the electronic equipment can determine whether the faulty node is located in the backbone network area or the second area.

[0117] For example, in combination Figure 1 Assume multiple source nodes are source node devices 102-1, 102-2, 102-4, 102-5, and 102-6, and the destination node is destination node device 107-1. Since destination node device 107-1, out-of-province provincial core switches 106-1 and 106-2, group core switches 105, and provincial core switches 104-1 or 104-2 will aggregate the first test information sent by multiple source nodes, therefore, when destination node device 107-1, out-of-province provincial core switches 106-1 and 106-2, group core switches 105, and provincial core switches 104-1 or 104-2 fail, multiple abnormal test messages (i.e., source node...) will inevitably appear. The packet loss rate between source node 102-1 and destination node 107-1 exceeds a preset value; the packet loss rate between source node 102-2 and destination node 107-1 exceeds a preset value; the packet loss rate between source node 102-3 and destination node 107-1 exceeds a preset value; the packet loss rate between source node 102-4 and destination node 107-1 exceeds a preset value; the packet loss rate between source node 102-5 and destination node 107-1 exceeds a preset value; and the packet loss rate between source node 102-6 and destination node 107-1 exceeds a preset value. Therefore, when there are multiple abnormal test messages, electronic device 101 can determine that the faulty area is the backbone network area or the second area.

[0118] S502. When the number of abnormal test information is equal to the preset number, the electronic device determines the fault area as the metropolitan area network area to which the source node corresponding to the abnormal test information belongs.

[0119] Specifically, since nodes in the metropolitan area network (MAN) to which the source node corresponding to the abnormal test information belongs only receive the first test information sent by the source node device within their own MAN, a failure in a node within the MAN to which the source node corresponding to the abnormal test information belongs will only affect the first test information of the source node within its own MAN, i.e., only one abnormal test information.

[0120] For example, in combination Figure 1Assume the source node corresponding to the abnormal test information is source node device 102-1, and the destination node is destination node device 107-1. Since nodes in the metropolitan area network (MAN) to which the source node belongs only receive the first test information sent by the source node devices (i.e., source node devices 102-1 and 102-2) within their own MAN, when the municipal-level aggregation switch 103-1, municipal-level aggregation switch 103-2, municipal-level core switch 103-3, and municipal-level core switch 103-4 fail, only one abnormal test information will inevitably appear (i.e., the packet loss rate between source node device 102-1 and destination node device 107-1 is greater than a preset value). Therefore, when there is only one abnormal test information, electronic device 101 can determine that the faulty area is the MAN to which the source node corresponding to the abnormal test information belongs.

[0121] In one embodiment, combined with Figure 5 ,like Figure 6 As shown, in S404 above, the method by which the electronic device determines the node location of the fault node based on multiple second test information and the fault area specifically includes: S601-S604.

[0122] S601. For each of the multiple second test information, the electronic device acquires the multi-hop test information corresponding to the second test information.

[0123] Among them, the multi-hop test information is the test information between each hop node from the source node corresponding to the second test information to the destination node.

[0124] For example, in combination Figure 1Assume the destination node corresponding to the abnormal test information is destination node device 107-1, and the multiple source nodes are source node devices 102-1, 102-2, 102-4, 102-5, and 102-6. In this case, the total number of data packets sent at each hop between source node device 102-1 and destination node device 107-1 is 100, and electronic device 101 can obtain the number of data packets replied by the nodes in each hop. Specifically, the number of data packets replied by the node between source node device 102-1 and the municipal-level aggregation switch 103-1 was 99; the number of data packets replied by the node between municipal-level aggregation switch 103-1 and the municipal-level core switch 103-3 was 98; the number of data packets replied by the node between municipal-level aggregation switch 103-1 and the municipal-level core switch 103-4 was 97; the number of data packets replied by the node between municipal-level core switch 103-3 and the provincial-level core switch 104-1 was 98; and the number of data packets replied by the node between municipal-level core switch 103-4 and the provincial-level core switch 104-1 was 98. The number of data packets replied by the nodes between switches 104-2 is 94; the number of data packets replied by the nodes between the provincial core switch 104-1 and the group core switch 105 is 100; the number of data packets replied by the nodes between the provincial core switch 104-2 and the group core switch 105 is 100; the number of data packets replied by the nodes between the group core switch 105 and the provincial core switch 106-1 of another province is 100; and the number of data packets replied by the nodes between the provincial core switch 106-1 of another province and the destination node device 107-1 is 98.

[0125] S602. The electronic device determines the first-hop abnormal test information from the multi-hop test information, excluding the test information corresponding to the preset node.

[0126] Among them, the preset nodes are nodes that are pre-set to be unable to return packets. Since these nodes cannot return packets, it is impossible to determine the packet loss rate of the node, so they are not within the scope of consideration of the embodiments of this application.

[0127] Optionally, the first-hop anomaly test information is the test information corresponding to the first node with a packet loss rate greater than a preset value during the MTR test signal transmission process.

[0128] Based on the above examples, the packet loss rate between source node device 102-1 and city-level aggregation switch 103-1 is 1%; the packet loss rate between city-level aggregation switch 103-1 and city-level core switch 103-3 is 2%; the packet loss rate between city-level aggregation switch 103-1 and city-level core switch 103-4 is 3%; the packet loss rate between city-level core switch 103-3 and provincial core switch 104-1 is 2%; the packet loss rate between city-level core switch 103-4 and provincial core switch 104-2 is 6%; the packet loss rate between provincial core switch 104-1 and group core switch 105 is 0%; the packet loss rate between provincial core switch 104-2 and group core switch 105 is 0%; the packet loss rate between group core switch 105 and out-of-province provincial core switch 106-1 is 0%; and the packet loss rate between out-of-province provincial core switch 106-1 and destination node device 107-1 is 2%. Based on the above packet loss rates, it can be seen that the packet loss rate between the municipal core switch 103-4 and the provincial core switch 104-2 is the first-hop anomaly test information.

[0129] S603. The electronic device determines the faulty node based on the first-hop anomaly test information and obtains the IP address of the faulty node.

[0130] Specifically, since the second test information includes the IP address of each hop device, after determining the first hop abnormal test information, the electronic device can identify the node corresponding to the first hop abnormal test information as the faulty node and extract the IP address of the faulty node from the first hop abnormal test information.

[0131] Optionally, the IP address range of the faulty node can be 2.2.XX.

[0132] For example, in combination Figure 1 The packet loss rate between the municipal core switch 103-4 and the provincial core switch 104-2 is a first-hop anomaly test information. The IP address of the municipal core switch 103-4 is 2.2.2.1.

[0133] S604. Electronic devices determine the location of the faulty node based on the node's IP address and the faulty area.

[0134] Specifically, after determining the node IP address, since the network segment of each fault area is different, the electronic device can accurately determine the node location of the faulty node based on the node IP address and the network segment corresponding to each fault area.

[0135] In one embodiment, combined with Figure 6 ,like Figure 7As shown, when there are multiple first-hop abnormal test information, the method for the electronic device to determine the fault node based on the first-hop abnormal test information in S603 above specifically includes: S701-S702.

[0136] S701. The electronic device determines the number of identical nodes among multiple nodes corresponding to multiple first-hop anomaly test information.

[0137] The number of identical nodes indicates the number of times the same node appears in multiple first-hop anomaly test messages.

[0138] For example, in combination Figure 1 Assume that the node corresponding to the first-hop anomaly test information between source node device 102-1 and destination node device 107-1 is 2.2.2.1, the node corresponding to the first-hop anomaly test information between source node device 102-2 and destination node device 107-1 is 2.2.1.1, and the node corresponding to the first-hop anomaly test information between source node device 102-3 and destination node device 107-1 is 2.2.2.1. In this case, the node corresponding to the first-hop anomaly test information between source node device 102-1 and destination node device 107-1 and the node corresponding to the first-hop anomaly test information between source node device 102-3 and destination node device 107-1 are the same node. Therefore, electronic device 101 can determine that the same node among the multiple nodes corresponding to multiple first-hop anomaly test information is 2.2.2.1, and determine that the number of the same nodes among the multiple nodes corresponding to multiple first-hop anomaly test information is 2.

[0139] S702. When the number of identical nodes exceeds the preset number, the electronic device will identify the identical nodes as faulty nodes.

[0140] Based on the above example, assuming the preset quantity is 1, it can be seen that electronic device 101 determines that the same node (i.e., the node with IP address 2.2.2.1) appears twice in multiple first-hop anomaly test information, which is more than once. Therefore, electronic device determines that the node with IP address 2.2.2.1 is a faulty node.

[0141] In one embodiment, combined with Figure 7 ,like Figure 8 As shown, in S604 above, the electronic device determines the location of the faulty node based on the node IP address and the fault area, including: S801-S803.

[0142] S801. When the fault area is the backbone network area or the second area, and the node IP address is an IP address within a preset network segment, the electronic device determines that the fault node is a node in the first backbone network.

[0143] Optionally, the preset network segment can be the network segment corresponding to the group-level backbone network area. For example, the 2.2.2.2 network segment.

[0144] For example, in combination Figure 1 When the faulty area is the provincial backbone network area of ​​province A, the group-level backbone network area, or the second area (i.e., any one of the areas of province B, province C, province D, and province E), and the node IP address is an IP address within the 2.2.2.2 network segment, the electronic device 101 determines that the faulty node is a node in the first backbone network (i.e., the network corresponding to the group-level backbone network area).

[0145] S802. When the fault area is the backbone network area or the second area, and the node IP address is the IP address before the preset network segment, the electronic device determines that the fault node is a node in the second backbone network.

[0146] For example, in combination Figure 1 When the faulty area is the provincial backbone network area of ​​province A, the group-level backbone network area, or the second area (i.e., the area of ​​province B, province C, province D, or province E), and the node IP address is an IP address before the 2.2.2.2 network segment (e.g., a node with an IP address of 2.2.2.1), the electronic device 101 determines that the faulty node is a node in the second backbone network (i.e., the network corresponding to the provincial backbone network area of ​​province A).

[0147] S803. When the fault area is the backbone network area or the second area, and the node IP address is an IP address after the preset network segment, the electronic device determines that the fault node is a node in the second area.

[0148] For example, in combination Figure 1 When the faulty area is the provincial backbone network area of ​​province A, the group-level backbone network area, or the second area (i.e., the area of ​​province B, province C, province D, or province E), and the node IP address is an IP address after the 2.2.2.2 network segment (e.g., a node with an IP address of 2.2.2.3), the electronic device 101 determines that the faulty node is a node in the second area.

[0149] In one embodiment, combined with Figures 4-8 ,like Figure 9 As shown, the above fault detection method also includes: S901.

[0150] S901. The electronic device obtains the node log information of the faulty node and outputs fault prompt information based on the log information.

[0151] Optionally, the node log information of the faulty node includes: port information, port anomaly alarms, traffic information, etc., which are not limited in this embodiment of the application.

[0152] Optionally, the electronic device may include a display screen (also known as a location result interface), which can display the node log information of the aforementioned faulty node. When the electronic device outputs a fault prompt message, the aforementioned node log information can be displayed on the screen.

[0153] Specifically, the electronic device determines the device port where the faulty node is located based on the node's location. Then, the electronic device calls the log system to query the abnormal alarms and traffic information of the aforementioned device port, and displays this information on the location results interface to facilitate troubleshooting personnel in investigating and handling the cause of the fault.

[0154] Optionally, after the fault handling personnel have finished handling the faulty node, the electronic device can also determine whether the faulty node has returned to normal by acquiring multiple third test messages sent from multiple source nodes to the destination node in the anomaly test information.

[0155] Optionally, one implementation of the electronic device acquiring multiple third test information is as follows: The electronic device can send a request to acquire the third test information to each source node. After receiving the request, each source node can initiate a third test to the destination node in the abnormal test information to obtain the third test result. Then, each source node can send third test information to the electronic device to represent the third test result.

[0156] Optionally, the specific testing method for the source node to initiate the third test to the destination node is as follows: The probe in the source node can periodically (e.g., every T3 seconds) initiate a PING test (i.e., the third test) to the destination node in the anomaly test information. Each PING test contains one data packet. The probe in the source node can send the PING test data packet to the destination node in the anomaly test information through an intermediate node between the source node and the destination node in the anomaly test information. After receiving the above data packet, the destination node in the anomaly test information can reply with a data packet. This data packet returns to the source node along the original path.

[0157] Next, the source node can periodically (e.g., every T4 seconds) determine the packet loss rate based on the number of packets sent and received to obtain a third test result, and send third test information to the electronic device to represent the third test result.

[0158] In this way, electronic devices can acquire multiple third-party test messages sent from multiple source nodes to the destination node in the anomaly test information.

[0159] Optionally, the electronic device can determine whether the faulty node has returned to normal based on the acquired third test information.

[0160] Optionally, one way for the electronic device to determine whether the faulty node has returned to normal based on the third test information is as follows:

[0161] When the result of the third test information shows that the packet loss rate of the destination node in the abnormal test information is less than K% for M consecutive times, the electronic device determines that the destination node in the abnormal test information has returned to normal.

[0162] When the result of the third test information shows that the destination node in the abnormal test information cannot have a packet loss rate of less than K% for M consecutive times, the source node device continues to initiate PING tests to the destination node in the abnormal test information.

[0163] For example, in combination Figure 1 Multiple source nodes (e.g.) Figure 1 The probe in the source node device 102-1 can send a probe to the destination node (e.g., in the anomaly test information) every 1 second. Figure 1 The destination node device 107-1 initiates a PING test, with each PING test consisting of one data packet. The probe in the source node device 102-1 can send the PING test data packets to the destination node device 107-1 through an intermediate node between the source node device 102-1 and the destination node device 107-1. Upon receiving these data packets, the destination node device 107-1 can reply with a data packet, which returns to the source node device 102-1 along the same path.

[0164] In this scenario, source node device 102-1 can determine the packet loss rate between source node device 102-1 and destination node device 107-1 every 60 seconds based on the number of data packets sent and received. When the packet loss rate between source node device 102-1 and destination node device 107-1 is less than 5% for three consecutive tests, electronic device 101 determines that the destination node (i.e., destination node device 107-1) in the abnormal test information has returned to normal.

[0165] In some embodiments, Figure 10 A flowchart illustrating an overall process for a fault detection method provided in an embodiment of this application is shown. Figure 10 As shown, the performance testing method provided in this application embodiment includes:

[0166] S1001, The electronic device acquires multiple first test messages sent from multiple source nodes to the destination node.

[0167] Among them, multiple source nodes can also be referred to as N1 source IPs, destination nodes can also be referred to as N2 destination IPs, the first test information can also be referred to as the first type of test information, and the first test information can also be referred to as the detection result set H.

[0168] Combination Figure 4 For a description of how electronic devices acquire multiple first test messages sent from multiple source nodes to a destination node, please refer to the relevant description in S401, which will not be repeated here.

[0169] S1002, The electronic device determines the number of abnormal test information from multiple first test information.

[0170] Among them, abnormal test information can also be called abnormal task source and destination IP (i.e., source IP and destination IP), and abnormal test information can also be called city-level test abnormal information.

[0171] Combination Figure 4 For a description of how electronic devices determine the number of abnormal test information from multiple first test information, please refer to the relevant description of S402, which will not be repeated here.

[0172] S1003. Electronic equipment determines the fault area based on the number of abnormal test information.

[0173] Specifically, when the number of abnormal test messages is greater than 1, the electronic device determines that the faulty node is located in the backbone network area or the second area. In this case, the electronic device can execute S1004-S1007.

[0174] Specifically, when the number of abnormal test messages is equal to 1, the electronic device determines that the faulty node is located in the metropolitan area network area where the source node device in the abnormal test message is located. In this case, the electronic device can execute S1008-S1010.

[0175] Among them, the method of determining the fault area of ​​electronic equipment based on the amount of abnormal test information can be called the fault delimitation method.

[0176] Combination Figure 5 The relevant descriptions of how electronic devices determine the fault area based on the number of abnormal test information can be found in the relevant descriptions of S501-S502, and will not be repeated here.

[0177] S1004. The electronic device acquires multiple second test messages sent from multiple source nodes to the destination node corresponding to the abnormal test message.

[0178] The second test information can also be referred to as the second type of test information.

[0179] Combination Figure 4 The relevant description of the electronic device acquiring multiple second test information sent from multiple source nodes to the destination node corresponding to the abnormal test information can be found in the relevant description of S403, and will not be repeated here.

[0180] S1005. The electronic device determines the node IP address of the faulty node based on multiple second test information and the fault area.

[0181] The IP address of the faulty node can also be referred to as the final suspected faulty node IP.

[0182] Combination Figure 6 and Figure 7 The relevant descriptions of how electronic equipment determines the location of the fault node based on multiple second test information and fault areas can be found in the relevant descriptions of S601-S604 and S701-S702, and will not be repeated here.

[0183] S1006. The electronic device determines the location of the faulty node based on the node's IP address and the faulty area.

[0184] The method by which electronic devices determine the location of a faulty node based on its IP address and the fault area can also be called the fault demarcation method.

[0185] Combination Figure 8 For details on how electronic devices determine the location of a faulty node based on its IP address and fault area, please refer to the relevant descriptions in S801-S803. These details will not be repeated here.

[0186] S1007. The electronic device obtains the node log information of the faulty node and outputs fault prompt information based on the log information.

[0187] Among them, node log information can also be referred to as abnormal alarm information of data device ports.

[0188] Combination Figure 9 The electronic device obtains the node log information of the faulty node and outputs a description of the fault prompt information based on the log information. You can refer to the relevant description of S901, which will not be repeated here.

[0189] S1008. The electronic device acquires multiple second test messages sent from multiple source nodes to the destination node corresponding to the abnormal test message.

[0190] The second test information can also be referred to as the second type of test information.

[0191] Combination Figure 4 The relevant description of the electronic device acquiring multiple second test information sent from multiple source nodes to the destination node corresponding to the abnormal test information can be found in the relevant description of S403, and will not be repeated here.

[0192] S1009. The electronic device determines the node IP address of the faulty node based on multiple second test information and the fault area.

[0193] The IP address of a faulty node can also be referred to as a suspected faulty IP.

[0194] Combination Figure 6 and Figure 7 The relevant descriptions of how electronic equipment determines the location of the fault node based on multiple second test information and fault areas can be found in the relevant descriptions of S601-S604 and S701-S702, and will not be repeated here.

[0195] S1010 The electronic device obtains the node log information of the faulty node and outputs fault prompt information based on the log information.

[0196] Among them, node log information can also be referred to as abnormal alarm information of data device ports.

[0197] Combination Figure 9 The electronic device obtains the node log information of the faulty node and outputs a description of the fault prompt information based on the log information. You can refer to the relevant description of S901, which will not be repeated here.

[0198] S1011, The electronic device can acquire multiple third test messages sent from multiple source nodes to the destination node in the abnormal test information.

[0199] The third test information can also be called the third type of PING test information.

[0200] Combination Figure 9 The electronic device can obtain descriptions of multiple third test information sent from multiple source nodes to the destination node in the abnormal test information. For details, please refer to the relevant description of S901, which will not be repeated here.

[0201] The foregoing mainly describes the solutions provided by the embodiments of this application from a methodological perspective. To achieve the above functions, it includes corresponding hardware structures and / or software modules for executing each function. Those skilled in the art should readily recognize that, based on the units and algorithm steps of the examples described in conjunction with the embodiments disclosed herein, this application can be implemented in hardware or a combination of hardware and computer software. Whether a function is executed in hardware or by computer software driving hardware depends on the specific application and design constraints of the technical solution. Those skilled in the art can use different methods to implement the described functions for each specific application, but such implementation should not be considered beyond the scope of this application.

[0202] This application embodiment can divide the fault detection device into functional modules according to the above method example. For example, each function can be divided into its own functional module, or two or more functions can be integrated into one processing module. The integrated module can be implemented in hardware or as a software functional module. Optionally, the module division in this application embodiment is illustrative and only represents one logical functional division; other division methods may be used in actual implementation.

[0203] like Figure 11 The diagram shown is a structural schematic of a fault detection device provided in an embodiment of this application. This fault detection device can be used to perform... Figures 4-9 The method for fault detection is shown. Figure 10 The fault detection device shown includes: an acquisition unit 1101 and a determination unit 1102.

[0204] Acquisition unit 1101 is used to acquire multiple first test messages sent from multiple source nodes to a destination node. The multiple source nodes are nodes in multiple metropolitan area networks within a first area. The destination node is a node in a second area.

[0205] The determining unit 1102 is used to determine the number of abnormal test information from multiple first test information, and to determine the fault area based on the number of abnormal test information.

[0206] The acquisition unit 1101 is also used to acquire multiple second test messages sent from multiple source nodes to the destination node corresponding to the abnormal test message.

[0207] The determining unit 1102 is also used to determine the node location of the fault node based on multiple second test information and the fault area.

[0208] Optionally, the determining unit 1102 is specifically used to: determine the fault area as the backbone network area or the second area when the number of abnormal test information is greater than a preset number; and determine the fault area as the metropolitan area network area to which the source node corresponding to the abnormal test information belongs when the number of abnormal test information is equal to the preset number.

[0209] Optionally, the determining unit 1102 is specifically used for: obtaining multi-hop test information corresponding to each of the multiple second test information sets. The multi-hop test information is the test information between each hop node from the source node to the destination node corresponding to the second test information. From the multi-hop test information, determine the first-hop abnormal test information, excluding the test information corresponding to a preset node. Based on the first-hop abnormal test information, determine the faulty node and obtain the node's Internet Protocol (IP) address. Based on the node IP address and the faulty region, determine the node location of the faulty node.

[0210] Optionally, the determining unit 1102 is specifically used to: determine the number of identical nodes among multiple nodes corresponding to multiple first-hop abnormal test information. When the number of identical nodes is greater than a preset number, the identical nodes are determined as faulty nodes.

[0211] Optionally, the determining unit 1102 is specifically used for: determining the faulty node as a node in the first backbone network when the faulty area is a backbone network area or a second area, and the node IP address is an IP address within a preset network segment; determining the faulty node as a node in the second backbone network when the faulty area is a backbone network area or a second area, and the node IP address is an IP address before the preset network segment; and determining the faulty node as a node in the second area when the faulty area is a backbone network area or a second area, and the node IP address is an IP address after the preset network segment.

[0212] Optionally, the acquisition unit 1101 is also used to acquire the node log information of the faulty node and output fault prompt information based on the log information.

[0213] This application also provides a computer-readable storage medium, which includes computer-executable instructions that, when executed on a computer, cause the computer to perform the fault detection method provided in the above embodiments.

[0214] This application also provides a computer program that can be directly loaded into a memory and contains software code. After being loaded and executed by a computer, the computer program can implement the fault detection method provided in the above embodiments.

[0215] Those skilled in the art will recognize that, in one or more of the examples above, the functions described in this invention can be implemented using hardware, software, firmware, or any combination thereof. When implemented in software, these functions can be stored in a computer-readable medium or transmitted as one or more instructions or code on a computer-readable medium. Computer-readable media include computer-readable storage media and communication media, wherein communication media include any medium that facilitates the transfer of a computer program from one place to another. Storage media can be any available medium accessible to a general-purpose or special-purpose computer.

[0216] Through the above description of the embodiments, those skilled in the art can clearly understand that, for the sake of convenience and brevity, only the division of the above functional modules is used as an example. In actual applications, the above functions can be assigned to different functional modules as needed, that is, the internal structure of the device can be divided into different functional modules to complete all or part of the functions described above.

[0217] In the several embodiments provided in this application, it should be understood that the disclosed apparatus and methods can be implemented in other ways. For example, the apparatus embodiments described above are merely illustrative; for instance, the division of modules or units is only a logical functional division, and there may be other division methods in actual implementation. For example, multiple units or components may be combined or integrated into another device, or some features may be ignored or not executed. Furthermore, the shown or discussed mutual couplings or direct couplings or communication connections may be through some interfaces; indirect couplings or communication connections between devices or units may be electrical, mechanical, or other forms. Units described as separate components may or may not be physically separate; components shown as units may be one physical unit or multiple physical units, i.e., they may be located in one place or distributed in multiple different places. Some or all of the units can be selected to achieve the purpose of this embodiment according to actual needs.

[0218] Furthermore, the functional units in the various embodiments of this invention can be integrated into one processing unit, or each unit can exist physically separately, or two or more units can be integrated into one unit. The integrated unit can be implemented in hardware or as a software functional unit. If the integrated unit is implemented as a software functional unit and sold or used as an independent product, it can be stored in a readable storage medium. Based on this understanding, the technical solution of the embodiments of this application, in essence, or the part that contributes to the prior art, or all or part of the technical solution, can be embodied in the form of a software product. This software product is stored in a storage medium and includes several instructions to cause a device (which may be a microcontroller, chip, etc.) or processor to execute all or part of the steps of the methods in the various embodiments of this invention. The aforementioned storage medium includes various media capable of storing program code, such as USB flash drives, portable hard drives, ROM, RAM, magnetic disks, or optical disks.

[0219] The above are merely specific embodiments of the present invention, but the scope of protection of the present invention is not limited thereto. Any variations or substitutions that can be easily conceived by those skilled in the art within the technical scope disclosed in the present invention should be included within the scope of protection of the present invention. Therefore, the scope of protection of the present invention should be determined by the scope of the claims.

Claims

1. A fault detection method, characterized in that, include: Acquire multiple first test messages sent from multiple source nodes to the destination node; The multiple source nodes are nodes in multiple metropolitan area networks within the first region; The target node is a node in the second region; The number of abnormal test information is determined from multiple first test information. When the number of abnormal test information is greater than a preset number, the fault area is determined to be the backbone network area or the second area. When the number of abnormal test information is equal to the preset number, the fault area is determined to be the metropolitan area network area to which the source node corresponding to the abnormal test information belongs. Obtain multiple second test messages sent from the multiple source nodes to the destination node corresponding to the abnormal test information; For each of the plurality of second test information, obtain the multi-hop test information corresponding to the second test information; The multi-hop test information is the test information between each hop node from the source node corresponding to the second test information to the destination node; From the multi-hop test information, identify the first-hop abnormal test information other than the test information corresponding to the preset node; Based on the first-hop anomaly test information, identify the faulty node and obtain the node Internet Protocol (IP) address of the faulty node. The location of the faulty node is determined based on the node's IP address and the faulty region.

2. The fault detection method according to claim 1, characterized in that, When there are multiple first-hop anomaly test messages, determining the fault node based on the first-hop anomaly test messages includes: Determine the number of identical nodes among multiple nodes corresponding to multiple first-hop anomaly test information; When the number of identical nodes exceeds a preset number, the identical nodes are identified as faulty nodes.

3. The fault detection method according to claim 1, characterized in that, Determining the location of the faulty node based on its IP address and the faulty region includes: When the faulty area is the backbone network area or the second area, and the node IP address is an IP address within a preset network segment, the faulty node is determined to be a node in the first backbone network. When the faulty area is the backbone network area or the second area, and the node IP address is an IP address before the preset network segment, the faulty node is determined to be a node in the second backbone network. When the faulty area is the backbone network area or the second area, and the node IP address is an IP address after the preset network segment, the faulty node is determined to be a node in the second area.

4. The fault detection method according to any one of claims 1-3, characterized in that, Also includes: Obtain the node log information of the faulty node, and output fault prompt information based on the log information.

5. A fault detection device, characterized in that, include: Acquiring and determining units; The acquisition unit is used to acquire multiple first test information sent from multiple source nodes to the destination node; The multiple source nodes are nodes in multiple metropolitan area networks within the first region; The target node is a node in the second region; The determining unit is used to determine the number of abnormal test information from multiple first test information. When the number of abnormal test information is greater than a preset number, the fault area is determined to be the backbone network area or the second area. When the number of abnormal test information is equal to the preset number, the fault area is determined to be the metropolitan area network area to which the source node corresponding to the abnormal test information belongs. The acquisition unit is further configured to acquire multiple second test messages sent from the multiple source nodes to the destination node corresponding to the abnormal test message; The determining unit is further configured to obtain multi-hop test information corresponding to each of the plurality of second test information; The multi-hop test information is the test information between each hop node from the source node corresponding to the second test information to the destination node; The determining unit is further configured to determine, from the multi-hop test information, first-hop abnormal test information other than the test information corresponding to the preset node; The determining unit is further configured to determine the faulty node based on the first-hop anomaly test information, and obtain the node Internet Protocol IP address of the faulty node. The determining unit is further configured to determine the node location of the faulty node based on the node IP address and the faulty area.

6. The fault detection device according to claim 5, characterized in that, When there are multiple instances of the first-hop anomaly test information, the determining unit is specifically used for: Determine the number of identical nodes among multiple nodes corresponding to multiple first-hop anomaly test information; When the number of identical nodes exceeds a preset number, the identical nodes are identified as faulty nodes.

7. The fault detection device according to claim 5, characterized in that, The determining unit is specifically used for: When the faulty area is the backbone network area or the second area, and the node IP address is an IP address within a preset network segment, the faulty node is determined to be a node in the first backbone network. When the faulty area is the backbone network area or the second area, and the node IP address is an IP address before the preset network segment, the faulty node is determined to be a node in the second backbone network. When the faulty area is the backbone network area or the second area, and the node IP address is an IP address after the preset network segment, the faulty node is determined to be a node in the second area.

8. The fault detection device according to any one of claims 5-7, characterized in that, The acquisition unit is also used to acquire the node log information of the faulty node and output fault prompt information based on the log information.

9. A fault detection device, characterized in that, It includes a memory and a processor; the memory is used to store computer execution instructions, and the processor is connected to the memory via a bus; when the fault detection device is running, the processor executes the computer execution instructions stored in the memory, so that the fault detection device performs the fault detection method as described in any one of claims 1-4.

10. A computer-readable storage medium, characterized in that, The computer-readable storage medium includes computer-executable instructions that, when executed on a computer, cause the computer to perform the fault detection method as described in any one of claims 1-4.

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